Hybrid integrated multi-tone microwave frequency measurement system and measurement method

CN122944729APending Publication Date: 2026-10-20HEBEI UNIVERSITY
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Patent Information

Application Number
CN202611428000.0
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2026-09-15
Publication Date
2026-10-20

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Abstract

This invention relates to a hybrid integrated multi-tone microwave frequency measurement system and method, belonging to the field of microwave frequency measurement technology. The measurement system of this invention includes an optical integrated chip, an electrical integrated chip, and a coupler. The optical integrated chip includes a fast sweep laser, an electro-optic phase modulator, a notch filter, and a photodetector connected sequentially via an optical waveguide. The electrical integrated chip includes a detector, a voltage acquisition device, a reference signal generation unit, a control signal generation unit, and a microcomputer processing unit connected electrically. One input terminal of the coupler serves as the receiving terminal of the multi-tone microwave signal under test, and the other input terminal is connected to the output terminal of the reference signal generation unit in the electrical integrated chip. The output terminal of the coupler is connected to the RF input electrode of the electro-optic phase modulator in the optical integrated chip. This invention reduces measurement errors caused by laser frequency fluctuations and filter frequency drift due to ambient temperature during actual measurement.
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Citation Information

Patent Citations

  • Integrated optical waveguide microwave frequency measurement chip and system and measurement method thereof

    CN109946515A