Imaging device and system for the device

Abstract

An imaging apparatus for acquiring an image of a gemstone sample, the image containing gemstone data indicative of properties of the gemstone sample, the imaging apparatus comprising: a sample holder configured to support the gemstone sample; an electromagnetic radiation source configured to generate an excitation wave for transmission through the gemstone sample to produce a transmitted wave modified by the gemstone sample; an optical train disposed relative to the sample holder and the electromagnetic radiation source and optically aligned to either modulate the excitation wave to produce a modified excitation wave or to modulate the transmitted wave to produce a modified transmitted wave; a detector optically aligned with the sample holder, the electromagnetic radiation source and the optical train to detect the transmitted wave and / or the modified transmitted wave incident on the detector to acquire the image of the gemstone sample. Further disclosed are a system for determining gemstone parameters comprising the apparatus and a method of manufacture.

Description

Technical Field

[0001] Various aspects of this disclosure relate to an imaging apparatus for acquiring at least one image containing gem data indicating the properties of a gem sample, and a system for determining gem parameters indicating the properties of a gem sample. Background Technology

[0002] The following discussion of background is intended only to facilitate understanding of this disclosure. It should be understood that this discussion does not acknowledge or assume that any material mentioned was published in any jurisdiction, is known, or is part of common general knowledge for those skilled in the art prior to the priority date of this disclosure.

[0003] Traditional gem identification methods involve the use of numerous handheld analytical tools such as microscopes, polariscopes, dichroscopes, UV lamps, spectrometers, and refractometers. Identifying gemstones requires trained gemologists who can interpret the results obtained using these tools.

[0004] This traditional method of gem identification is time-consuming, expensive, and requires specialized knowledge and numerous analytical tools. Furthermore, the lack of objective, quantitative standards for determining gem color, coupled with the individuality of human visual perception and inconsistencies in environmental conditions during gem viewing, makes color determination subjective. Typically, gem identification is inconsistent and / or inaccurate, depending on the gemologist's data visualization and human interpretation of the data, which affects the gem's valuation.

[0005] Furthermore, gemstone traceability is crucial for providing transparency in the supply chain of custody, and the practice of marking gemstones with unique, traceable identifiers is a prerequisite for gemstone transactions. Laser engraving on gemstone facets or marking gemstones with non-removable DNA information are established and common methods. However, these methods are not entirely reliable, as laser engravings can be erased during gemstone cutting, and marking gemstones with non-removable DNA information can damage the gemstone's natural crystal structure, thus affecting its value.

[0006] Therefore, there is a need for improved imaging devices that address at least one of the aforementioned problems, and / or systems that include such improved imaging devices. Summary of the Invention

[0007] This disclosure is conceptualized as providing an improved imaging apparatus for acquiring gem data indicating the properties of gem samples, and a system including the improved imaging apparatus for determining gem parameters based on the gem data. To this end, the imaging apparatus integrates various gem analysis tools into a single device, which also includes a detector for acquiring at least one image of the gem sample, the image including gem data required for gem identification, the gem data indicating the gem sample properties such as its optical properties, geometric properties, color, clarity, origin, and magnified details of inclusions and / or growth structures. This disclosure also includes a system comprising an imaging apparatus in data communication with a processor including at least one machine learning algorithm for analyzing the gem data, and the system determining gem parameters based on the gem data. Gem parameters can aid in gem sample identification. In particular, this disclosure provides an objective and quantitative system for determining gem color, which is device-independent, unaffected by environmental conditions, and provides a platform for calculating the color difference between two gems, and for consistently describing and comparing gem colors. Additionally, this disclosure provides a method for determining a unique gem signature to track gems, a method that preserves the gem's original structure and value.

[0008] Therefore, the improved imaging devices and systems provide a platform for rapid, consistent, and accurate identification of gemstone samples, and eliminate the need for trained gemologists, thus providing an efficient and usable platform for a wide variety of users.

[0009] According to a first aspect of this disclosure, an imaging apparatus for acquiring at least one image of a gemstone sample, the at least one image including gemstone data indicating properties of the gemstone sample, the imaging apparatus comprising a sample holder configured to support the gemstone sample; an electromagnetic radiation source configured to generate an excitation wave for transmitting / passing through the gemstone sample to generate a transmitted wave modified by the gemstone sample; at least one optical instrument disposed and optically aligned relative to the sample holder and the electromagnetic radiation source, the at least one optical instrument configured to modulate the excitation wave for transmitting / passing through the gemstone sample to generate the modified excitation wave, or to modulate the transmitted wave to generate the modified transmitted wave; and a detector optically aligned with the sample holder, the electromagnetic radiation source and the at least one optical instrument, wherein the detector is configured to detect the transmitted wave and / or the modified transmitted wave incident on the detector to acquire the at least one image of the gemstone sample.

[0010] In various embodiments, the at least one optical instrument may include a first optical instrument located between the electromagnetic radiation source and the sample holder, the first optical instrument being configured to modulate the excitation wave passing through the gemstone sample to generate the modified excitation wave, wherein the first optical instrument includes: a first polarizing filter, a grating assembly, and / or a prism assembly.

[0011] In various embodiments, the at least one optical instrument may further include a second optical instrument located between the sample holder and the detector, the second optical instrument being configured to modulate the transmitted wave to generate a modified transmitted wave, wherein the second optical instrument includes a second polarizing filter.

[0012] In various embodiments, the first polarizing filter and / or the second polarizing filter are configured to be rotatable along the horizontal and / or vertical axes of the first polarizing filter and / or the second polarizing filter.

[0013] In various embodiments, the imaging apparatus may further include a calibrated refractometer scale providing optical alignment with the sample holder, the electromagnetic radiation source, the at least one optical instrument, and the detector, wherein the at least one optical instrument further includes: an optical plate, hemisphere, or semi-cylinder disposed adjacent to the sample holder, the optical plate, hemisphere, or semi-cylinder being configured to modulate the excitation wave to generate the modified excitation wave; and modulate the transmitted wave to generate the modified transmitted wave and project the modified transmitted wave onto the calibrated refractometer scale.

[0014] In various embodiments, the sample holder is configured to rotate along the horizontal, vertical, and / or axial axes of the sample holder.

[0015] In various embodiments, the imaging apparatus may further include a sample chamber disposed adjacent to the sample holder, the sample chamber being configured to contain optical fluid, wherein the sample chamber is further configured to receive the sample holder supporting the gemstone sample such that the gemstone sample is suspended in the optical fluid contained in the sample chamber.

[0016] In various embodiments, the wavelength range of the excitation wave is between 100 and 3000 nm, and optionally between 250 nm and 700 nm.

[0017] In various embodiments, the at least one image of the gemstone sample includes at least one cross-sectional image of the gemstone sample, each cross-sectional image being acquired along a longitudinal plane, a sagittal plane, and / or a transverse plane of the gemstone sample.

[0018] According to a second aspect of this disclosure, a system is provided for determining gemstone parameters indicating the properties of a gemstone sample, the system comprising the imaging apparatus of the first aspect; a processor communicating with the imaging apparatus, the processor being configured to: acquire at least one image of the gemstone sample, the image containing gemstone data indicating the properties of the gemstone sample; and determine the gemstone parameters based on the at least one image of the gemstone sample containing the gemstone data indicating the properties of the gemstone sample.

[0019] In various embodiments, the processor includes at least one machine learning algorithm for determining the gemstone parameters, the machine learning algorithm optionally including a deep learning algorithm. In some embodiments, the deep learning algorithm includes a convolutional neural network algorithm, a diffusion model, and / or a visual converter.

[0020] In various embodiments, the gemstone parameters may include optical parameters indicating the optical properties of the gemstone sample, wherein the optical parameters include: a refractive index parameter indicating the refractive index of the gemstone sample; a birefringence parameter indicating birefringence characteristics related to the difference between the refractive indices of at least two crystal axes of the gemstone sample; a pleochroism parameter indicating pleochroism characteristics related to the chromaticity of at least two crystal axes of the gemstone sample; an absorption parameter indicating a characteristic absorption spectrum related to the dispersion of the transmitted wave of the gemstone sample; and UV fluorescence and / or phosphorescence parameters indicating characteristic fluorescence and / or phosphorescence related to the transmitted wave of the gemstone sample.

[0021] In various embodiments, the gemstone parameters may further include species parameters indicating the category of the gemstone sample, wherein the species parameters are determined based on the determination of at least one of the refractive index parameter, the birefringence parameter, the pleochroism parameter, the absorption parameter, the UV fluorescence and / or phosphorescence parameter of the gemstone sample.

[0022] In various embodiments, the gemstone parameters further include geometric parameters indicating the geometric characteristics of the gemstone sample, wherein the geometric parameters include: a gemstone shape parameter indicating the shape and size of the gemstone sample; and a facet parameter indicating the cut of at least one facet of the gemstone sample. The processor is further configured to: construct a gemstone sample image based on at least one image of the gemstone sample; compare the gemstone sample image with each of a plurality of reference gemstone sample images, each reference gemstone sample image containing a reference shape and size of the reference gemstone sample and also containing a reference cut of at least one facet of the reference gemstone sample image; determine the gemstone shape parameter based on the comparison of the gemstone sample image with each of the reference gemstone sample images including the reference shape and size of the reference gemstone sample image; determine the facet parameter based on the comparison of the gemstone sample image with each of the reference gemstone sample images including the reference cut of the at least one facet of the reference gemstone sample image; and determine the geometric parameters based on at least one of the gemstone shape parameter and / or the facet parameter.

[0023] In various embodiments, the gemstone parameters may further include clarity parameters indicating the purity of the gemstone sample, wherein the clarity parameters include: inclusion parameters indicating one or more inclusion characteristics in the gemstone sample, the one or more inclusion characteristics including the location and / or type of the one or more inclusions in the gemstone sample; growth structure parameters indicating one or more growth structure characteristics in the gemstone sample, the one or more growth structure characteristics including the location and / or mineralization pattern of the one or more growth structures formed in the gemstone sample; wherein the processor is further configured to: compare the gemstone sample image with the plurality of The method involves comparing the gemstone sample images with each of the plurality of reference gemstone sample images, each of which also includes one or more reference inclusions and reference growth structures; determining inclusion parameters based on a comparison of the gemstone sample image with each of the plurality of reference gemstone sample images containing the one or more reference inclusions; determining growth structure parameters based on a comparison of the gemstone sample image with each of the plurality of reference gemstone sample images including the one or more reference growth structures; and determining clarity parameters based on at least one of the inclusion parameters and / or the growth structure parameters.

[0024] In various embodiments, the gemstone parameters may further include origin parameters indicating the geological origin of the gemstone sample, wherein the processor is further configured to: compare the inclusion parameters with each of a plurality of predetermined reference origin parameters, each predetermined reference origin parameter including a reference type and / or a reference location of the one or more reference inclusions in the reference gemstone sample, and their relationship to a specific geographical location; and determine the origin parameters based on the comparison of the inclusion parameters with each of the plurality of predetermined reference origin parameters.

[0025] In various embodiments, the gemstone parameters may further include processing parameters indicating a treatment applied to the gemstone sample, wherein the processor is further configured to: compare the inclusion parameters with each of a plurality of predetermined reference processing parameters, each predetermined reference processing parameter including a reference type of the one or more reference inclusions and / or a reference location of the one or more reference inclusions and their relationship to a specific treatment applied to the reference gemstone sample; compare the growth structure parameters with each of the plurality of predetermined processing parameters, each predetermined reference processing parameter further including a reference location of the one or more reference growth structures and / or a reference mineralization pattern of the one or more reference growth structures and their relationship to the specific treatment applied to the reference gemstone sample; and determine the processing parameters based on the comparison of the inclusion parameters and / or the growth structure parameters with each of the plurality of predetermined reference processing parameters.

[0026] In various embodiments, the gemstone parameters may include color parameters indicating the color category of the gemstone sample, wherein the processor is further configured to: determine a representative color parameter indicating representative color coordinates allocated relative to a uniform color space; compare the representative color parameter with each of a plurality of reference color parameters, each reference color parameter indicating pre-assigned color coordinates corresponding to a predetermined color category of a corresponding one of the plurality of reference gemstone sample images, the pre-assigned color coordinates being allocated relative to the uniform color space; determine a color score parameter indicating a minimum color distance between the representative color parameter and at least one of the reference color parameters; compare the color score parameter with the predetermined color tolerance threshold of the expected deviation between the representative color parameter and the at least one of the reference color parameters; and determine the color parameter based on the comparison of the color score parameter and the predetermined color tolerance threshold.

[0027] In various embodiments, the gemstone sample image comprises a plurality of pixels, and the processor may be configured to determine the representative color parameter by: determining a pixel color parameter for each pixel of the plurality of pixels, the pixel color parameter indicating pixel color coordinates allocated relative to the uniform color space; clustering the pixels of the plurality of pixels into pixel color clusters of a plurality of pixel color clusters, each pixel color cluster representing a predetermined color cluster of the gemstone sample image, clustering the pixels based on the pixel color coordinates of each pixel; determining for each pixel color cluster a first color cluster parameter indicating the centroid coordinates of the corresponding pixel color cluster and a second color cluster parameter indicating the weighted average of the pixel color coordinates within the corresponding pixel color cluster; and determining the representative color parameter based on the first color cluster parameter and the second color cluster parameter.

[0028] In various embodiments, in order to determine the color parameter, the processor is further configured to: determine whether the color score parameter is less than or equal to the predetermined color tolerance threshold; and if the color score parameter is determined to be less than or equal to the predetermined color tolerance threshold, then determine the color parameter.

[0029] In various embodiments, the processor is further configured to: determine a unique gem signature of the gem sample, the unique gem signature including at least two gem parameters of the gem sample.

[0030] According to a third aspect of this disclosure, a method for manufacturing the imaging apparatus of the first aspect is provided, the method comprising: setting up a sample holder configured to support the gemstone sample; setting up an electromagnetic radiation source configured to generate an excitation wave for transmitting / passing through the gemstone sample to generate a transmitted wave modified by the gemstone sample; setting up at least one optical instrument disposed and optically aligned relative to the sample holder and the electromagnetic radiation source, the at least one optical instrument being configured to modulate the excitation wave for transmitting through the gemstone sample to generate the modified excitation wave, or modulate the transmitted wave to generate the modified transmitted wave; and setting up a detector optically aligned with the sample holder, the electromagnetic radiation source and the at least one optical instrument, the detector being configured to detect the transmitted wave and / or the modified transmitted wave to acquire at least one image of the gemstone sample.

[0031] According to a fourth aspect of this disclosure, a method for determining gemstone parameters indicating attributes of a gemstone sample is provided, comprising: setting up a processor for data communication with the imaging apparatus of the first aspect, wherein the method further comprises: acquiring at least one image of the gemstone sample, the image containing gemstone data indicating attributes of the gemstone sample; and determining the gemstone parameters based on the at least one image of the gemstone sample containing the gemstone data indicating attributes of the gemstone sample.

[0032] In various embodiments, the processor includes at least one machine learning algorithm for determining the gemstone parameters, the machine learning algorithm optionally including a deep learning algorithm.

[0033] According to a fifth aspect of this disclosure, a computer-readable medium including instructions is provided that, when executed by a processor, cause the processor to perform the method of the fourth aspect. Attached Figure Description

[0034] This disclosure will be better understood when considered in conjunction with the non-limiting examples and accompanying drawings, and in accordance with the detailed description, in which: Figure 1 An exemplary schematic diagram of the imaging device 100 is shown; Figure 2 An exemplary schematic diagram of the sample holder 102 of the imaging device 100 is shown; Figure 3 Another exemplary schematic diagram of the imaging device 300 is shown; Figure 4 Another exemplary schematic diagram of the imaging device 400 is shown; Figure 5 Another exemplary schematic diagram of the imaging device 500 is shown, and the illustration shows an example of a third optical instrument 150 including (A) an optical plate 154; or (B) a semi-cylinder 156; or (C) a hemisphere 158; Figure 6 An exemplary schematic diagram of a system 600 for determining gem parameters 174 that indicate the properties of gem sample 104 is shown; Figure 7 A schematic diagram of (A) an exemplary uniform color space 700 for determining a gem parameter 174 containing a color parameter 660 indicating a color label for a gem sample 104 is shown; and (B) an example diagram 710 of pre-assigned color coordinates corresponding to a predetermined color category of a corresponding reference gem sample image 634 is shown. Figure 8 An exemplary schematic diagram of various pixel color clusters 800 for determining representative color parameter 662 is shown, the representative color parameter 662 indicating the representative color coordinates of a gem sample 104 relative to a uniform color space allocation in (A) 3D format; and (B) 2D format. Figure 9 A comparison of representative color parameter 662 of gem sample image 632 with reference color parameter 672 is shown to determine color score parameter 664; Figure 10 A flowchart of an exemplary method 1000 for manufacturing an imaging device is shown; and Figure 11 A flowchart of an exemplary method 1100 for determining gemstone parameters is shown. Detailed Implementation

[0035] The following detailed description refers to the accompanying drawings, specific details, and embodiments through which this disclosure can be practiced. These embodiments are described in sufficient detail to enable those skilled in the art to practice this disclosure. Other embodiments may be utilized, and structural and logical changes may be made without departing from the scope of this disclosure. The various embodiments are not necessarily mutually exclusive, as some embodiments may be combined with one or more other embodiments to form new embodiments.

[0036] Features described in the context of an embodiment may be adapted accordingly to the same or similar features in other embodiments. Even if not explicitly described in these other embodiments, features described in the context of an embodiment may be adapted accordingly to other embodiments. Furthermore, additions and / or combinations and / or substitutions of feature descriptions in the context of an embodiment may be adapted accordingly to the same or similar features in other embodiments.

[0037] In the context of various embodiments, the articles “a,” “an,” and “the” used with respect to features or elements include references to one or more features or elements. As used herein, the term “and / or” includes any and all combinations of one or more of the associated listed items.

[0038] While terms such as "first" and "second" can be used to describe various elements, these elements are not limited to those terms. The terms are used only to distinguish one element from another and do not define the corresponding elements, such as their order and / or meaning. Without departing from the scope of this specification, a first element may be referred to as a second element, and similarly, a second element may be referred to as a first element.

[0039] Throughout this description, the term "image" as used herein can refer to an image, such as a graphical representation of a gem sample containing gem data indicating the properties of the gem sample. An image of a gem sample may contain transmitted light and / or modified transmitted light, modulated by optical instruments, and detectable at a detector. In various embodiments, the term "image" may also include cross-sectional images, such as a graphical representation of a gem sample.

[0040] Throughout this description, the term "attribute" as used herein may refer to a characteristic of a gem sample contained in the gem data. Non-limiting attributes of a gem sample may include color, optical properties, geometric properties, class, inclusions or growth structures, treatment conditions applied to the gem sample, and geological origin.

[0041] Throughout this description, the term "through / through a gemstone sample," as used herein, can refer to an excitation wave passing through / through one or more facets, or one or more sides or points, of a gemstone sample. For example, an excitation wave may be incident through one facet of a gemstone sample and exit through another facet. In another example, an excitation wave may be incident and exit through the same facet of a gemstone sample. In the context of this disclosure, the excitation wave passes through the gemstone sample and interacts with the gemstone sample to generate a transmitted wave.

[0042] Throughout this description, the term "arranged relative to..." as used herein can refer to the arrangement of an optical instrument relative to an electromagnetic radiation source, detector, or sample holder. In various embodiments, the optical instrument may be positioned near the sample holder, for example, adjacent to it. In various embodiments, the optical instrument may be positioned between the electromagnetic radiation source and the sample holder, and / or between the sample holder and the detector. In some embodiments, there may be no intervening elements between the optical instrument and the electromagnetic radiation source, detector, or sample holder that obstruct the transmission path of the excitation wave, modified excitation wave, transmitted wave, and / or modified transmitted wave. In some embodiments, the optical instrument may be positioned relative to the sample holder such that it can directly contact the sample holder and / or the gemstone sample. In some other embodiments, the optical instrument may be positioned relative to the sample holder such that it does not directly contact the sample holder and / or the gemstone sample.

[0043] Throughout this description, the term "gemstone parameter" as used herein can refer to a numerical value or range containing at least one alphanumeric character. Gemstone parameters can be determined based on gemstone data contained in at least one image of a gemstone sample, which may be contained in first, second, third, fourth, fifth, sixth, seventh, and eighth transmitted waves and / or first, second, and third modified transmitted waves. In some embodiments, gemstone parameters may include integers or fractions, such as refractive index. In some other embodiments, gemstone parameters may include letters or letter strings, such as color categories or processing conditions applied to the gemstone sample.

[0044] According to various embodiments, a circuit may include analog circuits or components, digital circuits or components, or hybrid circuits or components. According to alternative embodiments, any other type of implementation of the various functions, which will be described in more detail below, may be understood as a "circuit". A digital circuit may be understood as any type of logic implementation entity, which may be a dedicated circuit or a processor executing software stored in memory, firmware, or any combination thereof. Therefore, in various embodiments, "circuit" can be a digital circuit, such as a hardwired logic circuit or a programmable logic circuit (such as a programmable processor, for example, a microprocessor (e.g., a Complex Instruction Set Computer (CISC) processor or a Reduced Instruction Set Computer (RISC) processor). "Circuit" may also include a processor or controller for executing software (e.g., any type of computer program, such as a computer program using virtual machine code like Java). In various embodiments, the processor may include various units that communicate data with each other. The processor may include: (i.) a microcontroller unit including firmware stored therein for executing instructions for controlling the imaging apparatus; (ii.) a central processing unit including software and a user interface for controlling various imaging modes of the imaging apparatus to obtain gem data; and (iii.) a server unit, such as a cloud infrastructure for storing gem data, processing gem data to determine gem parameters, and / or training machine learning algorithms for determining gem parameters. In some embodiments, the central processing unit may also be configured to process the gem data to determine the gem parameters and / or train the machine learning algorithms for determining the gem parameters.

[0045] Figure 1 An exemplary schematic diagram of the imaging device 100 is shown. Figure 2 An exemplary schematic diagram of the sample holder 102 of the imaging device 100 is shown.

[0046] In various embodiments, the imaging device 100 may communicate with the processor 170 (e.g., a controller for controlling (e.g., activating or deactivating) various imaging modes of the imaging device 100 and for obtaining gem data 172 indicating the properties of the gem sample 104), as will be described below.

[0047] Reference Figure 1 The imaging apparatus 100 includes a sample holder 102 configured to support a gemstone sample 104. The sample holder 102 may include a platform configured to hold the gemstone sample 104, for example, via one or more claws (not shown), the claws being configured to receive and hold the gemstone sample 104. In some embodiments, such as... Figure 2As shown, the sample holder 102 may include an end effector with a tweezer-like manipulator 102b having one or more claws (not shown) for gripping the gemstone sample 104. In some other embodiments, the sample holder 102 may be a pneumatic micro-suction cup that applies pneumatic suction to grip the gemstone sample 104. In still other embodiments, an adhesive may be applied to secure (e.g., bond) the gemstone sample 104 to the sample holder 102. It is also conceivable that the sample holder 102 may include any of the combinations described above. Figure 1 and Figure 2 The sample holder 102 shown can be attached to the gem sample 104 manually or automatically, for example by a processor 170, and can be configured to suspend the gem sample 104 in the air.

[0048] The sample holder 102 can be configured to rotate along at least one of the following: a vertical axis D1 (i.e., the y-axis or longitudinal axis), a horizontal axis D2 (i.e., the x-axis or transverse axis), and a rotation axis D3 (i.e., the z-axis or applicate axis). The horizontal axis D2 can be perpendicular to the vertical axis D1, and the rotation axis D3 can be perpendicular to both the horizontal axis D2 and the vertical axis D1. Therefore, the sample holder 102 can be configured to orient the gemstone sample 104 in multiple degrees of freedom. The rotation of the sample holder 102 can be controlled by a processor 170, for example, the processor 170 can control one or more robotic arms 102a in the sample holder 102 to rotate about the vertical axis D1, horizontal axis D2, and / or rotation axis D3 of the sample holder 102 (see reference). Figure 2 ).

[0049] In various embodiments, the imaging apparatus 100 may further include a sample chamber 106, configured to be adjacent to and receive the sample holder 102. The sample chamber 106 may include a container configured to contain an optical fluid. The optical fluid may have a refractive index ranging from 0.5 to 2.0, optionally from 1.5 to 2.0. In various embodiments, the optical fluid may include a high-refractive-index optical fluid, such as, but not limited to, diiodomethane (CH2I2) with a refractive index of 1.7, which may be similar to the refractive index of the gemstone sample 104. In various embodiments, the sample holder 102 may be disposed within the sample chamber 106, such that the gemstone sample 104 is suspended in the optical fluid. The optical fluid may reduce or prevent light refraction at the boundary between the gemstone sample 104 and air (i.e., the sample-air boundary), thereby improving the quality of the image acquired by the detector 120.

[0050] The imaging device 100 also includes an electromagnetic radiation source 110, which is optically aligned with the sample holder 102 and configured to generate an excitation wave 112 that passes through / through the gemstone sample 104. Figure 1 As shown, the electromagnetic radiation source 110 may be located inside the illumination chamber 108, which houses and surrounds the sample holder 102. Optionally, the sample chamber 106 may be provided as an enclosed area with a controlled lighting environment.

[0051] The excitation wave 112 can have a wavelength range of 100 nm to 3000 nm. In various embodiments, the excitation wave 112 can be in the visible spectrum and can have a wavelength range of 400 nm to 700 nm. In some embodiments, the excitation wave 112 can be in the short-wave ultraviolet (UV) spectrum and can have a wavelength range of 180 nm to 250 nm. In some other embodiments, the excitation wave 112 can be in the long-wave UV spectrum and can have a wavelength range of 300 nm to 400 nm. In some other embodiments, the excitation wave 112 can be in the near-infrared spectrum and can have a wavelength range of 800 nm to 2500 nm. The electromagnetic radiation source 110 can be configured to generate excitation waves 112 with different wavelength ranges depending on the imaging mode in which the imaging device 100 is operating.

[0052] Excitation wave 112 can be transmitted such that it passes through one or more facets of gem sample 104. When excitation wave 112 passes through, it can interact with gem sample 104 to generate first, second, third, fourth, fifth, sixth, seventh, and eighth transmitted waves 122, 124, 126, 128, 129, 141, 143, and 152 that have been modified by gem sample 104.

[0053] The imaging apparatus 100 further includes a detector 120, which is optically aligned with the electromagnetic radiation source 110 and the sample holder 102, and configured to acquire at least one image of the gemstone sample 104. The at least one image of the gemstone sample 104 may be contained in transmitted waves 122, 124, 126, 128, 129, 141, 143, and 152. In some embodiments, the detector 120 may be configured to acquire modified transmitted waves 142, 144, and 154 (see reference 124). Figure 4 and Figure 5 The detector 120 may contain at least one image of a gem sample 104. The at least one image of the gem sample 104 may contain gem data 172 indicating the properties of the gem sample 104. The detector 120 may include an imaging sensor, such as a high-resolution camera, and may also include a zero-angle field-of-view lens. It is contemplated that the detector 120 may include any suitable lens configuration for acquiring at least one image of the gem sample 104.

[0054] In various embodiments, at least one image may include at least one cross-sectional image of the gemstone sample 104. In other words, the first, second, third, fourth, fifth, sixth, seventh, and eighth transmitted waves 122, 124, 126, 128, 129, 141, 143, 152 and / or the first, second, and third modified transmitted waves 142, 144, 154 may contain graphical representations of cross-sections of the gemstone sample 104, each cross-sectional image containing gemstone data 172 indicating the properties of the gemstone sample 104. Each cross-section of the gemstone sample 104 may include a 2D image or may include a 3D image. In some embodiments, each cross-sectional image may be acquired along a transverse (e.g., horizontal) plane of the gemstone sample 104. For example, each cross-sectional image along a transverse plane may be acquired from top to bottom of the gemstone sample 104. In some other embodiments, each cross-sectional image may be acquired, for example, from left to right along a longitudinal (e.g., vertical) plane of the gemstone sample 104. In some other embodiments, cross-sectional images can be acquired, for example, from the front to the back of the gemstone sample 104 along the sagittal plane of the gemstone sample 104. The cross-sectional images along the aforementioned plane can be acquired at predefined intervals (e.g., desired predefined distances). These predefined intervals can be determined by a user, for example, via a user interface of the processor 170.

[0055] In such Figure 1 and Figure 2 In various embodiments of the imaging apparatus 100 shown, the imaging apparatus 100 may be particularly suitable as a spectrometer for acquiring at least one image of a gem sample 104 containing gem data 172 of the color of the gem sample 104, which may be contained in a first transmitted wave 122. In various embodiments, the color of the gem sample 104 can be imaged when the electromagnetic radiation source 110 outputs an excitation wave 112 with a wavelength range of 400 nm to 700 nm (i.e., the visible spectrum), and the gem data 172 of the color of the gem sample 104 is contained in the first transmitted wave 122.

[0056] In such Figure 1 and Figure 2In various other embodiments of the imaging apparatus 100 shown, the imaging apparatus 100 may further include a magnifying lens (not shown), and the wavelength range of the excitation wave 112 may be 400 nm to 700 nm, i.e., the visible spectrum. The magnification of the magnifying lens may range from 0.5X to 100X, optionally from 10X to 50X. In this embodiment, the imaging apparatus 100 may be particularly suitable for acquiring an image of a gem sample 104 containing gem data 172 indicating one or more inclusion characteristics and / or one or more growth structure characteristics of the gem sample 104, which may be included in the second transmitted wave 124. Inclusion characteristics may include the location and / or type of one or more inclusions in the gem sample 104. Growth structure characteristics may include the location and / or mineralization pattern of one or more growth structures in the gem sample 104.

[0057] In such Figure 1 and Figure 2 In various other embodiments of the imaging apparatus 100 shown, the electromagnetic radiation source 110 may be configured to generate an excitation wave 112 of a short-wavelength UV spectrum (i.e., wavelength range of 180 nm to 250 nm) or a long-wavelength UV spectrum (i.e., wavelength range of 300 nm to 400 nm). In this embodiment, the imaging apparatus 100 may be particularly suited to fluorescence spectroscopy to acquire an image of a gemstone sample 104, the image including gemstone data 172 indicating UV fluorescence and / or phosphorescence of the gemstone sample 104, the image may be contained in a third transmission wave 126. The UV fluorescence and / or phosphorescence may indicate characteristic fluorescence and / or phosphorescence associated with the third transmission wave 126 of the gemstone sample 104.

[0058] Figure 3 Another exemplary schematic diagram of the imaging device 300 is shown. The imaging device 300 can be based on a reference... Figure 1 and Figure 2 The imaging device 100 is under discussion. Figure 3 For clarity, sample chamber 106 and lighting chamber 108 are not shown.

[0059] Reference Figure 3The imaging apparatus 300 may further include a first optical instrument 130 located between the electromagnetic radiation source 110 and the sample holder 102, the first optical instrument 30 being configured to modulate the excitation wave 112 to generate modified excitation waves 132, 134. In various embodiments, the first optical instrument 130 may be configured to rotate along a horizontal axis x (i.e., the x-axis) and / or a vertical axis y (i.e., the y-axis). The modified excitation waves 132, 134 may pass through / through the gemstone sample 104, and the detector 120 may acquire an image of the gemstone sample 104, which may be contained in fourth and fifth transmitted waves 128, 129, the image being based on the interaction between the modified excitation wave 132 and the gemstone sample 104. In various embodiments, the first optical instrument 130 may include a first polarizing filter, a grating assembly, and / or a prism assembly.

[0060] In various embodiments, the first optical instrument 130 may include a first polarizing filter, and the electromagnetic radiation source 110 may be configured to generate an excitation wave 112 in the wavelength range of 400 nm to 700 nm (i.e., the visible spectrum). The polarizing filter may interact with the excitation wave 112 to generate a first modified excitation wave 132 for transmission / through of the gemstone sample 104. In this embodiment, the imaging device 300 is particularly suitable as a pleochroism spectrometer to acquire an image of the gemstone sample 104 containing gemstone data 172 indicating the pleochroic properties of the gemstone sample 104, which may be contained in a fourth transmitted wave 128. The pleochroic properties may relate to the chromatogram of at least two crystal axes of the gemstone sample 104.

[0061] In various other embodiments, the first optical instrument 130 may include a prism assembly or a grating assembly, and the electromagnetic radiation source 110 may be configured to generate an excitation wave 112 with a wavelength range of 400 nm to 700 nm (i.e., the visible spectrum). A polarizing filter may interact with the excitation wave 112 to generate a second modified excitation wave 134 for transmission / through of the gemstone sample 104. In this embodiment, the imaging device 300 is particularly suitable as an absorption spectrometer to acquire an image of the gemstone sample 104, which may be contained in a fifth transmitted wave 129. The image of the gemstone sample 104 may include gemstone data 172 indicating a characteristic absorption spectrum related to the dispersion of the fifth transmitted wave 129 as it passes through the gemstone sample 104.

[0062] Figure 4 Another exemplary schematic diagram of the imaging device 400 is shown. The imaging device 400 can be based on a reference... Figure 3 The imaging device 300 is discussed. Figure 4 For clarity, sample chamber 106 and lighting chamber 108 are not shown.

[0063] Reference Figure 4 The imaging apparatus 400 may further include a second optical instrument 140 located between the sample holder 102 and the detector 120. The second optical instrument 140 is configured to modulate sixth and seventh transmitted waves 141, 143 to generate first and second modified transmitted waves 142, 144. In various embodiments, the second optical instrument 140 may be configured to be rotatable along its horizontal axis x (i.e., the x-axis) and / or vertical axis y (i.e., the y-axis). The second optical instrument 140 may include a second polarizing filter, and the wavelength range of the excitation wave 112 may be from 400 nm to 700 nm (i.e., the visible spectrum). Figure 4 In the illustrated embodiment, the first optical instrument 130 may include a first polarizing filter, and the excitation wave 112 may first be modulated by the first optical instrument 130 to generate a first modified excitation wave 132 that transmits through the gemstone sample 104. The gemstone sample 104 modifies the first modified excitation wave 132 to generate sixth and seventh transmitted waves 141, 143.

[0064] In such Figure 4 In various embodiments of the imaging apparatus 400 shown, the imaging apparatus 400 can be particularly suitable as a spectrometer for determining the geometric properties of the gem sample 104, and the second optical instrument 140 can modulate a sixth transmitted wave 141 to provide a first modified transmitted wave 142. Thus, the detector 120 can acquire an image of the gem sample 104 containing gem data 172 indicating the geometric properties of the gem sample 104, which can be included in the first modified transmitted wave 142.

[0065] In such Figure 4 In various other embodiments of the imaging apparatus 400 shown, the imaging apparatus 400 may be particularly suited to a birefringent spectrometer, and the second optical instrument 140 may modulate a seventh transmitted wave 143 to provide a second modified transmitted wave 144. Thus, the detector 120 may acquire an image of the gem sample 104 containing gem data 172 indicating the birefringent properties of the gem sample 104, which may be contained in the second modified transmitted wave 144. The birefringent properties may include the monorefringent properties, birefringent characteristics, and / or polycrystalline properties of the gem sample 104. The birefringent properties may relate to the difference between the refractive indices of at least two crystal axes of the gem sample 104.

[0066] Figure 5 Another exemplary schematic diagram of the imaging device 500 is shown, and the illustrations show an example of a third optical instrument 150 including (A) an optical plate 154; or (B) a semi-cylinder 156; or (C) a hemisphere 158. The imaging device 500 may be based on a reference... Figure 1 and Figure 2 The imaging device 100 is under discussion. Figure 5 For clarity, sample chamber 106 and lighting chamber 108 are not shown.

[0067] Reference Figure 5 The imaging device 500 may include a third optical instrument 150 disposed adjacent to the sample holder 102. In some embodiments, the third optical instrument 150 may also be disposed adjacent to at least one facet of the gemstone sample 104, for example perpendicular to at least one facet of the gemstone sample 104, and in direct contact with the gemstone sample 104. The third optical instrument 150 may include an optical plate 154 (see reference 154). Figure 5 A); Semi-cylinder 156 (refer to) Figure 5 B); or hemisphere 158 (refer to) Figure 5 Any of (C). The imaging apparatus 500 may also include a calibrated refractometer scale (not shown) optically aligned with the sample holder 102, the electromagnetic radiation source 110, the third optical instrument 150, and the detector 120. Figure 5 In the illustrated embodiment, the imaging device 500 may be particularly suitable for a refractive spectrometer (i.e., used as a refractometer) to obtain gem data 172 indicating the refractive index of the gem sample 104.

[0068] When the excitation wave 112 includes a wavelength range of 400 nm to 700 nm (i.e., the visible spectrum), the third optical plate 150 can be configured to modulate the excitation wave 112 to generate a third modified excitation wave 136 for transmission through the gemstone sample 104, and can be configured to modulate an eighth transmission wave 152 to generate a third modified transmission wave 154, which is generated based on the interaction between the gemstone sample 104 and the third modified excitation wave 136. Therefore, the detector 120 can acquire an image of the gemstone sample 104 containing gemstone data 172 indicating the refractive index of the gemstone sample 104, which can be included in the third modified transmission wave 154.

[0069] In various embodiments, a contact liquid layer may be provided to the third optical instrument 150 (e.g., the semi-cylinder 156 (see reference)). Figure 5B) establishes optical contact with the gemstone sample 104 and prevents air from accumulating between the facets of the gemstone sample 104 and the third optical instrument 150. Accumulated air at the interface between the facets of the gemstone sample 104 and the third optical instrument 150 affects total internal reflection and the accuracy of the gemstone data 172 indicating the refractive index of the gemstone sample 104. Since the contact liquid also has a refractive index, the optical contact is preferably set as a "thin film," for example, with a thickness of 0.1 mm to 1 mm, to prevent the gemstone sample 104 from floating on the surface of the contact liquid. This would cause the eighth transmitted wave 152 to refract within the liquid and affect the accuracy of the gemstone data 172 indicating the refractive index of the gemstone sample 104 contained in the third modified transmitted wave 154.

[0070] In various embodiments, each of the first, second, and third optical instruments 130, 140, and 150 can communicate with the processor 170 via wired or wireless means, and the processor 170 can control various imaging modes. In some embodiments, various imaging modes can be activated or deactivated based on input provided by the memory 180, with the processor 170 communicating with the memory 180, for example, based on the execution of instructions stored in the memory 180. In some other embodiments, the imaging mode can be based on user-selected input provided using the user interface of the processor 170. For example, the processor 170 can be configured to activate a refractive spectral mode to acquire gem data 172 indicating the refractive index of the gem sample 104. Thus, the processor 170 can be configured to activate and position the third optical instrument 150 so that it is optically aligned and adjacent to the sample holder 102 and / or the gem sample 104.

[0071] Therefore, refer to Figures 1 to 5 The imaging apparatuses 100, 300, 400, and 500 discussed can provide an automated device that integrates various optical instruments, such as, but not limited to, first and second polarizing filters, prism or grating assemblies, optical plates, high-magnification lenses, and a sample holder 102 with tweezer-like manipulators 102b to provide multiple degrees of freedom. This device is capable of acquiring images of gemstone samples 104 containing gemstone data 17 indicating the characteristics of various gemstone samples 104, which may be contained in first, second, third, fourth, fifth, sixth, seventh, and eighth transmitted waves 122, 124, 126, 128, 129, 141, 143, and 152 and / or first, second, and third modified transmitted waves 142, 144, and 154.

[0072] Figure 6 An exemplary schematic diagram of a system 600 for determining gem parameters 174 indicating properties of a gem sample 104, according to another aspect of this disclosure, is shown. System 600 may include reference... Figures 1 to 5The imaging devices 100, 300, 400, and 500 discussed may include a processor 170 that communicates data with the imaging devices 100, 300, 400, and 500.

[0073] In various embodiments, processor 170 may wirelessly communicate with imaging devices 100, 300, 400, and 500, for example, according to one or more predefined wireless protocols. Examples of predefined wireless communication protocols include: Global System for Mobile Communications (GSM), Enhanced Data GSM Environment (EDGE), Wideband Code Division Multiple Access (WCDMA), Code Division Multiple Access (CDMA), Time Division Multiple Access (TDMA), Wi-Fi, Voice over Internet Protocol (VoIP), Global Microwave Access Interoperability (Wi-MAX), Wi-Fi Direct (WFD), Ultra Wideband (UWB), Infrared Data Association (IrDA), Bluetooth, ZigBee, SigFox, LPWan, LoRaWan, GPRS, 3G, 4G, LTE, and 5G communication systems. Alternatively, processor 170 may wirelessly communicate with imaging devices 100, 300, 400, and 500.

[0074] In system 600, processor 170 may be configured to: acquire at least one image of gem sample 104 containing gem data 172 indicating various properties of gem sample 104; and determine gem parameters 174 based on at least one image containing gem data 172 indicating various properties of gem sample 104. The image of gem sample 104 may contain first, second, third, fourth, fifth, sixth, seventh, and eighth transmitted waves 122, 124, 126, 128, 129, 141, 143, 152 and / or first, second, and third modified transmitted waves 142, 144, 154, which can be detected when the first, second, third, fourth, fifth, sixth, seventh, and eighth transmitted waves 122, 124, 126, 128, 129, 141, 143, 152 and / or first, second, and third modified transmitted waves 142, 144, 154 are incident on detector 120.

[0075] In various embodiments, processor 170 may include at least one machine learning algorithm for determining gem parameters 174. In some embodiments, the machine learning algorithm may include a supervised, semi-supervised, or unsupervised machine learning algorithm for determining gem parameters 174. In some embodiments, the machine learning algorithm may include a deep learning algorithm. In some embodiments, the deep learning algorithm may include a convolutional neural network algorithm, a diffusion model, and / or a visual converter.

[0076] like Figure 6As shown, system 600 may further include memory 180 that communicates with processor 170 via wireless or wired means. Memory 180 may store one or more reference gemstone sample images 634; and / or one or more reference parameters (e.g., multiple reference color parameters 672), and may transmit the reference gemstone sample images 634 and / or reference parameters to processor 170 for identification of gemstone sample 104.

[0077] Reference Figure 6 Gemstone parameter 174 may include optical parameter 610 indicating the optical properties of gemstone sample 104. In various embodiments, optical parameter 610 may include at least one of UV fluorescence and / or phosphorescence parameter 612, pleochroism parameter 614, absorption parameter 615, birefringence parameter 616, and refractive index parameter 618. Various optical parameters 610 can help identify gemstone sample 104 and determine gemstone signature parameters 690 unique to gemstone sample 104.

[0078] In various embodiments, optical parameters 610 may include UV fluorescence and / or phosphorescence parameters 612 indicating characteristic fluorescence and / or phosphorescence associated with the third transmitted wave 126 of the gemstone sample 104. In other words, UV fluorescence and / or phosphorescence parameters 612 may be based on the third transmitted wave 126 (refer to...). Figure 1 The gemstone data 172 contained in the sample is used to determine the gemstone. Some gemstones may be inert and may not respond to the excitation wave 112 in either the short-wavelength or long-wavelength UV spectrum. However, gemstone samples 104 that exhibit a characteristic response to the excitation wave 112 can provide useful indicators for the identification of gemstone sample 104. In some embodiments, the UV fluorescence and / or phosphorescence parameters 612 may be compared with one or more reference UV fluorescence and / or phosphorescence parameters that may be stored in the memory 180 to aid in the identification of gemstone sample 104.

[0079] In various embodiments, optical parameter 610 may include pleochroism parameter 614, which indicates pleochroism characteristics related to the chromaticity of at least two crystal axes of the gemstone sample 104. Pleochroism parameter 614 may be based on a fourth transmitted wave 128 (see reference 128). Figure 3 The gem data 172 contained in the sample 104 is used to determine the various colors of the gem sample 104 when viewed along different crystal axes. For example, the pleochroism parameter 614 may be related to the absorption of a specific wavelength of the first modified excitation wave 132. In some embodiments, the pleochroism parameter 614 may be compared with one or more reference pleochroism values ​​that may be stored in the memory 180 to identify the gem sample 104.

[0080] In various embodiments, optical parameter 610 may include absorption parameter 615 indicating a characteristic absorption spectrum related to the dispersion of the fifth transmitted wave 129 of the gemstone sample 104. That is, absorption parameter 615 may be based on the fifth transmitted wave 129 (refer to...). Figure 3 The gem data 172 contained in the sample 104 is used to determine the distribution of the second modified excitation wave 134 into its constituent colors. The characteristic absorption spectrum may depend on the presence of the crystal lattice and / or inclusions or growth structures of the gem sample 104, such as impurities within the crystal lattice. In some embodiments, the absorption parameter 615 may be compared with one or more reference absorption parameters that may be stored in the memory 180 to identify the gem sample 104.

[0081] In various embodiments, optical parameter 610 may include birefringence parameter 616 indicating birefringence characteristics related to the difference in refractive index between at least two crystal axes of the gemstone sample 104. Birefringence parameter 616 may be based on a second modified transmitted wave 144 (refer to...). Figure 4 The birefringence parameter 616 is determined by the gem data 172 contained in the gem sample 104, and can be determined based on the refractive index difference between two crystal orientations of the gem sample 104. For example, the birefringence parameter 616 can exist in anisotropic gem sample 104 lattices that exhibit different optical properties along different crystal axes, and in particular, can exist in gem sample 104 having a hexagonal or triangular lattice. In some embodiments, the birefringence parameter 616 can be compared with one or more reference birefringence parameters that can be stored in memory 180 to identify the gem sample 104.

[0082] In various embodiments, optical parameter 610 may include refractive index parameter 618 indicating the refractive index of the gemstone sample. Refractive index parameter 618 may be based on a third modified transmitted wave 152 (refer to...) incorporating gemstone data 172. Figure 5 The method used to determine the gemstone data 172 includes measurements of how the third modified excitation wave 136 bends or refracts upon entering the gemstone sample 104. Since the refractive index parameter 618 is affected by the chemical composition and lattice of the gemstone sample 104, the refractive index parameter 616 can aid in the identification of the gemstone sample 104. Therefore, in some embodiments, the refractive index parameter 618 can be compared with one or more reference refractive index parameters that can be stored in the memory 180 to identify the gemstone sample 104.

[0083] Reference Figure 6The processor 170 can also be configured to determine gem parameters 174, including species parameters 620 indicating the category of gem sample 104. The determination of species parameters 620 can be based on the determination of optical parameters 610 described above. That is, species parameters 620 can be determined based on at least one of UV fluorescence and / or phosphorescence parameters 612, pleochroism parameters 614, absorption parameters 615, birefringence parameters 616, and / or refractive index parameters 618. In various embodiments, various optical parameters 610 provide information about the lattice structure and the arrangement of ions and molecules in gem sample 104, which can help determine the species of gem sample 104. For example, gem sample 104 can be classified as having an isotropic structure (e.g., cubic structure); or an anisotropic structure (e.g., tetragonal, hexagonal, triangular, orthorhombic, monoclinic, triclinic structure).

[0084] Reference Figure 6 The processor 170 may initially be configured to construct a gem sample image 632 based on gem data 172 contained in an image of gem sample 104, specifically a cross-sectional image of gem sample 104. In various embodiments, the cross-sectional image of gem sample 104 may be contained in at least one of first, second, third, fourth, fifth, sixth, seventh, and eighth transmission waves 122, 124, 126, 128, 129, 141, 143, 152 and / or first, second, and third modified transmission waves 142, 144, 154. In various embodiments, the gem sample image 632 may be constructed based on an image of gem sample 104 including gem data 172 indicating the color of gem sample 104 (i.e., contained in the first transmission wave 122) and / or an image of gem sample 104 including gem data 172 indicating one or more inclusion characteristics and / or one or more growth characteristics of gem sample 104 (i.e., contained in the second transmission wave 124). In other words, the gemstone sample image 632 can be constructed from an image (e.g., a cross-sectional image of the gemstone sample 104 acquired when the imaging device 100 is in spectral imaging mode). The first transmitted wave 122 and the second transmitted wave 124 may include images showing the overall geometry (e.g., gemstone shape and size) and the cut of at least one facet of the gemstone sample 104, and are therefore particularly suitable for constructing the gemstone sample image 632, as well as for determining the gemstone shape parameter 636 and facet parameter 638. In various embodiments, the reconstructed gemstone sample image 632 may include a 3D image and may include multiple pixels.

[0085] In various embodiments, processor 170 may be configured to construct gemstone sample image 632 using one or more tomographic techniques, which may include computer-based image reconstruction techniques such as deep learning models. In some embodiments, the deep learning model may include deep learning convolutional neural networks, generative adversarial networks, diffusion models, and / or visual converters. In some embodiments, processor 170 may also be configured to post-process the constructed gemstone sample image 632 to ensure that the gemstone sample image 632 is sharp, in focus, and has high contrast. Thus, processor 170 may use advanced post-processing algorithms such as focus stacking and high dynamic range stacking to improve the image quality of gemstone sample image 632.

[0086] Reference Figure 6 Gemstone parameter 174 may include geometric parameter 630 indicating the geometric properties of gemstone sample 104. In various embodiments, this may be based on a first modified transmitted wave 142 (refer to...). Figure 4 The gem data 172 included in the image is used to determine the geometric parameters 630. For example, to determine the geometric parameters 630, the gem sample image 632 can be constructed based on an image (e.g., a cross-sectional image) of the gem sample 104, which can be included in the first modified transmitted wave 142.

[0087] In various embodiments, geometric parameter 630 may include gem shape parameter 636 indicating the shape and size of gem sample 104. Non-limiting examples of the shape of gem sample 104 may include a circular shape, an elliptical shape, a square shape, a rectangular shape, and a heart shape.

[0088] To determine the gemstone shape parameter 636, the processor 170 may be configured to compare a gemstone sample image 632 with each of a plurality of reference gemstone sample images 634, each reference gemstone sample image 634 including a reference shape and size 634a of the reference gemstone sample image 634. In various embodiments, the shape and size of the gemstone sample 104 in a pixel of the gemstone sample image 632 may be compared with the reference shape and size 634a in a corresponding reference pixel of the reference gemstone sample image 634. In some embodiments, the comparison of the gemstone sample image 632 with the reference shape and size 634a of the reference gemstone sample image 634 may further include: determining a measurement value 632a of at least a portion of the gemstone sample image 632b; and comparing the measurement value 632a with a corresponding reference measurement value 634a1 of at least a portion of the reference gemstone sample image 634. For example, processor 170 may be configured to determine a measurement 632a of a facet of gem sample image 632; and compare the measurement 632a with a corresponding reference measurement 634a1 of a corresponding facet of reference gem sample image 634. Determining the measurement 632a of at least a portion of gem sample image 632 allows processor 170 to precisely determine the gem shape parameter 636 of gem sample 104 in terms of size.

[0089] Processor 170 may also be configured to determine gem shape parameters 636 based on a comparison of gem sample image 632 with each of the reference gem sample images 634. In various embodiments, processor 170 may be configured to determine gem shape parameters 636 by: determining whether the shape and size of gem sample 104 in a pixel of gem sample image 632 matches (e.g., are the same or equal to) a reference shape and size 634a in a corresponding reference pixel of reference gem sample image 634; and determining gem shape parameters 636 based on the determination that the shape and size of gem sample 104 in a pixel of gem sample image 632 matches the reference shape and size 634a in a corresponding reference pixel of reference gem sample image 634. In some embodiments, processor 170 may be configured to determine gem shape parameters 636 by: determining whether a measurement 632a of a facet of gem sample image 632 is equal to a corresponding reference measurement 634a1 of a corresponding facet of reference gem sample image 634; and determining gem shape parameters 636 based on said determination.

[0090] Reference Figure 6 The geometric parameter 630 may also include a facet parameter 638 indicating the cut of at least one facet of the gem sample 104. Non-limiting examples of cuts with at least one facet may include princess cut, emerald cut, cushion cut, oval cut, marquise cut.

[0091] To determine the facet parameter 638, the processor 170 may be configured to compare the gem sample image 632 with each of a plurality of reference gem sample images 634, each reference gem sample image 634 further comprising a reference cut of at least one facet 634b of the reference gem sample image 634. In various embodiments, the cut of at least one facet of the gem sample 104 in a pixel of the gem sample image 632 may be compared with the reference cut of at least one facet 634b in a corresponding reference pixel of the reference gem sample image 634.

[0092] Processor 170 may be configured to determine facet parameters 638 based on a comparison of gem sample image 632 with each of the reference gem sample images 634. In various embodiments, processor 170 may be configured to determine facet parameters 636 by: determining whether the cut of at least one facet of gem sample 104 in a pixel of gem sample image 632 matches (e.g., the same, equal) the reference cut of at least one facet 634b in a corresponding reference pixel of reference gem sample image 634; and determining facet parameters 638 based on the determination that the cut of at least one facet of gem sample 104 in a pixel of gem sample image 632 matches the reference cut of at least one facet 634b in a corresponding reference pixel of reference gem sample image 634.

[0093] In various embodiments, processor 170 may be configured to determine geometric parameters 630 based on at least one of gem shape parameters 636 and / or facet parameters 638.

[0094] Reference Figure 6 Gemstone parameter 174 may also include clarity parameter 640, which indicates the purity of gemstone sample 104. For example, clarity parameter 640 can provide an indicator of the presence or absence of one or more flaws, such as inclusions or growth structures, in gemstone sample 104. Inclusions and growth structures affect the transparency and visual appearance of gemstone sample 104. In various embodiments, clarity parameter 640 may be based on a second transmitted wave 124 (refer to...). Figure 1 The gem data 172 contained in the image can be used to determine the clarity parameter 640. For example, to determine the clarity parameter 640, the gem sample image 632 can be constructed from an image (e.g., a cross-sectional image of the gem sample 104 that can be contained in the second transmitted wave 124).

[0095] In various embodiments, clarity parameter 640 may include inclusion parameter 642 indicating the characteristics of one or more inclusions in the gemstone sample, the one or more inclusion characteristics including the type of one or more inclusions in the gemstone sample 104. Non-limiting examples of inclusion types include: filiform inclusions, fracture inclusions, needle-like inclusions, crystalline inclusions, and snowball inclusions. Additionally, or alternatively, one or more inclusion properties may include the location (e.g., orientation) of one or more inclusions in the gemstone sample 104.

[0096] To determine inclusion parameter 642, processor 170 may be configured to compare gem sample image 632 with each of a plurality of reference gem sample images 634, each reference gem sample image 634 further comprising one or more reference inclusions 634c. In various embodiments, pixels of gem sample image 632 may be compared with corresponding reference pixels of reference gem sample image 634 containing one or more reference inclusions 634c.

[0097] Processor 170 can also be configured to determine inclusion parameter 642 based on a comparison of gem sample image 632 with each of a plurality of reference gem sample images 634. In various embodiments, processor 170 can be configured to determine inclusion parameter 642 by: determining whether a pixel of gem sample image 632 matches a corresponding reference pixel in reference gem sample image 634 containing one or more reference inclusions 634c; and determining inclusion parameter 642 based on said determination. For example, if it is determined that a pixel of gem sample image 632 matches a corresponding reference pixel in reference gem sample image 634 containing one or more reference inclusions 634c, then gem parameter 642 can be determined to indicate the presence of inclusions in gem sample 104. In this example, processor 170 can also be configured to determine the type and / or location of one or more inclusions in gem sample 104. Alternatively, in another example, if it is determined that the pixels of the gem sample image 632 do not match the corresponding reference pixels of the reference gem sample image 634 which contain one or more reference inclusions 634c, then it can be determined that the gem parameter 642 can indicate that one or more inclusions are not present in the gem sample 104.

[0098] In various embodiments, clarity parameter 640 may further include growth structure parameter 644 indicating one or more growth structure characteristics in gemstone sample 104, including mineralization patterns of one or more growth structures in gemstone sample 104. Non-limiting examples of mineralization patterns include planar features or curved planar features, double cross patterns. Additionally, one or more growth structure characteristics may include the location (e.g., positioning) of growth structures in gemstone sample 104.

[0099] To determine the growth structure parameter 644, the processor 170 may be configured to compare the gemstone sample image 632 with each of a plurality of reference gemstone sample images 634, each reference gemstone sample image 634 further comprising one or more reference growth structures 634d within the reference gemstone sample image 634. In various embodiments, pixels of the gemstone sample image 632 may be compared with corresponding reference pixels in the reference gemstone sample image 634 containing one or more reference growth structures 634d.

[0100] Processor 170 can also be configured to determine growth structure parameters 644 based on comparisons between gem sample image 632 and each of a plurality of reference gem sample images 634. In various embodiments, processor 170 can be configured to determine growth structure parameters 644 by: determining whether pixels in gem sample image 632 match corresponding reference pixels in reference gem sample image 634 that contain one or more growth structures 634d; and determining growth structure parameters 644 based on said determination. For example, if it is determined that pixels in gem sample image 632 match corresponding reference pixels in reference gem sample image 634 that contain one or more reference growth structures 634d, then growth structure parameter 644 can be determined to indicate the presence of growth structures in gem sample 104. In this example, processor 170 can also be configured to determine the mineralization pattern and / or the location of one or more growth structures in gem sample 104. Alternatively, in another example, if it is determined that the pixels of the gem sample image 632 do not match the corresponding pixels of one or more reference growth structures 634d contained in the reference gem sample image 634, then it can be determined that the growth structure parameter 644 can indicate that one or more growth structures are not present in the gem sample 104.

[0101] In various embodiments, processor 170 may be configured to determine clarity parameter 640 based on at least one of inclusion parameter 642 and / or growth structure parameter 644.

[0102] Reference Figure 6 Gemstone parameter 174 may also include origin parameter 650, which indicates the geological origin of gemstone sample 104. The natural crystal formation process and geological conditions of a gemstone may vary depending on its specific geographical location and / or specific mining area; therefore, origin parameter 650 may be useful for the identification of gemstone sample 104. Typically, trained gemologists can determine the geological origin based on visual observation of the characteristics of inclusions within the gemstone.

[0103] In various embodiments, processor 170 may be configured to determine origin parameter 650 based on inclusion parameter 642 of gemstone sample 104. In various embodiments, processor 170 may be configured to compare inclusion parameter 642, indicating the characteristics of one or more inclusions in gemstone sample 104, with each of a plurality of predetermined reference origin parameters 652 for a reference gemstone sample, said one or more inclusion characteristics including the location and / or type of one or more inclusions in gemstone sample 104. The predetermined reference origin parameter 652 may include a reference type and / or reference location of one or more reference inclusions in reference gemstone sample image 634, and their relationship to a specific geographical location and / or specific mining area of ​​reference gemstone sample image 634.

[0104] Processor 170 may be configured to determine origin parameter 650 based on a comparison of inclusion parameter 642 with each of a plurality of predetermined reference origin parameters 652. In various embodiments, processor 170 may be configured to determine whether inclusion parameter 642 matches (e.g., is equal to or the same as) at least one of the plurality of predetermined reference origin parameters 652; and determine origin parameter 650 based on said comparison. For example, if it is determined that inclusion parameter 642 matches at least one of the predetermined reference origin parameters 652, the origin parameter 650 of gemstone sample 104 may be determined based on the association between the matched predetermined reference origin parameter 652 and a specific geographical location and / or specific mining area of ​​reference gemstone sample image 634.

[0105] Reference Figure 6 Gemstone parameter 174 may also include treatment parameter 655 indicating the treatment applied to gemstone sample 104. Various treatments can be applied to gemstone sample 104 to enhance its appearance, clarity, and color, thereby affecting its commercial value; therefore, treatment parameter 655 may be useful for the identification and subsequent valuation of gemstone sample 104. Conventionally, trained gemologists can determine whether gemstone sample 104 has been treated based on visual observation of inclusions and growth structure characteristics.

[0106] In various embodiments, processor 170 may also be configured to determine processing parameters 655 based on inclusion parameters 642 and growth structure parameters 644 of the gemstone sample 104. In various embodiments, processor 170 may be configured to compare inclusion parameters 642, indicating characteristics of one or more inclusions in the gemstone sample 104, with each of a plurality of predetermined reference processing parameters 656 for a reference gemstone sample, said one or more inclusion characteristics including the location and / or type of one or more inclusions in the gemstone sample 104. The predetermined reference processing parameters 656 may include a reference type and / or reference location of one or more reference inclusions in a reference gemstone sample image 634, and their relationship to a specific processing applied to the reference gemstone sample.

[0107] In various embodiments, processor 170 may be configured to determine whether inclusion parameter 642 matches (e.g., is equal to or the same as) at least one of a plurality of predetermined reference processing parameters 656. For example, if inclusion parameter 642 is determined to match at least one of predetermined reference processing parameters 656, processing parameter 655 may be determined in part based on the relationship between the matching predetermined reference processing parameter 656 and a specific processing applied to a reference gemstone sample.

[0108] In various embodiments, processor 170 may also be configured to compare growth structure parameters 644, indicating one or more growth structure characteristics in gemstone sample 104, with each of a plurality of predetermined reference processing parameters 656 for a reference gemstone sample, said one or more growth structure characteristics including the location and / or mineralization pattern of one or more growth structures in gemstone sample 104. The predetermined reference processing parameters 656 may also include reference mineralization patterns and / or reference locations of one or more reference growth structures in reference gemstone sample image 634, and their relationship to a specific processing applied to the reference gemstone sample.

[0109] In various embodiments, processor 170 may be configured to determine whether growth structure parameter 644 matches (e.g., is equal to or the same as) at least one of a plurality of predetermined reference processing parameters 656. For example, if it is determined that growth structure parameter 644 matches at least one of predetermined reference processing parameters 656, processing parameter 655 may be determined in part based on the relationship between the matching predetermined reference processing parameter 656 and a specific processing applied to a reference gemstone sample.

[0110] Therefore, the processing parameter 655 can be based on a comparison of the inclusion parameter 642 and / or the growth structure parameter 644 with each of a plurality of predetermined reference processing parameters 656. In some embodiments, the processing parameter 655 can be based on both the inclusion parameter 642 and the growth structure parameter 644.

[0111] Figure 7 A schematic diagram (A) of an exemplary uniform color space 700 for determining gemstone parameters 174, including color parameters 660 indicating the color category of gemstone sample 104, is shown; and an example diagram 710 (B) of pre-assigned color coordinates corresponding to a predetermined color category of a corresponding reference gemstone sample image 634. Currently, the determination of the color of gemstone sample 104 is based on the gemologist's visual perception of the color of gemstone sample 104, which can be inconsistent due to variations in human physiology and / or lighting conditions. Gemstone colors are also labeled using lengthy descriptors based on the gemologist's subjective perception of the gemstone color. For example, blue gemstones of different shades of blue can be labeled as "royal blue," "cornflower blue," "peacock blue," "purple blue," "blue," etc., and the color category of a particular gemstone may differ from that of a different gemologist.

[0112] Currently, there is no objective, quantitative, and standardized method to determine and label the color category of gemstone sample 104. Furthermore, due to the lack of a reference standardization measure for determining the color of gemstone sample 104, the acceptable color tolerance of the gemstone may vary across the industry due to differences in gemologists and lighting conditions. Additionally, determining the color category of gemstone sample 104 is particularly challenging due to the uneven distribution of color throughout the gemstone sample 104 (which depends on its shape, cut, and level of transparency, such as purity). This unevenness is exacerbated by the luster of gemstone sample 104 when it interacts with excitation wave 112 and is viewed from different angles. Therefore, the system 600 of this disclosure provides an objective, quantitative, and standardized measurement method for determining color parameters 660 to aid in the identification of gemstone sample 104. Non-limiting examples of color categories for gemstone sample 104 may include “blue,” “royal blue,” “cornflower blue,” “red,” “deep red,” “yellow,” and “green.”

[0113] Reference Figure 6 and Figure 7 A perceptual uniform color space 700, such as, but not limited to, the International Commission on Illumination (CIE) LAB 1976 color space, can be used to provide a library of multiple reference color parameters 672, each representing a pre-assigned color coordinate corresponding to a predetermined color category of one of the multiple reference gemstone sample images 634, the pre-assigned color coordinates being assigned relative to the uniform color space 700. In various embodiments, the uniform color space 700 provides a device-independent 3D color space for measuring the color of the reference gemstone sample images 634.

[0114] exist Figure 7 In the example shown in A, the uniform color space 700 can include L *Shaft 702, L * The axis is defined as black at one end (-L) * And define white (+L) at the opposite end. * ); a * Axis 704 represents green (-a) * - Red (+a) * Opposite colors and b * Axis 706 represents blue (-b) * - Yellow (+b) * ( ) Opposite colors; and the color coordinates of gemstone sample 104 can include L * a * and b * Cartesian coordinates on the axes. In other words, gem sample 104 can be assigned representative color coordinates with three coordinates, i.e. Furthermore, the color of gemstone sample 104 can be represented as points, for example, coordinates in a 3D uniform color space 700. Similarly, each predetermined color category of a corresponding one of the plurality of reference gemstone sample images 634 may include pre-assigned color coordinates, i.e., reference... value.

[0115] To provide a library including pre-assigned color coordinates corresponding to a predetermined color category of one of the plurality of reference gemstone sample images 634, processor 170 may include a machine learning algorithm. In various embodiments, the machine learning algorithm may be a deep learning machine learning algorithm, such as a diffusion model, a visual transducer, or a convolutional neural network, which can be trained using the reference gemstone sample images 634 visually pre-labeled with a predetermined color category. In various embodiments, the algorithm may be trained based on a large number of reference gemstone sample images 634, for example, at least 10,000, preferably 12,000, visually pre-labeled with a predetermined color category by a trained and experienced gemologist. Alternatively, it is conceivable that algorithm 634 may be trained using an unsupervised machine learning model based on the reference gemstone sample images 634.

[0116] Processor 170 can determine pre-assigned color coordinates corresponding to a predetermined color category of the reference gemstone sample image 634, allocated relative to a uniform color space 700. To determine the pre-assigned color coordinates, processor 170 can be configured to: determine the centroid coordinates of the predetermined color category; and determine the pre-assigned color coordinates as centroid coordinates, for example, a reference centroid of the predetermined color category. Value. Reference Figure 7In the example shown in B, one or more reference gemstone sample images 634 can be visually pre-labeled with a predetermined "blue" 712 color category, and the "blue" color category 710 can have pre-assigned color coordinates, i.e., "blue" references on a uniform color space 700. Similarly, one or more reference gemstone sample images 634 can be visually pre-labeled with a predetermined "red" 714 color category, and the "red" color category 714 can have pre-assigned color coordinates, i.e., "red" references on a uniform color space 700. Value. In other words, each of the multiple reference gemstone sample images 634 can have pre-assigned color coordinates corresponding to a predetermined color category (e.g., "blue" 712, "green", "red" 714) of the reference gemstone sample image 634, that is, (assigned relative to the uniform color space 700) reference. Value. In various embodiments, the library may be stored in memory 180. It is also conceivable that the library may be assembled and stored on other processors or servers (e.g., cloud infrastructure).

[0117] Figure 8 An exemplary schematic diagram is shown of various pixel color clusters 800 used to determine the representative color parameter 662, which indicates the representative color coordinates of a gem sample 104 relative to a uniform color space allocation in (A) a 3D format; and (B) a 2D format. The uniform color space can refer to... Figure 7 A discusses a uniform color space of 700. Figure 9 A comparison of representative color parameter 662 of gem sample image 632 with reference color parameter 672 is shown to determine color score parameter 664.

[0118] Reference Figure 6 , Figure 7 A, Figure 7 B. Figure 8 A, Figure 8 B and Figure 9 The processor 170 may first be configured to determine a representative color parameter 662 indicating representative color coordinates allocated relative to a uniform color space 700. In various embodiments, the gem sample image 632 comprises a plurality of pixels, and determining the representative color parameter 662 may include, for each pixel of the gem sample image 632, determining a pixel color parameter indicating pixel color coordinates allocated relative to a uniform color space. Pixel color coordinates may refer to Cartesian coordinates, i.e., the pixel coordinates of a pixel. The value, and each pixel of the gem sample image 632 can include the corresponding pixel color coordinates, that is, pixel value.

[0119] In various embodiments, the processor 170 may also be configured to cluster individual pixels among a plurality of pixels into pixel color clusters within a plurality of pixel color clusters, each pixel color cluster representing a predetermined color cluster of the gemstone sample image 104. For example, as Figure 8 A and Figure 8 As shown in Figure B, the predetermined color cluster may include a primary color cluster 802, a secondary color cluster 804, and a tertiary color cluster 806. In some embodiments, the predetermined color cluster may include only the primary color cluster 802 and the secondary color cluster 804. In various embodiments, the clustering of each pixel may be based on the pixel color coordinates, that is, the pixel coordinates of each pixel. The processor 170 can be configured to cluster pixels by implementing an unsupervised clustering algorithm (e.g., k-means clustering), where k refers to the number of predetermined color clusters. In various embodiments, k can be determined using contour analysis (in k-means clustering) to determine the optimal number of predetermined color clusters. In various embodiments, k can be equal to 3, i.e., k = 3, including primary color cluster 802, secondary color cluster 804, and tertiary color cluster 806. In some embodiments, k can be equal to 2, i.e., k = 2, including primary color cluster 802 and secondary color cluster 804. Alternatively, in some other embodiments, k can be greater than three; for example, k can be equal to four, i.e., k = 4, including a fourth color cluster (not shown) in addition to primary color cluster 802, secondary color cluster 804, and tertiary color cluster 806.

[0120] In various embodiments, the processor 170 may also be configured to determine a first color cluster parameter 661a representing the centroid coordinates of the values ​​of each pixel color cluster (e.g., primary color cluster 802, secondary color cluster 804, and tertiary color cluster 806), which may be assigned relative to the uniform color space 700. The first color cluster parameter 661a may include centroid coordinates, i.e., coordinates at the center of the respective pixel color cluster. For example, the first color cluster parameter 661a may be represented as having coordinates for the primary color cluster 802. Value; for secondary color cluster 804 Value; for the third chromaticity 806 Values; and for the fourth color cluster (not shown) value.

[0121] The processor 170 can also be configured to determine a second color cluster parameter 661b that indicates a weighted average of the pixel color coordinates within each pixel color cluster. Therefore, the second color cluster parameter 661b can be a weighted average of the pixel color coordinates of pixels already clustered into the corresponding pixel color cluster. In some examples, the second color cluster parameter 661b can be represented as n1 for the primary color cluster 802; n2 for the secondary color cluster 804; n3 for the third color cluster 806; and n4 for the fourth color cluster 806 (not shown).

[0122] Processor 170 can also be configured to determine representative color parameter 662 based on first color cluster parameter 661a and second color cluster parameter 662b. In various embodiments, processor 170 can also be configured to determine representative color coordinates based on equations (1) to (3) as defined below (i.e., The representative color parameter 662 is: Equation (1) Equation (2) Equation (3) in, This refers to the representative color parameter 662 in L. * Representative L on axis 702 * Coordinates, L1 * This refers to the primary color cluster 802 in L * L on shaft 702 * Coordinates, L2 * This refers to the secondary color cluster 804 in L * L on shaft 702 * Coordinates; a * (Representative value) refers to the representative color parameter 662 in a. * Representative a on axis 704 * Coordinates, a1 * This refers to the primary color cluster 802 in a * a on axis 704 * Coordinates, a2 * This refers to the secondary color cluster 804 in a * a on axis 704 * Coordinates; b * (Representative value) refers to the representative color parameter 662 in b * Representative b on axis 706 * Coordinates, b1 * This refers to the primary color cluster 802 in b * b on axis 706 * Coordinates, b2 * This refers to the secondary color cluster 804 in b * b on axis 706 * Coordinates; n1 refers to the weighted average of the pixel color coordinates of each pixel in the primary color cluster 802; and n2 is the weighted average of the pixel color coordinates of each pixel in the secondary color cluster 804.

[0123] In some embodiments, L * (Representative value) can also be based on L3 * and / or L4 * To determine, L3 *This refers to the third chromatic cluster 806 in L * L on shaft 702 * Coordinates, L4 * This refers to the fourth color cluster (not shown) in L * L on shaft 702 * Coordinates; a * (Representative value) can also be based on a3 * and / or a4 * To determine, a3 * This refers to the third chromatic cluster 806 in a * a on axis 704 * Coordinates, a4 * This refers to the fourth color cluster (not shown) in a * a on axis 704 * Coordinates; b * (Representative value) can also be based on b3 * and / or b4 * To determine, b3 * This refers to the third chromatic cluster 806 in b * b on axis 706 * Coordinates, b4 * This refers to the fourth color cluster (not shown) in b * b on axis 706 * Coordinates; n3 refers to the weighted average of the pixel color coordinates of all pixels within the third color cluster 806; n4 refers to the weighted average of the pixel color coordinates of all pixels within the fourth color cluster (not shown). For example, when k equals 3 (i.e., k = 3, including the primary color cluster 802, secondary color cluster 804, and third color cluster 806), the representative color parameter 662 with representative color coordinates is, It can be based on the following equations (4) to (6): Equation (4) Equation (5) Equation (6) Among them, L * (Representative value), L1 * L2 * It has been defined according to equations (1) to (3), and L3 * This refers to the third chromatic cluster 806 in L * L on shaft 702 * Coordinates; a * (Representative value), a1 * a2 * It has been defined according to equations (1) to (3), and a3 * This refers to the third chromatic cluster 806 in a *a on axis 704 * Coordinates; b * (Representative value), b1 * b2 * It has been defined according to equations (1) to (3), and b3 * This refers to the third chromatic cluster 806 in b * b on axis 706 * Coordinates; n1 and n2 have been defined according to equations (1) to (3), and n3 refers to the weighted average of the pixel color coordinates of each pixel within the third color cluster 806. The same principle (e.g., equations (4) to (6)) applies when k equals 4 (i.e., k = 4, including the primary color cluster 802, secondary color cluster 804, third color cluster 806, and fourth color cluster (not shown)), and has a representative color parameter 662 with representative color coordinates, i.e., It can also include the following parameters: L4 * It refers to the fourth color cluster (not shown) in L * L on shaft 702 * Coordinates; a4 * It refers to the fourth color cluster (not shown) in a * a on axis 704 * Coordinates; b4 * It refers to the fourth color cluster (not shown) in b * b on axis 706 * Coordinates; and n4 refers to the weighted average of the pixel color coordinates of each pixel within the fourth color cluster (not shown).

[0124] In various embodiments, the representative color parameter 662 can be further determined based on the number of pixel color clusters, which can be determined based on contour analysis (k-means clustering). In some embodiments, k can be an integer, for example, a positive natural number, i.e., k≥1; and the representative color parameter 662 has representative color coordinates, i.e. It can be based on the following equations (7) to (9): Equation (7) Equation (8) Equation (9) Where x = 1, 2, 3…k-1; This refers to the representative color parameter 662 in the L of the k-th pixel color cluster. * Representative L on axis 702 * coordinate, It refers to the color cluster of the k-th pixel in L * L on shaft 702 * coordinate; This refers to the representative color parameter 662 in the k-th pixel color cluster. * Representative a on axis 704 * coordinate, This refers to the color cluster of the k-th pixel in a * a on axis 704 * coordinate; This refers to the representative color parameter b in the k-th pixel color cluster. * Representative b* coordinates on axis 706; This refers to the color cluster of the k-th pixel in b. * b on axis 706 * Coordinates; n(k) refers to the weighted average of the pixel color coordinates of all pixels within the k-th pixel color cluster.

[0125] To determine color parameter 660, processor 170 may further be configured to compare representative color parameter 662 with each of a plurality of reference color parameters 672, which indicate pre-assigned color coordinates corresponding to a predetermined color category of a corresponding one of the plurality of reference gemstone sample images 634, relative to a uniform color space 700. For example, the representative color coordinates of representative color parameter 662 (i.e., ) and each pre-assigned color coordinate (i.e., the reference coordinates corresponding to the predetermined color category) The values ​​are compared with the reference color parameter 672 for the "red" predefined color category, the reference color parameter 672 for the "green" predefined color category, and the reference color parameter 672 for the "blue" 710 predefined color category.

[0126] In various embodiments, comparing the representative color parameter 662 with each reference color parameter 672 may include: determining, for each reference color parameter 672, the Euclidean distance ΔE between the representative color parameter 662 and the corresponding reference color parameter 672; and comparing the Euclidean distance ΔE between each pair of representative color parameters 662 and the corresponding reference color parameter 672. The Euclidean distance ΔE (refer to...) Figure 9 The color distance between the representative color parameter 662 and the corresponding reference color parameter 672 can be represented by the following equation (10): Equation (10) Wherein, ΔL is the ratio of the representative color parameter 662 to the corresponding reference color parameter 672 along L. * The difference between the coordinate values ​​of the axes; Δa refers to the difference between the representative color parameter 662 and the corresponding reference color parameter 672 along axis a. *The difference between the coordinate values ​​of the axes; and Δb refers to the difference between the representative color parameter 662 and the corresponding reference color parameter 672 along b. * The difference in coordinate values ​​of the axes. That is, the Euclidean distance ΔE can refer to the geometric distance between color points in the Cartesian coordinate system that corresponds to changes in human color vision perception.

[0127] Processor 170 can also be configured to determine a color score parameter 664, which indicates the minimum color distance between at least one of a representative color parameter 662 and a reference color parameter 672. In various embodiments, determining the color score parameter 664 may include identifying the minimum (i.e., least or smallest) Euclidean distance ΔE value among the respective pairs of representative color parameters 662 and corresponding reference color parameters 672. A lower (i.e., smallest) Euclidean distance ΔE value indicates a smaller perceived color difference between the representative color parameter 662 and the corresponding reference color parameter 672 pair, thus quantitatively representing the minimum color distance (smaller perceived color difference) between the two colors on the uniform color space 700.

[0128] like Figure 6 As shown, the processor 170 can also be configured to compare the color score parameter 664 with a predetermined color tolerance threshold 674 that indicates the expected deviation between at least one of the representative color parameter 662 and the reference color parameter 672. The predetermined color tolerance threshold 674 can indicate the expected deviation that allows the gem sample image 632 to be labeled with a predetermined color category. In various embodiments, the predetermined color tolerance threshold 674 can be in the range of 10 to 25, optionally in the range of 15 to 20.

[0129] Then, the processor 170 can determine the color parameter 660 (i.e., the predetermined color category of the gem sample 104) based on a comparison of the color score parameter 664 with a predetermined color tolerance threshold 674. In various embodiments, determining the color parameter 660 may include: determining whether the color score parameter 664 is less than or equal to the predetermined color tolerance threshold 674; and if the color score parameter 664 is determined to be less than or equal to the predetermined color tolerance threshold 674, then the color parameter 660 is determined. In other words, if the minimum Euclidean distance ΔE is less than or equal to the predetermined color tolerance threshold 674, the gem sample 104 can be labeled according to one of the predetermined color categories corresponding to the reference gem sample image 634. Therefore, the gem sample 104 can be labeled with the predetermined color category of the reference gem sample image 634 that has the smallest (i.e., closest) Euclidean distance ΔE to the corresponding reference color parameter 672.

[0130] While the comparison of gem sample image 632 with each of the plurality of reference gem sample images 634 has been discussed above, this disclosure is not limited thereto, and it is also conceivable that in some embodiments, reference gem sample image 634 may include multiple cross-sectional images of a reference gem sample, each cross-sectional image including a reference shape and size 634a, a reference cut of at least one facet 634b, one or more reference inclusions 634c and / or one or more reference growth structures 634d and / or reference color parameters 672. In this embodiment, each cross-sectional image of gem sample 104, for example including gem data 172 in at least one of the first, second, third, fourth, fifth, sixth, seventh, and eighth transmitted waves 122, 124, 126, 128, 129, 141, 143, 152 and / or the first, second, and third modified transmitted waves 142, 144, 154, may be individually compared with the corresponding cross-sectional image of reference gem image 634 to determine various gem parameters 174.

[0131] Reference Figure 6 The processor 170 can be configured to determine unique gem signature parameters 690 for the gem sample 104, which include at least two of the aforementioned gem parameters 174. For example, the unique gem signature parameters 690 may include a combination of at least two of the following: optical parameters 610 (e.g., UV fluorescence and / or phosphorescence parameters 612, pleochroism parameters 614, absorption parameters 615, birefringence parameters 616 and / or refractive index parameters 618); species parameters 620; geometric parameters 630 (e.g., gem shape parameters 636 and / or facet parameters 638); clarity parameters 640 (e.g., inclusion parameters 642 and / or growth structure parameters 644); origin parameters 650; treatment parameters 655; and / or color parameters 660. Further envisioning, the processor 170 can be configured to determine a gemstone similarity index, wherein the difference between a unique gemstone signature parameter 690 of gemstone sample 104 and another unique gemstone signature parameter 690 of another gemstone sample 104 can be compared, and a preset threshold can be used to infer and verify matching unique gemstone signature parameters 690. The determination of unique gemstone signature parameters 690 provides traceability and eliminates the need to mark gemstone sample 104 with laser engraving or non-removable DNA information, thus preserving the structure of gemstone sample 104.

[0132] Figure 10 A flowchart illustrating an exemplary method 1000 for generating at least one image of an imaging apparatus for acquiring a gemstone sample, according to another aspect of this disclosure, is shown, wherein the at least one image contains gemstone data indicating the properties of the gemstone sample. The imaging apparatus may refer to... Figures 1 to 5The imaging devices 100, 300, 400, and 500 are discussed, and repeated descriptions are omitted for the sake of brevity.

[0133] Method 1000 may include the following steps: setting up a sample holder configured to support a gemstone sample (step 1002); setting up an electromagnetic radiation source configured to generate an excitation wave that transmits / passes through the gemstone sample to generate a transmitted wave modified by the gemstone sample (step 1004); setting up at least one optical instrument positioned and optically aligned relative to the sample holder and the electromagnetic radiation source, the at least one optical instrument being configured to modulate the excitation wave that transmits through the gemstone sample to generate a modified excitation wave, or modulate the transmitted wave to generate a modified transmitted wave (step 1006); and setting up a detector optically aligned with the sample holder, the electromagnetic radiation source, and the at least one optical instrument, the detector being configured to detect the transmitted wave and / or the modified transmitted wave to obtain at least one image of the gemstone sample (step 1008).

[0134] In various embodiments, at least one optical instrument may include a first optical instrument located between an electromagnetic radiation source and a sample holder, the first optical instrument being configured to modulate an excitation wave passing through the gemstone sample to generate a modified excitation wave, wherein the first optical instrument includes: a first polarizing filter, a grating assembly, and / or a prism assembly.

[0135] In various embodiments, at least one optical instrument may further include a second optical instrument located between the sample holder and the detector, the second optical instrument being configured to modulate the transmitted wave to generate a modified transmitted wave, wherein the second optical instrument includes a second polarizing filter.

[0136] In various embodiments, the first polarizing filter and / or the second polarizing filter are configured to be rotatable along the horizontal and / or vertical axes of the first and / or second polarizing filters.

[0137] In various embodiments, method 1000 may further include providing a calibrated refractometer scale optically aligned with a sample holder, an electromagnetic radiation source, at least one optical instrument, and a detector, wherein the at least one optical instrument further includes an optical plate, hemisphere, or semi-cylinder disposed adjacent to the sample holder, the optical plate, hemisphere, or semi-cylinder being configured to modulate an excitation wave to generate a modified excitation wave; and modulating a transmitted wave to generate a modified transmitted wave and projecting the modified transmitted wave onto the calibrated refractometer scale.

[0138] In various embodiments, the sample holder is configured to rotate along the horizontal, vertical, and / or axial axes of the sample holder.

[0139] In various embodiments, method 1000 may further include: providing a sample chamber disposed adjacent to a sample holder, the sample chamber being configured to contain an optical fluid, wherein the sample chamber is further configured to receive a sample holder supporting a gemstone sample such that the gemstone sample is suspended in the optical fluid contained within the sample chamber.

[0140] In various embodiments, the wavelength of the excitation wave ranges from 100 to 3000 nm.

[0141] In various embodiments, at least one image of the gemstone sample includes at least one cross-sectional image of the gemstone sample, each cross-sectional image being acquired along the longitudinal, sagittal, and / or transverse planes of the gemstone sample.

[0142] Figure 11 A flowchart of an exemplary method 1100 for determining gem parameters indicating the properties of a gem sample, according to another aspect of this disclosure, is shown. The method 1100 for determining gem parameters can be referenced in [reference needed]. Figures 6 to 9 The system 600 used to determine various gem parameters 174 is discussed, and repeated descriptions are omitted for the sake of brevity.

[0143] Method 1100 may include the following steps: setting up a processor for data communication with the imaging device (step 1102). In various embodiments, the imaging device may refer to... Figures 1 to 5 The imaging devices 100, 300, 400, and 500 are discussed. Method 1100 may further include: obtaining at least one image of a gem sample containing gem data indicating the properties of the gem sample (step 1104); and determining gem parameters based on at least one image of the gem sample containing gem data indicating the properties of the gem sample (step 1106).

[0144] In various embodiments, the processor includes at least one machine learning algorithm for determining gem parameters, and the machine learning algorithm may optionally include a deep learning algorithm. In some embodiments, the deep learning algorithm may include a convolutional neural network algorithm, a diffusion model, and / or a visual converter.

[0145] In various embodiments, gemstone parameters may include optical parameters indicating the optical properties of the gemstone sample, wherein the optical parameters include: a refractive index parameter indicating the refractive index of the gemstone sample; a birefringence parameter indicating birefringence characteristics related to the difference between the refractive indices of at least two crystal axes of the gemstone sample; a pleochroism parameter indicating pleochroism characteristics related to the chromatogram of at least two crystal axes of the gemstone sample; an absorption parameter indicating characteristic absorption spectra related to the dispersion of transmitted waves of the gemstone sample; and UV fluorescence and / or phosphorescence parameters indicating characteristic fluorescence and / or phosphorescence related to transmitted waves of the gemstone sample.

[0146] In various embodiments, gemstone parameters may also include species parameters indicating the category of a gemstone sample, wherein the species parameters are determined based on at least one of a refractive index parameter, birefringence parameter, pleochroism parameter, absorption parameter, UV fluorescence and / or phosphorescence parameter of the gemstone sample.

[0147] In various embodiments, the gemstone parameters may further include geometric parameters indicating the geometric properties of the gemstone sample, wherein the geometric parameters include: gemstone shape parameters indicating the shape and size of the gemstone sample, and facet parameters indicating the cut of at least one facet of the gemstone sample, wherein determining the gemstone shape parameters includes: constructing a gemstone sample image based on at least one image of the gemstone sample; comparing the gemstone sample image with each of a plurality of reference gemstone sample images, each reference gemstone sample image containing a reference shape and size of the reference gemstone sample image; determining the gemstone shape parameters based on the comparison of the gemstone sample image with each of the reference gemstone sample images containing the reference shape and size of the reference gemstone sample image; wherein determining the facet parameters includes: comparing the gemstone sample image with each of a plurality of reference gemstone sample images, each reference gemstone sample image further containing a reference cut of at least one facet of the reference gemstone sample image; determining the facet parameters based on the comparison of the gemstone sample image with each of the reference gemstone sample images containing the reference cut of at least one facet of the reference gemstone sample image; and wherein the geometric parameters are determined based on at least one of the gemstone shape parameters and / or the facet parameters.

[0148] In various embodiments, the gemstone parameters may further include clarity parameters indicating the purity of the gemstone sample, wherein the clarity parameters include: inclusion parameters representing the characteristics of one or more inclusions in the gemstone sample, the one or more inclusion characteristics including the location and / or type of one or more inclusions in the gemstone sample; growth structure parameters indicating the characteristics of one or more growth structures in the gemstone sample, the one or more growth structure characteristics including the location and / or mineralization mode of one or more growth structures formed in the gemstone sample; wherein determining the inclusion parameters includes: comparing a gemstone sample image with each of a plurality of reference gemstone sample images, each reference gemstone sample image further comprising... The method involves referencing one or more reference inclusions in a gemstone sample image; and determining inclusion parameters based on a comparison between the gemstone sample image and a plurality of reference gemstone sample images that include one or more reference inclusions; wherein determining growth structure parameters includes: comparing the gemstone sample image with a plurality of reference gemstone sample images, each reference gemstone sample image further including one or more reference growth structures in the reference gemstone sample image; and determining growth structure parameters based on a comparison between the gemstone sample image and a plurality of reference gemstone sample images that include one or more reference growth structures; and wherein clarity parameters are determined based on at least one of the inclusion parameters and / or growth structure parameters.

[0149] In various embodiments, the gemstone parameters may further include origin parameters indicating the geological origin of the gemstone sample, wherein determining the origin parameters includes: comparing inclusion parameters with each of a plurality of predetermined reference origin parameters, each predetermined reference origin parameter including a reference type of one or more reference inclusions of the reference gemstone sample and / or a reference location of one or more reference inclusions, and their relationship to a specific geographical location; and determining the origin parameters based on the comparison of inclusion parameters with each of the plurality of predetermined reference origin parameters.

[0150] In various embodiments, gemstone parameters may include processing parameters indicating a treatment applied to a gemstone sample, wherein the processor is further configured to: compare inclusion parameters with each of a plurality of predetermined reference processing parameters, each predetermined reference processing parameter including a reference type of one or more reference inclusions and / or a reference location of one or more reference inclusions, and their relationship to a specific treatment applied to the reference gemstone sample; compare growth structure parameters with each of a plurality of predetermined processing parameters, each predetermined reference processing parameter further including a reference location of one or more reference growth structures and / or a reference mineralization pattern of one or more reference growth structures, and their relationship to a specific treatment applied to the reference gemstone sample; and determine processing parameters based on the comparison of inclusion parameters and / or growth structure parameters with each of the plurality of predetermined reference processing parameters.

[0151] In various embodiments, the gemstone parameters may include color parameters indicating the color category of a gemstone sample, wherein determining the color parameters includes: determining a representative color parameter indicating representative color coordinates allocated relative to a uniform color space; comparing the representative color parameter with each of a plurality of reference color parameters, each reference color parameter indicating pre-assigned color coordinates corresponding to a predetermined color category of one of the plurality of reference gemstone sample images, the pre-assigned color coordinates being allocated relative to a uniform color space; determining a color score parameter indicating a minimum color distance between the representative color parameter and at least one reference color parameter; comparing the color score parameter with a predetermined color tolerance threshold indicating a desired deviation between the representative color parameter and at least one reference color parameter; and determining the color parameters based on the comparison between the color score parameter and the predetermined color tolerance threshold.

[0152] In some embodiments, the gemstone sample image includes a plurality of pixels, and determining the representative color parameter may include: determining a pixel color parameter for each pixel of the plurality of pixels, the pixel color parameter representing a pixel color coordinate allocated relative to a uniform color space; clustering the pixels of the plurality of pixels into a plurality of pixel color clusters, each pixel color cluster representing a predetermined color cluster of the gemstone sample image, clustering the pixels based on the pixel color coordinates of the corresponding pixels; determining a first color cluster parameter indicating the centroid coordinates of the corresponding pixel color cluster and a second color cluster parameter indicating the weighted average of the pixel color coordinates within the corresponding pixel color cluster for each pixel color cluster; and determining the representative color parameter based on the first color cluster parameter and the second color cluster parameter.

[0153] In various embodiments, determining the color parameter further includes determining whether the color score parameter is less than or equal to a predetermined color tolerance threshold; and if the color score parameter is determined to be less than or equal to the predetermined color tolerance threshold, then determining the color parameter.

[0154] In various embodiments, method 1100 may further include: determining a unique gem signature of a gem sample, the unique gem signature including at least two gem parameters of the gem sample (step 1108).

[0155] According to another aspect of this disclosure, a computer-readable medium including instructions is provided that, when executed by a processor, causes the processor to perform a method 1100 for determining gem parameters 174.

[0156] Therefore, this disclosure provides an improved imaging apparatus for acquiring gem data indicating the properties of gem samples, and a system including the improved imaging apparatus for determining gem parameters based on the gem data. In this respect, the improved imaging apparatus integrates various gem analysis tools into a single device and also includes a detector for acquiring images of gem samples containing gem data required for gem identification. Additionally, the system of this disclosure includes a processor with at least one machine learning algorithm for analyzing gem data and determining gem parameters based on the gem data for gem sample identification. This disclosure also provides an objective and quantitative measurement method for determining gem color, which is device-independent and unaffected by environmental conditions, and provides a platform for calculating the color difference between two gems, as well as for describing and comparing gem colors in a consistent manner. Furthermore, this disclosure provides a method for determining a unique gem signature to track gems, which preserves the original structure and value of the gem.

[0157] While this disclosure has been specifically shown and described with reference to particular embodiments, those skilled in the art will understand that various changes in form and detail may be made therein without departing from the spirit and scope of this disclosure as defined by the appended claims. Therefore, the scope of this disclosure is indicated by the appended claims and is thus intended to cover all changes within the equivalent meaning and scope of the claims.

Claims

1. An imaging apparatus for acquiring at least one image of a gemstone sample, said at least one image including gemstone data indicating properties of said gemstone sample, said imaging apparatus comprising: A sample holder configured to support the gemstone sample; An electromagnetic radiation source configured to generate an excitation wave for transmission / through the gem sample, thereby generating a transmitted wave modified by the gem sample. At least one optical instrument is disposed and optically aligned relative to the sample holder and the electromagnetic radiation source, the at least one optical instrument being configured to modulate the excitation wave for transmission / through the gemstone sample to generate a modified excitation wave, or to modulate the transmitted wave to generate a modified transmitted wave. as well as A detector, optically aligned with the sample holder, the electromagnetic radiation source, and the at least one optical instrument, wherein the detector is configured to detect the transmitted wave and / or the modified transmitted wave incident on the detector to obtain the at least one image of the gemstone sample.

2. The imaging device according to claim 1, wherein, The at least one optical instrument includes: A first optical instrument located between the electromagnetic radiation source and the sample holder, the first optical instrument being configured to modulate the excitation wave transmitted through the gemstone sample, thereby generating the modified excitation wave. The first optical instrument includes: a first polarizing filter, a grating assembly and / or a prism assembly.

3. The imaging apparatus according to claim 1 or 2, wherein, The at least one optical instrument further includes: A second optical instrument located between the sample holder and the detector, the second optical instrument being configured to modulate the transmitted wave to generate the modified transmitted wave. The second optical instrument includes a second polarizing filter.

4. The imaging device according to claim 3, wherein, The first polarizing filter and / or the second polarizing filter are configured to be rotatable along the horizontal and / or vertical axes of the first polarizing filter and / or the second polarizing filter.

5. The imaging apparatus according to any one of claims 1 to 4, further comprising: A calibrated refractometer scale optically aligned with the sample holder, the electromagnetic radiation source, the at least one optical instrument, and the detector. The at least one optical instrument further includes: an optical plate, hemisphere, or semi-cylinder disposed adjacent to the sample holder, the optical plate, hemisphere, or semi-cylinder being configured to modulate the excitation wave to generate the modified excitation wave; and modulate the transmission wave to generate the modified transmission wave, and project the modified transmission wave onto the calibrated refractometer scale.

6. The imaging apparatus according to any one of claims 1 to 5, wherein, The sample holder is configured to rotate along the horizontal, vertical, and / or axial axes of the sample holder.

7. The imaging apparatus according to any one of claims 1 to 6, further comprising: A sample chamber is disposed adjacent to the sample holder, the sample chamber being configured to contain optical fluid. The sample chamber is further configured to receive the sample holder that supports the gemstone sample, such that the gemstone sample is suspended in an optical fluid contained within the sample chamber.

8. The imaging apparatus according to any one of claims 1 to 7, wherein, The wavelength range of the excitation wave is between 100 and 3000 nm, and optionally between 250 and 700 nm.

9. The imaging apparatus according to any one of claims 1 to 8, wherein, The at least one image of the gemstone sample includes at least one cross-sectional image of the gemstone sample, and each cross-sectional image is obtained along the longitudinal plane, sagittal plane and / or transverse plane of the gemstone sample.

10. A system for determining gem parameters indicating the properties of a gem sample, the system comprising: The imaging apparatus according to any one of claims 1 to 9, A processor that communicates data with the imaging device, the processor being configured as follows: Obtain at least one image of the gemstone sample, the image containing gemstone data indicating the properties of the gemstone sample; and The gem parameters are determined based on the at least one image of the gem sample containing gem data indicating the attributes of the gem sample.

11. The system according to claim 10, wherein, The processor includes at least one machine learning algorithm for determining the parameters of the gemstone, the machine learning algorithm optionally including a deep learning algorithm.

12. The system according to claim 10 or 11, wherein, The gemstone parameters include optical parameters that indicate the optical properties of the gemstone sample. The optical parameters include: The refractive index parameter indicates the refractive index of the gemstone sample; Birefringence parameter, which indicates the birefringence properties related to the difference between the refractive indices of at least two crystal axes of the gemstone sample; Pleochroism parameters, which indicate the pleochroism properties related to the chromatogram of the at least two crystal axes of the gemstone sample; Absorption parameters, which indicate the characteristic absorption spectrum related to the dispersion of the transmitted wave of the gemstone sample; UV fluorescence and / or phosphorescence parameters, which indicate characteristic fluorescence and / or phosphorescence associated with the transmitted waves of the gemstone sample.

13. The system according to claim 12, wherein, The gemstone parameters also include species parameters that indicate the category of the gemstone sample. The species parameters are determined based on at least one of the refractive index parameters, birefringence parameters, pleochroism parameters, absorption parameters, UV fluorescence and / or phosphorescence parameters of the gemstone sample.

14. The system according to any one of claims 10 to 13, wherein, The gemstone parameters also include geometric parameters that indicate the geometric properties of the gemstone sample. The geometric parameters include: Gemstone shape parameters, which indicate the shape and size of the gemstone sample. Facet parameters, which indicate the cut of at least one facet of the gemstone sample. The processor is further configured as follows: Construct a gem sample image based on at least one image of the gem sample; The gem sample image is compared with each of a plurality of reference gem sample images, each of which contains a reference shape and size of the reference gem sample image and also contains a reference cut of at least one facet of the reference gem sample image; The gemstone shape parameters are determined by comparing the gemstone sample image with each reference gemstone sample image, which includes the reference shape and size. The facet parameters are determined based on a comparison between the gemstone sample image and reference gemstone sample images of each reference cut including at least one facet of the reference gemstone sample image; and The geometric parameters are determined based on at least one of the gemstone shape parameters and / or the facet parameters.

15. The system according to claim 14, wherein, The gemstone parameters also include clarity parameters that indicate the purity of the gemstone sample. The clarity parameters include: Inclusion parameters, which indicate the characteristics of one or more inclusions in the gemstone sample, including the location and / or type of the one or more inclusions in the gemstone sample; Growth structure parameters, which indicate one or more growth structure characteristics in the gemstone sample, including the location of the one or more growth structures formed in the gemstone sample and / or the mineralization pattern of the one or more growth structures. The processor is further configured as follows: The gemstone sample image is compared with each of the plurality of reference gemstone sample images, each reference gemstone sample image further comprising one or more reference inclusions in the reference gemstone sample image, and also comprising the one or more reference growth structures in the reference gemstone sample image; The inclusion parameters are determined by comparing the gemstone sample image with each of a plurality of reference gemstone sample images containing one or more reference inclusions in the gemstone sample image. The growth structure parameters are determined based on a comparison between the gemstone sample image and each of the plurality of reference gemstone sample images containing the one or more reference growth structures; and The clarity parameter is determined based on at least one of the inclusion parameters and / or the growth structure parameters.

16. The system according to claim 15, wherein, The gemstone parameters also include origin parameters indicating the geological origin of the gemstone sample. The processor is further configured as follows: The inclusion parameters are compared with each of a plurality of predetermined reference origin parameters, each predetermined reference origin parameter including the reference type of one or more reference inclusions in a reference gemstone sample and / or the reference location of one or more reference inclusions and their relationship to a specific geographical location; and The origin parameter is determined by comparing the inclusion parameter with each of the plurality of predetermined reference origin parameters.

17. The system according to claim 16, wherein, The gemstone parameters also include treatment parameters that indicate the treatment applied to the gemstone sample. The processor is further configured as follows: The inclusion parameters are compared with each of a plurality of predetermined reference processing parameters, each predetermined reference processing parameter including the reference type of the one or more reference inclusions and / or the reference position of the one or more reference inclusions and their relationship to a specific treatment applied to the reference gemstone sample; The growth structure parameters are compared with each of the plurality of predetermined processing parameters, each predetermined reference processing parameter further including a reference position of the one or more reference growth structures and / or a reference mineralization pattern of the one or more reference growth structures and its relationship to the specific treatment applied to the reference gemstone sample; and The processing parameters are determined by comparing the inclusion parameters and / or the growth structure parameters with each of the plurality of predetermined reference processing parameters.

18. The system according to any one of claims 14 to 17, wherein, The gemstone parameters include color parameters that indicate the color category of the gemstone sample. The processor is further configured as follows: Determine representative color parameters that indicate representative color coordinates relative to a uniform color space allocation. The representative color parameter is compared with each of a plurality of reference color parameters, each reference color parameter indicating a pre-assigned color coordinate corresponding to a predetermined color category of a corresponding one of the plurality of reference gemstone sample images, the pre-assigned color coordinates being allocated relative to the uniform color space. Determine a color score parameter that indicates the minimum color distance between the representative color parameter and at least one of the reference color parameters. The color score parameter is compared with a predetermined color tolerance threshold that indicates the expected deviation between the representative color parameter and at least one of the reference color parameters. The color parameters are determined based on a comparison between the color score parameters and the predetermined color tolerance threshold.

19. The system according to claim 18, wherein, The gemstone sample image comprises multiple pixels, wherein the processor is configured to determine the representative color parameter in the following manner: Determine pixel color parameters for each of the plurality of pixels, the pixel color parameters indicating pixel color coordinates allocated relative to the uniform color space; Each pixel in the plurality of pixels is clustered into a pixel color cluster in a plurality of pixel color clusters, each pixel color cluster representing a predetermined color cluster of the gem sample image, and each pixel is clustered based on the pixel color coordinates of each pixel; For each pixel color cluster, determine a first color cluster parameter indicating the centroid coordinates of the corresponding pixel color cluster and a second color cluster parameter indicating the weighted average of the pixel color coordinates within the corresponding pixel color cluster; and The representative color parameters are determined based on the first color cluster parameters and the second color cluster parameters.

20. The system according to claim 18 or 19, wherein, To determine the color parameters, the processor is further configured to: Determine whether the color score parameter is less than or equal to the predetermined color tolerance threshold, and If it is determined that the color score parameter is less than or equal to the predetermined color tolerance threshold, then the color parameter is determined.

21. The system according to any one of claims 10 to 20, wherein, The processor is also configured to: Determine a unique gem signature for the gem sample, the unique gem signature including at least two gem parameters of the gem sample.

22. A method of manufacturing an imaging apparatus for acquiring at least one image of a gemstone sample, said at least one image containing gemstone data indicating properties of the gemstone sample, the method comprising: Configure the sample holder to support the gemstone sample; The configuration is set to generate an electromagnetic radiation source that transmits / passes through the gem sample to produce a transmitted wave modified by the gem sample. At least one optical instrument is provided, positioned and optically aligned relative to the sample holder and the electromagnetic radiation source, the at least one optical instrument being configured to modulate the excitation wave for transmitting through the gemstone sample to generate a modified excitation wave, or to modulate the transmitted wave to generate a modified transmitted wave. as well as A detector is provided that is optically aligned with the sample holder, the electromagnetic radiation source, and the at least one optical instrument. The detector is configured to detect the transmitted wave and / or the modified transmitted wave incident on the detector to obtain at least one image of the gemstone sample.

23. A method for determining gem parameters that indicate the properties of a gem sample, the method comprising: A processor is provided for data communication with the imaging apparatus according to any one of claims 1 to 9. The method further includes: Obtain at least one image of the gemstone sample, the image containing gemstone data indicating the properties of the gemstone sample; Gemstone parameters are determined based on at least one image containing gemstone data indicating the properties of the gemstone sample, based on the transmitted wave and / or the modified transmitted wave, and optionally... Determine a unique gem signature for the gem sample, the unique gem signature including at least two gem parameters of the gem sample.

24. The method according to claim 23, wherein, The processor includes at least one machine learning algorithm for determining the parameters of the gemstone, the machine learning algorithm optionally including a deep learning algorithm.

25. A computer-readable medium comprising instructions that, when executed by a processor, cause the processor to perform the method of claim 23 or 24.

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