A speckle intensity based quantum imaging system and method

Abstract

The application discloses a speckle intensity-based quantum imaging system, comprising a laser light source, an object to be imaged, a fluorescent layer, a microscope objective, a dichroic mirror, a first detection module, a second detection module and a processing module. The application also discloses a speckle intensity-based quantum imaging method, which is realized based on the speckle intensity-based quantum imaging system. The application discloses a speckle intensity-based quantum imaging system and method, wherein the object image is reconstructed according to the speckle intensity measured by the first detection module and the second detection module, and quantum imaging can be realized by using only one auxiliary light field which is weakly spatially correlated with the illumination light field and easy to obtain without knowing the spatial distribution of the actual illumination light field of the object to be imaged, so that the imaging ability in a strongly scattering and opaque medium is achieved, and the flexibility and robustness of the quantum imaging system are significantly improved.

Description

Technical Field

[0001] This invention relates to the technical fields of quantum computing and quantum imaging, and specifically to a speckle intensity-based quantum imaging system and method. Background Technology

[0002] The core idea of ​​quantum imaging technology lies in decomposing the image into two correlated signal channels: one channel is a spatial information channel, used to record the spatial distribution of the light field illuminating the object; the other channel is an intensity information channel, using only a bucket detector with no spatial resolution to collect the total light intensity reflected or transmitted from the object. Finally, by calculating the correlation between the signals from these two channels, an image of the object can be reconstructed. This technology can be widely applied in fields such as unmanned systems, industrial inspection and intelligent manufacturing, biomedical imaging and diagnosis, remote sensing and astronomical observation, as well as machine vision and virtual reality.

[0003] Despite the immense potential of quantum imaging technology, its practical application, particularly in complex scattering environments, faces fundamental technological bottlenecks. A fundamental prerequisite for existing quantum imaging techniques is the precise knowledge of the illumination pattern illuminating the object. This necessitates placing a high-resolution camera behind the object to directly record the transmitted speckle pattern in most transmission-based quantum imaging schemes. However, in many real-world scenarios, it is impossible to access the other side of the object for measurement, rendering transmission-based quantum imaging schemes ineffective.

[0004] Therefore, the absolute dependence on known illumination patterns limits the design flexibility of quantum imaging systems; moreover, any change that leads to inaccurate or unknown illumination patterns will result in imaging failure. Summary of the Invention

[0005] To address the problem that existing quantum imaging technologies rely on known illumination patterns, this invention provides a speckle intensity-based quantum imaging system and method.

[0006] To achieve the above objectives, the technical solution adopted by the present invention is as follows: A speckle intensity-based quantum imaging system includes a laser source, an object to be imaged, a fluorescent layer, a microscope objective, a dichroic mirror, a first detection module, a second detection module, and a processing module. The laser source outputs a laser beam; The laser beam is incident on the object to be imaged, producing reflected light and transmitted light; wherein... The reflected light passes sequentially through a microscope objective and a dichroic mirror, and is received by the first detection module to measure the intensity of the reflected speckle. The transmitted light shines on the fluorescent layer, exciting the fluorescent layer to emit fluorescence in all directions; The object to be imaged and the fluorescent layer rotate in the same direction with the same angular velocity; The fluorescence transmitted through the object to be imaged passes sequentially through the microscope objective and the dichroic mirror, and is then received and measured by the second detection module to obtain the intensity of the transmitted speckle. The processing module reconstructs the object image based on the reflected speckle intensity and the transmitted speckle intensity.

[0007] In the above scheme, the object image is reconstructed based on the speckle intensity measured by the first detection module and the second detection module. Without needing to know the spatial distribution of the actual illumination field of the object, quantum imaging can be achieved using only an easily obtainable auxiliary light field that has an arbitrary weak spatial correlation with the illumination field. This enables imaging in strongly scattering, opaque media, significantly improving the flexibility and robustness of the quantum imaging system.

[0008] Preferably, the laser source includes a laser, a beam expander, a pinhole, a collimating lens, and an aperture stop arranged coaxially in sequence.

[0009] Preferably, the first detection module includes a first plano-convex lens and a CCD camera; The fluorescent layer, the object to be imaged, the microscope objective, the dichroic mirror, the first plano-convex lens, and the CCD camera are arranged coaxially in sequence.

[0010] Preferably, the second detection module includes a filter, a second plano-convex lens, and a barrel detector; The fluorescence transmitted through the object to be imaged is reflected by the dichroic mirror, then passes through the filter and the second plano-convex lens in sequence, and is finally received by the second detection module.

[0011] Preferably, the wavelength of the laser beam is 450 nm.

[0012] Preferably, the center wavelength of the fluorescence is 550 nm.

[0013] Preferably, the filter is a 500nm long-pass filter.

[0014] Preferably, the processing module reconstructs the object image in the following manner: ; ; in, The reconstructed object image in image plane coordinates The intensity value at that location, The average intensity of the transmitted speckle. The average intensity of the reflected speckle. The transmittance distribution of the object to be imaged. For related functions, For the normalized fluctuations in the intensity of the reflected speckle, For the normalized fluctuations in transmitted speckle intensity, is the relative position, and r is the coordinate of the object plane.

[0015] A speckle intensity-based quantum imaging method, implemented using the aforementioned speckle intensity-based quantum imaging system, includes the following steps: S1: The laser beam output from the laser source is incident on the object to be imaged, producing reflected light and transmitted light; S2: The reflected light passes through the microscope objective and the dichroic mirror in sequence, and is received by the first detection module to measure the intensity of the reflected speckle. When transmitted light shines on the fluorescent layer, the fluorescent layer is excited to emit fluorescence in all directions; In this process, the object to be imaged and the fluorescent layer rotate in the same direction with the same angular velocity; S3: The fluorescence transmitted through the object to be imaged passes sequentially through the microscope objective and the dichroic mirror, and is then received and measured by the second detection module to obtain the intensity of the transmitted speckle. S4: The processing module reconstructs the object image based on the reflected speckle intensity and the transmitted speckle intensity.

[0016] Preferably, in step S4, the object image is reconstructed in the following manner: ; ; in, The reconstructed object image in image plane coordinates The intensity value at that location, The average intensity of the transmitted speckle. The average intensity of the reflected speckle. The transmittance distribution of the object to be imaged. For related functions, For the normalized fluctuations in the intensity of the reflected speckle, For the normalized fluctuations in transmitted speckle intensity, is the relative position, and r is the coordinate of the object plane.

[0017] Beneficial technical effects of the present invention: This invention provides a speckle intensity-based quantum imaging system and method. By reconstructing an object image based on the speckle intensity measured by the first and second detection modules, quantum imaging can be achieved without knowing the spatial distribution of the actual illumination field of the object. It only requires an easily obtainable auxiliary light field that has an arbitrary weak spatial correlation with the illumination field. This system has the ability to image in strongly scattering, opaque media, and significantly improves the flexibility and robustness of the quantum imaging system. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the overall structure of the present invention; Figure 2 This is a flowchart illustrating the implementation steps of the technical solution of the present invention; The components are: 1. Laser source; 11. Laser; 12. Beam expander; 13. Pinhole; 14. Collimating lens; 15. Aperture stop; 2. Object to be imaged; 3. Fluorescent layer; 4. Microscope objective; 5. Dichroic mirror; 6. First detection module; 61. First plano-convex lens; 62. CCD camera; 7. Second detection module; 71. Filter; 72. Second plano-convex lens; 73. Barrel detector. Detailed Implementation

[0019] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the embodiments. However, the scope of protection of this invention is not limited to the specific embodiments described below. Example

[0020] like Figure 1 As shown, a speckle intensity-based quantum imaging system includes a laser light source 1, an object to be imaged 2, a fluorescent layer 3, a microscope objective 4, a dichroic mirror 5, a first detection module 6, a second detection module 7, and a processing module. The laser source 1 outputs a laser beam; The laser beam is incident on the object 2 to be imaged, generating reflected light and transmitted light carrying information about the object; wherein... The reflected light passes sequentially through the microscope objective 4 and the dichroic mirror 5, and is then received and measured by the first detection module 6 to obtain the intensity of the reflected speckle. The transmitted light shines on the fluorescent layer 3, exciting the fluorescent layer 3 to emit fluorescence in all directions; The object to be imaged 2 and the fluorescent layer 3 rotate in the same direction with the same angular velocity; The fluorescence transmitted through the object to be imaged 2 passes sequentially through the microscope objective 4 and the dichroic mirror 5, and is then received and measured by the second detection module 7 to obtain the intensity of the transmitted speckle. The processing module reconstructs the object image based on the reflected speckle intensity and the transmitted speckle intensity.

[0021] In the specific implementation process, the object image is reconstructed based on the speckle intensity measured by the first detection module 6 and the second detection module 7. Without knowing the spatial distribution of the actual illumination field of the object, quantum imaging can be achieved using only an easily obtainable auxiliary light field that has an arbitrary weak spatial correlation with the illumination field. This enables imaging in strongly scattering, opaque media, significantly improving the flexibility and robustness of the quantum imaging system. Example

[0022] A speckle intensity-based quantum imaging system includes a laser light source 1, an object to be imaged 2, a fluorescent layer 3, a microscope objective 4, a dichroic mirror 5, a first detection module 6, a second detection module 7, and a processing module. The laser source 1 outputs a laser beam; More specifically, the laser source 1 includes a laser 11, a beam expander 12, a pinhole 13, a collimating lens 14, and an aperture stop 15 arranged coaxially in sequence.

[0023] More specifically, the wavelength of the laser beam is 450 nm.

[0024] In the specific implementation process, the laser 11 outputs a laser beam with a wavelength of 450nm. The laser beam is collimated and expanded by the beam expander 12 and the collimator 14. A pinhole 13 is provided at the focal position between the beam expander 12 and the collimator 14 to filter the laser beam. The collimated and expanded laser beam passes through the aperture stop 15 to select the diameter of the incident beam.

[0025] The laser beam is incident obliquely on the object 2 to be imaged (the oblique angle is between 30° and 60°, generally at a 45° angle to avoid specular reflection and ballistic transmission), generating reflected and transmitted light carrying object information; wherein... The reflected light passes sequentially through the microscope objective 4 (for magnification and collimation) and the dichroic mirror 5 (for transmission), and is then received by the first detection module 6, which measures the intensity of the reflected speckle. More specifically, the first detection module 6 includes a first plano-convex lens 61 and a CCD camera 62; The fluorescent layer 3, the object to be imaged 2, the microscope objective 4, the dichroic mirror 5, the first plano-convex lens 61, and the CCD camera 62 are arranged coaxially in sequence.

[0026] In the specific implementation process, the magnification of the microscope objective 4 is 10x, and the focal length of the first plano-convex lens 61 is 150mm.

[0027] The transmitted light shines on the fluorescent layer 3, exciting the fluorescent layer 3 to emit fluorescence in all directions; The object to be imaged 2 and the fluorescent layer 3 rotate in the same direction with the same angular velocity, and the fluorescent layer 3 is a YAG:Ce fluorescent layer; The fluorescence transmitted through the object to be imaged 2 passes sequentially through the microscope objective 4 (for magnification and collimation) and the dichroic mirror 5 (for reflection), and is then received by the second detection module 7 to measure the intensity of the transmitted speckle. More specifically, the second detection module 7 includes a filter 71, a second plano-convex lens 72, and a barrel detector 73; The fluorescence transmitted through the object to be imaged 2 is reflected by the dichroic mirror 5, then passes through the filter 71 and the second plano-convex lens 72 in sequence, and is finally received by the second detection module 7.

[0028] More specifically, the center wavelength of the fluorescence is 550 nm.

[0029] More specifically, the filter 71 is a 500nm long-pass filter.

[0030] In the specific implementation process, a 500nm long-pass filter is used to filter out laser light with a wavelength less than 500nm and its scattered light, while allowing fluorescence with a wavelength greater than 500nm to pass through. The focal length of the second plano-convex lens 72 is 150mm.

[0031] The processing module reconstructs the object image based on the reflected speckle intensity and the transmitted speckle intensity.

[0032] More specifically, the processing module reconstructs the object image in the following manner: Record the measurement obtained by CCD camera 62. i The intensity of the secondary reflection speckle is ; The barrel detector 73 measured the first i The intensity of the secondary transmission speckle is: (1); in, The first time that the object to be imaged 2 is actually illuminated i Secondary transmission speckle; The object image is reconstructed using the reflected speckle intensity instead of the transmitted speckle intensity, where the normalized formula for the reconstructed image is: (2); Substituting formula (1) into formula (2), we get: (3) Define ensemble average Normalized fluctuations , ,but , Substituting the values, we get: (4); in, The average intensity of the transmitted speckle. The average intensity of the reflected speckle. , All are constants; ; Define related functions (5); Substituting formulas (4) and (5) into formula (3), we get: ; in, The reconstructed object image in image plane coordinates The intensity value at that location, The average intensity of the transmitted speckle. The average intensity of the reflected speckle. The transmittance distribution of the object to be imaged. For related functions, For the normalized fluctuations in the intensity of the reflected speckle, For the normalized fluctuations in transmitted speckle intensity, is the relative position, and r is the coordinate of the object plane.

[0033] Example 3 like Figure 2 As shown, a speckle intensity-based quantum imaging method, implemented using the aforementioned speckle intensity-based quantum imaging system, includes the following steps: S1: The laser beam output from the laser source 1 is incident on the object to be imaged 2, generating reflected light and transmitted light carrying object information; S2: The reflected light passes sequentially through the microscope objective 4 and the dichroic mirror 5, and is then received and measured by the first detection module 6 to obtain the intensity of the reflected speckle. When transmitted light shines onto fluorescent layer 3, it excites fluorescent layer 3 to emit fluorescence in all directions; In this process, the object to be imaged 2 and the fluorescent layer 3 rotate in the same direction with the same angular velocity; S3: The fluorescence transmitted through the object to be imaged 2 passes sequentially through the microscope objective 4 and the dichroic mirror 5, and is then received and measured by the second detection module 7 to obtain the transmitted speckle intensity. S4: The processing module reconstructs the object image based on the reflected speckle intensity and the transmitted speckle intensity.

[0034] More specifically, in step S4, the object image is reconstructed in the following manner: ; ; in, The reconstructed object image in image plane coordinates The intensity value at that location, The average intensity of the transmitted speckle. The average intensity of the reflected speckle. The transmittance distribution of the object to be imaged. For related functions, For the normalized fluctuations in the intensity of the reflected speckle, For the normalized fluctuations in transmitted speckle intensity, is the relative position, and r is the coordinate of the object plane.

[0035] Based on the disclosure and teachings of the foregoing specification, those skilled in the art can make changes and modifications to the above embodiments. Therefore, the present invention is not limited to the specific embodiments disclosed and described above, and some modifications and changes to the invention should also fall within the protection scope of the claims of the present invention. Furthermore, although some specific terms are used in this specification, these terms are only for convenience of explanation and do not constitute any limitation on the present invention.

Claims

1. A speckle intensity-based quantum imaging system, characterized in that, It includes a laser light source, the object to be imaged, a fluorescent layer, a microscope objective, a dichroic mirror, a first detection module, a second detection module, and a processing module; The laser source outputs a laser beam; The laser beam is incident on the object to be imaged, producing reflected light and transmitted light; wherein... The reflected light passes sequentially through a microscope objective and a dichroic mirror, and is received by the first detection module to measure the intensity of the reflected speckle. The transmitted light shines on the fluorescent layer, exciting the fluorescent layer to emit fluorescence in all directions; The object to be imaged and the fluorescent layer rotate in the same direction with the same angular velocity; The fluorescence transmitted through the object to be imaged passes sequentially through the microscope objective and the dichroic mirror, and is then received and measured by the second detection module to obtain the intensity of the transmitted speckle. The processing module reconstructs the object image based on the reflected speckle intensity and the transmitted speckle intensity.

2. The speckle intensity-based quantum imaging system according to claim 1, characterized in that, The laser source includes a laser, a beam expander, a pinhole, a collimating lens, and an aperture stop arranged coaxially in sequence.

3. The speckle intensity-based quantum imaging system according to claim 1, characterized in that, The first detection module includes a first plano-convex lens and a CCD camera; The fluorescent layer, the object to be imaged, the microscope objective, the dichroic mirror, the first plano-convex lens, and the CCD camera are arranged coaxially in sequence.

4. The speckle intensity-based quantum imaging system according to claim 1, characterized in that, The second detection module includes a filter, a second plano-convex lens, and a barrel detector; The fluorescence transmitted through the object to be imaged is reflected by the dichroic mirror, then passes through the filter and the second plano-convex lens in sequence, and is finally received by the second detection module.

5. A speckle intensity-based quantum imaging system according to claim 1, characterized in that, The wavelength of the laser beam is 450nm.

6. The speckle intensity-based quantum imaging system according to claim 1, characterized in that, The center wavelength of the fluorescence is 550 nm.

7. A speckle intensity-based quantum imaging system according to claim 4, characterized in that, The filter is a 500nm long-pass filter.

8. A speckle intensity-based quantum imaging system according to claim 1, characterized in that, The processing module reconstructs the object image in the following way: ； ； in, The reconstructed object image in image plane coordinates The intensity value at that location, The average intensity of the transmitted speckle. The average intensity of the reflected speckle. The transmittance distribution of the object to be imaged. For related functions, For the normalized fluctuations in the intensity of the reflected speckle, For the normalized fluctuations in transmitted speckle intensity, is the relative position, and r is the coordinate of the object plane.

9. A quantum imaging method based on speckle intensity, characterized in that, Includes the following steps: S1: The laser beam output from the laser source is incident on the object to be imaged, producing reflected light and transmitted light; S2: The reflected light passes through the microscope objective and the dichroic mirror in sequence, and is received by the first detection module to measure the intensity of the reflected speckle. When transmitted light shines on the fluorescent layer, the fluorescent layer is excited to emit fluorescence in all directions; In this process, the object to be imaged and the fluorescent layer rotate in the same direction with the same angular velocity; S3: The fluorescence transmitted through the object to be imaged passes sequentially through the microscope objective and the dichroic mirror, and is then received and measured by the second detection module to obtain the intensity of the transmitted speckle. S4: The processing module reconstructs the object image based on the reflected speckle intensity and the transmitted speckle intensity.

10. The speckle intensity-based quantum imaging method according to claim 9, characterized in that, In step S4, the object image is reconstructed in the following way: ； ； in, The reconstructed object image in image plane coordinates The intensity value at that location, The average intensity of the transmitted speckle. The average intensity of the reflected speckle. The transmittance distribution of the object to be imaged. For related functions, For the normalized fluctuations in the intensity of the reflected speckle, For the normalized fluctuations in transmitted speckle intensity, is the relative position, and r is the coordinate of the object plane.

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