Color filter substrate and method for detecting the same
Patent Information
- Application Number
- CN202610964516.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-06-30
- Publication Date
- 2026-10-20
AI Technical Summary
在本发明技术方案的彩色滤光基板中,通过在所述透明基板的所述非显示区设置设计条件更为宽松的所述第二彩色滤光层,进而实现对所述显示区的所述第一彩色滤光层质量状态的间接且可靠的判定。具体而言,由于相邻所述第二彩色滤光层之间发生混色的设计条件被设定为宽松于相邻所述第一彩色滤光层之间发生混色的设计条件,且所述第二彩色滤光层发生漏光的设计条件也被设定为宽松于所述第一彩色滤光层发生漏光的设计条件,这意味着所述第二彩色滤光层形成了一个放大的缺陷检测窗口,即相较于相邻所述第一彩色滤光层而言,相邻所述第二彩色滤光层更容易发生混色,相较于所述第一彩色滤光层而言,所述第二彩色滤光层更容易发生漏光。当所述显示区的所述第一彩色滤光层因工艺波动接近混色或漏光的临界状态时,由于所述非显示区的设计条件更宽松,因此所述第二彩色滤光层会率先突破临界,提前表现出混色或漏光现象。此时,操作人员仅需通过目检所述非显示区的所述第二彩色滤光层是否发生漏光或混色,即可反向推断出所述显示区的所述第一彩色滤光层的实际状态。这种结构设计能够将高像素密度产品对精密量测的需求转化为目检可辨的宏观现象,无需逐点手动量测,从而在不牺牲自动光学检测机台生产节拍的前提下,实现对所述显示区的快速在线管控,大幅缩短产线检测时间并降低人力成本。
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Abstract
Description
Technical Field
[0001] This invention relates to the field of display device technology, and in particular to a color filter substrate and its testing method. Background Technology
[0002] In recent years, with the development of the information and communication field, the demand for various types of display devices has been increasing. Currently, mainstream display devices include liquid crystal displays (LCDs), plasma displays, electroluminescent displays (ELMs), and vacuum fluorescent displays (VFLDs). Due to their advantages such as being lightweight, thin, small in size, low in power consumption, and low in radiation, LCDs are widely used in various data processing devices, such as televisions, laptops, mobile phones, and personal digital assistants (PDAs).
[0003] A liquid crystal display (LCD) mainly comprises: a TFT array substrate, a color filter substrate, and a liquid crystal layer between the TFT array substrate and the color filter substrate. Electrodes on the TFT array substrate and the color filter substrate control the deflection of liquid crystal molecules to adjust the transmittance of external light, thereby achieving the display purpose.
[0004] The color filter substrate includes a transparent substrate, a light-shielding pattern layer (BM) on the transparent substrate, and a filter layer (RGB layer) on the light-shielding pattern layer and the transparent substrate. The filter layer covers the opening area of the light-shielding pattern layer and overlaps with the light-shielding pattern layer.
[0005] However, there are still many problems with the color filter substrate in the detection process in the existing technology. Summary of the Invention
[0006] The technical problem solved by this invention is to provide a color filter substrate and its detection method, so as to shorten the production line detection time and reduce labor costs.
[0007] To address the aforementioned problems, the present invention provides a color filter substrate, comprising: a transparent substrate, the transparent substrate including a display area and a non-display area; a plurality of first color filter layers located on the display area, adjacent first color filter layers allowing different colors to pass through; a plurality of second color filter layers located on the non-display area, adjacent second color filter layers allowing different colors to pass through; design conditions for color mixing between adjacent second color filter layers being more lenient than design conditions for color mixing between adjacent first color filter layers; and design conditions for light leakage in the second color filter layers being more lenient than design conditions for light leakage in the first color filter layers.
[0008] Optionally, it further includes: a first light-shielding layer located in the display area, the first light-shielding layer having a plurality of first openings exposing the transparent substrate, the first light-shielding layer between adjacent first openings having a designed light-shielding width; a first color filter layer covering the transparent substrate surface exposed by the corresponding first opening and a portion of the first light-shielding layer, the first color filter layer covering the first light-shielding layer having a first designed coverage width, the first designed coverage width being half of the designed light-shielding width; a second light-shielding layer located in the non-display area, the second light-shielding layer having a plurality of second openings exposing the transparent substrate, the second light-shielding layer between adjacent second openings having the designed light-shielding width; a first portion of the second color filter layer covering the transparent substrate surface exposed by the corresponding second opening and a portion of the second light-shielding layer, the first portion of the second color filter layer covering the second light-shielding layer having a second designed coverage width; a second portion of the second color filter layer covering the transparent substrate surface exposed by the corresponding second opening and a portion of the second light-shielding layer, the second portion of the second color filter layer covering the second light-shielding layer having a third designed coverage width.
[0009] Optionally, the design conditions for color mixing between adjacent second color filter layers are less stringent than those for color mixing between adjacent first color filter layers, including: the second design coverage width is greater than half of the design shading width; the design conditions for light leakage in the second color filter layer are less stringent than those for light leakage in the first color filter layer, including: the third design coverage width is less than half of the design shading width.
[0010] Optionally, the difference between the second design coverage width and half of the design shading width is the first design deviation value; the difference between the third design coverage width and half of the design shading width is the second design deviation value; the first design deviation value and the second design deviation value are equal; both the first design deviation value and the second design deviation value are equal to the process margin value.
[0011] Optionally, there is a first overlapping region between adjacent first color filter layers, and the first overlapping region has a first designed overlapping width; the width of the first overlapping region can fluctuate within the design tolerance range based on the first designed overlapping width.
[0012] Optionally, the second color filter layer includes: a first filter portion and a second filter portion, wherein the design width of the second filter portion is greater than the design width of the first filter portion, and the difference between the design width of the second filter portion and the design width of the first filter portion is the design deviation width.
[0013] Optionally, the design conditions for color mixing between adjacent second color filter layers are more lenient than those for color mixing between adjacent first color filter layers, including: the first filter portions of adjacent second color filter layers are separated, the width of the separation gap is the design deviation width, and the design deviation width is less than the design tolerance; the design conditions for color mixing between adjacent second color filter layers are more lenient than those for color mixing between adjacent first color filter layers, including: the second filter portions of adjacent second color filter layers have a second overlapping region, the width of the second overlapping region is the design deviation width, and the design deviation width is less than the design tolerance.
[0014] Optionally, the difference between the design deviation width and the design tolerance is the process margin value.
[0015] Accordingly, the present invention also provides a method for detecting a color filter substrate, comprising: providing a color filter substrate as described in any of the above technical solutions; and visually inspecting whether color mixing occurs between adjacent second color filter layers in the non-display area and whether light leakage occurs in the second color filter layer, to determine whether color mixing occurs between adjacent first color filter layers in the display area and whether light leakage occurs in the first color filter layer.
[0016] Optionally, the color filter substrate further includes: a first light-shielding layer located in the display area, the first light-shielding layer having a plurality of first openings exposing the transparent substrate, the first light-shielding layer between adjacent first openings having a designed light-shielding width; the first color filter layer covering the transparent substrate surface exposed by the corresponding first opening and a portion of the first light-shielding layer, the first color filter layer covering the first light-shielding layer having a first designed coverage width, the first designed coverage width being half of the designed light-shielding width; a second light-shielding layer located in the non-display area, the second light-shielding layer having a plurality of second openings exposing the transparent substrate, the second light-shielding layer between adjacent second openings having the designed light-shielding width; a first portion of the second color filter layer covering the corresponding second opening exposed... The transparent substrate surface and a portion of the second light-shielding layer, the first portion of the second color filter layer covering the second light-shielding layer having a second designed coverage width; the second portion of the second color filter layer covering the transparent substrate surface and a portion of the second light-shielding layer exposed by the corresponding second opening, the second portion of the second color filter layer covering the second light-shielding layer having a third designed coverage width; the design conditions for color mixing between adjacent second color filter layers are more lenient than the design conditions for color mixing between adjacent first color filter layers, including: the second designed coverage width is greater than half of the designed light-shielding width; the design conditions for light leakage of the second color filter layer are more lenient than the design conditions for light leakage of the first color filter layer, including: the third designed coverage width is less than half of the designed light-shielding width.
[0017] Optionally, the method for determining whether color mixing occurs between adjacent second color filter layers in the display area and whether light leakage occurs in the second color filter layer based on visual inspection of whether color mixing occurs between adjacent first color filter layers in the display area and whether light leakage occurs in the first color filter layer includes: if visual inspection shows no color mixing between adjacent second color filter layers in the non-display area and no light leakage occurs in the second color filter layer, then it is determined that no color mixing occurs between adjacent first color filter layers in the display area and no light leakage occurs in the first color filter layer; if visual inspection shows color mixing between adjacent second color filter layers in the non-display area, then it is determined that color mixing may occur between adjacent first color filter layers in the display area; if visual inspection shows light leakage in the second color filter layer in the non-display area, then it is determined that light leakage may occur in the first color filter layer in the display area.
[0018] Optionally, when color mixing occurs between adjacent second color filter layers in the non-display area, or when light leakage occurs in the second color filter layer, the actual width of the color mixing or light leakage is automatically measured by the detection machine, and the parameters of the manufacturing process are adjusted according to the measured actual width.
[0019] Optionally, adjacent first color filter layers have a first overlapping region, and the first overlapping region has a first designed overlapping width; the width of the first overlapping region can fluctuate within the design tolerance range, with the first designed overlapping width as a reference; the second color filter layer includes: a first filter portion and a second filter portion, the designed width of the second filter portion is greater than the designed width of the first filter portion, and the difference between the designed width of the second filter portion and the designed width of the first filter portion is the design deviation width; the design conditions for color mixing between adjacent second color filter layers are more lenient than those for color mixing between adjacent first color filter layers, including: the first filter portions of adjacent second color filter layers are separated, the width of the separation gap is the design deviation width, and the design deviation width is less than the design tolerance; the design conditions for color mixing between adjacent second color filter layers are more lenient than those for color mixing between adjacent first color filter layers, including: the second filter portion of adjacent second color filter layers has a second overlapping region, the width of the second overlapping region is the design deviation width, and the design deviation width is less than the design tolerance.
[0020] Optionally, the method for determining whether color mixing occurs between adjacent second color filter layers in the display area and whether light leakage occurs in the first color filter layer in the display area based on visual inspection of whether color mixing occurs between adjacent second color filter layers in the non-display area and whether light leakage occurs in the second color filter layer includes: when visual inspection shows that the second filter portions of adjacent second color filter layers in the non-display area are in an overlapping state and the first filter portions are in a separated state, it is determined that no color mixing occurs between adjacent first color filter layers in the display area and no light leakage occurs in the first color filter layer; when visual inspection shows that the second filter portions of adjacent second color filter layers in the non-display area are in an adjacent state or a separated state and the first filter portions are in a separated state, it is determined that light leakage may occur in the first color filter layer in the display area; when visual inspection shows that the second filter portions of adjacent second color filter layers in the non-display area are in an overlapping state and the first filter portions are in an adjacent state or an overlapping state, it is determined that color mixing may occur between adjacent first color filter layers in the display area.
[0021] Optionally, when visual inspection shows that the second filter portions of adjacent second color filter layers in the non-display area are in an adjacent or separated state, and the first filter portion is in a separated state, the actual separation size of the adjacent second filter portions is automatically measured by the detection machine, and the parameters of the manufacturing process are adjusted according to the measured actual separation size; when visual inspection shows that the second filter portions of adjacent second color filter layers in the non-display area are in an overlapping state, and the first filter portion is in an adjacent or overlapping state, the actual overlap size of the adjacent first filter portions is automatically measured by the detection machine, and the parameters of the manufacturing process are adjusted according to the measured actual overlap size.
[0022] Compared with the prior art, the technical solution of the present invention has the following advantages: In the color filter substrate of this invention, by setting a second color filter layer with more relaxed design conditions in the non-display area of the transparent substrate, an indirect and reliable determination of the quality state of the first color filter layer in the display area is achieved. Specifically, since the design conditions for color mixing between adjacent second color filter layers are set to be more relaxed than those for color mixing between adjacent first color filter layers, and the design conditions for light leakage in the second color filter layer are also set to be more relaxed than those for light leakage in the first color filter layer, this means that the second color filter layer forms an amplified defect detection window. That is, compared to adjacent first color filter layers, adjacent second color filter layers are more prone to color mixing, and compared to the first color filter layer, the second color filter layer is more prone to light leakage. When the first color filter layer in the display area approaches the critical state of color mixing or light leakage due to process fluctuations, because the design conditions in the non-display area are more relaxed, the second color filter layer will break through the critical state first and exhibit color mixing or light leakage phenomena earlier. At this point, the operator only needs to visually inspect whether the second color filter layer in the non-display area has light leakage or color mixing to infer the actual state of the first color filter layer in the display area. This structural design transforms the precision measurement requirements of high-pixel-density products into a visually discernible macroscopic phenomenon, eliminating the need for manual point-by-point measurement. This allows for rapid online control of the display area without sacrificing the production cycle time of the automated optical inspection machine, significantly shortening production line inspection time and reducing labor costs.
[0023] Furthermore, both the first design deviation value and the second design deviation value are equal to the process margin value; the difference between the design deviation width and the design tolerance is the process margin value. Using the process margin value as a reference, the color mixing and light leakage detection thresholds of the second color filter layer in the non-display area precisely correspond to the process fluctuation limits of the first color filter layer in the display area. When the process fluctuation reaches the margin boundary, the non-display area triggers a visible defect first, achieving a critical early warning function and avoiding misjudgments caused by overly strict thresholds.
[0024] In the color filter substrate inspection method of the present invention, by setting a second color filter layer with more relaxed design conditions in the non-display area of the transparent substrate, an indirect and reliable determination of the quality state of the first color filter layer in the display area is achieved. Specifically, since the design conditions for color mixing between adjacent second color filter layers are set to be more relaxed than those for color mixing between adjacent first color filter layers, and the design conditions for light leakage in the second color filter layer are also set to be more relaxed than those for light leakage in the first color filter layer, this means that the second color filter layer forms an amplified defect detection window. That is, compared with adjacent first color filter layers, adjacent second color filter layers are more prone to color mixing, and compared with first color filter layers, second color filter layers are more prone to light leakage. When the first color filter layer in the display area approaches the critical state of color mixing or light leakage due to process fluctuations, because the design conditions in the non-display area are more relaxed, the second color filter layer will break through the critical state first and exhibit color mixing or light leakage phenomena earlier. At this point, the operator only needs to visually inspect whether the second color filter layer in the non-display area has light leakage or color mixing to infer the actual state of the first color filter layer in the display area. This structural design transforms the precision measurement requirements of high-pixel-density products into a visually discernible macroscopic phenomenon, eliminating the need for manual point-by-point measurement. This allows for rapid online control of the display area without sacrificing the production cycle time of the automated optical inspection machine, significantly shortening production line inspection time and reducing labor costs. Attached Figure Description
[0025] Figure 1 This is a schematic diagram of the structure of the display area and the light-shielding layer and color filter layer above it in a color filter substrate according to an embodiment of the present invention; Figure 2 This is a schematic diagram of the structure of the non-display area and the light-shielding layer above it, and the first part of the color filter layer in a color filter substrate according to an embodiment of the present invention. Figure 3 This is a schematic diagram of the structure of the non-display area and the light-shielding layer above it, and the second part of the color filter layer in a color filter substrate according to an embodiment of the present invention. Figure 4 This is a schematic diagram of the structure of a color filter layer in a color filter substrate according to another embodiment of the present invention, wherein the width of the display area and the overlapping area above it is a first designed overlapping width; Figure 5 This is a schematic diagram of the structure of a color filter layer in a color filter substrate according to another embodiment of the present invention, wherein the width of the display area and the overlapping area above it is based on a first design overlapping width and floats upward with a design tolerance. Figure 6 This is a schematic diagram of the structure of a color filter layer in a color filter substrate according to another embodiment of the present invention, wherein the width of the display area and the overlapping area above it is based on a first design overlapping width and floats downward with a design tolerance. Figure 7 This is a schematic diagram of the structure of the non-display area and the color filter layer above it in another embodiment of the color filter substrate of the present invention; Figures 8 to 11 This is a schematic diagram of the structure of a color filter substrate in another embodiment of the present invention, showing different offsets in the non-display area and the color filter layer above it. Detailed Implementation
[0026] As described in the background section, there are still many problems with the existing color filter substrates during the detection process. These will be explained in detail below.
[0027] With the continuous improvement of LCD performance, the requirements for high precision in color filters are becoming increasingly stringent. In recent years, the pixel density of LCDs has been constantly reaching new highs. At the color filter level, high pixel density and high-resolution design are mainly reflected in the following aspects: smaller key dimensions of the light-shielding layer and smaller openings in the light-shielding layer; smaller key dimensions of each color filter layer and smaller overlap with the light-shielding layer; smaller key dimensions of the spacers and smaller differences between their upper and lower surfaces. High pixel density products place new demands on production and control. However, in order to maintain production speed, especially for Automated Optical Inspection (AOI) monitoring, the resolution of online equipment cannot be set too high. This creates a contradiction: the key dimensions and overlap of each color filter layer need to be precisely controlled, but the control equipment cannot achieve the goal of clear display.
[0028] The existing detection method involves increasing the critical dimensions of the light-shielding layer to prevent overlap between adjacent color filter layers, thus facilitating measurement. However, this method has significant drawbacks: the overlap between the color filter layer and the light-shielding layer needs to be greater than or equal to 3 micrometers; otherwise, the boundary is indistinguishable to the naked eye. Furthermore, each point must be manually measured to determine compliance, resulting in long production line times and high manpower costs. The reason for requiring measurement in the current approach is to determine the deviation value. If the deviation exceeds a threshold, it can be deduced that light leakage or color mixing has occurred in the display area; if the deviation is within the threshold range, it indicates that the display area is problem-free.
[0029] Based on this, the present invention provides a color filter substrate and its detection method. By setting a second color filter layer with more relaxed design conditions in the non-display area of the transparent substrate, the quality status of the first color filter layer in the display area can be indirectly determined. The color mixing and light leakage design conditions of the second color filter layer are more relaxed than those of the first color filter layer, forming an amplified defect detection window. When the first color filter layer approaches the critical point due to process fluctuations, the second color filter layer breaks through the critical point first and exhibits color mixing or light leakage earlier. Operators can infer the status of the display area by visually inspecting the non-display area, transforming the need for precise measurement into a visually discernible macroscopic phenomenon. This eliminates the need for manual measurement point by point, achieving rapid online control of the display area without sacrificing the production cycle of the automated optical inspection machine, significantly shortening production line inspection time and reducing labor costs.
[0030] To make the above-mentioned objects, features and advantages of the present invention more apparent and understandable, specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
[0031] Figure 1 This is a schematic diagram of the structure of the display area and the light-shielding layer and color filter layer above it in a color filter substrate according to an embodiment of the present invention; Figure 2 This is a schematic diagram of the structure of the non-display area and the light-shielding layer above it, and the first part of the color filter layer in a color filter substrate according to an embodiment of the present invention. Figure 3 This is a schematic diagram of the structure of the non-display area and the light-shielding layer above it, and the second part of the color filter layer in a color filter substrate according to an embodiment of the present invention.
[0032] Please refer to Figures 1 to 3A color filter substrate includes: a transparent substrate 100, the transparent substrate 100 including a display area I and a non-display area II; a plurality of first color filter layers 101 located on the display area I, adjacent first color filter layers 101 allowing different colors to pass through; a plurality of second color filter layers 102 located on the non-display area II, adjacent second color filter layers 102 allowing different colors to pass through; design conditions for color mixing between adjacent second color filter layers 102 are more lenient than design conditions for color mixing between adjacent first color filter layers 101; design conditions for light leakage in the second color filter layers 102 are more lenient than design conditions for light leakage in the first color filter layers 101.
[0033] By providing a second color filter layer 102 with more lenient design conditions in the non-display area II of the transparent substrate 100, an indirect and reliable determination of the quality status of the first color filter layer 101 in the display area I can be achieved. Specifically, since the design conditions for color mixing between adjacent second color filter layers 102 are set to be more lenient than those for color mixing between adjacent first color filter layers 101, and the design conditions for light leakage in the second color filter layer 102 are also set to be more lenient than those for light leakage in the first color filter layer 101, this means that the second color filter layer 102 forms an enlarged defect detection window. That is, compared to adjacent first color filter layers 101, adjacent second color filter layers 102 are more prone to color mixing, and compared to the first color filter layer 101, the second color filter layer 102 is more prone to light leakage. When the first color filter layer 101 of the display area I approaches the critical state of color mixing or light leakage due to process fluctuations, the second color filter layer 102 of the non-display area II, with its more lenient design conditions, will be the first to exceed the critical state, exhibiting color mixing or light leakage prematurely. At this point, the operator only needs to visually inspect whether the second color filter layer 102 of the non-display area II has experienced light leakage or color mixing to infer the actual state of the first color filter layer 101 of the display area I. This structural design transforms the precision measurement requirements of high-pixel-density products into visually perceptible macroscopic phenomena, eliminating the need for point-by-point manual measurement. This allows for rapid online control of the display area I without sacrificing the production cycle time of the automated optical inspection machine, significantly shortening production line inspection time and reducing labor costs.
[0034] It should be noted that, in this embodiment, the display area I refers to the area on the transparent substrate 100 used to form the effective product. The first color filter layer 101 disposed in the display area I directly determines the optical performance and image quality of the final display product, and is the core functional area of the product. The non-display area II (also known as the cutting path, border area, or invalid area) refers to the non-effective area outside the display area I that will be removed in the final product cutting process. The non-display area II is provided with a second color filter layer 102, whose design conditions (thresholds for color mixing and light leakage) are more lenient than those of the first color filter layer 101 in the display area I. It is specifically used as an amplified detection window for process fluctuations, and the quality status of the display area I can be indirectly monitored by visually inspecting the defects in the non-display area II.
[0035] Color mixing refers to the overlapping of edges between adjacent color filter layers (such as red, green, and blue filters) due to process variations, causing different color filter materials to permeate each other. When color mixing extends to the active area (i.e., the effective area of a pixel that actually participates in light emission or transmission), it reduces the area of that region, resulting in a smaller effective display area, decreased color purity, and brightness loss. Light leakage refers to the incomplete coverage of the color filter layer in the active area, exposing part of the surface of the transparent substrate 100. Light leakage allows white light or other stray light to pass through directly, destroying the pixel's proper color selectivity, causing bright spots, reduced contrast, and color shift in the image, severely affecting display uniformity and image quality.
[0036] Please continue to refer to this. Figures 1 to 3In this embodiment, the color filter substrate further includes: a first light-shielding layer 103 located in the display area I, the first light-shielding layer 103 having a plurality of first openings (not shown) exposing the transparent substrate 100, and the first light-shielding layer 103 between adjacent first openings having a designed light-shielding width d1; the first color filter layer 101 covering the surface of the transparent substrate 100 exposed by the corresponding first opening and part of the first light-shielding layer 103, the first color filter layer 101 covering the first light-shielding layer 103 having a first designed coverage width d2, the first designed coverage width d2 being half of the designed light-shielding width d1; and a second light-shielding layer 104 located in the non-display area II, the second light-shielding layer 104 having an exposure A plurality of second openings (not shown) are exposed on the transparent substrate 100. The second light-shielding layer 104 between adjacent second openings has the designed light-shielding width d1. A first portion of the second color filter layer 102 covers the surface of the transparent substrate 100 exposed by the corresponding second opening and a portion of the second light-shielding layer 104. The first portion of the second color filter layer 102 covering the second light-shielding layer 104 has a second designed coverage width d3. A second portion of the second color filter layer 102 covers the surface of the transparent substrate 100 exposed by the corresponding second opening and a portion of the second light-shielding layer 104. The second portion of the second color filter layer 102 covering the second light-shielding layer 104 has a third designed coverage width d4.
[0037] It should be noted that in this embodiment, the color filter substrate adopts a light-shielding layer structure. The first light-shielding layer 103 of the display area I and the second light-shielding layer 104 of the non-display area II both have openings that expose the transparent substrate 100. The light-shielding layer between adjacent openings has the designed light-shielding width d1. The designed light-shielding width d1 is the interval between adjacent active areas (the areas of the transparent substrate 100 exposed by the openings). The light-shielding layer itself is opaque and is used to prevent light crosstalk between pixels. The designed light-shielding width d1, the first designed coverage width d2, the second designed coverage width d3, and the third designed coverage width d4 are all ideal design values at the layout design level. In actual mass production, these values will inevitably deviate to some extent in the actual produced products due to factors such as photoresist coating uniformity, exposure energy fluctuations, development time deviations, etching rate changes, and equipment alignment accuracy. When process fluctuations cause the actual coverage width to increase, the color filter layer may extend beyond the light-shielding layer boundary into the active area, causing color mixing. When the actual coverage width decreases, the active area may not be completely covered by the color filter layer, resulting in light leakage and exposing the transparent substrate 100. It is precisely because of these actual deviations that the second color filter layer 102, which has more relaxed design conditions in the non-display area II, will be the first to break through the critical state and exhibit visually detectable color mixing or light leakage, thereby indirectly providing an early warning of the quality status of the display area I.
[0038] In this embodiment, the design conditions for color mixing between adjacent second color filter layers 102 are more lenient than those for color mixing between adjacent first color filter layers 101, including: the second design coverage width d3 is greater than half of the design light-blocking width d1; the design conditions for light leakage in the second color filter layer 102 are more lenient than those for light leakage in the first color filter layer 101, including: the third design coverage width d4 is less than half of the design light-blocking width d1.
[0039] The second design coverage width d3 is greater than half of the design light-shielding width d1, meaning that the coverage area of the second color filter layer 102 on the second light-shielding layer 104 is wider than that of the first color filter layer 101. The remaining light-shielding width between adjacent second color filter layers 102 is smaller, making it easier for them to overlap and extend beyond the boundary of the second light-shielding layer 104 into the active region under process fluctuations, thus resulting in more relaxed color mixing conditions. The third design coverage width d4 is less than half of the design light-shielding width d1, meaning that the coverage of the second color filter layer 102 on the second light-shielding layer 104 is narrower. The edge of the active region is more likely to expose the transparent substrate 100 due to insufficient coverage, thus also resulting in more relaxed light leakage conditions. Both of these factors make it easier for the second color filter layer 102 to break through the critical point first.
[0040] It should be noted that in this embodiment, the overall morphology of the first light-shielding layer 103 and the second light-shielding layer 104 can be different. For example, the first light-shielding layer 103 can adopt a matrix grid structure to adapt to the pixel array arrangement of the display area I, and the second light-shielding layer 104 can adopt a simplified pattern to reduce the process complexity of the non-display area II. However, both must have the same designed light-shielding width d1. The designed light-shielding width d1 is a reference parameter connecting the process fluctuations of the display area I and the non-display area II. Only by ensuring that this reference is consistent can the color mixing or light leakage phenomenon presented by the second color filter layer 102, which has more relaxed design conditions in the non-display area II, accurately reflect the degree to which the first color filter layer 101 of the display area I approaches the critical state when the actual coverage width deviates from the ideal value due to process fluctuations. This enables effective quality back-calculation from the non-display area II to the display area I.
[0041] In this embodiment, the difference between the second design coverage width d3 and half of the design light-shielding width d1 is the first design deviation value, that is, the difference between the second design coverage width d3 and the first design coverage width d2 is the first design deviation value; the difference between the third design coverage width d4 and half of the design light-shielding width d1 is the second design deviation value, that is, the difference between the third design coverage width d4 and the first design coverage width d2 is the second design deviation value; the first design deviation value and the second design deviation value are equal; both the first design deviation value and the second design deviation value are equal to the process margin value.
[0042] By using a process margin value as a reference, the color mixing and light leakage detection thresholds of the second color filter layer 102 in the non-display area II are made to correspond precisely to the process fluctuation limits of the first color filter layer 101 in the display area I. When the process fluctuation reaches the margin boundary, the non-display area II is the first to trigger a visible defect, realizing a critical warning function and avoiding misjudgments caused by overly strict thresholds.
[0043] In this embodiment, the detection method for the color filter substrate includes: visually inspecting whether color mixing occurs between adjacent second color filter layers 102 in the non-display area II and whether light leakage occurs in the second color filter layer 102, so as to determine whether color mixing occurs between adjacent first color filter layers 101 in the display area I and whether light leakage occurs in the first color filter layer 101. Specifically, if visual inspection reveals no color mixing between adjacent second color filter layers 102 in the non-display area II and no light leakage in the second color filter layers 102, then it is determined that no color mixing occurs between adjacent first color filter layers 101 in the display area I, and no light leakage occurs in the first color filter layers 101; if visual inspection reveals color mixing between adjacent second color filter layers 102 in the non-display area II, then it is determined that color mixing may occur between adjacent first color filter layers 101 in the display area I; if visual inspection reveals light leakage in the second color filter layer 102 in the non-display area II, then it is determined that light leakage may occur in the first color filter layer 101 of the display area I.
[0044] This is because if the non-display area II does not experience color mixing or light leakage, since the design conditions of the second color filter layer 102 are more lenient than those of the first color filter layer 101, it indicates that the process fluctuations have not yet reached a more stringent critical threshold, and the display area I is necessarily in a safe state, requiring no additional testing. If the non-display area II has experienced color mixing or light leakage, it indicates that the process fluctuations have exceeded the critical threshold of the second color filter layer 102, but the display area I, due to its relatively stringent design conditions, may not have yet exceeded its critical state. Therefore, it cannot be directly inferred that the display area I has failed. In this case, targeted testing of the display area I needs to be triggered. Even if the test results show that the display area I has no defects, it indicates that it is approaching a critical state, and process monitoring and parameter adjustments need to be strengthened to prevent subsequent batch failures.
[0045] In this embodiment, when color mixing occurs between adjacent second color filter layers 102 in the non-display area II, or when light leakage occurs in the second color filter layer 102, the actual width of the color mixing or light leakage is automatically measured by the detection machine, and the parameters of the manufacturing process are adjusted according to the measured actual width.
[0046] In one specific embodiment, the designed light-shielding width d1 is 5µm, and the corresponding first designed coverage width d2 is 5µm. 1 / 2 = 2.5µm. The process margin is 0.35µm, and the corresponding second design coverage width d3 is 2.5µm + 0.35µm = 2.85µm, and the third design coverage width d4 is 2.5µm - 0.35µm = 2.15µm. The final test results showed that when no color mixing or light leakage occurred in the non-display area II, the display area I was in a safe state and no further testing was required; when color mixing or light leakage occurred in the non-display area II, and the actual width of the color mixing or light leakage measured automatically by the testing machine was less than or equal to 0.35µm, the display area I was also approaching a critical state; when the actual width of the color mixing or light leakage measured automatically by the testing machine was greater than 0.35µm, the display area I also experienced color mixing or light leakage. Therefore, when color mixing or light leakage occurs in the non-display area II, the process parameters need to be adjusted to prevent subsequent batches from failing. The actual width dimension measured by the testing machine provides a quantitative basis for adjusting the process parameters, enabling precise control of the process window.
[0047] Figure 4 This is a schematic diagram of the structure of a color filter layer in a color filter substrate according to another embodiment of the present invention, wherein the width of the display area and the overlapping area above it is a first designed overlapping width; Figure 5 This is a schematic diagram of the structure of a color filter layer in a color filter substrate according to another embodiment of the present invention, wherein the width of the display area and the overlapping area above it is based on a first design overlapping width and floats upward with a design tolerance. Figure 6 This is a schematic diagram of the structure of a color filter layer in a color filter substrate according to another embodiment of the present invention, wherein the width of the display area and the overlapping area above it is based on a first design overlapping width and floats downward with a design tolerance. Figure 7 This is a schematic diagram of the structure of the non-display area and the color filter layer above it in another embodiment of the color filter substrate of the present invention; Figures 8 to 11 This is a schematic diagram of the structure of a color filter substrate in another embodiment of the present invention, showing different offsets in the non-display area and the color filter layer above it.
[0048] Please refer to Figures 4 to 7 A color filter substrate includes: a transparent substrate 200, the transparent substrate 200 including a display area I and a non-display area II; a plurality of first color filter layers 201 located on the display area I, adjacent first color filter layers 201 allowing different colors to pass through; a plurality of second color filter layers 202 located on the non-display area II, adjacent second color filter layers 202 allowing different colors to pass through; design conditions for color mixing between adjacent second color filter layers 202 are more lenient than design conditions for color mixing between adjacent first color filter layers 201; design conditions for light leakage in the second color filter layers 202 are more lenient than design conditions for light leakage in the first color filter layers 201.
[0049] By providing a second color filter layer 202 with more lenient design conditions in the non-display area II of the transparent substrate 200, an indirect and reliable determination of the quality status of the first color filter layer 201 in the display area I can be achieved. Specifically, since the design conditions for color mixing between adjacent second color filter layers 202 are set to be more lenient than those for color mixing between adjacent first color filter layers 201, and the design conditions for light leakage in the second color filter layer 202 are also set to be more lenient than those for light leakage in the first color filter layer 201, this means that the second color filter layer 202 forms an enlarged defect detection window. That is, compared to adjacent first color filter layers 201, adjacent second color filter layers 202 are more prone to color mixing, and compared to the first color filter layer 201, the second color filter layer 202 is more prone to light leakage. When the first color filter layer 201 of the display area I approaches the critical state of color mixing or light leakage due to process fluctuations, the second color filter layer 202 will be the first to exceed the critical state and exhibit color mixing or light leakage phenomena because the design conditions of the non-display area II are more lenient. At this time, the operator only needs to visually inspect whether the second color filter layer 202 of the non-display area II has light leakage or color mixing to infer the actual state of the first color filter layer 201 of the display area I. This structural design can transform the precision measurement requirements of high pixel density products into a visually discernible macroscopic phenomenon, eliminating the need for manual measurement point by point. Thus, without sacrificing the production cycle of the automatic optical inspection machine, it can achieve rapid online control of the display area I, significantly shortening the production line inspection time and reducing labor costs.
[0050] It should be noted that, in this embodiment, the display area I refers to the area on the transparent substrate 200 used to form the effective product. The first color filter layer 201 disposed in the display area I directly determines the optical performance and image quality of the final display product, and is the core functional area of the product. The non-display area II (also known as the cutting path, border area, or invalid area) refers to the non-effective area outside the display area I that will be removed in the final cutting process of the product. The non-display area II is provided with the second color filter layer 202, whose design conditions (thresholds for color mixing and light leakage) are more lenient than those of the first color filter layer 201 in the display area I. It is specifically used as an amplified detection window for process fluctuations, and the quality status of the display area I can be indirectly monitored by visually inspecting the defects in the non-display area II.
[0051] Color mixing refers to the overlapping of edges between adjacent color filter layers (such as red, green, and blue filters) due to process variations, causing different color filter materials to permeate each other. When color mixing extends to the active area (i.e., the effective area of the pixel that actually participates in light emission or transmission), it reduces the area of that region, resulting in a smaller effective display area, decreased color purity, and brightness loss. Light leakage refers to the incomplete coverage of the color filter layer in the active area, exposing part of the surface of the transparent substrate 200. Light leakage allows white light or other stray light to pass through directly, destroying the pixel's proper color selectivity, causing bright spots, reduced contrast, and color shift in the image, severely affecting display uniformity and image quality.
[0052] Please continue to refer to this. Figures 4 to 6 In this embodiment, adjacent first color filter layers 201 have a first overlapping region, and the first overlapping region has a first designed overlapping width d1; the width of the first overlapping region can fluctuate within a range of design tolerance D, based on the first designed overlapping width d1. Figure 4 The width of the first overlapping region shown is exactly the first designed overlapping width d1; Figure 5 The width of the first overlapping region is based on the first designed overlapping width d1, with the design tolerance D floating upwards. Figure 6 The width of the first overlapping region is shown as the design tolerance D, which is floated downwards from the first design overlapping width d1. The design tolerance D can be equal to the first design overlapping width d1.
[0053] It should be noted that in this embodiment, the color filter substrate adopts a structure without a light-shielding layer. The first overlapping region is directly formed between adjacent first color filter layers 201. The first overlapping region is functionally equivalent to a light-shielding layer, used to block light crosstalk between adjacent pixels. In actual production, the width of the first overlapping region can fluctuate within the range of the first designed overlapping width d1, with the upper and lower fluctuations both within the design tolerance D. If the first overlapping region exceeds the upper limit of this range due to process fluctuations, i.e., the overlapping width is too large, it will extend into the active region, causing color mixing; if it is below the lower limit of the range, the overlapping width is too small, and it cannot effectively shield light, causing light leakage.
[0054] Please continue to refer to this. Figure 7 In this embodiment, the second color filter layer 202 includes: a first filter portion 2021 and a second filter portion 2022. The design width of the second filter portion 2022 is greater than the design width of the first filter portion 2021, and the difference between the design width of the second filter portion 2022 and the design width of the first filter portion 2021 is the design deviation width d2.
[0055] It should be noted that in this embodiment, the first design overlap width d1 and the design deviation width d2 are both ideal design values at the layout design level. In actual mass production, these values will inevitably deviate to some extent due to factors such as photoresist coating uniformity, exposure energy fluctuations, development time deviations, etching rate changes, and equipment alignment accuracy. When process fluctuations cause the actual coverage width to increase, the color filter layer may extend beyond the light-shielding layer boundary into the active area, causing color mixing; when the actual coverage width decreases, the active area may not be completely covered by the color filter layer, resulting in light leakage and exposure of the transparent substrate 100. It is precisely because of these actual deviations that the second color filter layer 102, which has more relaxed design conditions for the non-display area II, will break through the critical state first and exhibit visually detectable color mixing or light leakage phenomena in advance, thereby achieving an indirect early warning of the quality status of the display area I.
[0056] In this embodiment, the design conditions for color mixing between adjacent second color filter layers 202 are more lenient than those for color mixing between adjacent first color filter layers 201, including: the first filter portions 2021 of adjacent second color filter layers 202 are separated, and the width of the separation gap is the design deviation width d2, which is less than the design tolerance D; the design conditions for color mixing between adjacent second color filter layers 202 are more lenient than those for color mixing between adjacent first color filter layers 201, including: the second filter portions 2022 of adjacent second color filter layers 202 have a second overlapping region, and the width of the second overlapping region is the design deviation width d2, which is less than the design tolerance D.
[0057] The first filter portions 2021 of adjacent second color filter layers 202 are separated, with a gap width equal to the design deviation width d2 and less than the design tolerance D. This means that the spacing between the first filter portions 2021 of adjacent second color filter layers 202 is smaller, making it more prone to overlapping and color mixing due to coating expansion under process fluctuations. The second filter portions 2022 of adjacent second color filter layers 202 have a second overlapping area, the width of which is also equal to the design deviation width d2. This means that the overlap width of the second filter portions 2022 of adjacent second color filter layers 202 is smaller, making it more prone to shrinkage and light leakage under process fluctuations. Compared to the design of the first color filter layer 201, which has a larger safety margin with the design tolerance D as the floating range, the design deviation width d2 of the second color filter layer 202 is smaller, the safety margin is compressed, and it is more likely to break the critical point and cause color mixing during process fluctuations. Therefore, its design conditions for color mixing and light leakage are more relaxed, and it can provide early warning of the quality risks of the display area I.
[0058] In this embodiment, the difference between the design deviation width d2 and the design tolerance D is the process margin value. Using the process margin value as a reference, the color mixing and light leakage detection thresholds of the second color filter layer 202 in the non-display area II precisely correspond to the process fluctuation limits of the first color filter layer 201 in the display area I. When the process fluctuation reaches the margin boundary, the non-display area II triggers a visible defect first, achieving a critical early warning function and avoiding misjudgments caused by overly strict thresholds.
[0059] In this embodiment, the detection method of the color filter substrate includes: visually inspecting whether color mixing occurs between adjacent second color filter layers 202 in the non-display area II and whether light leakage occurs in the second color filter layer 202, so as to determine whether color mixing occurs between adjacent first color filter layers 201 in the display area I and whether light leakage occurs in the first color filter layer 201.
[0060] For details, please continue to refer to [the website / information]. Figure 7 When visual inspection shows that the second filter portion 2022 of the adjacent second color filter layer 202 of the non-display area II is in an overlapping state and the first filter portion 2021 is in a separated state, it is determined that no color mixing has occurred between the adjacent first color filter layers 201 of the display area I, and no light leakage has occurred in the first color filter layer 201.
[0061] Please refer to Figure 8 and Figure 9 When the second filter portion 2022 of the adjacent second color filter layer 202 of the non-display area II is in an adjacent state or a separated state, and the first filter portion 2021 is in a separated state, it is determined that the first color filter layer 201 of the display area I may have light leakage.
[0062] Qing Reference Figure 10 and Figure 11 When visual inspection shows that the second filter portion 2022 of the adjacent second color filter layer 202 of the non-display area II is in an overlapping state, and the first filter portion 2021 is in an adjacent state or an overlapping state, it is determined that color mixing may occur between the adjacent first color filter layers 201 of the display area I.
[0063] This is because when the adjacent second filter 2022 of the non-display area II is still in an overlapping state and the adjacent first filter 2021 is still in a separated state, the process fluctuation range is less than the design deviation width d2, and therefore necessarily less than the design tolerance D. This indicates that the process fluctuation has not yet reached a more stringent critical threshold, and the display area I is necessarily in a safe state, requiring no additional testing. When the adjacent second filter 2022 of the non-display area II is in an adjacent or separated state, and the adjacent first filter 2021 is in a separated state, the process fluctuation range is greater than or equal to the design deviation width d2, and the fluctuation occurs when the adjacent second color filter layers 202 are separated and offset. This indicates that the first color filter layer 201 of the display area I is also separated and offset. The separation size may not have exceeded the design tolerance D, so it cannot be directly concluded that the display area I has failed. In this case, targeted testing of the display area I needs to be triggered. Similarly, when adjacent second filter sections 2022 of the non-display area II are in an overlapping state, and adjacent first filter sections 2021 are in an adjacent or overlapping state, the process fluctuation range is greater than or equal to the design deviation width d2, and the fluctuation occurs when adjacent second color filter layers 202 are shifted closer together. This indicates that the first color filter layer 201 of the display area I is also shifted closer together. The size of the shift may not have exceeded the design tolerance D, so it cannot be directly concluded that the display area I has failed. In this case, targeted testing of the display area I should be triggered. Even if the test results show that the display area I has no defects, it indicates that it is approaching a critical state, and process monitoring and parameter adjustment need to be strengthened to prevent subsequent batch failures.
[0064] In this embodiment, when the second filter portion 2022 of the adjacent second color filter layer 202 of the non-display area II is visually inspected to be in an adjacent state or a separated state, and the first filter portion 2021 is in a separated state, the actual separation size of the adjacent second filter portions 2022 is automatically measured by the detection machine, and the parameters of the manufacturing process are adjusted according to the measured actual separation size; when the second filter portion 2022 of the adjacent second color filter layer 202 of the non-display area II is visually inspected to be in an overlapping state, and the first filter portion 2021 is in an adjacent state or an overlapping state, the actual overlap size of the adjacent first filter portions 2021 is automatically measured by the detection machine, and the parameters of the manufacturing process are adjusted according to the measured actual overlap size.
[0065] In one specific embodiment, the first design overlap width d1 is 2.5 μm, and the design tolerance D is 2.5 μm. Therefore, the overlap width of the first overlap region between adjacent first color filter layers 201 can fluctuate within the range of 2.5 μm - 2.5 μm to 2.5 μm + 2.5 μm (i.e., 0 μm to 5 μm). The process margin is 0.35 μm, and the corresponding design deviation width d2 is 2.5 μm - 0.35 μm = 2.15 μm. The final test results showed that when the second filter portions 2022 of adjacent second color filter layers 202 in the non-display area II were visually inspected and found to be overlapping, while the first filter portion 2021 was in a separated state, it indicated that the display area I was definitely in a safe state and no additional testing was required; when the second filter portions 2022 of adjacent second color filter layers 202 in the non-display area II were visually inspected and found to be either adjacent or separated, while the first filter portion 2021 was in a separated state, and the actual separation size of the adjacent second filter portions 2022 was less than or equal to 0.35 μm based on the automatic measurement by the testing machine, it indicated that the display area I was also approaching a critical state; when .... If the actual separation size of adjacent second filter sections 2022 is greater than 0.35µm, it indicates that light leakage has also occurred in display area I. When the second filter sections 2022 of adjacent second color filter layers 202 in the non-display area II are in an overlapping state, and the first filter sections 2021 are in an adjacent or overlapping state, and the actual overlap size of adjacent first filter sections 2021 is less than or equal to 0.35µm based on the automatic measurement of the detection machine, it indicates that display area I is also approaching a critical state. When the actual overlap size of adjacent first filter sections 2021 is greater than 0.35µm based on the automatic measurement of the detection machine, it indicates that color mixing has also occurred in display area I. Therefore, when adjacent second filter sections 2022 separate or adjacent first filter sections 2021 overlap in the non-display area II, the process parameters need to be adjusted to prevent subsequent batch failures. The actual separation and overlap dimensions measured by the testing equipment provide a quantitative basis for adjusting the process parameters, enabling precise control of the process window.
[0066] While the present invention has been disclosed above, it is not limited thereto. Any person skilled in the art can make various modifications and alterations without departing from the spirit and scope of the invention; therefore, the scope of protection of the present invention should be determined by the scope defined in the claims.
Claims
1. A color filter substrate, characterized in that, include: A transparent substrate, comprising a display area and a non-display area; A plurality of first color filter layers are located on the display area, and adjacent first color filter layers allow different colors to pass through; Several second color filter layers are located in the non-display area, and adjacent second color filter layers allow different colors to pass through; The design conditions for color mixing between adjacent second color filter layers are more lenient than those for color mixing between adjacent first color filter layers. The design conditions for light leakage in the second color filter layer are less stringent than those for light leakage in the first color filter layer.
2. The color filter substrate as described in claim 1, characterized in that, Also includes: A first light-shielding layer located in the display area has a plurality of first openings exposing the transparent substrate, and the first light-shielding layer between adjacent first openings has a designed light-shielding width; a first color filter layer covers the transparent substrate surface exposed by the corresponding first opening and a portion of the first light-shielding layer, and the first color filter layer covering the first light-shielding layer has a first designed coverage width, which is half of the designed light-shielding width; a second light-shielding layer located in the non-display area has a plurality of second openings exposing the transparent substrate, and the second light-shielding layer between adjacent second openings has the designed light-shielding width; a first portion of the second color filter layer covers the transparent substrate surface exposed by the corresponding second opening and a portion of the second light-shielding layer, and the first portion of the second color filter layer covering the second light-shielding layer has a second designed coverage width; The second part of the second color filter layer covers the transparent substrate surface exposed by the corresponding second opening and part of the second light-shielding layer, and the second part of the second color filter layer covering the second light-shielding layer has a third designed coverage width.
3. The color filter substrate as described in claim 2, characterized in that, The design conditions for color mixing between adjacent second color filter layers are more lenient than those for color mixing between adjacent first color filter layers, including: the second design coverage width is greater than half of the design shading width; the design conditions for light leakage in the second color filter layer are more lenient than those for light leakage in the first color filter layer, including: the third design coverage width is less than half of the design shading width.
4. The color filter substrate as described in claim 3, characterized in that, The difference between the second design coverage width and half of the design shading width is the first design deviation value; the difference between the third design coverage width and half of the design shading width is the second design deviation value; the first design deviation value and the second design deviation value are equal. Both the first design deviation value and the second design deviation value are equal to the process margin value.
5. The color filter substrate as described in claim 1, characterized in that, There is a first overlapping region between adjacent first color filter layers, and the first overlapping region has a first designed overlapping width; the width of the first overlapping region can fluctuate within the design tolerance range with the first designed overlapping width as the reference.
6. The color filter substrate as described in claim 5, characterized in that, The second color filter layer includes a first filter portion and a second filter portion, wherein the design width of the second filter portion is greater than the design width of the first filter portion, and the difference between the design width of the second filter portion and the design width of the first filter portion is the design deviation width.
7. The color filter substrate as described in claim 6, characterized in that, The design conditions for color mixing between adjacent second color filter layers are more lenient than those for color mixing between adjacent first color filter layers, including: the first filter portions of adjacent second color filter layers are separated, the width of the separation gap is the design deviation width, and the design deviation width is less than the design tolerance; the design conditions for color mixing between adjacent second color filter layers are more lenient than those for color mixing between adjacent first color filter layers, including: the second filter portions of adjacent second color filter layers have a second overlapping region, the width of the second overlapping region is the design deviation width, and the design deviation width is less than the design tolerance.
8. The color filter substrate as described in claim 7, characterized in that, The difference between the design deviation width and the design tolerance is the process margin value.
9. A method for detecting a color filter substrate, characterized in that, include: Provide a color filter substrate as described in any one of claims 1 to 8; Based on visual inspection of whether color mixing occurs between adjacent second color filter layers in the non-display area and whether light leakage occurs in the second color filter layer, it is determined whether color mixing occurs between adjacent first color filter layers in the display area and whether light leakage occurs in the first color filter layer.
10. The method for detecting a color filter substrate as described in claim 9, characterized in that, The color filter substrate further includes: a first light-shielding layer located in the display area, the first light-shielding layer having a plurality of first openings exposing the transparent substrate, the first light-shielding layer between adjacent first openings having a designed light-shielding width; the first color filter layer covering the surface of the transparent substrate exposed by the corresponding first opening and a portion of the first light-shielding layer, the first color filter layer covering the first light-shielding layer having a first designed coverage width, the first designed coverage width being half of the designed light-shielding width; a second light-shielding layer located in the non-display area, the second light-shielding layer having a plurality of second openings exposing the transparent substrate, the second light-shielding layer between adjacent second openings having the designed light-shielding width; a first portion of the second color filter layer covering the surface of the transparent substrate exposed by the corresponding second opening and a portion of the first light-shielding layer. The transparent substrate surface and a portion of the second light-shielding layer are described. A first portion of the second color filter layer covers the second light-shielding layer and has a second designed coverage width. A second portion of the second color filter layer covers the transparent substrate surface and a portion of the second light-shielding layer exposed by the corresponding second opening. The second portion of the second color filter layer covers the second light-shielding layer and has a third designed coverage width. The design conditions for color mixing between adjacent second color filter layers are more lenient than those for color mixing between adjacent first color filter layers, including: the second designed coverage width is greater than half of the designed light-shielding width. The design conditions for light leakage in the second color filter layer are more lenient than those for light leakage in the first color filter layer, including: the third designed coverage width is less than half of the designed light-shielding width.
11. The method for detecting a color filter substrate as described in claim 10, characterized in that, The method for determining whether color mixing occurs between adjacent second color filter layers in the display area and whether light leakage occurs in the second color filter layer, based on visual inspection of whether color mixing occurs between adjacent second color filter layers in the non-display area and whether light leakage occurs in the second color filter layer, includes: if visual inspection shows no color mixing between adjacent second color filter layers in the non-display area and no light leakage occurs in the second color filter layer, then it is determined that no color mixing occurs between adjacent first color filter layers in the display area and no light leakage occurs in the first color filter layer; if visual inspection shows color mixing between adjacent second color filter layers in the non-display area, then it is determined that color mixing may occur between adjacent first color filter layers in the display area; if visual inspection shows light leakage in the second color filter layer in the non-display area, then it is determined that light leakage may occur in the first color filter layer in the display area.
12. The method for detecting a color filter substrate as described in claim 11, characterized in that, When color mixing occurs between adjacent second color filter layers in the non-display area, or when light leakage occurs in the second color filter layer, the actual width of the color mixing or light leakage is automatically measured by the detection machine, and the parameters of the manufacturing process are adjusted according to the measured actual width.
13. The method for detecting a color filter substrate as described in claim 9, characterized in that, There is a first overlapping region between adjacent first color filter layers, and the first overlapping region has a first designed overlapping width; the width of the first overlapping region can fluctuate within the design tolerance range, with the first designed overlapping width as a reference; the second color filter layer includes: a first filter part and a second filter part, the designed width of the second filter part is greater than the designed width of the first filter part, and the difference between the designed width of the second filter part and the designed width of the first filter part is the design deviation width; the design conditions for color mixing between adjacent second color filter layers are more lenient than those for color mixing between adjacent first color filter layers, including: the first filter parts of adjacent second color filter layers are separated, the width of the separation gap is the design deviation width, and the design deviation width is less than the design tolerance; the design conditions for color mixing between adjacent second color filter layers are more lenient than those for color mixing between adjacent first color filter layers, including: the second filter part of adjacent second color filter layers has a second overlapping region, the width of the second overlapping region is the design deviation width, and the design deviation width is less than the design tolerance.
14. The method for detecting a color filter substrate as described in claim 13, characterized in that, The method for determining whether color mixing occurs between adjacent second color filter layers in the display area and whether light leakage occurs in the first color filter layer in the display area based on visual inspection of whether color mixing occurs between adjacent second color filter layers in the non-display area and whether light leakage occurs in the second color filter layer includes: when visual inspection shows that the second filter portions of adjacent second color filter layers in the non-display area are in an overlapping state and the first filter portions are in a separated state, it is determined that no color mixing occurs between adjacent first color filter layers in the display area and no light leakage occurs in the first color filter layer; when visual inspection shows that the second filter portions of adjacent second color filter layers in the non-display area are in an adjacent state or a separated state and the first filter portions are in a separated state, it is determined that light leakage may occur in the first color filter layer in the display area; when visual inspection shows that the second filter portions of adjacent second color filter layers in the non-display area are in an overlapping state and the first filter portions are in an adjacent state or an overlapping state, it is determined that color mixing may occur between adjacent first color filter layers in the display area.
15. The method for detecting a color filter substrate as described in claim 14, characterized in that, When visual inspection shows that the second filter portions of adjacent second color filter layers in the non-display area are in an adjacent or separated state, and the first filter portion is in a separated state, the actual separation size of the adjacent second filter portions is automatically measured by the detection machine, and the manufacturing process parameters are adjusted according to the measured actual separation size; when visual inspection shows that the second filter portions of adjacent second color filter layers in the non-display area are in an overlapping state, and the first filter portion is in an adjacent or overlapping state, the actual overlap size of the adjacent first filter portions is automatically measured by the detection machine, and the manufacturing process parameters are adjusted according to the measured actual overlap size.