Beam switching time measurement method, apparatus, device, product, and medium

Abstract

The application provides a beam switching time measurement method, device, equipment, product and medium, and relates to the technical field of wireless. The method comprises: performing symbol-level weight configuration on a transmission signal of a to-be-tested device according to a preset rule, wherein the preset rule comprises: two adjacent symbols in the transmission signal correspond to different weights; performing beam switching simulation testing based on the weight configuration to obtain a beam switching time. The scheme of the application solves the problem of low testing efficiency of the beam switching time in the prior art.

Description

Technical Field

[0001] This invention relates to the field of wireless technology, and in particular to a method, apparatus, equipment, product, and medium for measuring beam switching time. Background Technology

[0002] Currently, beam management is one of the challenges facing VMI (Very Large Array) antenna technology, and beam switching speed is a crucial parameter in beam management. However, existing test systems can only test one beam at a time, and cannot test multiple beams simultaneously, resulting in low testing efficiency for beam switching speed (or switching time). Summary of the Invention

[0003] The purpose of this invention is to provide a method, apparatus, device, product, and medium for measuring beam switching time, which solves the problem of low testing efficiency of beam switching time in the prior art.

[0004] To achieve the above objectives, embodiments of the present invention provide a beam switching time measurement method, comprising:

[0005] According to preset rules, symbol-level weights are configured for the transmitted signals of the device under test. The preset rules include: two adjacent symbols in the transmitted signals correspond to different weights.

[0006] Based on the weight configuration, beam switching simulation tests are performed to obtain the beam switching time.

[0007] Optionally, the step of performing beam switching simulation tests based on the weight configuration to obtain the beam switching time includes:

[0008] When the turntable is started, data is collected from the device under test set on the turntable in different time domains to obtain an initial dataset;

[0009] Based on the weight configuration and the initial dataset, a signal feature map corresponding to the beam is generated, wherein the signal feature map is used to characterize the temporal and / or spatial characteristics of the beam, the beam is the beam generated by the device under test, and the beam corresponds one-to-one with the weight;

[0010] The beam switching time is obtained based on the signal feature map.

[0011] Optionally, the signal feature map includes: a timing map and a direction pattern;

[0012] The step of generating a signal feature map corresponding to the beam based on the weight configuration and the initial dataset includes:

[0013] For N beam switching combinations, a timing diagram corresponding to each beam switching combination is generated according to the weight configuration and the initial dataset. The beam switching combination includes any two beams among the N beams that can perform beam switching.

[0014] According to the weight configuration, the initial dataset is divided into N subsets based on N different values ​​of the weight, and N beam patterns are generated for each of the N subsets.

[0015] Where N is a positive integer greater than or equal to 2.

[0016] Optionally, obtaining the beam switching time based on the signal feature map includes:

[0017] For each of the aforementioned beam switching combinations, the effectiveness of the radiation patterns of the two beams in the beam switching combination is verified respectively;

[0018] If the radiation patterns of both beams are determined to be valid, the beam switching time between the two beams is determined according to the timing diagram corresponding to the beam switching combination.

[0019] Optionally, for each beam switching combination, the validity verification of the radiation patterns of the two beams in the beam switching combination includes:

[0020] Obtain the first target pattern corresponding to the first beam, wherein the first beam is any one of the two beams, and the first target pattern is: the pattern of the beam generated by the device under test when the weights of all symbols in the transmitted signal are all first values, and the first value is the weight corresponding to the first beam;

[0021] Compare the radiation pattern of the first beam with the radiation pattern of the first target;

[0022] When the difference between the radiation pattern of the first beam and the radiation pattern of the first target is within a preset range, the radiation pattern of the first beam is determined to be valid.

[0023] To achieve the above objectives, embodiments of the present invention provide a beam switching time measurement device, comprising:

[0024] The weight configuration module is used to configure symbol-level weights for the transmitted signals of the device under test according to preset rules, wherein the preset rules include: two adjacent symbols in the transmitted signals correspond to different weights;

[0025] The simulation test module is used to perform beam switching simulation tests based on the weight configuration to obtain the beam switching time.

[0026] Optionally, the simulation test module includes:

[0027] The data acquisition submodule is used to acquire data from the device under test set on the turntable in different time domains when the turntable is started, so as to obtain an initial dataset.

[0028] The feature generation submodule is used to generate a signal feature map corresponding to the beam based on the weight configuration and the initial dataset. The signal feature map is used to characterize the temporal and / or spatial features of the beam. The beam is a beam generated by the device under test. The beam corresponds one-to-one with the weight.

[0029] The first processing submodule is used to obtain the beam switching time based on the signal feature map.

[0030] Optionally, the signal feature map includes: a timing map and a direction pattern; the feature generation submodule includes:

[0031] The first generation unit is used to generate a timing diagram corresponding to each of the N beam switching combinations according to the weight configuration and the initial dataset. The beam switching combination includes any two beams among the N beams that can perform beam switching.

[0032] The second generation unit is used to divide the initial dataset into N subsets according to the N different values ​​of the weights, and generate N beam patterns according to the N subsets respectively.

[0033] Where N is a positive integer greater than or equal to 2.

[0034] Optionally, the first processing submodule includes:

[0035] The first verification unit is used to verify the effectiveness of the radiation patterns of the two beams in each beam switching combination.

[0036] The first processing unit is configured to determine the beam switching time between the two beams based on the timing diagram corresponding to the beam switching combination, provided that the radiation patterns of both beams are valid.

[0037] Optionally, the first verification unit includes:

[0038] The first acquisition subunit is used to acquire the first target pattern corresponding to the first beam, wherein the first beam is either of the two beams, and the first target pattern is the pattern of the beam generated by the device under test when the weights of all symbols in the transmitted signal are all first values, and the first value is the weight corresponding to the first beam.

[0039] The first comparison subunit is used to compare the radiation pattern of the first beam with the radiation pattern of the first target.

[0040] The first processing subunit is configured to determine that the radiation pattern of the first beam is valid when the difference between the radiation pattern of the first beam and the radiation pattern of the first target beam is within a preset range.

[0041] To achieve the above objectives, embodiments of the present invention provide a device including a processor and a transceiver, wherein the processor is used for:

[0042] According to preset rules, symbol-level weights are configured for the transmitted signals of the device under test. The preset rules include: two adjacent symbols in the transmitted signals correspond to different weights.

[0043] Based on the weight configuration, beam switching simulation tests are performed to obtain the beam switching time.

[0044] Optionally, when the processor performs beam switching simulation testing based on the weight configuration to obtain the beam switching time, it is specifically used for:

[0045] When the turntable is started, data is collected from the device under test set on the turntable in different time domains to obtain an initial dataset;

[0046] Based on the weight configuration and the initial dataset, a signal feature map corresponding to the beam is generated, wherein the signal feature map is used to characterize the temporal and / or spatial characteristics of the beam, the beam is the beam generated by the device under test, and the beam corresponds one-to-one with the weight;

[0047] The beam switching time is obtained based on the signal feature map.

[0048] Optionally, the signal feature map includes: a timing map and a direction pattern;

[0049] When the processor generates a signal feature map corresponding to the beam based on the weight configuration and the initial dataset, it is specifically used for:

[0050] For N beam switching combinations, a timing diagram corresponding to each beam switching combination is generated according to the weight configuration and the initial dataset. The beam switching combination includes any two beams among the N beams that can perform beam switching.

[0051] According to the weight configuration, the initial dataset is divided into N subsets based on N different values ​​of the weight, and N beam patterns are generated for each of the N subsets.

[0052] Where N is a positive integer greater than or equal to 2.

[0053] Optionally, when the processor obtains the beam switching time based on the signal feature map, it specifically performs the following:

[0054] For each of the aforementioned beam switching combinations, the effectiveness of the radiation patterns of the two beams in the beam switching combination is verified respectively;

[0055] If the radiation patterns of both beams are determined to be valid, the beam switching time between the two beams is determined according to the timing diagram corresponding to the beam switching combination.

[0056] Optionally, when the processor verifies the validity of the radiation patterns of the two beams in each beam switching combination, it specifically performs the following:

[0057] Obtain the first target pattern corresponding to the first beam, wherein the first beam is any one of the two beams, and the first target pattern is: the pattern of the beam generated by the device under test when the weights of all symbols in the transmitted signal are all first values, and the first value is the weight corresponding to the first beam;

[0058] Compare the radiation pattern of the first beam with the radiation pattern of the first target;

[0059] When the difference between the radiation pattern of the first beam and the radiation pattern of the first target is within a preset range, the radiation pattern of the first beam is determined to be valid.

[0060] To achieve the above objectives, embodiments of the present invention provide a device including a transceiver, a processor, a memory, and a program or instructions stored in the memory and executable on the processor; when the processor executes the program or instructions, it implements the beam switching time measurement method described above.

[0061] To achieve the above objectives, a computer program product is provided, including computer instructions that, when executed by a processor, implement the steps of the beam switching time measurement method described above.

[0062] To achieve the above objectives, embodiments of the present invention provide a readable storage medium storing a program or instructions that, when executed by a processor, implement the steps in the beam switching time measurement method described above.

[0063] The beneficial effects of the above-mentioned technical solution of the present invention are as follows:

[0064] The method of this invention can configure symbol-level weights for the transmitted signal according to preset rules, so that at least two simulated beams are cyclically switched during beam switching simulation testing, enabling simultaneous testing of at least two beams and improving the testing efficiency of beam switching time. Attached Figure Description

[0065] Figure 1 This is a schematic diagram of an existing antenna OTA testing system;

[0066] Figure 2 A schematic diagram showing the weight configuration of the signal frame structure during testing of existing AAU equipment;

[0067] Figure 3 This is a flowchart of the beam switching time measurement method according to an embodiment of the present invention;

[0068] Figure 4 This is a block diagram of a symbol-level analog beam timing test system according to an embodiment of the present invention;

[0069] Figure 5 This is a schematic diagram of symbol-level beam switching signal configuration and beam testing according to an embodiment of the present invention;

[0070] Figure 6 This is a timing diagram of beam switching time measurement according to an embodiment of the present invention;

[0071] Figure 7 This is a schematic diagram of the symbol-level analog beam switching time measurement process according to an embodiment of the present invention;

[0072] Figure 8 This is a structural diagram of the beam switching time measurement device according to an embodiment of the present invention;

[0073] Figure 9 This is a structural diagram of the device according to an embodiment of the present invention;

[0074] Figure 10 This is a structural diagram of a device according to another embodiment of the present invention. Detailed Implementation

[0075] To make the technical problems, technical solutions and advantages of the present invention clearer, a detailed description will be given below in conjunction with the accompanying drawings and specific embodiments.

[0076] It should be understood that the phrase "one embodiment" or "an embodiment" throughout the specification means that a specific feature, structure, or characteristic related to the embodiment is included in at least one embodiment of the invention. Therefore, "in one embodiment" or "in an embodiment" appearing throughout the specification do not necessarily refer to the same embodiment. Furthermore, these specific features, structures, or characteristics can be combined in any suitable manner in one or more embodiments.

[0077] In various embodiments of the present invention, it should be understood that the sequence number of each process described below does not imply the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present invention.

[0078] In addition, the terms "system" and "network" are often used interchangeably in this article.

[0079] In the embodiments provided in this application, it should be understood that "B corresponding to A" means that B is associated with A, and B can be determined based on A. However, it should also be understood that determining B based on A does not mean determining B solely based on A; B can also be determined based on A and / or other information.

[0080] The relevant technologies are as follows:

[0081] Currently, Massive MIMO is widely used in mobile communication systems, with existing devices typically employing 192 antenna elements and 32 or 64 RF channels. To achieve higher gain, the number of antenna elements in new devices is continuously increasing, reaching 768 elements in the 4.9GHz band. However, due to limitations in circuit design, cost, and power consumption, the number of RF channels has not increased accordingly. To ensure beam scanning capability and expand coverage, a symbol-level switchable digital-analog orthogonal architecture using digitally controlled phase shifters has become a key technology for new devices. In ultra-wide-angle coverage scenarios, such as low-altitude and inductive applications, even element-level digitally controlled phase shifting technology is used to create a beam scanning range greater than 60° in the vertical dimension, compensating for the narrow scanning range caused by insufficient digital channels.

[0082] Because very large-scale array antennas have higher beam gain and narrower beamwidth, a larger number of beams are needed to cover the entire coverage area. Therefore, beam management has become one of the challenges facing very large-scale array antenna technology. Among these challenges, beam switching speed is an important parameter in beam management.

[0083] Because of the introduction of a numerically controlled phase shifter, beam switching is accomplished by the joint assignment of digital and analog weights. Beam switching involves the switching control of multiple hardware and software nodes within the system. Therefore, the phase switching speed of a simple device-level numerically controlled phase shifter cannot be completely equivalent to the beam switching speed. During rooftop testing, it is also necessary to test the beam-level switching speed to more closely approximate the usage scenario.

[0084] Currently, the overall radiation performance testing of Massive-MIMO equipment is mainly conducted in an anechoic chamber. This includes measuring the radiation characteristics of the antenna beam pattern, such as gain, beamwidth, and front-to-back ratio, as well as the equipment's RF OTA (Over-The-Air) performance indicators, such as EIRP, EVM, and EIS. An overall radiation performance testing system is available, such as... Figure 1 As shown in the diagram. During the test of the antenna's beam pattern, the antenna array unit (AAU) is fixed on the turntable. After the test is started, the turntable begins to rotate, the AAU transmits a specified beam signal, the standard antenna receives the signal, and the signal is processed by a spectrum analyzer to obtain the antenna's radiation characteristics. Figure 2 As shown, during the test, the AAU radiated signal adopts a standard frame structure. To ensure more stable sampling data, the weights of the device's output signal remain unchanged within a subframe. Therefore, the current test system can only test one beam at a time and lacks the capability to test symbol-level beam switching speed, resulting in low test efficiency.

[0085] like Figure 3 As shown, an embodiment of the present invention provides a method for measuring beam switching time, comprising:

[0086] Step 301: According to preset rules, configure symbol-level weights for the transmitted signal of the device under test. The preset rules include: two adjacent symbols in the transmitted signal correspond to different weights.

[0087] like Figure 4 The diagram shown is a block diagram of a symbol-level simulated beam timing test system according to an embodiment of the present invention. In beam switching simulation testing, the device under test (DUT) can specifically be an analog array (AAU). The AAU is fixed on a turntable and rotates under the drive of the turntable. The AAU transmits signals during rotation. A spectrum analyzer with time-domain measurement capabilities can analyze the received signals.

[0088] In step 301, symbol-level weight switching configuration is performed on the transmitted signal. Specifically, when configuring different weights for two adjacent symbols in the transmitted signal, at least two weights are selected, with each weight corresponding to one beam. This ensures that cyclic switching occurs at least between two analog beams. For example, in an optional example, such as... Figure 5 As shown, two weights (weight 1 and weight 2) can be selected, and weights 1 and weight 2 can be alternately and repeatedly configured on the symbols of the transmitted signal; in another optional embodiment, three weights (such as w1, w2, w3) can be used to configure the symbols of the transmitted signal in sequence to ensure that adjacent symbols are configured with different weights. The weight order after the transmitted signal is configured is: w1w2w3w1w2w3… and so on.

[0089] Step 302: Based on the weight configuration, perform beam switching simulation test to obtain the beam switching time.

[0090] In this embodiment, symbol-level weights can be configured for the transmitted signal according to preset rules, so that at least two simulated beams are cyclically switched during beam switching simulation testing, enabling simultaneous testing of at least two beams and improving the testing efficiency of beam switching time.

[0091] In some embodiments, step 302, the step of performing beam switching simulation tests based on the weight configuration to obtain the beam switching time, includes:

[0092] Step 3021: With the turntable started, data is collected from the device under test set on the turntable in different time domains to obtain an initial dataset.

[0093] It should be noted that the symbol-level switching speed is on the order of μ seconds (microseconds), which is much smaller than the rotation speed of the turntable in the test system. Therefore, when the turntable rotates to a certain position (applicable to both horizontal and vertical directions), multiple analog beams can complete multiple switching during the dwell time in that position.

[0094] It should also be noted that before conducting beam switching simulation tests, it is necessary to ensure that the device under test (DUT) and the instrument (spectrum analyzer) are synchronized. After the instrument and DUT are synchronized, the instrument can clearly identify the symbol position in the time domain. By acquiring data in different time domains, the instrument can distinguish the signal level on different symbols, thereby achieving symbol-level signal acquisition.

[0095] Step 3022: Based on the weight configuration and the initial dataset, generate a signal feature map corresponding to the beam, wherein the signal feature map is used to characterize the temporal and / or spatial characteristics of the beam, the beam is the beam generated by the device under test, and the beam corresponds one-to-one with the weight.

[0096] Step 3023: Obtain the beam switching time based on the signal feature map.

[0097] In this embodiment, a signal feature map can be generated based on the dataset obtained from symbol-level signal acquisition, thereby clarifying the characteristics of the beam generated by the device under test, and then using this to analyze and obtain the beam switching time.

[0098] In some embodiments, the signal feature map includes a timing map and a direction pattern; step 3022 specifically includes:

[0099] Step 1: For N beam switching combinations, generate a timing diagram corresponding to each beam switching combination according to the weight configuration and the initial dataset. The beam switching combination includes any two beams among the N beams that can perform beam switching.

[0100] It should be noted that timing diagrams can reflect and display the changes of beams over time. Therefore, by using the timing diagrams corresponding to beam switching combinations, one can intuitively see the time distribution and duration of beams in the beam switching combination.

[0101] Step 2: According to the weight configuration, the initial dataset is divided into N subsets based on the N different values ​​of the weight, and N beam patterns are generated for each of the N subsets.

[0102] Where N is a positive integer greater than or equal to 2.

[0103] In step two, the mapping relationship between symbols in the transmitted signal and base station beam weights can be clearly defined based on the weight configuration. This allows the data collected for each symbol to be assigned to the beam corresponding to its respective weight. For example, ... Figure 5 As shown, the data collected on the symbols corresponding to weight 1 (date1, date3, date5, date7...) can be assigned to beam 1, that is, these data are divided into a subset, which corresponds to beam 1; the data collected on the symbols corresponding to weight 2 (date2, date4, date6...) can be assigned to beam 2.

[0104] It should be noted that during the data acquisition process by rotating the turntable, the turntable angle can be recorded simultaneously. This means that when the turntable rotates to each position, the data acquired at that position needs to be correlated with the current angle of the turntable. In this way, when generating a radiation pattern based on a subset of beams, the angle corresponding to each data point within that subset can be clearly identified.

[0105] It should also be noted that the execution order of steps one and two is not important; these operations can be executed concurrently, or one can be executed first and then the other.

[0106] In some embodiments, obtaining the beam switching time based on the signal feature map includes: for each beam switching combination, verifying the validity of the radiation patterns of the two beams in the beam switching combination; and if it is determined that the radiation patterns of the two beams are both valid, determining the beam switching time between the two beams based on the timing diagram corresponding to the beam switching combination.

[0107] It should be noted that since the beam weights in the hybrid digital-analog architecture are superimposed from digital and analog weights, the correctness of the radiation pattern needs to be verified in order to ensure the correctness of beam switching.

[0108] In this embodiment, if the verification result shows that the beam pattern is valid, the beam switching time can be further confirmed based on the timing diagram corresponding to the beam switching combination; if the verification result shows that the beam pattern is invalid, the measurement needs to be repeated. This ensures effective measurement of the beam switching time in the hybrid analog-digital architecture.

[0109] In some embodiments, the step of validating the radiation patterns of the two beams in each beam switching combination includes:

[0110] (1) Obtain the first target pattern corresponding to the first beam, wherein the first beam is any one of the two beams, and the first target pattern is: the pattern of the beam generated by the device under test when the weight of all symbols in the transmitted signal is the first value, and the first value is the weight corresponding to the first beam.

[0111] In other words, it is necessary to compare the radiation pattern obtained in the multi-beam test mode with the beam radiation pattern with the same weights measured in the single-beam test mode. It can be understood that the multi-beam test mode is when adjacent symbols in the transmitted signal are configured with different weights, while the single-beam test mode refers to when the transmitted signal is configured with only one weight.

[0112] (2) Compare the radiation pattern of the first beam with the radiation pattern of the first target;

[0113] (3) When the difference between the radiation pattern of the first beam and the radiation pattern of the first target beam is within a preset range, the radiation pattern of the first beam is determined to be valid.

[0114] Specifically, the differences in indicators can be determined by comparing key indicators such as gain and beamwidth. If the differences in indicators are within the allowable range (i.e., the preset range corresponding to the indicators), then the beam pattern is determined to be valid.

[0115] In this embodiment, the validity of the beam pattern can be verified by comparing the multi-beam radiation patterns, thereby confirming the accuracy of the beam switching time measurement. In other words, if the radiation pattern is invalid, the beam switching time measurement is considered inaccurate and needs to be retested.

[0116] It should be noted that before conducting beam switching simulation tests in this embodiment of the invention, the spectrum analyzer needs to be set to time-domain measurement mode, and reasonable center frequency, data analysis bandwidth (ABW), and time-domain measurement time need to be set. During the test, the spectrum analyzer can obtain a timing diagram by analyzing the collected data.

[0117] like Figure 6As shown, in some embodiments, when determining the beam switching time between two beams according to the timing diagram corresponding to the beam switching combination, a position where the signal strengths of the two beams differ greatly within one time slot may be determined first, which is represented in the timing diagram as before and after the switching between the high level and the low level (e.g. Figure 6 the time positions corresponding to d1 and d2 in the diagram), and the switching time between the high level and the low level (that is, the difference obtained by d2-d1) may reflect the switching time of the two analog beams (d2-d1<T, where T represents the duration of one time slot).

[0118] As shown in Figure 7 , the beam switching time measurement method according to the embodiment of the present invention mainly includes the following steps:

[0119] S701: Perform symbol-level weight configuration on the transmit signal of a device (i.e., a device under test) according to a preset rule;

[0120] S702: Start the turntable, and perform symbol-level data acquisition;

[0121] S703: Allocate the acquired data to a plurality of beams (which may also be two, depending on the weight configuration) according to the weights, generate a radiation pattern accordingly, and record time domain measurement data (i.e., the timing diagram);

[0122] S704: Verify through comparison whether the radiation pattern of the beam is valid, that is, confirm whether the switching is performed between correct beams, so as to perform a switching time test based on valid analog beam switching, and ensure the accuracy of the test result. In S704, if the judgment result is yes, execute S705; if the judgment result is no, execute S706;

[0123] S705: Call the time domain measurement data, and read the switching time within one slot duration;

[0124] S706: Troubleshoot the problem and perform the test again.

[0125] In the beam switching time measurement method of this embodiment, symbol-level weights can be configured for the transmit signal according to preset rules, so that cyclic switching is performed between at least two analog beams in the beam switching simulation test. In the time domain, symbol-level analog beam switching time measurement is realized, and at least two beams can be tested at the same time, which improves the test efficiency of beam switching time, can provide technical data support for beam management, and provides an effective guarantee for product quality.

[0126] As shown in Figure 8 , a beam switching time measurement apparatus according to an embodiment of the present invention includes:

[0127] The weight configuration module 810 is used to configure symbol-level weights for the transmitted signals of the device under test according to preset rules, wherein the preset rules include: two adjacent symbols in the transmitted signals correspond to different weights;

[0128] The simulation test module 820 is used to perform beam switching simulation tests based on the weight configuration to obtain the beam switching time.

[0129] In this embodiment, symbol-level weights can be configured for the transmitted signal according to preset rules, so that at least two simulated beams are cyclically switched during beam switching simulation testing, enabling simultaneous testing of at least two beams and improving the testing efficiency of beam switching time.

[0130] Optionally, the simulation test module 820 includes:

[0131] The data acquisition submodule is used to acquire data from the device under test set on the turntable in different time domains when the turntable is started, so as to obtain an initial dataset.

[0132] The feature generation submodule is used to generate a signal feature map corresponding to the beam based on the weight configuration and the initial dataset. The signal feature map is used to characterize the temporal and / or spatial features of the beam. The beam is a beam generated by the device under test. The beam corresponds one-to-one with the weight.

[0133] The first processing submodule is used to obtain the beam switching time based on the signal feature map.

[0134] Optionally, the signal feature map includes: a timing map and a direction pattern; the feature generation submodule includes:

[0135] The first generation unit is used to generate a timing diagram corresponding to each of the N beam switching combinations according to the weight configuration and the initial dataset. The beam switching combination includes any two beams among the N beams that can perform beam switching.

[0136] The second generation unit is used to divide the initial dataset into N subsets according to the N different values ​​of the weights, and generate N beam patterns according to the N subsets respectively.

[0137] Where N is a positive integer greater than or equal to 2.

[0138] Optionally, the first processing submodule includes:

[0139] The first verification unit is used to verify the effectiveness of the radiation patterns of the two beams in each beam switching combination.

[0140] The first processing unit is configured to determine the beam switching time between the two beams based on the timing diagram corresponding to the beam switching combination, provided that the radiation patterns of both beams are valid.

[0141] Optionally, the first verification unit includes:

[0142] The first acquisition subunit is used to acquire the first target pattern corresponding to the first beam, wherein the first beam is either of the two beams, and the first target pattern is the pattern of the beam generated by the device under test when the weights of all symbols in the transmitted signal are all first values, and the first value is the weight corresponding to the first beam.

[0143] The first comparison subunit is used to compare the radiation pattern of the first beam with the radiation pattern of the first target.

[0144] The first processing subunit is configured to determine that the radiation pattern of the first beam is valid when the difference between the radiation pattern of the first beam and the radiation pattern of the first target beam is within a preset range.

[0145] It should be noted that the beam switching time measurement device provided in this embodiment of the invention can implement all the method steps implemented in the above-mentioned beam switching time measurement method embodiment, and can achieve the same technical effect. Here, the parts that are the same as those in the method embodiment and the beneficial effects will not be described in detail.

[0146] like Figure 9 As shown, an embodiment of the present invention, a device 900, includes a processor 910 and a transceiver 920, wherein the processor 910 is used for:

[0147] According to preset rules, symbol-level weights are configured for the transmitted signals of the device under test. The preset rules include: two adjacent symbols in the transmitted signals correspond to different weights.

[0148] Based on the weight configuration, beam switching simulation tests are performed to obtain the beam switching time.

[0149] In this embodiment, symbol-level weights can be configured for the transmitted signal according to preset rules, so that at least two simulated beams are cyclically switched during beam switching simulation testing, enabling simultaneous testing of at least two beams and improving the testing efficiency of beam switching time.

[0150] Optionally, when the processor 910 performs beam switching simulation testing based on the weight configuration to obtain the beam switching time, it is specifically used for:

[0151] When the turntable is started, data is collected from the device under test set on the turntable in different time domains to obtain an initial dataset;

[0152] Based on the weight configuration and the initial dataset, a signal feature map corresponding to the beam is generated, wherein the signal feature map is used to characterize the temporal and / or spatial characteristics of the beam, the beam is the beam generated by the device under test, and the beam corresponds one-to-one with the weight;

[0153] The beam switching time is obtained based on the signal feature map.

[0154] Optionally, the signal feature map includes: a timing map and a direction pattern;

[0155] When the processor 910 generates a signal feature map corresponding to the beam based on the weight configuration and the initial dataset, it is specifically used for:

[0156] For N beam switching combinations, a timing diagram corresponding to each beam switching combination is generated according to the weight configuration and the initial dataset. The beam switching combination includes any two beams among the N beams that can perform beam switching.

[0157] According to the weight configuration, the initial dataset is divided into N subsets based on N different values ​​of the weight, and N beam patterns are generated for each of the N subsets.

[0158] Where N is a positive integer greater than or equal to 2.

[0159] Optionally, when the processor 910 obtains the beam switching time based on the signal feature map, it specifically performs the following:

[0160] For each of the aforementioned beam switching combinations, the effectiveness of the radiation patterns of the two beams in the beam switching combination is verified respectively;

[0161] If the radiation patterns of both beams are determined to be valid, the beam switching time between the two beams is determined according to the timing diagram corresponding to the beam switching combination.

[0162] Optionally, when the processor 910 verifies the validity of the radiation patterns of the two beams in each beam switching combination, it specifically performs the following:

[0163] Obtain the first target pattern corresponding to the first beam, wherein the first beam is any one of the two beams, and the first target pattern is: the pattern of the beam generated by the device under test when the weights of all symbols in the transmitted signal are all first values, and the first value is the weight corresponding to the first beam;

[0164] Compare the radiation pattern of the first beam with the radiation pattern of the first target;

[0165] When the difference between the radiation pattern of the first beam and the radiation pattern of the first target is within a preset range, the radiation pattern of the first beam is determined to be valid.

[0166] It should be noted that the device provided in this embodiment of the invention can implement all the method steps implemented in the above-mentioned beam switching time measurement method embodiment and can achieve the same technical effect. Here, the parts that are the same as those in the method embodiment and the beneficial effects will not be described in detail.

[0167] Another embodiment of the device of the present invention, such as Figure 10 As shown, it includes a transceiver 1010, a processor 1000, a memory 1020, and a program or instructions stored in the memory 1020 and executable on the processor 1000; when the processor 1000 executes the program or instructions, it implements the above-mentioned beam switching time measurement method.

[0168] The transceiver 1010 is used to receive and send data under the control of the processor 1000.

[0169] Among them, Figure 10 In this context, the bus architecture can include any number of interconnected buses and bridges, specifically linking various circuits of one or more processors represented by processor 1000 and memory represented by memory 1020 together. The bus architecture can also link various other circuits such as peripheral devices, voltage regulators, and power management circuits, which are well known in the art and therefore will not be described further herein. The bus interface provides an interface. The transceiver 1010 can be multiple elements, including transmitters and receivers, providing a unit for communicating with various other devices over a transmission medium. For different devices, the user interface 1030 can also be an interface capable of connecting external or internal devices, including but not limited to keypads, displays, speakers, microphones, joysticks, etc.

[0170] The processor 1000 is responsible for managing the bus architecture and general processing, while the memory 1020 can store the data used by the processor 1000 when performing operations.

[0171] This application also provides a computer program product, including computer instructions, which, when executed by a processor, implement the above-described... Figure 3 The various processes of the method embodiments shown can achieve the same technical effect, and will not be described again here to avoid repetition.

[0172] This invention provides a readable storage medium storing a program or instructions. When executed by a processor, the program or instructions implement the steps in the beam switching time measurement method described above and achieve the same technical effect. To avoid repetition, further details are omitted here. The computer-readable storage medium may be a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk.

[0173] It should be further noted that the terminals described in this specification include, but are not limited to, smartphones, tablets, etc., and many of the functional components described are referred to as modules in order to emphasize the independence of their implementation.

[0174] In this embodiment of the invention, the module can be implemented in software so that it can be executed by various types of processors. For example, an identified executable code module may include one or more physical or logical blocks of computer instructions, which may be constructed as objects, procedures, or functions. Nevertheless, the executable code of the identified module does not need to be physically located together, but may include different instructions stored in different bits, which, when logically combined, constitute the module and achieve the module's intended purpose.

[0175] In practice, an executable code module can be a single instruction or many instructions, and can even be distributed across multiple different code segments, different programs, and across multiple memory devices. Similarly, operational data can be identified within the module and can be implemented in any suitable form and organized within any suitable type of data structure. This operational data can be collected as a single dataset or distributed across different locations (including different storage devices), and can exist, at least in part, solely as electronic signals within the system or network.

[0176] When a module can be implemented using software, considering the current level of hardware technology, modules that can be implemented in software can be implemented using hardware circuits by those skilled in the art to achieve the corresponding functions, without considering cost. These hardware circuits include conventional very-large-scale integrated circuits (VLSI) or gate arrays, as well as existing semiconductors such as logic chips and transistors, or other discrete components. Modules can also be implemented using programmable hardware devices, such as field-programmable gate arrays, programmable array logic, and programmable logic devices.

[0177] The exemplary embodiments described above are with reference to the accompanying drawings. Many different forms and embodiments are feasible without departing from the spirit and teachings of the invention. Therefore, the invention should not be construed as limiting the exemplary embodiments set forth herein. Rather, these exemplary embodiments are provided to make the invention complete and convey the scope of the invention to those skilled in the art. In these drawings, component dimensions and relative dimensions may be exaggerated for clarity. The terminology used herein is for the purpose of describing particular exemplary embodiments only and is not intended to be limiting. As used herein, unless clearly indicated otherwise, the singular forms “a,” “an,” and “the” are intended to include all such forms. It will be further understood that the terms “comprising” and / or “including”, when used in this specification, indicate the presence of the stated features, integers, steps, operations, components, and / or elements, but do not exclude the presence or addition of one or more other features, integers, steps, operations, components, and / or groups thereof. Unless otherwise indicated, when stated, a range of values ​​includes the upper and lower limits of the range and any subranges in between.

[0178] The above description represents the preferred embodiments of the present invention. It should be noted that those skilled in the art can make various improvements and modifications without departing from the principles of the present invention, and these improvements and modifications should also be considered within the scope of protection of the present invention.

Claims

1. A method for measuring beam switching time, characterized in that, include: According to preset rules, symbol-level weights are configured for the transmitted signals of the device under test. The preset rules include: two adjacent symbols in the transmitted signals correspond to different weights. Based on the weight configuration, beam switching simulation tests are performed to obtain the beam switching time.

2. The method according to claim 1, characterized in that, The step of performing beam switching simulation tests based on the weight configuration to obtain the beam switching time includes: When the turntable is started, data is collected from the device under test set on the turntable in different time domains to obtain an initial dataset; Based on the weight configuration and the initial dataset, a signal feature map corresponding to the beam is generated, wherein the signal feature map is used to characterize the temporal and / or spatial characteristics of the beam, the beam is the beam generated by the device under test, and the beam corresponds one-to-one with the weight; The beam switching time is obtained based on the signal feature map.

3. The method according to claim 2, characterized in that, The signal feature map includes: a timing map and a direction map; The step of generating a signal feature map corresponding to the beam based on the weight configuration and the initial dataset includes: For N beam switching combinations, a timing diagram corresponding to each beam switching combination is generated according to the weight configuration and the initial dataset. The beam switching combination includes any two beams among the N beams that can perform beam switching. According to the weight configuration, the initial dataset is divided into N subsets based on N different values ​​of the weight, and N beam patterns are generated for each of the N subsets. Where N is a positive integer greater than or equal to 2.

4. The method according to claim 3, characterized in that, Obtaining the beam switching time based on the signal feature map includes: For each of the aforementioned beam switching combinations, the effectiveness of the radiation patterns of the two beams in the beam switching combination is verified respectively; If the radiation patterns of both beams are determined to be valid, the beam switching time between the two beams is determined according to the timing diagram corresponding to the beam switching combination.

5. The method according to claim 4, characterized in that, For each beam switching combination, the effectiveness verification of the radiation patterns of the two beams in the beam switching combination is performed, including: Obtain the first target pattern corresponding to the first beam, wherein the first beam is any one of the two beams, and the first target pattern is: the pattern of the beam generated by the device under test when the weights of all symbols in the transmitted signal are all first values, and the first value is the weight corresponding to the first beam; Compare the radiation pattern of the first beam with the radiation pattern of the first target; When the difference between the radiation pattern of the first beam and the radiation pattern of the first target is within a preset range, the radiation pattern of the first beam is determined to be valid.

6. A beam switching time measurement device, characterized in that, include: The weight configuration module is used to configure symbol-level weights for the transmitted signals of the device under test according to preset rules, wherein the preset rules include: two adjacent symbols in the transmitted signals correspond to different weights; The simulation test module is used to perform beam switching simulation tests based on the weight configuration to obtain the beam switching time.

7. A device, characterized in that, include: Transceiver and processor; The processor is used for: According to preset rules, symbol-level weights are configured for the transmitted signals of the device under test. The preset rules include: two adjacent symbols in the transmitted signals correspond to different weights. Based on the weight configuration, beam switching simulation tests are performed to obtain the beam switching time.

8. An apparatus comprising: A transceiver, a processor, a memory, and a program or instructions stored in the memory and executable on the processor; characterized in that, when the processor executes the program or instructions, it implements the beam switching time measurement method as described in any one of claims 1-5.

9. A computer program product, characterized in that, It includes computer instructions, which, when executed by a processor, implement the steps of the beam switching time measurement method as described in any one of claims 1-5.

10. A readable storage medium having a program or instructions stored thereon, characterized in that, When the program or instructions are executed by the processor, they implement the steps in the beam switching time measurement method as described in any one of claims 1-5.

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