Microswitch testing device

Abstract

The application discloses a micro switch testing device, which comprises a testing track, a work station shifting assembly, a loop connecting assembly and a switch triggering assembly. The testing track is divided into multiple work stations along a conveying direction. The work station shifting assembly is arranged on the first side of the testing track and comprises a carrying member with a carrying clamping opening, which is used for moving along the conveying direction and the advancing and retreating direction to gradually advance the micro switch to the corresponding work station. The loop connecting assembly is arranged on the second side of the testing track and comprises a connecting member provided with a testing probe group used for forming a testing loop, and the connecting member moves along the advancing and retreating direction. The switch triggering assembly is arranged corresponding to the work station and is used for triggering the micro switch contact. The carrying member and the connecting member act alternately. Through the alternating action logic on both sides, efficient decoupling and time sequence cooperation of non-interference step-by-step conveying and reliable electrical contact are realized, the abrasion and wear of the probe and the switch pin in the conveying process are avoided, the structure is compact, and the detection stability and efficiency are significantly improved.

Description

Technical Field

[0001] This invention relates to the field of micro switch manufacturing technology, and in particular to a micro switch testing device. Background Technology

[0002] In the mass production of microswitches, it is necessary to automate the testing of multiple parameters such as their built-in resistance, contact resistance, and mechanical properties. Existing testing equipment mostly adopts a fixed probe or rotary table structure, with the test probes permanently stationed on both sides of the track or driven by independent cylinders at each station.

[0003] However, microswitches are small in size and have fragile pins. If a fixed probe is used, the pins are prone to severe scraping against the probe when the switch moves along the track, resulting in pin deformation or abnormal wear and tear on the probe. If an independent multi-axis avoidance mechanism is configured for each test station, not only will the equipment structure be extremely bulky and costly, but it will also be difficult to ensure high-speed synchronization of multi-station operations.

[0004] Therefore, how to achieve efficient step-by-step progression of microswitches in a compact space, completely avoid probe interference and wear during transport, and ensure stable and reliable probe electrical contact during testing is a technical problem that urgently needs to be solved in this field. Summary of the Invention

[0005] To overcome the problems existing in related technologies, the purpose of this invention is to provide a micro switch testing device. This micro switch testing device overcomes the problems in the prior art where, when a micro switch moves forward on the test track, the probe and pin are severely scraped, resulting in pin deformation, probe wear, difficulty in synchronizing multi-station actions, and bulky equipment structure. This is achieved by setting a station transfer component and a circuit connection component on both sides of the test track, and making the transport component and the connection component move alternately.

[0006] A microswitch testing device, comprising: The test track has a conveying direction and is divided into multiple working positions along the conveying direction; A station transfer assembly is located on the first side of the test track. The station transfer assembly includes a transport component, which has multiple transport clamps for holding micro switches. The transport component is used to move along the conveying direction and in a forward and backward direction perpendicular to the conveying direction, so as to sequentially advance the micro switches along the test track to the corresponding working positions. A loop connection assembly is disposed on the second side of the test track. The loop connection assembly includes a connector and a test probe group is provided on the connector. The connector is used to move along the forward and backward direction so that the test probe group is electrically connected to the pin of the micro switch to form a test loop. A switch triggering component, configured corresponding to the working position, is used to trigger the contacts of the micro switch to change the circuit conduction state of the micro switch; The transport component and the connecting component operate alternately.

[0007] Furthermore, the workstation transfer component also includes: A first guide rail extends along the conveying direction and is located on the first side of the test rail; The first slide is slidably mounted on the first guide rail; A first driving mechanism is used to drive the first slide table to reciprocate along the conveying direction; The second guide rail is provided on the first slide table and extends in a direction parallel to the forward and backward direction. The conveying component is slidably mounted on the second guide rail. The second drive mechanism is located on the first slide and is used to drive the transport component to reciprocate along the forward and backward direction; The multiple transport clamps are equidistantly arranged along the side of the transport component closest to the test track.

[0008] Furthermore, the loop connection assembly also includes: The third guide rail extends along the forward and backward direction and is located on the second side of the test track; the connector is slidably mounted on the third guide rail. The third drive mechanism is located on the side of the connector away from the test track, and is used to drive the connector to reciprocate along the forward and backward direction; The connector has multiple test clamps on one side edge near the test track. The multiple test clamps are arranged at intervals along the conveying direction and aligned with the corresponding working positions. Each test clamp contains a set of test probes.

[0009] Furthermore, the plurality of workstations include a product break-in workstation, a built-in resistance testing workstation, a contact resistance testing workstation, and a performance testing workstation arranged sequentially along the conveying direction; The switch triggering component includes: The break-in pressing unit, which is set in accordance with the product break-in station, includes a first pressing needle that can reciprocate in the vertical direction, for reciprocating pressing of the micro switch located at the product break-in station; The built-in resistor pressing unit, corresponding to the built-in resistor test station, includes a second pressing pin that can reciprocate in the vertical direction, used to press and trigger the corresponding micro switch when the test circuit of the micro switch located at the built-in resistor test station is in the on state; The contact resistance pressing unit, which is set up in accordance with the contact resistance test station, includes a third pressing pin that can reciprocate in the vertical direction, and is used to press and trigger the corresponding micro switch when the test circuit of the micro switch located at the contact resistance test station is in the on state. The performance pressing unit, corresponding to the performance test station, includes a fourth pressing pin that can reciprocate in the vertical direction, used to press and trigger the corresponding micro switch when the test circuit of the micro switch located at the performance test station is in the on state; The circuit connection assembly is provided with three test clamps and three test probe groups, which correspond to the built-in resistance test station, the contact resistance test station and the performance test station, respectively.

[0010] Furthermore, the break-in pressing unit also includes: A rotary motor is fixedly installed above the product break-in station; An eccentric connecting rod slider mechanism is connected between the output shaft of the rotary motor and the first pressure needle; The rotation of the rotary motor drives the first pressure needle to reciprocate linearly in the vertical direction through the eccentric connecting rod slider mechanism.

[0011] Furthermore, both the built-in resistor pressing unit and the contact resistor pressing unit further include: A pneumatic slide is positioned above the corresponding work position, and the extension and retraction direction of the pneumatic slide is parallel to the vertical direction. In this unit, the moving end of the pneumatic slide corresponding to the built-in resistor pressing unit is connected to the second pressing pin; the moving end of the pneumatic slide corresponding to the contact resistor pressing unit is connected to the third pressing pin.

[0012] Furthermore, the performance pressing unit also includes: A servo linear module is positioned above the performance testing station; A tension / compression sensor is located on the moving end of the servo linear module, and the fourth pressure pin is located at the bottom of the tension / compression sensor. The servo linear module is used to drive the fourth pressure pin to perform a downward pressing action. The circuit connection assembly further includes a stabilizing block, which is disposed on the test clamp on the circuit connection assembly corresponding to the performance test station and is disposed on the top surface of the micro switch. It is used to move along the forward and backward direction to the top surface of the corresponding micro switch to abut against the limiting micro switch. The performance testing station is also provided with a bottom support assembly. The bottom support assembly is located below the performance testing station and includes a support drive component and a support plate that is driven to move up and down in the vertical direction by the support drive component. The upper end of the support plate is formed with a support position for supporting the bottom of the micro switch from below. During the performance pressing unit test, the support plate rises upward to support the bottom of the micro switch, and the stabilizing block moves to press against the top of the micro switch, so that the micro switch is pressed and fixed from both above and below.

[0013] Furthermore, the micro switch testing device also includes a product sorting mechanism located at the discharge end of the test track, used to perform sorting and placement based on the test results of the micro switches.

[0014] Furthermore, the product classification organization includes: A receiving funnel is located below the discharge end of the test track, and has an inlet channel and two outlet channels. The inlet channel is used to receive microswitches falling from the test track. A swing sorting component is located at the bifurcation of the feed channel and the two discharge channels. The swing sorting component includes a swing drive and a guide plate connected to the output shaft of the swing drive. The swing sorting component is used to selectively guide the micro switch falling from the receiving funnel to the corresponding discharge channel according to the test results.

[0015] Furthermore, the microswitch testing device also includes an assembly feeding mechanism, which comprises: Micro-motion feed rail is used to sequentially transport the micro-motion switch body; Handle feed rail, used for sequential conveying of handles; A micro-motion pushing component is located between the handle feeding rail and the micro-motion feeding rail, and is used to push the micro-motion switch body at the end of the micro-motion feeding rail to the handle assembly position located on the test rail. A handle press-fit assembly is located above the handle assembly position and is used to clamp the handle at the end of the handle feed rail, move it to the handle assembly position, and press it onto the micro switch body. A feeding assembly is located between the handle assembly position and the test track, and is used to push the micro switch body or the micro switch with the handle one by one to the first working position on the test track.

[0016] The beneficial effects of this invention are as follows: This invention provides a microswitch testing device, which includes a station transfer component and a loop connection component set on both sides of a test track. The transport component and the connection component move alternately. During the station transfer phase, the connection component retracts along the forward / backward direction, completely removing the test probe group from the movement path of the microswitch pin. This creates space for the transport component to advance step-by-step along the transport direction, avoiding scratching and wear between the probes and the switch pins during transport. During the testing phase, the transport component returns to its original position, and the connection component advances along the forward / backward direction, ensuring the test probe group precisely contacts the pin to form a test loop. The switch triggering component then triggers the contacts to change their conduction state for detection. This alternating action logic achieves efficient decoupling and timing coordination between interference-free step-by-step transport and highly reliable electrical contact testing. The device has a compact structure, significantly extends probe lifespan, protects switch pins, and significantly improves the stability and production efficiency of multi-station synchronous testing. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 This is a three-dimensional view of the overall structure of the micro switch testing device in the embodiments of this application.

[0019] Figure 2 yes Figure 1 The top view of the microswitch test device shown.

[0020] Figure 3 This is a three-dimensional structural diagram of the test track, workstation transfer component, and loop connection component in the embodiments of this application.

[0021] Figure 4 yes Figure 3 Main view of the workstation distribution on the test track.

[0022] Figure 5 This is a schematic diagram of the transport component in the workstation transfer assembly of this application.

[0023] Figure 6 This is a schematic diagram of the driving and guiding structure of the workstation transfer component in the embodiments of this application.

[0024] Figure 7 This is a three-dimensional structural diagram of the loop connection component in the embodiments of this application.

[0025] Figure 8 This is a front view of the loop connection component in the embodiments of this application.

[0026] Figure 9 This is a schematic diagram of the test track having a side opening in an embodiment of this application.

[0027] Figure 10 yes Figure 9 A schematic diagram showing the distributed arrangement of the openings on the side wall of the test track.

[0028] Figure 11 This is a partial lateral cross-sectional view of a microswitch placed within a test track.

[0029] Figure 12 This is a three-dimensional structural diagram of the switch trigger component and the test track assembly in an embodiment of this application.

[0030] Figure 13 yes Figure 12 The main view showing the arrangement of the switch trigger components and their corresponding workstations.

[0031] Figure 14 This is a partial exploded perspective view of the switch triggering component in the embodiments of this application.

[0032] Figure 15 This is a magnified 3D view of the stable block and micro switch working together at the performance testing station.

[0033] Figure 16 This is a three-dimensional structural diagram of the bottom support component and the performance testing station in an embodiment of this application.

[0034] Figure 17 This is a schematic diagram of the overall three-dimensional structure of the product classification mechanism in the embodiments of this application.

[0035] Figure 18 yes Figure 17 A three-dimensional structural diagram of the swing sorting component in the product classification mechanism.

[0036] Figure 19 This is a schematic diagram of the overall three-dimensional structure of the assembly feeding mechanism and the test track in the embodiment of this application.

[0037] Figure 20 yes Figure 19 A three-dimensional structural diagram of the material feeding mechanism in the middle assembly from another angle.

[0038] Figure 21 yes Figure 19 A partially enlarged schematic diagram of the handle pressing assembly in the middle assembly feeding mechanism.

[0039] Figure label: 100. Test track; 110. Feeding station; 120. Product break-in station; 130. Built-in resistance test station; 140. Contact resistance test station; 150. Performance test station; 160. Discharge station; 170. Side opening; 200. Workstation transfer assembly; 210. Transport component; 211. Transport clamp; 220. First guide rail; 230. First slide table; 240. First drive mechanism; 250. Second guide rail; 260. Second drive mechanism; 300. Loop connection assembly; 310. Connector; 311. Test clamp; 320. Test probe group; 330. Third guide rail; 340. Third drive mechanism; 350. Stabilizing block; 400. Switch trigger component; 410. Break-in pressing unit; 411. First pressing needle; 412. Rotary motor; 413. Eccentric connecting rod slider mechanism; 420. Built-in resistor pressing unit; 421. Second pressing pin; 422. Pneumatic slide; 430. Contact resistance pressing unit; 431. Third pressing pin; 440. Performance pressing unit; 441. Fourth pressing pin; 442. Servo linear module; 443. Tension / compression sensor; 500. Bottom support assembly; 510. Support drive component; 520. Support plate; 600. Product sorting mechanism; 610. Receiving funnel; 620. Swinging sorting assembly; 621. Swinging drive component; 622. Guide plate; 700. Assemble the feeding mechanism; 710. Handle assembly position; 720. Micro-motion feeding rail; 730. Handle feeding rail; 740. Micro-motion pushing assembly; 750. Handle pressing assembly; 760. Connecting pushing assembly; 800, Micro switch; 810, Pin; 820, Contact; 830, Handle; 900, Frame; 910, Worktable; 920, Human-Machine Interface; 930, Qualified Product Collection Box; 940, Defective Product Collection Box; 950, Vibrating Hopper. Detailed Implementation

[0040] Preferred embodiments of the invention will now be described in more detail with reference to the accompanying drawings. While preferred embodiments of the invention are shown in the drawings, it should be understood that the invention can be implemented in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that the invention will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.

[0041] Reference Figures 1 to 21This invention provides a micro switch testing device for fully automatic and high-precision testing and sorting of multiple parameters of a micro switch 800, including handle assembly, pre-run-in, built-in resistance, contact resistance, and mechanical and electrical properties.

[0042] like Figure 1 and Figure 2 As shown, the microswitch testing device of this embodiment includes a frame 900, a worktable 910 located on top of the frame 900, a human-machine interface 920, a qualified product collection box 930, a defective product collection box 940, and a vibrating hopper 950. On the worktable 910, an assembly feeding mechanism 700, a test track 100, a station transfer component 200, a circuit connection component 300, a switch triggering component 400, a bottom support component 500, and a product sorting mechanism 600 are arranged sequentially according to the material flow sequence.

[0043] I. Test Track 100 and Workstation Division like Figure 3 and Figure 4 As shown, the test track 100 is fixedly installed on the worktable 910. The test track 100 has a conveying direction that extends in a horizontal straight line, and multiple working positions are sequentially divided on the test track 100 along the conveying direction.

[0044] Specifically, see Figure 4 and Figure 13 In this embodiment, the multiple working stations are arranged sequentially along the conveying direction as follows: feeding station 110, product break-in station 120, built-in resistance testing station 130, contact resistance testing station 140, performance testing station 150, and discharging station 160.

[0045] In this embodiment, the center distance between adjacent stations along the conveying direction of the feeding station 110, product break-in station 120, built-in resistance test station 130, contact resistance test station 140, performance test station 150, and discharge station 160 is a fixed preset distance.

[0046] The test track 100 is a guide rail groove with openings at the top and sides, used to accommodate and constrain the micro switch 800 to slide along the conveying direction. Figure 9 and Figure 10 As shown, the test track 100 has a side opening 170 on the side wall corresponding to the built-in resistance test station 130, contact resistance test station 140 and performance test station 150. The side opening 170 is a horizontal clearance groove that penetrates the side wall of the test track 100, which is used to allow the circuit connection component 300 to extend into the interior of the test track 100 to contact the pin 810 of the micro switch 800.

[0047] II. Workstation Transfer Component 200 like Figure 3, Figure 5 and Figure 6 As shown, the workstation transfer assembly 200 is located on the first side of the test track 100 (in Figure 2 (The top view shows the rear side of test track 100), used to move the microswitches 800 sequentially along test track 100 one by one.

[0048] The workstation transfer assembly 200 includes a first guide rail 220, a first slide table 230, a first drive mechanism 240, a second guide rail 250, a second drive mechanism 260, and a transport component 210.

[0049] Specifically, the first guide rail 220 extends along the conveying direction and is fixed on the worktable 910; the first slide 230 is slidably mounted on the first guide rail 220; the first drive mechanism 240 is located on one side of the first slide 230 and is used to drive the first slide 230 to reciprocate linearly along the conveying direction. The second guide rail 250 is fixed on the top surface of the first slide 230, and the extension direction of the second guide rail 250 is parallel to the horizontal forward and backward direction perpendicular to the conveying direction; the transport component 210 is slidably mounted on the second guide rail 250; the second drive mechanism 260 is mounted on the first slide 230 and is used to drive the transport component 210 to reciprocate towards or away from the test track 100 along the forward and backward direction.

[0050] The transport member 210 has a plate-like structure extending along the transport direction. Multiple transport clamps 211 are equidistantly spaced along one edge of the transport member 210 near the test track 100 to hold the microswitch 800 body. In this embodiment, there are five transport clamps 211, and the center-to-center distance between adjacent transport clamps 211 is strictly equal to the preset distance.

[0051] In one preferred embodiment, the first drive mechanism 240 and the second drive mechanism 260 are preferably pneumatic cylinders (such as rodless cylinders, dual-axis pneumatic cylinders, or pneumatic slides). In other alternative embodiments of the invention, the first drive mechanism 240 and the second drive mechanism 260 can also be replaced by a servo motor with a ball screw mechanism, a stepper motor with a gear and rack mechanism, an electric cylinder, or a linear motor module, etc., which are power sources capable of achieving precise reciprocating linear drive. The conveying component 210 can be made of aluminum alloy plate, hard anodized aluminum plate, or polyoxymethylene engineering plastic plate, and the conveying clamp 211 can be a U-shaped groove, a V-shaped groove, or a rubber and plastic anti-scratch buffer pad attached inside the groove.

[0052] III. Loop Connection Assembly 300 like Figure 3 , Figure 7 and Figure 8 As shown, the loop connection assembly 300 is located on the second side of the test track 100 (i.e., the other side opposite to the first side). Figure 2(Front side in top view) The loop connection assembly 300 includes a third guide rail 330, a connector 310, a third drive mechanism 340, a test probe group 320, and a stabilizing block 350.

[0053] The third guide rail 330 extends along the forward and backward direction and is fixed on the worktable 910; the connector 310 is slidably mounted on the third guide rail 330; the third drive mechanism 340 is located on the side of the connector 310 away from the test track 100, and is used to drive the connector 310 to perform reciprocating linear motion along the forward and backward direction. The connector 310 has a plate-like structure, and multiple test clamps 311 are opened on the edge of the connector 310 near the test track 100. The multiple test clamps 311 are arranged at intervals along the conveying direction, and the center distance between adjacent test clamps 311 is also equal to the preset distance. The three test clamps 311 are precisely aligned with the built-in resistance test station 130, the contact resistance test station 140, and the performance test station 150, respectively. Each test clamp 311 is embedded with a test probe group 320 for establishing an electrical connection with the pin 810 of the micro switch 800.

[0054] See Figure 7 and Figure 11 The test probe group 320 comprises three gold-plated spring pins arranged side-by-side, with the spacing between the pins matching the spacing of the three pins 810 on the bottom of the microswitch 800. The test probe group 320 is connected via independent shielded wires to the first independent measurement circuit (built-in resistance test circuit), the second independent measurement circuit (contact resistance test circuit), and the performance data acquisition circuit within the control system. Each measurement circuit is electrically isolated and independently selected, completely eliminating electromagnetic interference and current crosstalk between the built-in high-voltage resistance test signal and the weak micro-ohm contact resistance signal, ensuring the accuracy of electrical parameter measurements and instrument safety.

[0055] like Figure 7 , Figure 8 and Figure 15 As shown, a stabilizing block 350 is also fixedly installed on the connector 310 above the test clamp 311 corresponding to the performance test station 150. The stabilizing block 350 is a horizontally extending stepped limiting block, with its end corresponding to the top surface of the micro switch 800. When the connector 310 is pushed forward, the stabilizing block 350 extends into the performance test station 150 and presses against the micro switch 800 from the top, preventing the micro switch 800 from lifting upward or flipping when subjected to vertical downward pressure.

[0056] In one preferred embodiment, the third drive mechanism 340 is preferably a dual-axis pneumatic slide. In other alternative embodiments, the third drive mechanism 340 may also be replaced by a servo electric cylinder, a stepper motor screw mechanism, or an electromagnetic push rod; the test probe group 320 may also be replaced by a copper spring probe or a miniature pneumatic stylus.

[0057] IV. Switch trigger assembly 400 and bottom support assembly 500 like Figure 12 , Figure 13 and Figure 14 As shown, the switch trigger assembly 400 is mounted above the test rail 100 and is used to press the contact 820 on the top of the micro switch 800. The switch trigger assembly 400 includes a break-in pressing unit 410, a built-in resistor pressing unit 420, a contact resistance pressing unit 430, and a performance pressing unit 440.

[0058] The break-in pressing unit 410 is set up corresponding to the product break-in station 120. The break-in pressing unit 410 includes a rotary motor 412 fixedly mounted above the station, an eccentric connecting rod slider mechanism 413 connected to the output shaft of the rotary motor 412, and a vertical first pressing needle 411 connected to the lower end of the slider. When the rotary motor 412 (such as a stepper motor or servo motor) rotates, it drives the first pressing needle 411 to perform high-frequency reciprocating linear pressing in the vertical direction through the eccentric connecting rod slider mechanism 413, thus performing pre-break-in on the micro switch 800 located at the product break-in station 120. The number of pressings can be freely set on the human-machine interface 920.

[0059] The built-in resistance pressing unit 420 and the contact resistance pressing unit 430 are respectively set for the built-in resistance testing station 130 and the contact resistance testing station 140. Both the built-in resistance pressing unit 420 and the contact resistance pressing unit 430 include a pneumatic slide 422 located above the station. The moving end of the pneumatic slide 422 in the built-in resistance pressing unit 420 is connected to a vertically downward extending second pressing pin 421; the moving end of the pneumatic slide 422 in the contact resistance pressing unit 430 is connected to a vertically downward extending third pressing pin 431. When the pneumatic slide 422 extends or retracts, it drives the second pressing pin 421 and the third pressing pin 431 to press down, triggering the corresponding microswitch 800 contact 820.

[0060] The performance pressing unit 440 is set up corresponding to the performance testing station 150. The performance pressing unit 440 includes a servo linear module 442 fixedly installed above the station, a tension / compression sensor 443 (such as an S-type or strain gauge force sensor) installed on the moving end of the servo linear module 442, and a fourth pressure pin 441 connected to the bottom of the tension / compression sensor 443. The servo linear module 442 has a built-in high-precision displacement sensor (such as a grating ruler or servo motor pulse encoder). When the performance pressing unit 440 is tested, the control system synchronously collects the real-time displacement signal returned by the displacement sensor and the real-time downward pressure signal returned by the tension / compression sensor 443, thereby automatically plotting and calculating the force-stroke characteristic curve of the micro switch 800 during the entire process of the contact 820 being pressed and returning, and automatically extracting parameters such as actuation force, return force, actuation stroke, and overtravel for qualification judgment.

[0061] like Figure 16 As shown, a bottom support assembly 500 is also provided below the performance testing station 150. The bottom support assembly 500 includes a support drive component 510 (such as a lifting cylinder) and a support plate 520 that is driven by the support drive component 510 to rise and fall vertically. A support position is provided at the upper end of the support plate 520. When the performance pressing unit 440 is tested, the support drive component 510 drives the support plate 520 to rise and support the bottom of the micro switch 800. At the same time, the stabilizing block 350 moves forward and backward to press against the top of the micro switch 800, and the fourth pressing pin 441 presses down from above, so that the micro switch 800 is pressed and fixed in three directions, completely eliminating the mechanical elastic deformation error when pressing down to measure the force.

[0062] The first pressing needle 411, the second pressing needle 421, the third pressing needle 431, and the fourth pressing needle 441 can be made of stainless steel, hard alloy, polytetrafluoroethylene, or polyoxymethylene engineering plastic. The rotary motor 412 can also be replaced by a frequency converter motor or a DC brushless motor; the eccentric connecting rod slider mechanism 413 can also be replaced by a cam push rod mechanism or a crank connecting rod mechanism.

[0063] V. Position sensing feedback and alternating action safety interlock mechanism Position sensors (such as magnetic proximity switches, photoelectric sensors, or limit switches) are installed on the moving ends or cylinder bodies of the first drive mechanism 240, the second drive mechanism 260, and the third drive mechanism 340. The position sensors are electrically connected to the control system.

[0064] The control system incorporates a safety interlock logic: the second drive mechanism 260 is only allowed to drive the transport component 210 forward when the position sensor detects that the connecting component 310 driven by the third drive mechanism 340 has completely retracted to the retraction limit point (i.e., the test probe group 320 has completely withdrawn from the side opening 170 of the test track 100); conversely, the third drive mechanism 340 is only allowed to drive the connecting component 310 forward for testing when the position sensor detects that the transport component 210 has retracted and completed its translational reset along the conveying direction. Through position sensing and hardware / software interlocking, mechanical interference and probe collisions during transport and testing are completely avoided.

[0065] VI. Product Classification Organization 600 like Figure 17 and Figure 18As shown, the product sorting mechanism 600 is located below the discharge station 160 of the test track 100. The product sorting mechanism 600 includes a receiving funnel 610 and a swing sorting assembly 620 located at a fork inside the receiving funnel 610. The receiving funnel 610 has an inlet channel at its upper end and forks into two outlet channels at its lower end, leading to a qualified product collection box 930 and a defective product collection box 940, respectively. The swing sorting assembly 620 includes a swing drive 621 (such as a swing cylinder or a rotary servo motor) and a guide swing plate 622 connected to the output shaft of the swing drive 621. Based on the electrical performance and performance test results, the control system controls the swing drive 621 to swing the guide swing plate 622 to a corresponding angle, selectively guiding the falling micro switch 800 to slide into the qualified product collection box 930 or the defective product collection box 940.

[0066] The oscillating drive 621 can also be replaced by a stepper motor, a servo motor, or an electromagnetic oscillating head; the receiving funnel 610 and the guide plate 622 can be made of stainless steel plate or engineering plastic plate with anti-scratch silicone pad.

[0067] VII. Assembly of the material supply mechanism 700 like Figure 19 , Figure 20 and Figure 21 As shown, the assembly feeding mechanism 700 is located on the front side of the feeding end of the test track 100. The assembly feeding mechanism 700 includes a handle assembly position 710, a micro-motion feeding rail 720, a handle feeding rail 730, a micro-motion pushing assembly 740, a handle pressing assembly 750, and a connecting pushing assembly 760.

[0068] The micro-motion feeding rail 720 and the handle feeding rail 730 are automatically fed by the corresponding vibrating hopper 950 (vibrating plate). The micro-motion pushing assembly 740 pushes the micro-switch body at the end of the micro-motion feeding rail 720 to the handle assembly position 710; the handle pressing assembly 750 (including pneumatic fingers and pressing cylinder) clamps the handle 830 at the end of the handle feeding rail 730 and presses it onto the micro-switch 800 body; the connecting pushing assembly 760 pushes the assembled micro-switches 800 one by one to the feeding position 110 of the test rail 100.

[0069] The human-machine interface 920 is equipped with a handle installation selection module. When the test does not require a micro switch with a handle, the handle pressing assembly 750 is bypassed by the control system with one key. The micro switch pushing assembly 740 directly pushes the micro switch 800 body to the handle assembly position 710, and then the connecting pushing assembly 760 directly sends it into the test track 100, realizing flexible compatibility of multiple models.

[0070] The vibrating hopper 950 can also be replaced with a flexible feeding tray or a stepped lifting feeder.

[0071] VIII. Complete Working Process of the Microswitch Testing Device in this Embodiment The complete workflow of the microswitch testing device in this embodiment is as follows: Material feeding and optional assembly: The vibrating hopper 950 feeds the micro switch 800 body and handle 830 into the micro switch feed rail 720 and handle feed rail 730 respectively. When the handle installation mode is selected through the human-machine interface 920, the handle pressing assembly 750 completes the pressing at the handle assembly position 710, and the connecting push assembly 760 pushes the micro switch 800 with handle into the feeding station 110 of the test rail 100; if the handle-free mode is selected, the handle pressing assembly 750 stops operating, and the micro switch 800 body is directly fed into the feeding station 110.

[0072] Alternating step-by-step handling and testing: The control system controls the station transfer component 200 and the loop connection component 300 to perform alternating actions. The first stage is the transport stage: the third drive mechanism 340 drives the connector 310 to retract in the forward and backward direction, and the test probe group 320 completely withdraws from the side opening 170 of the test track 100, releasing the contact with the pin 810; the position sensor transmits the retraction signal to the control system, and the second drive mechanism 260 drives the transport component 210 to advance in the forward and backward direction, and the five transport clamps 211 respectively clamp the microswitches 800 on the feeding station 110, the product running-in station 120, the built-in resistance test station 130, the contact resistance test station 140 and the performance test station 150; then, the first drive mechanism 240 drives the first slide 230 and the transport component 210 to move to the right by a preset distance in the conveying direction, and synchronously advances each microswitch 800 to the next adjacent working position; then, the second drive mechanism 260 drives the transport component 210 to retract in the forward and backward direction to release the microswitches.

[0073] The second stage is the testing stage: the first drive mechanism 240 drives the first slide table 230 and the transport component 210 to move to the left along the conveying direction and reset by a preset distance; the position sensor transmits the return and reset signals of the transport component to the control system; the third drive mechanism 340 drives the connector 310 to move forward along the forward and backward direction; the three test clamps 311 respectively clamp the microswitches 800 on the built-in resistance test station 130, the contact resistance test station 140 and the performance test station 150; the test probe group 320 passes through the side opening 170 and accurately contacts each switch pin 810 to establish a test circuit.

[0074] Multi-station synchronous trigger test: During the test phase, the four pressing units execute actions synchronously. At the product break-in station 120, the rotary motor 412 drives the first pressure needle 411 to perform a set number of high-frequency reciprocating presses on the switch contact 820 for pre-break-in through the eccentric connecting rod slider mechanism 413 to eliminate contact stress. At the built-in resistance test station 130, the pneumatic slide 422 drives the second pressure needle 421 to press down the contact 820 to turn on the switch. The test probe group 320, in conjunction with the built-in resistance test circuit, automatically measures and determines the built-in inherent resistance value. At the contact resistance test station 140, the pneumatic slide 422 drives the third pressure needle 431 to press down the contact 820 to turn on the switch. The test probe group 320 cooperates with the contact resistance test circuit to automatically measure and determine the contact resistance value of the contact point. At the performance testing station 150, the support drive component 510 drives the support plate 520 to support the bottom of the switch upwards, and the stabilizing block 350 on the connector 310 presses against the top of the switch; the servo linear module 442 drives the tension and pressure sensor 443 and the fourth pressure pin 441 to press down at a high precision and uniform speed, collects the downward pressure and displacement in real time, plots the force-stroke curve, and determines parameters such as action force, restoring force, action stroke, and overtravel.

[0075] Sorting and Discharging: After the test is completed, the micro switch 800 is moved to the discharge station 160 and falls into the receiving funnel 610. The swing sorting component 620 drives the guide plate 622 to switch directions according to the comprehensive test results, guiding qualified products to the qualified product collection box 930 and unqualified products to the defective product collection box 940.

[0076] This process is repeated continuously to achieve fully automated, efficient, and continuous testing and classification of microswitches without probe interference or scratching.

[0077] Unless otherwise specifically stated, the relative arrangement, numerical expressions, and values ​​of the components and steps set forth in these embodiments do not limit the scope of this application. Any specific values ​​in all examples shown and discussed herein should be interpreted as merely exemplary and not as limitations. Therefore, other examples of exemplary embodiments may have different values. It should be noted that similar reference numerals and letters in the following figures denote similar items; therefore, once an item is defined in one figure, it need not be further discussed in subsequent figures.

[0078] Furthermore, it should be noted that the use of terms such as "first" and "second" is merely for ease of distinction, and unless otherwise stated, these terms have no special meaning and therefore should not be construed as limiting the scope of protection of this application.

[0079] The above description is merely a preferred embodiment of the present invention and is not intended to limit the invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A microswitch testing device, characterized in that, include: The test track (100) has a conveying direction and is divided into multiple working positions along the conveying direction; A station transfer assembly (200) is disposed on the first side of the test track (100). The station transfer assembly (200) includes a transport component (210). The transport component (210) is provided with a plurality of transport clamps (211) for clamping the micro switch (800). The transport component (210) is used to move along the conveying direction and in a forward and backward direction perpendicular to the conveying direction, so as to advance the micro switch (800) along the test track (100) sequentially to the corresponding working position. A loop connection assembly (300) is disposed on the second side of the test track (100). The loop connection assembly (300) includes a connector (310). A test probe group (320) is provided on the connector (310). The connector (310) is used to move along the forward and backward direction so that the test probe group (320) is electrically connected to the pin (810) of the micro switch (800) to form a test loop. A switch triggering component (400), configured corresponding to the working position, is used to trigger the contact (820) of the micro switch (800) to change the circuit conduction state of the micro switch (800); The transport component (210) and the connecting component (310) operate alternately.

2. The micro switch testing device according to claim 1, characterized in that, The workstation transfer component (200) also includes: The first guide rail (220) extends along the conveying direction and is located on the first side of the test rail (100); The first slide (230) is slidably mounted on the first guide rail (220); The first drive mechanism (240) is used to drive the first slide (230) to reciprocate along the conveying direction; The second guide rail (250) is provided on the first slide table (230) and extends in a direction parallel to the forward and backward direction. The conveying component (210) is slidably mounted on the second guide rail (250). The second drive mechanism (260) is disposed on the first slide (230) and is used to drive the transport component (210) to reciprocate along the forward and backward direction; The plurality of transport clamps (211) are equidistantly arranged along one side of the transport member (210) near the test track (100).

3. The microswitch testing device according to claim 1 or 2, characterized in that, The loop connection assembly (300) further includes: The third guide rail (330) extends along the forward and backward direction and is located on the second side of the test rail (100). The connector (310) is slidably mounted on the third guide rail (330). The third drive mechanism (340) is located on the side of the connector (310) away from the test track (100) and is used to drive the connector (310) to reciprocate along the forward and backward direction; The connector (310) has multiple test clamps (311) on one side edge near the test track (100). The multiple test clamps (311) are arranged at intervals along the conveying direction and aligned with the corresponding working positions. Each test clamp (311) is provided with a test probe group (320).

4. The microswitch testing device according to claim 3, characterized in that, The plurality of workstations include a product break-in workstation (120), a built-in resistance test workstation (130), a contact resistance test workstation (140), and a performance test workstation (150) arranged sequentially along the conveying direction. The switch triggering component (400) includes: The break-in pressing unit (410) is set in accordance with the product break-in station (120), and includes a first pressing needle (411) that can reciprocate in the vertical direction, for reciprocating pressing of the micro switch (800) located on the product break-in station (120); The built-in resistor pressing unit (420) is set in accordance with the built-in resistor test station (130), including a second pressing needle (421) that can reciprocate in the vertical direction, for pressing to trigger the corresponding micro switch (800) when the test circuit of the micro switch (800) located on the built-in resistor test station (130) is in the on state; A contact resistance pressing unit (430) is provided corresponding to the contact resistance test station (140), including a third pressing pin (431) that can reciprocate in the vertical direction, used to press and trigger the corresponding micro switch (800) when the test circuit of the micro switch (800) located at the contact resistance test station (140) is in the on state. The performance pressing unit (440) is set in accordance with the performance test station (150), including a fourth pressing needle (441) that can reciprocate in the vertical direction, for pressing to trigger the corresponding micro switch (800) when the test circuit of the micro switch (800) located on the performance test station (150) is in the on state; The circuit connection assembly (300) is provided with three test clamps (311) and three test probe groups (320), which are respectively set to the built-in resistance test station (130), the contact resistance test station (140) and the performance test station (150).

5. The micro switch testing device according to claim 4, characterized in that, The break-in pressing unit (410) also includes: A rotary motor (412) is fixedly installed above the product break-in station (120); An eccentric connecting rod slider mechanism (413) is connected between the output shaft of the rotary motor (412) and the first pressure needle (411); The rotation of the rotary motor (412) drives the first pressure needle (411) to reciprocate linearly in the vertical direction through the eccentric connecting rod slider mechanism (413).

6. The microswitch testing device according to claim 4, characterized in that, Both the built-in resistor pressing unit (420) and the contact resistor pressing unit (430) further include: A pneumatic slide (422) is disposed above the corresponding working position, and the extension and retraction direction of the pneumatic slide (422) is parallel to the vertical direction; The movable end of the pneumatic slide (422) in the built-in resistor pressing unit (420) is connected to the second pressing needle (421); the movable end of the pneumatic slide (422) in the contact resistor pressing unit (430) is connected to the third pressing needle (431).

7. The micro switch testing device according to claim 4, characterized in that, The performance pressing unit (440) also includes: A servo linear module (442) is positioned above the performance test station (150); A tension / compression sensor (443) is disposed on the moving end of the servo linear module (442), and a fourth pressure pin (441) is disposed at the bottom of the tension / compression sensor (443). The servo linear module (442) is used to drive the fourth pressure pin (441) to perform a downward pressing action. The loop connection assembly (300) further includes a stabilizing block (350), which is disposed on the test clamp (311) of the loop connection assembly (300) corresponding to the performance test station (150) and is disposed on the top surface of the micro switch (800). It is used to move along the forward and backward direction to the top surface of the corresponding micro switch (800) to abut against the limiting micro switch (800). The performance testing station (150) is also provided with a bottom support assembly (500). The bottom support assembly (500) is located below the performance testing station (150) and includes a support drive (510) and a support plate (520) driven by the support drive (510) to move up and down in the vertical direction. The upper end of the support plate (520) has a support position for supporting the bottom of the micro switch (800) from below. During the testing of the performance pressing unit (440), the support plate (520) rises upward to support the bottom of the micro switch (800), and the stabilizing block (350) moves to press against the top of the micro switch (800), so that the micro switch (800) is pressed and fixed from the top and bottom.

8. The micro switch testing device according to claim 1, characterized in that, The micro switch testing device also includes a product sorting mechanism (600), located at the discharge end of the test track (100), for sorting and placing the micro switches (800) according to the test results.

9. The micro switch testing device according to claim 8, characterized in that, The product classification organization (600) includes: A receiving funnel (610) is located below the discharge end of the test track (100), and has an inlet channel and two outlet channels. The inlet channel is used to receive the micro switch (800) falling from the test track (100). A swing sorting assembly (620) is located at the bifurcation of the feed channel and the two discharge channels. The swing sorting assembly (620) includes a swing drive (621) and a guide plate (622) on the output shaft of the swing drive (621). The swing sorting assembly (620) is used to selectively guide the micro switch (800) falling from the receiving funnel (610) to the corresponding discharge channel according to the test results.

10. The micro switch testing device according to claim 8, characterized in that, The micro switch testing device further includes an assembly feeding mechanism (700), which includes: Micro-motion feed rail (720) is used to sequentially transport the micro-motion switch (800) body; Handle feed rail (730) for sequentially conveying handles (830); A micro-motion pusher assembly (740) is disposed between the handle feed rail (730) and the micro-motion feed rail (720) for pushing the micro-motion switch (800) body at the end of the micro-motion feed rail (720) to the handle assembly position (710) located on the test rail (100); A handle press-fit assembly (750) is located above the handle assembly position (710) and is used to clamp the handle (830) at the end of the handle feed rail (730), move it to the handle assembly position (710), and press it onto the micro switch (800) body. A feeding assembly (760) is provided between the handle assembly position (710) and the test track (100) for pushing the micro switch (800) body or the micro switch (800) with handle (830) one by one to the first working position on the test track (100).

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