An electronic product quality interception method, system and terminal device

Abstract

The application relates to the technical field of electronic product manufacturing, and discloses an electronic product quality interception method, system and terminal device, the electronic product quality interception method comprising the following steps: collecting test data files and recording collection time; performing format conversion on each test data file to obtain test data records in a unified format; determining the reliability of each test data record according to test time and collection time; screening the test data records according to the reliability to obtain reliable test data records; and determining whether to perform quality interception on the electronic product based on the reliable test data records. The electronic product quality interception method can realize real-time collection and format conversion of test data files of test equipment without a standard communication interface, perform quality interception based on reliable test data records, improve the accuracy of electronic product quality interception, and avoid the flow of defective products through subsequent processes or even out of the production line.

Description

Technical Field

[0001] This application relates to the field of electronic product manufacturing technology, and in particular to a method, system and terminal device for intercepting electronic product quality. Background Technology

[0002] In electronic product manufacturing lines, there are numerous testing devices that play a crucial role in product quality inspection. However, these devices share several common problems: First, they lack standard communication interfaces, meaning test results can only be output as files to local disks or network shared directories, preventing real-time external push. Second, the output file formats are highly heterogeneous, with significant differences in file formats between different manufacturers and models of testing equipment. This constraint prevents real-time data collection and processing, creating blind spots in quality control. Defective products may then flow through subsequent processes or even leave the production line, resulting in quality losses. Summary of the Invention

[0003] In view of this, embodiments of this application provide a method, system, and terminal device for intercepting electronic product quality issues, which can effectively improve the problems such as the inability to collect test data in real time, resulting in blind spots in electronic product quality interception.

[0004] In a first aspect, embodiments of this application provide a method for intercepting electronic product quality issues, including: Collect test data files output by multiple testing devices for electronic products, and record the acquisition time of each test data file; Each of the test data files is converted to a uniform format to obtain test data records. The reliability of each test data record is determined based on the test time and the acquisition time in each test data record; The test data records are filtered based on their reliability to obtain reliable test data records; Based on the aforementioned trusted test data records, it is determined whether to intercept the electronic product due to quality issues.

[0005] In a first possible embodiment of the first aspect, before acquiring the test data files output by multiple testing devices of the electronic product, the method further includes: The frequency of output test data files from multiple testing devices for electronic products; When the test data file output frequency is greater than the preset output frequency, the file acquisition mode of the test device is set to event-driven acquisition mode. When the output frequency of the test data file is less than or equal to the preset output frequency, the file acquisition mode of the test device is set to timed acquisition mode.

[0006] In a second possible embodiment of the first aspect, the test data file output by the multiple testing devices for acquiring electronic products includes: When the file acquisition mode of the test device is set to event-driven acquisition mode, the test data file of the test device is acquired at the time of output of the test data file. When the file acquisition mode of the test equipment is set to timed acquisition mode, the test data file of the test equipment is acquired at preset time intervals. Under the condition that the test data file of the test equipment is successfully acquired and successfully converted in format, update the timestamp watermark of the test equipment; If the test data file of the test equipment is not successfully acquired or the format is not successfully converted, the timestamp watermark of the test equipment will not be updated.

[0007] In a third possible embodiment of the first aspect, the step of converting the format of each test data file to obtain a test data record in a uniform format includes: Extract all data fields from each of the test data files; The data fields of each test data file are written into the preset field positions corresponding to the type of each data field to obtain the test data record.

[0008] In a fourth possible embodiment of the first aspect, determining the reliability of each test data record based on the test time and the acquisition time in each test data record includes: Calculate the time difference between the acquisition time and the test time; Under the condition that the time difference is less than the preset time difference, the credibility of the test data record is determined to be the first credibility. Under the condition that the time difference is greater than or equal to the preset time difference, the credibility of the test data record is determined to be the second credibility.

[0009] In a fifth possible embodiment of the first aspect, the step of filtering the test data records based on their reliability to obtain reliable test data records includes: The test data records with a confidence level of the first confidence level are retained, and the test data records with a confidence level of the second confidence level are filtered out to obtain the reliable test data records.

[0010] In a sixth possible embodiment of the first aspect, each of the trusted test data records includes an electronic product identifier and test results recorded by the test equipment, and the step of determining whether to intercept the electronic product based on each of the trusted test data records includes: Based on the electronic product identifier, each of the trusted test data records is divided into trusted test data records corresponding to different electronic products; If there is a test failure in the trusted test data record corresponding to the electronic product, the electronic product will be subject to quality interception. If all test results in the trusted test data record corresponding to the electronic product are successful, the electronic product will not be subject to quality interception.

[0011] In a seventh possible embodiment of the first aspect, the test data file is stored in the file output directory of the test device, and the method further includes: Collect the device status parameters of each of the test devices; Periodically check whether the file output directory of each of the test devices can be accessed normally; If the file output directory of the test device cannot be accessed normally, a reconnection mechanism with the test device will be triggered.

[0012] Secondly, embodiments of this application provide an electronic product quality interception system, comprising: The data acquisition module is used to acquire test data files output by multiple testing devices for electronic products and record the acquisition time of each test data file. The data processing module converts the format of each test data file to obtain test data records in a uniform format; A credibility determination module is used to determine the credibility of each test data record based on the test time in each test data record and the acquisition time; The data filtering module is used to filter the test data records according to their credibility to obtain credible test data records; The quality interception module is used to determine whether to intercept the electronic product based on each of the trusted test data records.

[0013] Thirdly, embodiments of this application provide a terminal device, which includes a processor and a memory. The memory stores a computer program, and the processor executes the computer program to implement the above-described electronic product quality interception method.

[0014] The embodiments of this application have the following beneficial effects: This embodiment of an electronic product quality interception method includes: collecting test data files output by multiple testing devices for electronic products and recording the collection time of each test data file; converting the format of each test data file to obtain test data records in a unified format; determining the reliability of each test data record based on the test time and collection time in each test data record; filtering the test data records based on their reliability to obtain reliable test data records; and determining whether to intercept the electronic product based on each reliable test data record. Based on the above scheme, this electronic product quality interception method can collect and convert the test data files of testing devices without standard communication interfaces in real time, solving the problems of severe file format heterogeneity and inability to collect test data. It determines the reliability of each test data record to filter and obtain reliable test data records, and performs quality interception based on these reliable test data records, thereby improving the accuracy of electronic product quality interception and preventing defective products from flowing through subsequent processes or even leaving the production line. Attached Figure Description

[0015] To more clearly illustrate the technical solutions of the embodiments of this application, the accompanying drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this application and should not be regarded as a limitation of the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0016] Figure 1 This paper illustrates a first flowchart of an electronic product quality interception method according to an embodiment of this application. Figure 2 This paper illustrates a second flowchart of the electronic product quality interception method according to an embodiment of this application. Figure 3 This illustration shows a schematic diagram of the updating of the timestamp watermark line of a certain test device according to an embodiment of this application; Figure 4 This paper illustrates a third flowchart of the electronic product quality interception method according to an embodiment of this application. Figure 5 A schematic diagram of an electronic product quality interception system according to an embodiment of this application is shown.

[0017] Explanation of key component symbols: 200 - Electronic Product Quality Interception System; 210 - Data Acquisition Module; 220 - Data Processing Module; 230 - Credibility Determination Module; 240 - Data Filtering Module; 250 - Quality Interception Module. Detailed Implementation

[0018] The technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments.

[0019] The components of the embodiments of this application described and illustrated in the accompanying drawings can be arranged and designed in a variety of different configurations. Therefore, the following detailed description of the embodiments of this application provided in the drawings is not intended to limit the scope of the claimed application, but merely to illustrate selected embodiments of the application. All other embodiments obtained by those skilled in the art based on the embodiments of this application without inventive effort are within the scope of protection of this application.

[0020] In the following text, the terms "comprising," "having," and their cognates, which may be used in various embodiments of this application, are intended only to indicate a particular feature, number, step, operation, element, component, or combination thereof, and should not be construed as primarily excluding the presence of one or more other features, numbers, steps, operations, elements, components, or combinations thereof, or adding the possibility of one or more combinations thereof. Furthermore, the terms "first," "second," "third," etc., are used only for distinguishing descriptions and should not be construed as indicating or implying relative importance.

[0021] Unless otherwise specified, all terms used herein (including technical and scientific terms) shall have the same meaning as commonly understood by one of ordinary skill in the art to which the various embodiments of this application pertain. Terms (such as those defined in commonly used dictionaries) shall be interpreted as having the same meaning as in their contextual meaning in the relevant technical field and shall not be construed as having an idealized or overly formal meaning, unless clearly defined in the various embodiments of this application.

[0022] The following detailed description of some embodiments of this application is provided in conjunction with the accompanying drawings. Unless otherwise specified, the following embodiments and features can be combined with each other.

[0023] The following examples illustrate the method for intercepting the quality of electronic products.

[0024] Figure 1 A flowchart of an electronic product quality interception method according to an embodiment of this application is shown. Exemplarily, the electronic product quality interception method includes the following steps: S110 collects test data files output by multiple testing devices for electronic products and records the collection time of each test data file; Exemplary of this testing equipment, it is used for quality inspection on electronic product manufacturing lines, including but not limited to Automated Optical Inspection (AOI), Solder Paste Inspection (SPI), flying probe testing machines, X-ray inspection machines, and PCB depaneling machines. The electronic products in question are various printed circuit boards and assembled finished products, including but not limited to main control printed circuit boards for tablets and smartwatches, and motherboards for smartphones. The testing equipment's test data file acquisition modes include event-driven acquisition and timed acquisition modes, allowing selection of the appropriate acquisition mode based on the characteristics of the test data files output by each testing device.

[0025] In one embodiment, the output frequency of test data files from multiple testing devices for an electronic product is obtained; when the output frequency of test data files is greater than a preset output frequency, the file acquisition mode of the testing devices is set to an event-driven acquisition mode; when the output frequency of test data files is less than or equal to the preset output frequency, the file acquisition mode of the testing devices is set to a timed acquisition mode.

[0026] In this embodiment, the preset output frequency is a threshold configured by the system to distinguish the data output rhythm of the test equipment. When the output frequency of the test data file is greater than the preset output frequency, the data output rhythm of the test equipment is high, for example, a new test data file is output every few seconds, which is suitable for the event-driven acquisition mode. The event-driven acquisition mode acquires the new file the moment it appears, and the delay is usually within 100 milliseconds.

[0027] When the output frequency of test data files is less than or equal to the preset output frequency, the output rhythm of the test equipment is low, making the timed scan mode suitable. This means that the test equipment actively checks the test data directory where test data files are stored every preset time interval, collecting only new files. The selection of the timed scan mode is determined by a switch in the test equipment's configuration table (including enabling / disabling the scan switch) and the scan cycle, and is automatically executed by the system according to the configuration without manual intervention.

[0028] In another embodiment, such as Figure 2 As shown, collecting the test data files output by each test device includes the following steps: S111, when the file acquisition mode of the test device is set to event-driven acquisition mode, the test data file of the test device is acquired at the time of output of the test data file.

[0029] In this embodiment, the operating system-level file system monitoring API (FileSystemWatcher) is used to listen for file creation events in the test data directory of the test device. When a new file is detected, it is immediately submitted to a dedicated consumer thread for processing via a bounded blocking queue, achieving millisecond-level response. The bounded blocking queue is a thread-safe queuing container with a maximum capacity, where both ends automatically wait when the queue is empty or full.

[0030] S112, when the file acquisition mode of the test equipment is set to timed acquisition mode, the test data file of the test equipment is acquired at preset time intervals.

[0031] In this embodiment, the device test data directory is periodically scanned at configurable preset time intervals, and collected files are filtered using a timestamp watermark mechanism. The first scan processes all files within the time window, while subsequent scans only process files added or modified after the timestamp watermark, achieving incremental discovery of memory complexity. The preset time interval ranges from 1 to 10 minutes, and preferably, it can be configured to be 5 minutes.

[0032] S113, under the condition that the test data file of the test equipment is successfully acquired and successfully converted in format, update the timestamp watermark of the test equipment.

[0033] S114. If the test data file of the test equipment is not successfully acquired or the format is not successfully converted, the timestamp watermark of the test equipment shall not be updated.

[0034] In this embodiment, when collecting test data files, the system isolates each test data file individually. This means that an error in collecting one file will not affect other files in the same batch. Only when a file is successfully collected and its format converted is it recorded as successfully collected and added to the batch's successful list. The timestamp watermark of the test device corresponding to the successfully collected test data file is advanced only when there is at least one test data file in the batch's successful list. This timestamp watermark represents the detection time of the successfully collected test data file, marking that these files have already been collected and do not need to be collected again. The successfully collected test data files are then deleted from the test data directory. If a file fails to be collected, or if subsequent format conversion fails, it will not be recorded in the successful list, and the timestamp watermark of the corresponding test device will not advance. Therefore, this file will be automatically re-collected and processed during the next scan.

[0035] In a demonstrative sense, traditional solutions typically develop dedicated data acquisition programs for a single type of test equipment. Each new test equipment requires a completely new program, resulting in high maintenance costs and poor scalability. The method described in this application enables the acquisition of test data files from all test equipment, providing a data foundation for subsequent quality interception. For each new test equipment, only the acquisition mode of that equipment needs to be determined; data is then collected from the test equipment according to the corresponding acquisition mode. This results in lower maintenance costs and higher scalability.

[0036] In one implementation, such as Figure 3 The diagram illustrates the updating of the timestamp watermark for a certain testing device. During the initial periodic scan of the device's test data directory, the timestamp watermark is at zero, representing the earliest detection time of the testing device. In subsequent scans, if a file marked as T4 is successfully acquired and its format successfully converted, the detection time corresponding to the T4 file is used as the timestamp watermark. This detection time can be the time when the testing device generates the test data file after testing the electronic product. In other words, files with the detection time corresponding to the T4 file, as well as files with times prior to that detection time, are not scanned or acquired; only files after that detection time are acquired.

[0037] S120 converts the format of each test data file to obtain test data records in a uniform format.

[0038] In one embodiment, all data fields in each test data file are extracted; the data fields of each test data file are written to the preset field positions corresponding to the type of each data field to obtain test data records.

[0039] In this embodiment, the file formats of the test data files output by different test devices vary greatly. For example, some output CSV (Comma-Separated Values), some output TXT (Text File), some output REP (Report File), or ERR (Error File) specific formats. All devices use the same unified data model, i.e., a fixed set of data field rows. Each data field type is located in a different position within this fixed data field row. For example, the data field rows might include: Test Device Code, Test Device Name, Test Data File Name, Test Time, Test Result, Number of Open Circuits on Circuit Boards, Number of Short Circuits on Circuit Boards, Defect Code, Electronic Product Identifier, etc., facilitating subsequent unified processing. If the data field type is Test Device Code, it is written to the first position of the preset field; if the data field type is Test Device Name, it is written to the second position, and so on.

[0040] In one implementation, firstly, the corresponding reading method is selected based on the test data file extension. For example, CSV files are separated by commas, TXT files by tabs, and Excel files are read using a dedicated library. The file encoding is automatically identified; in Chinese environments, it is mostly GBK (Guo Biao Ku, Chinese character encoding extension standard), and a few are UTF-8 (8-bit Unicode Transformation Format). Business fields such as work order number, board number, and batch number are extracted from the file content according to the device-specific format rules, thus extracting all data fields from the test data file. Then, the extracted data fields are filled into the standard data field rows of the unified data model; that is, the data fields are written to the preset field positions corresponding to the type of each data field, resulting in test data records. Standardized test data records can be written to a unified data table through a database operation interface. If a main table (test data records) and a sub-table (defect details recorded by the test equipment) are involved, they will be written in the same database transaction to ensure data consistency. In this way, regardless of whether the test equipment is AOI, SPI, or a flying probe machine, the data format for determining whether quality interception should be performed is uniform.

[0041] S130, determine the reliability of each test data record based on the test time and acquisition time in each test data record.

[0042] In one embodiment, the acquisition time is accurate to milliseconds, supporting time-series traceability of product quality. The time difference between the acquisition time and the test time is calculated; if the time difference is less than a preset time difference, the reliability of the test data record is determined to be a first reliability; if the time difference is greater than or equal to the preset time difference, the reliability of the test data record is determined to be a second reliability.

[0043] In this embodiment, the first confidence level is greater than the second confidence level. When the time difference is less than a preset time difference, it indicates that the real-time performance of the test data recording is high, and the confidence level for quality interception judgment is high. When the time difference is greater than or equal to the preset time difference, it indicates that the real-time performance of the test data recording is low, and the confidence level for quality interception judgment is low.

[0044] In one implementation, the second level of confidence can be divided into a first sub-confidence level, a second sub-confidence level, and a third sub-confidence level, from high to low. When the confidence level of the test data record is the first level of confidence, the test equipment is in a normal acquisition state. For example, if the time difference is less than 30 minutes, it indicates that the test equipment is currently working normally, the output data has the highest confidence level, and its test data record can be directly used for quality judgment without additional confirmation.

[0045] When the reliability of the test data record is at the first sub-reliability level, the device is online. For example, if the time difference is between 30 minutes and 48 hours, it indicates that the device was working normally before but may be idle at present. The data reliability is medium, and its results can be used, but it is recommended to combine it with cross-validation data from other devices.

[0046] When the reliability of the test data record is the second sub-reliability, the device is offline and the time difference is greater than 48 hours. This indicates that the test device may have been shut down, disconnected from the network, or malfunctioned, and the data reliability is low. An alarm should be issued and manual confirmation should be enabled or data from a backup test device should be referenced.

[0047] When the reliability of the test data record is the third sub-reliability, the equipment is in a faulty state, the time difference is greater than 48 hours, and there is abnormal information in the equipment's test data file that has not been cleared. This indicates that the equipment has recently had a problem that has not yet been resolved, and the data reliability is further reduced. It should be reverted to the manual re-inspection process.

[0048] It's important to note that "normal collection status" and "online status" refer to normal working conditions, while "offline status" and "fault status" are abnormal states. Abnormal states do not necessarily mean the test data records are unusable; they simply require more caution when using them. This mechanism allows for data quality grading at the data source, improving the reliability of quality interception judgments.

[0049] S140, The test data records are filtered according to their reliability to obtain reliable test data records.

[0050] In one embodiment, test data records with a first level of confidence are retained, and test data records with a second level of confidence are filtered out to obtain reliable test data records.

[0051] In this embodiment, only test data records with a confidence level of the first level are used as data for subsequent quality interception judgment. This provides a unified format for quality interception judgment and ensures that the test data records with higher confidence are used. Since the quality interception judgment is based on the test data records with higher confidence, the accuracy of the quality interception judgment can be improved.

[0052] S150 determines whether to intercept electronic products based on various trusted test data records.

[0053] For example, each trusted test data record includes an electronic product identifier recorded by the test equipment and a test result. The test result includes two types: test success and test failure. The electronic product identifier is a unique identifier for each type of electronic product and can be used to distinguish which type of electronic product the trusted test data record belongs to. For example, the product serial number or board number in the trusted test data record can be used as the electronic product identifier.

[0054] In one embodiment, trusted test data records are divided into trusted test data records corresponding to different electronic products based on the electronic product identifier; if there is a test failure in the trusted test data record corresponding to an electronic product, the electronic product is quality intercepted; if all test results in the trusted test data record corresponding to an electronic product are successful, the electronic product is not quality intercepted.

[0055] In this embodiment, because electronic products may undergo multiple testing processes using multiple testing devices—for example, first an SPI solder paste inspector, then an AOI optical inspector, and finally a flying probe tester—multiple reliable test data records will be generated, corresponding to different test process results. Therefore, multiple reliable test data records of the same electronic product are linked together according to the electronic product identifier to obtain reliable test data records corresponding to different electronic products. When any reliable test data record of an electronic product fails, it is determined to be an interception target, and the electronic product is subject to quality interception.

[0056] In one implementation, once a target is identified for interception, an interception sign can be immediately set at the workstation, the on-site operator can be notified, and the electronic product can be prevented from flowing to the downstream process. At the same time, a log is recorded, recording the time of interception, the reason, the defect code, etc., for subsequent quality traceability.

[0057] In one implementation, the operations of filtering files and intercepting electronic products based on the filtered reliable test data records can be performed in the MES (Manufacturing Execution System). That is, after converting the format of the collected test data files, they can be written into the MES through idempotency based on the MERGE statement. The MES can obtain the test results in real time and execute the interception decision in steps S130 to S150, thereby connecting the test equipment that was originally in a data island to the MES quality interception system and eliminating the blind spots in quality inspection.

[0058] In one embodiment, device status parameters of each test device are collected; the file output directory of each test device is checked periodically to see if it can be accessed normally; and a reconnection mechanism with the test device is triggered if the file output directory of the test device cannot be accessed normally.

[0059] In this embodiment, device status parameters can be uploaded to the MES in real time via MQTT (Message Queuing Telemetry Transport). These parameters are process parameters and device status read from the device in real time using industrial communication protocols, such as the device's current temperature, pressure, running / stopping status, and alarm information. This type of data is characterized by its high real-time performance (updated every few hundred milliseconds) and reflects the device's operating process and health status. It is primarily used for quality control of electronic products, allowing for timely retrospective checks to ensure the device is operating normally.

[0060] In one implementation, a timer with a preset time (e.g., 30 minutes) is set for each test device. Every preset time, a directory reachability check is performed to determine if the test device's file output directory can be accessed normally. If access is not possible, the cause could be network interruption, shared directory disconnection, device shutdown, etc. An error message can be recorded to indicate a health check failure, triggering an automatic reconnection mechanism to attempt to restore the connection with the test device, for example, by re-establishing the communication network. Before each check, the system first checks if it is currently being shut down; if so, it skips the check to avoid performing unnecessary operations.

[0061] In one implementation, such as Figure 4 As shown, the test equipment layer includes an AOI optical inspection instrument, an SPI solder paste inspection instrument, a flying probe tester, an X-ray inspection machine, and a board separation machine. The acquisition service layer is used to collect test data files from each test device in the test equipment layer. The acquisition service layer caches the collected test data files through a bounded blocking queue using event-driven and timed acquisition modes. After format conversion, the test data files in the bounded blocking queue are written to the MES / cloud layer using idempotent methods based on the MERGE statement. The MES / cloud layer is used to filter the files and perform quality interception on electronic products based on the filtered reliable test data records.

[0062] Figure 5 A schematic diagram of an electronic product quality interception system 200 according to an embodiment of this application is shown. Exemplarily, the electronic product quality interception system 200 includes: The data acquisition module 210 is used to acquire test data files output by multiple testing devices for electronic products and record the acquisition time of each test data file.

[0063] In one embodiment, the data acquisition module 210 is further configured to acquire the output frequency of test data files from multiple test devices of the electronic product; when the output frequency of the test data files is greater than a preset output frequency, the file acquisition mode of the test devices is set to an event-driven acquisition mode; when the output frequency of the test data files is less than or equal to the preset output frequency, the file acquisition mode of the test devices is set to a timed acquisition mode.

[0064] In one embodiment, the data acquisition module 210 is further configured to: acquire the test data file of the test device at the output time of the test data file when the file acquisition mode of the test device is set to event-driven acquisition mode; acquire the test data file of the test device at preset time intervals when the file acquisition mode of the test device is set to timed acquisition mode; update the timestamp watermark of the test device when the test data file of the test device is successfully acquired and successfully converted in format; and not update the timestamp watermark of the test device when the test data file of the test device is not successfully acquired or successfully converted in format.

[0065] In one embodiment, the data acquisition module 210 is also used to acquire device status parameters of each test device; periodically check whether the file output directory of each test device can be accessed normally; and trigger a reconnection mechanism with the test device if the file output directory of the test device cannot be accessed normally.

[0066] The data processing module 220 converts the format of each test data file to obtain test data records in a uniform format.

[0067] In one embodiment, the data processing module 220 is further configured to extract all data fields in each test data file; and write the data fields of each test data file into the preset field positions corresponding to the type of each data field to obtain test data records.

[0068] The credibility determination module 230 is used to determine the credibility of each test data record based on the test time and collection time in each test data record.

[0069] In one embodiment, the credibility determination module 230 is further configured to calculate the time difference between the acquisition time and the test time; if the time difference is less than a preset time difference, determine the credibility of the test data record as a first credibility; if the time difference is greater than or equal to the preset time difference, determine the credibility of the test data record as a second credibility.

[0070] The data filtering module 240 is used to filter test data records based on their credibility to obtain credible test data records.

[0071] In one embodiment, the data filtering module 240 is further configured to retain test data records with a first level of confidence and filter out test data records with a second level of confidence to obtain reliable test data records.

[0072] The quality interception module 250 is used to determine whether to intercept electronic products based on various trusted test data records.

[0073] In one embodiment, each trusted test data record includes the electronic product identifier and test result recorded by the test equipment. The quality interception module 250 is further configured to divide each trusted test data record into trusted test data records corresponding to different electronic products according to the electronic product identifier; under the condition that there is a test failure in the trusted test data record corresponding to the electronic product, the electronic product is quality intercepted; under the condition that all test results in the trusted test data record corresponding to the electronic product are successful, the electronic product is not quality intercepted.

[0074] It is understood that the system in this embodiment corresponds to the electronic product quality interception method in the above embodiment, and the options in the above embodiment are also applicable to this embodiment, so they will not be described again here.

[0075] This application also provides a terminal device, exemplary of which includes a processor and a memory, wherein the memory stores a computer program, and the processor executes the computer program to enable the terminal device to perform the functions of the various modules in the above-described electronic product quality interception method or electronic product quality interception system.

[0076] The processor can be an integrated circuit chip with signal processing capabilities. The processor can be a general-purpose processor, including at least one of a Central Processing Unit (CPU), Graphics Processing Unit (GPU), Network Processor (NP), Digital Signal Processor (DSP), Application-Specific Integrated Circuit (ASIC), Field-Programmable Gate Array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components. The general-purpose processor can be a microprocessor or any conventional processor, capable of implementing or executing the methods, steps, and logic block diagrams disclosed in the embodiments of this application.

[0077] The memory can be, but is not limited to, Random Access Memory (RAM), Read Only Memory (ROM), Programmable Read-Only Memory (PROM), Erasable Programmable Read-Only Memory (EPROM), Electrically Erasable Programmable Read-Only Memory (EEPROM), etc. The memory is used to store computer programs, and the processor can execute the computer programs accordingly after receiving execution instructions.

[0078] This application also provides a computer-readable storage medium for storing the computer program used in the aforementioned terminal device. For example, the computer-readable storage medium may include, but is not limited to, various media capable of storing program code, such as a USB flash drive, a portable hard drive, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk.

[0079] In the several embodiments provided in this application, it should be understood that the disclosed apparatus and methods can also be implemented in other ways. The apparatus embodiments described above are merely illustrative. For example, the flowcharts and block diagrams in the accompanying drawings show the architecture, functionality, and operation of possible implementations of apparatus, methods, and computer program products according to various embodiments of this application. In this regard, each block in a flowchart or block diagram may represent a module, segment, or portion of code containing one or more executable instructions for implementing a specified logical function. It should also be noted that, in alternative implementations, the functions marked in the blocks may occur in a different order than those marked in the drawings. For example, two consecutive blocks may actually be executed substantially in parallel, and they may sometimes be executed in reverse order, depending on the functions involved. It should also be noted that each block in the block diagram and / or flowchart, and combinations of blocks in the block diagram and / or flowchart, can be implemented using a dedicated hardware-based system that performs the specified function or action, or using a combination of dedicated hardware and computer instructions.

[0080] In addition, the functional modules or units in the various embodiments of this application can be integrated together to form an independent part, or each module can exist independently, or two or more modules can be integrated to form an independent part.

[0081] If the aforementioned functions are implemented as software functional modules and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or a part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a smartphone, personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this application.

[0082] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any changes or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application.

Claims

1. A method for intercepting quality issues in electronic products, characterized in that, include: Collect test data files output by multiple testing devices for electronic products, and record the acquisition time of each test data file; Each of the test data files is converted to a uniform format to obtain test data records. The reliability of each test data record is determined based on the test time and the acquisition time in each test data record; The test data records are filtered based on their reliability to obtain reliable test data records; Based on the aforementioned trusted test data records, it is determined whether to intercept the electronic product due to quality issues.

2. The electronic product quality interception method according to claim 1, characterized in that, Before collecting test data files output by multiple testing devices for electronic products, the method further includes: The frequency of output test data files from multiple testing devices for electronic products; When the test data file output frequency is greater than the preset output frequency, the file acquisition mode of the test device is set to event-driven acquisition mode. When the output frequency of the test data file is less than or equal to the preset output frequency, the file acquisition mode of the test device is set to timed acquisition mode.

3. The electronic product quality interception method according to claim 2, characterized in that, The test data files collected from multiple testing devices of the electronic product include: When the file acquisition mode of the test device is set to event-driven acquisition mode, the test data file of the test device is acquired at the time of output of the test data file. When the file acquisition mode of the test equipment is set to timed acquisition mode, the test data file of the test equipment is acquired at preset time intervals. Under the condition that the test data file of the test equipment is successfully acquired and successfully converted in format, update the timestamp watermark of the test equipment; If the test data file of the test equipment is not successfully acquired or the format is not successfully converted, the timestamp watermark of the test equipment will not be updated.

4. The electronic product quality interception method according to claim 1, characterized in that, The step of converting each of the test data files to obtain test data records in a uniform format includes: Extract all data fields from each of the test data files; The data fields of each test data file are written into the preset field positions corresponding to the type of each data field to obtain the test data record.

5. The electronic product quality interception method according to claim 1, characterized in that, The step of determining the reliability of each test data record based on the test time and the acquisition time in each test data record includes: Calculate the time difference between the acquisition time and the test time; Under the condition that the time difference is less than the preset time difference, the credibility of the test data record is determined to be the first credibility. Under the condition that the time difference is greater than or equal to the preset time difference, the credibility of the test data record is determined to be the second credibility.

6. The electronic product quality interception method according to claim 5, characterized in that, The step of filtering the test data records based on their reliability to obtain reliable test data records includes: The test data records with a confidence level of the first confidence level are retained, and the test data records with a confidence level of the second confidence level are filtered out to obtain the reliable test data records.

7. The electronic product quality interception method according to claim 1, characterized in that, Each of the trusted test data records includes the electronic product identifier and test results recorded by the test equipment. The step of determining whether to intercept the electronic product based on each of the trusted test data records includes: Based on the electronic product identifier, each of the trusted test data records is divided into trusted test data records corresponding to different electronic products; If there is a test failure in the trusted test data record corresponding to the electronic product, the electronic product will be subject to quality interception. If all test results in the trusted test data record corresponding to the electronic product are successful, the electronic product will not be subject to quality interception.

8. The electronic product quality interception method according to claim 1, characterized in that, The test data file is stored in the file output directory of the test device, and the method further includes: Collect the device status parameters of each of the test devices; Periodically check whether the file output directory of each of the test devices can be accessed normally; If the file output directory of the test device cannot be accessed normally, a reconnection mechanism with the test device will be triggered.

9. An electronic product quality interception system, characterized in that, include: The data acquisition module is used to acquire test data files output by multiple testing devices for electronic products and record the acquisition time of each test data file. The data processing module converts the format of each test data file to obtain test data records in a uniform format; A credibility determination module is used to determine the credibility of each test data record based on the test time in each test data record and the acquisition time; The data filtering module is used to filter the test data records according to their credibility to obtain credible test data records; The quality interception module is used to determine whether to intercept the electronic product based on each of the trusted test data records.

10. A terminal device, characterized in that, The terminal device includes a processor and a memory, the memory storing a computer program, and the processor executing the computer program to implement the electronic product quality interception method according to any one of claims 1-8.

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