Illumination processing system and illumination processing method

Abstract

The application provides a light treatment system and a light treatment method, which are applied to the technical field of medical devices, and the light treatment system comprises a safety interlocking module, the safety interlocking module comprises a gate circuit, a latch and a relay, and only when high-level signals are received by the first input end and the second input end of the gate circuit, the gate circuit outputs a high-level signal to make the relay close and make the power supply circuit of the power supply device conduct. Through the combination of the gate circuit, the latch and the relay, the safety interlocking is changed from software execution in the prior art to physical wire connection, and no CPU is involved in the whole decision link, no memory reading and writing are involved, and no software branch judgment is involved. Even in the extreme working condition that the controller CPU is completely dead, the software watchdog is invalid, and the electromagnetic interference causes the bus data to be abnormal, the gate circuit can still reliably execute the safety decision according to the two-level signals, so that the safety of the light treatment system is improved.

Description

Technical Field

[0001] This application relates to the field of medical device technology, and in particular to a light processing system and a light processing method. Background Technology

[0002] Extracorporeal photochemotherapy (ECP) is a therapeutic technique that involves mixing a patient's blood (or blood components) with a photosensitizer (such as 8-methoxypsoralen / 8-MOP, riboflavin, etc.) via extracorporeal circulation, followed by irradiation with a light source of a specific wavelength. This generates reactive oxygen species to regulate immune cell function or inactivate pathogens. This technology has been widely applied in areas such as graft-versus-host disease, scleroderma, cutaneous T-cell lymphoma, and the inactivation of blood pathogens.

[0003] The calibration verification and irradiation start authorization functions of existing ECP equipment are completed by the embedded central processing unit (CPU) executing firmware instructions: before irradiation, the equipment reads the sensor values ​​through software, and the CPU determines whether they are within the allowable range; if the determination is qualified, the software sets a calibration qualified flag bit in memory; when irradiation starts, the software checks the flag bit, and if it is true, it allows the output of the pulse width modulation (PWM) circuit drive signal.

[0004] Existing ECP equipment safety interlocks rely entirely on software logic, which is prone to failure under abnormal operating conditions such as CPU crashes, program malfunctions, and electromagnetic interference, resulting in low security. Summary of the Invention

[0005] This application provides a light processing system and a light processing method that can solve the problem of low security in existing ECP devices.

[0006] In a first aspect, embodiments of this application provide a light processing system, which includes: a light source device, an operating table, a quality inspection device, an irradiation device, and a safety interlock module; The operating table is provided with a mounting slot, and the light-emitting surface of the light source device faces the mounting slot. The mounting slot is used to install a target device, which is the quality inspection device or the irradiation device. The mounting slot is equipped with a sensing component. The safety interlock module includes a gate circuit, a latch, and a relay. The first input terminal of the gate circuit is electrically connected to the sensing component. The input terminal of the latch is electrically connected to the quality inspection device. The output terminal of the latch is electrically connected to the second input terminal of the gate circuit. The output terminal of the gate circuit is electrically connected to the control terminal of the relay. The relay is connected in series with the power supply circuit of the light source device to control the power supply circuit to be turned on or off. When the target device is installed in the preset position of the mounting slot, the sensing component outputs a high-level signal to the first input terminal; when the target device is not installed in the preset position of the mounting slot, the sensing component outputs a low-level signal to the first input terminal. When the quality inspection device inspects the illumination information of the light source device and the inspection is qualified, the quality inspection device sends a quality inspection qualified signal to the latch; upon receiving the quality inspection qualified signal, the latch switches the output signal output to the second input terminal from a low level signal to a high level signal. When both the first input terminal and the second input terminal receive a high-level signal, the output terminal of the gate circuit outputs a high-level signal to the relay to close the relay and turn on the power supply circuit; when either the first input terminal or the second input terminal receives a low-level signal, the output terminal of the gate circuit sends a low-level signal to the relay to open the relay and turn off the power supply circuit.

[0007] Optionally, the light processing system further includes a dose control unit, which is electrically connected to the light source device and the quality inspection device respectively; The dose control unit is used to send a light-enabling signal to the light source device. The dose control unit is also used to supply power to the light source device during the quality inspection process of the quality inspection device for the light information of the light source device. The light-enabling signal is used to control the light source device to emit light.

[0008] Optionally, the light processing system further includes a light dose sensor array and a temperature sensor array. The light dose sensor array is used to detect the light power density of the irradiated surface of the light source device, and the temperature sensor array is used to detect the substrate temperature of the light source device. The light information includes the light power density and the substrate temperature. Both the light dose sensor array and the temperature sensor array are electrically connected to the dose control unit; The dose control unit is used to: receive the light power density detected by the light dose sensor array during the quality inspection process of the quality inspection device, and control the duration of sending the light enable signal to the light source device based on the light power density.

[0009] Optionally, the quality inspection device includes a hollow section, and each sensor in the light dose sensor array and the temperature sensor array is respectively snapped into the hollow section by quick-release clips.

[0010] Optionally, the sensing component includes a rotary locking latch, a signal control circuit, a first mechanical micro switch, and a second mechanical micro switch; The signal control circuit is disposed in the mounting slot. The signal control circuit includes a signal transmitting unit, a main circuit, and a switching circuit. The main circuit and the switching circuit are connected in series. The signal transmitting unit is disposed in the main circuit. The switching circuit includes two switching branches connected in parallel. The first mechanical micro switch and the second mechanical micro switch are both disposed on the side wall of the mounting slot. The switch of one of the two switching branches is the first mechanical micro switch, and the switch of the other of the two switching branches is the second mechanical micro switch. The signal transmitting end of the signal transmitting unit is electrically connected to the first input end. The rotary locking buckle can rotate relative to the mounting slot. The quality inspection device is provided with a first locking groove that engages with the rotary locking buckle for locking; the irradiation device is provided with a second locking groove that engages with the rotary locking buckle for locking. The preset position includes a first position and a second position. When the target device is the quality inspection device, the rotary locking buckle rotates to the first position and engages with the first locking groove to lock the quality inspection device. The rotary locking buckle also presses against the first mechanical micro switch to make the signal control circuit conduct, so that the signal transmitting unit outputs a high-level signal to the first input terminal. When the target device is the irradiation device, the rotary locking buckle rotates to the second position and engages with the second locking groove to lock the irradiation device, and the rotary locking buckle presses against the second mechanical micro switch to make the signal control circuit conduct, so that the signal transmitting unit outputs a high-level signal to the first input terminal.

[0011] Optionally, the light source device includes at least two light-emitting diode light sources with different center wavelengths.

[0012] Secondly, embodiments of this application also provide a light processing method, wherein the light processing method is applied to the light processing system described in the first aspect, the method comprising: When the quality inspection device is installed in a preset position in the mounting slot, the illumination information of the light source device is inspected based on the quality inspection device. If the quality inspection device passes the quality inspection, the quality inspection device sends a quality inspection pass signal to the latch, and the latch switches the output signal output to the second input terminal of the gate circuit from a low level signal to a high level signal. When the quality inspection device is removed and the irradiation device is installed in the preset position of the mounting slot, the sensing component outputs a high-level signal to the first input terminal of the gate circuit; When both the first input terminal and the second input terminal of the gate circuit receive a high-level signal, the gate circuit controls the relay to close, thereby turning on the power supply circuit of the light source device.

[0013] Optionally, after the gate circuit controls the relay to close, thereby turning on the power supply circuit of the light source device, the method further includes: The dose control unit in the illumination processing system sends an illumination enable signal to the light source device to make the light source device emit light.

[0014] Optionally, the quality inspection of the illumination information of the light source device based on the quality inspection device includes: During the time period when the dose control unit supplies power to the light source device and sends the light enable signal to the light source device, the light power density of the light source device illuminating the irradiation surface of the quality inspection device is detected by the light dose sensor array in the light processing system, and the substrate temperature of the light source device is detected by the temperature sensor array in the light processing system. If the deviation between the optical power density and the preset density does not exceed the preset deviation threshold and the substrate temperature is less than the preset temperature, the quality inspection device is deemed to have passed the quality inspection.

[0015] Optionally, the irradiation device is used to hold the photosensitizer and the cells to be irradiated; Before the dose control unit in the illumination processing system sends an illumination enable signal to the light source device to cause the light source device to emit light, the method further includes: The light dose is determined based on the photosensitizer type and the cell type of the cells to be irradiated. The irradiation duration is calculated based on the optical power density and light dose. After the dose control unit sends a light-enabling signal to the light source device, the method further includes: When the duration for which the dose control unit sends the light-enabling signal to the light source device reaches the irradiation duration, the sending of the light-enabling signal to the light source device is stopped.

[0016] In this embodiment, the safety interlock module includes a gate circuit, a latch, and a relay. The gate circuit only outputs a high-level signal when both its first and second input terminals receive a high-level signal, causing the relay to close and the power supply circuit of the power supply device to conduct. By combining purely hardware gate circuits, latches, and relays, the safety interlock is transformed from software execution in existing technologies to physical wire connections. The entire decision chain involves no CPU participation, no memory read / write operations, and no software branch judgments. Even under extreme conditions such as a complete controller CPU crash, software watchdog failure, or electromagnetic interference causing bus data anomalies, the gate circuit can still independently and reliably execute safety decisions based on the two level signals, thereby improving the safety of the lighting processing system in this application. Attached Figure Description

[0017] To more clearly illustrate the technical solutions of the embodiments of this application, the drawings used in the description of the embodiments of this application will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 This is a schematic diagram of the structure of the light processing system provided in the embodiments of this application; Figure 2 This is a schematic diagram of the safety interlocking circuit provided in the embodiments of this application; Figure 3 This is a schematic flowchart of the illumination processing method provided in the embodiments of this application.

[0019] Figure label: 1. Light source equipment; 2. Operating table; 21. Mounting slot; 3. Quality inspection device; 4. Irradiation device; 5. Gate circuit; 6. Relay; 7. Latch; 8. Sensing component; 9. Dosage control unit. Detailed Implementation

[0020] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0021] This application provides a light processing system.

[0022] like Figures 1 to 2 As shown, the light processing system includes: a light source device 1, an operating table 2, a quality inspection device 3, an irradiation device 4, and a safety interlock module.

[0023] The operating table 2 is equipped with a mounting slot 21, with the light-emitting surface of the light source device 1 facing the mounting slot 21. The mounting slot 21 is used to install the target device, which is either the quality inspection device 3 or the irradiation device 4. It should be noted that the quality inspection device 3 and the irradiation device 4 have the same external positioning contour (such as a flat rectangle of 23cm × 28cm × 0.6cm), and they share the mounting slot 21. Only one of them can be inserted into and locked in the mounting slot 21 at any given time.

[0024] The mounting slot 21 is equipped with a sensing component 8. The safety interlock module includes a gate circuit 5, a latch 7, and a relay 6. The first input terminal of the gate circuit 5 is electrically connected to the sensing component 8. The input terminal of the latch 7 is electrically connected to the quality inspection device 3. The output terminal of the latch 7 is electrically connected to the second input terminal of the gate circuit 5. The output terminal of the gate circuit 5 is electrically connected to the control terminal of the relay 6. The relay 6 is connected in series in the power supply circuit of the light source device 1 to control the power supply circuit to be turned on or off.

[0025] Among them, gate circuit 5 is composed of discrete logic gate chips (such as 74 series TTL AND gate chips) or programmable logic devices (CPLD / FPGA, configured only for pure combinational logic functions) in a pure combinational logic manner, and the input terminal is equipped with a Schmitt trigger shaping circuit (such as 74HCT14) to filter out electromagnetic interference glitches.

[0026] When the target device is installed in the preset position of the mounting slot 21, the sensing component 8 outputs a high-level signal to the first input terminal; when the target device is not installed in the preset position of the mounting slot 21, the sensing component 8 outputs a low-level signal to the first input terminal.

[0027] When the quality inspection device 3 inspects the illumination information of the light source device 1 and the inspection is qualified, the quality inspection device 3 sends a quality inspection qualified signal to the latch 7. Upon receiving the quality inspection qualified signal, the latch 7 switches the output signal to the second input terminal from a low level signal to a high level signal. It should be noted that when using the illumination processing system of this application for illumination processing, the illumination information of the light source device 1 is first inspected by the quality inspection device 3. After the quality inspection is qualified, the irradiation device 4 (used to hold the photosensitizer and the cells to be irradiated) is installed in the mounting slot 21, and the light source device 1 irradiates the irradiation device 4. If the quality inspection is not performed before irradiating the irradiation device 4, the illumination information may not meet the requirements due to the temperature drift and aging decay characteristics of the light source device 1. This may result in the photosensitizer and the cells to be irradiated in the irradiation device 4 not meeting clinical requirements, but entering the clinical process, which will bring huge safety hazards. In addition, after latch 7 switches from a low-level signal to a high-level signal, it remains in that position and is only cleared when the system is powered off or manually reset.

[0028] Since the two signals received by the two input terminals of gate circuit 5 are completely different in signal form, generation mechanism and transmission path, they can form a heterogeneous two-factor security verification mechanism.

[0029] When both the first and second input terminals receive a high-level signal, the output of gate circuit 5 outputs a high-level signal to relay 6, causing relay 6 to close and the power supply circuit to conduct. When either the first or second input terminal receives a low-level signal, the output of gate circuit 5 sends a low-level signal to relay 6, causing relay 6 to open and the power supply circuit to disconnect. Understandably, gate circuit 5 only outputs a TTL high-level signal (also called a conduction enable signal) when both input signals are simultaneously high, which, after current amplification, drives the coil of relay 6. The normally open contact of relay 6 is connected in series to the power supply circuit of the power supply device (AC input terminal of the AC / DC module or positive terminal of the DC bus). When relay 6 is closed, the power supply circuit is physically powered on; when it is open, the power supply circuit is physically de-energized. The decision process for whether the power supply circuit is on or off is determined by the hardware structure, independent of CPU instruction execution, not subject to operating system scheduling, and unaffected by software program crashes, watchdog timer failures, bus data anomalies, or register data mutations.

[0030] Existing ECP equipment relies on a software logic chain for safety interlocks: the CPU reads sensor values, the software makes a judgment, sets memory flags, the software checks the flags, and allows startup. If any link in this chain is affected by an anomaly (CPU crash, program crash, watchdog timer failure, electromagnetic interference causing memory bit flipping, malicious access to the debug interface), the safety interlock fails. In the illumination processing system of this application, the safety interlock module includes a gate circuit 5, a latch 7, and a relay 6. Gate circuit 5 only outputs a high-level signal when both its first and second inputs receive a high-level signal, causing relay 6 to close and enabling the power supply circuit of the power supply device to conduct. Through the combination of purely hardware gate circuit 5, latch 7, and relay 6, the safety interlock is transformed from software execution in existing technologies to a physical wire connection. The entire decision chain involves no CPU participation, no memory read / write operations, and no software branch judgments. Even under extreme conditions such as a complete controller CPU crash, watchdog timer failure, or electromagnetic interference causing bus data anomalies, gate circuit 5 can still independently and reliably execute safety decisions based on the two level signals, thereby improving the safety of the illumination processing system of this application.

[0031] Optionally, the light processing system also includes a dose control unit 9, which is electrically connected to the light source device 1 and the quality inspection device 3 respectively; The dose control unit 9 is used to send a light-enabling signal to the light source device 1. The dose control unit 9 is also used to supply power to the light source device 1 during the process of quality inspection device 3 inspecting the light information of the light source device 1. The light-enabling signal is used to control the light source device 1 to emit light.

[0032] like Figure 1 As shown, in this embodiment, the light processing system further includes a dose control unit 9. The dose control unit 9 is used to send a light enabling signal to the light source device 1. The light enabling signal is used to control the light source device 1 to emit light. It should be noted that the light source device 1 in this embodiment does not emit light directly when it is powered, but only when it is powered and receives the light enabling signal. Both conditions are indispensable.

[0033] During the quality inspection process of the quality inspection device 3 on the illumination information of the light source device 1, the dose control unit 9 controls other circuits, distinct from the power supply circuit, to supply power to the light source device 1 and to send an illumination enable signal to the light source device 1 for a preset duration (the preset duration is based on the light source device 1 reaching thermal equilibrium, for example, preheating until the light power density reading stabilizes before recording the measured value). During this process, the light source device 1 will emit light to illuminate the quality inspection device 3, thereby allowing the illumination information of the light source device 1 to be measured. After the preset duration ends, the dose control unit 9 stops supplying power to the light source device 1 and stops outputting the illumination enable signal.

[0034] After the quality inspection device 3 passes inspection and is removed, and the irradiation device 4 is installed in the preset position of the mounting slot 21, the sensing component 8 outputs a high-level signal to the first input terminal of the gate circuit 5. Since the quality inspection device 3 has passed inspection, the latch 7 outputs a high-level signal to the second input terminal. The output terminal of the gate circuit 5 outputs a high-level signal to the relay 6, causing the relay 6 to close, the power supply circuit to conduct, and the light source device 1 to receive power. At this time, the dose control unit 9 sends a light-enabling signal to the light source device 1. The light source device 1 meets the conditions of receiving power and receiving the light-enabling signal, and emits light to irradiate the irradiation device 4.

[0035] In this embodiment, the dose control unit 9 and the safety interlock module cooperate with each other. The relay 6 ensures that the light source cannot be lit under abnormal operating conditions at the power supply level, and the light illumination enable signal of the dose control unit 9 ensures that the light source is lit only when permitted at the light emission level. Any single-layer failure is not enough to cause the light source to emit light out of control. The failure path of accidental irradiation is further compressed, thereby further improving the safety of the light processing system.

[0036] Optionally, the light processing system further includes a light dose sensor array and a temperature sensor array. The light dose sensor array is used to detect the light power density of the irradiated surface of the light source device 1, and the temperature sensor array is used to detect the substrate temperature of the light source device 1. The light information includes light power density and substrate temperature. Both the light dose sensor array and the temperature sensor array are electrically connected to the dose control unit 9; The dose control unit 9 is used to: receive the light power density detected by the light dose sensor array during the quality inspection process of the quality inspection device 3, and control the duration of sending the light enable signal to the light source device 1 based on the light power density.

[0037] In this embodiment, the light dose sensor array is used to detect the light power density emitted by the light source device 1 onto the quality inspection device 3 during the quality inspection process of the quality inspection device 3 inspecting the light information of the light source device 1; the temperature sensor array is used to detect the substrate temperature of the light source device 1 during the quality inspection process of the quality inspection device 3 inspecting the light information of the light source device 1.

[0038] If the deviation between the detected optical power density and the preset density does not exceed a preset deviation threshold and the substrate temperature is lower than a preset temperature, the quality inspection device 3 is deemed to have passed quality inspection. For example: Light source device 1 includes a 365nm LED (with a set optical power density of 10.0mW / cm²). 2 ) and 310nm LED (light power density set at 8.0mW / cm²) 2 ).

[0039] For a 365nm LED, the measured optical power density of the light dose sensor array is 9.8 mW / cm². 2 (Deviation -2%, acceptable); For a 310nm LED, the measured optical power density of the light dose sensor array is 7.85mW / cm². 2 (Deviance -1.9%, acceptable); The LED substrate temperature detected by the temperature sensor array is 38.5℃ (not exceeding the set 40℃, acceptable); The system determines that the quality control is acceptable. In an optional embodiment, the illumination information may also include the uniformity of the irradiated surface (maximum value of the irradiated surface / minimum value of the irradiated surface). The above-mentioned preset deviation threshold and preset temperature are exemplary settings for this embodiment and can be adjusted according to the overall quality requirements.

[0040] Furthermore, the dose control unit 9 is also used to control the duration of sending a light-enabling signal to the light source device 1 based on the optical power density and substrate temperature. For example: The dose control unit 9 automatically matches the target total dose of 12.0 J / cm² based on the photosensitizer type (8-MOP) and cell type (PBMC). 2 And based on the detected optical power density of the 365nm channel (9.8mW / cm²), 2 The irradiation time is automatically calculated as: t = 12000 / 9.8 ≈ 1224 seconds, with a duration of 1224 seconds. This scheme uses 8-MOP as a photosensitizer, illuminating only the 365nm channel that matches its absorption characteristics during irradiation, while the 310nm channel remains unlit.

[0041] After determining the target dose or duration, during the illumination process of the light-emitting device 4, the dose control unit 9 calculates the cumulative irradiation dose by integrating the measured light power density over time from the start of irradiation; when the cumulative total irradiation dose reaches 12.0 J / cm²... 2 When the PWM enable signal is automatically terminated, the LED turns off; or, the dose control unit 9 starts timing from the start of irradiation, and stops outputting the enable signal after the irradiation duration reaches 1224s, and the LED turns off.

[0042] Since the dosage calculation is based on the actual on-site measured value of the LED output before each irradiation, the output deviation caused by LED aging, batch differences and temperature drift is absorbed in the pre-quality control test, and there is no need to monitor it in real time during the irradiation process.

[0043] In this embodiment, since the dose control unit 9 can control the duration of sending the light irradiation enable signal to the light source device 1 based on the light power density, the irradiation dose can be precisely controlled according to the actual output of the light source device 1 during the irradiation process, and the enable signal is automatically withdrawn to terminate the irradiation of the light source device 1 when the target duration is reached. This avoids the risk of damage caused by excessive dose and the failure to achieve the desired therapeutic effect due to insufficient dose, and does not require manual intervention, further improving the accuracy of the irradiation dose and the safety of treatment.

[0044] Optionally, the quality inspection device 3 includes a hollow section, and each sensor in the light dose sensor array and temperature sensor array is snapped into the hollow section by quick-release clips.

[0045] In this embodiment, the housing of the quality inspection device 3 has a cutout. A temperature sensor array (at least 4 points, 2×2 distribution) and a light dose sensor array (at least 4 points, 2×2 distribution, each point containing a 310nm / 365nm / 455nm three-wavelength filter) are fixed to the housing through the cutout. The photosensitive surfaces of the sensors directly face the irradiation surface of the light source device 1. Each sensor is fixed by a quick-release clip and can be replaced independently. The temperature sensor array can use a non-contact infrared temperature sensor to detect the substrate temperature of the light source device 1; alternatively, the substrate temperature can also be detected by an onboard temperature sensor built into the light source device 1 and output to the dose control unit 9 via an electrical interface.

[0046] In this embodiment, the quality inspection device 3 is provided with a hollow section. Each sensor in the light dose sensor array and temperature sensor array is snapped onto this mounting section via quick-release clips, forming a modular, quick-disassembly and assembly split structure. On the one hand, the quick-release clips are tool-free and can be repeatedly plugged and unplugged, allowing for rapid installation and disassembly of the sensor array, significantly improving maintenance efficiency and equipment availability; when a single sensor array ages or is damaged, only partial replacement is required, resulting in short repair time, while the other intact sensor array does not need to be replaced, reducing long-term use and maintenance costs.

[0047] Optionally, the sensing component 8 includes a rotary locking latch, a signal control circuit, a first mechanical micro switch, and a second mechanical micro switch; The signal control circuit is set in the mounting slot 21. The signal control circuit includes a signal transmitting unit, a main circuit and a switching circuit. The main circuit and the switching circuit are connected in series. The signal transmitting unit is set in the main circuit. The switching circuit includes two switching branches connected in parallel. The first mechanical micro switch and the second mechanical micro switch are both set in the side wall of the mounting slot 21. The switch of one of the two switching branches is the first mechanical micro switch and the switch of the other branch is the second mechanical micro switch. The signal transmitting end of the signal transmitting unit is electrically connected to the first input end. The rotating locking buckle can rotate relative to the mounting slot 21. The quality inspection device 3 is provided with a first locking groove that engages with the rotary locking buckle for locking; the irradiation device 4 is provided with a second locking groove that engages with the rotary locking buckle for locking. The preset positions include a first position and a second position. When the target device is a quality inspection device 3, the rotating locking buckle is rotated to the first position and engages with the first locking groove to lock the quality inspection device 3. The rotating locking buckle also presses against the first mechanical micro switch to make the signal control circuit conduct, so that the signal transmitting unit outputs a high-level signal to the first input terminal. When the target device is the irradiation device 4, the rotating locking buckle is rotated to the second position and engages with the second locking groove to lock the irradiation device 4. The rotating locking buckle also presses against the second mechanical micro switch to make the signal control circuit open, so that the signal transmitting unit outputs a high-level signal to the first input terminal.

[0048] In this embodiment, a first mechanical micro switch and a second mechanical micro switch are provided on the inner wall of the mounting groove 21. The two switches are in different positions, and the two switches correspond one-to-one with the two switch branches.

[0049] Taking the first mechanical micro switch as an example, the working principle of the mechanical micro switch is explained: The first mechanical micro switch is normally open in its corresponding switch branch. When the rotary locking buckle is rotated to the first position, the quality inspection device 3 locks itself in the mounting slot 21 through the cooperation of the first locking groove and the rotary locking buckle. At the same time, the rotary locking buckle presses the first mechanical micro switch, causing it to close and the corresponding switch branch to be turned on, thereby turning on the signal control circuit. The signal transmitting unit sends a high-level signal to the first input terminal. When the quality inspection device 3 is removed from the mounting slot 21 and the rotary locking buckle is rotated to a position other than the first and second positions, the first mechanical micro switch is reset under the action of the spring, the corresponding switch branch to be turned off, and the signal transmitting unit stops sending a high-level signal to the first input terminal.

[0050] The second mechanical micro switch operates in a similar manner to the first mechanical micro switch, and will not be described again.

[0051] In this embodiment, the mechanical locking structure of the sensing component 8 and the electrical connection of the gate circuit 5 are integrated into a single design: when inserted and locked in place, the micro switch is pressed, and the signal transmitting unit sends a high-level signal to the first input terminal; when pulled out, the micro switch pops open, stops sending the high-level signal, and the relay 6 immediately disconnects. This disconnected state cannot be restored by conventional software commands; it can only be released by physically re-inserting and locking the corresponding module.

[0052] Furthermore, since the high-level signal sent by the signal transmitting unit to the first input terminal is a passive mechanical contact signal, while the signal generated by the quality inspection device 3 upon passing quality inspection is an active electronic comparator output signal latched by hardware, the two signals are completely different in signal form (passive / active), generation mechanism (mechanical pressing / photoelectric conversion plus threshold comparison), and transmission path. Even if the light dose sensor system completely fails, the mechanical contacts of the micro switch can still independently cut off the power supply circuit of the light source device 1; even if the mechanical structure is jammed, the active electrical signal of the quality control test failure can still independently block the irradiation start. Corresponding to the high-level signal sent by the signal transmitting unit to the first input terminal, the quality inspection device 3's quality inspection pass signal is also a necessary prerequisite for the physical power-on of the power supply circuit of the light source device 1. When the test fails, the latch 7 is not set, the second input terminal of the gate circuit 5 lacks a high-level signal, the output remains low, the relay 6 remains open, the power supply circuit is physically de-energized, and the system is in a physically locked state, which cannot be overridden by software interface, manual operation, or conventional commands. The device can only be unlocked after the operator has troubleshooted the problem (such as replacing the aging light source device 1, adjusting the heat dissipation, replacing the sensor, etc.) and the device passes the retest.

[0053] Furthermore, the quality control device 3 and the irradiation device 4 share the same mounting slot 21, allowing only one to be inserted and locked at a time, creating mechanical exclusivity. Simultaneously, the pass / fail signal from the quality control device 3 is latched by the latch 7: without inspection by the quality control device 3, the latch 7 has no pass / fail signal. Even if the irradiation device 4 is directly installed and the slot is locked in place, the second input of the gate circuit 5 remains low, the relay 6 remains open, and irradiation cannot start. Only after quality control is passed can the quality control device 3 be removed, the irradiation device 4 replaced, and the power supply circuit maintained. This enforces a sequence of quality control before irradiation from both electrical and mechanical perspectives, upgrading the operating procedure from software prompts to physical interlocking, completely eliminating the risk of misoperation by skipping pre-quality control inspection and directly irradiating, thus further improving safety.

[0054] Optionally, the light source device 1 includes at least two light-emitting diode light sources with different center wavelengths.

[0055] In this embodiment, the light source device 1 may include LEDs with three wavelengths: 310nm, 365nm, and 455nm. The 310nm UVB LED is based on AlGaN wide bandgap material, with a typical driving condition of 6.5V / 350mA, and is packaged with a quartz glass lens. The 365nm UVA LED is based on InGaN material, with a typical driving condition of 3.85V / 1000mA. The 455nm blue LED is based on the standard InGaN system, with a typical driving condition of 3.2V / 1000mA. The light power density of the LED changes non-linearly with junction temperature and aging time, but approximately linearly with driving current. Different batches of LEDs may have initial light power densities differing by ±8% under the same current. Therefore, the illumination processing system of this application uses a pre-control detection device to measure the actual light power density of each wavelength under thermal equilibrium before irradiation, and calculates the irradiation time accordingly to ensure that the actual irradiation dose is consistent with the set dose.

[0056] In the illumination processing system of this application, the safety interlock module is composed of a 74LS08 four-way AND gate chip forming pure combinational logic, and is equipped with a 74LS279 RS latch 7. Gate circuit 5 receives two inputs: a high-level signal generated when the target device is installed in the preset position (from a microswitch, normally open, which closes after mechanical pressing and outputs a TTL high level of 5V) and a high-level signal generated when the quality inspection device 3 passes the quality inspection (generated by the illumination dose sensor array after comparison with an ADC and a threshold, latched and held by a 74LS279, and outputting a TTL high level of 5V). The two signals are respectively input to the two input terminals of the 74LS08 after passing through a Schmitt trigger shaping circuit (74HCT14). The output terminal is amplified by an NPN transistor (2N2222, β≥100) and drives the coil of relay 6 (coil voltage 5V, contact capacity selected according to the load current of the power supply circuit, for example 5A~10A / 250VAC). Relay 6 adopts a double-pole double-throw structure. One set of normally open contacts is connected in series in the power supply circuit of the light source device 1, and the other set of normally closed contacts is connected to the fault indication circuit. Only when both inputs of the AND gate are high level, the coil of relay 6 is energized, the normally open contacts close, and the power supply circuit is physically powered on; when either input is low level, the AND gate outputs a low level, the coil of relay 6 is de-energized, the normally open contacts open, and the power supply circuit is physically de-energized.

[0057] The replaceability of the quality inspection device 3 and the light dose sensor array in this application was verified: Remove the quality inspection device 3 from the mounting slot 21, open the quick-release buckle at the cutout, remove the 365nm light dose sensor, replace it with a new sensor of the same model, and then reinsert and lock it. Repeat the quality inspection process, and the measured light power density is 10.1 mW / cm². 2(365nm), with a deviation of +3.1% from the original value, is within the allowable range for sensor batch variations. This demonstrates that the pluggable design of the cutout section enables rapid sensor replacement and maintenance, ensuring the traceability and accuracy of pre-quality control testing.

[0058] The quality inspection device 3 is only used for quality inspection of the illumination information before irradiation and is removed after the quality inspection is completed and before the formal irradiation begins. When the quality inspection device 3 is removed, its mechanical locking structure releases the micro switch, causing the high-level signal at the first input terminal to become low-level, the output of the gate circuit 5 immediately becomes low-level, the relay 6 is disconnected, and the power supply circuit is physically de-energized. This de-energized state cannot be restored through the software interface or remote command; it can only be released by re-inserting and locking the corresponding module.

[0059] Verify the logical functions of the safety interlock module: Test equipment: Gate circuit 5 composed of 74LS08 TTL AND gate chip (DIP-14 package), with its two input terminals connected in series with Schmitt trigger shaping circuit (74HCT14), and the second input terminal connected in front of 74LS279 hardware latch 7; 5V DC relay 6 (HF41F type, contact capacity 10A / 250VAC), with its normally open contact connected in series with the power supply circuit of light source device 1; dual-channel signal generator, respectively simulating the signal (TTL_1) of the target device installed in the preset position of the mounting slot 21 and the signal (TTL_2) of the quality inspection device 3 passing the quality inspection; digital oscilloscope (Tektronix TDS2024C) monitoring the voltage at the output terminal of gate circuit 5 and the two ends of the contact of relay 6; power supply circuit simulating load (resistive load, equivalent power 200W).

[0060] The following four input combinations were tested. After each combination ran stably for 30 seconds, the output status was recorded. The results are shown in Table 1: Table 1

[0061] The oscilloscope recordings show that in the fourth combination, the time from the simultaneous high signal of both signals to the complete closure of relay 6 contact is 4.7ms (including the mechanical action time of relay 6); in combinations 1 to 3, relay 6 contact remains open, and the input voltage of the LED driver circuit AC / DC module is 0V. The tests demonstrate that the hard logic gate circuit 5 strictly implements the two indispensable physical conditions for the logic function—slot locking and pre-processing quality control testing—which are both essential; this logic function does not involve any CPU instructions, memory read / write operations, or software branch judgments, and is entirely completed by the hardware circuit itself.

[0062] Verify that the safety interlock module's signal cannot be reset: Test objects: Quality inspection device 3, mounting slot 21.

[0063] (1) Insertion without locking: The quality inspection device 3 is inserted into the mounting slot 21, but not rotated to lock. At this time, the rotation locking buckle does not press the first mechanical micro switch, and the contacts of the first mechanical micro switch remain open; the first input terminal of the gate circuit 5 is grounded through the pull-down resistor (10kΩ), and the level is 0V (low level); even if the quality inspection device 3 detects a qualified signal, the latch 7 outputs a high-level signal to the second input terminal, the output of the gate circuit 5 is still low level, the relay 6 is disconnected, and the irradiation cannot be started.

[0064] (2) Insert and lock in place: Rotate the quality inspection device 3 to the first position, rotate the locking buckle to push the first mechanical micro switch to move 2mm, and the contact closes; the +5V level is directly transmitted to the first input terminal of the gate circuit 5 through the closed first mechanical micro switch (or the signal transmitting unit sends a high-level signal to the gate circuit 5); the oscilloscope shows that the level of the first input terminal jumps from 0V to +5V within 3ms after the locking action is completed; when the signal sent by the latch 7 is also high, the relay 6 closes and the power supply circuit is powered on.

[0065] (3) Pulling out (simulating accidental detachment or operator-initiated stop): Rotate the rotary locking buckle and pull out the quality inspection device 3. The rotary locking buckle disengages from the first mechanical micro switch, and the spring resets, causing the contact to open; the level of the first input terminal drops to 0V within 1ms of the contact opening, and the output of gate circuit 5 flips to a low level; the oscilloscope captures a total time of 3.2ms from the start of the pull-out action to the complete opening of the relay 6 contact (i.e., the power supply circuit is disconnected).

[0066] (4) Non-resettable verification: With the quality inspection device 3 removed and the relay 6 in the open state, the host computer debugging software sends a relay 6 closing command to the embedded controller (STM32F407) of the device (via the UART interface), and at the same time, directly modifies the register bits related to the control of relay 6 in memory via the JTAG interface. Actual test results: The oscilloscope shows that the voltage across the contacts of relay 6 is always 0V (remaining open), and the voltage at the input of the power supply circuit is 0V. The above software operation has no effect on the state of relay 6. Further attempts were made to start the irradiation using the forced start function of the device's touch screen, but the system remained in a physically locked state and could not be started.

[0067] The above verification shows that the disconnected state of relay 6 after the quality inspection device 3 is removed is completely beyond software control. It can only be released by physically re-inserting and locking the corresponding module. This physical irreversibility eliminates security vulnerabilities caused by software anomalies, misoperations, or remote attacks under normal operating conditions.

[0068] Verification of the mutually exclusive installation of irradiation device 4 and quality inspection device 3: When the quality inspection device 3 is inserted into the mounting slot 21 and rotated to lock in place, its mechanical locking latch simultaneously engages the microswitch, outputting a TTL high level. At this point, an attempt is made to insert the irradiation device 4 into the mounting slot 21. Because the mounting slot 21 is occupied and locked by the quality inspection device 3, the irradiation device 4 is mechanically blocked at approximately 1 / 3 of its insertion stroke and cannot be fully inserted. This test was repeated 100 times, and the success rate of preventing reverse insertion was 100%. Conversely, when the irradiation device 4 is in place and locked, the quality inspection device 3 also cannot be inserted. This demonstrates that the shared mounting slot 21 physically enforces the mutually exclusive installation of the quality inspection device 3 and the irradiation device 4.

[0069] Verification of the blocking function for light source device 1 that cannot be irradiated without quality inspection: After the equipment is powered on, without performing quality inspection, the irradiation device 4 is directly inserted into the mounting slot 21 and locked in place. At this time, the slot locking signal is high, but the latch 7 (74LS279) is never set, the signal sent by the latch 7 remains low, the gate circuit 5 outputs a low level, and the relay 6 remains open; when the operator clicks to start irradiation, the power supply circuit is still physically de-energized, and irradiation cannot start. Only after the irradiation device 4 is removed, the quality inspection device 3 is inserted to complete the quality inspection and pass, and the latch 7 is set, does the system have the physical power-on conditions.

[0070] Reliability verification under extreme operating conditions: (1) Controller CPU crash condition: The system is running normally (irradiation device 4 is inserted and locked, quality inspection pass signal is latched, relay 6 is closed, and light source device 1 is irradiating). The external clock signal of the embedded main control chip (STM32F407) is manually cut off (crystal oscillator circuit is disconnected). The simulation program runs away and the watchdog fails. The CPU stops executing any instructions, and all software-level safety monitoring functions are completely paralyzed. Actual test results: After the CPU stops working, the two input terminals of gate circuit 5 remain unchanged (the slot lock signal is directly provided by the micro switch, and the pass signal is provided by the output of latch 7, neither of which depends on the CPU); when the operator pulls out the irradiation device 4, the slot lock signal drops to 0V, the output of gate circuit 5 flips to low level, relay 6 disconnects within 4.0ms, and light source device 1 immediately turns off; the CPU is completely in a crash state throughout the process and does not execute any instructions. This proves that the decision and execution of hard logic safety interlock are completely independent of the CPU's live state.

[0071] (2) Strong Electromagnetic Interference (EMI) Conditions: A 10V / m radio frequency field strength interference (frequency range 1MHz-100MHz, 1MHz step, 80% AM, 1kHz sine wave modulation) was applied near the device drive circuit to simulate the electromagnetic interference that the ECP device may encounter in the blood cell separator environment. The test was divided into two groups: Group A did not have Schmitt trigger shaping at the input of gate circuit 5; Group B had Schmitt trigger shaping (74HCT14). Measured results: In Group A, at five frequency points of 15MHz, 27MHz, 45MHz, 68MHz, and 89MHz, spikes with an amplitude of approximately ±0.8V appeared at the input of gate circuit 5 (duration approximately 50-100ns), posing a potential risk of instantaneous switching of the output of gate circuit 5; In Group B, the hysteresis window of the Schmitt trigger (typical value 0.8V) effectively filtered out all spikes, the output of gate circuit 5 remained at a stable level, and the relay 6 did not jitter or malfunction. The results demonstrate that after adding the Smite trigger shaping circuit, the safety interlock module can still operate reliably under strong radio frequency interference of 10V / m, providing verification support for the reliable operation of the safety interlock module in a strong electromagnetic interference environment.

[0072] (3) Cumulative dose deviation analysis of forced removal of irradiation device 4 during irradiation: full power irradiation of light source device 1 (light power density 10mW / cm²) 2 The target total dose is 12.0 J / cm³. 2 The irradiation time was calculated to be 1200 seconds. After 600 seconds of irradiation, the operator forcibly rotated and pulled out the irradiation device 4 (simulating misoperation or emergency stop). Actual test results: The time from the start of the pulling action to the complete disconnection of relay 6 contacts (light source device 1 turning off) was 4.2 ms; within 4.2 ms, the additional energy output by light source device 1 to the sample was 10 mW / cm². 2 ×0.0042s=0.000042J / cm 2 Compared to 12.0 J / cm 2 The target total dose had a deviation of only 0.00035%, far less than the clinically acceptable ±10% deviation range for ECP. This demonstrates that the safety interlock response time is extremely short (less than 5ms), and even if the irradiation device 4 is accidentally removed during irradiation, the impact on the cumulative dose of the sample is negligible.

[0073] Comparative experiment of the safety interlock of the illumination processing system in this application with existing software cascade interlocks: On the same ECP illumination processing system, two interlocking modes were enabled: Mode A (software interlocking), where hardware gate circuit 5 was disabled and the CPU executed the interlocking judgment logic in the firmware; and Mode B (hard logic interlocking), where the hardware gate circuit 5, hardware latch 7, and relay 6 of this invention were enabled. Abnormal operating conditions were simulated in both modes, and the failure of the safety interlocking was recorded. The results are shown in Table 2. Table 2

[0074] In all five simulated abnormal operating conditions, the software cascaded interlocks failed completely (failure rate 100%), while the safety interlocks of this application were effective in all five conditions (failure rate 0%). This comparative experiment quantitatively demonstrates the overwhelming reliability advantage of the safety interlocks of this application over existing software cascaded interlocks. It should be noted that the software interlock comparison in Mode A is set as a basic implementation without failure-safe design, i.e., the interlock decision and output shutdown are handled by the same software chain when the CPU fails; this comparison focuses on the reliability of the interlock decision-making process itself.

[0075] The above experimental process demonstrates that the light processing system of this application can improve security.

[0076] See Figure 3 , Figure 3 This is a flowchart of the illumination processing method provided in the embodiments of this application, such as... Figure 3 As shown, it includes the following steps: Step 101: With the quality inspection device 3 installed in the preset position of the mounting slot 21, the illumination information of the light source device 1 is inspected based on the quality inspection device 3. Step 102: If the quality inspection device 3 passes the quality inspection, the quality inspection device 3 sends a quality inspection pass signal to the latch 7, and the latch 7 switches the output signal output to the second input terminal of the gate circuit 5 from a low level signal to a high level signal. Step 103: When the quality inspection device 3 is removed and the irradiation device 4 is installed in the preset position of the mounting slot 21, the sensing component 8 outputs a high-level signal to the first input terminal of the gate circuit 5. Step 104: When both the first input terminal and the second input terminal of gate circuit 5 receive a high-level signal, gate circuit 5 controls relay 6 to close, so that the power supply circuit of light source device 1 is turned on.

[0077] In the illumination processing method of this application, after passing the quality control by the quality inspection device 3, the latch 7 outputs a high-level signal to the second input terminal. Then, the irradiation device 4 is installed to make the slot locked in place signal valid, the gate circuit 5 outputs a high-level signal, the relay 6 closes, and the power supply circuit is turned on. By adopting the sequence of quality control before irradiation, the risk of misoperation by skipping the pre-quality control inspection and directly irradiating can be reduced, thereby improving safety.

[0078] Optionally, after gate circuit 5 controls relay 6 to close, thereby turning on the power supply circuit of light source device 1, the method further includes: The dose control unit 9 in the light processing system sends a light enable signal to the light source device 1 so that the light source device 1 emits light.

[0079] In this embodiment, the dose control unit 9 and the safety interlock module work together to ensure that the light source cannot be lit under abnormal operating conditions at the power supply level, and the light enable signal of the dose control unit 9 ensures that the light source is lit only when permitted at the light emission level. Any single-layer failure is not enough to cause the light source to emit light out of control. The failure path of accidental irradiation is further compressed, thereby further improving the safety of the light processing system.

[0080] Optionally, the quality inspection of the illumination information of the light source device 1 based on the quality inspection device 3 includes: During the time period when the dose control unit 9 supplies power to the light source device 1 and sends a light illumination enable signal to the light source device 1, the light power density of the light source device 1 irradiating the irradiated surface of the quality inspection device 3 is detected by the light dose sensor array in the light illumination processing system, and the substrate temperature of the light source device 1 is detected by the temperature sensor array in the light illumination processing system. If the deviation between the optical power density and the preset density does not exceed the preset deviation threshold and the substrate temperature is lower than the preset temperature, the quality inspection device 3 is deemed to have passed the quality inspection.

[0081] In this embodiment, before irradiating the irradiation device 4, the light power density of the light source device 1 irradiating the irradiation surface of the quality inspection device 3 and the substrate temperature of the light source device 1 are detected to determine whether the performance of the light source device 1 has changed. This can reduce the safety hazards caused by the photosensitizer and the cells to be irradiated in the irradiation device 4 failing to meet clinical requirements due to changes in the performance of the light source device 1.

[0082] Optionally, the irradiation device 4 is used to hold the photosensitizer and the cells to be irradiated; Before the dose control unit 9 in the illumination processing system sends an illumination enable signal to the light source device 1 to cause the light source device 1 to emit light, the method further includes: The light dose is determined based on the photosensitizer type and the cell type of the cells to be irradiated. The irradiation duration is calculated based on the optical power density and light dose. After the dose control unit 9 sends a light illumination enable signal to the light source device 1, the method further includes: When the duration for which the dose control unit 9 sends the illumination enable signal to the light source device 1 reaches the irradiation duration, the transmission of the illumination enable signal to the light source device 1 is stopped.

[0083] In this embodiment, the duration of the light-enabling signal sent to the light source device 1 is controlled based on the light power density, so that the irradiation dose can be precisely controlled according to the actual output of the light source device 1 during the irradiation process. When the target duration is reached, the enabling signal is automatically withdrawn to terminate the irradiation of the light source device 1. This avoids the risk of damage caused by excessive dose and the failure to achieve the desired therapeutic effect due to insufficient dose. Moreover, it does not require manual intervention, further improving the accuracy of the irradiation dose and the safety of treatment.

[0084] The method of this application will be explained below in conjunction with practical application scenarios: Step 1: Power on, equipment in standby lock. After powering on, the quality inspection device 3 is not inserted into the slot, the irradiation device 4 is not installed, the micro switch is off, and the slot lock signal is low (0V); the latch 7 is in the cleared state, and the signal sent by the latch 7 is low. The gate circuit 5 outputs a low level, the relay 6 remains off, the power supply circuit is physically disconnected, and the touch screen displays "Please insert quality inspection device 3".

[0085] Step 2: Insert and lock the quality inspection device 3. The operator removes the quality inspection device 3, inserts it into the mounting slot 21, and rotates it to lock. After a locking sound, the micro switch is pressed, and a +5V level is sent to the first input terminal of the gate circuit 5. The slot locking signal becomes high. At this time, the quality inspection has not yet been performed. The signal sent by the latch 7 is still low, the output of the gate circuit 5 is still low, the relay 6 is still in the open state, and the touch screen displays that the quality inspection device 3 is in place. Please perform the quality inspection.

[0086] Step 3: Perform quality inspection. The operator starts the quality inspection via the touchscreen; the light dose sensor array measures the light power density at each point, and the temperature sensor array measures the substrate temperature. Example of measured data: Light source device 1 includes a 365nm LED (with a set optical power density of 10.0mW / cm²). 2 ) and 310nm LED (light power density set at 8.0mW / cm²) 2 For a 365nm LED, the measured optical power density of the light dose sensor array was 9.8 mW / cm². 2 (Deviation -2%, acceptable); For a 310nm LED, the measured optical power density of the light dose sensor array is 7.85mW / cm². 2 (Deviation -1.9%, qualified); The temperature of the LED substrate detected by the temperature sensor array is 38.5℃ (not exceeding the set 40℃, qualified); The system judges the quality control to be qualified.

[0087] The quality control pass signal output by the comparator (LM393) is inverted and sent to the low-level active set terminal of latch 7 (74LS279). Latch 7 is set and latched (+5V high level), and then sent to the second input terminal of gate circuit 5. At this time, both signals are at a high level, gate circuit 5 outputs a high level, driving relay 6 to close, physically powering the power supply circuit. However, the dose control unit 9 has not yet sent the PWM enable signal, and the light source device 1 remains off. The touch screen displays "Quality control pass, system unlocked. Please remove quality control device 3 and install irradiation device 4."

[0088] Step 4: Remove the quality inspection device 3 and install the irradiation device 4. The operator rotates the quality inspection device 3 in the reverse direction to pull it out. The micro switch pops open, the slot locking signal drops to 0V, the output of gate circuit 5 flips to a low level, relay 6 disconnects, and the power supply circuit is physically de-energized. At this time, the quality inspection pass signal has been latched and held by the hardware latch 7 and is not lost due to the pulling action. The operator inserts the irradiation device 4 into the installation slot 21 and rotates it to lock it in place. The locking action presses the micro switch, and the slot locking signal returns to a high level. The two inputs of hardware gate circuit 5 are simultaneously high again, relay 6 closes, the power supply circuit is physically powered on again, and the system enters the irradiation ready state.

[0089] Step 5: Cell Separation. The operator connects the patient's blood to a disposable cell separation tubing. The system drives the blood pump and separation unit to complete the cell separation, separating the target cells (such as PBMCs). The entire separation process is completed within the disposable cell separation tubing, and the blood and cells do not come into contact with the equipment itself.

[0090] Step 6: Add photosensitizer and mix. Add photosensitizer (8-MOP) to the separated target cells and mix thoroughly in a disposable cell separation tubing; the addition and mixing of photosensitizer are performed entirely within disposable consumables.

[0091] Step 7: Cells enter irradiation device 4. The mixed cell suspension containing photosensitizer is automatically pumped into irradiation device 4 under program control. After the cell suspension in irradiation device 4 is full and the flow is stable, the system enters the irradiation state.

[0092] Step 8: Set parameters and start irradiation. The dose control unit 9 automatically matches the target total dose of 12.0 J / cm² based on the photosensitizer type (8-MOP) and cell type (PBMC). 2 And based on the detected optical power density of the 365nm channel (9.8mW / cm²), 2The irradiation time is automatically calculated as t = 12000 / 9.8 ≈ 1224 seconds, with a duration of 1224 seconds. This scheme uses 8-MOP as the photosensitizer. During irradiation, only the 365nm channel, which matches its absorption characteristics, is illuminated; the 310nm channel remains unlit. After the operator clicks "Start Irradiation," the dose control unit 9 confirms the slot lock signal is valid and the latched quality inspection pass signal exists, then outputs a PWM enable signal, and the LED begins irradiation.

[0093] Step 9: Dose Control During Irradiation. During irradiation, the dose control unit 9 uses the measured optical power density from step 3 as the dose calculation parameter. From the start of irradiation, the dose control unit 9 calculates the cumulative irradiation dose by integrating the measured optical power density over time; when the total cumulative irradiation dose reaches 12.0 J / cm²... 2 When the PWM enable signal is automatically terminated, the LED turns off; or, the dose control unit 9 starts timing from the start of irradiation, and stops outputting the enable signal after the irradiation duration reaches 1224s, and the LED turns off.

[0094] Step 10: Irradiation End and Reinfusion. After irradiation ends, the LED turns off; the operator reinfuses the processed cell suspension to the patient via tubing, then removes the irradiation device 4. The microswitch pops open, the slot locking signal is disabled, the hardware gate circuit 5 outputs a low level, the relay 6 disconnects, and the power supply circuit is physically de-energized. The system returns to standby mode; if irradiation is required again, the hardware latch 7 must be reset (either by power-off or manual reset) and steps 1 to 10 must be executed again.

[0095] Abnormal Branch 1 – Quality Inspection Failure: If the measured optical power density deviates from the set value by more than ±5%, the hardware comparator will not output a qualified signal, latch 7 will not be set, and the second input of gate circuit 5 will remain low. Even if the slot locking signal is high, the output of gate circuit 5 will still be low, relay 6 will remain open, and the system will be physically locked. The operator cannot force the irradiation to start via the touch screen or any software means. The only way to resolve this is to troubleshoot (such as replacing the aging LED module, cleaning the sensor window, checking the heat dissipation, etc.) and then re-perform the pre-quality control test until it passes.

[0096] Abnormal Branch 2 – Pipeline installed without quality control: In this case, hardware latch 7 has no qualified signal, relay 6 remains open, and irradiation cannot be started.

[0097] Abnormal Branch 3 – Irradiation Device 4 Not Installed Correctly: If the irradiation device 4 is not properly locked in place, the micro switch will not operate, the slot locking signal will be invalid, the hardware gate circuit 5 will output a low level, the relay 6 will remain open, and irradiation will not start.

[0098] This embodiment demonstrates that the safety interlocking module of the present invention strictly implements multiple safety guarantees in the complete workflow through physical hardware, including no power supply when the module is not inserted, no power supply when the module is inserted but not locked, no power supply when the module has not been quality controlled or the quality control is unqualified, no power supply when the irradiation device 4 is not in place, and immediate power-off when the module is pulled out and cannot be reset by software. Furthermore, the timing connection between the quality control stage and the irradiation stage is realized through the hardware latch 7.

[0099] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0100] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods of the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) and includes several instructions to cause a terminal (which may be a mobile phone, computer, server, air conditioner, or network device, etc.) to execute the methods described in the various embodiments of this application.

[0101] The embodiments of this application have been described above with reference to the accompanying drawings. However, this application is not limited to the specific embodiments described above. The specific embodiments described above are merely illustrative and not restrictive. Those skilled in the art can make many other forms under the guidance of this application without departing from the spirit and scope of the claims, and all of these forms are within the protection scope of this application.

Claims

1. A light processing system, characterized in that, The light processing system includes: a light source device (1), an operating table (2), a quality inspection device (3), an irradiation device (4), and a safety interlock module; The operating table (2) is provided with a mounting slot (21), and the light-emitting surface of the light source device (1) faces the mounting slot (21). The mounting slot (21) is used to install the target device, which is the quality inspection device (3) or the irradiation device (4). The mounting slot (21) is provided with a sensing component (8). The safety interlock module includes a gate circuit (5), a latch (7) and a relay (6). The first input terminal of the gate circuit (5) is electrically connected to the sensing component (8). The input terminal of the latch (7) is electrically connected to the quality inspection device (3). The output terminal of the latch (7) is electrically connected to the second input terminal of the gate circuit (5). The output terminal of the gate circuit (5) is electrically connected to the control terminal of the relay (6). The relay (6) is connected in series with the power supply circuit of the light source device (1) to control the power supply circuit to be turned on or off. When the target device is installed in the preset position of the mounting slot (21), the sensing component (8) outputs a high-level signal to the first input terminal; when the target device is not installed in the preset position of the mounting slot (21), the sensing component (8) outputs a low-level signal to the first input terminal. When the quality inspection device (3) performs quality inspection on the illumination information of the light source device (1) and the quality inspection is qualified, the quality inspection device (3) sends a quality inspection qualified signal to the latch (7); when the latch (7) receives the quality inspection qualified signal, it switches the output signal output to the second input terminal from a low level signal to a high level signal. When both the first input terminal and the second input terminal receive a high-level signal, the output terminal of the gate circuit (5) outputs a high-level signal to the relay (6) to close the relay (6) and turn on the power supply circuit; when either the first input terminal or the second input terminal receives a low-level signal, the output terminal of the gate circuit (5) sends a low-level signal to the relay (6) to open the relay (6) and turn off the power supply circuit.

2. The light processing system according to claim 1, characterized in that, The light processing system also includes a dose control unit (9), which is electrically connected to the light source device (1) and the quality inspection device (3) respectively; The dose control unit (9) is used to send a light-enabling signal to the light source device (1). The dose control unit (9) is also used to supply power to the light source device (1) during the process of the quality inspection device (3) inspecting the light information of the light source device (1). The light-enabling signal is used to control the light source device (1) to emit light.

3. The light processing system according to claim 2, characterized in that, The light processing system further includes a light dose sensor array and a temperature sensor array. The light dose sensor array is used to detect the light power density of the irradiated surface of the light source device (1), and the temperature sensor array is used to detect the substrate temperature of the light source device (1). The light information includes the light power density and the substrate temperature. Both the light dose sensor array and the temperature sensor array are electrically connected to the dose control unit (9); The dose control unit (9) is used to: receive the light power density detected by the light dose sensor array during the quality inspection process of the quality inspection device (3), and control the duration of sending the light enable signal to the light source device (1) based on the light power density.

4. The light processing system according to claim 3, characterized in that, The quality inspection device (3) includes a hollow section, and each sensor in the light dose sensor array and the temperature sensor array is respectively fastened to the hollow section by quick-release buckles.

5. The light processing system according to any one of claims 1 to 4, characterized in that, The sensing component (8) includes a rotary locking buckle, a signal control circuit, a first mechanical micro switch, and a second mechanical micro switch; The signal control circuit is set in the mounting slot (21). The signal control circuit includes a signal transmitting unit, a main circuit and a switch circuit. The main circuit and the switch circuit are connected in series. The signal transmitting unit is set in the main circuit. The switch circuit includes two switch branches connected in parallel. The first mechanical micro switch and the second mechanical micro switch are both set on the side wall of the mounting slot (21). The switch of one branch of the two switch branches is the first mechanical micro switch, and the switch of the other branch of the two switch branches is the second mechanical micro switch. The signal transmitting end of the signal transmitting unit is electrically connected to the first input end. The rotating locking buckle can rotate relative to the mounting slot (21). The quality inspection device (3) is provided with a first locking groove that cooperates with the rotary locking buckle for locking, and the irradiation device (4) is provided with a second locking groove that cooperates with the rotary locking buckle for locking; The preset position includes a first position and a second position. When the target device is the quality inspection device (3), the rotating locking buckle rotates to the first position and engages with the first locking groove to lock the quality inspection device (3). The rotating locking buckle presses against the first mechanical micro switch to make the signal control circuit conduct so that the signal transmitting unit outputs a high-level signal to the first input terminal. When the target device is the irradiation device (4), the rotary locking buckle rotates to the second position and engages with the second locking groove to lock the irradiation device (4), and the rotary locking buckle presses against the second mechanical micro switch to make the signal control circuit conduct so that the signal transmitting unit outputs a high-level signal to the first input terminal.

6. The light processing system according to any one of claims 1 to 4, characterized in that, The light source device (1) includes at least two light-emitting diode light sources with different center wavelengths.

7. A method for processing light, characterized in that, The illumination processing method is applied to the illumination processing system according to any one of claims 1 to 6, and the method includes: When the quality inspection device (3) is installed in the preset position of the mounting slot (21), the illumination information of the light source device (1) is inspected based on the quality inspection device (3); When the quality inspection device (3) passes the quality inspection, the quality inspection device (3) sends a quality inspection pass signal to the latch (7), and the latch (7) switches the output signal output to the second input terminal of the gate circuit (5) from a low level signal to a high level signal. When the quality inspection device (3) is removed and the irradiation device (4) is installed in the preset position of the mounting slot (21), the sensing component (8) outputs a high-level signal to the first input terminal of the gate circuit (5); When both the first input terminal and the second input terminal of the gate circuit (5) receive a high-level signal, the gate circuit (5) controls the relay (6) to close, so that the power supply circuit of the light source device (1) is turned on.

8. The light processing method according to claim 7, characterized in that, After the gate circuit (5) controls the relay (6) to close, thereby turning on the power supply circuit of the light source device (1), the method further includes: The dose control unit (9) in the light processing system sends a light enable signal to the light source device (1) so that the light source device (1) emits light.

9. The light processing method according to claim 8, characterized in that, The quality inspection of the illumination information of the light source device (1) based on the quality inspection device (3) includes: During the time period when the dose control unit (9) supplies power to the light source device (1) and sends the light enable signal to the light source device (1), the light power density of the light source device (1) irradiating the irradiated surface of the quality inspection device (3) is detected by the light dose sensor array in the light processing system, and the substrate temperature of the light source device (1) is detected by the temperature sensor array in the light processing system. If the deviation between the optical power density and the preset density does not exceed the preset deviation threshold and the substrate temperature is less than the preset temperature, the quality inspection device (3) is deemed to have passed the quality inspection.

10. The light processing method according to claim 9, characterized in that, The irradiation device (4) is used to hold the photosensitizer and the cells to be irradiated; Before the dose control unit (9) in the illumination processing system sends an illumination enable signal to the light source device (1) to cause the light source device (1) to emit light, the method further includes: The light dose is determined based on the photosensitizer type and the cell type of the cells to be irradiated. The irradiation duration is calculated based on the optical power density and light dose. After the dose control unit (9) sends a light-enabling signal to the light source device (1), the method further includes: When the duration for which the dose control unit (9) sends the light-enabling signal to the light source device (1) reaches the irradiation duration, the sending of the light-enabling signal to the light source device (1) is stopped.

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