Battery piece testing device, testing method and electronic device

Abstract

This application discloses a testing apparatus, testing method, and electronic device for solar cells, belonging to the field of solar cell technology. The testing apparatus includes: a contact component, a power supply, and a switching component, wherein the power supply is electrically connected to the contact component via the switching component; an image acquisition device and a resistance measuring device. The image acquisition device is used to acquire an electroluminescence image of the solar cell under test when the switching component connects the power supply and the contact component; the resistance measuring device is connected to the contact component and is used to acquire grid line resistance data of the solar cell under test when the switching component disconnects the connection between the power supply and the contact component. This testing apparatus integrates electroluminescence testing and resistance testing into a single device, effectively saving testing costs and improving testing efficiency.

Description

Technical Field

[0001] This application belongs to the field of battery cell technology, and in particular relates to a battery cell testing device, testing method and electronic equipment. Background Technology

[0002] Currently, the mainstream photovoltaic cells include passivated emitter and back contact cells (PERC), tunnel oxide passivated contact cells (TOPCon), heterojunction cells (HJT), and back contact cells (BC). These cells all require metallization to fabricate grid lines in order to collect, combine, and extract current.

[0003] The grid lines have a significant impact on battery efficiency, and their quality needs to be tested and evaluated before the cells are put into use.

[0004] Currently, different tests on solar cell grid lines are usually performed using different machines, resulting in high testing costs and low efficiency. Summary of the Invention

[0005] This application aims to address at least one of the technical problems existing in the prior art. To this end, this application proposes a testing apparatus, testing method, and electronic equipment for solar cells, which centralizes the testing in a single device, effectively saving testing costs and improving testing efficiency.

[0006] In a first aspect, this application provides a testing apparatus for solar cells, comprising:

[0007] A contact assembly for contacting the grid lines of the cell under test;

[0008] A power supply and a switching assembly, wherein the power supply is electrically connected to the contact assembly via the switching assembly;

[0009] An image acquisition device and a resistance measuring device are provided. The image acquisition device is used to acquire an electroluminescence image of the battery cell under test when the switching assembly connects the power supply and the contact assembly. The resistance measuring device is connected to the contact assembly and is used to acquire grid line resistance data of the battery cell under test when the switching assembly disconnects the power supply and the contact assembly.

[0010] According to the battery cell testing apparatus of this application, by contacting the grid lines of the battery cell under test with a contact component, and cooperating with a switching component to control the conduction and disconnection of the electrical connection between the power supply and the contact component, electroluminescence testing and resistance testing are concentrated in the same device, which can effectively save the testing cost of battery cells and improve the testing efficiency of battery cells.

[0011] According to one embodiment of this application, the contact assembly includes a plurality of probe arrays, the probe arrays being electrically connected to the switch assembly, the probe arrays being provided with a plurality of contact probes, the contact probes being used to contact the grid lines of the battery cell under test.

[0012] According to one embodiment of this application, the battery cell under test includes a plurality of first grid lines and a plurality of second grid lines, wherein the first grid lines intersect with the second grid lines, the first grid lines extend along a first direction, and the plurality of second grid lines are arranged at intervals along the first direction;

[0013] The plurality of probe arrays of the contact assembly are in one-to-one contact with the plurality of second grid lines. The resistance measuring device is used to collect the resistance data of the first grid line through the plurality of probe arrays when the switching assembly disconnects the electrical connection between the power supply and the contact assembly.

[0014] According to one embodiment of this application, the resistance data of the first gate line includes a first resistance value between two adjacent probe arrays;

[0015] The unit line resistance of the first gate line is determined based on the first resistance value between two adjacent probe rows, the spacing between two adjacent probe rows, and the number of the first gate lines.

[0016] According to one embodiment of this application, the switching assembly includes a plurality of first switches corresponding one-to-one with the plurality of probe arrays, one end of the first switch being connected to the power supply, and the other end of the first switch being connected to the probe arrays.

[0017] According to one embodiment of this application, the image acquisition device is used to acquire an electroluminescence image of the battery cell under test when all of the plurality of first switches are closed;

[0018] The resistance measuring device is used to collect grid line resistance data of the battery cell under test when all of the multiple first switches are open.

[0019] According to one embodiment of this application, it also includes:

[0020] A processing device is connected to the switching assembly, the image acquisition device, and the resistance measuring device. The processing device is used to control the operation of the switching assembly, the image acquisition device, and the resistance measuring device, and / or, the processing device is used to process the electroluminescent image of the battery cell under test and the grid line resistance data of the battery cell under test to obtain the test result of the battery cell under test.

[0021] According to one embodiment of this application, it also includes:

[0022] A conveying device for conveying the battery cell under test.

[0023] Secondly, this application provides a method for testing solar cells, the method being used in the solar cell testing apparatus described in the first aspect above, the method comprising:

[0024] Acquire an electroluminescence image of the battery cell under test, and acquire grid line resistance data of the battery cell under test;

[0025] The test results of the battery cell under test are obtained based on the electroluminescence image and grid line resistance data of the battery cell under test.

[0026] According to the battery cell testing method of this application, electroluminescence testing and resistance testing are performed using the same device to obtain electroluminescence images and grid line resistance data of the battery cell under test, and to evaluate the quality of the battery cell under test. This can effectively save the testing cost of the battery cell and improve the testing efficiency of the battery cell.

[0027] Thirdly, this application provides an electronic device including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the battery cell testing method as described in the second aspect above.

[0028] Additional aspects and advantages of this application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of this application. Attached Figure Description

[0029] The above and / or additional aspects and advantages of this application will become apparent and readily understood from the description of the embodiments taken in conjunction with the following drawings, in which:

[0030] Figure 1 This is a schematic diagram of the structure of the battery cell testing device provided in the embodiments of this application;

[0031] Figure 2 This is a schematic diagram of the probe array in the battery cell testing device provided in the embodiments of this application;

[0032] Figure 3 This is a schematic diagram of the circuit box in the battery cell testing device provided in the embodiments of this application;

[0033] Figure 4 This is a schematic diagram of the structure of the battery cell under test provided in an embodiment of this application;

[0034] Figure 5 This is a schematic flowchart of the battery cell testing method provided in the embodiments of this application;

[0035] Figure 6This is a schematic diagram of the structure of the electronic device provided in the embodiments of this application.

[0036] Figure label:

[0037] Circuit box 100, power supply 110, switch assembly 120, probe array 210, contact probe 211, image acquisition device 310, processing device 320, transmission device 330.

[0038] The cell under test is 400, the first grid line is 410, and the second grid line is 420. Detailed Implementation

[0039] The embodiments of this application are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain this application, and should not be construed as limiting this application.

[0040] The following is for reference. Figures 1-6 This application describes a testing apparatus, a testing method, and an electronic device for battery cells according to embodiments of the present application.

[0041] The battery cell testing apparatus of this application embodiment can be applied to the grid line quality testing of solar cells.

[0042] Understandably, solar cells have grid lines for collecting photogenerated carriers, and the quality of these grid lines significantly affects the actual conversion efficiency of the solar cell.

[0043] In practical applications, electroluminescence (EL) testing can be used to detect the printing quality of grid lines, determine whether grid lines are broken, and also observe process defects in some upstream processes of the battery cell.

[0044] The grid line resistance also has a significant impact on the actual output power of solar cells. If the grid line resistance is too high, it will result in a lower actual output power. Before the solar cells are put into use, the grid line resistance (i.e., line resistance) should be tested to ensure that the grid line resistance is within a reasonable range.

[0045] Currently, electroluminescence testing and line resistance testing are performed using different equipment, resulting in high costs and low efficiency in cell testing.

[0046] This application provides a testing device for battery cells that integrates electroluminescence testing and resistance testing into the same device, which can effectively save testing costs and improve testing efficiency.

[0047] like Figure 1As shown, the battery cell testing apparatus of this application embodiment includes a contact component, a power supply 110, a switch component 120, an image acquisition device 310, and a resistance measuring device.

[0048] The contact component is used to make contact with the grid lines of the cell under test 400.

[0049] It should be noted that the contact component is a conductive component that enables electrical connection between the power supply 110 and the battery cell under test 400. When the contact component contacts the grid line of the battery cell under test 400, it can transfer electrical energy from the power supply 110 to the battery cell under test 400.

[0050] In this embodiment, the power supply 110 is electrically connected to the contact component via the switch assembly 120.

[0051] The switching assembly 120 can control the conduction and disconnection of the electrical connection between the power supply 110 and the contact assembly. When the switching assembly 120 makes the electrical connection between the power supply 110 and the contact assembly conduct, the electrical energy of the power supply 110 is transmitted to the battery cell under test 400 through the contact assembly, which can provide the current required for the electroluminescence test of the battery cell under test 400.

[0052] In actual implementation, a power supply 110 and a switch assembly 120 can be set in the circuit box 100. The type and specifications of the power supply 110 can be selected according to the electroluminescence test conditions of the battery cell 400 under test.

[0053] For example, the power supply 110 can be a constant current, and the power of the power supply 110 is set according to the power of the battery cell 400 under test.

[0054] In the testing apparatus for solar cells, the sampling devices for test data include an image acquisition device 310 and a resistance measuring device.

[0055] The image acquisition device 310 is used to acquire electroluminescence images of the battery cell 400 under test when the switching assembly 120 enables the electrical connection between the power supply 110 and the contact assembly.

[0056] Electroluminescence testing is a non-destructive testing technique based on the principle of electroluminescence. By applying a voltage to the cell under test 400, the recombination of charge carriers inside the cell under test 400 is excited to emit light. A near-infrared camera is used to capture the light emission image to detect potential defects (e.g., broken grids) inside the cell under test 400.

[0057] In this embodiment, the image acquisition device 310 may be a near-infrared camera with a spectral range of 1000 nm to 1100 nm.

[0058] It is understood that the power supply 110 is electrically connected to the contact component through the switching component 120. When the switching component 120 makes the electrical connection between the power supply 110 and the contact component conduct, the power supply 110 can apply voltage to the battery cell 400 under test. The image acquisition device 310 can acquire the electroluminescence image of the battery cell 400 under test. Based on the electroluminescence image, it can be determined whether the battery cell 400 under test has a broken grid.

[0059] In this embodiment, the resistance measuring device is connected to the contact assembly and is used to collect grid line resistance data of the cell under test 400 when the switching assembly 120 disconnects the electrical connection between the power supply 110 and the contact assembly.

[0060] It should be noted that when the switch assembly 120 connects the power supply 110 and the contact assembly, the contact assembly applies voltage to the cell under test 400 to provide the current required for electroluminescence testing; when the switch assembly 120 disconnects the power supply 110 and the contact assembly, the contact assembly acts as the grid line measurement contact of the resistance measuring device to collect the grid line resistance data of the cell under test 400.

[0061] In this embodiment, the circuit design of the switch assembly 120 and the contact assembly enables a single device to perform both electroluminescence testing and line resistance testing using a single battery cell testing device. The contact assembly contacts the grid lines of the battery cell under test 400. The switch assembly 120 controls the connection and disconnection of the electrical connection between the power supply 110 and the contact assembly. The testing device is simple to operate, and by concentrating electroluminescence testing and resistance testing in the same device, testing costs can be effectively saved and testing efficiency improved.

[0062] According to the battery cell testing apparatus provided in the embodiments of this application, the contact component contacts the grid line of the battery cell 400 under test, and the switching component 120 controls the conduction and disconnection of the electrical connection between the power supply 110 and the contact component. The electroluminescence test and the resistance test are concentrated in the same device, which can effectively save the testing cost of the battery cell and improve the testing efficiency of the battery cell.

[0063] In some embodiments, the contact assembly includes a plurality of probe rows 210, which are electrically connected to the switch assembly 120. The probe rows 210 are provided with a plurality of contact probes 211, which are used to contact the grid lines of the battery cell 400 under test.

[0064] like Figure 2As shown, the contact assembly may include multiple probe arrays 210. One end of the probe array 210 can be electrically connected to the switch assembly 120 via a wire. Multiple contact probes 211 are provided on the probe array 210. The contact probes 211 contact the grid lines of the cell under test 400 to apply voltage to the cell under test 400, providing conditions for electroluminescence testing, or measuring the grid line resistance of the cell under test 400.

[0065] It should be noted that the number and placement of the probe array 210, as well as the number and placement of the contact probes 211 on the probe array 210, and other specifications of the contact components, can be designed and adjusted according to the distribution of the grid lines on the cell under test 400.

[0066] In some embodiments, the cell under test 400 includes a plurality of first grid lines 410 and a plurality of second grid lines 420, the first grid lines 410 intersect the second grid lines 420, the first grid lines 410 extend along a first direction, and the plurality of second grid lines 420 are spaced apart along the first direction.

[0067] The first direction is the direction parallel to the plane where the battery cell 400 under test is located.

[0068] For example, such as Figure 4 As shown, the first direction is the direction from left to right on the battery cell 400 under test, the first grid line 410 extends along the first direction from left to right, and a plurality of second grid lines 420 are arranged at intervals along the first direction from left to right.

[0069] In this embodiment, the multiple probe arrays 210 of the contact component are in one-to-one contact with the multiple second gate lines 420. The resistance measuring device is used to collect the resistance data of the first gate line 410 through the multiple probe arrays 210 when the switching component 120 disconnects the electrical connection between the power supply 110 and the contact component.

[0070] Understandably, the grid lines of the cell under test 400 include intersecting first grid lines 410 and second grid lines 420. The first grid line 410 can be a fine grid on the cell under test 400, used to collect the current generated by photogenerated carriers; the second grid line 420 can be a main grid on the cell under test 400, collecting the current collected by the fine grid and transmitting it to the outside. Through the synergistic effect of the first grid line 410 and the second grid line 420, the photoelectric conversion efficiency of the cell under test 400 is improved.

[0071] For a cell under test 400 having a first grid line 410 and a second grid line 420, the contact assembly includes a plurality of probe rows 210 that are in one-to-one contact with the plurality of second grid lines 420, and the resistance data of the first grid line 410 are collected through the plurality of probe rows 210.

[0072] For example, such as Figure 4As shown, the cell under test 400 includes five second grid lines 420 spaced apart along a first direction from left to right, as... Figure 1 As shown, the contact assembly includes five probe rows 210, and the probe rows 210 and the second gate line 420 are in one-to-one contact.

[0073] It should be noted that the resistance measuring device measures the corresponding resistance value of the component under test by measuring the voltage across the component under test and the current flowing through the component under test. The probe array 210 can conduct electricity and is in contact with the second grid line 420. By measuring the voltage, current and other data of different probe arrays 210, the resistance data of the first grid line 410 can be obtained.

[0074] In actual operation, the contact probe 211 can form a one-to-one contact relationship with the grid lines of the cell under test 400.

[0075] For example, multiple second gate lines 420 are arranged at intervals along the first direction, multiple probe rows 210 are arranged at intervals along the first direction, multiple first gate lines 410 are arranged at intervals along directions intersecting the first direction, multiple contact probes 211 are provided on the probe rows 210, and the multiple contact probes 211 are also arranged at intervals along directions intersecting the first direction, and the contact probes 211 make contact with the first gate lines 410 one by one.

[0076] It is understandable that the first gate line 410 and the second gate line 420 intersect, the probe row 210 is placed on the second gate line 420, and the contact probe 211 on the probe row 210 contacts the intersection point of the first gate line 410 and the second gate line 420, so that the contact probe 211 contacts the first gate line 410 in a one-to-one correspondence.

[0077] It should be noted that the testing device for solar cells can also test solar cells 400 without main grids. The fine grids of the solar cells 400 without main grids extend along the first direction, and the multiple probe rows 210 of the contact assembly are arranged at intervals along the first direction. The multiple contact probes 211 of the probe rows 210 make contact with the multiple fine grids one by one.

[0078] In some embodiments, the resistance data of the first gate line 410 includes a first resistance value between two adjacent probe rows 210, and the unit line resistance of the first gate line 410 is determined based on the first resistance value between two adjacent probe rows 210, the spacing between two adjacent probe rows 210, and the number of the first gate lines 410.

[0079] In this embodiment, the resistance measuring device can acquire the first resistance value between two adjacent probe rows 210, that is, measure the resistance value of the first grid line 410 between two adjacent second grid lines 420.

[0080] In this configuration, the probe array 210 and the second gate line 420 are in one-to-one contact. The distance between two adjacent probe arrays 210 is the distance between two adjacent second gate lines 420, which is also the length of the first gate line 410 between two adjacent second gate lines 420.

[0081] It is understandable that the unit line resistance of the first gate line 410 refers to the resistance value per unit length of the first gate line 410, which can be used to characterize the conductivity of the first gate line 410.

[0082] In actual implementation, the unit line resistance of the first gate line 410 can be calculated based on the first resistance value between two adjacent probe rows 210, the spacing between two adjacent probe rows 210, and the number of the first gate lines 410.

[0083] For example, such as Figure 4 As shown, the battery cell 400 under test has five second grid lines 420 arranged at intervals along the first direction. The distance between two adjacent second grid lines 420 is d, which is the distance between two adjacent probe rows 210.

[0084] like Figure 3 As shown, for 5 probe rows 210, a total of 4 first resistance values ​​can be measured between two adjacent probe rows 210: R1, R2, R3 and R4.

[0085] Taking the number of first grid lines 410 on the cell under test 400 as N as an example.

[0086] The unit line resistance of the first gate line 410 can be calculated using the following formula:

[0087] R = [(R1 + R2 + R3 + R4) / 4] / d * N

[0088] Where R1, R2, R3 and R4 are the first resistance values ​​between two adjacent probe rows 210, d is the spacing between two adjacent probe rows 210, N is the number of the first gate lines 410, and R is the unit line resistance of the first gate line 410.

[0089] In practice, the conductivity of the first grid line 410 on the cell under test 400 can be evaluated by the unit line resistance of the first grid line 410.

[0090] In some embodiments, the switch assembly 120 includes a plurality of first switches corresponding one-to-one with a plurality of probe arrays 210, one end of the first switch being connected to a power supply 110, and the other end of the first switch being connected to a probe array 210.

[0091] In actual operation, the first switch can control the connection between the probe array 210 and the power supply 110. When the first switch is closed, the connection between the probe array 210 and the power supply 110 is made; when the first switch is open, the connection between the probe array 210 and the power supply 110 is disconnected.

[0092] For example, the contact assembly includes 5 probe rows 210, such as Figure 3 As shown, the switch assembly 120 includes five first switches, K1, K2, K3, K4 and K5, which control the connection and disconnection of the electrical connection between the probe array 210 and the power supply 110.

[0093] In actual implementation, multiple first switches and power supply 110 can be integrated into the circuit box 100.

[0094] In some embodiments, the image acquisition device 310 is used to acquire an electroluminescent image of the battery cell 400 under test when all of the plurality of first switches are closed.

[0095] In this embodiment, when all the first switches in the switch assembly 120 are closed, the power supply 110 supplies power to the battery cell 400 under test, and the image acquisition device 310 acquires the electroluminescence image of the battery cell 400 under test. Based on the electroluminescence image, it is determined whether the battery cell 400 under test has experienced phenomena such as grid breakage.

[0096] For example, such as Figure 3 As shown, the switch assembly 120 includes five first switches, K1, K2, K3, K4 and K5.

[0097] When K1, K2, K3, K4 and K5 in the control circuit box 100 are closed, a constant current is applied to the battery cell 400 under test through the power supply 110, and the image acquisition device 310 is used to take pictures of the battery cell 400 under test, collecting the infrared distribution on the surface of the battery cell 400 under test, and obtaining the electroluminescence image of the battery cell 400 under test through calculation and processing.

[0098] In some embodiments, the resistance measuring device is used to acquire grid line resistance data of the cell under test 400 when all of the first switches are open.

[0099] In this embodiment, when all the first switches in the switching assembly 120 are turned off, the electrical connection between the power supply 110 and the battery cell under test 400 is broken. The resistance measuring device collects the grid line resistance data of the battery cell under test 400 through the contact assembly and analyzes the conductivity of the grid lines on the battery cell under test 400.

[0100] For example, such as Figure 3As shown, the switch assembly 120 includes five first switches, K1, K2, K3, K4 and K5.

[0101] K1, K2, K3, K4 and K5 in the control circuit box 100 are disconnected, the contact assembly is in contact with the grid line of the cell under test 400, and the first resistance value between two adjacent probe rows 210, R1, R2, R3 and R4, is measured by the resistance measuring device.

[0102] In this embodiment, the number of first grid lines 410 on the battery cell 400 under test is N, and the unit line resistance R of the first grid line 410 is R = [(R1+R2+R3+R4) / 4] / d*N, where d is the spacing between two adjacent probe rows 210, and N is the number of first grid lines 410.

[0103] In some embodiments, the testing apparatus for the battery cells may further include a processing device 320, which is connected to the switching assembly 120, the image acquisition device 310, and the resistance measuring device.

[0104] In this embodiment, the processing device 320 can be used to control the operation of the switching assembly 120, the image acquisition device 310 and the resistance measuring device, and / or, the processing device 320 can be used to process the electroluminescent image of the battery cell 400 under test and the grid line resistance data of the battery cell 400 under test to obtain the test result of the battery cell 400 under test.

[0105] It should be noted that the processing device 320 can have the functions of executing programs and processing data, and the processing device 320 can also coordinate the operation of various devices in the battery cell testing device.

[0106] For example, the processing device 320 can process the electroluminescent image of the cell under test 400 and the grid line resistance data of the cell under test 400 according to a certain execution program, evaluate the quality of the grid lines on the cell under test 400, and obtain the test results of the cell under test 400.

[0107] In this embodiment, the processing device 320 can determine whether the grid breakage phenomenon has occurred in the battery cell 400 under test based on the electroluminescence image of the battery cell 400 under test. The processing device 320 can also evaluate the conductivity of the grid lines on the battery cell 400 under test based on the grid line resistance data of the battery cell 400 under test, and determine whether the grid line resistance of the battery cell 400 under test is within a reasonable range.

[0108] For example, the processing device 320 can control the operation of the first switch in the switching assembly 120 to control the conduction and disconnection of the electrical connection between the power supply 110 and the battery cell 400 under test.

[0109] In this embodiment, the processing device 320 can control all the first switches in the switching assembly 120 to close, so that the power supply 110 and the battery cell under test 400 are electrically connected, and the processing device 320 controls the image acquisition device 310 to acquire the electroluminescent image of the battery cell under test 400.

[0110] The processing device 320 can also control all the first switches in the switching assembly 120 to be turned off, so that the electrical connection between the power supply 110 and the battery cell under test 400 is disconnected, and the processing device 320 controls the resistance measuring device to collect the grid resistance data of the battery cell under test 400.

[0111] In actual operation, the processing device 320 can simultaneously perform data processing and control functions. The processing device 320 can control the operation of the switching assembly 120, the image acquisition device 310, and the resistance measurement device to acquire the electroluminescent image and grid line resistance data of the battery cell 400 under test, analyze the electroluminescent image and grid line resistance data of the battery cell 400 under test, evaluate the grid line quality of the battery cell 400 under test, and obtain the test results of the battery cell 400 under test.

[0112] In some embodiments, the testing apparatus for the solar cell may further include a conveying device 330 for conveying the solar cell 400 to be tested.

[0113] It is understandable that the conveying device 330 can transport the battery cell 400 under test from one position to another, realizing efficient transmission and automated handling of the battery cell 400 under test. Setting up the conveying device 330 can effectively improve the testing efficiency of the battery cell.

[0114] In this embodiment, multiple battery cells 400 to be tested can be placed in a conveying device 330, and the battery cells 400 to be tested can be transported one by one to the testing position for testing through the conveying device 330.

[0115] In actual implementation, the conveying device 330 can be a conveyor belt, including components such as a conveyor belt, a drive unit, and rollers.

[0116] It is understood that the transport operation of the conveying device 330 can be controlled by the processing device 320. After the conveying device 330 transports the cell under test 400 to the detection position, the processing device 320 controls the operation of the switching assembly 120, the image acquisition device 310 and the resistance measurement device to acquire the electroluminescence image and grid line resistance data of the cell under test 400. Based on the electroluminescence image and grid line resistance data of the cell under test 400, the processing device 320 evaluates the grid line quality of the cell under test 400 and obtains the test result of the cell under test 400.

[0117] The following is a specific example.

[0118] like Figure 1 As shown, the battery cell 400 under test is conveyed on the conveying device 330. The test station is equipped with a probe array 210 and an image acquisition device 310. When the battery cell 400 under test is transported to the test station, the probe array 210 is pressed down, and the contact probes 211 on the probe array 210 contact the battery cell 400 under test. The probe array 210 is transmitted to the circuit box 100 via wires.

[0119] like Figure 3 As shown, the circuit box 100 is provided with a power supply 110 and a switch assembly 120, wherein the switch assembly 120 is provided with a plurality of first switches that are connected one-to-one with the probe array 210.

[0120] In this embodiment, the control and data transmission analysis of the first switch, image acquisition device 310 and resistance measurement device in the circuit box 100 are completed by the processing device 320 (which may be a computer).

[0121] When K1, K2, K3, K4 and K5 in the control circuit box 100 of the processing device 320 are disconnected, the contact assembly makes contact with the grid line of the cell under test 400, and the first resistance value between two adjacent probe rows 210, R1, R2, R3 and R4, is measured by the resistance measuring device.

[0122] Processing device 320 calculates the unit line resistance of the first gate line 410 using the following formula:

[0123] R = [(R1 + R2 + R3 + R4) / 4] / d * N

[0124] Where R1, R2, R3 and R4 are the first resistance values ​​between two adjacent probe rows 210, d is the spacing between two adjacent probe rows 210, N is the number of the first gate lines 410, and R is the unit line resistance of the first gate line 410.

[0125] The processing device 320 controls the circuit box 100 to close K1, K2, K3, K4 and K5, and the power supply 110 passes a constant current to the battery cell 400 under test. The image acquisition device 310 takes a picture of the battery cell 400 under test and collects the infrared distribution on the surface of the battery cell 400 under test. The electroluminescence image of the battery cell 400 under test is obtained through calculation and processing.

[0126] In this embodiment, the electroluminescence test and resistance test are integrated into the test device for the battery cell, and the battery cell 400 under test is transported by the conveying device 330, which can effectively save test costs and improve test efficiency.

[0127] It should be noted that when using the battery cell testing device, there is no prescribed order for electroluminescence testing and resistance testing. The first switch can be turned off first to perform the resistance test, or the first switch can be turned on first to perform the electroluminescence test.

[0128] This application also provides a method for testing battery cells, which can be used in the aforementioned battery cell testing apparatus.

[0129] like Figure 5 As shown, the battery cell testing method of this application embodiment includes steps 510 and 520.

[0130] Step 510: Obtain the electroluminescence image of the cell under test 400 and obtain the grid line resistance data of the cell under test 400.

[0131] The contact component makes contact with the grid lines of the cell under test 400, and the switching component 120 controls the conduction and disconnection of the electrical connection between the power supply 110 and the contact component.

[0132] In this step, when the switching assembly 120 connects the power supply 110 and the contact assembly, the image acquisition device 310 acquires the electroluminescence image of the battery cell 400 under test; when the switching assembly 120 disconnects the power supply 110 and the contact assembly, the resistance measurement device acquires the grid resistance data of the battery cell 400 under test.

[0133] It should be noted that there is no prescribed order for the electroluminescence test and the resistance test. The resistance test can be performed first to obtain the grid line resistance data of the cell under test 400, and then the electroluminescence test can be performed to obtain the electroluminescence image of the cell under test 400; or the electroluminescence test can be performed first to obtain the electroluminescence image of the cell under test 400, and then the resistance test can be performed to obtain the grid line resistance data of the cell under test 400.

[0134] Step 520: Based on the electroluminescence image and grid line resistance data of the cell under test 400, the test results of the cell under test 400 are obtained.

[0135] In this embodiment, based on the electroluminescence image of the battery cell under test 400, it is determined whether the battery cell under test 400 has a grid breakage phenomenon, and the grid line printing quality on the battery cell under test 400 is evaluated; based on the grid line resistance data of the battery cell under test 400, the conductivity of the grid lines on the battery cell under test 400 is evaluated, and it is determined whether the grid line resistance of the battery cell under test 400 is within a reasonable range.

[0136] According to the battery cell testing method provided in the embodiments of this application, electroluminescence testing and resistance testing are completed using the same device, and the electroluminescence image and grid line resistance data of the battery cell under test 400 are obtained to evaluate the quality of the battery cell under test 400. This can effectively save the testing cost of the battery cell and improve the testing efficiency of the battery cell.

[0137] In some embodiments, such as Figure 6 As shown, this application embodiment also provides an electronic device 600, including a processor 601, a memory 602, and a computer program stored in the memory 602 and executable on the processor 601. When the program is executed by the processor 601, it implements the various processes of the above-described battery cell testing method embodiment and can achieve the same technical effect. To avoid repetition, it will not be described again here.

[0138] It is understood that, for example, electronic devices may be computers, industrial control computers, robots, etc., and the embodiments of this application do not specifically limit them.

[0139] The terms "first," "second," etc., used in the specification and claims of this application are used to distinguish similar objects and not to describe a specific order or sequence. It should be understood that such use of data can be interchanged where appropriate so that embodiments of this application can be implemented in orders other than those illustrated or described herein, and the objects distinguished by "first," "second," etc., are generally of the same class and the number of objects is not limited; for example, a first object can be one or more. Furthermore, in the specification and claims, "and / or" indicates at least one of the connected objects, and the character " / " generally indicates that the preceding and following objects are in an "or" relationship.

[0140] In the description of this application, it should be understood that the terms "upper" and "lower" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application.

[0141] In the description of this application, "first feature" and "second feature" may include one or more of the features.

[0142] In the description of this application, "multiple" means two or more.

[0143] In the description of this application, the first feature being "above" or "below" the second feature may include the first and second features being in direct contact, or the first and second features being in contact through another feature between them.

[0144] In the description of this application, the terms "above," "over," and "on top" for the first feature and the second feature include the first feature being directly above or diagonally above the second feature, or simply indicate that the first feature is at a higher horizontal level than the second feature.

[0145] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "illustrative embodiment," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0146] Although embodiments of this application have been shown and described, those skilled in the art will understand that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of this application, the scope of which is defined by the claims and their equivalents.

Claims

1. A testing device for battery cells, characterized in that, include: A contact assembly for contacting the grid lines of the cell under test; A power supply and a switching assembly, wherein the power supply is electrically connected to the contact assembly via the switching assembly; An image acquisition device and a resistance measuring device are provided. The image acquisition device is used to acquire an electroluminescence image of the battery cell under test when the switching assembly connects the power supply and the contact assembly. The resistance measuring device is connected to the contact assembly and is used to acquire grid line resistance data of the battery cell under test when the switching assembly disconnects the power supply and the contact assembly.

2. The testing apparatus for battery cells according to claim 1, characterized in that, The contact assembly includes multiple probe arrays, which are electrically connected to the switch assembly. The probe arrays are provided with multiple contact probes, which are used to contact the grid lines of the battery cell under test.

3. The testing apparatus for battery cells according to claim 2, characterized in that, The cell under test includes a plurality of first grid lines and a plurality of second grid lines, wherein the first grid lines intersect with the second grid lines, the first grid lines extend along a first direction, and the plurality of second grid lines are arranged at intervals along the first direction; The plurality of probe arrays of the contact assembly are in one-to-one contact with the plurality of second grid lines. The resistance measuring device is used to collect the resistance data of the first grid line through the plurality of probe arrays when the switching assembly disconnects the electrical connection between the power supply and the contact assembly.

4. The testing apparatus for battery cells according to claim 3, characterized in that, The resistance data of the first gate line includes the first resistance value between two adjacent probe rows; The unit line resistance of the first gate line is determined based on the first resistance value between two adjacent probe rows, the spacing between two adjacent probe rows, and the number of the first gate lines.

5. The testing apparatus for battery cells according to claim 2, characterized in that, The switching assembly includes a plurality of first switches corresponding one-to-one with the plurality of probe arrays. One end of the first switch is connected to the power supply, and the other end of the first switch is connected to the probe array.

6. The testing apparatus for battery cells according to claim 5, characterized in that, The image acquisition device is used to acquire the electroluminescence image of the battery cell under test when all of the plurality of first switches are closed; The resistance measuring device is used to collect grid line resistance data of the battery cell under test when all of the multiple first switches are open.

7. The testing apparatus for solar cells according to any one of claims 1-6, characterized in that, Also includes: A processing device is connected to the switching assembly, the image acquisition device, and the resistance measuring device. The processing device is used to control the operation of the switching assembly, the image acquisition device, and the resistance measuring device, and / or, the processing device is used to process the electroluminescent image of the battery cell under test and the grid line resistance data of the battery cell under test to obtain the test result of the battery cell under test.

8. The testing apparatus for solar cells according to any one of claims 1-6, characterized in that, Also includes: A conveying device for conveying the battery cell under test.

9. A method for testing battery cells, characterized in that, The method is used in the testing apparatus for the battery cells according to any one of claims 1-8, and the method includes: Acquire an electroluminescence image of the battery cell under test, and acquire grid line resistance data of the battery cell under test; The test results of the battery cell under test are obtained based on the electroluminescence image and grid line resistance data of the battery cell under test.

10. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the program, it implements the battery cell testing method as described in claim 9.

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