Infrared image anti-reflection method, device, system and electronic equipment for photovoltaic module

Abstract

The application discloses a kind of photovoltaic module infrared image anti-reflection methods, device, system and electronic equipment, it is related to photovoltaic module technical field.The method comprises: obtaining the visible light image of photovoltaic module and the infrared image corresponding with visible light image, and according to visible light image obtains gray image;Judge whether there is anti-reflection area in visible light image;When there is no anti-reflection area in visible light image, according to the geographical position of photovoltaic module and the shooting time of infrared image, infrared image is carried out anti-reflection processing, and the infrared image of anti-reflection is obtained;When there is anti-reflection area in visible light image, according to gray image, infrared image is carried out anti-reflection processing, and the infrared image of anti-reflection is obtained.Thereby, it can realize effectively eliminating the interference of sunlight to the inspection result, and precision and speed are considered, and universality and adaptability are strong.

Description

Technical Field

[0001] This invention relates to the field of photovoltaic module technology, and in particular to a method, apparatus, system and electronic device for de-reflecting infrared images of photovoltaic modules. Background Technology

[0002] Currently, drone inspection has become the mainstream method for the operation and maintenance of photovoltaic power plants. By equipping drones with visible light cameras and infrared thermal imagers, surface defects of photovoltaic panels (such as hot spots, missing strings, and dust obstruction) can be quickly detected. However, in actual inspections, the direction of sunlight has a significant impact on the inspection results, especially in infrared thermal imaging. The intensity and angle of sunlight directly change the surface temperature of the photovoltaic panels, causing the temperature in directly sunlit areas to be higher and the temperature in shaded areas to be lower. This can easily be confused with actual hot spot faults on the photovoltaic panels, leading to a decrease in the accuracy of defect detection.

[0003] In related technologies, some rely on manual judgment, while others simply estimate the infrared scene based on temperature data. These methods are difficult to effectively eliminate the interference of sunlight on the inspection results, and they have poor versatility and weak adaptability, making it difficult to meet the high-efficiency inspection needs of large-scale photovoltaic power plants. Summary of the Invention

[0004] This invention aims to at least partially solve one of the technical problems in related technologies. Therefore, the first objective of this invention is to propose a method for de-reflecting infrared images of photovoltaic modules, effectively eliminating the interference of sunlight on inspection results, and possessing strong versatility and adaptability.

[0005] The second objective of this invention is to provide an electronic device.

[0006] The third objective of this invention is to provide a device for de-reflecting infrared images of photovoltaic modules.

[0007] The fourth objective of this invention is to provide a photovoltaic module infrared image de-reflection system.

[0008] To achieve the above objectives, a first aspect of the present invention provides a method for de-reflecting infrared images of photovoltaic modules. The method includes: acquiring a visible light image of the photovoltaic module and an infrared image corresponding to the visible light image, and obtaining a grayscale image based on the visible light image; determining whether a reflective region exists in the visible light image; when no reflective region exists in the visible light image, performing de-reflection processing on the infrared image based on the geographical location of the photovoltaic module and the shooting time of the infrared image to obtain a de-reflected infrared image; when a reflective region exists in the visible light image, performing de-reflection processing on the infrared image based on the grayscale image to obtain a de-reflected infrared image.

[0009] In addition, the photovoltaic module infrared image de-reflection method according to embodiments of the present invention may also have the following additional technical features: According to one embodiment of the present invention, the number of photovoltaic modules is multiple, and the visible light image includes multiple photovoltaic module regions corresponding one-to-one with the multiple photovoltaic modules. The step of determining whether there is a reflective region in the visible light image includes: obtaining a shadow region in the visible light image, and obtaining a target photovoltaic module region from the multiple photovoltaic module regions that satisfies a preset proximity relationship with the shadow region; determining whether there is a bright region in the target photovoltaic module region; when there is a bright region in the target photovoltaic module region, there is a reflective region in the visible light image.

[0010] According to an embodiment of the present invention, determining whether a bright area exists in the target photovoltaic module region includes: obtaining a first target region in the grayscale image corresponding to the target photovoltaic module region; obtaining the total number of pixels in the first target region and the grayscale value of each pixel; obtaining a first number of pixels in the first target region whose grayscale value is greater than a preset grayscale value threshold based on the pixel grayscale value; and determining that a bright area exists in the target photovoltaic module region when the ratio between the first number and the total number of pixels is greater than a preset ratio threshold.

[0011] According to one embodiment of the present invention, the step of performing anti-reflection processing on the infrared image based on the geographical location of the photovoltaic module and the shooting time of the infrared image to obtain an anti-reflection infrared image includes: obtaining the solar declination angle and solar hour angle based on the shooting time; obtaining the solar altitude angle and solar azimuth angle based on the geographical location, the solar declination angle, and the solar hour angle; and correcting the pixel value of each infrared image pixel in the infrared image based on the solar altitude angle, the solar azimuth angle, the state of the photovoltaic module when the infrared image was taken, and the state of the camera when the infrared image was taken to obtain an anti-reflection infrared image.

[0012] According to one embodiment of the present invention, the photovoltaic module state includes the photovoltaic panel tilt angle and the photovoltaic panel orientation angle, and the camera state includes the camera pitch angle and the camera yaw angle.

[0013] According to one embodiment of the present invention, for each of the infrared image pixels, the pixel value of the infrared image pixel is corrected according to the following formula: , , , , , , , , , in, The tilt angle of the photovoltaic panel is [missing information]. The photovoltaic panel's orientation angle is... It is the normal vector. Let x be the x-axis component of the normal vector in the first preset coordinate system. Let y be the component of the normal vector in the first preset coordinate system. Let z be the z-axis component of the normal vector in the first preset coordinate system. The solar altitude angle is... The solar azimuth angle. Let be the incident vector. Let x be the x-axis component of the incident vector in the second preset coordinate system. Let y be the y-axis component of the incident vector in the second preset coordinate system. Let z be the z-axis component of the incident vector in the second preset coordinate system. The camera's pitch angle, Let yaw angle be the angle of the camera. To observe the vector, The x-axis component of the observation vector in the third preset coordinate system. The y-axis component of the observation vector in the third preset coordinate system. Let r be the z-axis component of the observation vector in the third preset coordinate system, r be the reflection vector, and n be the normalized normal vector. The normalized incident vector, As an intermediate variable, The diffuse reflectance coefficient is... To achieve full reflectance, The specular reflection coefficient, The observed vector is the normalized version. The surface roughness of the photovoltaic module. For specular reflection brightness, These are the corrected pixel values. The surface emissivity of the photovoltaic module. These are the pixel values ​​before correction.

[0014] According to one embodiment of the present invention, the step of performing anti-reflection processing on the infrared image based on the grayscale image includes: obtaining a second target region in the infrared image corresponding to the reflective region; and adjusting the pixel value of the infrared image pixel for each infrared image pixel in the second target region based on the grayscale value of the corresponding grayscale image pixel in the grayscale image.

[0015] To achieve the above objectives, a second aspect of the present invention provides an electronic device, including a memory, a processor, and a computer program stored in the memory and running on the processor, wherein when the computer program is executed by the processor, it implements the above-described method for de-reflecting infrared images of photovoltaic modules.

[0016] To achieve the above objectives, a third aspect of the present invention provides a photovoltaic module infrared image de-reflection device, comprising: an acquisition module for acquiring a visible light image of the photovoltaic module and an infrared image corresponding to the visible light image, and obtaining a grayscale image based on the visible light image; a judgment module for determining whether a reflective area exists in the visible light image; and a de-reflection module for, when no reflective area exists in the visible light image, performing de-reflection processing on the infrared image based on the geographical location of the photovoltaic module and the shooting time of the infrared image to obtain a de-reflected infrared image; and when a reflective area exists in the visible light image, performing de-reflection processing on the infrared image based on the grayscale image to obtain a de-reflected infrared image.

[0017] To achieve the above objectives, a fourth aspect of the present invention provides a photovoltaic module infrared image de-reflection system, including the aforementioned photovoltaic module infrared image de-reflection device.

[0018] According to embodiments of the present invention, a photovoltaic module infrared image de-reflection method, apparatus, system, and electronic device acquire a visible light image of the photovoltaic module and a corresponding infrared image, and obtain a grayscale image based on the visible light image; determine whether a reflective area exists in the visible light image; when no reflective area exists in the visible light image, perform de-reflection processing on the infrared image based on the geographical location of the photovoltaic module and the shooting time of the infrared image to obtain a de-reflected infrared image; when a reflective area exists in the visible light image, perform de-reflection processing on the infrared image based on the grayscale image to obtain a de-reflected infrared image. Therefore, when a reflective area exists in the visible light image, performing de-reflection processing on the infrared image based on the grayscale image obtained from the visible light image can achieve simple and efficient de-reflection; when no reflective area exists in the visible light image, performing de-reflection processing on the infrared image based on the geographical location of the photovoltaic module and the shooting time of the infrared image can achieve de-reflection even when no reflective area exists in the visible light image. Thus, it can effectively eliminate the interference of sunlight on the inspection results, while balancing accuracy and speed, and exhibiting strong versatility and adaptability.

[0019] Additional aspects and advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Attached Figure Description

[0020] Figure 1 This is a flowchart of a photovoltaic module infrared image de-reflection method according to an embodiment of the present invention; Figure 2 This is the first example of a visible light image; Figure 3 This is the infrared image of the first example before dereflection; Figure 4 This is the second example of a visible light image; Figure 5 This is the infrared image of the second example before dereflection; Figure 6 This is the de-reflected infrared image of the first example; Figure 7 This is a structural block diagram of an electronic device according to an embodiment of the present invention; Figure 8 This is a structural block diagram of the photovoltaic module infrared image de-reflection device according to an embodiment of the present invention; Figure 9 This is a structural block diagram of the photovoltaic module infrared image de-reflection system according to an embodiment of the present invention. Detailed Implementation

[0021] The following description, with reference to the accompanying drawings, outlines a method, apparatus, system, and electronic device for de-reflecting infrared images of photovoltaic modules according to embodiments of the present invention. Throughout the description, the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions. The embodiments described with reference to the accompanying drawings are exemplary and should not be construed as limiting the present invention.

[0022] Figure 1 This is a flowchart of a photovoltaic module infrared image de-reflection method according to an embodiment of the present invention.

[0023] When a device equipped with an infrared camera photographs photovoltaic modules, due to the specular reflection characteristics of the photovoltaic module's glass surface, when the angle of solar incidence and the infrared camera's viewing angle are close to the reflection angle, the infrared camera will capture a strong solar reflection signal, which appears as a false high-temperature area in the infrared image. This is easily misidentified as a hot spot or other defect by traditional detection algorithms. See details... Figure 2 and Figure 3 The example shown, where, Figure 2 Visible light image, Figure 3 To and Figure 2 The infrared image corresponding to the visible light image shown.

[0024] It can be seen that, due to Figure 2 The lower right corner of the visible light image shown has a reflection, causing... Figure 3 The infrared image shown has a false high-temperature area in the lower right corner. This false high-temperature area is caused by the reflection of the photovoltaic module, which makes it appear as a hot spot or a broken string. This directly affects the accuracy of subsequent AI diagnosis by the drone.

[0025] Therefore, this invention proposes a method for de-reflecting infrared images of photovoltaic modules.

[0026] like Figure 1 As shown, the method for de-reflecting infrared images of photovoltaic modules includes: S11, acquire the visible light image of the photovoltaic module and the infrared image corresponding to the visible light image, and obtain the grayscale image based on the visible light image.

[0027] The aforementioned visible light and infrared images can be images taken by drones equipped with visible light and infrared cameras during inspections.

[0028] The aforementioned visible light image and the corresponding infrared image can be images captured simultaneously by a visible light camera and an infrared camera on a drone, targeting the same photovoltaic module.

[0029] Since visible light and infrared images are usually taken at a certain height, both images may include multiple photovoltaic module areas corresponding to multiple photovoltaic modules.

[0030] Furthermore, after acquiring visible light and infrared images, registration and preprocessing of the visible light and infrared images can be performed.

[0031] The above-mentioned preprocessing for registration of visible light and infrared images may include converting the visible light image to a grayscale image and performing normalization processing; using bilinear interpolation to adjust the infrared temperature image to the same size as the visible light image; extracting and matching feature points of the two images based on the SIFT feature matching algorithm; and completing pixel-level registration through affine transformation to ensure that the pixel positions correspond one-to-one and eliminate positional deviations caused by parallax and attitude shift.

[0032] S12, determine whether there is a reflective area in the visible light image.

[0033] There are two situations regarding the reflection of photovoltaic modules.

[0034] For the first scenario, please refer to [link / reference needed]. Figure 2 and Figure 3 Reflection is present in both visible light and infrared images.

[0035] In the second case, the visible light image can be found here. Figure 4 The example shown can be found in the infrared image. Figure 5 The example shown.

[0036] As can be seen, the reflection phenomenon in the visible light image is not obvious, and there is no obvious shadow, but the reflection phenomenon in the left half of the infrared image is more obvious.

[0037] Therefore, it is necessary to first identify whether there are reflective areas in the visible light image, so as to determine how to remove reflections from the infrared image based on whether there are reflective areas in the visible light image.

[0038] In one specific embodiment, the number of photovoltaic modules is multiple, and the visible light image includes multiple photovoltaic module regions that correspond one-to-one with the multiple photovoltaic modules.

[0039] At this point, the above-mentioned determination of whether there is a reflective area in the visible light image includes: obtaining the shadow area in the visible light image, and obtaining the target photovoltaic module area that satisfies a preset proximity relationship with the shadow area from multiple photovoltaic module areas; determining whether there is a bright area in the target photovoltaic module area; when there is a bright area in the target photovoltaic module area, there is a reflective area in the visible light image.

[0040] When there are no shadow areas in the visible light image, it can be directly concluded that there are no reflective areas in the visible light image.

[0041] The aforementioned shadowed areas can be identified from visible light images using commonly used image morphology algorithms.

[0042] The aforementioned preset proximity relationship can be intersecting with the target area, touching it, or being less than a preset distance threshold. For example, assuming the preset proximity relationship is that the distance is less than the preset distance threshold, the distance between multiple photovoltaic module areas and the shaded area can be obtained, and the photovoltaic module area with a distance less than the preset distance threshold can be used as the target photovoltaic module area.

[0043] The above-mentioned determination of whether there is a bright area in the target photovoltaic module area includes: obtaining a first target area in a grayscale image corresponding to the target photovoltaic module area; obtaining the total number of pixels in the first target area and the grayscale value of each pixel; obtaining a first number of pixels in the first target area whose grayscale value is greater than a preset grayscale value threshold based on the pixel grayscale value; when the ratio between the first number and the total number of pixels is greater than a preset ratio threshold, there is a bright area in the target photovoltaic module area.

[0044] The aforementioned preset grayscale threshold can be, for example, 200. That is, it is necessary to obtain the grayscale values ​​of all pixels in the first target area, find the pixels with grayscale values ​​greater than 200, obtain the first number, divide the first number by the total number of pixels, and compare the division result with the preset ratio threshold.

[0045] The aforementioned preset ratio threshold ranges from 2% to 5%.

[0046] S13, when there is no reflective area in the visible light image, the infrared image is de-reflected according to the geographical location of the photovoltaic module and the shooting time of the infrared image to obtain a de-reflected infrared image.

[0047] The above-mentioned process of de-reflecting infrared images based on the geographical location of photovoltaic modules and the shooting time of infrared images to obtain de-reflecting infrared images includes: obtaining the solar declination angle and solar hour angle based on the shooting time; obtaining the solar altitude angle and solar azimuth angle based on the geographical location, solar declination angle, and solar hour angle; and correcting the pixel value of each infrared image pixel in the infrared image based on the solar altitude angle, solar azimuth angle, the state of the photovoltaic modules when the infrared image was taken, and the state of the camera when the infrared image was taken, to obtain a de-reflecting infrared image.

[0048] The time when the aforementioned infrared image was taken includes the day of the year (1-365) in which the infrared image was taken, as well as the local solar time at the location where the infrared image was taken.

[0049] The solar declination angle mentioned above can be calculated using the following formula: , in, The solar declination angle, It refers to the day of the year.

[0050] The solar hour angle mentioned above can be calculated using the following formula: , in, t is the solar hour angle, and t is the local solar time.

[0051] As an example, suppose an infrared image was taken at 8:00 AM on January 2nd, then n is 2 and t is 8.

[0052] The geographical location of the aforementioned photovoltaic module can be determined by the geographical latitude of the photovoltaic power station that includes the photovoltaic module. In other words, the dimensional information of the photovoltaic power station can be obtained using a positioning device, and this dimensional information can be used as the geographical location of all photovoltaic modules in the photovoltaic power station.

[0053] The solar altitude angle mentioned above can be calculated using the following formula: , Where h is the solar altitude angle, The latitude is the latitude of the photovoltaic power station that includes the aforementioned photovoltaic modules.

[0054] The solar azimuth angle mentioned above can be calculated using the following formula: , Where A is the solar azimuth angle.

[0055] The aforementioned photovoltaic module status includes the photovoltaic panel tilt angle and photovoltaic panel orientation angle, while the camera status includes the camera pitch angle and camera yaw angle.

[0056] Furthermore, for each infrared image pixel in the infrared image, the pixel value of the infrared image pixel can be corrected according to the following formula: , , , , , , , , , in, The tilt angle of the photovoltaic panel. The angle of the photovoltaic panel. It is the normal vector. Let x be the x-axis component of the normal vector in the first preset coordinate system. The y-axis component of the normal vector in the first preset coordinate system. The z-axis component of the normal vector in the first preset coordinate system. The solar altitude angle, The solar azimuth angle. Let be the incident vector. Let x be the x-axis component of the incident vector in the second preset coordinate system. Let y be the y-axis component of the incident vector in the second preset coordinate system. Let z be the z-axis component of the incident vector in the second preset coordinate system. For camera tilt angle, For the camera yaw angle, To observe the vector, To observe the x-axis components of the vector in the third preset coordinate system, To observe the y-axis component of the vector in the third preset coordinate system, To observe the z-axis component of the vector in the third preset coordinate system, r is the reflection vector and n is the normalized normal vector. The normalized incident vector, As an intermediate variable, The diffuse reflectance coefficient is... To achieve full reflectance, The specular reflection coefficient, This is the normalized observation vector. The surface roughness of photovoltaic modules, For specular reflection brightness, These are the corrected pixel values. The surface emissivity of a photovoltaic module, These are the pixel values ​​before correction.

[0057] The first, second, and third preset coordinate systems mentioned above can all use the same coordinate system, as long as they can meet the requirements of the above calculation formula.

[0058] The above diffuse reflectance coefficient The value of can be 0.8, and the above specular reflection coefficient The value of can be 0.2, representing the surface roughness of the aforementioned photovoltaic modules. The value can be 10, and the above diffuse reflectance brightness and specular reflection brightness The value of can be 1. The surface emissivity of the above components The value can be 0.85.

[0059] Since ambient light is negligible during drone inspections, but sunlight, when incident on photovoltaic modules as parallel light, enters the drone's camera through a combination of specular and diffuse reflection, ultimately generating an image, the aforementioned method can be used to obtain intermediate variables characterizing diffuse and specular reflection. Then based on intermediate variables The pixel value of each infrared image pixel is corrected to eliminate the false high temperature caused by reflection in the infrared image, thereby achieving de-reflection of the infrared image.

[0060] S14. When there is a reflective area in the visible light image, the infrared image is de-reflected based on the grayscale image to obtain a de-reflected infrared image.

[0061] When there are reflective areas in a visible light image, since the visible light image has already indicated the location of the reflective areas, the infrared image can be directly de-reflected based on the visible light image.

[0062] Specifically, the process of de-reflecting the infrared image based on the grayscale image includes: obtaining a second target region in the infrared image corresponding to the reflective region; and adjusting the pixel value of each infrared image pixel in the second target region according to the grayscale value of the corresponding grayscale image pixel in the grayscale image.

[0063] For any infrared image pixel in the second target region, the pixel value of that infrared image pixel can be adjusted using the following formula: , in, These are the adjusted pixel values. These are the pixel values ​​before adjustment. This is the fitting coefficient, which can take a value of 0.35. It is the grayscale value of the grayscale image pixel that corresponds to the pixel in the infrared image.

[0064] Using this method Figure 3 The result of processing the infrared image shown is shown below. Figure 6 ,visible, Figure 3 The false high temperature in the lower right corner has been eliminated.

[0065] In summary, the photovoltaic module infrared image de-reflection method of this embodiment of the invention acquires a visible light image of the photovoltaic module and an infrared image corresponding to the visible light image, and obtains a grayscale image based on the visible light image; determines whether there is a reflective area in the visible light image; when there is no reflective area in the visible light image, performs de-reflection processing on the infrared image based on the geographical location of the photovoltaic module and the shooting time of the infrared image to obtain a de-reflected infrared image; when there is a reflective area in the visible light image, performs de-reflection processing on the infrared image based on the grayscale image to obtain a de-reflected infrared image. Therefore, when reflective areas exist in the visible light image, de-reflection processing of the infrared image can be achieved simply and efficiently by using the grayscale image obtained from the visible light image. When no reflective areas exist in the visible light image, de-reflection processing of the infrared image can be performed based on the geographical location of the photovoltaic module and the shooting time of the infrared image. This achieves de-reflection even if there are no reflective areas in the visible light image, thus effectively eliminating the interference of sunlight on the inspection results. It also balances accuracy and speed, and has strong versatility and adaptability. For example, it is not only suitable for scenarios with strong light, but also for scenarios with weak light and inconspicuous reflection, and can be widely applied to various photovoltaic power stations, such as those in plains, mountains, deserts, and floating photovoltaic power stations. Moreover, only a single visible light or infrared image, along with environmental data such as the latitude and longitude of the shooting location and the shooting time, is required to quickly calculate the results, without the need for annotation and pre-training of a large number of images. Furthermore, it has good interpretability, with each step having an analytical solution based on the calculation formula, which is easy to understand and debug, and also easy to perform targeted parameter optimization for special field conditions, such as high-altitude and cold environments.

[0066] Furthermore, the present invention proposes an electronic device.

[0067] Figure 7 This is a structural block diagram of an electronic device according to an embodiment of the present invention.

[0068] like Figure 7 As shown, the electronic device 500 includes a processor 501 and a memory 503. The processor 501 and the memory 503 are connected, for example, via a bus 502. Optionally, the electronic device 500 may also include a transceiver 504. It should be noted that in practical applications, the transceiver 504 is not limited to one type, and the structure of this electronic device 500 does not constitute a limitation on the embodiments of the present invention.

[0069] Processor 501 may be a CPU (Central Processing Unit), a general-purpose processor, a DSP (Digital Signal Processor), an ASIC (Application Specific Integrated Circuit), an FPGA (Field Programmable Gate Array), or other programmable logic devices, transistor logic devices, hardware components, or any combination thereof. It can implement or execute the various exemplary logic blocks, modules, and circuits described in conjunction with the disclosure of this invention. Processor 501 may also be a combination that implements computational functions, such as including one or more microprocessor combinations, a combination of a DSP and a microprocessor, etc.

[0070] Bus 502 may include a pathway for transmitting information between the aforementioned components. Bus 502 may be a PCI (Peripheral Component Interconnect) bus or an EISA (Extended Industry Standard Architecture) bus, etc. Bus 502 can be divided into address bus, data bus, control bus, etc. For ease of representation, Figure 7 The bus is represented by a single thick line, but this does not mean that there is only one bus or one type of bus.

[0071] The memory 503 is used to store a computer program corresponding to the photovoltaic module infrared image de-reflection method of the above embodiments of the present invention. The computer program is controlled and executed by the processor 501. The processor 501 is used to execute the computer program stored in the memory 503 to implement the content shown in the foregoing method embodiments.

[0072] in, Figure 7 The electronic device 500 shown is merely an example and should not be construed as limiting the functionality and scope of use of the embodiments of the present invention.

[0073] The electronic device according to the present invention, by implementing the photovoltaic module infrared image de-reflection method of the commercial embodiment, can effectively eliminate the interference of sunlight on the inspection results, while taking into account both accuracy and speed, and has strong versatility and adaptability.

[0074] Furthermore, this invention proposes a device for de-reflecting infrared images of photovoltaic modules.

[0075] Figure 8 This is a structural block diagram of the photovoltaic module infrared image de-reflection device according to an embodiment of the present invention.

[0076] like Figure 8 As shown, the photovoltaic module infrared image de-reflection device 100 includes: an acquisition module 101, used to acquire a visible light image of the photovoltaic module and an infrared image corresponding to the visible light image, and obtain a grayscale image based on the visible light image; a judgment module 102, used to determine whether there is a reflective area in the visible light image; and a de-reflection module 103, used to perform de-reflection processing on the infrared image based on the geographical location of the photovoltaic module and the shooting time of the infrared image when there is no reflective area in the visible light image, to obtain a de-reflected infrared image; and to perform de-reflection processing on the infrared image based on the grayscale image when there is a reflective area in the visible light image, to obtain a de-reflected infrared image.

[0077] It should be noted that other specific embodiments of the photovoltaic module infrared image de-reflection device of the present invention can refer to the photovoltaic module infrared image de-reflection method of the above embodiments.

[0078] The photovoltaic module infrared image de-reflection device according to embodiments of the present invention can effectively eliminate the interference of sunlight on the inspection results, while taking into account both accuracy and speed, and has strong versatility and adaptability.

[0079] Furthermore, this invention proposes an infrared image de-reflection system for photovoltaic modules.

[0080] Figure 9 This is a structural block diagram of the photovoltaic module infrared image de-reflection system according to an embodiment of the present invention.

[0081] like Figure 9 As shown, the photovoltaic module infrared image de-reflection system 10 includes the aforementioned photovoltaic module infrared image de-reflection device 100.

[0082] The photovoltaic module infrared image de-reflection system according to embodiments of the present invention can effectively eliminate the interference of sunlight on inspection results, while balancing accuracy and speed, and has strong versatility and adaptability.

[0083] It should be noted that the logic and / or steps represented in the flowchart or otherwise described herein can be considered as a ordered list of executable instructions for implementing logical functions, which can be embodied in any computer-readable medium for use by, or in conjunction with, an instruction execution system, apparatus, or device (such as a computer-based system, a processor-included system, or other system that can fetch and execute instructions from, an instruction execution system, apparatus, or device). For the purposes of this specification, "computer-readable medium" can be any means that can contain, store, communicate, propagate, or transmit programs for use by, or in conjunction with, an instruction execution system, apparatus, or device. More specific examples (a non-exhaustive list) of computer-readable media include: an electrical connection having one or more wires (electronic device), a portable computer disk drive (magnetic device), random access memory (RAM), read-only memory (ROM), erasable and editable read-only memory (EPROM or flash memory), fiber optic devices, and portable optical disc read-only memory (CDROM). Alternatively, the computer-readable medium may be paper or other suitable media on which the program can be printed, since the program can be obtained electronically, for example, by optically scanning the paper or other medium, followed by editing, interpreting, or otherwise processing as necessary, and then stored in a computer memory.

[0084] It should be understood that various parts of the present invention can be implemented in hardware, software, firmware, or a combination thereof. In the above embodiments, multiple steps or methods can be implemented in software or firmware stored in memory and executed by a suitable instruction execution system. If implemented in hardware, as in another embodiment, it can be implemented using any one or a combination of the following techniques known in the art: discrete logic circuits having logic gates for implementing logical functions on data signals, application-specific integrated circuits (ASICs) having suitable combinational logic gates, programmable gate arrays (PGAs), field-programmable gate arrays (FPGAs), etc.

[0085] In the description of this specification, references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0086] In the description of this specification, the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," and "circumferential" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and should not be construed as limiting the present invention.

[0087] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this invention, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0088] In this specification, unless otherwise stated, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise explicitly defined. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0089] In this invention, unless otherwise explicitly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature is in indirect contact with the second feature through an intermediate medium. Furthermore, "above," "over," and "on top" of the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0090] Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention. Those skilled in the art can make changes, modifications, substitutions and variations to the above embodiments within the scope of the present invention.

Claims

1. A method for de-reflecting infrared images of photovoltaic modules, characterized in that, The method includes: Acquire a visible light image of the photovoltaic module and an infrared image corresponding to the visible light image, and obtain a grayscale image based on the visible light image; Determine whether there are reflective areas in the visible light image; When there is no reflective area in the visible light image, the infrared image is de-reflected based on the geographical location of the photovoltaic module and the shooting time of the infrared image to obtain a de-reflected infrared image. When there is a reflective area in the visible light image, the infrared image is de-reflected based on the grayscale image to obtain a de-reflected infrared image.

2. The method for de-reflecting infrared images of photovoltaic modules according to claim 1, characterized in that, The number of photovoltaic modules is multiple, and the visible light image includes multiple photovoltaic module regions corresponding one-to-one with the multiple photovoltaic modules. Determining whether there are reflective regions in the visible light image includes: Obtain the shadow region in the visible light image, and obtain the target photovoltaic module region that satisfies a preset proximity relationship with the shadow region from the plurality of photovoltaic module regions; Determine whether there are any bright areas in the target photovoltaic module area; When there is a bright area in the target photovoltaic module area, there is a reflective area in the visible light image.

3. The method for de-reflecting infrared images of photovoltaic modules according to claim 2, characterized in that, The determination of whether there is a high-brightness area in the target photovoltaic module region includes: Obtain the first target region in the grayscale image that corresponds to the target photovoltaic module region; Obtain the total number of pixels in the first target region and the grayscale value of each pixel; The first number of pixels in the first target region whose grayscale value is greater than a preset grayscale value threshold is obtained based on the grayscale value of the pixels. When the ratio between the first quantity and the total number of pixels is greater than a preset ratio threshold, there is a bright area in the target photovoltaic module area.

4. The method for de-reflecting infrared images of photovoltaic modules according to claim 1, characterized in that, The step of performing de-reflection processing on the infrared image based on the geographical location of the photovoltaic module and the shooting time of the infrared image to obtain a de-reflection infrared image includes: The solar declination angle and solar hour angle are obtained based on the shooting time. The solar altitude angle and solar azimuth angle are obtained based on the geographical location, the solar declination angle, and the solar hour angle. The pixel values ​​of each infrared image pixel in the infrared image are corrected based on the solar altitude angle, the solar azimuth angle, the state of the photovoltaic module when the infrared image is captured, and the state of the camera when the infrared image is captured, to obtain a de-reflective infrared image.

5. The method for de-reflecting infrared images of photovoltaic modules according to claim 4, characterized in that, The photovoltaic module status includes the photovoltaic panel tilt angle and the photovoltaic panel orientation angle, and the camera status includes the camera pitch angle and the camera yaw angle.

6. The method for de-reflecting infrared images of photovoltaic modules according to claim 5, characterized in that, For each of the infrared image pixels, the pixel value of the infrared image pixel is corrected according to the following formula: ， ， ， ， ， ， ， ， ， in, The tilt angle of the photovoltaic panel is [missing information]. The photovoltaic panel's orientation angle is... It is the normal vector. Let x be the x-axis component of the normal vector in the first preset coordinate system. Let y be the component of the normal vector in the first preset coordinate system. Let z be the z-axis component of the normal vector in the first preset coordinate system. The solar altitude angle is... The solar azimuth angle. Let be the incident vector. Let x be the x-axis component of the incident vector in the second preset coordinate system. Let y be the y-axis component of the incident vector in the second preset coordinate system. Let z be the z-axis component of the incident vector in the second preset coordinate system. The camera's pitch angle, Let yaw angle be the angle of the camera. To observe the vector, The x-axis component of the observation vector in the third preset coordinate system. The y-axis component of the observation vector in the third preset coordinate system. Let r be the z-axis component of the observation vector in the third preset coordinate system, r be the reflection vector, and n be the normalized normal vector. The normalized incident vector, As an intermediate variable, The diffuse reflectance coefficient is... To achieve full reflectance, The specular reflection coefficient, The observed vector is the normalized version. The surface roughness of the photovoltaic module. For specular reflection brightness, These are the corrected pixel values. The surface emissivity of the photovoltaic module. These are the pixel values ​​before correction.

7. The method for de-reflecting infrared images of photovoltaic modules according to claim 1, characterized in that, The step of performing de-reflection processing on the infrared image based on the grayscale image includes: Obtain the second target region in the infrared image that corresponds to the reflective region; For each infrared image pixel in the second target region, the pixel value of the infrared image pixel is adjusted according to the gray value of the corresponding gray image pixel in the gray image.

8. An electronic device, characterized in that, The method includes a memory, a processor, and a computer program stored in the memory and running on the processor, wherein when the computer program is executed by the processor, it implements the method for de-reflecting infrared images of photovoltaic modules according to any one of claims 1-7.

9. A device for de-reflecting infrared images of photovoltaic modules, characterized in that, include: The acquisition module is used to acquire a visible light image of the photovoltaic module and an infrared image corresponding to the visible light image, and to obtain a grayscale image based on the visible light image; The judgment module is used to determine whether there is a reflective area in the visible light image; The de-reflection module is used to perform de-reflection processing on the infrared image based on the geographical location of the photovoltaic module and the shooting time of the infrared image when there is no reflective area in the visible light image, to obtain a de-reflection infrared image; and to perform de-reflection processing on the infrared image based on the grayscale image when there is a reflective area in the visible light image, to obtain a de-reflection infrared image.

10. A photovoltaic module infrared image de-reflection system, characterized in that, Including the photovoltaic module infrared image de-reflection device according to claim 9.

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