Polarizer reflectivity suppression design method for high ambient light scenes

Abstract

This invention discloses a polarizer reflectivity suppression design method for high ambient light scenarios, belonging to the field of polarizer optical design technology. The method includes: calculating the effective reflectivity contribution factor of the polarizer film interfaces based on ambient light incident angle distribution data; dividing the film interfaces into a high-reflectivity contribution interface group and a low-reflectivity contribution interface group based on the effective reflectivity contribution factor; extracting the refractive index difference and incident light polarization state deviation for each film interface in the high-reflectivity contribution interface group; independently determining the phase modulation parameter for each high-reflectivity contribution interface based on the refractive index difference and incident light polarization state deviation; setting different film thickness fine-tuning amounts according to the phase modulation parameter; and adjusting the actual optical thickness of each film interface in the high-reflectivity contribution interface group to differentiate the interference conditions of reflected light at each high-reflectivity contribution interface. This method can effectively suppress the main reflective interfaces and reduce the reflectivity of the polarizer under high ambient light conditions.

Description

Technical Field

[0001] This invention relates to the field of polarizer optical design technology, specifically to a polarizer reflectivity suppression design method for high ambient light scenarios. Background Technology

[0002] In high ambient light conditions, polarizer film interfaces exhibit strong reflections, leading to washed-out displays, reduced contrast, and perceptible glare. To reduce reflections on the polarizer surface and at film interfaces, existing technologies typically employ anti-reflection film design, refractive index gradient matching, multilayer film thickness optimization, or surface microstructure treatment. These design methods generally target reflectance at normal or a single oblique incidence angle, uniformly optimizing all polarizer film interfaces or adjusting film thickness based on the overall reflectance response of the film system. However, these approaches have significant limitations in high ambient light scenarios. Ambient light often reaches the polarizer surface at a wide range of incident angles, and the reflection contribution of interfaces varies at different angles. Evaluating based on a single angle can overestimate or underestimate the actual reflection impact of some film interfaces. Furthermore, existing methods lack the ability to identify differences in contribution between individual film interfaces, easily leading to the indiscriminate adjustment of low-reflection-contribution interfaces along with high-reflection-contribution interfaces, causing unnecessary changes to the film system structure and potentially introducing transmission spectrum shifts. While some methods consider the refractive index difference at the interface, they fail to account for the deviation in the polarization state of the incident light at the interface due to angle variations. This leads to a mismatch between the film thickness phasing parameters and the actual polarization reflection characteristics of the interface, making it difficult to accurately and differentially control the reflected light interference conditions. Under high ambient light conditions, it is necessary to identify the main reflection-contributing interfaces in the polarizer based on the actual energy distribution at different angles, and determine the film thickness phasing amount according to the refractive index difference across each high-reflection-contributing interface and the degree of polarization state deviation of the incident light, in order to reduce the superposition intensity of reflected light from high-reflection interfaces. These problems require corresponding design methods to improve upon. Summary of the Invention

[0003] To address the shortcomings of existing polarizer reflectivity suppression designs in high ambient light scenarios, which fail to adequately consider the incident angle distribution and uniformly treat the interfaces of each film layer, resulting in insufficient suppression of major reflective interfaces, this invention aims to propose a polarizer reflectivity suppression design method for high ambient light scenarios. This method calculates the effective reflectivity contribution factor based on the ambient light incident angle distribution and selects high-reflectivity contributing interfaces. Based on the refractive index difference across the interface and the polarization state deviation of the incident light, phase modulation parameters and film thickness fine-tuning are independently determined for each high-reflectivity contributing interface. This differentiates the interference conditions of reflected light at each high-reflectivity interface, thereby reducing the reflectivity of the polarizer under high ambient light conditions.

[0004] To achieve the above objectives, the present invention provides the following technical solution: The present invention provides a polarizer reflectivity suppression design method for high ambient light scenes, comprising: Based on the ambient light incident angle distribution data, the effective reflectivity contribution factor of the polarizer film interface is calculated. According to the effective reflectivity contribution factor, the polarizer film interfaces are divided into a high-reflectivity contribution interface group and a low-reflectivity contribution interface group. For each film interface in the high-reflectivity contribution interface group, the refractive index difference between the media on both sides of the interface and the polarization state deviation of the incident light at that interface are extracted. Based on the refractive index difference and the polarization state deviation of the incident light, phase modulation parameters are independently determined for each high-reflectivity contribution interface. According to the phase modulation parameters, different film thickness fine-tuning amounts are set for each film interface in the high-reflectivity contribution interface group. The actual optical thickness of each film interface in the high-reflectivity contribution interface group is adjusted according to the film thickness fine-tuning amount, causing a differentiated shift in the interference conditions of reflected light at each high-reflectivity contribution interface. The adjusted actual optical thickness is used to update the polarizer film structure parameters, resulting in the polarizer film configuration after reflectivity suppression.

[0005] This method takes the ambient light incident angle distribution as input, classifies the polarizer film interface according to its effective reflection contribution, and applies differentiated phase modulation and film thickness fine-tuning only to the high reflection contribution interface. This causes a differentiated shift in the interference conditions of reflected light at each high reflection contribution interface, avoiding the superposition and enhancement of reflected light under the same phase condition. This reduces the apparent reflectivity of the polarizer in high ambient light scenarios, while retaining the low reflection contribution interface to maintain the overall spectral characteristics of the film system.

[0006] Preferably, when calculating the effective reflectivity contribution factor, the ambient light incident angle distribution data is divided into multiple incident angle sub-intervals according to the angle interval, and the energy weight of the incident light in each incident angle sub-interval is calculated. For each film interface in the polarizer, the interface reflectivity of the film interface in each incident angle sub-interval is calculated. The product of the interface reflectivity of the same film interface in each incident angle sub-interval and the corresponding energy weight is accumulated to obtain the effective reflectivity contribution factor of the film interface. By weighting the incident angle sub-intervals with energy, the contribution factor can truly reflect the actual impact of different incident directions on interface reflection in high ambient light scenes.

[0007] Preferably, when dividing the high-reflectance contributing interface group and the low-reflectance contributing interface group, the effective reflectance contribution factors of all film interfaces are sorted in descending order; the maximum value is extracted from the sorted effective reflectance contribution factors, and the product of the maximum value and a preset proportional coefficient is calculated to obtain the grouping threshold; film interfaces with effective reflectance contribution factors greater than or equal to the grouping threshold are assigned to the high-reflectance contributing interface group; film interfaces with effective reflectance contribution factors less than the grouping threshold are assigned to the low-reflectance contributing interface group. This allows for centralized processing of interfaces that play a major role in reflectance and reduces unnecessary disturbance to low-contribution interfaces.

[0008] Preferably, when extracting the refractive index difference and incident light polarization state deviation for each film interface in the high-reflection contributing interface group, the refractive indices of the upper and lower media at the current film interface are obtained, and the absolute value of the difference between the refractive indices of the upper and lower media is calculated as the refractive index difference between the media on both sides of the interface. The amplitudes of the p-polarized component and s-polarized component of the incident light at the current film interface are obtained, and the polarization state deviation of the incident light at the interface is calculated based on the ratio of the p-polarized component amplitude to the s-polarized component amplitude. By simultaneously considering the refractive index difference and polarization state deviation, the phase modulation requirements of the interface can be determined more accurately.

[0009] Preferably, when independently determining the phase modulation parameters for each high-reflectivity contributing interface based on the refractive index difference and the incident light polarization state deviation, the refractive index difference of the current film interface in the high-reflectivity contributing interface group is used as the first adjustment factor, and the incident light polarization state deviation of the current film interface is used as the second adjustment factor. A weighting coefficient for the current film interface is determined based on its location and depth. The product of the first adjustment factor and the weighting coefficient, plus the product of the complementary coefficient of the second adjustment factor and the weighting coefficient, yields the comprehensive modulation index of the current film interface. This comprehensive modulation index is then mapped to a preset phase modulation range to obtain the phase modulation parameters of the current film interface. Since interfaces at different depths have different phase sensitivities, introducing location and depth weights allows the phase modulation parameters to match the actual optical response of the film.

[0010] Preferably, when different film thickness fine-tuning amounts are set for each film layer interface in the high-reflection contributing interface group according to the phase modulation parameters, the basic physical thickness of the current film layer interface in the high-reflection contributing interface group and the wavelength of the incident light in the film layer are obtained; the initial film thickness fine-tuning amount of the interface is calculated based on the product of the phase modulation parameters of the current film layer interface and the basic physical thickness; the initial film thickness fine-tuning amount is periodically corrected according to the wavelength of the incident light in the film layer to obtain a corrected film thickness fine-tuning amount located near a half-integer multiple of the wavelength; the corrected film thickness fine-tuning amount is used as the final film thickness fine-tuning amount of the current film layer interface. By correcting the fine-tuning amount to near a half-integer multiple of the wavelength, the phase of the reflected light can be controllably shifted, avoiding the impact on transmission performance due to excessive film thickness changes.

[0011] Preferably, when periodically correcting the initial film thickness adjustment, a modulus calculation is performed with half the wavelength of the incident light in the film layer as the period, and the difference between the modulus calculation result and half the wavelength is used as the correction film thickness adjustment amount. This correction method makes each highly reflective contributing interface have a different phase shift, which is beneficial to breaking the coherent enhancement condition of reflected light.

[0012] Preferably, when adjusting the actual optical thickness of each film layer interface in the high-reflection contributing interface group according to the film thickness fine-tuning amount, for each film layer interface in the high-reflection contributing interface group, the total physical thickness of the film layer above the interface and the total physical thickness of the film layer below the interface are obtained; the film thickness fine-tuning amount of the current film layer interface is allocated to the upper and lower film layers to obtain the allocated thickness above and the allocated thickness below; the total physical thickness of the upper film layer is subtracted from the allocated thickness above to obtain the adjusted thickness of the upper film layer; the total physical thickness of the lower film layer is added to the allocated thickness below to obtain the adjusted thickness of the lower film layer; based on the adjusted thickness of the upper and lower film layers, the actual optical thickness of the current film layer interface is calculated. Through the coordinated adjustment of the thicknesses of the upper and lower film layers, the transitional influence on the adjacent film layer structure can be controlled while changing the optical thickness of the interface.

[0013] Preferably, when updating the polarizer's film structure parameters using the adjusted actual optical thickness, the actual optical thickness of each film layer interface in the high-reflectance contribution interface group is used to replace the corresponding original optical thickness, resulting in a first updated film structure. Based on the first updated film structure, the transmission spectrum shift of each film layer in the polarizer is calculated after adjustment. Based on the transmission spectrum shift, the optical thickness of each film layer interface in the low-reflectance contribution interface group is adjusted in reverse compensation to restore the main peak position of the overall transmission spectrum of the polarizer to the original wavelength range. The film structure parameters adjusted in reverse compensation are used as the polarizer film layer configuration after reflectivity suppression. This method compensates for the transmission spectrum shift while suppressing reflectivity, maintaining the original optical function of the polarizer.

[0014] Preferably, when adjusting the optical thickness of each film interface in the low-reflection contributing interface group through reverse compensation, the total compensation thickness offset is allocated proportionally according to the effective reflectivity contribution factor of each low-reflection contributing interface. This concentrates the compensation on the interfaces that have a greater impact on the spectrum, improving the accuracy of spectral reconstruction.

[0015] The technical effects and advantages provided by the present invention in the above technical solution are as follows: By dividing ambient light incident angle distribution data into angular intervals and statistically weighting them, the interface reflectance of each film layer interface under different incident angle sub-intervals is weighted and accumulated to obtain an effective reflectance contribution factor. Then, based on the contribution factor ranking, the film layers are divided into a high-reflectance contribution interface group and a low-reflectance contribution interface group. The reflectance suppression target is thus matched with the actual ambient light energy distribution. The angular range where energy is concentrated in high ambient light scenes is prioritized for inclusion in the reflection contribution calculation, avoiding the omission of major reflection sources caused by evaluating only normal incidence or a single angle. Applying subsequent phase modulation and thickness adjustment only to the high-reflectance contribution interface group can effectively weaken interfaces with larger actual reflection contributions, reducing the perturbations to the film structure and transmission spectrum caused by indiscriminate adjustments to low-reflectance contribution interfaces, achieving reflectance suppression effects with relatively small changes in film thickness. For the selected high-reflectivity contributing interfaces, the refractive index difference between the media on both sides of each interface and the polarization state deviation corresponding to the amplitude ratio of the p-polarization component to the s-polarization component of the incident light at that interface are extracted. The refractive index difference and polarization state deviation are used as adjustment factors, combined with the interface position and depth weights to obtain a comprehensive modulation index, which is then mapped to a phase modulation parameter. The film thickness is fine-tuned according to the different phase modulation parameters for each interface, and the actual fine-tuned thickness is obtained using wavelength periodicity correction. Different high-reflectivity interfaces obtain independent thickness phase modulation amounts due to differences in refractive index difference and polarization state deviation, causing differentiated shifts in the interference conditions of reflected light at each interface. The original in-phase superposition relationship between reflected light is broken, making it difficult to form concentrated reflection peaks under wide-angle ambient light, thus suppressing overall reflectivity. Compared to uniform film thickness scaling or a single refractive index matching method, this differentiated phase modulation independently controls the actual polarization reflection characteristics of the interface, reducing the probability of coherent enhancement of reflected light at high-reflectivity interfaces and minimizing the impact on the shift of the main peak position of the polarizer's transmission spectrum. The low-reflectance contribution interfaces allocate compensation thickness offset proportionally according to their respective effective reflectance contribution factors, which can restore the position of the main peak of the transmission spectrum without reintroducing high-reflectance contribution. Attached Figure Description

[0016] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments recorded in this invention. For those skilled in the art, other drawings can be obtained based on these drawings.

[0017] Figure 1 This is a flowchart of a design method for suppressing the reflectivity of polarizers in high ambient light scenarios; Figure 2 This is a flowchart for calculating the phase modulation parameters of the high-reflectivity contributing interface group. Detailed Implementation

[0018] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0019] See Figure 1 This invention provides a method for suppressing the reflectivity of polarizers in high ambient light scenarios. When implementing this method, ambient light incident angle distribution data of the scene where the polarizer is located is acquired. This data describes the distribution of ambient light energy or intensity at different incident angles. Based on the ambient light incident angle distribution data, the effective reflectivity contribution factor of the polarizer film interfaces is calculated. The effective reflectivity contribution factor reflects the comprehensive contribution of a certain film interface to reflectivity under overall ambient light illumination conditions. Based on the effective reflectivity contribution factor, the polarizer film interfaces are divided into a high-reflectivity contribution interface group and a low-reflectivity contribution interface group. The high-reflectivity contribution interface group contains film interfaces with higher effective reflectivity contribution factors, and the low-reflectivity contribution interface group contains film interfaces with lower effective reflectivity contribution factors. For each film interface in the high-reflectivity contribution interface group, the refractive index difference between the media on both sides of the interface and the incident light polarization state deviation at the interface are extracted. Based on the refractive index difference and the incident light polarization state deviation, phase modulation parameters are independently determined for each high-reflectivity contribution interface. The phase modulation parameters corresponding to different film interfaces can be different. Based on the phase modulation parameters, different film thickness fine-tuning amounts are set for each film interface in the high-reflection contributing interface group. These fine-tuning amounts are used to change the physical thickness distribution of the films above and below the interface. The actual optical thickness of each film interface in the high-reflection contributing interface group is adjusted according to the fine-tuning amounts, causing a differential shift in the interference conditions of reflected light at each high-reflection contributing interface. The interference conditions of reflected light at each high-reflection contributing interface are no longer uniformly superimposed, thereby reducing the reflection contribution of the polarizer film interfaces in high ambient light scenarios. The adjusted actual optical thickness is used to update the polarizer's film structure parameters, resulting in the polarizer film configuration after reflectivity suppression.

[0020] In specific implementation, ambient light incident angle distribution data is acquired. This data originates from luminance meter measurements, fisheye camera images, or ambient light simulation models of actual scenes. The data contains information on radiance or intensity at different incident angles. The ambient light incident angle distribution data is divided into multiple incident angle sub-intervals according to angle ranges. When dividing these sub-intervals, the entire incident angle range is discretized according to the angle sampling interval. In one implementation, equal angle intervals are used, with an angle sampling interval of 5 degrees, dividing the incident angle range from 0 to 90 degrees into 18 incident angle sub-intervals. In another implementation, the angle sampling interval is set to 2 degrees, dividing the incident angle range from 0 to 90 degrees into 45 incident angle sub-intervals. Each incident angle sub-interval has a lower incident angle limit and an upper incident angle limit; the representative angle of the sub-interval is determined based on the average of the lower and upper incident angle limits.

[0021] In some embodiments, for each incident angle sub-interval, the energy weight of the incident light rays within the incident angle sub-interval is calculated. When calculating the energy weight, the ambient light radiant flux within the same incident angle sub-interval is obtained. The ambient light radiant flux is the angular integral of the ambient light incident angle distribution data with respect to radiance within the incident angle sub-interval. The ratio of the ambient light radiant flux within the same incident angle sub-interval to the sum of the ambient light radiant fluxes of all incident angle sub-intervals is calculated; this ratio is the energy weight of the corresponding incident angle sub-interval. The energy weight ranges from greater than or equal to 0 to less than or equal to 1. The sum of the energy weights of all incident angle sub-intervals equals 1. The energy weight reflects the relative distribution ratio of ambient light radiant energy in different incident angle directions.

[0022] Optionally, when dividing the incident angle sub-intervals and calculating energy weights, the number of incident angle sub-intervals is set according to the accuracy requirements of the polarizer reflectivity calculation. A larger number of incident angle sub-intervals results in higher angular resolution and higher accuracy in subsequent calculations of the effective reflectivity contribution factor, but also increases the computational load. When computational resources allow, the number of incident angle sub-intervals is set to 72 or 180.

[0023] It is understandable that, for each film interface in a polarizer, the interface reflectivity is calculated for each incident angle sub-interval. A polarizer has multiple film interfaces, formed by abrupt changes in refractive index between adjacent layers. After determining the film interface to be calculated, the refractive indices of the upper and lower media of the interface are obtained. For each incident angle sub-interval, a representative incident angle is determined. The representative incident angle is taken as the center angle of the incident angle sub-interval. At the representative incident angle, the interface reflectivity is calculated using Fresnel reflection formulas based on the refractive indices of the upper and lower media and the polarization state of the incident light. For unpolarized ambient light, the interface reflectivity is taken as the average of the s-polarized and p-polarized reflectivities. For ambient light with a specific polarization state, the interface reflectivity is calculated using a weighted average of the amplitudes of the p-polarized and s-polarized components. In other implementations, the interface reflectivity is calculated using the transfer matrix method, which treats the entire polarizer film system as a multilayer film structure and calculates the local reflection contribution at the interface of each film layer to obtain the interface reflectivity of a single film layer interface.

[0024] In practice, the product of the interfacial reflectivity of the same film layer interface under each incident angle sub-interval and the corresponding energy weight is accumulated. The accumulation uses a weighted summation method. For the first polarizer... The effective reflectance contribution factor of each film interface is calculated using the following formula:

[0025] in, Indicates the first The effective reflectivity contribution factor of each polarizer film interface The value range of is greater than or equal to 0 and less than or equal to 1. The value range is from 1 to the total number of polarizer film layers. The total number of polarizer film layers is the number of interfaces formed between adjacent film layers in the polarizer. This represents the total number of incident angle sub-intervals. The value is determined by the angle sampling interval of the ambient light incident angle distribution data. When the angle sampling interval is 5 degrees... Take 18, when the angle sampling interval is 2 degrees. Take 45, when the angle sampling interval is 1 degree. Take 90; Indicates the first The energy weight of each incident angle sub-interval The value of is greater than or equal to 0 and less than or equal to 1, and the sum of the energy weights of all incident angle sub-intervals is 1. It is obtained by calculating the ratio of the ambient light radiant flux within the same incident angle sub-interval to the sum of the ambient light radiant flux across all incident angle sub-intervals; Indicates the first The polarizer film interface at the first... Interface reflectivity under each incident angle sub-range The value range of is greater than or equal to 0 and less than or equal to 1. Obtained through calculation using Fresnel reflection formula or transfer matrix method. Accumulated result. That is, the first The effective reflectivity contribution factor of the polarizer film interface is as follows: the larger the effective reflectivity contribution factor, the greater the contribution of the corresponding film interface to the total reflectivity of the polarizer under ambient light.

[0026] In some embodiments, the above weighted summation calculation is performed sequentially on all polarizer film interfaces to obtain the effective reflectance contribution factor for each polarizer film interface. The effective reflectance contribution factors of all polarizer film interfaces constitute an effective reflectance contribution factor set, which is used to subsequently divide the interface into high-reflectance contribution interface group and low-reflectance contribution interface group based on the effective reflectance contribution factors.

[0027] In practice, the effective reflectance contribution factors of all film interfaces of the polarizer are obtained. These effective reflectance contribution factors are obtained by weighted summation of ambient light incident angle distribution data and the interface reflectance of each film interface under different incident angle sub-intervals. The effective reflectance contribution factors of all film interfaces constitute an effective reflectance contribution factor set. Each element in the effective reflectance contribution factor set corresponds to one film interface.

[0028] In some embodiments, the effective reflectance contribution factors of all film interfaces are sorted in descending order. A descending order sorting algorithm is used. This algorithm can be any one of bubble sort, quicksort, merge sort, or heapsort. After descending order sorting, a sorted sequence of effective reflectance contribution factors is obtained. In this sequence, the first element is the maximum effective reflectance contribution factor among all film interfaces, the second element is the second largest, and so on, with the last element being the minimum. Each element in the sorted sequence retains its corresponding film interface identifier, which is used to distinguish different film interfaces.

[0029] Optionally, during the sorting process, for film interfaces with the same effective reflectivity contribution factor, they are arranged according to their positional order within the polarizer film system structure. The positional order of the film interfaces within the polarizer film system structure is determined by their sequential position numbers from the incident side to the exit side of the polarizer.

[0030] In practice, the maximum value is extracted from the sorted effective reflectivity contribution factors. The maximum value is the first element in the sorted sequence of effective reflectivity contribution factors. After obtaining the maximum value, a preset proportional coefficient is obtained. The preset proportional coefficient is a pre-defined value, ranging from greater than 0 to less than 1. The preset proportional coefficient is set to 0.5, based on distinguishing the high-reflectivity contribution interface group and the low-reflectivity contribution interface group according to the relative magnitude of the effective reflectivity contribution factor to the maximum value. When the preset proportional coefficient is set to 0.5, film interfaces with effective reflectivity contribution factors reaching more than half of the maximum value are assigned to the high-reflectivity contribution interface group, and the remaining film interfaces are assigned to the low-reflectivity contribution interface group.

[0031] In some embodiments, the preset scaling factor is set to 0.6. This is based on the fact that when the ambient light incident angle distribution data is concentrated in certain angle ranges, the effective reflectivity contribution factors between the polarizer film interfaces differ significantly, requiring a higher preset scaling factor to avoid the high-reflectivity contribution interface group containing too many film interfaces. In other embodiments, the preset scaling factor is set to 0.4. This is based on the fact that when the ambient light incident angle distribution data is relatively uniformly distributed across multiple angle ranges, the effective reflectivity contribution factors between the polarizer film interfaces differ less, requiring a lower preset scaling factor to ensure that the high-reflectivity contribution interface group includes film interfaces that significantly contribute to reflectivity.

[0032] It can be understood that the grouping threshold is obtained by multiplying the maximum value by a preset proportional coefficient. The grouping threshold is calculated using the following formula:

[0033] in, Indicates the grouping threshold. The value range is greater than 0 and less than 1. The grouping threshold is used to distinguish between the high reflectance contribution interface group and the low reflectance contribution interface group. This represents the maximum value extracted from the sorted effective reflectivity contribution factors. The value of is greater than 0 and less than or equal to 1. It is the largest value among the effective reflectance contribution factors of all film interfaces; This indicates the preset scaling factor. The value range is greater than 0 and less than 1. The value is set to 0.5. The basis for this setting is to classify the film interface with an effective reflectivity contribution factor of more than half of its maximum value into the high reflectivity contribution interface group.

[0034] In practice, film interfaces with an effective reflectance contribution factor greater than or equal to a grouping threshold are assigned to the high reflectance contribution interface group. During this assignment, the effective reflectance contribution factors of all film interfaces are iterated over. For each film interface, its effective reflectance contribution factor is compared to the grouping threshold. When the effective reflectance contribution factor of an interface is greater than or equal to the grouping threshold, the interface is assigned to the high reflectance contribution interface group. The interface identifier and effective reflectance contribution factor of this interface are then recorded in the high reflectance contribution interface group set.

[0035] In some embodiments, film interfaces with an effective reflectance contribution factor less than a grouping threshold are classified into a low reflectance contribution interface group. For each film interface, when the effective reflectance contribution factor of that film interface is less than the grouping threshold, the film interface is classified into a low reflectance contribution interface group. The film interface identifier and effective reflectance contribution factor of that film interface are recorded in the low reflectance contribution interface group set.

[0036] Optionally, a parallel comparison method is used during the partitioning process. An array is constructed from the effective reflectance contribution factors of all film interfaces, with a scalar threshold for grouping. Each element in the array is compared numerically with the grouping threshold, generating a Boolean array. Elements in the Boolean array corresponding to the high-reflectance contribution interface group are set to true, while elements corresponding to the low-reflectance contribution interface group are set to false. The high-reflectance contribution interface group set and the low-reflectance contribution interface group set are then selected based on the Boolean array.

[0037] It is understandable that the resulting high-reflectance contributing interface group set contains film interfaces with high effective reflectivity contribution factors, while the low-reflectance contributing interface group set contains film interfaces with low effective reflectivity contribution factors. These high-reflectance contributing interface group sets and low-reflectance contributing interface group sets serve as grouping results in the polarizer reflectivity suppression design process, and are subsequently used to extract refractive index differences and incident light polarization state deviations for each film interface within the high-reflectance contributing interface group.

[0038] In specific implementation, please refer to Figure 2 From the high-reflectance contributing interface group, one film interface is selected sequentially as the current film interface. The refractive index of the upper medium of the current film interface is obtained. The refractive index of the upper medium is the refractive index of the adjacent film medium near the incident direction of the polarizer. The refractive index of the lower medium of the current film interface is obtained. The refractive index of the lower medium is the refractive index of the adjacent film medium away from the incident direction of the polarizer. The refractive indices of the upper and lower media are obtained from the polarizer film system structure parameters. The polarizer film system structure parameters include the material refractive index of each film layer, the film layer arrangement order, and the physical thickness of the film layers.

[0039] In some embodiments, the absolute value of the difference between the refractive indices of the upper and lower media is calculated. During calculation, the original value of the refractive index difference is obtained by subtracting the refractive index of the lower media from the refractive index of the upper media, and then the absolute value of the original refractive index difference is taken. The absolute value calculation eliminates the influence of the order of the refractive indices of the upper and lower media, ensuring that the refractive index difference reflects the magnitude of the refractive index difference between the media on both sides of the current film interface. The refractive index difference is a non-negative value.

[0040] Optionally, obtain the amplitude of the p-polarization component of the incident light at the current film interface. The p-polarization component amplitude is the amplitude of the projection of the incident photoelectric field vector onto the incident plane. Obtain the amplitude of the s-polarization component of the incident light at the current film interface. The s-polarization component amplitude is the amplitude of the incident photoelectric field vector perpendicular to the incident plane. The p-polarization component amplitude and s-polarization component amplitude are determined based on the polarization state distribution data of the incident light. The polarization state distribution data of the incident light includes the amplitudes of the p-polarization component amplitude and s-polarization component amplitude at different incident angles. When the incident light is natural light, the p-polarization component amplitude is equal to the s-polarization component amplitude. When the incident light is partially polarized light, there is a difference between the p-polarization component amplitude and the s-polarization component amplitude.

[0041] In practice, the polarization state deviation of the incident light at the current film interface is calculated based on the ratio of the p-polarization component amplitude to the s-polarization component amplitude. The calculation involves dividing the p-polarization component amplitude by the s-polarization component amplitude to obtain the polarization amplitude ratio. When the polarization amplitude ratio equals 1, the polarization state deviation of the incident light is 0, indicating that the p-polarization component amplitude and the s-polarization component amplitude are completely equal. When the polarization amplitude ratio deviates from 1, the polarization state deviation of the incident light is taken as the absolute value of the difference between the polarization amplitude ratio and 1. The polarization state deviation of the incident light is a non-negative value; the larger the polarization state deviation, the greater the amplitude difference between the incident light in the p-polarization direction and the s-polarization direction.

[0042] It can be understood that the refractive index difference at the current film interface is used as the first adjustment factor. The larger the refractive index difference, the larger the first adjustment factor. The polarization state deviation of the incident light at the current film interface is used as the second adjustment factor. The larger the polarization state deviation of the incident light, the larger the second adjustment factor.

[0043] In some embodiments, the weighting coefficient of the current film interface is determined based on its location depth. The location depth is the physical distance from the current film interface to the incident surface of the polarizer. The location depth is obtained from the polarizer film system structural parameters. The polarizer film system structural parameters record the position coordinates of each film interface. The greater the location depth of the current film interface, the farther the current film interface is from the incident surface of the polarizer. The weighting coefficient ranges from greater than or equal to 0 to less than or equal to 1. When determining the weighting coefficient, the ratio of the physical distance from the current film interface to the incident surface of the polarizer to the total thickness of the polarizer is calculated, and this ratio is used as the weighting coefficient. When the total thickness of the polarizer is fixed, film interfaces located near the incident side of the polarizer have a smaller weighting coefficient, while film interfaces located near the exit side of the polarizer have a larger weighting coefficient.

[0044] In practical implementation, the overall modulation index of the current film interface is calculated. The overall modulation index is calculated using the following formula:

[0045] in, Indicating the high reflectivity contributing interface group, the first The overall modulation index of each membrane interface. The range of values ​​for is greater than or equal to 0. The larger the value, the greater the phase modulation amplitude that needs to be applied to the current film interface. The value range is from 1 to the total number of film interfaces in the high reflectance contributing interface group. The total number of film interfaces in the high reflectance contributing interface group is the number of film interfaces assigned to the high reflectance contributing interface group. Indicating the high reflectivity contributing interface group, the first The weighting coefficients of each membrane interface. The value range of is greater than or equal to 0 and less than or equal to 1. This is obtained by calculating the ratio of the physical distance from the current film interface to the incident surface of the polarizer to the total thickness of the polarizer. When the current film interface is located on the incident surface of the polarizer... The value is 0 when the current film interface is located on the exiting surface of the polarizer. =1; Indicating the high reflectivity contributing interface group, the first The difference in refractive index between the media on both sides of the film interface. The calculation method is to take the absolute value of the difference between the refractive index of the upper medium and the refractive index of the lower medium at the current film interface; Indicating the high reflectivity contributing interface group, the first Polarization state deviation of incident light at the interface of each film layer The calculation method is to take the absolute value of the difference between the ratio of the p-polarization component amplitude to the s-polarization component amplitude and 1. The first term in the formula... The second term is the product of the first adjustment factor and the weighting coefficient. It is the product of the second adjustment factor and the complementary coefficient of the weighting coefficient.

[0046] Optionally, when calculating the overall modulation index, the complement of the weighting coefficient is 1 minus the weighting coefficient. The value of the complement of the weighting coefficient is greater than or equal to 0 and less than or equal to 1. When the weighting coefficient is large, the refractive index difference contributes more to the overall modulation index; when the weighting coefficient is small, the polarization state deviation of the incident light contributes more to the overall modulation index.

[0047] In practice, the comprehensive modulation index is mapped to a preset phase modulation interval to obtain the phase modulation parameters of the current film interface. The preset phase modulation interval is from 0 to 2π. Before mapping, the comprehensive modulation index of all film interfaces in the high-reflection contributing interface group is normalized. During normalization, the maximum value of the comprehensive modulation index of all film interfaces in the high-reflection contributing interface group is obtained, and the comprehensive modulation index of each film interface is divided by the maximum value to obtain the normalized comprehensive modulation index. The value range of the normalized comprehensive modulation index is greater than or equal to 0 and less than or equal to 1. The normalized comprehensive modulation index is multiplied by 2π to obtain the phase modulation parameters of the current film interface. The value range of the phase modulation parameters is from 0 to 2π. The phase modulation parameters are used to subsequently set different film thickness fine-tuning amounts for each film interface in the high-reflection contributing interface group according to the phase modulation parameters.

[0048] In practice, each film interface in the high-reflectivity contributing interface group is processed individually. The basic physical thickness of the current film interface is obtained. This basic physical thickness is the physical thickness of the current film interface before any thickness fine-tuning. The basic physical thickness is obtained from the polarizer film system structural parameters. The wavelength of the incident light in the film layer is obtained. This wavelength is obtained by dividing the designed wavelength of the incident light in vacuum by the refractive index of the current film medium. The designed wavelength of the incident light in vacuum is determined based on the operating wavelength range of the polarizer, which is determined based on the light source spectrum of the display device or optical system.

[0049] In some embodiments, the initial film thickness adjustment amount at the current film interface is calculated based on the product of the phase modulation parameter of the current film interface and the basic physical thickness. The phase modulation parameter is obtained by mapping the comprehensive modulation index to a preset phase modulation range. The initial film thickness adjustment amount is equal to the product of the phase modulation parameter and the basic physical thickness. The initial film thickness adjustment amount has positive and negative values, with positive values ​​indicating an increase in physical thickness and negative values ​​indicating a decrease in physical thickness.

[0050] Optionally, the initial film thickness adjustment is periodically corrected based on the wavelength of the incident light in the film layer. The periodic correction is performed using a modulus calculation with a period of half the wavelength of the incident light in the film layer. The half-wavelength is half the wavelength of the incident light in the film layer. The corrected film thickness adjustment is calculated using the following formula:

[0051] in, This indicates the amount of fine-tuning for correcting the film thickness. Located near half the wavelength of the incident light in the film layer, The range of values ​​is greater than or equal to and less than ; This indicates the initial film thickness fine-tuning amount. It is obtained by multiplying the phase modulation parameter of the current film interface with the basic physical thickness. The positive or negative value indicates the direction of increase or decrease in physical thickness; This indicates the wavelength of the incident light within the film. It is obtained by dividing the designed wavelength of the incident light in vacuum by the refractive index of the current film medium; This represents the half wavelength of the incident light within the film layer; This represents the modulo operation. Indicates using Divide by The remainder obtained afterwards.

[0052] In practice, the corrected film thickness adjustment amount is used as the final film thickness adjustment amount for the current film layer interface. The final film thickness adjustment amount is used to adjust the actual optical thickness of the current film layer interface in the high-reflectivity contributing interface group.

[0053] In some embodiments, the total physical thickness of the film layers above the current film layer interface is obtained. The total physical thickness of the film layers above the current film layer interface is the sum of the physical thicknesses of all film layers above the current film layer interface. The total physical thickness of the film layers below the current film layer interface is obtained. The total physical thickness of the film layers below the current film layer interface is the sum of the physical thicknesses of all film layers below the current film layer interface. The total physical thicknesses of the film layers above and below are obtained from the polarizer film system structure parameters.

[0054] Optionally, the final film thickness adjustment amount at the current film interface is allocated to the upper and lower film layers. The allocation ratio is set to 0.5, based on the principle of ensuring that the upper and lower film layers bear equal thickness adjustment amounts, maintaining the symmetry of the thickness adjustment between the upper and lower film layers. The allocated thickness for the upper layer is the final film thickness adjustment amount multiplied by the allocation ratio, and the allocated thickness for the lower layer is also the final film thickness adjustment amount multiplied by the allocation ratio. Since the allocation ratio is 0.5, the allocated thicknesses for the upper and lower layers are equal.

[0055] In practice, the adjusted upper film thickness is obtained by subtracting the allocated upper thickness from the total physical thickness of the upper film layer. The adjusted lower film thickness is obtained by adding the allocated lower thickness to the total physical thickness of the lower film layer. The adjusted upper film optical thickness is obtained by multiplying the adjusted upper film thickness by the refractive index of the upper film medium. The adjusted lower film optical thickness is obtained by multiplying the adjusted lower film thickness by the refractive index of the lower film medium. The actual optical thickness of the current film interface is equal to the sum of the adjusted upper and lower film optical thicknesses. This actual optical thickness is used to subsequently update the polarizer's film structure parameters.

[0056] In the specific implementation, the actual optical thickness of each film interface in the high-reflection contributing interface group is obtained. The actual optical thickness is obtained by adding the adjusted optical thickness of the upper film layer and the adjusted optical thickness of the lower film layer. The actual optical thickness of each film interface in the high-reflection contributing interface group is used to replace the original optical thickness of the corresponding film interface in the original polarizer film system structure. During the replacement, the original optical thickness of each film interface in the low-reflection contributing interface group is kept unchanged. After the replacement is completed, the first updated film system structure is obtained. The first updated film system structure includes the adjusted optical thickness of each film interface in the high-reflection contributing interface group and the original optical thickness of each film interface in the low-reflection contributing interface group.

[0057] In some embodiments, the shift in the adjusted transmission spectrum of each layer of the polarizer is calculated based on the first updated film system structure. During the calculation, the original film system structure of the polarizer is obtained. Based on the original film system structure, the original transmission spectrum is calculated using the transfer matrix method. Based on the first updated film system structure, the adjusted transmission spectrum is calculated using the transfer matrix method. The transfer matrix method represents each layer of the polarizer as a characteristic matrix. The characteristic matrices of all layers are multiplied in the order of their arrangement to obtain the total characteristic matrix of the polarizer film system. The transmittance of the polarizer is calculated based on the total characteristic matrix. The transmittance is calculated repeatedly for different wavelengths to obtain the transmission spectrum.

[0058] Optionally, obtain the position of the main peak in the original transmission spectrum. The main peak position is the wavelength corresponding to the maximum transmittance in the original transmission spectrum. Based on the original transmission spectrum, extract the transmittance corresponding to all wavelength points, find the maximum transmittance value, and determine the wavelength corresponding to the maximum transmittance value. This wavelength is the main peak wavelength of the original transmission spectrum. Obtain the position of the main peak in the adjusted transmission spectrum. The main peak position is the wavelength corresponding to the maximum transmittance in the adjusted transmission spectrum. Based on the adjusted transmission spectrum, extract the transmittance corresponding to all wavelength points, find the maximum transmittance value, and determine the wavelength corresponding to the maximum transmittance value. This wavelength is the main peak wavelength of the adjusted transmission spectrum. Calculate the difference between the main peak wavelength of the adjusted transmission spectrum and the main peak wavelength of the original transmission spectrum. The difference is the transmission spectrum offset. The transmission spectrum offset has a positive and negative sign; a positive value indicates that the main peak wavelength of the adjusted transmission spectrum shifts towards longer wavelengths, and a negative value indicates that the main peak wavelength of the adjusted transmission spectrum shifts towards shorter wavelengths.

[0059] In practice, the optical thickness of each film interface in the low-reflection contribution interface group is adjusted in reverse according to the transmission spectrum shift. The direction of the reverse compensation adjustment is opposite to the direction of the transmission spectrum shift. When the transmission spectrum shift is positive, the main peak wavelength of the adjusted transmission spectrum shifts towards longer wavelengths. The reverse compensation adjustment reduces the optical thickness of each film interface in the low-reflection contribution interface group, causing the overall transmission spectrum main peak position of the polarizer to shift back towards shorter wavelengths. When the transmission spectrum shift is negative, the main peak wavelength of the adjusted transmission spectrum shifts towards shorter wavelengths. The reverse compensation adjustment increases the optical thickness of each film interface in the low-reflection contribution interface group, causing the overall transmission spectrum main peak position of the polarizer to shift back towards longer wavelengths.

[0060] It is understandable that when adjusting the optical thickness of each film interface in the low-reflection contribution interface group through reverse compensation, the total compensation thickness offset is allocated proportionally based on the effective reflectivity contribution factor of each film interface in the low-reflection contribution interface group. The total compensation thickness offset is obtained by converting the transmission spectrum offset. During the conversion, based on the correspondence between the total optical thickness in the polarizer film system structure and the wavelength of the main peak of the transmission spectrum, the wavelength offset corresponding to the transmission spectrum offset is converted into the total optical thickness offset, and the resulting total optical thickness offset is the total compensation thickness offset.

[0061] In some embodiments, the first in the low-reflection contributing interface group The compensation thickness offset assigned to each membrane interface is calculated using the following formula:

[0062] in, Indicating the first low-reflection contributing interface group The compensation thickness offset assigned to each film layer interface. The sign indicates whether the optical thickness of the corresponding film interface is increased (positive value) or decreased (negative value). The value range is from 1 to the total number of film interfaces in the low-reflection contribution interface group; Indicating the first low-reflection contributing interface group The effective reflectance contribution factor of each film interface The value of is greater than or equal to 0 and less than 1. It is obtained by multiplying and summing the interfacial reflectance of the film layer interface in each incident angle sub-interval with the corresponding energy weight; This represents the total number of film interfaces in the low-reflection contribution interface group. The number of film interfaces that are divided into low-reflection contributing interface groups; This indicates the summation index used to iterate through all film interfaces in the low-reflection contribution interface group. The value range is from 1 to the total number of film interfaces in the low-reflection contribution interface group; This represents the sum of the effective reflectance contribution factors of all film interfaces in the low-reflectance contribution interface group; This represents the total compensation thickness offset. The transmission spectrum offset is calculated based on the correspondence between the total optical thickness of the polarizer film system and the wavelength of the main peak of the transmission spectrum.

[0063] In practice, the compensation thickness offset allocated to each film interface in the low-reflection contribution interface group is applied to the optical thickness of the corresponding film interface. This is done by adding the compensation thickness offset to the original optical thickness of the corresponding film interface to obtain the optical thickness after reverse compensation adjustment. After performing reverse compensation adjustment on all film interfaces in the low-reflection contribution interface group, the reverse-compensated film structure parameters are obtained. These parameters include the actual optical thickness of each film interface in the high-reflection contribution interface group and the compensated optical thickness of each film interface in the low-reflection contribution interface group. The reverse-compensated film structure parameters are then used as the polarizer film configuration after reflectivity suppression.

[0064] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any changes or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application.

Claims

1. A method for suppressing the reflectivity of polarizers in high ambient light scenarios, characterized in that, include: Based on the ambient light incident angle distribution data, the effective reflectivity contribution factor of the polarizer film interface is calculated. Based on the effective reflectance contribution factor, the film interfaces of polarizers are divided into a high reflectance contribution interface group and a low reflectance contribution interface group. For each film layer interface in the high-reflection contributing interface group, the refractive index difference between the media on both sides of the interface and the polarization state deviation of the incident light at the interface are extracted respectively. Based on the refractive index difference and the polarization state deviation of the incident light, the phase modulation parameters are independently determined for each highly reflective contributing interface; According to the phase modulation parameters, different film thickness fine-tuning amounts are set for each film layer interface in the high-reflection contributing interface group. Adjust the actual optical thickness of each film layer interface in the high-reflection contributing interface group according to the film thickness fine-tuning amount, so that the interference conditions of reflected light at each high-reflection contributing interface are differentially shifted. The polarizer film structure parameters are updated using the adjusted actual optical thickness to obtain the polarizer film layer configuration after reflectivity suppression.

2. The polarizer reflectivity suppression design method for high ambient light scenes according to claim 1, characterized in that, Based on the ambient light incident angle distribution data, the effective reflectivity contribution factor at the polarizer film interface is calculated, specifically including: The ambient light incident angle distribution data is divided into multiple incident angle sub-intervals according to the angle interval; For each incident angle sub-interval, calculate the energy weight of the incident light rays within that sub-interval; For each film layer interface in the polarizer, calculate the interface reflectance of the film layer interface in each incident angle sub-interval; The effective reflectivity contribution factor of the same film interface is obtained by summing the products of the interface reflectivity and the corresponding energy weight under each incident angle interval.

3. The polarizer reflectivity suppression design method for high ambient light scenes according to claim 1, characterized in that, Based on the effective reflectance contribution factor, the polarizer film interfaces are divided into a high-reflectance contribution interface group and a low-reflectance contribution interface group, specifically including: The effective reflectance contribution factors of all film interfaces are sorted in descending order; Extract the maximum value from the sorted effective reflectivity contribution factors, calculate the product of the maximum value and the preset proportional coefficient, and obtain the grouping threshold; Film interfaces with effective reflectance contribution factors greater than or equal to the grouping threshold are classified into the high reflectance contribution interface group. Film interfaces with effective reflectance contribution factors less than the grouping threshold are classified into the low reflectance contribution interface group.

4. The polarizer reflectivity suppression design method for high ambient light scenes according to claim 1, characterized in that, For each film interface in the high-reflectivity contributing interface group, the refractive index difference between the media on both sides of the interface and the polarization state deviation of the incident light at the interface are extracted, specifically including: Obtain the refractive index of the upper medium and the refractive index of the lower medium at the current film interface in the high-reflectivity contributing interface group; Calculate the absolute value of the difference between the refractive index of the upper medium and the refractive index of the lower medium, and use it as the refractive index difference between the two media on both sides of the interface; Obtain the amplitudes of the p-polarization component and s-polarization component of the incident light at the current film interface; The polarization state deviation of the incident light at the interface is calculated based on the ratio of the amplitude of the p-polarization component to the amplitude of the s-polarization component.

5. The polarizer reflectivity suppression design method for high ambient light scenes according to claim 1, characterized in that, Based on the refractive index difference and the polarization state deviation of the incident light, phase modulation parameters are independently determined for each highly reflective contributing interface, specifically including: The refractive index difference of the current film interface in the high-reflectivity contributing interface group is used as the first adjustment factor. The polarization state deviation of the incident light at the current film interface is used as the second adjustment factor; The weighting coefficient of the interface is determined based on its current location and depth. The product of the first adjustment factor and the weight coefficient is added to the product of the second adjustment factor and the complementary coefficient of the weight coefficient to obtain the comprehensive modulation index of the current film interface. The overall modulation index is mapped to a preset phase modulation range to obtain the phase modulation parameters of the current film interface.

6. The polarizer reflectivity suppression design method for high ambient light scenes according to claim 1, characterized in that, Based on the phase modulation parameters, different film thickness fine-tuning amounts are set for each film layer interface in the high-reflection contributing interface group, specifically including: Obtain the basic physical thickness of the current film interface and the wavelength of the incident light in the film in the high-reflectivity contributing interface group; The initial film thickness adjustment amount is calculated based on the product of the current phase modulation parameter of the film interface and the basic physical thickness. Based on the wavelength of the incident light in the film, the initial film thickness fine-tuning amount is periodically corrected to obtain the corrected film thickness fine-tuning amount located near a half-integer multiple of the wavelength. The corrected film thickness adjustment amount is used as the final film thickness adjustment amount at the current film interface.

7. The polarizer reflectivity suppression design method for high ambient light scenes according to claim 1, characterized in that, The actual optical thickness of each film layer interface in the high-reflectivity contributing interface group is adjusted according to the film thickness fine-tuning amount, specifically including: For each film layer interface in the high-reflectivity contributing interface group, obtain the total physical thickness of the film layer above the interface and the total physical thickness of the film layer below the interface. The thickness adjustment amount at the current membrane layer interface is allocated to the upper and lower membrane layers to obtain the upper allocated thickness and the lower allocated thickness. Subtract the allocated thickness from the total physical thickness of the upper film layer to obtain the adjusted thickness of the upper film layer. The adjusted thickness of the lower membrane layer is obtained by adding the total physical thickness of the lower membrane layer to the allocated thickness of the lower membrane layer. Calculate the actual optical thickness of the current film interface based on the adjusted upper film thickness and the adjusted lower film thickness.

8. The polarizer reflectivity suppression design method for high ambient light scenes according to claim 1, characterized in that, The polarizer's film structure parameters are updated using the adjusted actual optical thickness to obtain the polarizer film layer configuration after reflectivity suppression, specifically including: The actual optical thickness of each film layer interface in the high-reflection contributing interface group is replaced with the corresponding original optical thickness to obtain the first updated film system structure. Based on the first updated film system structure, calculate the shift of each film layer of the polarizer in the adjusted transmission spectrum. Based on the transmission spectrum shift, the optical thickness of each film layer interface in the low reflection contribution interface group is adjusted in reverse compensation so that the position of the main peak of the overall transmission spectrum of the polarizer is restored to the original wavelength range. The film structure parameters adjusted by reverse compensation are used as the configuration of the polarizer film layer after reflectivity suppression.

9. The polarizer reflectivity suppression design method for high ambient light scenes according to claim 6, characterized in that, When periodically correcting the initial film thickness adjustment, the modulus calculation is performed with half the wavelength of the incident light in the film layer as the period, and the difference between the modulus calculation result and half the wavelength is used as the correction film thickness adjustment amount.

10. The polarizer reflectivity suppression design method for high ambient light scenes according to claim 8, characterized in that, When adjusting the optical thickness of each film layer interface in the low-reflection contributing interface group in reverse compensation, the total compensation thickness offset is allocated proportionally according to the effective reflectivity contribution factor of each low-reflection contributing interface.

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