SSD reliability testing device and testing method

Abstract

The application belongs to the technical field of direct attached storage and specifically relates to a SSD reliability testing device and testing method, which uses NAND nonvolatile flash memory chip to store data and comprises a solid state disk, the solid state disk comprises a first circuit board, a main control chip, a cache, a flash memory particle and a first data transmission interface are welded on the first circuit board, and the solid state disk further comprises: an elastic washer arranged outside the first circuit board; a first seat ring and a second seat ring are inserted into each other on the first circuit board; wherein the elastic washer, the first seat ring and the second seat ring are all used for separating adjacent first circuit boards to prevent mutual bumping when the first circuit boards are taken and placed in batches, and are used for testing a solid state disk, which comprises a test cabinet, a control panel and a test cavity are arranged on the test cabinet at intervals. The application provides the solid state disk with batch feeding, accelerates the overall testing rhythm of direct attached storage, solves the problem that the testing efficiency is difficult to improve, and separates defective products and good products after testing.

Description

Technical Field

[0001] This invention belongs to the field of direct-attach storage technology, specifically relating to an SSD reliability testing device and testing method. Background Technology

[0002] Direct-Attached Storage (DAS) differs from storage area networks (SAND) and network-attached storage (NAT) which rely on computer networks to connect to storage devices. It includes solid-state drives (SSDs), hard disk drives (HDDs), optical disc drives, and other storage devices that are directly connected to the computer. Solid-state drives (SSDs) primarily use semiconductor chips (such as NAND flash memory chips) as their storage medium and have no moving mechanical parts.

[0003] Before a solid-state drive (SSD) leaves the factory, it is typically programmed into the main controller chip using a programming device and mass production tools. After programming, the SSD is subjected to high-intensity testing in an accelerated aging environment, such as a high-temperature environment, by an RDT (Reliability Demonstration Test) device to verify whether the product has met the pre-set reliability indicators.

[0004] In the production testing phase of solid-state drives (SSDs), while conventional automated testing equipment can process up to 300 units per hour, the loading process still requires manual insertion of each drive into the testing interface, making batch processing impossible. This bottleneck significantly slows down the overall testing pace, hindering efforts to improve testing efficiency. Summary of the Invention

[0005] The purpose of this invention is to provide an SSD reliability testing device and method that can support batch loading of solid-state drives, accelerate the overall testing pace of direct-attached storage, solve the problem of difficulty in improving testing efficiency, and separate defective and good products after testing.

[0006] The specific technical solution adopted by this invention is as follows: A solid-state drive (SSD) uses NAND flash memory chips to store data, comprising a first circuit board on which a controller chip, cache, flash memory chips, and a first data transmission interface are soldered, and further comprising: An elastic washer is disposed on the outside of the first circuit board; The first and second races are interlocked on the first circuit board; The elastic washer, the first seat ring, and the second seat ring are all used to separate adjacent first circuit boards to prevent them from bumping into each other when the first circuit boards are picked up and placed in batches.

[0007] An SSD reliability testing device for testing a solid-state drive includes a test cabinet, on which a control panel and a test chamber are spaced apart. The test chamber has a second data transmission interface connected to the control panel. The device also includes: The base and heat insulation channel are disposed inside the test chamber along the centerline of the second data transmission interface; The base includes a first square tube and a limiting step opened inside the first square tube, and the heat insulation channel includes a second square tube and a support rod welded inside the second square tube. The test chamber is divided into multiple test channels. Each test channel is equipped with multiple sets of second data transmission interfaces. Each set of second data transmission interfaces has a corresponding second square tube and support rod for batch loading of solid-state drives. When the first and second square tubes are inserted into the second data transmission interface, they are used to block heat convection between the solid-state drives.

[0008] As an alternative, it also includes: A suspension assembly is disposed on the first circuit board. The suspension assembly includes a fourth seat ring and a mounting block respectively bonded to both sides of the solid-state drive. A limit block is integrally disposed inside the fourth seat ring, and an elastic membrane and a plug are disposed at intervals on the mounting block. A locking assembly is disposed outside the second square tube. The locking assembly includes a support frame disposed outside each group of second square tubes. Wing bolts and clamping rods are installed at intervals on the support frame. One end of the support rod passes through the solid-state drive and the second square tube along the fourth seat ring axially, and the insertion rod passes through one end of the support rod for locking, while the clamping rod provides clamping force to the solid-state drive along the other end of the support rod for clamping action of the solid-state drive during batch loading. When the insertion rod is detached from the support rod, the clamping state of defective products in the solid-state drive can be released, thereby separating the defective products.

[0009] As an optional solution, the test channel is equipped with slide rails and trays connected sequentially along the second data transmission interface, and the trays are provided with ventilation holes and columns at intervals. The tray has a second circuit board detachably mounted on the outside of each group of second data transmission interfaces via a column, and each group of second data transmission interfaces is electrically connected to the control panel via the second circuit board.

[0010] As an alternative, the inner side of the first square tube is provided with a guide groove for limiting the second square tube, and the first flange plate and support leg can be detachably installed on both sides of the first square tube corresponding to each group of second data transmission interfaces. The first flange plate and the support leg are used to laterally position the first square tube along the second data transmission interface, which can ensure that the first square tube and the second square tube are spaced at the same interval.

[0011] As an alternative, a guide and a third seat ring are installed at intervals on the outer side of the second square tube, with the guide facing the first square tube along the longitudinal direction of the second data transmission interface; The third seat ring has a threaded hole that matches the thread of the wing bolt, which is used to provide support for the locking assembly.

[0012] As an alternative, the end of the insertion rod is fixed with an operating handle, and the elastic membrane and the mounting block are respectively provided with a first through hole and a second through hole for guiding the insertion rod; When the first through hole and the second through hole are facing each other, the insert rod can be inserted into both, thereby locking the support rod.

[0013] As an optional solution, two mounting blocks are provided on the outside of the support rod, and an elastic membrane is connected between the two mounting blocks; In the locked state, the support rod provides a compressive force to the elastic membrane, increasing the elastic potential energy of the elastic membrane. After the support rod is unlocked, it moves away from the solid-state drive under the action of the elastic potential energy of the elastic membrane.

[0014] As an alternative, a cantilever is welded between the support frame and the clamping rod. The cantilever is a hollow triangle, which is used to improve the stability of the clamping rod when clamping the solid-state drive.

[0015] An SSD reliability testing method, using an SSD reliability testing apparatus as described above, includes the following steps: Loading: The staff suspends the solid-state drives (SSDs) onto the support rods so that each set of second square tubes carries an SSD, and clamps the SSDs along the first and second retaining rings. The elastic deformation of the elastic washers is used to prevent the SSDs from being bumped or knocked. Loading: Each time the staff takes a set of second square tubes, they move the solid-state drive. During the process of the second square tube and the first square tube being inserted, the solid-state drive is inserted into the second data transmission interface, thus completing the batch loading. Test Start-up: After the material loading is completed, the staff closes the door of the test cabinet and operates the heating button on the control panel. The heating tubes and fans inside the test cabinet start and blow hot air into the test channel until the junction temperature of the solid-state drive reaches the set range. Load adjustment: Apply environmental stress to the solid-state drive to accelerate aging. In conjunction with the program written inside the control panel, apply electrical stress to the solid-state drive to simulate long-term use conditions, expose potential defects, and complete bad block management, data integrity verification and early failure screening. Temperature control: The test chamber is divided into multiple test channels, and the fan blows hot air so that the hot air passes through different test channels. At the same time, the first square tube and the second square tube are plugged into the second data transmission interface to block the heat convection between solid-state drives and reduce the temperature interference between solid-state drives. Test complete: Based on the test results, defective products are classified as good products. The locked state of defective products is released, allowing them to be released from the second square tube one after the other, thus enabling separate feeding.

[0016] The technical effects achieved by this invention are as follows: This invention provides a solid-state drive (SSD) capable of reliability verification testing. The SSD's pre-drilled holes are fitted with a removable protective structure, suitable for batch loading and unloading, preventing collisions during batch handling, improving the overall testing pace of the SSD, and solving the problem of difficulty in improving testing efficiency.

[0017] This invention provides a direct-attach storage and its reliability testing device, which simulates long-term product use conditions, quickly exposes potential defects in NAND flash memory, controller, firmware and process, and completes bad block management, data integrity verification and early failure screening.

[0018] This invention provides a solid-state drive (SSD) and its reliability testing device. During testing, the SSD is enclosed by two sets of transparent square tubes, allowing the light to pass through while simultaneously blocking heat convection between the SSDs, thus reducing temperature interference between them.

[0019] This invention provides a solid-state drive (SSD) and its reliability testing device. During testing, a suspension assembly and a locking assembly are added to two sets of transparent square tubes. These assemblies lock each set of SSDs in place for batch loading. After testing, the suspension and locking assemblies are operated to detach defective and good SSDs sequentially, achieving sorting. Attached Figure Description

[0020] Figure 1 This is a schematic diagram of the solid-state drive structure in Embodiment 1 of the present invention; Figure 2 This is the invention Figure 1 Exploded view of the intermediate elastic washer, the first seat ring, and the second seat ring; Figure 3 This is a schematic diagram of the SSD reliability testing device in the off state according to Embodiment 2 of the present invention; Figure 4 This is the invention Figure 3 A schematic diagram of an SSD reliability testing device in its open state; Figure 5 This is the invention Figure 4 Schematic diagram of the structure of the middle tray; Figure 6 This is the invention Figure 5 Top view of the second circuit board; Figure 7 This is the invention Figure 5 A schematic diagram of the structure of the second circuit board in the middle; Figure 8 This is the invention Figure 7 Top view of the first square tube in the middle; Figure 9 This is the invention Figure 7 Top view of the first flange plate; Figure 10 This is the invention Figure 9 Schematic diagram of the middle support leg; Figure 11 This is the invention Figure 7 A schematic diagram of the structure of a solid-state drive (SSD); Figure 12 This is the invention Figure 7 Top view of the second square tube in the middle; Figure 13 This is the invention Figure 12 Top view of the middle support rod; Figure 14 This is the invention Figure 13 Top view of the middle insertion rod; Figure 15 This is the invention Figure 13 Bottom view of the middle support rod; Figure 16 This is the invention Figure 13 A schematic diagram of the structure of the fourth ring in the middle; Figure 17 This is the invention Figure 13 Exploded view of the third seat ring and support frame; Figure 18 This is a flowchart of an SSD reliability testing method according to Embodiment 3 of the present invention.

[0021] The attached diagram lists the components represented by each number as follows: 1. Solid State Drive; 101. First Circuit Board; 102. Main Controller Chip; 103. Cache; 104. Flash Memory Chip; 105. First Data Transmission Interface; 106. Elastic Washer; 107. First Sealing Ring; 108. Second Sealing Ring; 2. Test cabinet; 201. Control panel; 3. Test chamber; 301. Slide rail; 302. Tray; 303. Ventilation hole; 304. Column; 305. Second circuit board; 4. Second data transmission interface; 5. Base; 501. First square tube; 502. Viewing window; 503. Limiting step; 504. Guide groove; 505. First flange plate; 506. Support leg; 6. Insulated channel; 601. Second square tube; 602. Guide component; 603. Third seat ring; 604. Support rod; 7. Suspension assembly; 701. Fourth seat ring; 702. Limiting block; 703. Mounting block; 704. Elastic diaphragm; 705. Insert rod; 706. Operating handle; 707. First through hole; 708. Second through hole; 8. Locking assembly; 801. Support frame; 802. Wing bolt; 803. Cantilever; 804. Clamping rod. Detailed Implementation

[0022] To make the objectives and advantages of this invention clearer, the invention will be specifically described below with reference to embodiments. It should be understood that the following text is merely used to describe one or more specific embodiments of the invention and does not strictly limit the scope of protection specifically claimed by the invention.

[0023] Example 1: like Figures 1-2 As shown, a solid-state drive (SSD) uses NAND non-volatile flash memory chips to store data, including SSD 1. SSD 1 includes a first circuit board 101, the size of which is 2.5 inches. A main control chip 102, a cache 103, a flash memory chip 104, and a first data transmission interface 105 are soldered on the first circuit board 101. Pins a and b of the cache 103 are soldered to the main control chip 102 and the flash memory chip 104, respectively. The first data transmission interface 105 is connected to the main control chip 102 through a data transmission bus. The first data transmission interface 105 adopts a SATA protocol interface with a transmission speed of 6Gb / s, and the data transmission speed of the entire solid-state drive is 550MB / s, or adopts an M.2 NVMe PCIe (Peripheral Component Interconnect Express) 3.0 interface, M.2 NVMe PCIe 4.0 interface, etc.; During production, workers use the stencil of an automatic solder paste printer to print solder paste onto PCBA pads to form the first circuit board 101. Then, a high-speed pick-and-place machine automatically picks up and solders the main control chip 102, cache 103, flash memory chip 104 and first data transmission interface 105 according to the production coordinate information, and solders them to the designated positions on the first circuit board 101 to form the solid-state drive 1. Meanwhile, the staff placed solid-state drive 1 into a high-temperature reflow oven for multi-temperature zone heating to melt the solder paste of solid-state drive 1, and then cooled and solidified it to complete the soldering. Then, the staff placed the soldered solid-state drive 1 into the Sinic-tek testing machine. Based on the production coordinate information, the machine automatically detected whether there were any missing or poorly soldered electronic components such as the main control chip 102, cache 103, flash memory chip 104, and first data transmission interface 105. For example, it tested whether the components used were SATA interface, M.2 NVMe PCIe 3.0 interface, or M.2 NVMe PCIe 4.0 interface. After visual inspection, the staff sent SSD 1 into the testing pipeline for firmware flashing K1, RDT testing, firmware flashing K2, BIT aging test, and firmware flashing K3 in sequence. Firmware burning K1 operation: It can burn the basic boot firmware, initialization firmware and simple test firmware to the main control chip 102, complete the identification of flash memory chip 104, channel initialization and basic hardware self-test, establish basic communication between the main control chip 102 and NAND Flash, and generate the initial bad block scan table. Firmware flashing K2 operation: Flashing intermediate firmware with complete FLT algorithm, bad block management strategy and test-specific parameters, re-sorting and masking weak blocks and unstable blocks marked in the previous test, calibrating performance parameters and SMART (Self-Monitoring, Analysis and Reporting Technology) monitoring items, verifying the overall function and reliability of the device, and ensuring that the product status meets the standards. Firmware burning K3 operation: Through mass production tools, the firmware is burned to the main control chip and flash memory chips in batches, completing full disk initialization, capacity calibration, SMART information configuration, encryption key injection and function verification, locking the final bad block mapping table and activating the complete read and write protocol, so that the SSD can be transformed from the test state to the finished product state that can be normally recognized by the host and run stably. After the burning process was completed, the staff installed a casing on the solid-state drive 1, forming a complete direct-attach storage product.

[0024] Specifically, RDT testing, or reliability verification testing, is a key step in the mass production and quality control of solid-state drives (SSDs). It accelerates aging through environmental stresses such as high-temperature aging and temperature cycling, combined with electrical stresses such as high-intensity sequential and random mixed read / write loads, power supply fluctuations, and abnormal power outages. This simulates the long-term operating conditions of the product, quickly exposing potential defects in NAND flash memory, controllers, firmware, and manufacturing processes. It also completes bad block management, data integrity verification, and early failure screening. Before the casing is installed, the reliability of the product is verified, ensuring that the SSD is stable and reliable in actual use.

[0025] See attached document Figure 1 and Figure 2To achieve batch RDT testing of solid-state drive 1, the staff inserted a first seat ring 107 and a second seat ring 108 into the two reserved holes on the top of the first circuit board 101. Elastic washers 106 were inserted into the first seat ring 107 and the second seat ring 108. During batch RDT testing, the staff loaded solid-state drives 1 into groups of 10 and placed them into the SSD reliability testing device. In batch testing, the elastic washer 106, the first seat ring 107, and the second seat ring 108 are all used to separate adjacent first circuit boards 101, enabling workers to stack the first circuit boards 101 horizontally, realize batch picking and loading, prevent mutual collisions when picking up and placing the first circuit boards 101 in batches, improve the overall testing rhythm of the solid-state drive 1, and solve the problem of difficulty in improving testing efficiency.

[0026] Example 2: like Figures 3-17 As shown, an SSD reliability testing device is used to test a solid-state drive as provided in Embodiment 1. It includes a test cabinet 2, on which a control panel 201 and a test chamber 3 are spaced apart. The control panel 201 is fixed to the outer surface of the test cabinet 2 with screws. The test chamber 3 contains a second data transmission interface 4 connected to the control panel 201, a base 5, and a heat insulation channel 6. (See also...) Figure 2 The test chamber 3 is divided into 6 test channels. Each test channel is equipped with 10 sets of second data transmission interfaces 4. The base 5 is positioned inside the test chamber 3 along the centerline of the second data transmission interfaces 4. Before loading, refer to... Figure 6 and Figure 7 Ten heat insulation channels 6 are fixed together with screws and steel plates. During loading, the staff will suspend the tested and burned solid-state drives 1 one by one inside the heat insulation channel 6 through the elastic washer 106, the first seat ring 107 and the second seat ring 108. The staff can move 10 solid-state drives 1 by hand in one heat insulation channel 6. At the same time, the cabinet door of the test cabinet 2 is opened, the heat insulation channel 6 is inserted into the designated base 5, and the first data transmission interface 105 of the solid-state drive 1 is inserted into the second data transmission interface 4, so that the solid-state drive 1 can interact with the control panel 201. See Figure 1 After the material loading is completed, the staff closes the door of the test cabinet 2, so that the solid-state drive 1 is inside the test channel with a certain degree of sealing, and operates the heating button on the control panel 201. The heating tube and fan inside the test cabinet 2 start up and blow hot air into the test channel until the junction temperature of the solid-state drive 1 reaches the set range. Reliability verification tests were conducted, and high-acceleration life tests were initiated by environmental stresses such as high-temperature aging and temperature cycling. In conjunction with the program written inside the control panel 201, high-intensity sequential and random mixed read and write loads, power supply fluctuations and abnormal power failures were applied to the solid-state drive 1 to simulate long-term use conditions of the product, quickly expose potential defects in NAND chips, controllers, firmware and processes, and complete bad block management, data integrity verification and early failure screening. Each of the first data transmission interfaces 105 is connected in series with a dual-color LED indicator. When the solid-state drive 1 is tested normally, the dual-color LED indicator emits a green light, while when the solid-state drive 1 is tested abnormally, the dual-color LED indicator emits a red light, which makes it easier for staff to distinguish between good and bad products after the reliability verification test of the solid-state drive 1.

[0027] It should be noted that the number of test channels and the second data transmission interface 4 can be adjusted according to production needs. For example, 8 test channels can be configured, with 12 sets of second data transmission interfaces 4 configured inside each test channel to meet the needs of higher production capacity. The second data transmission interface 4 can adopt SATA interface, PCIe 3.0 interface or PCIe 4.0 interface, etc.

[0028] See attached document Figure 4 and Figure 5 Inside each test channel, slide rails 301 and trays 302 are connected sequentially by screws along the horizontal direction of the second data transmission interface 4. When loading, the trays 302 divide the test chamber 3 into 6 test channels. Ventilation holes 303 and columns 304 for supporting the suspended solid-state drive 1 are provided on the trays 302 at intervals, which can form a three-dimensional ventilation structure, so that the hot air blown by the fan can flow along the ventilation holes 303 and columns 304 at intervals inside the test channels and cross different test channels. The tray 302 has a second circuit board 305 detachably mounted on the outside of the tray 302 via the column 304 for each group of second data transmission interfaces 4. Each group of second data transmission interfaces 4 is electrically connected to the control panel 201 via the second circuit board 305, realizing centralized power supply and data transmission for each group of solid-state drives 1.

[0029] See attached document Figure 7 and Figure 8 The base 5 includes a first square tube 501 and a limiting step 503 opened inside the first square tube 501. In order to facilitate the staff to observe the test status of the solid-state drive 1, the first square tube 501 is made of transparent acrylic or glass, which makes it easy for the staff to see through. Meanwhile, the inner and outer surfaces of the first square tube 501 can be coated with a transparent heat-insulating coating, such as indium tin oxide, tin antimony oxide and tungsten bronze compound, which allows the line of sight to pass through and can block heat convection between solid-state drives 1, reducing temperature interference between solid-state drives 1.

[0030] Specifically, to facilitate staff observation of the light emitted by the dual-color LED indicator, a glass viewing window 502 is embedded at the bottom of the first square tube 501, allowing staff to observe the dual-color LED indicator up close. The surface of the viewing window 502 is coated with a cross-linked polymer based on dynamic oxime-urethane bonds to prevent moisture from adhering.

[0031] See attached document Figure 8 , Figure 9 and Figure 12 The inner side of the first square tube 501 is provided with a guide groove 504 for limiting the second square tube 601. Each set of second data transmission interfaces 4 has a first flange plate 505 and a support leg 506 detachably installed on both sides of the first square tube 501 by screws. During installation, a round hole is opened on the support leg 506, the round hole is aligned with the reserved hole of the second circuit board 305, and the screw is passed through the round hole and the reserved hole and tightened in the threaded hole of the column 304 along the thread, thereby locking the first flange plate 505 and the support leg 506.

[0032] As an optional embodiment, the first flange plate 505 can be bonded to the first square tube 501 to improve the stability of batch feeding.

[0033] See attached document Figure 7 , Figure 12 and Figure 13 The heat insulation channel 6 includes a second square tube 601 and a support rod 604 welded inside the second square tube 601. After the solid-state drive 1 is burned, it can be suspended to the support rod 604 through the reserved hole on its top. The second square tube 601 and support rod 604 corresponding to each group of second data transmission interfaces 4 are used for batch loading of solid-state drives 1. When the first square tube 501 and the second square tube 601 are inserted outside the second data transmission interface 4, they are used to block the heat convection between solid-state drives 1 and reduce the temperature interference between solid-state drives 1.

[0034] Specifically, in order to facilitate staff to observe the test status of solid-state drive 1, the second square tube 601 is made of transparent acrylic or glass, which allows staff to see through it easily. Meanwhile, the inner and outer surfaces of the second square tube 601 can be coated with a transparent heat-insulating coating, such as indium tin oxide, tin antimony oxide and tungsten bronze compound, which allows the line of sight to pass through and can block heat convection between solid-state drives 1, reducing temperature interference between solid-state drives 1.

[0035] The first flange plate 505 and the support leg 506 are used to laterally position the first square tube 501 along the second data transmission interface 4, which can ensure that the first square tube 501 and the second square tube 601 are spaced at the same interval, so that the first square tube 501 and the second square tube 601 can be smoothly inserted.

[0036] See attached document Figure 7 , Figure 12 and Figure 17 The outer side of the second square tube 601 is integrally milled or welded with a guide member 602. The guide member 602 is aligned with the first square tube 501 along the longitudinal direction of the second data transmission interface 4. During the insertion process of the first square tube 501 and the second square tube 601, the guide member 602 slides along the guide groove 504 to realize the foolproof design of the second square tube 601 and the first square tube 501, and improve the accuracy and smoothness of the insertion action. Each set of second square tubes 601 has a third seat ring 603 connected to both sides by screws or welding. The third seat ring 603 consists of two parallel T-shaped plates and two cross braces. The two cross braces are welded between the two T-shaped plates. The T-shaped plates have threaded holes. During installation, the workers fix the third seat ring 603 to the top of each set of second square tubes 601 by screws through the threaded holes, which makes it easy to pick up a set of second square tubes 601 at a time and provides a physical basis for the batch loading of solid-state drives 1.

[0037] See attached document Figure 17 In this embodiment, a locking assembly 8 is provided on the outside of the second square tube 601. The locking assembly 8 includes a support frame 801 provided on the outside of each group of second square tubes 601. Wing bolts 802 and clamping rods 804 are installed at intervals on the support frame 801. When loading, the solid-state drive 1 is suspended on the support rod 604 of the second square tube 601. At the same time, the operator moves the support frame 801 to press down the third seat ring 603, and drives the clamping rod 804 to press down the first seat ring 107, the second seat ring 108 and the elastic washer 106 of the solid-state drive 1 laterally. Then, the wing bolts 802 are inserted into the threaded holes on the support frame 801 and the T-shaped plate along the threads, thereby locking the solid-state drive 1, so that the operator can load a group of solid-state drives 1 and insert the second data transmission interface 4.

[0038] See attached document Figure 17 A cantilever 803 is welded between the support frame 801 and the clamping rod 804. The cantilever 803 is a hollow triangle that can support the clamping rod 804 in the horizontal direction, thereby improving the stability of the clamping rod 804 in clamping the solid-state drive 1.

[0039] See attached document Figure 12 , Figure 13 and Figure 14One end of the support rod 604 can pass through the solid-state drive 1 and the second square tube 601 along the fourth seat ring 701 axially. A suspension assembly 7 is installed on the surface of the first circuit board 101. The suspension assembly 7 includes a fourth seat ring 701 and a mounting block 703 respectively bonded to both sides of the solid-state drive 1. The number of mounting blocks 703 is configured to be two. An elastic membrane 704 and a plug 705 are provided between the two mounting blocks 703. Before loading, the operator pushes and stretches the elastic membrane 704 by passing one end of the support rod 604 through the gap between the two mounting blocks 703 until the support rod 604 reaches the designated position. The plug 705 is then inserted into the support rod 604 and the mounting block 703, so that the friction between the support rod 604 and the plug 705 is increased under the action of the elastic potential energy of the elastic membrane 704, thus completing the locking. When a defective product is detected, the worker pulls out the adjacent insertion rod 705 to release the locking state of the support rod 604, and then pulls the support rod 604 by hand until the support rod 604 is separated from the solid-state drive 1 and the second square tube 601. After the inspection is completed, the worker lifts the second square tube 601, the suspension assembly 7 and the locking assembly 8 upwards, so that the defective product is separated from the second square tube 601 and the locking assembly 8 under the friction of the second data transmission interface 4, thereby realizing the rapid separation of defective and good products, and subsequent unloading. Alternatively, when the locking assembly 8 is removed later, the defective product falls out of the second square tube 601, while the good product remains suspended on the suspension assembly 7, thus achieving rapid separation of the defective and good products.

[0040] Meanwhile, the fourth seat ring 701 has an integrated milled (or molded) limit block 702 inside, and the support rod 604 has a guide groove that matches the limit block 702. The limit block 702 is inserted into the guide groove to achieve a foolproof design and provide tangential support force to prevent the support rod 604 from rotating and loosening.

[0041] The fourth mounting ring 701 and the mounting block 703 can also be soldered to both sides of the solid-state drive 1. Both can be removed after the solder strips melt for maintenance or replacement.

[0042] See attached document Figure 13 , Figure 14 and Figure 15 The end of the insertion rod 705 is welded (or integrally milled) with an operating handle 706. The elastic membrane 704 and the mounting block 703 are respectively provided with a first through hole 707 and a second through hole 708 for guiding the insertion rod 705. When the support rod 604 reaches the designated position, the first through hole 707 and the second through hole 708 are aligned and can be inserted into the insertion rod 705, thereby locking the support rod 604.

[0043] See attached document Figure 12 and Figure 13When the support rod 604 is locked, it provides a squeezing force to the elastic membrane 704, which increases the elastic potential energy of the elastic membrane 704. After the support rod 604 is unlocked, it moves away from the solid-state drive 1 under the action of the elastic potential energy of the elastic membrane 704, reducing the difficulty of removing the support rod 604.

[0044] Example 3: like Figure 18 As shown, an SSD reliability testing method, using the SSD reliability testing apparatus provided in Embodiment 2, includes the following steps: Loading: After the solid-state drive 1 is burned, it can be suspended to the support rod 604 through the reserved hole on its top, so that each set of second square tubes 601 carries the solid-state drive 1 and clamps the solid-state drive 1 along the first seat ring 107 and the second seat ring 108. The elastic deformation of the elastic washer 106 is used to prevent the solid-state drive 1 from being bumped. Material loading: Each time the staff takes a set of second square tubes 601, moves solid-state drive 1. During the process of the second square tube 601 and the first square tube 501 being inserted, the solid-state drive 1 is inserted into the second data transmission interface 4 to complete the batch loading. Test Start-up: After the material loading is completed, the staff closes the cabinet door of test cabinet 2, so that solid-state drive 1 is inside the test channel with a certain degree of sealing, and operates the heating button on control panel 201. The heating tube and fan inside test cabinet 2 start up and blow hot air into the test channel until the junction temperature of solid-state drive 1 reaches the set range. Load adjustment: Through environmental stresses such as high-temperature aging and temperature cycling, the aging process is accelerated. Combined with the program written inside the control panel 201, the solid-state drive 1 is subjected to high-intensity sequential and random mixed read and write loads, power supply fluctuations and abnormal power failures, etc., to simulate the long-term use conditions of the product, quickly expose potential defects in NAND chips, controllers, firmware and processes, and complete bad block management, data integrity verification and early failure screening. Temperature control: The test chamber 3 is divided into 6 test channels, and the fan blows hot air so that the hot air passes through different test channels. At the same time, the first square tube 501 and the second square tube 601 are used to block the heat convection between solid-state drives 1 when the second data transmission interface 4 is plugged in, so as to reduce the temperature interference between solid-state drives 1. Test complete: Based on the test results, defective products and good products are classified. The locked state of defective products is released, allowing them to be released from the second square tube 601 one after the other, so that they can be fed separately.

[0045] The above description is merely an optional embodiment of the present invention. It should be noted that those skilled in the art can make various improvements and modifications without departing from the principle of the present invention, and these improvements and modifications should also be considered within the scope of protection of the present invention. Structures, devices, and operating methods not specifically described or explained in this invention, unless otherwise specified or limited, shall be implemented according to conventional means in the art.

Claims

1. A solid-state drive (SSD) using NAND flash memory chips to store data, comprising a SSD (1), the SSD (1) comprising a first circuit board (101), wherein a controller chip (102), a cache (103), flash memory chips (104), and a first data transmission interface (105) are soldered onto the first circuit board (101), characterized in that, Also includes: An elastic washer (106) is disposed on the outside of the first circuit board (101); The first retainer (107) and the second retainer (108) are interlocked on the first circuit board (101); The elastic washer (106), the first seat ring (107), and the second seat ring (108) are all used to separate adjacent first circuit boards (101) to prevent them from bumping into each other when the first circuit boards (101) are picked up and put in batches.

2. An SSD reliability testing device for testing a solid-state drive as described in claim 1, comprising a test cabinet (2), wherein a control panel (201) and a test cavity (3) are spaced apart on the test cabinet (2), and a second data transmission interface (4) connected to the control panel (201) is provided inside the test cavity (3), characterized in that, Also includes: The base (5) and the heat insulation channel (6) are arranged inside the test chamber (3) along the center line of the second data transmission interface (4); The base (5) includes a first square tube (501) and a limiting step (503) opened inside the first square tube (501), and the heat insulation channel (6) includes a second square tube (601) and a support rod (604) welded inside the second square tube (601). The test cavity (3) is divided into multiple test channels. Multiple sets of second data transmission interfaces (4) are configured inside the test channels. The second square tube (601) and support rod (604) corresponding to each set of second data transmission interfaces (4) are used for batch loading of solid-state drives (1). The first square tube (501) and the second square tube (601) are used to block the heat convection between the solid-state drives (1) when they are inserted outside the second data transmission interface (4).

3. The SSD reliability testing device according to claim 2, characterized in that, Also includes: The suspension assembly (7) is disposed on the first circuit board (101). The suspension assembly (7) includes a fourth seat ring (701) and a mounting block (703) respectively bonded to both sides of the solid-state drive (1). The fourth seat ring (701) is integrated with a limit block (702). The mounting block (703) is provided with an elastic membrane (704) and a plug (705) at intervals. Locking assembly (8) is disposed outside the second square tube (601). The locking assembly (8) includes a support frame (801) disposed outside each group of second square tubes (601). Wing bolts (802) and clamping rods (804) are installed at intervals on the support frame (801). Wherein, one end of the support rod (604) passes through the solid-state drive (1) and the second square tube (601) along the fourth seat ring (701) axially, and the insertion rod (705) passes through one end of the support rod (604) for locking, while the clamping rod (804) provides clamping force to the solid-state drive (1) along the other end of the support rod (604) for clamping action of the solid-state drive (1) during the batch loading process; When the insertion rod (705) is disengaged from the support rod (604), the clamping state of the defective product in the solid-state drive (1) can be released, and the defective product can be separated.

4. The SSD reliability testing device according to claim 2, characterized in that: Inside each test channel, slide rails (301) and trays (302) are connected sequentially along the second data transmission interface (4). Ventilation holes (303) and columns (304) are provided at intervals on the trays (302). The tray (302) is equipped with a second circuit board (305) for each group of second data transmission interfaces (4) via a column (304). Each group of second data transmission interfaces (4) is electrically connected to the control panel (201) via the second circuit board (305).

5. The SSD reliability testing device according to claim 2, characterized in that: The first square tube (501) has a guide groove (504) for limiting the second square tube (601) on its inner side. The first flange plate (505) and the support leg (506) are detachably installed on both sides of the first square tube (501) corresponding to each group of second data transmission interfaces (4). The first flange plate (505) and the support leg (506) are used to laterally position the first square tube (501) along the second data transmission interface (4), which can ensure that the first square tube (501) and the second square tube (601) are spaced at the same interval.

6. The SSD reliability testing device according to claim 3, characterized in that: The second square tube (601) is provided with a guide (602) and a third seat ring (603) at intervals on the outside. The guide (602) is directly opposite the first square tube (501) along the longitudinal direction of the second data transmission interface (4). The third seat ring (603) has a threaded hole that is compatible with the thread of the wing bolt (802) to provide support for the locking assembly (8).

7. The SSD reliability testing device according to claim 3, characterized in that: An operating handle (706) is fixed to the end of the insertion rod (705), and the elastic membrane (704) and the mounting block (703) are respectively provided with a first through hole (707) and a second through hole (708) for guiding the insertion rod (705). When the first through hole (707) and the second through hole (708) are facing each other, the two can insert the insert rod (705) to lock the support rod (604).

8. The SSD reliability testing device according to claim 3, characterized in that: The support rod (604) is provided with two mounting blocks (703) on its outside, and an elastic membrane (704) is connected between the two mounting blocks (703). In the locked state, the support rod (604) provides a squeezing force to the elastic membrane (704), which increases the elastic potential energy of the elastic membrane (704). After the support rod (604) is unlocked, it moves away from the solid-state drive (1) under the action of the elastic potential energy of the elastic membrane (704).

9. The SSD reliability testing device according to claim 3, characterized in that: A cantilever (803) is welded between the support frame (801) and the clamping rod (804). The cantilever (803) is a hollow triangle and is used to improve the stability of the clamping rod (804) clamping the solid-state drive (1).

10. An SSD reliability testing method, using an SSD reliability testing apparatus as described in any one of claims 2-9, characterized in that, Includes the following steps: Loading: The staff suspends the solid-state drive (1) on the support rod (604) so ​​that each set of second square tubes (601) carries the solid-state drive (1) and clamps the solid-state drive (1) along the first seat ring (107) and the second seat ring (108). The elastic deformation of the elastic washer (106) is used to prevent the solid-state drive (1) from being bumped. Loading: Each time the staff takes a set of second square tubes (601), moves the solid-state drive (1), and during the process of the second square tube (601) and the first square tube (501) being inserted, the solid-state drive (1) is inserted into the second data transmission interface (4) to complete the batch loading; Test start: After the material loading is completed, the staff closes the cabinet door of the test cabinet (2) and operates the heating button on the control panel (201). The heating tube and fan inside the test cabinet (2) start and blow hot air into the test channel until the junction temperature of the solid-state drive (1) reaches the set range. Adjusting the load: Applying environmental stress to the solid-state drive (1) to accelerate aging, and in conjunction with the program written inside the control panel (201), applying electrical stress to the solid-state drive (1) to simulate the long-term use conditions of the product, expose potential defects, and complete bad block management, data integrity verification and early failure screening. Temperature control: The test chamber (3) is divided into multiple test channels, and the fan blows hot air so that the hot air crosses different test channels. At the same time, the first square tube (501) and the second square tube (601) are plugged into the second data transmission interface (4) to block the heat convection between solid-state drives (1) and reduce the temperature interference between solid-state drives (1). Test complete: Based on the test results, defective products and good products are classified. The locked state of defective products is released, allowing defective products and good products to be released from the second square tube (601) one after the other, so that they can be fed separately.

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