A method and system for testing noise in simulated inductance conditions

Abstract

This invention relates to a noise testing method and system for simulating inductor operating conditions, comprising the following steps: S1, assembling the system device and performing acoustic calibration and sensitivity compensation; S2, clamping the inductor under test and configuring current operating parameters, including peak current, first current point time, second current point time, and current velocity; S3, injecting a trapezoidal wave current, simultaneously acquiring noise signals, and generating frequency and decibel histograms; S4, performing spectrum analysis and noise quantization judgment, and calculating a comprehensive evaluation value; S5, determining whether the inductor is qualified based on the comprehensive evaluation value, sorting qualified inductors, and archiving the data. The beneficial effects of this invention are: it solves the technical defects of traditional testing devices that cannot simulate frequency current and high peak current, reduces complexity, and improves testing efficiency and the accuracy of test data.

Description

Technical Field

[0001] This invention relates to the field of electronic component noise testing technology, and specifically to a noise testing method and system that simulates inductor operating conditions. Background Technology

[0002] Under high-frequency alternating current, the inductor core expands and contracts repeatedly due to hysteresis. This micro-dimensional change in the core within the alternating magnetic field causes vibrations in both the core and windings. Simultaneously, the electromagnetic repulsion between the windings exacerbates the coil vibrations. The noise generated by this vibration is transmitted and radiated to the outside world through structures such as heat sinks and PCBs. Furthermore, the noise intensity is positively correlated with the peak current; the higher the current, the more pronounced the noise problem. Currently, this noise has become a bottleneck in hardware performance, particularly in the power supply circuits of new-generation high-power CPUs and GPUs, where inductor noise is especially prominent, with the main noise frequencies concentrated around 1kHz and 2kHz.

[0003] In existing technologies, inductor noise testing cannot simulate high peak currents, making it difficult to reproduce the true noise of inductors under high current conditions. Furthermore, the testing accuracy is insufficient, lacking the ability to quantitatively detect noise signals, and does not compensate for environmental noise and calibration deviations, resulting in poor reliability of the test data. Summary of the Invention

[0004] To address the shortcomings of existing technologies, this application proposes a noise testing method and system that simulates inductor operating conditions. This method overcomes the technical limitations of traditional testing devices in simulating frequency currents and peak currents, reduces complexity, and improves testing efficiency and the accuracy of test data.

[0005] The following is the technical solution of the present invention: a noise testing method simulating inductor operating conditions, comprising the following steps: S1. Assemble the system device and perform acoustic calibration and sensitivity compensation; S2. Clamp the inductor under test and configure the current operating parameters, including peak current, first current point time, second current point time and current rate. S3. Inject trapezoidal wave current, simultaneously collect noise signals, and generate frequency and decibel histograms; S4. Perform spectrum analysis and noise quantification to determine the comprehensive evaluation value; S5. Determine whether the inductor is qualified based on the comprehensive evaluation value, sort the qualified inductors, and archive the data.

[0006] In a preferred embodiment of the present invention, in S1, the assembly system device includes: The soundproof enclosure unit consists of an outer steel plate, a middle damping layer, and an inner sound-absorbing layer. The soundproof enclosure unit is equipped with an inductor clamp fixing unit and a microphone bracket. An electronic load current simulation module, a DC power supply, and a dynamic signal acquisition unit are placed outside the soundproof enclosure unit. The DC power supply and electronic load current simulation module are connected to the inductor under test inside the soundproof enclosure unit to form a current loop, and the noise signal is transmitted to the dynamic signal acquisition unit.

[0007] In a preferred embodiment of the present invention, in S1, sensitivity compensation is performed, including: Acquire the calibration signal. If the displayed decibel value is not 94dB, adjust the value to 94dB and perform sensitivity compensation. The expression is as follows: ,

[0008] In the above formula, The compensated sensor sensitivity level. For reference sensor sensitivity level, The decibel value displayed after the calibration signal is acquired by the AHAI1041 dynamic signal analysis software.

[0009] As a preferred embodiment of the present invention, S3 includes the following steps: S301. Turn on the AHAI2022 dynamic signal acquisition unit and set the test frequency range to 20Hz to 20kHz. S302. Input a trapezoidal current into the inductor under test; S303: Collect noise signals and generate frequency and decibel histograms.

[0010] In a preferred embodiment of the present invention, in S302, a trapezoidal wave current is generated, expressed as follows:

[0011]

[0012]

[0013] ,

[0014] In the above formula, The period of the trapezoidal wave current. For the time at the first current point, For the second current point time, The frequency of the trapezoidal wave current, The duration of the rising or falling segment of the current. This is the peak current. For current velocity, The duration of the peak hold period, The duration of the zero-value holding period.

[0015] As a preferred embodiment of the present invention, S4 includes the following steps: S401. Read and record the noise decibel value at the corresponding frequency; S402. Perform frequency band weighted evaluation on the noise evaluation value; S403. Conduct a comprehensive evaluation of multi-frequency noise.

[0016] In a preferred embodiment of the present invention, in S403, a comprehensive evaluation of multi-band noise is performed, as expressed below:

[0017] ,

[0018] In the above formula, This is a comprehensive evaluation value for multi-band noise. The noise level in decibels is 1 kHz. The noise level in decibels is 2kHz. This refers to the ambient noise level in decibels. The weighting coefficients are for 1kHz frequency, 2kHz frequency, and ambient noise, respectively.

[0019] In a preferred embodiment of the present invention, in S5, data archiving includes: Test data includes test time, inductor number under test, current operating parameters, noise level in decibels, and frequency spectrum. The test report includes information on the inductor under test, test conditions, noise test results, spectrum diagram, and test conclusions.

[0020] A noise testing system simulating inductor operating conditions includes: The electronic load current simulation module is used to simulate the current environment of an inductor under AC current conditions. The silent sound insulation test module is used to provide a quiet testing environment; The dynamic signal acquisition and analysis module is used to acquire and analyze noise signals; The clamping, positioning, and calibration module is used to fix the inductor under test and perform acoustic calibration. The central control and data management module is used to control the testing process and manage test data.

[0021] As a preferred embodiment of the present invention, the electronic load current simulation module adopts the CCDH working mode and has a first current point and a second current point. Each current point includes three parameters: peak current, current point time and current rate. The sum of the time at the first current point and the time at the second current point constitutes one cycle. The current value at the second current point is 0A, and the current value at the first current point is the peak current. The operating frequency range of the electronic load current simulation module is 20Hz-20kHz.

[0022] The beneficial effects of this invention are: 1. This invention can simulate the real noise environment of an inductor. The electronic load current simulation module simulates a wide-band current, with a frequency range of 20Hz to 20kHz and a peak current of 100A, thus restoring the actual working environment of the inductor. This solves the technical deficiency of traditional testing devices that cannot simulate frequency current and high peak current. The electronic load current simulation module adopts the CCDH working mode and generates a trapezoidal current through the trapezoidal current generation unit to simulate the current conditions of the inductor in the actual operation of the CPU / GPU, especially the main sources of noise at 1kHz and 2kHz frequencies. 2. In this invention, a standardized testing process is formed through the synergy of signal acquisition, current simulation, and data analysis, which reduces complexity and improves testing efficiency. Based on the signal processing capabilities of the AHAI1041 dynamic signal analysis system, quantitative detection of inductor noise is performed, thereby improving the accuracy of test data. Attached Figure Description

[0023] Figure 1 This is a schematic diagram of the noise testing system of the present invention; Figure 2 This is a schematic diagram of the electronic load current simulation module of the noise testing system of the present invention; Figure 3 This is a schematic diagram of the noise testing module of the noise testing system of the present invention; Figure 4 This is a schematic diagram of the dynamic signal acquisition and analysis module of the noise testing system of the present invention; Figure 5 This is a schematic diagram of the clamping, positioning, and calibration module of the noise testing system of the present invention; Figure 6 This is a schematic diagram of the central control and data management module of the noise testing system of the present invention; Figure 7 This is a flowchart of the noise testing method of the present invention; Figure 8 This is a current diagram of the noise testing method of the present invention at a frequency of 1kHz. Figure 9 This is a current diagram of the noise testing method of the present invention at a frequency of 2kHz. Figure 10 This is a bar chart showing the frequency and decibels of inductive noise in the noise testing method of this invention. In the diagram: 1. Electronic load current simulation module; 101. Trapezoidal wave current generation unit; 102. Frequency current parameter configuration unit; 103. Current loop closed-loop feedback unit; 104. Operating condition switching and protection unit; 2. Silent sound insulation test module; 201. Sound insulation enclosure unit; 202. Clamping bracket adjustment unit; 203. Shielded wiring and sealing unit; 204. Environmental noise monitoring unit; 3. Dynamic signal acquisition and analysis module; 301. Test microphone pickup unit; 302. Dynamic signal acquisition instrument unit; 303. Spectrum analysis and visualization unit; 304. Noise quantization output unit; 4. Clamping positioning and calibration module; 401. Inductor clamp fixing unit; 402. Acoustic calibration unit; 403. Sensitivity compensation unit; 404. Test readiness confirmation unit; 5. Central control and data management module; 501. Timing synchronization control unit; 502. Data storage and traceability unit; 503. Alarm and interlock protection unit; 504. Test report generation unit. Detailed Implementation

[0024] To make the technical problems solved by the present invention, the technical solutions adopted, and the technical effects achieved clearer, the technical solutions of the embodiments of the present invention will be further described in detail below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0025] Example 1 like Figures 1 to 6 As shown, a noise testing system simulating inductor operating conditions includes: Electronic load current simulation module 1 is used to simulate the current environment of an inductor under AC current conditions. The noise insulation test module 2 is used to provide a quiet testing environment; Dynamic signal acquisition and analysis module 3 is used to acquire and analyze noise signals; Clamping, positioning, and calibration module 4 is used to fix the inductor under test and perform acoustic calibration. Central control and data management module 5 is used to control the testing process and manage test data.

[0026] In this embodiment, the electronic load current simulation module 1 is used to simulate the current environment of an inductor under AC current conditions. The electronic load current simulation module 1 operates in CCDH mode and has two current points. Each current point contains three parameters: peak current, current point time, and current rate. The sum of the times of the first and second current points constitutes one cycle. The current value at the second current point is 0A, and the current value at the first current point is the peak current. The electronic load current simulation module 1 operates in the frequency range of 20Hz-20kHz, and is most sensitive in the frequency range of 500Hz-2kHz, enabling it to simulate the current conditions of an inductor during actual CPU / GPU operation.

[0027] The electronic load current simulation module 1 includes a trapezoidal current generation unit 101, a frequency current parameter configuration unit 102, a current loop closed-loop feedback unit 103, and a working condition switching and protection unit 104. The trapezoidal current generation unit 101 is used to generate a trapezoidal current waveform according to the current working condition parameters; the frequency current parameter configuration unit 102 is used to configure current working condition parameters such as peak current, current point time, and current velocity; the current loop closed-loop feedback unit 103 is used to control the current loop to ensure the accuracy of the current waveform; and the working condition switching and protection unit 104 is used to switch the working condition and protection circuit.

[0028] The frequency current parameter configuration unit 102 is connected to the trapezoidal wave current generation unit 101, the trapezoidal wave current generation unit 101 is connected to the current loop closed-loop feedback unit 103, and the current loop closed-loop feedback unit 103 is connected to the trapezoidal wave current generation unit 101. The operating condition switching and protection unit 104 is connected to the frequency current parameter configuration unit 102, the trapezoidal wave current generation unit 101 and the current loop closed-loop feedback unit 103 respectively. The electronic load current simulation module 1 is connected to the measured inductor inside the soundproof enclosure unit 201 through the wire hole of the shielded wire sealing unit 203.

[0029] In this embodiment, the silent sound insulation test module 2 is used to provide a quiet testing environment and isolate external environmental noise. The silent sound insulation test module 2 forms a closed soundproof space through the soundproof enclosure unit 201, in which the inductor under test and the test microphone pickup unit 301 are placed to isolate interference from external environmental noise.

[0030] The silent sound insulation test module 2 includes a sound insulation enclosure unit 201, a clamping bracket adjustment unit 202, a shielded wiring and sealing unit 203, and an environmental noise monitoring unit 204. The sound insulation enclosure unit 201 is used to provide a closed sound insulation environment; the clamping bracket adjustment unit 202 is used to adjust the height and horizontal distance of the clamping bracket; the shielded wiring and sealing unit 203 is used to thread wires and shield electromagnetic interference; and the environmental noise monitoring unit 204 is used to monitor the environmental noise inside the sound insulation enclosure unit 201.

[0031] The clamping bracket adjustment unit 202, the shielded wiring sealing unit 203, and the environmental noise monitoring unit 204 are all installed on the soundproof enclosure unit 201. The clamping bracket adjustment unit 202 is located inside the soundproof enclosure unit 201, supporting the inductor clamp fixing unit 401 and the test microphone pickup unit 301. The shielded wiring sealing unit 203 penetrates through the enclosure wall of the soundproof enclosure unit 201, introducing the current line of the electronic load current simulation module 1 and the signal line of the test microphone pickup unit 301 into the soundproof enclosure unit 201, while ensuring the airtightness of the soundproof enclosure unit 201. The sensor of the environmental noise monitoring unit 204 is located inside the soundproof enclosure unit 201, and the output end of the environmental noise monitoring unit 204 is connected to the central control and data management module 5 through the shielded wiring sealing unit 203.

[0032] In this embodiment, the dynamic signal acquisition and analysis module 3 is used to acquire and analyze noise signals. The dynamic signal acquisition and analysis module 3 picks up the noise signal generated by the inductor under test through the test microphone pickup unit 301, acquires and performs analog-to-digital conversion on the noise signal through the dynamic signal acquisition unit 302, performs spectrum analysis on the noise signal through the spectrum analysis and visualization unit 303, and outputs the noise quantization result through the noise quantization output unit 304.

[0033] The dynamic signal acquisition and analysis module 3 includes a test microphone pickup unit 301, a dynamic signal acquisition unit 302, a spectrum analysis and visualization unit 303, and a noise quantization output unit 304. The test microphone pickup unit 301 is used to pick up noise signals; the dynamic signal acquisition unit 302 uses an AHAI2022 dynamic signal acquisition instrument to acquire and convert noise signals from analog to digital; the spectrum analysis and visualization unit 303 is used to perform spectrum analysis on the noise signals and generate a spectrum diagram; and the noise quantization output unit 304 is used to output the noise quantization results.

[0034] The test microphone pickup unit 301 is connected to the dynamic signal acquisition unit 302 via a shielded cable. The dynamic signal acquisition unit 302 is connected to the central control and data management module 5 via a network cable. The spectrum analysis and visualization unit 303 and the noise quantization output unit 304 are integrated into the AHAI1041 dynamic signal analysis software and run on the central control and data management module 5. The test microphone pickup unit 301 is located inside the soundproof enclosure unit 201 and is connected to the dynamic signal acquisition unit 302 outside the soundproof enclosure unit 201 via a shielded wiring sealing unit 203.

[0035] In this embodiment, the clamping, positioning, and calibration module 4 is used to fix the inductor under test and perform acoustic calibration. The clamping, positioning, and calibration module 4 fixes the inductor under test through the inductor clamp fixing unit 401, calibrates the test microphone pickup unit 301 through the acoustic calibration unit 402, compensates for sensitivity deviation through the sensitivity compensation unit 403, and confirms the test readiness status through the test readiness confirmation unit 404.

[0036] The clamping, positioning, and calibration module 4 includes an inductor clamp fixing unit 401, an acoustic calibration unit 402, a sensitivity compensation unit 403, and a test readiness confirmation unit 404. The inductor clamp fixing unit 401 is used to fix the inductor under test; the acoustic calibration unit 402 uses an AHAI2601 acoustic calibrator to calibrate the microphone pickup unit 301; the sensitivity compensation unit 403 is used to compensate for sensitivity deviation; and the test readiness confirmation unit 404 is used to confirm the test readiness status.

[0037] The inductor clamp fixing unit 401 is mounted on the clamping bracket adjustment unit 202. The AHAI2601 acoustic calibrator of the acoustic calibration unit 402 is used in conjunction with the test microphone of the test microphone pickup unit 301. The sensitivity compensation unit 403 is integrated into the AHAI1041 dynamic signal analysis software. The test readiness confirmation unit 404 is connected to the environmental noise monitoring unit 204, the acoustic calibration unit 402, and the frequency and current parameter configuration unit 102, respectively. The test readiness confirmation unit 404 is connected to the central control and data management module 5.

[0038] In this embodiment, the central control and data management module 5 is used to control the test process and manage test data. The central control and data management module 5 uses a timing synchronization control unit 501 to synchronize the timing between the electronic load current simulation module 1, the dynamic signal acquisition and analysis module 3, and the clamping, positioning, and calibration module 4; it uses a data storage and traceability unit 502 to store test data; it uses an alarm and interlock protection unit 503 to provide alarm and interlock protection; and it uses a test report generation unit 504 to generate test reports.

[0039] The central control and data management module 5 includes a timing synchronization control unit 501, a data storage and traceability unit 502, an alarm and interlock protection unit 503, and a test report generation unit 504. The timing synchronization control unit 501 is used for timing synchronization between modules; the data storage and traceability unit 502 is used for storing test data; the alarm and interlock protection unit 503 is used for alarm and interlock protection; and the test report generation unit 504 is used for generating test reports. The central control and data management module 5 uses a control computer and runs AHAI1041 dynamic signal analysis software.

[0040] The timing synchronization control unit 501 is connected to the operating condition switching and protection unit 104, the dynamic signal acquisition unit 302, and the test readiness confirmation unit 404, respectively. The data storage and traceability unit 502 is connected to the dynamic signal acquisition unit 302. The alarm and interlock protection unit 503 is connected to the environmental noise monitoring unit 204 and the current loop closed-loop feedback unit 103, respectively. The alarm and interlock protection unit 503 is connected to the operating condition switching and protection unit 104. The test report generation unit 504 is connected to the data storage and traceability unit 502.

[0041] Example 2 like Figures 7 to 10 As shown, a noise testing method simulating inductor operating conditions includes the following steps: S1. Assemble the system device and perform acoustic calibration and sensitivity compensation; S2. Clamp the inductor under test and configure the current operating parameters, including peak current, first current point time, second current point time and current rate. S3. Inject trapezoidal wave current, simultaneously collect noise signals, and generate frequency and decibel histograms; S4. Perform spectrum analysis and noise quantification to determine the comprehensive evaluation value; S5. Determine whether the inductor is qualified based on the comprehensive evaluation value, sort the qualified inductors, and archive the data.

[0042] In step S1, the system device is assembled, and acoustic calibration and sensitivity compensation are performed, including the following steps: S101, Assembly system device.

[0043] The sound insulation enclosure unit 201 of the silent sound insulation test module 2 is placed in the acoustic laboratory. The sound insulation enclosure unit 201 is far away from vibration sources and electromagnetic interference sources. The sound insulation enclosure unit 201 adopts a multi-layer composite sound insulation structure, including an outer steel plate, a middle damping layer and an inner sound-absorbing layer. The door of the sound insulation enclosure unit 201 is sealed with a sealing strip. The sound insulation of the sound insulation enclosure unit 201 in the closed state is not less than 30dB.

[0044] The inductive clamp fixing unit 401 of the clamping, positioning and calibration module 4 and the microphone bracket of the test microphone pickup unit 301 are installed inside the sound insulation enclosure unit 201. The height and horizontal distance of the bracket are adjusted by the clamping bracket adjustment unit 202 of the silent sound insulation test module 2. The bracket height adjustment range is 0 to 200 mm, and the horizontal distance adjustment range is 0 to 150 mm.

[0045] A dynamic signal acquisition unit 302 consisting of an electronic load current simulation module 1, a DC power supply, and a dynamic signal acquisition and analysis module 3 is placed outside the soundproof enclosure unit 201. The electronic load current simulation module 1 operates in the frequency range of 20Hz to 20kHz and has a peak current of 100A.

[0046] The DC power supply and electronic load current simulation module 1 are connected to the inductor under test inside the soundproof enclosure unit 201 through the wire hole of the shielded wire sealing unit 203 of the silent sound insulation test module 2 to form a current loop. The shielded wire sealing unit 203 uses shielded cable and sealed wall-penetrating component. The shielding layer of the shielded cable is grounded, and the sealed wall-penetrating component uses rubber sealing ring to improve the sealing and electromagnetic shielding of the wire hole.

[0047] The test microphone pickup unit 301 transmits the noise signal to the dynamic signal acquisition unit 302 outside the soundproof enclosure unit 201 through the shielded wire of the shielded wire sealing unit 203.

[0048] The dynamic signal acquisition unit 302 interacts with the central control and data management module 5 via a network cable.

[0049] S102. Perform acoustic calibration and sensitivity compensation; To activate the AHAI2601 acoustic calibrator in the acoustic calibration unit 402 of the clamping, positioning and calibration module 4, press the "ON" button.

[0050] When the "RUN" indicator light flashes, the AHAI2601 acoustic calibrator of the acoustic calibration unit 402 emits a 1kHz / 94dB standard audio signal.

[0051] Insert the test microphone of the test microphone pickup unit 301 into the sound hole of the AHAI2601 sound calibrator of the acoustic calibration unit 402.

[0052] Close the door of the sound insulation enclosure unit 201 of the silent sound insulation test module 2.

[0053] Open the AHAI1041 dynamic signal analysis software on the central control and data management module 5 to collect calibration signals.

[0054] If the displayed decibel value is not 94dB, adjust the value to 94dB in "Sensor Sensitivity Level (dB)" and perform sensitivity compensation through the sensitivity compensation unit 403 of the clamping, positioning and calibration module 4, as shown in the following expression: ,

[0055] In the above formula, The compensated sensor sensitivity level. For reference sensor sensitivity level, The decibel value displayed after the calibration signal is acquired by the AHAI1041 dynamic signal analysis software.

[0056] In step S2, the inductor under test is clamped, and the current operating parameters are configured, including peak current, first current point time, second current point time, and current rate, including the following steps: S201, Insert the inductor to be tested into the inductor fixing slot of the inductor clamp fixing unit 401 of the clamping, positioning and calibration module 4.

[0057] Tighten the inductor under test with fixing bolts to ensure that the inductor under test is in close contact with the inductor fixing slot of the inductor clamp fixing unit 401, so as to avoid vibration and generate additional noise.

[0058] S202. The current operating parameters, including peak current, are set through the frequency current parameter configuration unit 102 of the electronic load current simulation module 1. First current point time Second current point time and current velocity The parameters are then transmitted to the trapezoidal wave current generation unit 101 of the electronic load current simulation module 1.

[0059] S203. The trapezoidal wave current generation unit 101 of the electronic load current simulation module 1 generates a trapezoidal wave current waveform according to the current operating parameters. The trapezoidal wave current sequentially goes through the rising segment, peak holding segment, falling segment and zero value holding segment in one cycle.

[0060] The actual current in the current loop is sampled by the closed-loop feedback unit 103 of the current loop of the electronic load current simulation module 1, and compared with the set value of the trapezoidal wave current generation unit 101. The deviation is fed back to the trapezoidal wave current generation unit 101 for PID adjustment to improve the accuracy of the current waveform.

[0061] In step S3, a trapezoidal wave current is injected, noise signals are acquired simultaneously, and frequency and decibel histograms are generated, including the following steps: S301. Turn on the AHAI2022 dynamic signal acquisition instrument of the dynamic signal acquisition unit 302 of the dynamic signal acquisition and analysis module 3.

[0062] Set the test frequency range to 20Hz to 20kHz in the AHAI1041 dynamic signal analysis software.

[0063] S302. The electronic load current simulation module 1 and the DC power supply are started to input a trapezoidal current to the inductor under test. The trapezoidal current generation unit 101 of the electronic load current simulation module 1 generates a trapezoidal current, the expression of which is as follows:

[0064]

[0065]

[0066] ,

[0067] In the above formula, The period of the trapezoidal wave current. For the time at the first current point, For the second current point time, The frequency of the trapezoidal wave current, The duration of the rising or falling segment of the current. This is the peak current. For current velocity, The duration of the peak hold period, The duration of the zero-value holding period.

[0068] Taking a frequency of 1kHz, a peak current of 30A, and a current rate of 0.2A / μs as an example, the current takes 150μs to rise from 0A to 30A and is maintained at 30A for 350μs. The current takes 150μs to fall from 30A to 0A and is maintained at 0A for 350μs. The period is 1000μs.

[0069] S303. Click the acquisition button of the AHAI1041 dynamic signal analysis software. The noise signal is acquired through the test microphone pickup unit 301 of the dynamic signal acquisition and analysis module 3. The timing synchronization control unit 501 of the central control and data management module 5 enables the trapezoidal wave current injection and noise signal acquisition to be synchronized.

[0070] The dynamic signal acquisition unit 302 of the dynamic signal acquisition and analysis module 3 generates frequency and decibel histograms.

[0071] In step S4, spectrum analysis and noise quantization are performed to calculate the comprehensive evaluation value, including the following steps: S401. The noise decibel value of the corresponding frequency is read and recorded by the spectrum analysis and visualization unit 303 of the dynamic signal acquisition and analysis module 3.

[0072] The noise signal is analyzed by the spectrum analysis and visualization unit 303 to generate frequency and decibel histograms, with the frequency range set to 20Hz to 20kHz.

[0073] S402. The noise evaluation value is evaluated by frequency band weighting through the noise quantization output unit 304 of the dynamic signal acquisition and analysis module 3, as shown in the following expression: ,

[0074] In the above formula, This is the frequency band weighted noise evaluation value. Let be the weighting coefficient for the i-th frequency band. Let be the noise decibel value of the i-th frequency band. In this embodiment, Based on the main frequency distribution of inductive noise, the weighting coefficients for the 1kHz and 2kHz frequency bands are relatively large.

[0075] S403. The noise quantization output unit 304 performs a comprehensive evaluation of multi-frequency noise, as shown in the following expression:

[0076] ,

[0077] In the above formula, This is a comprehensive evaluation value for multi-band noise. The noise level in decibels is 1 kHz. The noise level in decibels is 2kHz. This refers to the ambient noise level in decibels. The weighting coefficients are for 1kHz frequency, 2kHz frequency, and ambient noise, respectively.

[0078] The noise quantization result is output through the noise quantization output unit 304.

[0079] In step S5, the inductor is judged to be qualified based on the comprehensive evaluation value, and qualified inductors are sorted, including the following steps: S501. End the test, determine whether the inductor is qualified based on the comprehensive evaluation value, and sort the qualified inductors. Click the pause acquisition button in the AHAI1041 dynamic signal analysis software; close the AHAI1041 dynamic signal analysis software and the dynamic signal acquisition unit 302 of the dynamic signal acquisition and analysis module 3; disconnect the electronic load current simulation module 1 and the DC power supply; loosen the fixing bolts of the inductor clamp fixing unit 401 of the clamping positioning and calibration module 4, and remove the inductor to be measured.

[0080] If the comprehensive evaluation value meets the acceptable range, the inductor is deemed qualified and the batch of inductors is sorted to the qualified product area. If the comprehensive evaluation value does not meet the acceptable range, the inductor is deemed unqualified and the batch of inductors is sorted to the unqualified product area.

[0081] S502. Archive the data; Test data, including test time, inductor number under test, current operating parameters, noise decibel value, and spectrum, is stored through the data storage and traceability unit 502 of the central control and data management module 5.

[0082] The test report generation unit 504 of the central control and data management module 5 generates a test report based on the test data stored in the data storage and traceability unit 502. The test report includes the inductor under test information, test conditions, noise test results, spectrum diagram and test conclusion.

[0083] This invention can simulate the real noise environment of an inductor. The electronic load current simulation module 1 simulates a wide-band current, with a frequency range of 20Hz to 20kHz and a peak current of 100A, thus restoring the actual working environment of the inductor. This solves the technical deficiency of traditional test devices that cannot simulate frequency current and high peak current. The electronic load current simulation module 1 adopts the CCDH working mode and generates a trapezoidal current through the trapezoidal current generation unit 101 to simulate the current conditions of the inductor in the actual operation of the CPU / GPU, especially the main sources of noise at 1kHz and 2kHz frequencies. Through the coordination of signal acquisition, current simulation and data analysis, a standardized test process is formed, which reduces complexity and improves test efficiency. Based on the signal processing capabilities of the AHAI1041 dynamic signal analysis system, quantitative detection of inductor noise is performed, improving the accuracy of test data.

[0084] Although preferred embodiments of the invention have been described, those skilled in the art, upon learning the basic inventive concept, can make other changes and modifications to these embodiments. Clearly, those skilled in the art can make various alterations and variations to the invention without departing from its spirit and scope. Therefore, if these modifications and variations fall within the scope of equivalents of the invention, the invention is also intended to include these modifications and variations.

Claims

1. A noise testing method simulating inductor operating conditions, characterized in that, Includes the following steps: S1. Assemble the system device and perform acoustic calibration and sensitivity compensation; S2. Clamp the inductor under test and configure the current operating parameters, including peak current, first current point time, second current point time and current rate. S3. Inject trapezoidal wave current, simultaneously collect noise signals, and generate frequency and decibel histograms; S4. Perform spectrum analysis and noise quantification to determine the comprehensive evaluation value; S5. Determine whether the inductor is qualified based on the comprehensive evaluation value, sort the qualified inductors, and archive the data.

2. The noise testing method for simulating inductor operating conditions according to claim 1, characterized in that, In S1, the assembly system device includes: The soundproof enclosure unit consists of an outer steel plate, a middle damping layer, and an inner sound-absorbing layer. The soundproof enclosure unit is equipped with an inductor clamp fixing unit and a microphone bracket. An electronic load current simulation module, a DC power supply, and a dynamic signal acquisition unit are placed outside the soundproof enclosure unit. The DC power supply and electronic load current simulation module are connected to the inductor under test inside the soundproof enclosure unit to form a current loop, and the noise signal is transmitted to the dynamic signal acquisition unit.

3. The noise testing method for simulating inductor operating conditions according to claim 1, characterized in that, In S1, sensitivity compensation is performed, including: Acquire the calibration signal. If the displayed decibel value is not 94dB, adjust the value to 94dB and perform sensitivity compensation. The expression is as follows: ， In the above formula, The compensated sensor sensitivity level. For reference sensor sensitivity level, The decibel value displayed after the calibration signal is acquired by the AHAI1041 dynamic signal analysis software.

4. The noise testing method for simulating inductor operating conditions according to claim 2, characterized in that, S3 includes the following steps: S301. Turn on the AHAI2022 dynamic signal acquisition unit and set the test frequency range to 20Hz to 20kHz. S302. Input a trapezoidal current into the inductor under test; S303: Collect noise signals and generate frequency and decibel histograms.

5. The noise testing method for simulating inductor operating conditions according to claim 4, characterized in that, In S302, a trapezoidal current is generated, expressed as follows: ， In the above formula, The period of the trapezoidal wave current. For the time at the first current point, For the second current point time, The frequency of the trapezoidal wave current, The duration of the rising or falling segment of the current. This is the peak current. For current velocity, The duration of the peak hold period, The duration of the zero-value holding period.

6. The noise testing method for simulating inductor operating conditions according to claim 1, characterized in that, S4 includes the following steps: S401. Read and record the noise decibel value at the corresponding frequency; S402. Perform frequency band weighted evaluation on the noise evaluation value; S403. Conduct a comprehensive evaluation of multi-frequency noise.

7. The noise testing method for simulating inductor operating conditions according to claim 6, characterized in that, In S403, a comprehensive evaluation of multi-band noise is performed, as expressed below: ， In the above formula, This is a comprehensive evaluation value for multi-frequency noise. The noise level in decibels is 1 kHz. The noise level in decibels is 2kHz. This refers to the ambient noise level in decibels. The weighting coefficients are for 1kHz frequency, 2kHz frequency, and ambient noise, respectively.

8. The noise testing method for simulating inductor operating conditions according to claim 1, characterized in that, In S5, data archiving includes: Test data includes test time, inductor number under test, current operating parameters, noise level in decibels, and frequency spectrum. The test report includes information on the inductor under test, test conditions, noise test results, spectrum diagram, and test conclusions.

9. A noise testing system simulating inductor operating conditions, applicable to the noise testing method simulating inductor operating conditions as described in any one of claims 1-8, characterized in that, include: Electronic load current simulation module is used to simulate the current environment of an inductor under AC current conditions; The silent sound insulation test module is used to provide a quiet testing environment; The dynamic signal acquisition and analysis module is used to acquire and analyze noise signals; The clamping, positioning, and calibration module is used to fix the inductor under test and perform acoustic calibration. The central control and data management module is used to control the testing process and manage test data.

10. The noise testing method for simulating inductor operating conditions according to claim 9, characterized in that, The electronic load current simulation module adopts the CCDH working mode and has a first current point and a second current point. Each current point includes three parameters: peak current, current point time and current rate. The sum of the time at the first current point and the time at the second current point constitutes one cycle. The current value at the second current point is 0A, and the current value at the first current point is the peak current. The operating frequency range of the electronic load current simulation module is 20Hz-20kHz.

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