Power supply test method and device, electronic equipment and storage medium

Abstract

This disclosure provides a power supply testing method, apparatus, electronic device, and storage medium, relating to the field of testing technology. The method includes: performing a first aging process on the power supply, the first aging process including at least one of load aging process and no-load aging process; moving the power supply after the first aging process into a test station; and performing a standby power consumption test on the power supply in the test station. The solution provided by the embodiments of this disclosure, by decoupling the power supply aging process from the standby power consumption test process, can reduce the time spent on standby power consumption testing of the power supply and improve the efficiency of standby power consumption testing.

Description

Technical Field

[0001] This disclosure relates to the field of testing technology, and in particular to a power supply testing method, apparatus, electronic device, and storage medium. Background Technology

[0002] With the increasing popularity of power supply products and the pursuit of energy conservation and environmental protection, standby power consumption has become an important parameter of power supplies.

[0003] In related technologies, the standby power consumption test of the power supply involves aging treatment of the power supply, and the aging treatment process takes a long time, resulting in low battery testing efficiency. Summary of the Invention

[0004] To overcome the problems existing in related technologies, this disclosure provides a power supply testing method, apparatus, electronic device, and storage medium.

[0005] According to a first aspect of the present disclosure, a power supply testing method is provided, comprising:

[0006] The power supply is subjected to a first aging process, which includes at least one of a load aging process and an no-load aging process.

[0007] The power supply, after undergoing the first aging process, is moved to the testing station.

[0008] Standby power consumption was tested on the power supply in the test station.

[0009] In some embodiments, the first aging process on the power supply includes:

[0010] The power supply is subjected to load aging treatment and no-load aging treatment in sequence.

[0011] In some embodiments, the sequential load aging process and no-load aging process performed on the power supply includes:

[0012] At a first temperature, the power supply is subjected to a first-time load aging treatment in order to perform an aging test on the power supply.

[0013] At a second temperature, the power supply that has undergone load aging treatment is subjected to a second period of no-load aging treatment.

[0014] Wherein, the first temperature is greater than the second temperature, and the first duration is greater than the second duration.

[0015] In some embodiments, after the power supply undergoes a first-duration load aging process, the method further includes:

[0016] The power supply is subjected to periodic load aging treatment according to a preset time interval, so as to perform periodic aging tests on the power supply.

[0017] In some embodiments, after moving the power supply that has undergone the first aging process into the test station, the method further includes:

[0018] The power supply in the test station is subjected to a second aging process, which includes an unloaded aging process.

[0019] In some embodiments, the duration of the second aging process is the same as the duration of the power supply's performance testing at the test station, the performance testing including the standby power consumption test.

[0020] In some embodiments, the standby power consumption test of the power supply in the test station includes:

[0021] When the power supply is in standby mode, measure the cumulative power consumption of the power supply within a preset time period;

[0022] If the cumulative power consumption is less than the preset standby power consumption threshold, the power supply is determined to have passed the standby power consumption test.

[0023] According to a second aspect of the present disclosure, a power supply testing apparatus is provided, comprising:

[0024] An aging module is used to perform a first aging process on the power supply, the first aging process including at least one of load aging process and no-load aging process.

[0025] The conveyor module is used to move the power supply after the first aging process into the test station.

[0026] The test module is used to perform standby power consumption tests on the power supply in the test station.

[0027] According to a third aspect of the present disclosure, an electronic device is provided, comprising:

[0028] Processor; and

[0029] Memory for storing the executable instructions of the processor;

[0030] The processor is configured to execute the method described in the first aspect by executing the executable instructions.

[0031] According to a fourth aspect of the present disclosure, a computer-readable storage medium is provided having a computer program stored thereon, which, when executed by a processor, implements the method described in the first aspect.

[0032] In the solution provided in this embodiment, the power supply undergoes an aging process before being moved to the testing station for standby power consumption testing. By decoupling the power supply aging process from the standby power consumption testing process, the time spent on standby power consumption testing can be reduced, thereby improving the efficiency of standby power consumption testing. Attached Figure Description

[0033] Figure 1 A schematic diagram showing the relationship between capacitor leakage current and energization duration in an embodiment of this disclosure is shown.

[0034] Figure 2 A schematic diagram showing the relationship between capacitor leakage current and temperature in an embodiment of this disclosure is shown.

[0035] Figure 3 A schematic flowchart of a power supply testing method according to an embodiment of this disclosure is shown.

[0036] Figure 4 A schematic diagram of the structure of a power supply testing device according to an embodiment of the present disclosure is shown.

[0037] Figure 5 A schematic diagram of the structure of an electronic device according to an embodiment of the present disclosure is shown. Detailed Implementation

[0038] Exemplary embodiments will now be described in detail, examples of which are illustrated in the accompanying drawings. When the following description relates to the drawings, unless otherwise indicated, the same numerals in different drawings denote the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this disclosure. Rather, they are merely examples of apparatuses and methods consistent with some aspects of this disclosure as detailed in the appended claims.

[0039] With the increasing popularity of power supply products and the growing pursuit of energy conservation and environmental protection, standby power consumption has become a crucial parameter for power supplies. Currently, standby power consumption testing is typically conducted during the power supply's ATE (Automatic Test Equipment) stage. However, since standby power consumption testing involves aging the power supply, which takes a considerable amount of time, this method affects the testing efficiency. Furthermore, if the power supply is not sufficiently aged before the standby power consumption test, it will also affect the accuracy of the test results.

[0040] The inventors discovered that the standby power consumption of a power supply mainly depends on the leakage current of the capacitors in the power supply. The leakage current of the capacitors is affected by two factors: the duration of power-on (i.e., the degree of aging) and the temperature.

[0041] Please refer to Figure 1 , Figure 1 The relationship between capacitor leakage current and energization time is shown. Figure 1In the graph, the horizontal axis represents the energizing time, and the vertical axis represents the leakage current. Figure 1 It can be seen that the leakage current of the capacitor tends to stabilize as the energizing time increases.

[0042] Please refer to Figure 2 , Figure 2 The relationship between capacitor leakage current and temperature is shown. Figure 2 In the graph, the horizontal axis represents temperature, and the vertical axis represents leakage current. Figure 2 It can be seen that an increase in temperature will lead to an increase in leakage current, and the leakage current of the capacitor is relatively stable at room temperature (25℃).

[0043] Therefore, in order to accurately measure the standby power consumption of the power supply, reduce the impact of leakage current fluctuations on the standby power consumption of the power supply, and also consider the simulation of the standby state of the power supply, the standby power consumption of the power supply can be tested at room temperature after the power supply has been powered on for a long time and aged.

[0044] Building upon this foundation, and considering the testing efficiency of power supplies, the inventors separated the aging process from the testing phase. This means that the power supplies are pre-aged to a sufficient degree before being moved to the testing station for testing. This pre-aging process can be performed simultaneously on a large batch of power supplies from the production line, ensuring that the capacitors in the power supplies have a sufficiently long energizing time to achieve adequate aging. Simultaneously, the process of moving the pre-aged power supplies to the testing station allows them to return to room temperature to some extent. Therefore, the accuracy of standby power consumption testing can be improved without affecting testing efficiency.

[0045] The solution provided in this disclosure will now be described in detail with reference to specific embodiments.

[0046] First, this disclosure provides a power supply testing method, which can be performed by an electronic device used to control a power supply production line.

[0047] Figure 3 This diagram illustrates a power supply testing method according to an embodiment of the present disclosure, as shown below. Figure 3 As shown, the power supply testing method provided in this embodiment includes the following steps.

[0048] S301, the power supply undergoes its first aging process.

[0049] In some embodiments, the first aging process includes at least one of a loaded aging process and an unloaded aging process.

[0050] The load aging process can be understood as connecting a certain load to the output terminal of the power supply while it is powered on, simulating the actual working state of the power supply. The load can be a resistive load or an electronic load, etc. When the output terminal of the power supply is connected to the load, the power supply can supply power to the load at its maximum output power. Of course, the output power of the power supply can also be adjusted according to actual needs, and this disclosure does not limit this.

[0051] No-load aging treatment can be understood as leaving the power supply unloaded (i.e., without any load connected) while it is powered on. In other words, only the power supply's input is connected to the equipment being powered, and the power supply will still undergo aging under these conditions.

[0052] The purpose of the first aging process for the power supply is to age it under power, reducing leakage current in the internal capacitors and bringing it up to the requirements for standby power consumption testing. Therefore, in S301, regardless of the aging method used, as long as the aging level meets the testing requirements, it will not affect subsequent standby power consumption testing. For example, the power supply can be aged under load only, under no-load only, or under both load and no-load conditions.

[0053] S302, the power supply after the first aging process is moved into the test station.

[0054] In some embodiments, the test station can be a test station in the production line used to perform Automatic Test Equipment (ATE) testing. After the first aging process, the power supply can be moved to the ATE test station by means of rails, conveyor belts, automated guided vehicles (AGVs), or manual handling.

[0055] ATE testing can automatically test and verify the performance of power supplies during the power supply production process, thereby quickly and accurately evaluating whether the various parameters of the power supply meet the design specifications and ensuring product quality.

[0056] For example, ATE testing includes testing the power supply's standby power consumption, as well as other tests related to power supply performance testing. These other tests could include power supply input / output characteristic testing, protection function testing, dynamic response testing, etc.

[0057] Of course, the test station can also be other test stations that can be used to perform standby power consumption tests, and this disclosure does not limit this.

[0058] S303 performs standby power consumption tests on the power supply in the test station.

[0059] In some embodiments, to simulate the standby state of the power supply, the power supply can be placed in an unloaded state during the standby power consumption test. That is, the input terminal of the power supply is plugged into a power supply device, and the output terminal is not connected to any load. The power supply device can be a power strip, a miniature power outlet, an uninterruptible power supply (UPS) with a timing function, etc.

[0060] For example, a standby power consumption test can be conducted by measuring the cumulative power consumption of the power supply over a preset period of time while the power supply is in standby mode. If the cumulative power consumption is less than a preset standby power consumption threshold, the power supply is deemed to have passed the standby power consumption test.

[0061] In standby mode, the power supply's power consumption is very low and may fluctuate, so directly measuring the instantaneous standby power consumption may not yield accurate test results. By measuring the power supply's cumulative power consumption over a preset period and using this cumulative power consumption to measure the standby power consumption test results, errors caused by instantaneous power consumption fluctuations can be eliminated.

[0062] The cumulative power consumption of the power supply within a preset time period can be obtained by integrating the power consumption of the power supply within the preset time period, which will not be elaborated in this embodiment.

[0063] In this embodiment of the disclosure, the aging process of the power supply is decoupled from the testing process in standby power consumption testing. This allows the aging process to be performed before the power supply is moved to the testing station, without occupying the testing position. Therefore, the testing efficiency of standby power consumption testing can be improved.

[0064] In some embodiments, in S301 above, the power supply can first undergo load aging treatment, and then undergo no-load aging treatment. That is, the power supply can first be rapidly aged by load aging treatment to improve the activity of the electrolyte inside the capacitors and reduce the leakage current of the capacitors. Subsequently, no-load aging treatment is performed to allow the power supply to reduce the temperature while maintaining the activity of the electrolyte, thereby further reducing the leakage current and meeting the standby power consumption test conditions.

[0065] Understandably, the power supply aging process and standby power consumption testing are decoupled in this disclosure, and the time interval between the completion of aging and the start of the standby power consumption test is unpredictable. Although load aging can increase the aging speed of the power supply, it also causes the power supply temperature to rise rapidly, failing to meet the requirements for standby power consumption testing. By making the final step of the first aging process an unloaded aging process, it is also possible to avoid the power supply not having sufficient time to cool down to the test temperature before the standby power consumption test due to an excessively short time interval between the first aging process and the standby power consumption test.

[0066] It is worth noting that the first aging process can be performed in an aging chamber. Those skilled in the art will understand that an aging chamber can perform batch aging processes on power supplies and can also perform aging tests on power supplies. By decoupling the aging process and standby power consumption testing of power supplies, using an aging chamber for the first aging process allows for the simultaneous aging of a large number of power supplies, thereby saving aging time and enabling aging tests to be completed simultaneously with the first aging process, further reducing the time spent testing power supplies on the production line.

[0067] For example, the power supply can first be subjected to a load aging process for a first duration at a first temperature to perform an aging test. Then, the power supply subjected to the load aging process can be subjected to an no-load aging process for a second duration at a second temperature to reduce the power supply temperature and make it meet the conditions for standby power consumption testing. Here, the first temperature is higher than the second temperature, and the first duration is longer than the second duration.

[0068] In other words, the power supply can first undergo a prolonged load aging process at a relatively high temperature. This "relatively high temperature" can be above room temperature (e.g., 25°C), but within the power supply's permissible temperature range, such as 35°C to 45°C. The "relatively long" duration can be determined experimentally; it refers to the temperature at which the power supply is sufficiently aged while the activity of the electrolyte inside the capacitors remains largely unchanged. The higher temperature and longer duration promote the aging process from both temporal and thermal perspectives, ensuring the power supply meets the requirements for both aging tests and standby power consumption tests. The power supply after load aging can then be directly used for aging tests.

[0069] Subsequently, the power supply can undergo a short-duration no-load aging process at a relatively low temperature. This lower temperature can be room temperature (e.g., 25°C) or below, but should still be within the power supply's permissible temperature range. The shorter duration can also be determined experimentally; it refers to the time it takes for the power supply to cool to approximately room temperature during the no-load aging process at the second temperature. This allows the internal temperature of the power supply to be reduced to room temperature while maintaining the activity of the electrolyte within the capacitors.

[0070] For example, during the process of sequentially performing the first duration of load aging treatment and the second duration of no-load aging treatment, after the first duration of load aging treatment, the power supply can also undergo periodic load aging treatment at preset time intervals to perform periodic aging tests. That is, after connecting the power supply's input terminal to the power supply equipment and the output terminal to the load, the power supply equipment is alternately turned on and off at certain time intervals, thereby switching the power supply between a load-bearing operating state and a power-off state to meet the aging requirements of periodic aging tests.

[0071] In other words, the method of performing the first aging treatment on the power supply in the aging cabinet can be set according to the needs of the aging test, so that various aging tests on the power supply can be completed simultaneously during the pre-aging process.

[0072] In some embodiments, after S302 described above, a second aging process can be performed on the power supply in the test station. That is, after the power supply is moved into the test station and before the standby power consumption test is performed, the power supply in the test station can be aged again.

[0073] As mentioned above, because the power supply aging process and standby power consumption test are decoupled in this disclosure, the time interval between the completion of the first aging process and the commencement of the standby power consumption test is unpredictable. If the time interval is too long, the aging degree of the power supply after the first aging process may be low, meaning the activity of the electrolyte inside the capacitors will decrease, leading to increased capacitor leakage current and failing to meet the requirements of the standby power consumption test.

[0074] By subjecting the power supply moved to the test station to another aging process before the standby power consumption test begins, the activity of the electrolyte inside the capacitor can be increased again, ensuring that the leakage current of the capacitor can meet the requirements of the standby power consumption test.

[0075] For example, since the power supply after the second aging process will be used directly for standby power consumption testing, there is no idle time between the second aging process and the standby power consumption test to allow the power supply to cool down. Therefore, to avoid the power supply temperature rising due to the second aging process, the second aging process can be an unloaded aging process.

[0076] Understandably, since the power supply has already undergone the first aging process, even a short period of no-load aging during the second aging process is sufficient to improve the activity of the electrolyte inside the capacitor and reduce the leakage current of the capacitor to within the standby power consumption test requirements.

[0077] For example, the duration of the second aging process can be the same as the time consumed by the power supply during performance testing at the test station. This performance testing includes all tests the power supply will undergo at that test station, including standby power consumption testing. For instance, if the test station is for performing ATE testing, the performance testing includes all test items in the ATE test.

[0078] Therefore, the second aging process and performance testing can be performed alternately, so that the additional second aging process step will not take up time of the performance testing in the testing station.

[0079] For example, assuming the production line can support simultaneous performance testing of eight power supplies, then while the eight power supplies in the first group are being tested, the second aging process can be performed simultaneously on the eight power supplies in the second group. Since the second aging process takes the same amount of time as the performance test, the performance testing of the first group of power supplies and the second aging process of the second group will be completed simultaneously. At this point, performance testing of the second group of power supplies can begin directly.

[0080] In other words, while performing performance tests on each group of power supplies, a second aging process can be simultaneously applied to the next group of power supplies to be tested. This ensures that the power supply currently undergoing performance testing always meets the test requirements without consuming additional performance testing time.

[0081] In some embodiments, the duration of the second aging process may be greater than or less than the duration of the performance test, but still close to the duration of the performance test. That is, the difference between the duration of the second aging process and the duration of the performance test can be less than a preset difference threshold.

[0082] The following section will illustrate the complete implementation process of the solution provided in this disclosure, using practical applications as examples.

[0083] Firstly, the finished product testing process on a power supply production line typically includes three stages: Functional Circuit Test (FCT), Aging Test, and ATE Test. FCT tests whether the power supply's various functions are normal; Aging Test tests the power supply's stability and reliability; and ATE Test tests the power supply's various performance parameters. Standby power consumption testing can be included in the ATE test stage.

[0084] Next, we will take a 65W power supply as an example to introduce the standby power consumption testing method in the production line:

[0085] 1) After the FCT test is completed, the power supply is transferred to the aging chamber for aging. The aging program in the aging chamber can be set according to the needs of the aging test. For example, the ambient temperature can be set to 40±5℃, allowing the power supply to operate under load at 20V and 3.25A for 100 minutes. Then, the power supply is alternately turned on and off at 60-second intervals, repeated 10 times for a total of 20 minutes. After the above two-hour aging program is completed, the power supply in the aging chamber can be subjected to aging tests.

[0086] 2) Continue no-load aging of the power supply in the aging chamber. At this stage, the power supply output can be set to 5V, 0A, and the ambient temperature to 25℃, simulating the no-load state of the power supply at room temperature. This step is used to cool the power supply (including capacitors). The purpose of cooling is twofold: firstly, to simulate the standby temperature of the power supply to meet the requirements of standby power consumption testing; and secondly, to control the leakage current of the capacitors in the power supply, improving the accuracy of the standby power consumption test.

[0087] In addition, during the cooling process based on no-load aging, the power supply is always powered on, so the leakage current of the capacitor will not rise, thus keeping the standby power consumption of the power supply stable.

[0088] 3) Remove the power supply from the aging chamber and transfer it to the ATE testing station. After being removed from the aging chamber, the power supply will be in a de-energized state. During this time, the leakage current of the capacitors will increase with the time the power supply has been de-energized. However, in automated production lines, the power supply removed from the aging chamber will be quickly transferred to the ATE testing station via a track or conveyor belt. This process typically takes no more than 20 minutes, and the increase in leakage current is minimal. Even in non-automated production lines, the time spent transferring the power supply to the ATE testing station usually does not lead to a significant increase in leakage current.

[0089] 4) Perform no-load aging on the power supply in the test station, followed by ATE testing.

[0090] For example, power supplies can be grouped into sets of eight and inserted into a power supply device using a clamp for no-load aging. The power supply device can be a power strip, a miniature power outlet, or a UPS with a timing function. This step only requires powering on the input terminals of the power supplies; no cables or devices need to be connected to the output terminals. Performing no-load aging at this stage prevents the leakage current of the capacitors from increasing again before the power supplies are removed from the aging cabinet and before ATE testing, thereby improving the accuracy of standby power consumption testing.

[0091] After the first set of power supplies has completed its no-load aging process, the power supplies are plugged into the ATE testing device for ATE testing. The first item in the ATE test can be the standby power consumption test, thus avoiding inaccurate standby power consumption tests due to the power supply's aging properties deteriorating in other ATE test items and increased capacitor leakage current.

[0092] For example, in this stage, the no-load aging time for each power supply group can be the same as the ATE test time for each power supply group. For instance, both the no-load aging time and the ATE test time for each power supply group can be 2 minutes. With this setup, after the first power supply group starts its ATE test, the next power supply group can begin its no-load aging. After the first power supply group completes its ATE test, the next power supply group has just completed its no-load aging and can immediately begin its ATE test. This process continues, with no-load aging and ATE testing alternating, thus ensuring the accuracy of standby power consumption testing without affecting the power supply's testing efficiency, and consequently ensuring that the ATE test time meets the requirement of the number of units per hour (UPH) produced by the power supply.

[0093] Based on the same inventive concept, this disclosure also provides a power supply testing device, as shown in the following embodiment. Since the principle of this power supply testing device embodiment in solving the problem is the same as that described above... Figure 1 The method embodiments shown are similar, therefore, the implementation of this power supply testing device embodiment can be found in the above description. Figure 1 The implementation of the method embodiments shown will not be repeated here.

[0094] Figure 4 A schematic diagram of a power supply testing device according to an embodiment of this disclosure is shown. Figure 4 As shown, the power supply testing device 400 includes: an aging module 401, a transmission module 402, and a testing module 403.

[0095] The aging module 401 is used to perform a first aging process on the power supply, which includes at least one of a load aging process and an no-load aging process.

[0096] The conveyor module 402 is used to move the power supply after the first aging process into the test station;

[0097] Test module 403 is used to perform standby power consumption tests on the power supply in the test station.

[0098] In some embodiments, the aging module 401 is specifically used to perform load aging and no-load aging processes on the power supply in sequence.

[0099] In some embodiments, the aging module 401 is specifically used to perform a first-duration load aging process on the power supply at a first temperature for a first duration in order to perform an aging test on the power supply; and to perform a second-duration no-load aging process on the power supply after the load aging process at a second temperature for a second duration; wherein the first temperature is greater than the second temperature and the first duration is greater than the second duration.

[0100] In some embodiments, the aging module 401 is further configured to perform periodic load aging treatment on the power supply according to a preset time interval, so as to perform periodic aging tests on the power supply.

[0101] In some embodiments, the test module 403 is further configured to perform a second aging process on the power supply in the test station, the second aging process including an unloaded aging process.

[0102] In some embodiments, the duration of the second aging process is the same as the duration of the power supply's performance testing at the test station, which includes standby power consumption testing.

[0103] In some embodiments, the test module 403 is specifically used to measure the cumulative power consumption of the power supply within a preset time period when the power supply is in standby mode; and to determine that the power supply passes the standby power consumption test if the cumulative power consumption is less than a preset standby power consumption threshold.

[0104] The following reference Figure 5 This describes an electronic device 500 capable of implementing embodiments of the present disclosure. Figure 5 The electronic device 500 shown is merely an example and should not be construed as limiting the functionality and scope of the embodiments disclosed herein.

[0105] like Figure 5 As shown, the electronic device 500 is presented in the form of a general-purpose computing device. The components of the electronic device 500 may include, but are not limited to: at least one processor 510, at least one memory 520, and a bus 530 connecting different system components (including memory 520 and processor 510).

[0106] The memory stores program code that can be executed by the processor 510, causing the processor 510 to perform the steps described in the "Exemplary Methods" section of this disclosure according to various exemplary embodiments of this disclosure.

[0107] In some embodiments, the processor 510 may also perform the following steps of the above method embodiments:

[0108] The power supply undergoes a first aging process, which includes at least one of a load aging process and an no-load aging process.

[0109] The power supply, after undergoing the first aging process, is moved to the testing station.

[0110] Standby power consumption tests were performed on the power supply at the test station.

[0111] The memory 520 may include a readable medium in the form of volatile memory, such as random access memory (RAM) 5201 and / or cache memory 5202, and may further include read-only memory (ROM) 5203.

[0112] The memory 520 may also include a program / utility 5204 having a set (at least one) of program modules 5205, including but not limited to: an operating system, one or more application programs, other program modules, and program data, each or some combination of these examples may include an implementation of a network environment.

[0113] Bus 530 can represent one or more of several types of bus structures, including a memory bus or memory controller, peripheral bus, graphics acceleration port, processor, or a local bus using any of the various bus structures.

[0114] Electronic device 500 can also communicate with one or more external devices 540 (e.g., keyboard, pointing device, Bluetooth device, etc.), and with one or more devices that enable a user to interact with the electronic device 500, and / or with any device that enables the electronic device 500 to communicate with one or more other computing devices (e.g., router, modem, etc.). This communication can be performed via input / output (I / O) interface 550. Furthermore, electronic device 500 can also communicate with one or more networks (e.g., local area network (LAN), wide area network (WAN), and / or public networks, such as the Internet) via network adapter 560. Figure 5 As shown, network adapter 560 communicates with other modules of electronic device 500 via bus 530. It should be understood that, although not shown in the figure, other hardware and / or software modules can be used in conjunction with electronic device 500, including but not limited to: microcode, device drivers, redundant processors, external disk drive arrays, RAID systems, tape drives, and data backup storage systems.

[0115] From the above description of the embodiments, those skilled in the art will readily understand that the exemplary embodiments described herein can be implemented by software or by combining software with necessary hardware. Therefore, the technical solutions according to the embodiments of this disclosure can be embodied in the form of a software product, which can be stored in a non-volatile storage medium (such as a CD-ROM, USB flash drive, external hard drive, etc.) or on a network, including several instructions to cause a computing device (such as a personal computer, server, terminal device, or network device, etc.) to execute the methods according to the embodiments of this disclosure.

[0116] In exemplary embodiments of this disclosure, a computer-readable storage medium is also provided, which may be a readable signal medium or a readable storage medium. A program product capable of implementing the methods described above is stored thereon. In some possible implementations, various aspects of this disclosure may also be implemented as a program product including program code, which, when run on a terminal device, causes the terminal device to perform the steps described in the "Exemplary Methods" section of this disclosure according to various exemplary embodiments of this disclosure.

[0117] Other embodiments of this disclosure will readily occur to those skilled in the art upon consideration of the specification and practice of the invention disclosed herein. This disclosure is intended to cover any variations, uses, or adaptations of this disclosure that follow the general principles of this disclosure and include common knowledge or customary techniques in the art not disclosed herein. The specification and examples are to be considered exemplary only, and the true scope and spirit of this disclosure are indicated by the appended claims.

Claims

1. A power supply testing method, characterized in that, include: The power supply is subjected to a first aging process, which includes at least one of a load aging process and an no-load aging process. The power supply, after undergoing the first aging process, is moved to the testing station. Standby power consumption was tested on the power supply in the test station.

2. The method according to claim 1, characterized in that, The first aging process for the power supply includes: The power supply is subjected to load aging treatment and no-load aging treatment in sequence.

3. The method according to claim 2, characterized in that, The process of sequentially performing load aging treatment and no-load aging treatment on the power supply includes: At a first temperature, the power supply is subjected to a first-time load aging treatment in order to perform an aging test on the power supply. At a second temperature, the power supply that has undergone load aging treatment is subjected to a second period of no-load aging treatment. Wherein, the first temperature is greater than the second temperature, and the first duration is greater than the second duration.

4. The method according to claim 3, characterized in that, After the power supply undergoes a first-duration load aging process, the method further includes: The power supply is subjected to periodic load aging treatment according to a preset time interval, so as to perform periodic aging tests on the power supply.

5. The method according to claim 1, characterized in that, After moving the power supply, which has undergone the first aging process, into the testing station, the method further includes: The power supply in the test station is subjected to a second aging process, which includes an unloaded aging process.

6. The method according to claim 5, characterized in that, The time consumed by the second aging process is the same as the time consumed by the power supply during performance testing at the test station, and the performance testing includes the standby power consumption test.

7. The method according to claim 1, characterized in that, The standby power consumption test of the power supply in the test station includes: When the power supply is in standby mode, measure the cumulative power consumption of the power supply within a preset time period; If the cumulative power consumption is less than the preset standby power consumption threshold, the power supply is determined to have passed the standby power consumption test.

8. A power supply testing device, characterized in that, include: An aging module is used to perform a first aging process on the power supply, the first aging process including at least one of load aging process and no-load aging process. The conveyor module is used to move the power supply after the first aging process into the test station. The test module is used to perform standby power consumption tests on the power supply in the test station.

9. An electronic device, characterized in that, include: processor; as well as Memory for storing the executable instructions of the processor; The processor is configured to execute the method of any one of claims 1 to 7 by executing the executable instructions.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the method described in any one of claims 1 to 7.

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