Device detection method and apparatus for use in a power system

Abstract

The present disclosure relates to a device detection method and device applied to a power system, the method comprising: generating a time-domain trapezoidal pulse sequence and inputting the time-domain trapezoidal pulse sequence to a device under test; detecting frequency-domain response results of each frequency point in a frequency band under test of the device under test, and determining a device detection result based on the frequency-domain response results of each frequency point in the frequency band under test.

Description

Technical Field

[0001] This disclosure relates to the field of power system technology, and specifically to a method and apparatus for testing equipment in power systems. Background Technology

[0002] In the health status monitoring of high-voltage power equipment such as power cables and transformers, frequency sweep analysis is a key method for identifying insulation aging, moisture, and partial discharge defects.

[0003] The main measurement technique used in related technologies is sinusoidal wave frequency sweeping. This technique involves transmitting a sine wave at each frequency point using a signal generator and measuring the steady-state response of the system under the sinusoidal wave at each frequency point. This method is relatively inefficient. Summary of the Invention

[0004] To overcome the problems existing in the related technologies, this disclosure provides a method and apparatus for testing equipment in power systems, thereby addressing the deficiencies in the related technologies.

[0005] According to a first aspect of the present disclosure, a device testing method for a power system is provided, the method comprising: A time-domain trapezoidal pulse sequence is generated and input into the device under test. The frequency domain response results of the device under test at each measured frequency point within the measured frequency band are detected, and the device test results are determined based on the frequency domain response results at each measured frequency point within the measured frequency band.

[0006] In some possible embodiments of this disclosure, the method further includes: Adjust the repetition frequency of the time-domain trapezoidal pulses within the time-domain trapezoidal pulse sequence to adjust the sweep resolution of the measured frequency points within the measured frequency band.

[0007] In some possible embodiments of this disclosure, the repetition frequency of the time-domain trapezoidal pulses in the time-domain trapezoidal pulse sequence is negatively correlated with the sweep resolution of the measured frequency point within the measured frequency band.

[0008] In some possible embodiments of this disclosure, the method further includes: Adjust the rise time of the time-domain trapezoidal pulses within the time-domain trapezoidal pulse sequence to adjust the sweep bandwidth of the frequency band under test.

[0009] In some possible embodiments of this disclosure, the rise time of the time-domain trapezoidal pulses in the time-domain trapezoidal pulse sequence is negatively correlated with the sweep bandwidth of the measured frequency band.

[0010] In some possible embodiments of this disclosure, the method further includes: Adjust the peak duration of the time-domain trapezoidal pulses within the time-domain trapezoidal pulse sequence to adjust the frequency point where the excitation amplitude is 0 within the measured frequency band.

[0011] In some possible embodiments of this disclosure, inputting the time-domain trapezoidal pulse sequence to the device under test includes: After each adjustment of the time-domain parameters of the time-domain trapezoidal pulses in the time-domain trapezoidal pulse sequence, the time-domain trapezoidal pulse sequence is input to the device under test until the time-domain parameters are adjusted a preset number of times. The time-domain parameters include repetition frequency, rise duration and flat-top duration. Each time the time-domain parameters are adjusted, at least one of the repetition frequency, rise duration and flat-top duration is adjusted.

[0012] In some possible embodiments of this disclosure, the step of detecting the frequency domain response results of the device under test at each measured frequency point within the measured frequency band, and determining the device detection result based on the frequency domain response results of each measured frequency point within the measured frequency band, includes: The frequency domain response of the device under test at each measured frequency point in the measured frequency band is detected after the time domain trapezoidal pulse sequence with each time domain parameter is injected. For each measured frequency point within the measured frequency band, the total frequency response result of the measured frequency point is determined based on the frequency domain response result of the device under test after the time domain trapezoidal pulse sequence with each time domain parameter is injected at the measured frequency point; The device detection result is determined based on the total frequency domain response of each measured frequency point within the measured frequency band.

[0013] In some possible embodiments of this disclosure, determining the total frequency domain response at the measured frequency point based on the frequency domain response at that measured frequency point after the device under test is injected with the time-domain trapezoidal pulse sequence of various time-domain parameters includes: The weight of each time-domain parameter is determined based on the excitation amplitude at the measured frequency point after the time-domain trapezoidal pulse sequence of each time-domain parameter is injected into the device under test. Based on the weights of each time-domain parameter, the frequency domain response results of the device under test at the measured frequency point after the time-domain trapezoidal pulse sequence of each time-domain parameter is injected are weighted and summed, and the summation result is determined as the total frequency domain response result at the measured frequency point.

[0014] According to a second aspect of the present disclosure, a device for testing equipment in a power system is provided, the device comprising: The input module is used to generate a time-domain trapezoidal pulse sequence and input the time-domain trapezoidal pulse sequence to the device under test; The detection module is used to detect the frequency domain response results of the device under test at each measured frequency point within the measured frequency band, and to determine the device detection result based on the frequency domain response results of each measured frequency point within the measured frequency band.

[0015] In some possible embodiments of this disclosure, the device further includes an adjustment module for: Adjust the repetition frequency of the time-domain trapezoidal pulses within the time-domain trapezoidal pulse sequence to adjust the sweep resolution of the measured frequency points within the measured frequency band.

[0016] In some possible embodiments of this disclosure, the repetition frequency of the time-domain trapezoidal pulses in the time-domain trapezoidal pulse sequence is negatively correlated with the sweep resolution of the measured frequency point within the measured frequency band.

[0017] In some possible embodiments of this disclosure, the device further includes an adjustment module for: Adjust the rise time of the time-domain trapezoidal pulses within the time-domain trapezoidal pulse sequence to adjust the sweep bandwidth of the frequency band under test.

[0018] In some possible embodiments of this disclosure, the rise time of the time-domain trapezoidal pulses in the time-domain trapezoidal pulse sequence is negatively correlated with the sweep bandwidth of the measured frequency band.

[0019] In some possible embodiments of this disclosure, the device further includes an adjustment module for: Adjust the peak duration of the time-domain trapezoidal pulses within the time-domain trapezoidal pulse sequence to adjust the frequency point where the excitation amplitude is 0 within the measured frequency band.

[0020] In some possible embodiments of this disclosure, when the input module is used to input the time-domain trapezoidal pulse sequence to the device under test, it is used for: After each adjustment of the time-domain parameters of the time-domain trapezoidal pulses in the time-domain trapezoidal pulse sequence, the time-domain trapezoidal pulse sequence is input to the device under test until the time-domain parameters are adjusted a preset number of times. The time-domain parameters include repetition frequency, rise duration and flat-top duration. Each time the time-domain parameters are adjusted, at least one of the repetition frequency, rise duration and flat-top duration is adjusted.

[0021] In some possible implementations of this disclosure, the detection module is used for: The frequency domain response of the device under test at each measured frequency point in the measured frequency band is detected after the time domain trapezoidal pulse sequence with each time domain parameter is injected. For each measured frequency point within the measured frequency band, the total frequency response result of the measured frequency point is determined based on the frequency domain response result of the device under test after the time domain trapezoidal pulse sequence with each time domain parameter is injected at the measured frequency point; The device detection result is determined based on the total frequency domain response of each measured frequency point within the measured frequency band.

[0022] In some possible embodiments of this disclosure, when the detection module is used to determine the total frequency domain response at the measured frequency point based on the frequency domain response result at the measured frequency point after the device under test is injected with the time domain trapezoidal pulse sequence of various time domain parameters, it is used to: The weight of each time-domain parameter is determined based on the excitation amplitude at the measured frequency point after the time-domain trapezoidal pulse sequence of each time-domain parameter is injected into the device under test. Based on the weights of each time-domain parameter, the frequency domain response results of the device under test at the measured frequency point after the time-domain trapezoidal pulse sequence of each time-domain parameter is injected are weighted and summed, and the summation result is determined as the total frequency domain response result at the measured frequency point.

[0023] According to a third aspect of the present disclosure, a computer program product is provided, including a computer program / instructions that, when executed by a processor, implement the steps of the method described in the first aspect.

[0024] According to a fourth aspect of the present disclosure, an electronic device is provided, the electronic device including a memory and a processor, the memory being configured to store computer instructions executable on the processor, and the processor being configured to implement the method of the first aspect when executing the computer instructions.

[0025] According to a fifth aspect of the present disclosure, a computer-readable storage medium is provided having a computer program stored thereon, which, when executed by a processor, implements the method described in the first aspect.

[0026] The technical solutions provided by the embodiments of this disclosure may include the following beneficial effects: The device testing method for power systems provided in this disclosure generates a time-domain trapezoidal pulse sequence and inputs it to the device under test (DUT). It then detects the frequency domain response of the DUT at each measured frequency point within the measured frequency band and determines the device testing result based on the frequency domain response results at each measured frequency point within the measured frequency band. This method uses a time-domain trapezoidal pulse sequence to cover the excitation energy of the measured frequency band in the frequency domain, thereby exciting the frequency domain response of the DUT at multiple measured frequency points within the measured frequency band. This allows for parallel frequency sweeping of multiple measured frequency points, improving the frequency sweeping efficiency and testing effect of the DUT. Attached Figure Description

[0027] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.

[0028] Figure 1 This is a flowchart illustrating an exemplary embodiment of the present disclosure of a device testing method applied to a power system; Figure 2 This is a schematic diagram of the structure of an equipment testing device applied to a power system, as shown in an exemplary embodiment of this disclosure; Figure 3 This is a structural block diagram of an electronic device illustrated in an exemplary embodiment of the present disclosure. Detailed Implementation

[0029] Exemplary embodiments will now be described in detail, examples of which are illustrated in the accompanying drawings. When the following description relates to the drawings, unless otherwise indicated, the same numerals in different drawings denote the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this disclosure. Rather, they are merely examples of apparatuses and methods consistent with some aspects of this disclosure as detailed in the appended claims.

[0030] The terminology used in this disclosure is for the purpose of describing particular embodiments only and is not intended to be limiting of the disclosure. The singular forms “a,” “the,” and “the” as used in this disclosure and the appended claims are also intended to include the plural forms unless the context clearly indicates otherwise. It should also be understood that the term “and / or” as used herein refers to and includes any and all possible combinations of one or more of the associated listed items.

[0031] It should be understood that although the terms first, second, third, etc., may be used in this disclosure to describe various information, such information should not be limited to these terms. These terms are used only to distinguish information of the same type from one another. For example, without departing from the scope of this disclosure, first information may also be referred to as second information, and similarly, second information may also be referred to as first information. Depending on the context, the word "if" as used herein may be interpreted as "when," "when," or "in response to determination."

[0032] In the health status monitoring of high-voltage power equipment such as power cables and transformers, frequency sweep analysis is a key method for identifying insulation aging, moisture, and partial discharge defects.

[0033] The main measurement technique used in related technologies is sinusoidal wave frequency sweeping. This technique involves transmitting a sine wave at each frequency point using a signal generator and measuring the steady-state response of the system under the sinusoidal wave at each frequency point. This method is relatively inefficient.

[0034] The frequency sweeping methods described above in related technologies place high demands on hardware performance. To achieve a sufficient signal-to-noise ratio on power cables with large capacitance and long distances, a high-voltage, high-power linear power amplifier is required. However, in high-frequency bands (such as...),... Amplifiers that combine high voltage output with wide bandwidth are extremely difficult to develop and very expensive.

[0035] The frequency sweeping methods described above in related technologies have low testing efficiency. Sinusoidal frequency sweeping is essentially a quasi-static process, requiring the system to reach a steady state before each frequency point can be measured. In online monitoring scenarios where environmental noise fluctuates drastically or the state of the device under test changes instantaneously, this long acquisition method cannot capture the dynamic evolution of frequency domain characteristics, making it difficult to apply to rapid detection or online transient monitoring.

[0036] The frequency sweeping methods described above in related technologies have a low signal-to-noise ratio. In environments with strong electromagnetic interference, low-amplitude sinusoidal test signals are easily submerged and difficult to decouple from the power frequency background. In particular, the frequency sweeping methods described above in related technologies lack precise control over the spectral energy distribution and have energy dead zones (spectral zero points) that lead to inaccurate measurements.

[0037] Based on this, in a first aspect, various embodiments of this disclosure provide a device testing method for power systems. This method utilizes time-domain trapezoidal pulse excitation to achieve equivalent wideband frequency sweep, that is, by covering the excitation energy of multiple measured frequency bands in the frequency domain with a time-domain trapezoidal pulse sequence, the device under test is excited to excite the frequency domain response of multiple measured frequency points in the measured frequency band, thereby completing the frequency sweep of multiple measured frequency points in parallel, improving the frequency sweep efficiency and detection effect of the device under test.

[0038] Please refer to the appendix. Figure 1 The example shows a flowchart of the device detection method applied to a power system, including steps S101 to S102.

[0039] In step S101, a time-domain trapezoidal pulse sequence is generated and input to the device under test.

[0040] For example, nonlinear switching characteristics can be used to generate time-domain trapezoidal pulse sequences, avoiding expensive linear amplifiers, and obtaining excitation amplitudes (i.e., energy components) with higher amplitudes than sine waves in the frequency domain.

[0041] Among them, the time-domain trapezoidal pulse sequence can cover the excitation energy of multiple measured frequency bands in the frequency domain. The analytical solution of the continuous Fourier transform of a single trapezoidal pulse in the time domain is as follows: In the above formula, Let f be the excitation amplitude or spectrum function at frequency f in the frequency domain. The amplitude of the trapezoidal pulse. Rise time (e.g., fall time equals rise time). The width of the flat top (assuming the descent time equals the ascent time).

[0042] As can be seen from the above equation, a single time-domain trapezoidal pulse injection can excite the energy components of the entire frequency band in parallel in the frequency domain, which constitutes the physical basis for instantaneous frequency sweep.

[0043] For example, before, after, or simultaneously with the generation of the time-domain trapezoidal pulse sequence, the repetition frequency of the time-domain trapezoidal pulses in the time-domain trapezoidal pulse sequence can be adjusted to adjust the sweep resolution of the measured frequency points within the measured frequency band.

[0044] Since the time-domain trapezoidal pulse sequence has a repetition frequency of... A periodic sequence whose spectrum consists of a series of... The discrete spectral lines at that point. According to the Fourier series, the nth harmonic frequency of the time-domain trapezoidal pulse sequence is... discrete amplitude at for: As shown in the above equation, the repetition frequency of the time-domain trapezoidal pulses within the time-domain trapezoidal pulse sequence is negatively correlated with the sweep resolution of the measured frequency points within the measured frequency band. The repetition frequency determines the density of impedance observation points in the frequency domain and the spectral line spacing. Reduce This allows for a finer spectral density, thus improving frequency resolution. Sweep resolution is the sweep step size, which is the interval between adjacent measured frequencies. A finer density of measured frequencies can be obtained by reducing the repetition frequency, i.e., reducing the sweep step size.

[0045] For example, the rise time of the time-domain trapezoidal pulses in the time-domain trapezoidal pulse sequence can be adjusted before, after, or simultaneously with the generation of the time-domain trapezoidal pulse sequence to adjust the sweep bandwidth of the frequency band under test.

[0046] The rise time of the time-domain trapezoidal pulses within the time-domain trapezoidal pulse sequence is negatively correlated with the sweep bandwidth of the measured frequency band. By shortening the rise time, the edge steepness can be compressed, pushing the envelope zero point to extremely high frequencies, ensuring... The amplitude response is smooth within the sweep frequency range.

[0047] The second term of the spectrum This constitutes the high-frequency amplitude modulation envelope of the spectrum. Its zero-crossing point (the frequency at which the excitation amplitude is 0) appears at: This determines the equivalent bandwidth of the frequency sweep. The steeper the time-domain edge, the slower the frequency-domain envelope decreases. By... Compression to the nanosecond level essentially expands the effective dynamic range of the excitation signal, ensuring that the energy amplitude in the high-frequency band is higher than the background noise benchmark.

[0048] For example, before, after, or simultaneously with the generation of the time-domain trapezoidal pulse sequence, the flat-top duration of the time-domain trapezoidal pulses in the time-domain trapezoidal pulse sequence can be adjusted to adjust the frequency point where the excitation amplitude is 0 in the measured frequency band.

[0049] The first term of the spectrum The main envelope of the spectrum is formed, and its zero-crossing point (i.e., the frequency point where the excitation amplitude is 0) appears at: Flat-top duration The energy concentration of the main lobe of the spectrum is determined by adjusting the peak duration. In essence, this corresponds to "frequency domain shifting," which allows for the artificial movement of the blind zone position (i.e., the frequency point with an excitation amplitude of 0) to ensure that the target frequency point (i.e. the frequency point that is to be detected) receives a sufficient excitation amplitude.

[0050] The trapezoidal pulse spectrum consists of two... Superposition mapping of functions. This disclosure achieves this through time-domain co-regulation. (Control step size) (Control bandwidth) and (By controlling the energy blind zone offset), it is theoretically possible to synthesize an equivalent swept spectrum with flat and continuous amplitude within a specific frequency band.

[0051] In step S102, the frequency domain response results of the device under test at each measured frequency point within the measured frequency band are detected, and the device test result is determined based on the frequency domain response results of each measured frequency point within the measured frequency band.

[0052] Frequency domain response results can include impedance results, etc.

[0053] The device testing method for power systems provided in this disclosure generates a time-domain trapezoidal pulse sequence and inputs it to the device under test (DUT). It then detects the frequency domain response of the DUT at each measured frequency point within the measured frequency band and determines the device testing result based on the frequency domain response results at each measured frequency point within the measured frequency band. This method uses a time-domain trapezoidal pulse sequence to cover the excitation energy of the measured frequency band in the frequency domain, thereby exciting the frequency domain response of the DUT at multiple measured frequency points within the measured frequency band. This allows for parallel frequency sweeping of multiple measured frequency points, improving the frequency sweeping efficiency and testing effect of the DUT.

[0054] In some possible embodiments of this disclosure, the time-domain trapezoidal pulse sequence can be input to the device under test in the following manner: after adjusting the time-domain parameters of the time-domain trapezoidal pulses in the time-domain trapezoidal pulse sequence each time, the time-domain trapezoidal pulse sequence is input to the device under test until the time-domain parameters are adjusted a preset number of times, wherein the time-domain parameters include repetition frequency, rise duration and flat-top duration, and at least one of the repetition frequency, rise duration and flat-top duration is adjusted each time the time-domain parameters are adjusted.

[0055] In other words, within a detection cycle, multiple sets of time-domain trapezoidal pulses with different time-domain parameters (at least one of the rise time, repetition frequency, and flat-top duration of the different time-domain parameters is different) can be emitted cyclically.

[0056] For example, two sets of timing trapezoidal pulses with flat-top durations of the first and second durations are alternately transmitted. The rise duration and repetition frequency of the two sets of timing trapezoidal pulses are the same. Since the zero-point position varies... With the shift of time-domain parameters, multiple sets of signals form complementary peaks to troughs in the frequency domain, and the zero-crossing points (frequency points where the excitation amplitude is 0) and peaks of the two sets of time-series trapezoidal pulses are complementary.

[0057] Based on the time-domain trapezoidal pulse sequence input method in this embodiment, the frequency domain response results of the device under test at each measured frequency point within the measured frequency band can be detected in the following manner, and the device detection result can be determined based on the frequency domain response results at each measured frequency point within the measured frequency band: First, the frequency domain response of the device under test (DUT) at each measured frequency point within the measured frequency band is detected after the time-domain trapezoidal pulse sequence with various time-domain parameters is injected. In other words, after each injection of a set of time-domain trapezoidal pulse sequences, the frequency domain response results, such as impedance components, at each measured frequency point within the measured frequency band are collected. After injecting multiple sets of time-domain trapezoidal pulse sequences with different time-domain parameters, the frequency domain response results of the DUT at each measured frequency point within the measured frequency band after the time-domain trapezoidal pulse sequence with various time-domain parameters is injected are obtained.

[0058] Next, for each frequency point within the measured frequency band, the total frequency response result of the measured frequency point is determined based on the frequency domain response result of the device under test after the time domain trapezoidal pulse sequence with each time domain parameter is injected at that frequency point.

[0059] The first step is to determine the weight of each time-domain parameter based on the excitation amplitude at the measured frequency point after the device under test is injected with the time-domain trapezoidal pulse sequence with each time-domain parameter. Taking the injection of M sets of time-domain trapezoidal pulse sequences with different time-domain parameters into the device under test as an example, the weight of each time-domain parameter can be determined at each measured frequency point. At this point, by comparing the excitation amplitude under different parameters in group M. The confidence weights are calculated based on the energy intensity of the excitation signal at each frequency point. The i-th group of time-domain trapezoidal pulse sequences is defined at frequency points... Confidence weight at the point The magnitude of the excitation signal at that point is a power function of its amplitude. For the calculated i-th group of time-domain trapezoidal pulses in The discrete amplitude magnitude at the point, k is the sensitivity adjustment coefficient (usually taken as...). When k is large, the system will greatly suppress measurement data near the energy zero point, causing the final result to be biased towards high-energy (high signal-to-noise ratio) data.

[0060] The second step involves weighting and summing the frequency domain response results of the device under test (DUT) at the measured frequency point after the time-domain trapezoidal pulse sequence of each time-domain parameter is injected, based on the weights of each time-domain parameter. The summation result is then determined as the total frequency domain response result at that measured frequency point. For example, its total frequency domain response results As shown in the following formula: in This refers to the frequency domain response (such as impedance components) obtained through sampling calculation under the i-th set of time-domain trapezoidal pulse parameters. This dynamic weight allocation strategy can fundamentally eliminate the inherent inaccuracies in single-pulse measurements.

[0061] Sine wave sweep technology in related technologies heavily relies on linear power amplifiers. To achieve a sufficient signal-to-noise ratio on high-voltage cables with large capacitive loads, this hardware must possess extremely high linear output capability. However, its energy conversion efficiency is extremely low at high frequencies, and the equipment is extremely expensive. In contrast, this invention utilizes the nonlinear switching characteristics of power semiconductor devices to generate pulses through the instantaneous release of energy storage capacitors. This switching-type energy transfer loss is far lower than that of the linear mode, reducing hardware cost and power consumption while achieving wideband excitation with the same signal-to-noise ratio.

[0062] The sinusoidal frequency sweep technology in related technologies uses a serial stepping mode, which requires transmission and stabilization at each frequency point. Completing a single high-resolution scan typically requires thousands of cycles, which is time-consuming and cannot be monitored in real time. In contrast, this invention utilizes the parallel excitation characteristics of pulse excitation, where a single pulse can simultaneously generate spectral line components covering a large bandwidth in the frequency domain. This allows the system to extract impedance information across the entire frequency band with only a few pulse injections, enhancing the real-time performance of online cable condition monitoring.

[0063] Sinusoidal test signals, due to their low amplitude and waveform characteristics similar to power system background noise, are easily overwhelmed by power frequency interference in live monitoring environments. The trapezoidal pulses generated by this invention have extremely high edge steepness. Its abrupt change characteristics in the time domain are significantly different from background noise; due to the concentrated release of energy in a very short time by pulse excitation, its instantaneous peak power is much higher than that of ordinary sine waves, thus greatly improving the signal-to-noise ratio of the target frequency. Combined with the confidence weight fusion algorithm proposed in this invention, the system can automatically identify and enhance the effective information of high-energy frequency points; simultaneously, by adjusting the repetition frequency, the spectral line density can be optimized, effectively suppressing the influence of on-site electromagnetic interference on the measurement results and ensuring the accuracy of online monitoring.

[0064] According to a second aspect of the embodiments of this disclosure, an equipment testing device for a power system is provided. Please refer to the attached drawing. Figure 2 The device includes: Input module 201 is used to generate a time-domain trapezoidal pulse sequence and input the time-domain trapezoidal pulse sequence to the device under test; The detection module 202 is used to detect the frequency domain response results of the device under test at each measured frequency point within the measured frequency band, and to determine the device detection result based on the frequency domain response results of each measured frequency point within the measured frequency band.

[0065] In some possible embodiments of this disclosure, the device further includes an adjustment module for: Adjust the repetition frequency of the time-domain trapezoidal pulses within the time-domain trapezoidal pulse sequence to adjust the sweep resolution of the measured frequency points within the measured frequency band.

[0066] In some possible embodiments of this disclosure, the repetition frequency of the time-domain trapezoidal pulses in the time-domain trapezoidal pulse sequence is negatively correlated with the sweep resolution of the measured frequency point within the measured frequency band.

[0067] In some possible embodiments of this disclosure, the device further includes an adjustment module for: Adjust the rise time of the time-domain trapezoidal pulses within the time-domain trapezoidal pulse sequence to adjust the sweep bandwidth of the frequency band under test.

[0068] In some possible embodiments of this disclosure, the rise time of the time-domain trapezoidal pulses in the time-domain trapezoidal pulse sequence is negatively correlated with the sweep bandwidth of the measured frequency band.

[0069] In some possible embodiments of this disclosure, the device further includes an adjustment module for: Adjust the peak duration of the time-domain trapezoidal pulses within the time-domain trapezoidal pulse sequence to adjust the frequency point where the excitation amplitude is 0 within the measured frequency band.

[0070] In some possible embodiments of this disclosure, when the input module is used to input the time-domain trapezoidal pulse sequence to the device under test, it is used for: After each adjustment of the time-domain parameters of the time-domain trapezoidal pulses in the time-domain trapezoidal pulse sequence, the time-domain trapezoidal pulse sequence is input to the device under test until the time-domain parameters are adjusted a preset number of times. The time-domain parameters include repetition frequency, rise duration and flat-top duration. Each time the time-domain parameters are adjusted, at least one of the repetition frequency, rise duration and flat-top duration is adjusted.

[0071] In some possible implementations of this disclosure, the detection module is used for: The frequency domain response of the device under test at each measured frequency point in the measured frequency band is detected after the time domain trapezoidal pulse sequence with each time domain parameter is injected. For each measured frequency point within the measured frequency band, the total frequency response result of the measured frequency point is determined based on the frequency domain response result of the device under test after the time domain trapezoidal pulse sequence with each time domain parameter is injected at the measured frequency point; The device detection result is determined based on the total frequency domain response of each measured frequency point within the measured frequency band.

[0072] In some possible embodiments of this disclosure, when the detection module is used to determine the total frequency domain response at the measured frequency point based on the frequency domain response result at the measured frequency point after the device under test is injected with the time domain trapezoidal pulse sequence of various time domain parameters, it is used to: The weight of each time-domain parameter is determined based on the excitation amplitude at the measured frequency point after the time-domain trapezoidal pulse sequence of each time-domain parameter is injected into the device under test. Based on the weights of each time-domain parameter, the frequency domain response results of the device under test at the measured frequency point after the time-domain trapezoidal pulse sequence of each time-domain parameter is injected are weighted and summed, and the summation result is determined as the total frequency domain response result at the measured frequency point.

[0073] Regarding the apparatus in the above embodiments, the specific manner in which each module performs its operation has been described in detail in the embodiments of the method in the first aspect, and will not be elaborated upon here.

[0074] According to a third aspect of the present disclosure, a computer program product is provided, including a computer program / instructions that, when executed by a processor, implement the steps of the method described in the first aspect.

[0075] According to the fourth aspect of the embodiments of this disclosure, please refer to the appendix. Figure 3An electronic device is provided, the electronic device including a memory and a processor, the memory being used to store computer instructions executable on the processor, and the processor being used to implement the method of the first aspect when executing the computer instructions.

[0076] According to a fifth aspect of the present disclosure, a computer-readable storage medium is provided having a computer program stored thereon, which, when executed by a processor, implements the method described in the first aspect.

[0077] Other embodiments of this disclosure will readily occur to those skilled in the art upon consideration of the specification and practice of the disclosure herein. This disclosure is intended to cover any variations, uses, or adaptations of this disclosure that follow the general principles of this disclosure and include common knowledge or customary techniques in the art not disclosed herein. The specification and examples are to be considered exemplary only, and the true scope and spirit of this disclosure are indicated by the following claims.

[0078] It should be understood that this disclosure is not limited to the precise structures described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of this disclosure is limited only by the appended claims.

Claims

1. A method for testing equipment in a power system, characterized in that, The method includes: Generate a time-domain trapezoidal pulse sequence and input the time-domain trapezoidal pulse sequence into the device under test; The frequency domain response results of the device under test at each measured frequency point within the measured frequency band are detected, and the device test result is determined based on the frequency domain response results at each measured frequency point within the measured frequency band.

2. The equipment testing method for power systems according to claim 1, characterized in that, The method further includes: Adjust the repetition frequency of the time-domain trapezoidal pulses within the time-domain trapezoidal pulse sequence to adjust the sweep resolution of the measured frequency points within the measured frequency band.

3. The equipment testing method for power systems according to claim 2, characterized in that, The repetition frequency of the time-domain trapezoidal pulses in the time-domain trapezoidal pulse sequence is negatively correlated with the sweep resolution of the measured frequency points within the measured frequency band.

4. The equipment testing method for power systems according to claim 1, characterized in that, The method further includes: Adjust the rise time of the time-domain trapezoidal pulses within the time-domain trapezoidal pulse sequence to adjust the sweep bandwidth of the frequency band under test.

5. The equipment testing method for power systems according to claim 4, characterized in that, The rise time of the time-domain trapezoidal pulses in the time-domain trapezoidal pulse sequence is negatively correlated with the sweep bandwidth of the measured frequency band.

6. The equipment testing method for power systems according to claim 1, characterized in that, The method further includes: Adjust the peak duration of the time-domain trapezoidal pulses within the time-domain trapezoidal pulse sequence to adjust the frequency point where the excitation amplitude is 0 within the measured frequency band.

7. The equipment testing method for power systems according to claim 1, characterized in that, The step of inputting the time-domain trapezoidal pulse sequence to the device under test includes: After each adjustment of the time-domain parameters of the time-domain trapezoidal pulses in the time-domain trapezoidal pulse sequence, the time-domain trapezoidal pulse sequence is input to the device under test until the time-domain parameters are adjusted a preset number of times. The time-domain parameters include repetition frequency, rise duration and flat-top duration. Each time the time-domain parameters are adjusted, at least one of the repetition frequency, rise duration and flat-top duration is adjusted.

8. The equipment testing method for power systems according to claim 7, characterized in that, The process of detecting the frequency domain response results of the device under test at each measured frequency point within the measured frequency band, and determining the device detection result based on the frequency domain response results at each measured frequency point within the measured frequency band, includes: The frequency domain response of the device under test at each measured frequency point in the measured frequency band is detected after the time domain trapezoidal pulse sequence with each time domain parameter is injected. For each measured frequency point within the measured frequency band, the total frequency response result of the measured frequency point is determined based on the frequency domain response result of the device under test after the time domain trapezoidal pulse sequence with each time domain parameter is injected at the measured frequency point; The device detection result is determined based on the total frequency domain response of each measured frequency point within the measured frequency band.

9. The equipment testing method for power systems according to claim 8, characterized in that, The determination of the total frequency domain response at the measured frequency point based on the frequency domain response result at the measured frequency point after the time domain trapezoidal pulse sequence with each time domain parameter is injected into the device under test includes: The weight of each time-domain parameter is determined based on the excitation amplitude at the measured frequency point after the time-domain trapezoidal pulse sequence of each time-domain parameter is injected into the device under test. Based on the weights of each time-domain parameter, the frequency domain response results of the device under test at the measured frequency point after the time-domain trapezoidal pulse sequence of each time-domain parameter is injected are weighted and summed, and the summation result is determined as the total frequency domain response result at the measured frequency point.

10. An equipment testing device for use in a power system, characterized in that, The device includes: The input module is used to generate a time-domain trapezoidal pulse sequence and input the time-domain trapezoidal pulse sequence to the device under test; The detection module is used to detect the frequency domain response results of the device under test at each measured frequency point within the measured frequency band, and to determine the device detection result based on the frequency domain response results of each measured frequency point within the measured frequency band.

11. A computer program product, comprising a computer program / instructions, characterized in that, When the computational program / instructions are executed by the processor, they implement the steps of the method described in any one of claims 1 to 9.

12. An electronic device, characterized in that, The electronic device includes a memory and a processor, the memory being used to store computer instructions that can be executed on the processor, and the processor being used to implement the method of any one of claims 1 to 9 when executing the computer instructions.

13. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the program is executed by the processor, it implements the method of any one of claims 1 to 9.

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