A multi-channel high-speed connector short circuit test circuit and device

Abstract

The application belongs to the technical field of testing devices, and discloses a multi-channel high-speed connector short-circuit and open-circuit testing circuit and device, which comprises a power output end, a single-pole double-throw knife switch, a short-circuit testing power supply branch, an open-circuit testing power supply branch, a short-circuit fault indication loop connected with a red light, an open-circuit fault indication loop connected with a yellow light, a wire harness and a plug-in block. Through the cooperation of the double-path electrical detection component, the knife switch, the red light and the yellow light, the short-circuit testing power supply branch and the open-circuit testing power supply branch are switched by the single-pole double-throw switching characteristic of the knife switch, and different fault types are fed back by the independent indication loop, so that the short-circuit and open-circuit synchronous screening of the multi-channel connector can be completed at one time, the traditional manual point-by-point multimeter measurement mode is replaced, the problems of low manual testing efficiency and long testing time are effectively solved, and the operation efficiency of the batch testing of the multi-channel connector is greatly improved.

Description

Technical Field

[0001] This invention belongs to the field of testing device technology, specifically a short-circuit test circuit and device for multi-channel high-speed connectors. Background Technology

[0002] With the rapid iteration and upgrading of aerospace, weaponry, radar detection, high-speed communication, and high-density data transmission equipment, the demand for high-speed, high-capacity, and highly integrated data interaction continues to rise. Multi-channel high-speed connectors, as core basic components for signal interconnection and data transmission within various electronic systems, are widely used in various high-precision and high-reliability electronic equipment scenarios. Multi-channel high-speed connectors feature a large number of channels, dense pin arrangement, compact overall structure, high single-channel transmission rate, and stringent anti-interference requirements. Some high-end models can integrate hundreds of signal channels, enabling parallel transmission of multiple high-frequency signals within limited installation space. This effectively simplifies the overall wiring structure and reduces equipment size, making them an indispensable core interconnect component in current high-density integrated electronic systems.

[0003] Currently, the industry's methods for short-circuit and open-circuit testing of multi-channel high-speed connectors are relatively traditional. The mainstream testing method still relies on manual traversal testing, using handheld multimeters and portable continuity testers to perform pin-by-pin and channel-by-channel testing. During the testing process, operators need to repeatedly switch test points, perform probe alignment, conduct power-on testing, and record data for each densely packed pin. The entire operation is highly dependent on manual operation.

[0004] Due to the large number of channels and extremely dense pin arrangement of multi-channel high-speed connectors, manual operation is required to complete alignment, contact measurement, and result recording for each channel individually. This only enables single-channel serial testing and cannot perform multi-channel synchronous screening. As a result, the testing of a single product is time-consuming and the work cycle is slow, making it difficult to adapt to the testing needs of mass production of connectors. The overall testing efficiency is low. At the same time, existing conventional testing equipment has limited functionality and cannot achieve integrated short-circuit and open-circuit testing or one-click switching. It can only complete the testing of a single fault type. For the two most critical electrical defects in connector production, namely short circuits and open circuits, the existing testing mode requires different testing equipment and separate steps to carry out testing. During the operation, it is necessary to frequently change testing fixtures, repeatedly align and clamp workpieces, and repeatedly build test circuits. The process is redundant and cumbersome, and the equipment integration and universal adaptability are poor. Summary of the Invention

[0005] To address the problems mentioned in the background section, this invention provides a multi-channel high-speed connector short-circuit test circuit and apparatus.

[0006] To achieve the above objectives, the present invention provides the following technical solution: a multi-channel high-speed connector short circuit and open circuit test circuit, including a power supply output terminal, a single-pole double-throw switch, a short circuit test power supply branch, an open circuit test power supply branch, a short circuit fault indication circuit connected to a red light, an open circuit fault indication circuit connected to a yellow light, a wire harness, and a plug block;

[0007] The common terminal of the disconnect switch is electrically connected to the power supply output terminal. The normally closed contact of the disconnect switch is electrically connected to the short-circuit test power supply branch, and the normally open contact of the disconnect switch is electrically connected to the open-circuit test power supply branch. The two power supply branches can be selectively connected by switching the disconnect switch position. The short-circuit test power supply branch is electrically connected in series with a short-circuit fault indication circuit with a red light, and the open-circuit test power supply branch is electrically connected in series with an open-circuit fault indication circuit with a yellow light. The short-circuit test power supply branch and the open-circuit test power supply branch are connected in sequence through a wire harness and a plug block to form an external test terminal. The plug block is electrically connected to the side card interface of the connector to be tested and forms a closed-loop test line.

[0008] Preferably, a current-limiting resistor is connected in series inside the short-circuit test power supply branch, and the positive terminal of the power supply is connected to the anode of the red lamp through the current-limiting resistor, the cathode of the red lamp is connected to the plug block through the wire harness, and the shielded ground wire of the connector to be tested is connected to the negative terminal of the power supply.

[0009] Preferably, the plug-in block is made of conductive metal, and the plug-in end face of the plug-in block has a flat and fitting structure. After the plug-in block is plugged into the side card interface, a surface contact conductive structure is formed.

[0010] Secondly, this application discloses a multi-channel high-speed connector short-circuit test device, applied to the aforementioned multi-channel high-speed connector short-circuit test circuit, including a test platform assembly and a dual-channel electrical test assembly. The test platform assembly includes a test platform with an integrated power supply and a shelf fixedly connected to the inner wall of the test platform. The upper surface of the shelf is used to support and place the connector to be tested. The horizontal section of the connector to be tested is symmetrically equipped with side card interfaces. The dual-channel electrical test assembly is assembled on the upper end of the test platform assembly. The side cable blocks, wire harnesses, plug blocks, and control blocks located on both sides of the test platform are all located within the dual-channel electrical test assembly. The side cable blocks on both sides are respectively connected to the wire harnesses. The ends of the wire harnesses are fixedly connected to plug blocks, and the plug blocks are electrically connected to the side card interfaces. The knife switch, yellow light, and red light are all installed on the control block.

[0011] Preferably, it further includes a drive assembly disposed on the upper side of the detection stage assembly. The drive assembly includes a rectangular array of strip slides fixed to the detection stage surface. The movable output end of the strip slides is equipped with a slider. A strip card holder that fits the insertion block is fixedly connected between the strip slides on both sides of the insertion block.

[0012] Preferably, a drive arm assembly is mounted above the detection platform, the drive arm assembly includes a drive arm body, and a clamping component is detachably mounted at the lower end of the drive arm body.

[0013] Preferably, the clamping member is fitted with an alignment assembly on its side end. The alignment assembly includes a protrusion fixedly connected to the clamping member, a tapered protrusion fixedly provided at the lower end of the protrusion, a protrusion fixedly connected between two horizontally corresponding strip slides, and a tapered concave cylinder fixedly provided at the upper end of the protrusion. The tapered protrusion and the tapered concave cylinder form a vertical alignment fit.

[0014] Preferably, a set of guide plates are symmetrically fixedly installed on both sides of the upper surface of the placement plate. The gap width of the set of guide plates is adapted to the width of the side card interface, and the guide plates are enclosed to form a flared channel for the alignment and introduction of the connector to be tested.

[0015] Preferably, the placement plate is a rigid insulating board structure, and the placement plate and the testing table are fixed and rigidly connected.

[0016] Preferably, the drive arm is a multi-degree-of-freedom robotic arm structure, and the output end of the drive arm is fixedly connected to the clamping member to drive the clamping member to achieve spatial displacement.

[0017] Compared with the prior art, the beneficial effects of the present invention are as follows:

[0018] This invention, through the structural coordination of dual-path electrical detection components, a knife switch, and red and yellow lights, utilizes the single-pole double-throw switching characteristic of the knife switch to conduct short-circuit test power supply branches and open-circuit test power supply branches in a time-division manner. Relying on independent indicator circuits to provide feedback on different fault types, it can simultaneously screen for short circuits and open circuits of multi-channel connectors in one go. This replaces the traditional manual point-by-point measurement method with a multimeter, effectively solving the problems of low efficiency and long testing time of manual testing, and significantly improving the work efficiency of batch testing of multi-channel connectors.

[0019] This invention achieves automatic workpiece alignment and correction by setting up a structure that combines a placement plate, a guide plate, a driving component, and a strip-shaped card holder. At the same time, it relies on the strip-shaped slide table and the slider linkage strip-shaped card holder to limit and fix the insertion block, ensuring that the insertion position of the insertion block and the side card interface is accurate and uniform.

[0020] This invention, by setting a cooperative structure between the drive arm assembly and the alignment assembly, utilizes the self-adaptive alignment characteristics of the conical surfaces of the conical convex rod and the conical concave cylinder, and in conjunction with the clamping components, achieves secondary precise positioning of the workpiece, eliminating minor alignment deviations during mechanical assembly, and effectively improving the overall testing reliability and high-precision adaptability of the device. Attached Figure Description

[0021] Figure 1This is a schematic diagram of the overall structure of the detection stage assembly of the present invention;

[0022] Figure 2 This is a schematic diagram of the connector under test in the test state according to the present invention;

[0023] Figure 3 For the present invention Figure 2 A magnified schematic diagram of a partial section of the central placement plate;

[0024] Figure 4 This is a schematic diagram of the drive arm assembly structure of the present invention;

[0025] Figure 5 This is a schematic diagram of the dual-channel electrical detection component structure of the present invention;

[0026] Figure 6 This is a flowchart of the circuit system of the present invention.

[0027] In the diagram: 1. Testing table assembly; 100. Testing table surface; 101. Shelf plate; 102. Connector to be tested; 103. Side card interface; 2. Dual-channel electrical testing assembly; 200. Side cable block; 201. Wire harness; 202. Plug-in block; 203. Knife switch; 204. Yellow light; 205. Red light; 3. Drive assembly; 300. Strip slide table; 301. Slider; 302. Strip card holder; 4. Drive arm assembly; 400. Drive arm body; 401. Clamping component; 5. Alignment assembly assembly; 500. Protrusion; 501. Conical protrusion; 502. Protrusion; 503. Conical concave cylinder; 504. Guide plate. Detailed Implementation

[0028] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0029] like Figures 1 to 6As shown, this invention provides a multi-channel high-speed connector short-circuit and open-circuit test circuit, including a power supply output terminal, a single-pole double-throw switch 203, a short-circuit test power supply branch, an open-circuit test power supply branch, a short-circuit fault indication circuit connected to a red light 205, an open-circuit fault indication circuit connected to a yellow light 204, a wiring harness 201, and a plug-in block 202. The common terminal of the switch 203 is electrically connected to the power supply output terminal. The normally closed contact of the switch 203 is electrically connected to the short-circuit test power supply branch, and the normally open contact of the switch 203 is electrically connected to the open-circuit test power supply branch. The switch 203 switches between different positions to select one of the two power supply branches to conduct. The short-circuit test power supply branch is electrically connected in series with the short-circuit fault indication circuit with the red light 205. The open-circuit test power supply branch is electrically connected in series with the short-circuit fault indication circuit with the red light 205. A series circuit with a yellow light 204 is connected to form an open circuit fault indication circuit. The short circuit test power supply branch and the open circuit test power supply branch are connected to the wire harness 201 and the plug block 202 in sequence to form an external test terminal. The plug block 202 is electrically connected to the side card interface 103 of the connector under test 102 to form a closed loop test circuit. The short circuit test power supply branch is connected in series with a current limiting resistor. The positive terminal of the power supply is connected to the anode of the red light 205 through the current limiting resistor. The cathode of the red light 205 is connected to the plug block 202 through the wire harness 201. The shield ground wire of the connector under test 102 is connected to the negative terminal of the power supply. The plug block 202 is made of conductive metal and the plug end face of the plug block 202 is a flat and fit structure. After the plug block 202 is plugged into the side card interface 103, a surface contact conductive structure is formed.

[0030] The above scheme employs the following: the dual-path electrical detection component 2 is the core electrical detection execution structure of this invention, enabling integrated detection and feedback of both short-circuit and open-circuit faults. The control block serves as the integrated circuit mounting carrier, internally integrating a complete switching circuit and an indicator circuit, allowing for centralized switching of test modes and fault status indication. The knife switch 203 uses a general-purpose single-pole double-throw toggle switch, a conventional electrical switching element, capable of selectively switching between two circuits. It has no special customized structure, strong versatility, and convenient maintenance. The yellow light 204 and red light 205 both use general-purpose LED indicator lights, featuring low power consumption, high brightness, and long lifespan. They can provide visual indication of the on / off status of different fault circuits, intuitively feeding back connector test results and replacing the traditional method of manually observing multimeter data.

[0031] like Figures 2 to 5As shown, this application also discloses a multi-channel high-speed connector short-circuit test device, applied to the aforementioned multi-channel high-speed connector short-circuit test circuit. It includes a drive assembly 3 located on the upper side of the test platform assembly 1. The drive assembly 3 includes a rectangular array of strip slides 300 fixed to the test platform 100. A slider 301 is mounted on the movable output end of each strip slide 300. A strip bracket 302, which mates with the plug-in block 202, is fixedly connected between the strip slides 300 on both sides of the plug-in block 202. A drive arm assembly 4 is mounted above the test platform 100. The drive arm assembly 4 includes a drive arm body 400. A clamping member 401 is detachably mounted on the lower end of the drive arm body 400. An alignment assembly 5 is mounted on the side end of the clamping member 401. The alignment assembly 5 includes a protrusion 500 fixedly connected to the clamping member 401. A tapered protrusion 501 is fixedly installed at the lower end, and a protrusion 502 is fixedly connected between two horizontally corresponding strip slides 300. A tapered concave cylinder 503 is fixedly installed at the upper end of the protrusion 502. The tapered protrusion 501 and the tapered concave cylinder 503 form a vertical alignment fit. A set of guide plates 504 are symmetrically fixedly installed on both sides of the upper end face of the placement plate 101. The gap width of the set of guide plates 504 is adapted to the width of the side card interface 103. The guide plates 504 form an flared channel for the alignment and introduction of the connector 102 to be tested. The placement plate 101 is a rigid insulating board structure. The placement plate 101 and the testing table 100 are fixedly rigidly connected. The drive arm 400 is a multi-degree-of-freedom robotic arm structure, and the output end of the drive arm 400 is fixedly connected to the clamping member 401 to drive the clamping member 401 to achieve spatial displacement.

[0032] The above solution is adopted: the clamping component 401 adopts a detachable assembly structure, which can be disassembled and replaced according to different specifications of the connector 102 to be tested, effectively improving the adaptability and versatility of the device and reducing the equipment modification cost.

[0033] like Figures 2 to 6 As shown, the testing platform assembly 1 includes a testing platform 100 with an integrated power supply and a shelf 101 fixedly connected to the lower inner wall of the testing platform 100. The upper surface of the shelf 101 is used to support and place the connector 102 to be tested. The connector 102 to be tested is symmetrically equipped with side card interfaces 103 on both sides of its horizontal section. The dual-circuit electrical testing assembly 2 is assembled on the upper end of the testing platform assembly 1. The side cable blocks 200, wire harnesses 201, plug-in blocks 202 and control blocks located on both sides of the testing platform 100 are all located in the dual-circuit electrical testing assembly 2. The side cable blocks 200 on both sides are respectively connected to the wire harnesses 201. The ends of the wire harnesses 201 are fixedly connected to the plug-in blocks 202, and the plug-in blocks 202 are electrically connected to the side card interfaces 103. The knife switch 203, yellow light 204 and red light 205 are all installed on the control block.

[0034] The above scheme is adopted: the dual-circuit switching power supply circuit specifically includes two independent circuits: a short-circuit test power supply branch and an open-circuit test power supply branch. The two circuits are isolated from each other and do not interfere with each other, which can effectively avoid circuit crosstalk in different test modes and ensure the accuracy of test results. In the short-circuit test power supply branch, the positive terminal of the power supply is connected in series with the anode of the red lamp 205 through a current-limiting resistor. The cathode of the red lamp 205 is connected to the signal channel of the connector under test 102 through the wire harness 201. The shield ground wire of this channel is connected to the negative terminal of the power supply.

[0035] Working principle and usage process of this invention:

[0036] This device relies on the testing platform assembly 1 as the main body for supporting and powering the entire machine. The power supply integrated inside the testing platform 100 can continuously provide working power to the testing circuit of the entire machine. At the same time, the testing platform 100 can fix and support the overall structure of the placement plate 101, the dual-circuit electrical testing assembly 2, and the drive assembly 3, ensuring the stability of the entire machine's testing operation. Before the operation begins, the connector 102 to be tested is first placed stably on the upper surface of the placement plate 101. The guide plates 504 fixedly installed on both sides of the placement plate 101 can automatically align and correct the connector 102 to be tested and the side clamp interfaces 103 assembled on both sides of the connector 102 through the flared channels formed by their own enclosure. The gap width between the guide plate 504 and the side clamp interfaces 103 can ensure the regularity of the workpiece placement position and reduce the testing error caused by manual placement deviation. After the workpiece is placed... Then, the drive component 3 is activated. The rectangular array of strip slides 300 can drive the sliders 301 mounted on their output ends to perform directional displacement. During the movement, the sliders 301 can synchronously drive the strip brackets 302 fixed between the strip slides 300 to move synchronously, so that the strip brackets 302 and the plug-in blocks 202 form a stable locking and limiting structure, thereby fixing the working position of the plug-in blocks 202 and ensuring that the position of the plug-in structure is uniform. On this basis, the cable blocks 200 on both sides remain fixed. The wire harness 201 connected to the end of the side cable block 200 can drive the plug-in blocks 202 mounted at the end to move smoothly, so that the plug-in blocks 202 are accurately inserted into the side card interface 103 of the connector 102 to be tested. The conductive metal plug-in blocks 202 form a surface contact conduction structure through the flat plug-in end face, thereby stably building the electrical connection circuit of the whole machine.

[0037] After the electrical circuit is established, staff or external drivers can adjust the position of the switch 203 mounted at the end of the control block. Switch 203 adopts a single-pole double-throw structure, and its common terminal is continuously electrically connected to the power output terminal inside the test platform 100. By switching the position of switch 203, two independent power supply branches can be selectively activated. When switch 203 is switched to the normally closed contact position, the equipment connects to the short-circuit test power supply branch; when switch 203 is switched to the normally open contact position, the equipment connects to the open-circuit test power supply branch. This achieves orderly switching between short-circuit and open-circuit test functions. With the short-circuit test power supply branch activated, the circuit is connected in series to the red... When the short-circuit fault indication circuit corresponding to lamp 205 is in the state of open circuit test power supply branch being conductive, the circuit is connected in series to the open circuit fault indication circuit corresponding to yellow lamp 204. The two power supply branches can be connected to the internal channel of the connector under test 102 through wire harness 201, plug block 202, and side card interface 103 in sequence to form a complete closed-loop test circuit. When there is a short circuit fault in the channel of the connector under test 102, the short-circuit test circuit is fully conductive, the red lamp 205 lights up and completes the fault indication. When there is an open circuit fault in the channel of the connector under test 102, the conduction state of the open circuit test circuit changes, the yellow lamp 204 lights up and completes the fault indication, thereby completing the standardized short-circuit and open-circuit test operation of the multi-channel high-speed connector.

[0038] Based on the above-mentioned basic testing process, this device can be equipped with a drive arm assembly 4 and an alignment assembly 5 to achieve high-precision alignment. Specifically, the drive arm body 400 drives the lower detachable clamping member 401 to move as a whole through its own multi-directional displacement structure. The clamping member 401 can perform secondary clamping and positioning of the connector 102 to be tested. At the same time, the protrusion 500 fixed on the side of the clamping member 401 moves synchronously with the clamping member 401, thereby driving the tapered protrusion 501 to move vertically. The tapered protrusion 501 can form a vertical alignment fit with the tapered concave cylinder 503 at the upper end of the protrusion 502 between the strip slide 300. The tapered surface adaptation structure can eliminate the alignment deviation caused by mechanical assembly, further improve the coaxiality and structural stability of the insertion operation, and make the equipment adaptable to higher precision connector testing scenarios.

[0039] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus.

[0040] Although embodiments of the invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A short-circuit / open-circuit test circuit for a multi-channel high-speed connector, characterized in that: It includes a power supply output terminal, a single-pole double-throw switch (203), a short-circuit test power supply branch, an open-circuit test power supply branch, a short-circuit fault indication circuit connected to the red light (205), an open-circuit fault indication circuit connected to the yellow light (204), a wiring harness (201), and a plug-in block (202). The common terminal of the knife switch (203) is electrically connected to the power supply output terminal. The normally closed contact of the knife switch (203) is electrically connected to the short-circuit test power supply branch, and the normally open contact of the knife switch (203) is electrically connected to the open-circuit test power supply branch. The two power supply branches can be selected to conduct by switching the knife switch (203). The short-circuit test power supply branch is electrically connected in series with a short-circuit fault indication circuit with a red light (205). The open-circuit test power supply branch is electrically connected in series with an open-circuit fault indication circuit with a yellow light (204). The short-circuit test power supply branch and the open-circuit test power supply branch are connected in sequence through the wire harness (201) and the plug block (202) to form an external test terminal. The plug block (202) is electrically connected to the side card interface (103) of the connector to be tested (102) and forms a closed-loop test line.

2. The multi-channel high-speed connector short-circuit test circuit according to claim 1, characterized in that: The short-circuit test power supply branch has a series current-limiting resistor connected inside, and the positive terminal of the power supply is connected to the anode of the red lamp (205) through the current-limiting resistor. The cathode of the red lamp (205) is connected to the plug block (202) through the wire harness (201). The shielded ground wire of the connector (102) to be tested is connected to the negative terminal of the power supply.

3. The multi-channel high-speed connector short-circuit test circuit according to claim 1, characterized in that: The plug-in block (202) is made of conductive metal, and the plug-in end face of the plug-in block (202) is a flat and fitted structure. After the plug-in block (202) is plugged into the side card interface (103), a surface contact conductive structure is formed.

4. A multi-channel high-speed connector short-circuit test device, applied to the multi-channel high-speed connector short-circuit test circuit according to any one of claims 1-3, characterized in that: The test platform assembly (1) includes a test platform (100) with an integrated power supply, and a shelf (101) fixedly connected to the inner wall of the test platform (100). The upper surface of the shelf (101) is used to support and place the connector (102) to be tested. The connector (102) to be tested has side card interfaces (103) symmetrically mounted on both sides of its horizontal section. A dual-circuit electrical testing assembly (2) is mounted on the upper end of the test platform assembly (1) and is located on the test platform (100). The side cable blocks (200), wire harness (201), plug-in block (202) and control block on both sides of 100 are all located in the dual-circuit electrical detection assembly (2). The side cable blocks (200) on both sides are connected to the wire harness (201) respectively. The end of the wire harness (201) is fixedly connected to the plug-in block (202), and the plug-in block (202) is electrically connected to the side card interface (103). The knife switch (203), yellow light (204) and red light (205) are all installed on the control block.

5. The multi-channel high-speed connector short-circuit test device according to claim 4, characterized in that: It also includes a drive assembly (3) located on the upper side of the detection stage assembly (1). The drive assembly (3) includes a rectangular array of strip slides (300) fixed to the detection stage surface (100). The movable output end of the strip slides (300) is equipped with a slider (301). A strip card holder (302) that fits into the plug-in block (202) is fixedly connected between the strip slides (300) on both sides of the plug-in block (202).

6. The multi-channel high-speed connector short-circuit test device according to claim 5, characterized in that: A drive arm assembly (4) is mounted on the top of the testing platform (100). The drive arm assembly (4) includes a drive arm body (400), and a clamping component (401) is detachably mounted on the lower end of the drive arm body (400).

7. The multi-channel high-speed connector short-circuit test device according to claim 6, characterized in that: The clamping member (401) is fitted with an alignment assembly (5) on its side. The alignment assembly (5) includes a protrusion (500) fixedly connected to the clamping member (401). A tapered protrusion (501) is fixedly provided at the lower end of the protrusion (500). A protrusion (502) is fixedly connected between two horizontally corresponding strip slides (300). A tapered concave cylinder (503) is fixedly provided at the upper end of the protrusion (502). The tapered protrusion (501) and the tapered concave cylinder (503) form a vertical alignment fit.

8. The multi-channel high-speed connector short-circuit test device according to claim 4, characterized in that: A set of guide plates (504) are symmetrically fixed on both sides of the upper end face of the placement plate (101). The gap width of the set of guide plates (504) is adapted to the width of the side card interface (103). The guide plates (504) are enclosed to form a flared channel for the alignment and introduction of the connector (102) to be tested.

9. The multi-channel high-speed connector short-circuit test device according to claim 4, characterized in that: The placement plate (101) is a rigid insulating board structure, and the placement plate (101) and the testing table (100) are fixed rigidly connected.

10. The multi-channel high-speed connector short-circuit test device according to claim 6, characterized in that: The drive arm (400) is a multi-degree-of-freedom robotic arm structure, and the output end of the drive arm (400) is fixedly connected to the clamping member (401) to drive the clamping member (401) to achieve spatial displacement.

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