Intelligent substation testing method and system

Abstract

The application discloses a kind of intelligent substation test method and system, belong to substation test technical field.The method is applicable to the host computer of intelligent substation test system;System also includes embedded test device;Method includes according to the equipment capacity of equipment to be tested and configuration instance description file and carries out communication configuration, according to the generated whole station configuration description file, the configuration information and test threshold information of substation to be tested are decomposed, and the test data set and working condition simulation data matched with equipment to be tested are generated;Based on the connection relationship of equipment to be tested and each embedded test device, equipment information data set is generated in combination with component information;Control embedded test device sends digital message in equipment information data set to corresponding equipment to be tested, so that equipment to be tested responds digital message and exports action response signal, obtains substation test result according to action response signal and test threshold information, and the problem of low reliability of prior art test is solved by implementing the application.

Description

Technical Field

[0001] This invention relates to the field of substation testing technology, and in particular to a smart substation testing method and system. Background Technology

[0002] Compared with traditional substations, smart substations utilize advanced intelligent electronic devices (IEDs), network communication, and digital measurement and control technologies, which greatly improves the level of operation and maintenance in areas such as equipment monitoring, remote operation, and rapid fault handling. They have become the core carrier for the intelligent development of power grids and are being applied on a large scale in power systems.

[0003] The equipment in smart substations is mostly newly developed digital devices. The construction of these projects is characterized by short construction periods, heavy workloads, and the use of new technologies, significantly increasing the difficulty and complexity of on-site commissioning. Currently, the mainstream commissioning method in the industry is to use digital protection testing devices to test each smart electronic device in the substation individually. This approach can only verify the independent function of a single device and cannot test and verify the overall reliability of the entire substation's equipment operation within the overall substation framework. Summary of the Invention

[0004] This invention provides a testing method and system for intelligent substations, which can effectively solve the problem that existing technologies cannot test the overall operational reliability of substations.

[0005] One embodiment of the present invention provides a testing method for intelligent substations, applicable to the host computer of an intelligent substation testing system; the intelligent substation testing system further includes an embedded testing device; The intelligent substation testing method includes: Obtain the configuration information and test threshold information of the substation under test, as well as the equipment capability description files, configuration instance description files, and component information of each device under test in the substation under test; Based on the device capability description file and the configuration instance description file, the intelligent substation test system is configured for communication adaptation, and a full-station configuration description file is generated. Based on the full-site configuration description file, the configuration information, and the test threshold information, the test tasks are decomposed to generate test datasets and operating condition simulation data corresponding to each device under test; Based on the connection relationship between each device under test and each embedded test device, the test dataset, operating condition simulation data and component information of the device under test connected to the same embedded test device are integrated to generate the device information dataset corresponding to each embedded test device, and the device information dataset is sent to the corresponding embedded test device. Each embedded test device is controlled to send digital messages containing the device information data, including the simulated substation operating status and typical fault status, to the corresponding device under test, so that the device under test responds to the digital messages and sends an action response signal to the corresponding embedded test device. The system receives action response signals transmitted from each embedded testing device, analyzes the action response signals and test threshold information, and obtains the substation test results.

[0006] Furthermore, based on the equipment capability description file and the configuration instance description file, the intelligent substation testing system is configured for communication adaptation, generating a full-site configuration description file, including: Based on the device capability description file, input and output signals are selected and configured to generate a simulation test information model file; The intelligent substation test system is configured for bidirectional communication adaptation based on the configuration instance description file. After the bidirectional communication adaptation is configured, a full-station configuration description file is generated based on the simulation test information model file, the equipment capability description file, and the configuration instance description file.

[0007] Furthermore, the configuration information includes: power system parameters and communication protocol parameters; the test threshold information includes: the action time threshold of the protection device, the maximum error threshold of the time synchronization device, and the message frame loss rate threshold; Based on the overall site configuration description file, the configuration information, and the test threshold information, the test tasks are decomposed to generate test datasets and operating condition simulation data for each device under test, including: Based on the substation electrical wiring information and power system parameters in the full-station configuration description file, simulation calculations are performed on typical fault conditions of the substation to obtain transient simulation data; among them, typical fault conditions of the substation include: single-phase grounding fault, phase-to-phase short circuit fault and three-phase short circuit fault. The test evaluation thresholds for each device under test are determined based on the action time threshold of the protection device, the maximum error threshold of the time synchronization device, and the message frame loss rate threshold. Based on the test evaluation threshold, the test tasks are decomposed according to the device association relationship in the whole site configuration description file to obtain the test tasks of each device under test. The transient simulation data is grouped and encoded to generate operating condition simulation data that conforms to the communication protocol parameters; The operating condition simulation data is associated with the test tasks of each device under test to generate a test dataset corresponding to each device under test.

[0008] Furthermore, based on the action response signal and test threshold information, the substation test results are obtained through analysis, including: Based on the action response signal, extract the first action time used to characterize the action time of the protection device, the second action time used to characterize the action time of the time synchronization device, the message transmission parameters, and the functional logic execution results from the device under test. The first action time is compared with the corresponding action time threshold to obtain the first action time test result, and the second action time is compared with the corresponding maximum error threshold to obtain the second action time test result. The communication performance test results are obtained by comparing the message transmission parameters of the device under test with the corresponding message frame loss rate threshold. The substation test results are generated based on the first action time test results, the second action time test results, the communication performance test results, and the functional logic execution results.

[0009] Furthermore, before sending the device information dataset to the corresponding embedded testing device, the following steps are also included: Based on the full-site configuration description file, perform online status verification and communication link verification on each embedded test device; If both the online status verification and the communication link verification pass, it is determined that each embedded test device is online and that the communication link with the host computer and the device under test is normal. If it is confirmed that each embedded test device is online and that the communication links with the host computer and the device under test are normal, the device information dataset is sent to the corresponding embedded test device; otherwise, the device information dataset is not sent to the corresponding embedded test device.

[0010] Furthermore, the embedded testing device includes: a main control unit, a signal processing unit, and an output unit; The embedded testing device sends digital messages, including simulated substation operating status and typical fault status, from the device information dataset to the corresponding device under test, including: The embedded testing device receives the device information dataset sent by the host computer through the main control unit, and parses the device information dataset to obtain digital messages including the simulated substation operating status and typical fault status. The signal processing unit encapsulates the digital message into a sampled value format or a substation event format. The output unit converts the encapsulated digital message into an optical signal and sends the optical signal to the corresponding device under test.

[0011] As an improvement to the above solution, another embodiment of the present invention provides an intelligent substation testing system, including: a host computer and an embedded testing device; The host computer is used to acquire configuration information and test threshold information of the substation under test, as well as device capability description files, configuration instance description files, and component information of each device under test within the substation under test; perform communication adaptation configuration of the intelligent substation test system according to the device capability description files and configuration instance description files, and generate a full-station configuration description file; decompose test tasks according to the full-station configuration description file, the configuration information, and the test threshold information, and generate test datasets and operating condition simulation data corresponding to each device under test; and integrate the test datasets, operating condition simulation data, and component information of devices under test connected to the same embedded test device according to the connection relationship between each device under test and each embedded test device, generate a device information dataset corresponding to each embedded test device, and send the device information dataset to the corresponding embedded test device. The embedded testing device is used to send digital messages, which include the simulated substation operating status and typical fault status, to the corresponding device under test, so that the device under test responds to the digital messages and feeds back action response signals. The host computer is also used to receive action response signals transmitted by each embedded test device, analyze the action response signals and test threshold information, and obtain the substation test results.

[0012] Furthermore, the embedded testing device includes: a main control unit, a signal processing unit, and an output unit; The main control unit is used to receive the equipment information dataset sent by the host computer and parse the equipment information dataset to obtain digital messages including the simulated substation operating status and typical fault status. The signal processing unit is used to encapsulate the digital message into a sampled value format or a substation event format. The output unit is used to convert the encapsulated digital message into an optical signal and send the optical signal to the corresponding device under test.

[0013] Furthermore, the configuration information includes: power system parameters and communication protocol parameters; the test threshold information includes: the action time threshold of the protection device, the maximum error threshold of the time synchronization device, and the message frame loss rate threshold; The host computer is used to decompose test tasks according to the full-site configuration description file, the configuration information, and the test threshold information, and generate test datasets and operating condition simulation data corresponding to each device under test, including: Based on the substation electrical wiring information and power system parameters in the full-station configuration description file, simulation calculations are performed on typical fault conditions of the substation to obtain transient simulation data; among them, typical fault conditions of the substation include: single-phase grounding fault, phase-to-phase short circuit fault and three-phase short circuit fault. The test evaluation thresholds for each device under test are determined based on the action time threshold of the protection device, the maximum error threshold of the time synchronization device, and the message frame loss rate threshold. Based on the test evaluation threshold, the test tasks are decomposed according to the device association relationship in the whole site configuration description file to obtain the test tasks of each device under test. The transient simulation data is grouped and encoded to generate operating condition simulation data that conforms to the communication protocol parameters; The operating condition simulation data is associated with the test tasks of each device under test to generate a test dataset corresponding to each device under test.

[0014] Furthermore, the host computer is used to analyze the action response signal and test threshold information to obtain the substation test results, including: Based on the action response signal, extract the message transmission parameters of the device under test, the action logic execution result, the first action time used to characterize the action time of the protection device, and the second action time used to characterize the action time of the time synchronization device. The first action time is compared with the corresponding action time threshold to obtain the first action time test result, and the second action time is compared with the corresponding maximum error threshold to obtain the second action time test result. The communication performance test results are obtained by comparing the message transmission parameters of the device under test with the corresponding message frame loss rate threshold. The substation test results are generated based on the first action time test results, the second action time test results, the communication performance test results, and the functional logic execution results.

[0015] By implementing this invention, at least the following beneficial effects are achieved: This invention provides a testing method and system for intelligent substations. The method enables communication adaptation configuration of the intelligent substation testing system based on equipment capability description files and configuration instance description files, generating a full-station configuration description file, thus laying the data foundation for integrated testing of the entire substation. Then, based on the full-station configuration description file, configuration information, and test threshold information, test tasks are decomposed to generate several test datasets and operating condition simulation data matching the device under test (DUT). Furthermore, based on the connection relationship between the DUT and various embedded test devices, a device information dataset is generated according to the test datasets, operating condition simulation data, and component information. The overall testing task of the entire substation is broken down into tasks matched with each device under test (DUT). This approach considers the collaborative work scenarios between DUTs, enabling distributed deployment of testing tasks and allowing multiple embedded testing devices to work in parallel. The embedded testing devices simultaneously send digital messages simulating operating status and typical faults to multiple DUTs, and receive the action response signals from each DUT, transmitting them back to the host computer for comprehensive analysis and judgment. This achieves integrated closed-loop linkage testing of all equipment in the intelligent substation, effectively eliminating blind spots in single-unit testing, comprehensively verifying the collaborative capabilities between equipment within the substation, and improving the overall operational reliability. Attached Figure Description

[0016] Figure 1 This is a flowchart illustrating a smart substation testing method according to an embodiment of the present invention; Figure 2 This is a schematic diagram of the principle structure of a testing system provided in an embodiment of the present invention; Figure 3 This is a schematic diagram of the physical equipment structure of a test system provided in an embodiment of the present invention; Figure 4 This is a schematic diagram of the functional composition of a test controller provided in an embodiment of the present invention; Figure 5 This is a schematic diagram of the hardware configuration of a tester provided in an embodiment of the present invention; Figure 6 This is a schematic diagram of the integrated testing scheme for intelligent substations provided in an embodiment of the present invention; Figure 7 This is a schematic diagram of the overall testing process of the management configuration platform provided in an embodiment of the present invention; Figure 8 This is a schematic diagram of the structure of an intelligent substation testing system provided in an embodiment of the present invention. Detailed Implementation

[0017] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0018] See Figure 1 To address the problem that existing technologies cannot test the overall operational reliability of substations, an embodiment of the present invention provides a flowchart of a smart substation testing method. The method is applicable to the host computer of a smart substation testing system; the smart substation testing system also includes an embedded testing device. Specifically, the host computer, or integrated management configuration and fault simulation platform, is the computer backend system that realizes the control, simulation calculation, data processing, and report generation of the entire testing process. The embedded test device, or test controller, is the hardware execution unit of this test system. It adopts an ARM+DSP+FPGA heterogeneous hardware architecture to realize test instruction execution, message encapsulation and parsing, and bidirectional communication with the device under test. A DSP is a digital signal processor, a chip used for high-speed digital signal processing and computation. An FPGA is a field-programmable gate array, a flexibly programmable semiconductor device that supports parallel computing and customized hardware logic.

[0019] In a preferred embodiment of the present invention, such as Figure 2 As shown, the management configuration platform computer host (host computer) and network switch are deployed in the substation control room, while the test controller (embedded test device) is deployed in the protection room or intelligent terminal room. The test controllers communicate with each other via Ethernet, and the switch supports both wired and wireless Ethernet communication with the test controller, adapting to the wiring requirements of the substation site. Figure 3 As shown, the computer host and monitor serving as the management and configuration platform, multiple test controllers supporting flexible expansion configurations, and industrial-grade network switches are all adapted to the industrial operating environment of the substation site.

[0020] The intelligent substation testing method includes: S1. Obtain the configuration information and test threshold information of the substation under test, as well as the equipment capability description file, configuration instance description file, and component information of each device under test in the substation under test. Specifically, in a substation, IED refers to Intelligent Electronic Device, which refers to various electronic devices in a smart substation that perform measurement, protection, and control functions, including but not limited to line protection devices, main transformer protection devices, measurement and control devices, merging units, and intelligent terminals. The Equipment Capability Description File (ICD file) is a standard document describing the functionality, data model, and communication capabilities of a single IED. The Configuration Instance Description File (CID file) is a configured IED instance description file, generated by parsing the full-station configuration description file, and adapted to the actual operation of a single IED. Component information refers to the initial configuration information of secondary equipment (merging units, intelligent terminals, and protection devices) in the substation under test, including but not limited to the device's IP address, MAC address, SV sampling parameters, GOOSE transmit / receive parameters, initial protection settings, circuit breaker status, and alarm status information. GOOSE is a general object-oriented substation event protocol used for transmitting real-time switching signals within a substation, primarily transmitting trip commands, switch positions, and other signals.

[0021] Schematic illustration: The host computer includes a test configuration module. In the test configuration module of the host computer, the operator can import the complete electrical wiring diagram of the substation under test, the ICD file (equipment capability description file) and CID file (configuration instance description file) of each IED (device under test) through a visual interface, and manually input or automatically read the configuration information, test threshold information and component information through the station control layer MMS network.

[0022] S2. Configure the intelligent substation test system for communication adaptation based on the equipment capability description file and the configuration instance description file, and generate a full-station configuration description file. Specifically, the full station configuration description file (full station SCD file) is the configuration description file for the substation under test.

[0023] Indicatively, the host computer parses the ICD files of each IED under test, filters and configures the input and output signals between the intelligent substation test system and the IED under test, and generates the information model ICD file of the simulation test system; it parses the CID files of each IED under test, completes the bidirectional communication parameter adaptation between the test system and the IED under test; and finally integrates and generates a full-station SCD file containing the simulation test system and all IEDs under test.

[0024] Preferably, the intelligent substation testing system is configured for communication adaptation based on the equipment capability description file and the configuration instance description file to generate a full-station configuration description file, including: Based on the device capability description file, input and output signals are selected and configured to generate a simulation test information model file; The intelligent substation test system is configured for bidirectional communication adaptation based on the configuration instance description file. After the bidirectional communication adaptation is configured, a full-station configuration description file is generated based on the simulation test information model file, the equipment capability description file, and the configuration instance description file.

[0025] Specifically, the input signals are the signals output by the IED under test to the test system, including GOOSE trip signals, switch status signals, and operational alarm signals. The output signals are the signals input by the test system to the IED under test, including SMV voltage and current sampling signals, GOOSE switch position signals, and other simulation test signals. The bidirectional communication adapter configuration refers to the parameter configuration of the uplink and downlink communication links between the test system and the IED under test, including communication address, VLAN configuration, dataset mapping, and control block configuration, ensuring normal bidirectional signal interaction.

[0026] In a schematic manner, the host computer uses the SCD configuration tool to parse the ICD files of all IEDs under test, extracting core information such as input / output datasets and communication control blocks. It then filters the input and output signals that the test system needs to transmit and receive, and generates a simulation test information model file (the ICD file of the test system) according to the IEC 61850-6 standard. The host computer parses the CID files of the IEDs under test, extracting actual operating parameters such as IP address, MAC address, VLAN tag, APPID, and dataset publish / subscribe address. It then configures the corresponding communication parameters of the test system, completing bidirectional communication adaptation for downlink (test system - IED under test) and uplink (IED under test - test system). The test system is treated as a virtual IED and integrated with all IEDs under test into the same full-site configuration file. That is, the host computer integrates the simulation test information model file, the ICD files of all IEDs under test, and the CID files, generating a full-site SCD file containing the substation primary equipment model, secondary equipment model, communication system model, and test system model according to the IEC 61850-6 standard.

[0027] In a preferred embodiment of the present invention, during the bidirectional communication adaptation configuration process, the host computer can automatically complete the mapping configuration of virtual terminals, reducing the workload of manual configuration. The generated full-site configuration description file supports online compliance verification, automatically checking file format, dataset matching, and the rationality of control block configuration.

[0028] This embodiment, through bidirectional communication adaptation configuration, avoids problems such as test data loss and signal transmission failure caused by communication configuration errors, thus improving test reliability. The generated full-site configuration description file provides a unified configuration foundation for subsequent full-site device linkage testing and system-level functional verification, ensuring the integrity of integration testing.

[0029] S3. Based on the full-site configuration description file, the configuration information, and the test threshold information, the test task is decomposed to generate test datasets and operating condition simulation data corresponding to each device under test. Schematic, the host computer, based on the device association relationships in the whole station SCD file, combined with configuration information and test threshold information, decomposes the whole station test tasks into multiple standardized test units and generates an automated test plan; calls PSCAD simulation software to complete the transient simulation of typical substation faults, generates transient simulation data and encodes it into operating condition simulation data that conforms to the communication protocol; associates the operating condition simulation data with the test tasks and test thresholds of the device under test, and generates a test dataset that matches the device under test one by one.

[0030] Preferably, the configuration information includes: power system parameters and communication protocol parameters; the test threshold information includes: the action time threshold of the protection device, the maximum error threshold of the time synchronization device, and the message frame loss rate threshold; Based on the overall site configuration description file, the configuration information, and the test threshold information, the test tasks are decomposed to generate test datasets and operating condition simulation data for each device under test, including: Based on the substation electrical wiring information and power system parameters in the full-station configuration description file, simulation calculations are performed on typical fault conditions of the substation to obtain transient simulation data; among them, typical fault conditions of the substation include: single-phase grounding fault, phase-to-phase short circuit fault and three-phase short circuit fault. The test evaluation thresholds for each device under test are determined based on the action time threshold of the protection device, the maximum error threshold of the time synchronization device, and the message frame loss rate threshold. Based on the test evaluation threshold, the test tasks are decomposed according to the device association relationship in the whole site configuration description file to obtain the test tasks of each device under test. The transient simulation data is grouped and encoded to generate operating condition simulation data that conforms to the communication protocol parameters; The operating condition simulation data is associated with the test tasks of each device under test to generate a test dataset corresponding to each device under test.

[0031] Specifically, power system parameters are the fundamental parameters describing the operating characteristics of the primary and secondary electrical systems of the substation under test. These parameters include: rated voltage, rated power, system impedance, grounding method, protection settings, and operating time limits of the substation under test. Communication protocol parameters are parameters that regulate the communication behavior between the test system and the IED under test. These parameters include: sampled value communication parameters (SV protocol parameters), manufacturing message specification communication parameters (MMS protocol parameters), time synchronization parameters, and general-purpose substation event communication parameters (GOOSE protocol parameters).

[0032] Specifically, the test evaluation threshold is the pass / fail cutoff value set for each test item of a single device under test. The device relationships are the electrical connection relationships, signal interaction relationships, and functional linkage relationships between the IEDs under test recorded in the overall site configuration description file.

[0033] To illustrate, the host computer calls the built-in PSCAD simulation software, imports electrical wiring information and power system parameters, and builds a simulation model completely consistent with the substation under test. For typical fault conditions such as single-phase grounding, phase-to-phase short circuit, and three-phase short circuit, different fault locations, closing angles, and durations are set, and transient simulation calculations are performed to obtain the voltage and current time-domain transient data for the entire fault process. Based on the input test threshold information, combined with the substation voltage level, equipment type, and power grid acceptance specifications, the host computer assigns corresponding test evaluation thresholds to each device under test, action time thresholds to protection devices, maximum error thresholds to time synchronization devices, and message frame loss rate thresholds to all IEDs. Based on the device relationships, the overall test task for the entire station is broken down into test tasks corresponding to each device under test. Each test task includes all test items for that device and is bound to the corresponding test evaluation threshold. The host computer, based on communication protocol parameters, groups the transient simulation data by channel, interpolates by sampling frequency, and encodes it according to the protocol format to generate operating condition simulation data conforming to the IEC61850 standard. This data includes voltage, current, and switch status information for normal operation and typical fault states. The test tasks for each device under test (DUT) are then linked and integrated with the corresponding operating condition simulation data, test evaluation thresholds, and device configuration information to generate a test dataset that corresponds one-to-one with the DUT.

[0034] In a preferred embodiment of the present invention, typical fault conditions include not only single-phase grounding, phase-to-phase short circuit, and three-phase short circuit, but also common abnormal conditions such as developing faults, transitional faults, system oscillations, and CT saturation, covering all test scenarios for the protection device. The sampling frequency of the transient simulation data can be flexibly adjusted according to the sampling frequency of the IED under test, supporting multiple sampling frequencies such as 4kHz and 8kHz. The test task decomposition supports custom test units, allowing operators to flexibly combine different test items to generate customized test plans.

[0035] By implementing this embodiment, transient simulation data matching the actual characteristics of the substation under test is generated based on PSCAD, ensuring the authenticity of the test excitation. This effectively verifies the operating logic of the protection device under real fault conditions, improving the effectiveness of the test. Test tasks are decomposed based on equipment relationships, balancing the needs of single-device functional testing and multi-device linkage testing. This fully verifies the integrity of the entire substation's intelligent control functions and eliminates test blind spots.

[0036] S4. Based on the connection relationship between each device under test and each embedded test device, integrate the test dataset, working condition simulation data and component information of the device under test connected to the same embedded test device to generate the device information dataset corresponding to each embedded test device, and send the device information dataset to the corresponding embedded test device. In a schematic manner, the host computer obtains the physical connection correspondence between each embedded test device and the IED under test, integrates the test dataset, working condition simulation data and component information of all IEDs under test connected to the same module, and generates a device information dataset that corresponds one-to-one with the module; through an industrial-grade Ethernet switch, the device information datasets are distributed and distributed to the corresponding matching embedded test devices.

[0037] Preferably, before sending the device information dataset to the corresponding embedded testing device, the method further includes: Based on the full-site configuration description file, perform online status verification and communication link verification on each embedded test device; If both the online status verification and the communication link verification pass, it is determined that each embedded test device is online and that the communication link with the host computer and the device under test is normal. If it is confirmed that each embedded test device is online and that the communication links with the host computer and the device under test are normal, the device information dataset is sent to the corresponding embedded test device; otherwise, the device information dataset is not sent to the corresponding embedded test device.

[0038] Specifically, online status verification involves verifying the operating status and online condition of the embedded test device, confirming whether the module is powered on normally, whether it has established a network connection with the host computer, and whether it is in a ready state for normal operation. Communication link verification involves verifying the connectivity and reliability of the uplink and downlink communication links between the embedded test device and the host computer, and the fiber optic communication link between the embedded test device and the device under test.

[0039] Schematic illustration: Based on the IP address of the embedded test device in the full-site configuration description file, the host computer sends online heartbeat messages and status query commands to all modules; it receives status feedback messages from the modules and verifies the module's power-on status, operating status, hardware self-test results, and firmware version; if the module powers on normally, has no hardware faults, and has a normal network connection, it is determined that the online status is normal. The host computer and the embedded test device send test data packets via Ethernet to verify the connectivity, packet loss rate, and transmission bandwidth of the uplink and downlink communication links, confirming that the communication link with the host computer is normal; it controls the embedded test device to send GOOSE heartbeat messages and link test messages to the corresponding device under test, receives feedback messages from the device under test, verifies the connectivity, optical power, and communication parameter matching of the fiber optic link, and confirms that the communication link with the device under test is normal. Only when the online status verification of the embedded test device, the communication link verification with the host computer, and the communication link verification with the device under test all pass can the module be confirmed to be in a normal state capable of executing test tasks. If any module fails the verification, the host computer will immediately issue an alarm. After all modules have passed the verification, the device information dataset will be sent out.

[0040] In a preferred embodiment of the present invention, if the optical power of the embedded test device is found to be insufficient to meet communication requirements during the verification process, the optical power attenuation of the fiber optic link can be automatically detected through the built-in optical power measurement function of the module to locate the fault point. For modules that fail verification, the host computer can automatically perform a retry verification and record a fault log to provide a basis for troubleshooting. After verification, the host computer can send test initialization parameters, including time synchronization parameters, communication parameters, sampling frequency parameters, etc., to all verified embedded test devices to complete the pre-test initialization configuration of the module.

[0041] This embodiment performs a full-dimensional verification of the embedded testing device before the test task is issued, proactively identifying and resolving issues such as module offlineness and communication link failures, thus avoiding interruptions during testing and improving testing efficiency. It ensures that all modules participating in the test are in normal working order, preventing test data errors and distorted test results due to module failures, thereby improving the accuracy and reliability of test results. The automated verification process replaces manual device status checks and link tests, reducing the workload of on-site debugging personnel and improving the efficiency of test preparation.

[0042] S5. Control each embedded test device to send digital messages containing the device information data, including the simulated substation operating status and typical fault status, to the corresponding device under test, so that the device under test responds to the digital messages and sends an action response signal to the corresponding embedded test device. Specifically, the action response signal is the signal output by the device under test (DUT) in response to the test message. Action response signals include: substation event trip command messages or switch output signals. The substation event trip command message, also known as the GOOSE trip command message, is a trip instruction message output by the DUT via the GOOSE protocol after detecting a fault condition. It contains information such as the tripping object, tripping phase, and action time, and is the standard form of trip command output by protection devices in smart substations. The switch output signal is the hard-contact switch signal output by the DUT, measurement and control device, etc., including the open / closed status signals of normally open and normally closed contacts, used to characterize the device's operating status, switch position status, etc.

[0043] In a preferred embodiment of the present invention, when the device under test is a digital IED device such as a protection device or a merging unit, its output action response signal is a substation event trip command message in GOOSE format, which is transmitted to the embedded test device via an optical fiber link; when the device under test is a device with hard contact output such as a smart terminal or a measurement and control device, its output action response signal is a switch output signal, which is connected to the switch input interface of the embedded test device via a cable; the embedded test device converts both types of action response signals received into digital signals with timestamps and then sends them back to the host computer for analysis and judgment of the test results.

[0044] Indicatively, the host computer issues a test start command, controlling the embedded test device to parse the equipment information dataset, encapsulate the operating condition simulation data into SMV (sampled value format message) or GOOSE (substation event format message) messages according to the IEC61850 standard, and send them to the corresponding IED under test via optical fiber; after receiving the message, the IED under test performs its own protection or control logic calculations and outputs an action response signal; the embedded test device receives the action response signal in real time and transmits it back to the host computer.

[0045] Preferably, the embedded testing device includes: a main control unit, a signal processing unit, and an output unit; The embedded testing device sends digital messages, including simulated substation operating status and typical fault status, from the device information dataset to the corresponding device under test, including: The embedded testing device receives the device information dataset sent by the host computer through the main control unit, and parses the device information dataset to obtain digital messages including the simulated substation operating status and typical fault status. The signal processing unit encapsulates the digital message into a sampled value format or a substation event format. The output unit converts the encapsulated digital message into an optical signal and sends the optical signal to the corresponding device under test.

[0046] Specifically, the main control unit, i.e., the ARM main controller in the embedded test device, is the core management unit of the module, responsible for communication with the host computer, parameter parsing, test process control, and data interaction. The signal processing unit, i.e., the DSP+FPGA heterogeneous signal processing platform in the embedded test device, is responsible for high-speed processing of test data, message packaging and parsing, parallel computation, and synchronous control. The output unit, i.e., the fiber optic output module in the embedded test device, is responsible for converting electrical signals into fiber optic signals to achieve fiber optic communication with the IED under test. The sampled value format is the SMV sampled value message format conforming to the IEC61850 standard, used to transmit analog sampled data such as voltage and current. The substation event format is the GOOSE message format conforming to the IEC61850 standard, used to transmit signals such as switching quantities and trip commands.

[0047] Schematic illustration: The main control unit (ARM main controller) of the embedded test device receives the device information dataset from the host computer via an Ethernet interface. It parses the dataset, extracting test commands, operating condition simulation data, communication parameters, and configuration information of the device under test (DUT) to obtain the raw digital message data. The main control unit then sends the parsed raw digital message data to the signal processing unit (DSP+FPGA signal processing platform). The DSP performs high-speed digital signal processing, interpolation, and filtering. The FPGA, based on its parallel computing capabilities, encapsulates the data into standard messages in SMV sampled value format or GOOSE substation event format according to the IEC61850 standard. Simultaneously, it controls the synchronous transmission of multi-port messages, ensuring time synchronization accuracy down to the nanosecond level. The signal processing unit sends the encapsulated SMV / GOOSE messages to the output unit (fiber optic output module). The output unit converts the electrical signal into an optical signal conforming to fiber optic transmission standards via an optical port chip and sends the optical signal to the corresponding connected DUT via an optical fiber interface and fiber optic link.

[0048] In a preferred embodiment of the present invention, such as Figure 4As shown, the hardware architecture of the test controller (embedded test device) is based on an ARM main controller + DSP + FPGA signal processing platform, supplemented by peripheral modules such as fiber optic output module, communication module, and time synchronization module. The main control unit obtains test cases and basic parameters from the management configuration platform via Ethernet, completes parameter parsing, and sends them to the signal processing unit. Simultaneously, it receives test data returned by the signal processing unit, achieving local control of the testing process. The signal processing unit performs high-speed processing, message packaging, and parsing of test data, exhibiting high efficiency and fast response speed. It can output real-time data streams, improving the accuracy and waveform quality of test signals. Utilizing the parallel computing characteristics of the FPGA, it achieves high synchronization of various optical ports and optical serial ports, completing the synchronous transmission and reception of SMV data and GOOSE protocol with various IED devices in the substation. It also integrates auxiliary functions such as optical power measurement, virtual terminal checking, SCD file checking, and multi-mode time synchronization, enhancing the comprehensiveness of the test. The output unit packages and outputs the test data according to the IEC61850-9-1 / 2 standard. The data frame format conforms to the ISO / IEC8802.3 standard. The electrical signal is converted into an optical fiber signal through the optical port chip and transmitted to the IED under test.

[0049] In a preferred embodiment of the present invention, such as Figure 5 As shown, the core hardware of the embedded test device (test controller) includes a power supply module, an ARM board module, a DSP board module, an FPGA board module, an optical Ethernet interface, an FT3 interface, a B-code receiver, an analog interface, and a digital interface. The core features of the hardware design are: Based on the FPGA platform and parallel working mode, it adopts the on-chip SOC design concept, with high integration and good scalability. It can flexibly integrate multiple time synchronization modules such as GPS, B code, and 1588, and supports multiple serial encoding modes such as FT3 and IEC60044-7 / 8. Real-time performance far exceeds that of traditional CPUs and single ARM / DSP platforms, with synchronization accuracy reaching the nanosecond level, ensuring high precision requirements for MU (merging unit) dispersion, timestamps, and IEEE1588 time synchronization. It has a rich array of hardware interfaces, including 8 optical Ethernet ports, 8 FT3 output ports, 1 FT3 receiver port, 1 B code receiver port, 8 output / 8 input channels, analog interfaces, etc., and can connect to multiple IED devices at the same time. Each interface works independently, and each module is equipped with a dedicated algorithm unit for real-time calculation, supporting the synchronous operation of 8-16 optical ports, adapting to the testing needs of large-scale substations. The sampled value output strictly complies with IEC61850-9-2 and IEC60044-7 / 8 standards, with accurate message format. It supports the simultaneous sending and receiving of multiple GOOSE messages and establishes a mapping association between the sampled value and GOOSE and optical Ethernet interfaces to meet the needs of various test scenarios in power systems.

[0050] Indicatively, in addition to message encapsulation, the signal processing unit integrates auxiliary functions such as optical power measurement, virtual terminal checking, SCD file checking, and multi-mode time synchronization, enabling simultaneous detection of auxiliary test items during the testing process. The embedded test device supports outputting standard time synchronization signals such as B-IRIG and IEEE1588, achieving nanosecond-level high-precision time synchronization with the IED under test, ensuring the timestamp accuracy of the test messages. The FPGA of the signal processing unit supports synchronous parallel operation of 8-16 optical ports, allowing simultaneous connection to multiple IEDs under test, meeting the testing needs of large-scale substations.

[0051] S6. Receive the action response signals transmitted by each embedded test device, analyze the action response signals and test threshold information to obtain the substation test results.

[0052] To illustrate, the host computer parses the returned action response signal, extracts data such as the action time, message transmission parameters, and functional logic execution results of the device under test, compares them with the test threshold information, completes the qualification judgment of the device under test's functional compliance, communication compatibility, system configuration validity, and the integrity of the whole station's intelligent control functions, and generates comprehensive substation test results.

[0053] Preferably, the substation test results are obtained by analyzing the action response signal and test threshold information, including: Based on the action response signal, extract the first action time used to characterize the action time of the protection device, the second action time used to characterize the action time of the time synchronization device, the message transmission parameters, and the functional logic execution results from the device under test. The first action time is compared with the corresponding action time threshold to obtain the first action time test result, and the second action time is compared with the corresponding maximum error threshold to obtain the second action time test result. The communication performance test results are obtained by comparing the message transmission parameters of the device under test with the corresponding message frame loss rate threshold. The substation test results are generated based on the first action time test results, the second action time test results, the communication performance test results, and the functional logic execution results.

[0054] Specifically, the first action time represents the time interval between the moment the test system sends a fault simulation message to the device under test (DUT) and the moment the DUT outputs a tripping action response signal; it is a core indicator characterizing the speed of action of the protection device. The second action time represents the synchronization response delay of the time synchronization device, i.e., the time interval between the moment the time synchronization signal is sent and the moment the DUT completes time synchronization locking; it is used to calculate the time synchronization error. Message transmission parameters characterize the communication quality between the test system and the DUT, including message frame loss rate, transmission delay, jitter, and packet error rate. The functional logic execution result represents the execution status of the protection and control logic of the DUT after responding to the test message, including whether it operates correctly, whether it operates erroneously, whether it fails to operate, and whether it correctly issues an alarm signal.

[0055] Schematic diagram: The host computer parses action response signals, real-time operating data, and message interaction logs. Based on the test message sending timestamp and action signal receiving timestamp, it calculates and extracts the first action time and the second action time, and extracts message transmission parameters. Based on the action signal and preset protection logic, it judges the execution result of the extraction function logic. The host computer compares the first action time with the action time threshold. If the first action time is less than or equal to the action time threshold, it is considered qualified; otherwise, it is unqualified, and a first action time test result is generated. The host computer compares the synchronization error calculated for the second action time with the maximum error threshold. If the synchronization error is less than or equal to the maximum error threshold, it is considered qualified; otherwise, it is unqualified, and a second action time test result is generated. The message frame loss rate is compared with the message frame loss rate threshold. If the message frame loss rate is less than or equal to the message frame loss rate threshold, it is considered qualified; otherwise, it is unqualified. At the same time, it performs auxiliary judgments on transmission delay, jitter, and packet error rate, and generates communication performance test results. Then, the host computer integrates the sub-test results and functional logic execution results of all devices under test to complete the comprehensive qualification judgment of a single device; finally, combined with the inter-device linkage function test results, it completes the comprehensive judgment of the integrity of the intelligent control function of the whole station and the reliability of system operation, and generates a complete substation test result.

[0056] Indicatively, when extracting key parameters, the host computer can simultaneously generate test data curves, including fault voltage and current waveforms, protection action timing diagrams, and message transmission timing diagrams, visually demonstrating the testing process. For unqualified test items, the host computer can automatically locate the cause of failure, including action timeout, excessive synchronization error, message packet loss, and protection logic malfunction or failure to operate, providing guidance for on-site commissioning. Test result judgment supports multi-dimensional statistical analysis, and can perform pass rate statistics by equipment type, interval, and test item type, generating a station-wide test statistical report.

[0057] By implementing this embodiment, the test results are automatically determined through quantitative threshold comparison, avoiding subjective errors caused by manual judgment and improving the objectivity and accuracy of the test results. The logic of summarizing the test results from individual device sub-test results to the overall test results of the entire station takes into account both individual device performance verification and system-level functional verification of the entire station.

[0058] In a preferred embodiment of the present invention, separate wiring and specialized debugging are supported for protection devices that directly trip, adapting to the testing needs of different types of IEDs under test in substations. During the testing process, the host computer can monitor the testing process in real time, supporting emergency pauses, manual intervention, and other operations to ensure testing safety. The embedded testing device supports both wired and wireless communication via Ethernet with the host computer, adapting to the wiring requirements of the substation site. The intelligent substation testing system adopts a hardware connection architecture of dual networks and fiber optics. The gigabit network card of the host computer is connected to the embedded testing device via Ethernet, and the embedded testing device is connected to the IED under test via fiber optics, ensuring high-speed and reliable data transmission.

[0059] In a preferred embodiment of the present invention, such as Figure 6 As shown, the intelligent substation test system interfaces with the digital inputs or outputs of the devices under test (DUTs) at various levels. After wiring the IEDs connected to the process layer network and station control layer network, the system automatically completes the integrated testing of the entire substation based on the full-station configuration description file. For protection devices with direct sampling and tripping capabilities, separate wiring and dedicated debugging are supported. The test system acquires basic information and operational data of the entire substation through the substation control layer MMS network. The embedded test device applies standard digital signals from the process layer network to the intelligent devices, simulating voltage, current, and other sampling data under normal substation operation and various typical fault conditions (short circuit, grounding, etc.). Simultaneously, it receives GOOSE trip commands from the intelligent devices or switch output signals from the intelligent terminals, thereby verifying the accuracy of data acquisition, the validity of setting values, and the functional logic compliance of the intelligent devices for measurement, control, and protection. The functional module network port of the embedded test device is connected to the gigabit network card of the management platform computer via an Ethernet switch to achieve high-speed transmission of simulation messages. The device is connected to the IEDs under test via optical fiber, completing communication based on the IEC61850 standard. During the simulation experiment, the computer performs real-time calculations on the power grid's operating status and sends information such as voltage, current, and switch status required by the IED to the embedded test equipment via Gigabit Ethernet. The test equipment encapsulates the electrical information into SMV / GOOSE messages according to the IEC61850 standard and transmits them to the IED. The trip signal issued by the IED is transmitted back to the test equipment via GOOSE messages, converted into a simulation signal, and then transmitted to the computer via Gigabit Ethernet. This completes the iterative simulation calculation of the power grid status, forming a closed-loop test process of test-simulation-feedback.

[0060] In a preferred embodiment of the present invention, such as Figure 7 As shown, an integrated testing system is formed by combining a management configuration platform, test controllers (one or more), and IEDs under test (one or more). A computer with the management configuration platform software installed is connected to multiple parallel test controllers via Ethernet through twisted-pair cables and switches. The fiber optic interfaces of the IEDs under test are directly connected to the fiber optic input / output interfaces of the test controllers or connected through fiber optic switches. Simultaneously, the trip outputs of the IEDs are connected to the switch and input terminals to form a closed-loop testing system. The system automatically executes test tasks according to the prepared test plan, monitors the test process in real time, and supports emergency pauses and manual intervention. The test controller sends test data to the IEDs under test according to the test method, receives and parses trip information, and generates test results for a single device. After all content in the test template has been tested, a comprehensive test report for the entire station is automatically generated, supporting retesting of non-conforming items and export in multiple formats.

[0061] In a preferred embodiment of the present invention, taking the full-station integrated test of a 110kV smart substation as an example, the host computer first imports the ICD and CID files of the two main transformer protection devices, six line protection devices, twelve measurement and control devices, eight merging units, and eight smart terminals of the substation under test. It also inputs power system parameters such as 110kV rated voltage, 50Hz rated frequency, system impedance, and protection settings, as well as SV, GOOSE, and MMS communication protocol parameters. The protection action time threshold is set to ≤40ms, the time synchronization error threshold to ≤1μs, and the message frame loss rate threshold to ≤0.1%. Simultaneously, it reads the IP, MAC address, sampling parameters, and other component information of all devices under test. Then, the host computer parses the ICD files of all IEDs under test, configures the input and output signals of the test system, and generates the ICD file of the simulation test system. It parses the CID files to complete bidirectional communication adaptation, and finally integrates and generates a full-station SCD file containing the simulation detection system and all IEDs under test. Next, the host computer breaks down the entire substation testing task into 5 standardized test units, generating an automated test plan; it calls PSCAD simulation software to complete transient simulations of single-phase grounding, phase-to-phase short circuit, and three-phase short circuit faults, generating operating condition simulation data; and it generates 28 test datasets that are matched one-to-one with the devices under test. The substation under test is currently configured with 4 embedded test devices, each connected to 7 IEDs under test; the host computer generates 4 device information datasets according to the connection relationships and sends them to the corresponding embedded test devices. Then, the host computer issues a test start command, controlling the embedded test devices to encapsulate the operating condition simulation data into SMV or GOOSE messages and send them to the IEDs under test; after receiving the fault simulation message, the IED under test outputs a GOOSE trip command, which is transmitted back to the host computer through the embedded test device. Finally, the host computer parses the transmitted trip signal, extracts data such as protection action time, synchronization error, and message frame loss rate, compares it with preset thresholds, completes the qualification judgment of all devices under test, and generates the comprehensive test results for the 110kV substation.

[0062] By implementing this embodiment, the intelligent substation testing system is configured for communication adaptation based on the equipment capability description file and configuration instance description file, generating a full-station configuration description file, laying the data foundation for integrated testing of the entire substation. Then, based on the full-station configuration description file, configuration information, and test threshold information, test tasks are decomposed to generate several test datasets and operating condition simulation data matching the devices under test (DUT). Furthermore, based on the connection relationship between the DUT and each embedded test device, a device information dataset is generated according to the test dataset, operating condition simulation data, and component information. The overall testing task of the entire substation is decomposed into tasks matching each DUT, considering the scenario of collaborative work between the DUTs, realizing the distributed deployment of test tasks, and enabling multiple embedded test devices to work in parallel. The embedded test devices simultaneously send digital messages simulating operating status and typical faults to multiple DUTs, and receive the action response signals output by each DUT and transmit them back to the host computer for comprehensive analysis and judgment. This realizes integrated closed-loop linkage testing of all equipment in the intelligent substation, effectively eliminating blind spots in single-unit testing, comprehensively verifying the collaborative capabilities between equipment within the substation, and improving the overall operational reliability.

[0063] See Figure 8 This is a schematic diagram of the structure of an intelligent substation testing system provided in an embodiment of the present invention, including: a host computer and an embedded testing device; The host computer is used to acquire configuration information and test threshold information of the substation under test, as well as device capability description files, configuration instance description files, and component information of each device under test within the substation under test; perform communication adaptation configuration of the intelligent substation test system according to the device capability description files and configuration instance description files, and generate a full-station configuration description file; decompose test tasks according to the full-station configuration description file, the configuration information, and the test threshold information, and generate test datasets and operating condition simulation data corresponding to each device under test; and integrate the test datasets, operating condition simulation data, and component information of devices under test connected to the same embedded test device according to the connection relationship between each device under test and each embedded test device, generate a device information dataset corresponding to each embedded test device, and send the device information dataset to the corresponding embedded test device. The embedded testing device is used to send digital messages, which include the simulated substation operating status and typical fault status, to the corresponding device under test, so that the device under test responds to the digital messages and feeds back action response signals. The host computer is also used to receive action response signals transmitted by each embedded test device, analyze the action response signals and test threshold information, and obtain the substation test results.

[0064] Preferably, the embedded testing device includes: a main control unit, a signal processing unit, and an output unit; The main control unit is used to receive the equipment information dataset sent by the host computer and parse the equipment information dataset to obtain digital messages including the simulated substation operating status and typical fault status. The signal processing unit is used to encapsulate the digital message into a sampled value format or a substation event format. The output unit is used to convert the encapsulated digital message into an optical signal and send the optical signal to the corresponding device under test.

[0065] Preferably, the host computer is used to perform communication adaptation configuration on the intelligent substation testing system according to the device capability description file and the configuration instance description file, and generate a full-station configuration description file, including: Based on the device capability description file, input and output signals are selected and configured to generate a simulation test information model file; The intelligent substation test system is configured for bidirectional communication adaptation based on the configuration instance description file. After the bidirectional communication adaptation is configured, a full-station configuration description file is generated based on the simulation test information model file, the equipment capability description file, and the configuration instance description file.

[0066] Preferably, the configuration information includes: power system parameters and communication protocol parameters; the test threshold information includes: the action time threshold of the protection device, the maximum error threshold of the time synchronization device, and the message frame loss rate threshold; The host computer is used to decompose test tasks according to the full-site configuration description file, the configuration information, and the test threshold information, and generate test datasets and operating condition simulation data corresponding to each device under test, including: Based on the substation electrical wiring information and power system parameters in the full-station configuration description file, simulation calculations are performed on typical fault conditions of the substation to obtain transient simulation data; among them, typical fault conditions of the substation include: single-phase grounding fault, phase-to-phase short circuit fault and three-phase short circuit fault. The test evaluation thresholds for each device under test are determined based on the action time threshold of the protection device, the maximum error threshold of the time synchronization device, and the message frame loss rate threshold. Based on the test evaluation threshold, the test tasks are decomposed according to the device association relationship in the whole site configuration description file to obtain the test tasks of each device under test. The transient simulation data is grouped and encoded to generate operating condition simulation data that conforms to the communication protocol parameters; The operating condition simulation data is associated with the test tasks of each device under test to generate a test dataset corresponding to each device under test.

[0067] Preferably, the host computer is used to analyze the action response signal and test threshold information to obtain the substation test results, including: Based on the action response signal, extract the message transmission parameters, action logic execution results, first action time used to characterize the action time of the protection device, and second action time used to characterize the action time of the time synchronization device of the device under test. The first action time is compared with the corresponding action time threshold to obtain the first action time test result, and the second action time is compared with the corresponding maximum error threshold to obtain the second action time test result. The communication performance test results are obtained by comparing the message transmission parameters of the device under test with the corresponding message frame loss rate threshold. The substation test results are generated based on the first action time test results, the second action time test results, the communication performance test results, and the functional logic execution results.

[0068] Preferably, the action response signal includes: a substation event trip command message or a switch output signal.

[0069] This invention provides an intelligent substation testing system. A host computer configures the intelligent substation testing system for communication adaptation based on equipment capability description files and configuration instance description files, generating a full-station configuration description file, laying the data foundation for integrated testing of the entire substation. Then, based on the full-station configuration description file, configuration information, and test threshold information, test tasks are broken down to generate several test datasets and operating condition simulation data matching the device under test (DUT). Furthermore, based on the connection relationship between the DUT and various embedded test devices, a device information dataset is generated according to the test datasets, operating condition simulation data, and component information. The overall testing task of the entire substation is broken down into tasks matched with each device under test (DUT). The scenario of collaborative work between DUTs is considered, and the distributed deployment of test tasks is realized, enabling multiple embedded test devices to work in parallel. The embedded test devices simultaneously send digital messages simulating operating status and typical faults to multiple DUTs, and receive the action response signals output by each DUT and send them back to the host computer for comprehensive analysis and judgment. This realizes integrated closed-loop linkage testing of all equipment in the smart substation, effectively eliminating blind spots in single-unit testing, and comprehensively verifying the collaborative capabilities between equipment in the substation, thereby improving the overall operational reliability.

[0070] It should be noted that the system embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs. Furthermore, in the accompanying drawings of the system embodiments provided by this invention, the connection relationships between modules indicate that they have communication connections, which can be specifically implemented as one or more communication buses or signal lines. Those skilled in the art can understand and implement this without any creative effort.

[0071] Those skilled in the art will understand that, for convenience and brevity, the specific working process of the system described above can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0072] The above description represents the preferred embodiments of the present invention. It should be noted that those skilled in the art can make various improvements and modifications without departing from the principles of the present invention, and these improvements and modifications are also considered to be within the scope of protection of the present invention.

Claims

1. A testing method for intelligent substations, characterized in that, A host computer suitable for intelligent substation testing systems; The intelligent substation testing system also includes an embedded testing device; The intelligent substation testing method includes: Obtain the configuration information and test threshold information of the substation under test, as well as the equipment capability description files, configuration instance description files, and component information of each device under test in the substation under test; Based on the device capability description file and the configuration instance description file, the intelligent substation test system is configured for communication adaptation, and a full-station configuration description file is generated. Based on the full-site configuration description file, the configuration information, and the test threshold information, the test tasks are decomposed to generate test datasets and operating condition simulation data corresponding to each device under test; Based on the connection relationship between each device under test and each embedded test device, the test dataset, operating condition simulation data and component information of the device under test connected to the same embedded test device are integrated to generate the device information dataset corresponding to each embedded test device, and the device information dataset is sent to the corresponding embedded test device. Each embedded test device is controlled to send digital messages containing the device information data, including the simulated substation operating status and typical fault status, to the corresponding device under test, so that the device under test responds to the digital messages and sends an action response signal to the corresponding embedded test device. The system receives action response signals transmitted from each embedded testing device, analyzes the action response signals and test threshold information, and obtains the substation test results.

2. The intelligent substation testing method as described in claim 1, characterized in that, Based on the device capability description file and the configuration instance description file, the intelligent substation testing system is configured for communication adaptation, generating a full-site configuration description file, including: Based on the device capability description file, input and output signals are selected and configured to generate a simulation test information model file; The intelligent substation test system is configured for bidirectional communication adaptation based on the configuration instance description file. After the bidirectional communication adaptation is configured, a full-station configuration description file is generated based on the simulation test information model file, the equipment capability description file, and the configuration instance description file.

3. The intelligent substation testing method as described in claim 1, characterized in that, The configuration information includes: power system parameters and communication protocol parameters; the test threshold information includes: the action time threshold of the protection device, the maximum error threshold of the time synchronization device, and the message frame loss rate threshold. Based on the overall site configuration description file, the configuration information, and the test threshold information, the test tasks are decomposed to generate test datasets and operating condition simulation data for each device under test, including: Based on the substation electrical wiring information and power system parameters in the full-station configuration description file, simulation calculations are performed on typical fault conditions of the substation to obtain transient simulation data; among them, typical fault conditions of the substation include: single-phase grounding fault, phase-to-phase short circuit fault and three-phase short circuit fault. The test evaluation thresholds for each device under test are determined based on the action time threshold of the protection device, the maximum error threshold of the time synchronization device, and the message frame loss rate threshold. Based on the test evaluation threshold, the test tasks are decomposed according to the device association relationship in the whole site configuration description file to obtain the test tasks of each device under test. The transient simulation data is grouped and encoded to generate operating condition simulation data that conforms to the communication protocol parameters; The operating condition simulation data is associated with the test tasks of each device under test to generate a test dataset corresponding to each device under test.

4. The intelligent substation testing method as described in claim 3, characterized in that, Based on the analysis of the action response signal and test threshold information, the substation test results are obtained, including: Based on the action response signal, extract the first action time used to characterize the action time of the protection device, the second action time used to characterize the action time of the time synchronization device, the message transmission parameters, and the functional logic execution results from the device under test. The first action time is compared with the corresponding action time threshold to obtain the first action time test result, and the second action time is compared with the corresponding maximum error threshold to obtain the second action time test result. The communication performance test results are obtained by comparing the message transmission parameters of the device under test with the corresponding message frame loss rate threshold. The substation test results are generated based on the first action time test results, the second action time test results, the communication performance test results, and the functional logic execution results.

5. The intelligent substation testing method as described in claim 1, characterized in that, Before sending the device information dataset to the corresponding embedded test device, the following steps are also included: Based on the full-site configuration description file, perform online status verification and communication link verification on each embedded test device; If both the online status verification and the communication link verification pass, it is determined that each embedded test device is online and that the communication link with the host computer and the device under test is normal. If it is confirmed that each embedded test device is online and that the communication links with the host computer and the device under test are normal, the device information dataset is sent to the corresponding embedded test device; otherwise, the device information dataset is not sent to the corresponding embedded test device.

6. The intelligent substation testing method as described in claim 1, characterized in that, The embedded testing device includes: a main control unit, a signal processing unit, and an output unit; The embedded testing device sends digital messages, including simulated substation operating status and typical fault status, from the device information dataset to the corresponding device under test, including: The embedded testing device receives the device information dataset sent by the host computer through the main control unit, and parses the device information dataset to obtain digital messages including the simulated substation operating status and typical fault status. The signal processing unit encapsulates the digital message into a sampled value format or a substation event format. The output unit converts the encapsulated digital message into an optical signal and sends the optical signal to the corresponding device under test.

7. A smart substation testing system, characterized in that, include: Host computer and embedded testing equipment; The host computer is used to acquire the configuration information and test threshold information of the substation under test, the equipment capability description files, configuration instance description files, and component information of each device under test in the substation under test; to perform communication adaptation configuration on the intelligent substation test system according to the equipment capability description files and the configuration instance description files, and to generate a full-station configuration description file; and to decompose the test tasks according to the full-station configuration description file, the configuration information, and the test threshold information, and to generate test datasets and operating condition simulation data corresponding to each device under test. Based on the connection relationship between each device under test and each embedded test device, the test dataset, operating condition simulation data and component information of the device under test connected to the same embedded test device are integrated to generate the device information dataset corresponding to each embedded test device, and the device information dataset is sent to the corresponding embedded test device. The embedded testing device is used to send digital messages, which include the simulated substation operating status and typical fault status, to the corresponding device under test, so that the device under test responds to the digital messages and feeds back action response signals. The host computer is also used to receive action response signals transmitted by each embedded test device, analyze the action response signals and test threshold information, and obtain the substation test results.

8. The intelligent substation testing system as described in claim 7, characterized in that, The embedded testing device includes: a main control unit, a signal processing unit, and an output unit; The main control unit is used to receive the equipment information dataset sent by the host computer and parse the equipment information dataset to obtain digital messages including the simulated substation operating status and typical fault status. The signal processing unit is used to encapsulate the digital message into a sampled value format or a substation event format. The output unit is used to convert the encapsulated digital message into an optical signal and send the optical signal to the corresponding device under test.

9. The intelligent substation testing system as described in claim 7, characterized in that, The configuration information includes: power system parameters and communication protocol parameters; the test threshold information includes: the action time threshold of the protection device, the maximum error threshold of the time synchronization device, and the message frame loss rate threshold. The host computer is used to decompose test tasks according to the full-site configuration description file, the configuration information, and the test threshold information, and generate test datasets and operating condition simulation data corresponding to each device under test, including: Based on the substation electrical wiring information and power system parameters in the full-station configuration description file, simulation calculations are performed on typical fault conditions of the substation to obtain transient simulation data; among them, typical fault conditions of the substation include: single-phase grounding fault, phase-to-phase short circuit fault and three-phase short circuit fault. The test evaluation thresholds for each device under test are determined based on the action time threshold of the protection device, the maximum error threshold of the time synchronization device, and the message frame loss rate threshold. Based on the test evaluation threshold, the test tasks are decomposed according to the device association relationship in the whole site configuration description file to obtain the test tasks of each device under test. The transient simulation data is grouped and encoded to generate operating condition simulation data that conforms to the communication protocol parameters; The operating condition simulation data is associated with the test tasks of each device under test to generate a test dataset corresponding to each device under test.

10. The intelligent substation testing system as described in claim 9, characterized in that, The host computer is used to analyze the action response signal and test threshold information to obtain the substation test results, including: Based on the action response signal, extract the message transmission parameters of the device under test, the action logic execution result, the first action time used to characterize the action time of the protection device, and the second action time used to characterize the action time of the time synchronization device. The first action time is compared with the corresponding action time threshold to obtain the first action time test result, and the second action time is compared with the corresponding maximum error threshold to obtain the second action time test result. The communication performance test results are obtained by comparing the message transmission parameters of the device under test with the corresponding message frame loss rate threshold. The substation test results are generated based on the first action time test results, the second action time test results, the communication performance test results, and the functional logic execution results.

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