A logic control unit automatic test bench and test method

Abstract

The embodiment of the present application relates to the field of rail transit, and discloses a kind of logic control unit automation test board and test method, the logic control unit automation test board includes: industrial computer, for obtaining and issuing configuration information, the configuration information includes the IO connector configuration information and test item configuration information of the logic control unit to be measured, and the test item includes at least one of insulation voltage resistance test, function test, performance test and communication test;Test system, for testing the logic control unit to be measured according to the configuration information;External connector, for connecting the test system and the logic control unit to be measured.Solve the problem of quickly batch detecting logic control unit function / performance, shorten the test time effect.

Description

Technical Field

[0001] This invention relates to the field of rail transit, and in particular to an automated test bench and test method for a logic control unit. Background Technology

[0002] In rail transit vehicles, semiconductor integrated circuits have been widely used to replace traditional relays for vehicle electrical logic control. These products are collectively referred to as Logic Control Units (LCUs). Compared with traditional relay solutions, LCUs have advantages such as smaller size, higher reliability / availability, maintainability, and strong scalability. However, the internal hardware circuits and control logic designs of LCUs are complex, and the actual operating performance of products from different manufacturers varies, resulting in significant on-site quality pressure. Summary of the Invention

[0003] The purpose of this invention is to provide at least one automated test bench and test method for logic control units, which can at least solve the problem of rapidly batch testing the functions / performance of logic control units and achieve the effect of shortening the test time.

[0004] To address the aforementioned technical problems, embodiments of the present invention provide an automated test bench for logic control units, comprising:

[0005] An industrial control computer is used to acquire and send configuration information, which includes I / O connector configuration information and test item configuration information of the logic control unit under test. The test items include at least one of insulation withstand voltage test, functional test, performance test and communication test.

[0006] A test-testing system is used to test the logic control unit under test according to the configuration information.

[0007] An external connector is used to connect the test system and the logic control unit under test.

[0008] In some alternative embodiments, the accompanying testing system includes:

[0009] Multiple relay matrices are connected one-to-one with the external connectors to form multiple test channels, and each test channel is connected to an IO connector of the logic control unit under test.

[0010] The control host is used to control the insulation withstand voltage tester and the relay matrix board to perform insulation withstand voltage tests, functional tests, and performance tests; the control host interacts with the industrial computer and the logic control unit under test to perform communication tests.

[0011] In some optional embodiments, the CAN bus of the control host is connected to each relay matrix; the Ethernet interface of the control host is connected to the industrial computer and the logic control unit under test; the MVB interface of the control host is connected to the logic control unit under test; and the bus interface of the control host is connected to the insulation withstand voltage tester.

[0012] In some optional embodiments, the automated test bench for the logic control unit further includes:

[0013] The power supply system includes two adjustable power supplies connected to the bus interface of the control host. The two adjustable power supplies simultaneously power the power supply and I / O connector of the logic control unit under test.

[0014] In some alternative embodiments, the relay matrix includes:

[0015] The first relay group is used for insulation withstand voltage testing. Each relay in the first relay group is connected to an IO interface in the IO connector of the logic control unit under test to access the corresponding line of the logic control unit under test.

[0016] A second relay group is used for functional testing and performance testing. The second relay group includes multiple third relay groups, and each third relay group is connected to a relay in the corresponding first relay group.

[0017] Embodiments of the present invention also provide an automated testing method for logic control units, implemented based on the aforementioned automated testing bench for logic control units. The automated testing method for logic control units includes:

[0018] The industrial control computer acquires and sends out configuration information, which includes I / O connector configuration information and test item configuration information of the logic control unit under test. The test items include at least one of insulation withstand voltage test, functional test, performance test and communication test.

[0019] The testing system performs tests on the logic control unit under test based on the configuration information.

[0020] In some optional embodiments, before the test system performs tests on the logic control unit under test according to the configuration information, the method further includes:

[0021] The control host sends status data for the test steps used to complete the test items to the relay matrix board in a polling manner.

[0022] If the relay matrix board is in a state that meets the requirements for being put into use, determine whether the relay matrix board meets the test conditions.

[0023] The test configuration is complete once the relay matrix board meets the test conditions.

[0024] In some optional embodiments, the test system performs tests on the logic control unit under test according to the configuration information, including:

[0025] Control host protocol MVB / Ethernet communication test protocol;

[0026] The logic control unit under test performs a communication test according to the MVB / Ethernet communication test protocol and sends the IO data stored inside it to the control host to determine whether the data recorded by the control host is correct.

[0027] In some optional embodiments, the test system performs tests on the logic control unit under test according to the configuration information, including:

[0028] All lines of the logic control unit under test are short-circuited by the relay contacts in the first relay group, while all relays in the second relay group are disconnected to perform an insulation withstand voltage test.

[0029] In some optional embodiments, the test system performs tests on the logic control unit under test according to the configuration information, including:

[0030] By disconnecting all the circuits short-circuited by the relay contacts in the first relay group, and selectively activating the relays in the second relay group, functional or performance testing can be performed.

[0031] The industrial control computer of this invention acquires and sends the I / O connector configuration information and test item configuration information of the logic control unit under test to the test system. The test system then performs insulation withstand voltage tests, functional tests, performance tests, and communication tests on the logic control unit under test based on the configuration information, enabling rapid batch testing of the logic control unit's functionality / performance. This can meet the functional and performance testing requirements of rail transit logic control units (LCUs) and similar products, reducing working time from 2-3 hours to 30 minutes, reducing labor costs, and identifying product quality problems. Attached Figure Description

[0032] One or more embodiments are illustrated by way of example with reference to the accompanying drawings, and these illustrative descriptions do not constitute a limitation on the embodiments.

[0033] Figure 1 This is a schematic diagram of an automated test bench for logic control units provided in an embodiment of the present invention;

[0034] Figure 2 This is a schematic diagram of the topology of the automated test bench for logic control units provided in an embodiment of the present invention;

[0035] Figure 3 This is a schematic diagram of the network topology of the accompanying testing system provided in an embodiment of the present invention;

[0036] Figure 4 This is a schematic diagram of the execution logic for the control host to handshake with all relay matrices according to an embodiment of the present invention;

[0037] Figure 5 This is a schematic diagram of a relay matrix provided in an embodiment of the present invention. Detailed Implementation

[0038] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the various embodiments of the present invention will be described in detail below with reference to the accompanying drawings. However, those skilled in the art will understand that many technical details are presented in the embodiments of the present invention to facilitate a better understanding of the invention. However, the technical solutions claimed in the present invention can be implemented even without these technical details and various variations and modifications based on the following embodiments. The division of the following embodiments is for ease of description and should not constitute any limitation on the specific implementation of the present invention. The various embodiments can be combined with and referenced by each other without contradiction.

[0039] To facilitate understanding of the embodiments of the present invention, relevant content regarding the logic control unit will be introduced first.

[0040] The Logic Control Unit (LCU) of rail transit replaces the traditional contact-based control circuits of trains with contactless circuits such as optocouplers and field-effect transistors to realize the logical control functions of subsystems such as traction control, braking control, door control, and auxiliary power supply. The LCU mainly consists of a main control board, power supply board, digital input / output board, analog input / output board, and communication board. The LCU adopts a hot-standby redundancy architecture to ensure that any single point of failure does not affect vehicle operation, guaranteeing system availability and reliability, and meeting SIL2 safety level requirements.

[0041] To address the issue of rapidly testing the functionality / performance of logic control units in batches, this invention proposes an automated test bench and testing method for logic control units. The implementation details of the embodiments of this invention are described below. The following content is only for the convenience of understanding and is not necessary for implementing this solution.

[0042] Example 1

[0043] This embodiment provides an automated test bench for logic control units, such as... Figure 1 As shown, it includes:

[0044] The industrial computer 101 is used to acquire and send configuration information, including the configuration information of the IO connector of the logic control unit under test and the configuration information of the test items, including at least one of insulation withstand voltage test, functional test, performance test and communication test.

[0045] The test system 102 is used to test the logic control unit under test according to the configuration information.

[0046] External connector 103 is used to connect the test system and the logic control unit under test 104.

[0047] In this embodiment, the industrial control computer 101 acquires and sends the IO connector configuration information and test item configuration information of the logic control unit under test to the test system 102. The test system 102 performs insulation withstand voltage test, functional test, performance test and communication test on the logic control unit under test according to the configuration information, so as to quickly and batch test the function / performance of the logic control unit.

[0048] In practice, the automated test bench for logic control units mainly tests the system's basic functions such as I / O, communication, storage, and fault protection, as well as its basic performance such as insulation withstand voltage.

[0049] In addition to considering the general functions of the logic control unit, the following issues also need to be considered for rail transit applications:

[0050] 1. Compared to relays, does the input / output response time of the logic control unit meet the requirements of rail transit applications?

[0051] 2. As a subsystem of train control, does the logic control unit's startup time meet the requirements of rail transit applications?

[0052] 3. As the electrical logic control execution unit of the train, does the load driving capability of the logic control unit meet the load application requirements of existing vehicles?

[0053] 4. When the logic control unit, as a redundant system, performs passive / active switching, will it affect the normal operation of the vehicle's load?

[0054] In a specific example, the test items that the logic control unit needs to include for all the above operating conditions are shown in Table 1.

[0055] Table 1 Test Items for Automated Test Bench

[0056]

[0057]

[0058] In the table above, the input / output function test and power fluctuation test are used to test the IO function; the data logging function test is used to test the storage function; the power consumption test and inrush current test are used to test the load driving capability; the power supply redundancy test is used to test whether passive / active switching will affect the normal operation of the vehicle load; and the Ethernet test and MVB communication test are used to test the communication function.

[0059] The industrial computer 101 is used as a host computer. According to the 12 test items provided in Table 1, the logic control unit automated test bench needs to operate the host computer with a display / operating system to realize the automated testing of all functions.

[0060] like Figure 2 The schematic diagram of the automated test bench topology for the logic control unit (LCU) shown includes a power supply system connected to the auxiliary test system and the host computer for power supply. The auxiliary test system communicates with the host computer and connects to the LCU under test (DUT) via an external connector to power and test the DUT.

[0061] In some specific implementations, the main functions of each subsystem of the logic control unit automated test bench are shown in Table 2. Since the LCU's IO board can be freely configured, the logic control unit automated test bench can distribute the LCU's IO board configuration and test item configuration by distributing configuration files, supporting multiple tests or single tests on the LCU.

[0062] Table 2 Functional Requirements of the Test Stand

[0063]

[0064] Before testing, all electrical interfaces of the LCU must be connected to the external connectors of the test bench, and a grounding wire must be installed to ensure that the test fixtures are installed in place. According to the requirements for LCU connectors in QCRRC J 1144—2021 "Programmable Logic Control Unit (LCU) for Urban Rail Transit Vehicles" and BZDT1111-FA-G000-022-Series of Simplified Scheme for LCU in the Development and Testing Project of Metro Trains under Chinese Standards, all IO connectors use 48-pin Euler connectors (with cold-pressed pins), Ethernet uses M12 D-type coded connectors, and MVB uses 9-pin D-SUB connectors. The external connector types of the test bench should be consistent with those of the LCU connectors to facilitate PIN-to-PIN testing.

[0065] In some specific implementations, the testing system of this embodiment includes:

[0066] Multiple relay matrices are connected one-to-one with external connectors to form multiple test channels. Each test channel is connected to an IO connector of the logic control unit under test. That is, the LCU includes multiple IO connectors, each connector contains multiple IO interfaces, and each IO connector corresponds to a relay matrix board.

[0067] The control host is used to control the insulation withstand voltage tester and the relay matrix board to perform insulation withstand voltage tests, functional tests, and performance tests; the control host interacts with the industrial computer and the logic control unit under test to perform communication tests.

[0068] The test support system 102 incorporates a control host as the core controller of the test bench. This host controls the insulation withstand voltage tester, adjustable power supply, and relay matrix board. It also features a communication interface to interact with the industrial computer and the logic control unit under test (LCU), enabling test configuration distribution and communication testing. Based on the simplified urban rail LCU design, the LCU can adopt a 3U or 6U standard chassis structure, with a maximum chassis width of 84R. According to the largest chassis configuration (6U, 84R), the test scheme must meet the testing requirements of at least 512 digital channels, 16 analog channels, and 2 communication channels.

[0069] In a specific example, based on the test items, the maximum number of LCU channels, and other characteristics, the test channels are divided into 20 groups according to the LCU standard connector configuration. Each group is connected one-to-one with 48-pin Euler connectors. In order to meet the needs of automated testing, each group of interface matrices can realize automatic control functions, thereby meeting the full-function test requirements of the chassis and facilitating subsequent insulation withstand voltage, functional performance, and other tests.

[0070] To meet the functional / performance tests such as insulation withstand voltage, power supply, power consumption, protection, and redundancy switching, an adjustable power supply with communication capabilities, an insulation withstand voltage tester, and electronic loads are required to achieve automated testing. RS485 communication can be used to control each sub-device, and relevant circuit breakers and contactors can be configured to achieve power distribution protection, logic control, and interlocking functions, ensuring the reliability and safety of the test.

[0071] The accompanying testing system adopts Figure 3The network topology shown uses ETH1, MVB, and 485 to represent Ethernet, MVB, and 485 bus interfaces, respectively. The electronic load serves as a test device for fault protection function testing. The control host's CAN bus connects to each relay matrix. To ensure the timeliness and compatibility of internal parameter distribution while also considering stability and economy, this embodiment uses a 4-channel CAN bus to control 20 relay matrices (boards). CAN1, CAN2, CAN3, and CAN4 each connect to 5 relay matrices. The control host's Ethernet interface ETH1 connects to the industrial computer and the logic control unit under test (DUT). The control host's MVB interface connects to the DUT, and the control host's 485 bus interface connects to the insulation withstand voltage tester. The power system includes two adjustable power supplies connected to the control host's 485 bus interface. These two adjustable power supplies can simultaneously power the DUT's power supply and I / O connectors. It should be understood that the bus interface can be of a type other than 485; this is not limited here.

[0072] The aforementioned CAN bus has a transmission rate of 500Kbps, uses the CAN 2.0B protocol, and has a host communication cycle set to ≤100ms. It uses a polling method to send data to each relay matrix. The host sends data to generate status data and process data through application protocol specification. The status data is used to complete the agreed-upon test steps, and the process data is used to implement the logic simulation of the vehicle application (third-party software). During normal testing, the relay matrix immediately responds with data after receiving the status data. After the host completes a handshake with all relay matrices, it executes the specific test tasks.

[0073] The execution logic for the control host to handshake with all relay matrices is as follows: Figure 4 As shown. The control host sends status data for completing test steps or process data for implementing vehicle application (third-party software) logic simulation to the relay matrix board using a polling method. If the relay matrix board's status meets the requirements for use, it determines whether the relay matrix board meets the test conditions; if the relay matrix board meets the test conditions, the test configuration is complete. If the test conditions are not met, it checks whether the simulation conditions are met. If they are met, the simulation configuration is complete; otherwise, the relay matrix is ​​considered faulty. If the relay matrix board's status does not meet the requirements for use, the check is repeated until the fault conditions are met or the check is repeated a certain number of times, at which point the relay matrix is ​​determined to be faulty.

[0074] In this embodiment, the test system performs tests on the logic control unit under test according to the configuration information, including:

[0075] Control host protocol MVB / Ethernet communication test protocol;

[0076] The logic control unit under test performs communication tests according to the MVB / Ethernet communication test protocol and sends the IO data stored inside it to the control host to determine whether the data recorded by the control host is correct.

[0077] To ensure the safety of insulation withstand voltage testing, the test bench is designed to meet the following requirements:

[0078] 1. Equipped with an insulation withstand voltage indicator light. When conducting insulation withstand voltage tests, the test cabinet door should be closed to prevent accidental contact by personnel.

[0079] 2. The logic control unit under test shall be insulated from the test bench, and the electrical isolation level shall be not less than DC3000V.

[0080] In practice, the logic control unit under test is physically insulated from the test bench, for example, by placing insulating material between them.

[0081] According to the test items shown in Table 1, the logic control unit under test is first short-circuited to perform insulation / withstand voltage tests on all electrical interfaces of the same voltage level, and then other functional / performance tests are performed. To reduce manual time, in some implementations of this embodiment, an automatic relay switching matrix scheme is used, which configures channel attributes by switching different contacts. Specifically, the relay matrix includes:

[0082] The first relay group is used for insulation withstand voltage testing. Each relay in the first relay group is connected to an IO interface in the IO connector of the logic control unit under test to access the corresponding line of the logic control unit under test.

[0083] The second relay group is used for functional testing and performance testing. The second relay group includes multiple third relay groups, and each third relay group is connected to a relay in the corresponding first relay group.

[0084] In a specific example, such as Figure 5 As shown, N=20. This explanation uses only one relay matrix as an example, and the relay matrix involves only two test lines (channels). The first relay group includes relays R1 and R2, which are short-circuited during automated testing to perform insulation withstand voltage testing. The second relay group includes relays R1.1, R1.2, and R1.3, which are connected to VCC, COM, and GND respectively. The third relay group includes relays R2.1, R2.2, and R2.3, which are also connected to VCC, COM, and GND respectively.

[0085] (1) When performing insulation withstand voltage testing, all circuits are short-circuited through relay contacts (R1 and R2 are closed), while all relays related to the functional / performance test are disconnected (R1.1 to R1.3, R2.1 to R2.3 are disconnected). The insulation withstand voltage test is performed by applying voltage to the short-circuited circuit and the chassis of the LCU under test through the internal connector of the relay matrix. The withstand voltage between the relay coil and contacts, and between contacts, is higher than the withstand voltage test requirements. According to GB / T 25119, the highest withstand voltage test value involved in the test bench is DC1350V (1.35 times the altitude coefficient). Therefore, the relay withstand voltage value should be ≥DC1500V when selecting a model.

[0086] (2) When performing functional / performance tests, disconnect the short-circuit lines (R1 and R2 are disconnected) and select the appropriate conduction point according to the actual definition of the line. Taking line 1 as an example, conducting R1.1 is equivalent to connecting the line to the common power supply VCC (DC110V / DC24V), conducting R1.2 is equivalent to connecting the line to the signal terminal COM. The COM terminal has a built-in detection circuit and isolation switching circuit, used for normal line conduction IO function and communication function. Conducting R1.3 is equivalent to connecting the line to the common power supply GND. In specific design, the actual meaning of the line can be determined according to the LCU electrical interface definition (configured through the industrial control computer). After all ports are configured according to the electrical interface definition, the functional / performance test can begin. During the functional / performance test, the relay contacts in the relay matrix will not operate until all tests are completed.

[0087] (3) Since hundreds of circuits are involved in the test, the relay matrix is ​​equipped with an internal self-test circuit. The built-in COM terminal detection circuit is used to detect the status of key circuit relays through program control switching. The detection is automatically completed when the matrix is ​​powered on, ensuring the maintainability of the system.

[0088] (4) Since each circuit under test involves multiple switching of four functions: VCC, GND, COM, and insulation withstand voltage test, when any two functions work at the same time, abnormal conditions such as internal power supply short circuit will occur. In order to avoid such conditions, this invention sets up a channel multi-channel interlock function, realizes channel-level software / hardware function interlock, and ensures the reliability of the system.

[0089] In addition, the relay matrix (board) adopts a 1U chassis solution, which is suitable for standard cabinets. As a standard component, it occupies little space and is easy to maintain.

[0090] This embodiment of the automated logic control unit test bench is used for rapid batch testing of the functionality / performance of logic control units, effectively shortening testing time. It can also port third-party testing software to achieve vehicle-level logic control function simulation testing, identifying application risks in advance. There are 12 test items, with each test expected to take 10-20 minutes. Once operators are proficient in all operating procedures, the testing time can be reduced to 2-3 hours per unit. Compared to the original testing method, the test items are more comprehensive, significantly improving product quality, and reducing testing time from 2-3 hours to 30 minutes, while reducing the number of testers from 2-3 to 1, thus reducing labor costs.

[0091] Example 2

[0092] This embodiment also provides an automated testing method for logic control units, implemented based on the aforementioned automated testing bench for logic control units. The automated testing method for logic control units includes:

[0093] Step 101: The industrial control computer obtains and sends out configuration information, which includes the IO connector configuration information of the logic control unit under test and the test item configuration information. The test items include at least one of insulation withstand voltage test, functional test, performance test and communication test.

[0094] Step 102: The test system performs tests on the logic control unit under test according to the configuration information.

[0095] In this embodiment, the test bench uses an industrial control computer to acquire and send the IO connector configuration information and test item configuration information of the logic control unit under test to the test system. The test system performs insulation withstand voltage tests, functional tests, performance tests, and communication tests on the logic control unit under test according to the configuration information, so as to quickly and batch test the function / performance of the logic control unit.

[0096] The control host sends data, specifying status data and process data through the application protocol. The status data is used to complete the agreed-upon test steps, while the process data is used to implement the logic simulation of the vehicle application (third-party software). During normal testing, the relay matrix responds immediately upon receiving the status data. Once the control host has completed a handshake with all relay matrices, it executes the specific test tasks.

[0097] In the specific implementation, before the test system performs tests on the logic control unit under test based on the configuration information, it also includes:

[0098] The control host sends status data for the test steps used to complete the test items to the relay matrix board in a polling manner.

[0099] If the relay matrix board is in a state that meets the requirements for being put into use, determine whether the relay matrix board meets the test conditions.

[0100] The test configuration is complete once the relay matrix board meets the test conditions.

[0101] The execution logic for the control host to handshake with all relay matrices is as follows: Figure 4 As shown. The control host sends status data for completing test steps or process data for implementing vehicle application (third-party software) logic simulation to the relay matrix board using a polling method. If the relay matrix board's status meets the requirements for use, it determines whether the relay matrix board meets the test conditions; if the relay matrix board meets the test conditions, the test configuration is complete. If the test conditions are not met, it checks whether the simulation conditions are met. If they are met, the simulation configuration is complete; otherwise, the relay matrix is ​​considered faulty. If the relay matrix board's status does not meet the requirements for use, the check is repeated until the fault conditions are met or the check is repeated a certain number of times, at which point the relay matrix is ​​determined to be faulty.

[0102] In some specific implementations, the test system performs tests on the logic control unit under test based on the configuration information, including:

[0103] Control host protocol MVB / Ethernet communication test protocol;

[0104] The logic control unit under test performs communication tests according to the MVB / Ethernet communication test protocol and sends the IO data stored inside it to the control host to determine whether the data recorded by the control host is correct.

[0105] In some specific implementations, the test support system performs tests on the logic control unit under test based on configuration information, including:

[0106] The insulation withstand voltage test is performed by short-circuiting all the circuits of the logic control unit under test through the relay contacts in the first relay group, while all the relays in the second relay group are disconnected.

[0107] In some specific implementations, the test support system performs tests on the logic control unit under test based on configuration information, including:

[0108] By disconnecting all circuits short-circuited by the relay contacts in the first relay group, and selectively activating the relays in the second relay group, functional or performance testing can be performed.

[0109] by Figure 5 For example, insulation withstand voltage and functional / performance tests

[0110] (1) When performing insulation withstand voltage testing, all circuits are short-circuited through relay contacts (R1 and R2 are closed), while all relays related to the functional / performance test are disconnected (R1.1 to R1.3, R2.1 to R2.3 are disconnected). The insulation withstand voltage test is performed by applying voltage to the short-circuited circuit and the chassis of the LCU under test through the internal connector of the relay matrix. The withstand voltage between the relay coil and contacts, and between contacts, is higher than the withstand voltage test requirements. According to GB / T 25119, the highest withstand voltage test value involved in the test bench is DC1350V (1.35 times the altitude coefficient). Therefore, the relay withstand voltage value should be ≥DC1500V when selecting a model.

[0111] (2) When performing functional / performance tests, disconnect the short-circuit lines (R1 and R2 are disconnected) and select the appropriate conduction point according to the actual definition of the line. Taking line 1 as an example, conducting R1.1 is equivalent to connecting the line to the common power supply VCC (DC110V / DC24V), conducting R1.2 is equivalent to connecting the line to the signal terminal COM. The COM terminal has a built-in detection circuit and isolation switching circuit, used for normal line conduction IO function and communication function. Conducting R1.3 is equivalent to connecting the line to the common power supply GND. In specific design, the actual meaning of the line can be determined according to the LCU electrical interface definition (configured through the industrial control computer). After all ports are configured according to the electrical interface definition, the functional / performance test can begin. During the functional / performance test, the relay contacts in the relay matrix will not operate until all tests are completed.

[0112] The method described in this embodiment enables rapid batch testing of logic control unit functions / performance, effectively shortening testing time. It can also be ported to third-party testing software to achieve vehicle-level logic control function simulation testing, allowing for early identification of application risks. There are 12 test items, with each item expected to take 10-20 minutes. Once operators are proficient in all operating steps, the testing time can be reduced to 2-3 hours per unit. Compared to the original testing method, the test items are more comprehensive, significantly improving product quality. Testing time is reduced from 2-3 hours to 30 minutes, and the number of testers is reduced from 2-3 to 1, reducing labor costs. This solves the problems of inconsistent logic control unit product quality, high on-site quality pressure, and the complexity and time-consuming nature of standardized test items.

[0113] Those skilled in the art will understand that the above embodiments are specific embodiments for implementing the present invention, and in practical applications, various changes in form and detail may be made without departing from the spirit and scope of the present invention.

Claims

1. An automated test bench for logic control units, characterized in that, include: An industrial control computer is used to acquire and send configuration information, which includes I / O connector configuration information and test item configuration information of the logic control unit under test. The test items include at least one of insulation withstand voltage test, functional test, performance test and communication test. A test-testing system is used to test the logic control unit under test according to the configuration information. An external connector is used to connect the test system and the logic control unit under test.

2. The automated test bench for logic control units according to claim 1, characterized in that, The accompanying testing system includes: Multiple relay matrices are connected one-to-one with the external connectors to form multiple test channels, and each test channel is connected to an IO connector of the logic control unit under test. The control host is used to control the insulation withstand voltage tester and the relay matrix board to perform insulation withstand voltage tests, functional tests, and performance tests; the control host interacts with the industrial computer and the logic control unit under test to perform communication tests.

3. The automated test bench for logic control units according to claim 2, characterized in that, The CAN bus of the control host is connected to each relay matrix; the Ethernet interface of the control host is connected to the industrial computer and the logic control unit under test; the MVB interface of the control host is connected to the logic control unit under test; and the bus interface of the control host is connected to the insulation withstand voltage tester.

4. The automated test bench for logic control units according to claim 3, characterized in that, Also includes: The power supply system includes two adjustable power supplies connected to the bus interface of the control host. The two adjustable power supplies simultaneously power the power supply and I / O connector of the logic control unit under test.

5. The automated test bench for logic control units according to claim 2, characterized in that, The relay matrix includes: The first relay group is used for insulation withstand voltage testing. Each relay in the first relay group is connected to an IO interface in the IO connector of the logic control unit under test to access the corresponding line of the logic control unit under test. A second relay group is used for functional testing and performance testing. The second relay group includes multiple third relay groups, and each third relay group is connected to a relay in the corresponding first relay group.

6. An automated testing method for a logic control unit, characterized in that, Based on the automated test bench for the logic control unit according to any one of claims 1 to 5, the automated testing method for the logic control unit includes: The industrial control computer acquires and sends out configuration information, which includes the I / O connector configuration information and test item configuration information of the logic control unit under test. The test items include at least one of insulation withstand voltage test, functional test, performance test and communication test. The testing system performs tests on the logic control unit under test based on the configuration information.

7. The automated testing method for logic control units according to claim 6, characterized in that, Before the test system tests the logic control unit under test according to the configuration information, it also includes: The control host sends status data for the test steps used to complete the test items to the relay matrix board in a polling manner. If the relay matrix board is in a state that meets the requirements for being put into use, determine whether the relay matrix board meets the test conditions. The test configuration is complete once the relay matrix board meets the test conditions.

8. The automated testing method for logic control units according to claim 6, characterized in that, The testing system performs tests on the logic control unit under test based on the configuration information, including: Control host protocol MVB / Ethernet communication test protocol; The logic control unit under test performs a communication test according to the MVB / Ethernet communication test protocol and sends the IO data stored inside it to the control host to determine whether the data recorded by the control host is correct.

9. The automated testing method for logic control units according to claim 6, characterized in that, The testing system performs tests on the logic control unit under test based on the configuration information, including: All lines of the logic control unit under test are short-circuited by the relay contacts in the first relay group, while all relays in the second relay group are disconnected to perform an insulation withstand voltage test.

10. The automated testing method for the logic control unit according to claim 9, characterized in that, The testing system performs tests on the logic control unit under test based on the configuration information, including: By disconnecting all the circuits short-circuited by the relay contacts in the first relay group, and selectively activating the relays in the second relay group, functional or performance testing can be performed.

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