Method and system for calibrating anti-suspension threshold of electric energy meter, electronic device and storage medium

Abstract

The application discloses a kind of anti-sneak motion threshold calibration method and system of electric energy meter, electronic equipment, storage medium, the zero load test is carried out based on multiple test voltages, obtains the zero load power sample of electric energy meter under multiple test voltages, and the anti-sneak motion threshold of electric energy meter is determined based on the zero load power sample under multiple test voltages, no longer directly determine the anti-sneak motion threshold with single voltage single point value, not only can accurately reflect the zero load power change under different voltages, and effectively reduce the influence of occasional large power peak on anti-sneak motion threshold, to improve the calibration accuracy of anti-sneak motion threshold.

Description

Technical Field

[0001] This invention relates to the field of electricity meter calibration technology, and in particular to a method and system for calibrating the anti-creep threshold of an electricity meter, an electronic device, and a computer-readable storage medium. Background Technology

[0002] When an electronic energy meter has no load on the current line but an operating voltage is applied to the voltage line, it may output a low-power signal near zero due to factors such as input offset of the metering chip, analog front-end noise, power supply ripple, voltage line coupling, quantization error, and external electromagnetic interference. If this low-power signal continues to participate in the accumulation of active energy, it may cause the energy meter to produce incorrect measurements under actual no-load conditions, i.e., creeping. To avoid the above problem, existing energy meters usually set an anti-creeping threshold in the metering chip. When the absolute value of active power is lower than the anti-creeping threshold, the corresponding active energy is not accumulated. When the absolute value of active power reaches or exceeds the anti-creeping threshold, it enters the normal metering logic. If the anti-creeping threshold is too low, zero-load power will be accumulated, resulting in no-load readings. If the anti-creeping threshold is too high, the actual small load will be blocked, reducing the start-up metering capability. Therefore, it is necessary to accurately calibrate the anti-creeping threshold of the energy meter. Existing methods for calibrating anti-creep thresholds mainly include the following two approaches. The first approach involves setting a fixed threshold for electricity meters of the same specification based on human experience. This method is simple to implement, but it cannot reflect the device discreteness, assembly differences, and analog front-end bias differences between different electricity meters. It is greatly affected by human factors and has poor calibration accuracy. The second approach involves conducting zero-load tests under zero input current and single voltage conditions, collecting zero-load power, and adding a safety margin to the maximum, average, or quantile value as the anti-creep threshold. Although this method can reflect the zero-load characteristics of a single electricity meter, occasional high-power spikes may directly raise the final threshold, thus preventing timely metering under real small loads. Moreover, test data at a single voltage point cannot accurately reflect the changes in zero-load power under different operating voltages, and the calibration accuracy remains poor. Summary of the Invention

[0003] This invention provides a method and system for calibrating the anti-creep threshold of an electricity meter, an electronic device, and a computer-readable storage medium, which can improve the calibration accuracy of the anti-creep threshold.

[0004] According to one aspect of the present invention, a method for calibrating the anti-creep threshold of an electricity meter is provided, comprising the following: Maintain a zero input current state at the current input terminal of the energy meter, and apply multiple test voltages to the voltage line respectively; Zero-load tests were conducted on the energy meter based on multiple test voltages to obtain zero-load power samples of the energy meter under multiple test voltages. The anti-creep threshold of the energy meter was determined based on zero-load power samples under multiple test voltages.

[0005] Furthermore, the process of determining the anti-creep threshold of the energy meter based on zero-load power samples under multiple test voltages includes the following: The minimum resolvable power setting zero-value quantization band is based on the energy meter metering chip, and the proportion of the zero-value quantization band of the zero-load power sample under each test voltage is calculated. The samples that exceed the zero-value quantization band in the zero-load power samples under each test voltage are sorted in ascending order of absolute power, and the average zero-load power of the upper tail sample is calculated. Based on the zero-value quantization band ratio and the average zero-load power of the upper tail sample, the anti-creep threshold anchor point under each test voltage is calculated. Obtain the operating voltage of the electricity meter, select the anti-creep threshold anchor points of two test voltages adjacent to the operating voltage, interpolate to obtain the anti-creep threshold anchor point corresponding to the operating voltage, and limit the anti-creep threshold anchor point to obtain the anti-creep threshold under the operating voltage.

[0006] Furthermore, the anti-creep threshold anchor point is calculated for each test voltage based on the following formula: T j = A j δ + (1- A j ) H j ; in, T j Indicates the first j Anti-creep threshold anchor points under test voltage, A j Indicates the first j The proportion of the zero-value quantization band for each test voltage zero-load power sample , n j Indicates the first j Number of zero-load power samples under each test voltage Indicates the first j The number of samples in the zero-load power sample under a test voltage whose absolute power is not greater than the zero-value quantization band. δ Indicates the zero-value quantization band. δ = rP r , r This represents the preset expansion factor. P rThis indicates the minimum resolvable power of the electricity meter's metering chip. H j Indicates the first j The test voltage corresponds to the average zero-load power of the upper and lower samples.

[0007] Furthermore, the process of determining the anti-creep threshold of the energy meter based on zero-load power samples under multiple test voltages includes the following: Multiple candidate reference powers are set within the preset candidate range of the anti-creep threshold; For each candidate reference power, determine the different candidate powers corresponding to the same candidate reference power for different test voltages; Based on the candidate power for each test voltage, calculate the sample support ratio for each test voltage to different candidate reference power. Based on the sample support ratio of all test voltages for the same candidate reference power, the cross-voltage common support degree of each candidate reference power is calculated, and the candidate reference power with the highest cross-voltage common support degree is used as the anti-creep threshold reference. The final anti-creep threshold is determined based on the anti-creep threshold benchmark.

[0008] Furthermore, the sample support ratio for each test voltage to different candidate reference power is calculated based on the following formula: ; in, Indicates the first j Each test voltage versus candidate reference power The proportion of samples supporting the data. Indicates the first j In the zero-load power samples under the test voltage, the absolute power is greater than or equal to the candidate reference power. Corresponding candidate power The number of samples, , Indicates the first j Voltage conversion factor corresponding to each test voltage. n j Indicates the first j Number of zero-load power samples under each test voltage.

[0009] Furthermore, the cross-voltage common support for each candidate reference power is calculated based on the following formula: ; in, Indicates candidate reference power The cross-voltage joint support degree, m Indicates the quantity of test voltage. and Representing candidate reference power The minimum and maximum values ​​of the corresponding sample support ratio.

[0010] Furthermore, after calculating the cross-voltage common support of each candidate reference power, the cross-voltage common support of each candidate reference power is compared with a preset cross-voltage common support threshold. If the cross-voltage common support of a candidate reference power is less than the preset cross-voltage common support threshold, the candidate reference power is eliminated.

[0011] In addition, the present invention also provides an anti-creep threshold calibration system for an electricity meter, comprising: The test voltage setting module is used to maintain a zero input current state at the current input terminal of the energy meter and apply multiple test voltages to the voltage line respectively; The zero-load test data acquisition module is used to conduct zero-load tests on the energy meter based on multiple test voltages to obtain zero-load power samples of the energy meter under multiple test voltages. The anti-creep threshold calibration module is used to determine the anti-creep threshold of the energy meter based on zero-load power samples under multiple test voltages.

[0012] In addition, the present invention also provides an electronic device, including a processor and a memory, wherein the memory stores a computer program, and the processor executes the steps of the method described above by calling the computer program stored in the memory.

[0013] In addition, the present invention also provides a computer-readable storage medium for storing a computer program for calibrating the anti-creep threshold of an electricity meter, wherein the computer program executes the steps of the method described above when running on a computer.

[0014] The present invention has the following beneficial effects: The anti-creep threshold calibration method for electricity meters of the present invention performs zero-load tests based on multiple test voltages to obtain zero-load power samples of the electricity meter under multiple test voltages, and determines the anti-creep threshold of the electricity meter based on the zero-load power samples under multiple test voltages. Instead of directly determining the anti-creep threshold based on a single point value of a single voltage, it can not only accurately reflect the zero-load power changes under different voltages, but also effectively reduce the impact of occasional high-power spikes on the anti-creep threshold, thereby improving the calibration accuracy of the anti-creep threshold.

[0015] In addition, the anti-creep threshold calibration system for the electricity meter of the present invention also has the above-mentioned advantages.

[0016] In addition to the objectives, features, and advantages described above, the present invention has other objectives, features, and advantages. The invention will now be described in further detail with reference to the figures. Attached Figure Description

[0017] The accompanying drawings, which form part of this application, are used to provide a further understanding of the invention. The illustrative embodiments of the invention and their descriptions are used to explain the invention and do not constitute an undue limitation of the invention. In the drawings: Figure 1 This is a flowchart illustrating the anti-creep threshold calibration method for an electricity meter according to a preferred embodiment of this application. Figure 2 yes Figure 1 A schematic diagram of the sub-process of step S3; Figure 3 yes Figure 1 Another sub-process diagram of step S3; Figure 4 This is a schematic diagram of the module structure of an anti-creep threshold calibration system for an electricity meter according to another embodiment of this application. Detailed Implementation

[0018] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. This application will now be described in detail with reference to the accompanying drawings and embodiments.

[0019] Reference Figure 1 A preferred embodiment of this application provides a method for calibrating the anti-creep threshold of an electricity meter, including the following: Step S1: Maintain a zero input current state at the current input terminal of the energy meter, and apply multiple test voltages to the voltage line respectively; Step S2: Conduct zero-load tests on the energy meter based on multiple test voltages to obtain zero-load power samples of the energy meter under multiple test voltages; Step S3: Determine the anti-creep threshold of the energy meter based on zero-load power samples under multiple test voltages.

[0020] It is understood that the anti-creep threshold calibration method of the electricity meter in this embodiment is based on zero-load tests conducted under multiple test voltages to obtain zero-load power samples of the electricity meter under multiple test voltages. The anti-creep threshold of the electricity meter is determined based on the zero-load power samples under multiple test voltages, instead of directly determining the anti-creep threshold based on a single point value (maximum value, average value, or quantile value) of a single voltage. This method can not only accurately reflect the zero-load power changes under different voltages, but also effectively reduce the impact of occasional high-power spikes on the anti-creep threshold, thereby improving the calibration accuracy of the anti-creep threshold.

[0021] In step S1, after the energy meter completes routine metering calibration, the current input terminal of the energy meter is kept at zero, and multiple test voltages are applied to the voltage line respectively. , j=1,2,3,... m , m The number of test voltages is specified. A preferred embodiment of the present invention uses three test voltages as an example for illustrative purposes, but this is not a specific limitation. In other embodiments, two, four, or even more test voltages can be selected. For example, the three test voltages can each be set as a reference voltage U. p 75%~85%, 95%~105%, and 115%~125% are preferably set as reference voltage U. p 80%, 100%, 120%, for example, when the reference voltage U p When the voltage is 220V, the three test voltages are 176V, 220V, and 264V, respectively.

[0022] In addition, in step S2, a zero-load test is performed at each test voltage, and a zero-load active power sample is obtained at each test voltage with a preset sampling period, thereby obtaining multiple zero-load power samples at test voltages. For example, suppose the first... j The data collected at the test voltage was the first... k The zero-load power sample is denoted as: , k =1,2,3,…, n j , n j Indicates the first j The number of zero-load power samples under each test voltage. Zero-load power refers to active power. Furthermore, since zero-load active power may fluctuate between positive and negative values, this invention uses the absolute value of the power for subsequent calculations.

[0023] Optionally, before collecting zero-load power samples, the energy meter should be brought to thermal equilibrium under the corresponding test voltage and zero input current conditions to ensure that the energy meter is in a stable state, effectively reducing the impact of the energy meter's sampling error.

[0024] Optionally, after collecting zero-load power samples, it is also necessary to determine the validity of the samples. The validity conditions of the samples include that the effective value of the current is not greater than the preset zero-current judgment upper limit, the metering chip does not have an overflow flag, the actual voltage is within the allowable error range of the target test voltage, there is no communication interruption during the sample collection process, the number of valid samples reaches the preset minimum number, and the sample loss rate does not exceed the preset loss rate. If any of the above conditions are not met, the power sampling is judged to be unqualified, the sample cannot be used, and the zero-load test must be performed again to collect the sample again.

[0025] Among them, such as Figure 2As shown, in step S3, the process of determining the anti-creep threshold of the energy meter based on zero-load power samples under multiple test voltages includes the following: Step S31a: Set the zero-value quantization band based on the minimum resolvable power of the energy meter chip, and calculate the proportion of the zero-value quantization band for each zero-load power sample under each test voltage. Step S32a: Sort the samples that exceed the zero-value quantization band in the zero-load power samples under each test voltage according to the absolute power from smallest to largest, and calculate the average zero-load power of the upper tail sample. Step S33a: Based on the zero-value quantization band ratio and the average zero-load power of the upper tail sample, calculate the anti-creep threshold anchor point for each test voltage; Step S34a: Obtain the operating voltage of the electricity meter, select the anti-creep threshold anchor points of two test voltages adjacent to the operating voltage and interpolate them to obtain the anti-creep threshold anchor point corresponding to the operating voltage, and limit the anti-creep threshold anchor point to obtain the anti-creep threshold under the operating voltage.

[0026] Specifically, assuming the three test voltages are U1, U2, and U3, and U1 < U2 < U3, the zero-load power sample for each test voltage has been collected in step S2. Assuming the... j The data collected at the test voltage was the first... k The zero-load power sample is denoted as At this point, the quantization band of the minimum resolvable power setting zero value based on the electricity meter's metering chip can be expressed as: δ = rP r , δ Indicates the zero-value quantization band. r This represents the preset expansion factor, with a value range of (1, 3). P r The minimum resolvable power of the electricity meter's metering chip can be used to calculate the zero-value quantization band ratio of the zero-load power sample under each test voltage. The calculation formula is as follows: , A j Indicates the first j The proportion of the zero-value quantization band for each test voltage zero-load power sample n j Indicates the first j Number of zero-load power samples under each test voltage Indicates the first j The number of samples in the zero-load power sample under the test voltage whose absolute power is not greater than the zero-value quantization band, i.e. To satisfy | p j,k |≤ δThe number of samples and the proportion of zero-value quantization bands are not the theoretical "probability that the power is exactly equal to zero", but the actual measurable "probability that the power falls within the resolution band near zero of the chip".

[0027] Then, the samples exceeding the zero-value quantization band in the zero-load power samples at each test voltage (i.e., | p j,k |> δ The samples are sorted in ascending order of absolute power, and the upper tail proportion is 1. α Take a value not less than (1- α The quantile values ​​are used as the upper tail sample, and the average zero-load power of the upper tail sample is calculated. H j .in, α The preferred value is 0.1, which means only the largest 10% of non-zero samples are counted.

[0028] Next, the anti-creep threshold anchor point is calculated for each test voltage based on the following formula: T j = A j δ + (1- A j ) H j ; in, T j Indicates the first j Anti-creep threshold anchor points under test voltage, H j Indicates the first j Each test voltage corresponds to the average zero-load power of the upper and lower samples. This is understandable. A j δ This represents the basic threshold portion retained when there is a significant amount of power near zero, (1- A j ) H j This represents the increased risk threshold when non-zero high power occurs. This calculation does not use the normal distribution assumption, nor does it directly use the confidence interval as the threshold.

[0029] Then, the operating voltage U of the electricity meter is obtained. The anti-creep threshold anchor points of two test voltages adjacent to the operating voltage are selected and interpolated to obtain the anti-creep threshold anchor point corresponding to the operating voltage. For example, when U is between U1 and U2, the anti-creep threshold anchor point corresponding to the operating voltage is obtained based on the following formula: T (U) = T 1+ ( T2 - T 1)(U - U1) / (U2 - U1), T 1. T 2 represents the anti-creep threshold anchor points corresponding to test voltages U1 and U2, respectively; when U is between U2 and U3, the anti-creep threshold anchor point corresponding to the operating voltage is obtained by interpolation based on the following formula: T (U) = T 2+ ( T 3 - T 2)(U - U2) / (U3 - U2), T 3 indicates the anti-creep threshold anchor point corresponding to the test voltage U3. Finally, for T (U) Limiting is applied to obtain the anti-creep threshold under the operating voltage, where the limiting can be expressed as: T final = min( T max , max( T min , T (U))), T final This indicates the anti-creep threshold under operating voltage. T min This represents the lower limit of the anti-creep threshold, determined by quantization resolution and zero-load verification. T max This indicates the upper limit of the anti-creep threshold, which is determined by the specified starting power or product technical conditions.

[0030] It is understood that this invention forms multiple threshold anchor points by statistically analyzing the proportion of power near zero and the upper tail mean of non-zero power at multiple test voltage points. During operation, interpolation is performed between adjacent threshold anchor points according to the voltage range. When the proportion near zero is high, the impact of a single large value on the threshold is reduced. When the frequency or amplitude of non-zero large values ​​increases, the threshold anchor point is raised accordingly. This allows the anti-creep threshold to simultaneously reflect the frequency of noise near zero and the magnitude of large zero-load power, avoiding the direct determination of the anti-creep threshold by occasional large values, and adapting to different operating voltages.

[0031] Furthermore, while the aforementioned interpolation method can reflect the impact of voltage changes on zero-load power to some extent, the data for each voltage point is processed independently. For example, the anti-creep threshold anchor point for each voltage point is calculated separately. When an occasional disturbance occurs at a voltage point, the abnormal data at that voltage point may still form a higher threshold anchor point, further affecting the anti-creep threshold in adjacent operating voltage ranges. If a higher power is supported only by a small number of occasional samples under one test voltage, and lacks corresponding sample support under other test voltages, then this higher power should not be directly used as the basis for the anti-creep threshold. If this higher power is supported by a certain proportion of zero-load samples under multiple test voltages, and the support proportion of each test voltage is relatively balanced, then this higher power better reflects the stable zero-load characteristics of the energy meter. Therefore, as a preferred method, such as... Figure 3 As shown, in step S3, the process of determining the anti-creep threshold of the energy meter based on zero-load power samples under multiple test voltages includes the following: Step S31b: Set multiple candidate reference powers within the preset candidate range of the anti-creep threshold; Step S32b: For each candidate reference power, determine the different candidate powers corresponding to the same candidate reference power for different test voltages; Step S33b: Based on the candidate power of each test voltage, calculate the sample support ratio of each test voltage for different candidate reference powers; Step S34b: Based on the sample support ratio of all test voltages for the same candidate reference power, calculate the cross-voltage common support degree of each candidate reference power, and take the candidate reference power with the highest cross-voltage common support degree as the anti-creep threshold reference. Step S35b: Determine the final anti-creep threshold based on the anti-creep threshold benchmark.

[0032] Specifically, multiple candidate reference power values ​​are set within the preset candidate range of the anti-creep threshold. , q =1,2,3,…, Q , Q This indicates the number of candidate reference powers. These candidate reference powers can be generated by incrementing in fixed steps, for example, , This indicates the starting value of the candidate reference power. This indicates an incremental step size, for example, setting the power of multiple candidate references sequentially to... Of course, as an alternative, the candidate reference power can also be selected from the actual sample values ​​at each test voltage.

[0033] Since the zero-load power level varies under different test voltages, for the same candidate reference power, it is necessary to determine the different candidate powers corresponding to the same candidate reference power under different test voltages. This is to facilitate the accurate calculation of the sample support ratio of each test voltage for different candidate reference powers. Specifically, the sample support ratio of each test voltage for different candidate reference powers is calculated based on the following formula: , Indicates the first j Voltage conversion factor corresponding to each test voltage. Indicates the first q One candidate reference power, Indicates the first j Each test voltage corresponds to a candidate reference power. The candidate power and voltage conversion factor are preset values, which can be determined based on the ratio of test voltage to reference voltage, the ratio of the square of test voltage to the square of reference voltage, historical test data of the same model sample meter, the actual zero-load response curve of the metering chip and analog front end, or preset according to the product technical conditions.

[0034] Then, based on the candidate power for each test voltage The sample support ratio for each test voltage to different candidate reference power is calculated based on the following formula: ; in, Indicates the first j Each test voltage versus candidate reference power The proportion of samples supporting the data. , Indicates the first j In the zero-load power samples under the test voltage, the absolute power is greater than or equal to the candidate reference power. Corresponding candidate power The number of samples that satisfy the condition The number of samples, Indicates the first j The zero-load power sample under the test voltage is the first k A zero-load power value, n j Indicates the first j The number of zero-load power samples under each test voltage. It can be seen that... The larger the value, the higher the value. j The more zero-load samples at a given test voltage can reach or exceed the corresponding candidate power. For example, the first j There are 1000 valid samples under each test voltage, of which 400 samples reach or exceed the corresponding candidate power. That is, the test voltage supports 40% of the candidate reference power.

[0035] Next, for the same candidate reference power, by combining the sample support ratios under all test voltages, the cross-voltage common support degree of each candidate reference power can be calculated. Specifically, the cross-voltage common support degree of each candidate reference power is calculated based on the following formula: ; in, Indicates candidate reference power The cross-voltage joint support degree, m Indicates the quantity of test voltage. and Representing candidate reference power The minimum and maximum values ​​of the corresponding sample support ratio, i.e. , The above formula consists of two parts. The first part is the product root of multiple sample support ratios, used to represent the power of multiple test voltages relative to the candidate reference power. The overall common support degree is determined by the product relationship between the support ratios of each sample. When the support ratio of any test voltage is small, the product will decrease significantly. When the support ratio of any test voltage is zero, this part will also be zero. Therefore, a small number of high-power samples appearing under a single test voltage cannot form a high cross-voltage common support degree on their own. The second part is the ratio of the minimum support ratio to the maximum support ratio, which is used to represent the support balance among multiple test voltages. When the support ratios of multiple test voltages are relatively close, this ratio is close to 1. When the support ratio of a certain test voltage is significantly higher than that of other test voltages, this ratio will decrease significantly. By multiplying the overall common support degree with the support balance degree, the following two situations can be suppressed simultaneously: 1) Only one or a few test voltages support higher candidate power; 2) The support ratios of each test voltage are seriously unbalanced. This invention defines the calculation result of the product of the two as the cross-voltage common support degree of the candidate reference power. The higher the cross-voltage common support degree of a candidate reference power, the greater its probability of serving as the anti-creep threshold.

[0036] Optionally, after calculating the cross-voltage common support for each candidate reference power, the cross-voltage common support for each candidate reference power is also compared with a preset cross-voltage common support threshold. G A comparison is made between 0 and 1. If the cross-voltage common support of a candidate reference power is less than the preset cross-voltage common support threshold, then the candidate reference power is removed, i.e., it is determined whether the following condition is met: If this condition is met, it indicates that the candidate reference power is... Multiple test voltages were obtained for cross-voltage common support; if this is not met, it indicates that the candidate reference power has not obtained sufficient cross-voltage common support. G 0 can be determined based on the sample support baseline ratio and the baseline ratio between the minimum and maximum support ratios. These two baseline ratios are set according to actual needs; for example, the sample support baseline ratio for each test voltage can be set to 40%, and the minimum... To occupy the largest At least 60%, then G 0 = 0.4 × 0.6 = 0.24.

[0037] Among all candidate reference powers that meet the criteria for cross-voltage common support, the candidate reference power with the largest cross-voltage common support is selected as the anti-creep threshold reference, i.e. , This represents the anti-creep threshold benchmark, which characterizes the highest zero-load power level supported by multiple test voltages. Furthermore, if the preceding cross-voltage common support determination criteria were not performed, i.e., no judgment was made... and The relative magnitudes are then used to directly select the candidate reference power with the largest cross-voltage common support as the anti-creep threshold reference, i.e. .

[0038] Finally, based on the anti-creep threshold benchmark By adding a safety margin and limiting the amplitude based on the above, the final anti-creep threshold can be obtained. For example, the anti-creep threshold can be calculated first based on the following formula. , The minimum power increment can be represented by the minimum power difference between two adjacent writable threshold codes in the anti-creep threshold register of the metering chip, or by the minimum threshold adjustment amount predefined by the calibration system. By adding a minimum power increment to the anti-creep threshold benchmark, the anti-creep threshold can be made slightly higher than the determined benchmark, while avoiding excessively high anti-creep thresholds due to large proportional margins. Then, to prevent the anti-creep threshold from being too low to effectively suppress creep, or too high to affect the metering of actual small load starts, upper and lower limits are constrained for the anti-creep threshold. The final anti-creep threshold can be expressed as: , T min This represents the lower limit of the anti-creep threshold, determined by quantization resolution and zero-load verification. T max The upper limit of the anti-creep threshold is determined by the specified starting power or product technical specifications. Of course, in other embodiments of the present invention, the anti-creep threshold benchmark can also be directly used as the anti-creep threshold for limiting the amplitude, without increasing the safety margin.

[0039] It is understood that this invention no longer processes data at a single voltage point separately, but proposes a technical indicator of cross-voltage common support. Only candidate reference power with sufficient cross-voltage common support can be used as the threshold basis. Even if the sample support ratio of a certain candidate reference power is high under a certain test voltage, as long as the sample support ratio of other test voltages is low or the support ratio is seriously unbalanced, the cross-voltage common support ratio of the candidate reference power will still be suppressed. This ensures that occasional high-power samples occurring only under a single test voltage cannot raise the final anti-creep threshold on their own, nor will it affect the anti-creep threshold in adjacent operating voltage ranges. It also eliminates the need to pre-determine which samples are outliers, reducing the dependence of outlier identification rules on specific noise distributions. It can determine the anti-creep threshold benchmark based on the actual zero-load samples of a single energy meter, thereby adapting to the device discreteness and analog front-end differences between different energy meters.

[0040] In addition, after calculating the final anti-creep threshold, it is converted into a threshold code in the format specified by the metering chip and written to the anti-creep threshold register of the metering chip. After writing, the anti-creep threshold register is read and the read value is compared with the written value. When the read value and the written value are consistent, the anti-creep threshold calibration is completed. When the read value and the written value are inconsistent, the calibration error information is rewritten or output.

[0041] In addition, such as Figure 4 As shown, another embodiment of the present invention also provides a creep-proof threshold calibration system for an electricity meter, preferably employing the creep-proof threshold calibration method for an electricity meter as described above, comprising: The test voltage setting module is used to maintain a zero input current state at the current input terminal of the energy meter and apply multiple test voltages to the voltage line respectively; The zero-load test data acquisition module is used to conduct zero-load tests on the energy meter based on multiple test voltages to obtain zero-load power samples of the energy meter under multiple test voltages. The anti-creep threshold calibration module is used to determine the anti-creep threshold of the energy meter based on zero-load power samples under multiple test voltages.

[0042] It is understood that the anti-creep threshold calibration system for the electricity meter in this embodiment conducts zero-load tests based on multiple test voltages, obtains zero-load power samples of the electricity meter under multiple test voltages, and determines the anti-creep threshold of the electricity meter based on the zero-load power samples under multiple test voltages. Instead of directly determining the anti-creep threshold based on a single point value (maximum value, average value, or quantile value) of a single voltage, it can not only accurately reflect the zero-load power changes under different voltages, but also effectively reduce the impact of occasional high-power spikes on the anti-creep threshold, thereby improving the calibration accuracy of the anti-creep threshold.

[0043] In addition, another embodiment of the present invention provides an electronic device including a processor and a memory, wherein the memory stores a computer program, and the processor executes the steps of the method described above by calling the computer program stored in the memory.

[0044] In addition, another embodiment of the present invention provides a computer-readable storage medium for storing a computer program for calibrating the anti-creep threshold of an electricity meter, wherein the computer program executes the steps of the method described above when running on a computer.

[0045] Common computer-readable storage media include: floppy disks, flexible disks, hard disks, magnetic tapes, any other magnetic media, CD-ROMs, any other optical media, punch cards, paper tape, any other physical media with perforated patterns, random access memory (RAM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), flash erasable programmable read-only memory (FLASH-EPROM), any other memory chips or cartridges, or any other media readable by a computer. Instructions may further be transmitted or received by a transmission medium. The term transmission medium can include any tangible or intangible medium used to store, encode, or carry instructions for execution by a machine, and includes digital or analog carrier communication signals or intangible media that facilitate communication of such instructions. Transmission media include coaxial cables, copper wires, and optical fibers, which contain conductors for transmitting a bus of computer data signals.

[0046] Those skilled in the art will understand that embodiments of this application can be provided as methods, systems, or computer program products. Therefore, this application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this application can take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code. The solutions in the embodiments of this application can be implemented in various computer languages, such as the object-oriented programming language Java and the interpreted scripting language JavaScript.

[0047] This application is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this application. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart... Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0048] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0049] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0050] Although preferred embodiments of this application have been described, those skilled in the art, upon learning the basic inventive concept, can make other changes and modifications to these embodiments. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments as well as all changes and modifications falling within the scope of this application.

[0051] Obviously, those skilled in the art can make various modifications and variations to this application without departing from the spirit and scope of this application. Therefore, if such modifications and variations fall within the scope of the claims of this application and their equivalents, this application also intends to include such modifications and variations.

[0052] The above description is merely a preferred embodiment of the present invention and is not intended to limit the invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A method for calibrating the anti-creep threshold of an electricity meter, characterized in that, Includes the following: Maintain a zero input current state at the current input terminal of the energy meter, and apply multiple test voltages to the voltage line respectively; Zero-load tests were conducted on the energy meter based on multiple test voltages to obtain zero-load power samples of the energy meter under multiple test voltages. The anti-creep threshold of the energy meter was determined based on zero-load power samples under multiple test voltages.

2. The method for calibrating the anti-creep threshold of an electricity meter as described in claim 1, characterized in that, The process of determining the anti-creep threshold of the energy meter based on zero-load power samples under multiple test voltages includes the following: The minimum resolvable power setting zero-value quantization band is based on the energy meter metering chip, and the proportion of the zero-value quantization band of the zero-load power sample under each test voltage is calculated. The samples that exceed the zero-value quantization band in the zero-load power samples under each test voltage are sorted in ascending order of absolute power, and the average zero-load power of the upper tail sample is calculated. Based on the zero-value quantization band ratio and the average zero-load power of the upper tail sample, the anti-creep threshold anchor point under each test voltage is calculated. Obtain the operating voltage of the electricity meter, select the anti-creep threshold anchor points of two test voltages adjacent to the operating voltage, interpolate to obtain the anti-creep threshold anchor point corresponding to the operating voltage, and limit the anti-creep threshold anchor point to obtain the anti-creep threshold under the operating voltage.

3. The method for calibrating the anti-creep threshold of an electricity meter as described in claim 2, characterized in that, The anti-creep threshold anchor point for each test voltage is calculated based on the following formula: T j = A j δ + (1- A j ) H j ； in, T j Indicates the first j Anti-creep threshold anchor points under test voltage, A j Indicates the first j The proportion of the zero-value quantization band for each test voltage zero-load power sample , n j Indicates the first j Number of zero-load power samples under each test voltage Indicates the first j The number of samples in the zero-load power sample under a test voltage whose absolute power is not greater than the zero-value quantization band. δ Indicates the zero-value quantization band. δ = rP r , r This represents the preset expansion factor. P r This indicates the minimum resolvable power of the electricity meter's metering chip. H j Indicates the first j The test voltage corresponds to the average zero-load power of the upper and lower samples.

4. The method for calibrating the anti-creep threshold of an electricity meter as described in claim 1, characterized in that, The process of determining the anti-creep threshold of the energy meter based on zero-load power samples under multiple test voltages includes the following: Multiple candidate reference powers are set within the preset candidate range of the anti-creep threshold; For each candidate reference power, determine the different candidate powers corresponding to the same candidate reference power for different test voltages; Based on the candidate power for each test voltage, calculate the sample support ratio for each test voltage to different candidate reference power. Based on the sample support ratio of all test voltages for the same candidate reference power, the cross-voltage common support degree of each candidate reference power is calculated, and the candidate reference power with the highest cross-voltage common support degree is used as the anti-creep threshold reference. The final anti-creep threshold is determined based on the anti-creep threshold benchmark.

5. The method for calibrating the anti-creep threshold of an electricity meter as described in claim 4, characterized in that, The sample support ratio for each test voltage for different candidate reference powers is calculated based on the following formula: ； in, Indicates the first j Each test voltage versus candidate reference power The proportion of samples supporting the data. Indicates the first j In the zero-load power samples under the test voltage, the absolute power is greater than or equal to the candidate reference power. Corresponding candidate power The number of samples, , Indicates the first j Voltage conversion factor corresponding to each test voltage. n j Indicates the first j Number of zero-load power samples under each test voltage.

6. The method for calibrating the anti-creep threshold of an electricity meter as described in claim 5, characterized in that, The cross-voltage common support for each candidate reference power is calculated based on the following formula: ； in, Indicates candidate reference power The cross-voltage common support degree, m Indicates the quantity of test voltage. and Representing candidate reference power The minimum and maximum values ​​of the corresponding sample support ratio.

7. The method for calibrating the anti-creep threshold of an electricity meter as described in claim 4, characterized in that, After calculating the cross-voltage common support for each candidate reference power, the cross-voltage common support for each candidate reference power is compared with a preset cross-voltage common support threshold. If the cross-voltage common support for a candidate reference power is less than the preset cross-voltage common support threshold, the candidate reference power is removed.

8. A creepage prevention threshold calibration system for an electricity meter, characterized in that, include: The test voltage setting module is used to maintain a zero input current state at the current input terminal of the energy meter and apply multiple test voltages to the voltage line respectively; The zero-load test data acquisition module is used to conduct zero-load tests on the energy meter based on multiple test voltages to obtain zero-load power samples of the energy meter under multiple test voltages. The anti-creep threshold calibration module is used to determine the anti-creep threshold of the energy meter based on zero-load power samples under multiple test voltages.

9. An electronic device, characterized in that, The method includes a processor and a memory, wherein the memory stores a computer program, and the processor executes the steps of the method as described in any one of claims 1 to 7 by calling the computer program stored in the memory.

10. A computer-readable storage medium for storing a computer program for calibrating the anti-creep threshold of an electricity meter, characterized in that, The computer program, when run on a computer, performs the steps of the method as described in any one of claims 1 to 7.

Images