High efficiency die testing handler

Abstract

This invention relates to the field of grain testing technology, specifically to a high-efficiency grain testing and sorting machine, comprising a machine base; a rotating seat is provided on the machine base; multiple adsorption mechanisms are provided on the rotating seat along the circumferential direction; a feeding mechanism, a testing mechanism, and a sorting seat are sequentially arranged on the machine base along the rotation direction of the rotating seat; multiple sorting slots are provided on the sorting seat along the rotation direction of the rotating seat; a pressing mechanism is provided on the top of the testing mechanism on the machine base; the pressing mechanism is used to press down the adsorption mechanisms, thereby placing the grains in the testing mechanism. This invention adopts a rotary circumferential multi-station layout, with multiple adsorption mechanisms evenly arranged on the outer circumference of the rotating seat. Combined with the feeding mechanism, testing mechanism, and sorting seat arranged sequentially along the rotation direction, multiple processes such as grain feeding and adsorption, electrical performance testing, and sorting can be completed simultaneously. The multiple adsorption mechanisms work alternately in a cyclical manner, reducing waiting time between processes and effectively improving overall work efficiency.

Description

Technical Field

[0001] This invention relates to the field of grain testing technology, and more specifically to a high-efficiency grain testing and sorting machine. Background Technology

[0002] In the semiconductor chip manufacturing process, the electrical performance testing and sorting of chips are crucial downstream processes that directly determine the yield, reliability, and overall production efficiency of the final chip product. With the rapid development of the semiconductor industry, chip sizes are constantly shrinking and integration is continuously increasing, and the market is placing increasingly stringent demands on the accuracy, speed, and stability of chip testing and sorting.

[0003] Most mainstream die testing and sorting machines on the market currently adopt a single-station serial operation mode. The processes of feeding, testing, and sorting need to be completed sequentially. Only one die can be processed at a time, and there is a lot of waiting time between processes. The production capacity is difficult to meet the needs of large-scale mass production in the semiconductor industry. Some equipment that attempts to design multiple stations has limited efficiency improvement due to unreasonable structural layout and poor station switching synchronization. Summary of the Invention

[0004] The purpose of this invention is to address the aforementioned shortcomings in the prior art by providing a high-efficiency grain testing and sorting machine.

[0005] The objective of this invention is achieved through the following technical solution: a high-efficiency grain testing and sorting machine, comprising a machine base; the machine base is rotatably provided with a rotating seat; the rotating seat is provided with multiple adsorption mechanisms along the circumferential direction; The machine base is provided with a feeding mechanism, a testing mechanism and a sorting seat in sequence along the rotation direction of the rotating base; the sorting seat is provided with multiple sorting slots along the rotation direction of the rotating base. The machine tool is equipped with a pressing mechanism at the top of the testing mechanism; the pressing mechanism is used to press down the adsorption mechanism so that the crystals are placed in the testing mechanism.

[0006] The present invention is further configured such that the testing mechanism includes a testing seat disposed on the machine platform; the testing seat is provided with a testing platform; the testing seat is provided with a movable plate; the movable plate is provided with a probe plate; the probe plate is provided with a testing probe; the adsorption mechanism is movably disposed on the top of the testing platform; and the pressing mechanism is used to press down the adsorption mechanism so that the crystal is placed on the testing platform. The test platform is provided with a test slot; the test probe passes through the test slot from the bottom of the test platform; a first buffer spring is provided between the test platform and the test seat; a second buffer spring is provided between the probe plate and the movable plate.

[0007] The present invention is further configured such that a first test guide post is provided at the bottom of the test platform; the first test guide post is slidably and vertically disposed on the test seat; and the first buffer spring is sleeved on the outside of the first test guide post. One end of the probe plate is connected to the movable plate; the other end of the probe plate is provided with an inclined guide block; the test probe is disposed on the inclined guide block; the test probe is movably inserted through the inclined guide block; the inclined guide block is provided with a locking bolt for fixing the test probe.

[0008] The present invention is further configured such that: a limiting rod is provided at the top of the movable plate; a second test guide post is provided at the bottom of the limiting rod; a limiting block is provided at the bottom of the second test guide post; the second test guide post is movably inserted through the other end of the probe plate; a second buffer spring is sleeved on the outside of the second test guide post; and the second buffer spring is located between the bottom of the probe plate and the top of the limiting block. The bottom of the limiting rod is provided with a contact ball for abutting against the top of the probe plate.

[0009] The present invention is further configured such that: the test seat is provided with an adjusting base plate; the adjusting base plate is provided with a transverse adjusting platform that slides in the transverse direction; the adjusting base plate is rotatably provided with a transverse adjusting screw extending in the transverse direction; the transverse adjusting platform is provided with a transverse adjusting slide rail extending in the transverse direction; the adjusting base plate is provided with a transverse adjusting slider that is slidably connected to the transverse adjusting slide rail; a transverse adjusting nut is sleeved on the transverse adjusting screw; the transverse adjusting nut is connected to the transverse adjusting platform; and a transverse adjusting knob is connected to the transverse adjusting screw. The transverse adjustment platform is provided with a longitudinal adjustment platform that slides along the longitudinal direction; the transverse adjustment platform is rotatably provided with a longitudinal adjustment screw that extends along the longitudinal direction; the longitudinal adjustment platform is provided with a longitudinal adjustment slide rail that extends along the longitudinal direction; the transverse adjustment platform is provided with a longitudinal adjustment slider that is slidably connected to the longitudinal adjustment slide rail; the longitudinal adjustment screw is fitted with a longitudinal adjustment nut; the longitudinal adjustment nut is connected to the longitudinal adjustment platform; the longitudinal adjustment screw is connected to a longitudinal adjustment knob; The longitudinal adjustment platform is equipped with a lifting adjustment platform that slides along the height direction; the longitudinal adjustment platform is rotatably equipped with a lifting adjustment screw that extends along the height direction; the lifting adjustment platform is equipped with a lifting adjustment slide rail that extends along the height direction; the longitudinal adjustment platform is equipped with a lifting adjustment slider that is slidably connected to the lifting adjustment slide rail; the lifting adjustment screw is fitted with a lifting adjustment nut; the lifting adjustment nut is connected to the lifting adjustment platform; the lifting adjustment screw is connected to a lifting adjustment knob; the lifting adjustment platform is connected to a movable plate.

[0010] The present invention is further configured such that the adsorption mechanism includes an adsorption seat disposed on the outer periphery of the rotating seat, an adsorption rod movably passing through the adsorption seat along the height direction, an adsorption pressing platform disposed on the top of the adsorption rod, and a metal suction nozzle disposed on the bottom of the adsorption rod; an adsorption buffer spring is provided between the bottom of the adsorption pressing platform and the adsorption seat; and a vacuum hole is provided at the bottom of the metal suction nozzle. The test stand is equipped with a conductive element for contact with the metal nozzle.

[0011] The present invention is further configured such that a vacuum channel communicating with a vacuum hole is provided between the metal suction nozzle and the adsorption rod; The conductive component is a metal spring; one end of the metal spring is connected to the test socket; the other end of the metal spring is provided with a metal contact block; The metal nozzle has an annular contact portion in the middle for contacting the metal contact block; a protective cover is fitted over the bottom of the metal nozzle.

[0012] The invention is further configured such that the machine platform is provided with a column; the pressing mechanism includes a pressing seat provided on the column, a pressing plate that is movably and vertically provided on the pressing seat, and a pressing rod provided on the pressing plate; the pressing seat is provided with a pressing linear module that extends along the height direction; the output end of the pressing linear module is connected to the pressing plate; the pressing rod is used to attract the pressing platform to descend.

[0013] The present invention is further configured such that the feeding mechanism includes a vibratory plate and a linear vibrator mounted on the machine base; one end of the linear vibrator is connected to the vibratory plate; and the adsorption mechanism is used to absorb the crystals at the other end of the linear vibrator.

[0014] The present invention is further configured such that the number of the feeding mechanism, the testing mechanism, the sorting seat and the pressing mechanism are all two; the two feeding mechanisms, the two testing mechanisms, the two sorting seats and the two pressing mechanisms are all arranged symmetrically about the center of the rotating seat.

[0015] The beneficial effects of the present invention are as follows: The present invention adopts a rotary circumferential multi-station layout, with multiple adsorption mechanisms evenly arranged on the outer circumference of the rotating seat. Combined with the feeding mechanism, testing mechanism and sorting seat arranged in sequence along the rotation direction, multiple processes such as grain feeding and adsorption, electrical performance testing and sorting can be completed simultaneously. The multiple adsorption mechanisms work in a cyclical alternation, which reduces the waiting time between processes and effectively improves the overall work efficiency. Attached Figure Description

[0016] The invention will be further illustrated with reference to the accompanying drawings, but the embodiments in the drawings do not constitute any limitation on the invention. For those skilled in the art, other drawings can be obtained based on the following drawings without any creative effort.

[0017] Figure 1This is a schematic diagram of the structure of the present invention; Figure 2 yes Figure 1 A magnified view of part A in the middle; Figure 3 This is a structural schematic diagram from another perspective of the present invention; Figure 4 This is a schematic diagram of the adsorption mechanism of the present invention; Figure 5 This is a cross-sectional view of the adsorption mechanism of the present invention; Figure 6 This is a schematic diagram of the testing mechanism of the present invention; Figure 7 yes Figure 6 A magnified view of part B in the middle; Figure 8 This is a structural schematic diagram of the testing mechanism of the present invention from another perspective; Figure 9 This is a cross-sectional view of the testing mechanism of the present invention; The components include: 1. Machine base; 11. Column; 12. Rotary seat; 2. Adsorption mechanism; 21. Adsorption seat; 22. Adsorption rod; 23. Adsorption pressing platform; 24. Metal suction nozzle; 25. Adsorption buffer spring; 26. Vacuum hole; 27. Vacuum channel; 28. Annular contact part; 29. ​​Protective cover; 31. Vibratory plate; 32. Straight vibrator; 4. Sorting seat; 41. Sorting groove; 5. Test seat; 51. Test groove; 52. Test platform; 521. First test guide post; 522. First buffer spring; 53. Movable plate; 531. Limiting rod; 532. Second test guide post; 533. Second buffer spring; 534. Limiting block; 535. Contact ball; 54. Probe plate; 541. Inclined guide block; 542. Test probe; 54 3. Locking bolt; 55. Adjusting base plate; 551. Lateral adjusting screw; 552. Lateral adjusting slider; 553. Lateral adjusting nut; 554. Lateral adjusting knob; 56. Lateral adjusting platform; 561. Lateral adjusting slide rail; 562. Longitudinal adjusting screw; 563. Longitudinal adjusting slider; 564. Longitudinal adjusting nut; 565. Longitudinal adjusting knob; 57. Longitudinal adjusting platform; 571. Longitudinal adjusting slide rail; 572. Lifting adjusting screw; 573. Lifting adjusting slider; 574. Lifting adjusting nut; 575. Lifting adjusting knob; 58. Lifting adjusting platform; 581. Lifting adjusting slide rail; 59. Conductive component; 591. Metal contact block; 6. Lower pressure seat; 61. Lower pressure plate; 62. Lower pressure rod; 63. Lower pressure linear module. Detailed Implementation

[0018] The present invention will be further described in conjunction with the following embodiments.

[0019] Depend on Figures 1 to 9As can be seen, the high-efficiency grain testing and sorting machine described in this embodiment includes a machine base 1; the machine base 1 is rotatably provided with a rotating seat 12; the rotating seat 12 is provided with a plurality of adsorption mechanisms 2 along the circumferential direction; The machine base 1 is provided with a feeding mechanism, a testing mechanism and a sorting seat 4 in sequence along the rotation direction of the rotating seat 12; the sorting seat 4 is provided with a plurality of sorting slots 41 along the rotation direction of the rotating seat 12. The machine platform 1 is equipped with a pressing mechanism at the top of the testing mechanism; the pressing mechanism is used to press down the adsorption mechanism 2 so that the crystals are placed in the testing mechanism.

[0020] Specifically, in this embodiment, the high-efficiency grain testing and sorting machine first pours a batch of grains to be tested into the feeding mechanism. The feeding mechanism uses vibration sorting to transport the grains one by one to a fixed picking station in an orderly manner. The rotating seat 12 is driven by a servo motor to perform intermittent circular rotation, which drives multiple empty adsorption mechanisms 2 evenly distributed along its outer circumference to move sequentially to the top of the picking station. The adsorption mechanism 2 activates the vacuum system to generate negative pressure and picks up a single grain. Then, the rotating seat 12 continues to rotate, transporting the adsorption mechanism 2 with the adsorbed grain to the top of the testing mechanism. At this time, the pressing mechanism is activated, pressing the top of the adsorption mechanism 2 vertically downward, so that the adsorption mechanism 2 carrying the grain descends synchronously and smoothly, so that the bottom surface of the grain is completely attached to the testing mechanism. On the testing platform 52 of the testing mechanism, the testing mechanism immediately detects the electrical performance parameters of the crystals. After the test is completed, the pressing mechanism resets and rises, and the adsorption mechanism 2 rises synchronously under the action of its own elastic reset structure, maintaining a vacuum adsorption state on the crystals throughout the process. The rotating seat 12 rotates again, transporting the tested crystals to the top of the sorting seat 4. According to the test results, the corresponding adsorption mechanism 2 is controlled to close the vacuum when it passes directly above the target sorting tank 41, so that the crystals fall into the corresponding sorting tank 41 under the action of gravity to complete the classification and collection. Multiple adsorption mechanisms 2 work alternately in cycles. Within one rotation cycle of the rotating seat 12, multiple crystals can be loaded, adsorbed, tested for electrical performance, and sorted and unloaded at the same time.

[0021] This embodiment adopts a rotary circumferential multi-station layout. Multiple adsorption mechanisms 2 are evenly arranged on the outer periphery of the rotating seat 12. Together with the feeding mechanism, testing mechanism and sorting seat 4 arranged in sequence along the rotation direction, multiple processes such as grain feeding and adsorption, electrical performance testing and sorting can be completed simultaneously. The multiple adsorption mechanisms 2 work in a cycle and alternately, which reduces the waiting time between processes and effectively improves the overall work efficiency.

[0022] This embodiment describes a high-efficiency grain testing and sorting machine. The testing mechanism includes a testing seat 5 mounted on a machine base 1; the testing seat 5 is provided with a testing platform 52; the testing seat 5 is provided with a movable plate 53; the movable plate 53 is provided with a probe plate 54; the probe plate 54 is provided with test probes 542; the adsorption mechanism 2 is movably mounted on the top of the testing platform 52; and the pressing mechanism is used to press down the adsorption mechanism 2 so that the grains are placed on the testing platform 52. The test platform 52 is provided with a test slot 51; the test probe 542 passes through the test slot 51 from the bottom of the test platform 52; a first buffer spring 522 is provided between the test platform 52 and the test seat 5; a second buffer spring 533 is provided between the probe plate 54 and the movable plate 53.

[0023] Specifically, in the high-efficiency grain testing and sorting machine described in this embodiment, after the adsorption mechanism 2 carries the grains to directly above the testing platform 52, the pressing mechanism presses down on the adsorption mechanism 2, causing the adsorption mechanism 2 to drive the grains to descend synchronously. The bottom surface of the grains first contacts the top surface of the testing platform 52 and is located at the top of the testing groove 51. The pressing mechanism continues to apply downward pressure, and the adsorption mechanism 2 pushes the testing platform 52 to overcome the elastic force of the first buffer spring 522 and move downward in the vertical direction, so that the tip of the test probe 542, which was originally hidden inside the testing groove 51, gradually emerges from the bottom of the testing groove 51 until the tip of the probe contacts the bottom surface of the grains. At the same time, the test probe 542 is subjected to the downward force of the grains, causing the probe plate 54 to overcome the elastic force of the second buffer spring 533 relative to the movable... The plate 53 undergoes a slight downward displacement deformation. After the test is completed, the pressing mechanism resets and rises. The first buffer spring 522 pushes the test platform 52 to reset, causing the test probe 542 to retract back into the test slot 51. The second buffer spring 533 pushes the probe plate 54 to reset synchronously, preparing for the next test. This embodiment adopts a bottom-surface probe contact test structure, avoiding the risk of scratching the functional surface of the grain caused by traditional top-surface probe testing. In addition, by setting the first buffer spring 522 and the second buffer spring 533, double flexible contact is achieved during the test process, effectively absorbing the impact energy during the pressing process. This not only prevents the problem of grain edge chipping and probe breakage caused by hard contact, but also ensures the uniformity and stability of the contact pressure between the test probe 542 and the grain.

[0024] The high-efficiency grain testing and sorting machine described in this embodiment has a first test guide post 521 at the bottom of the test platform 52; the first test guide post 521 is slidably and vertically mounted on the test base 5; and the first buffer spring 522 is sleeved on the outside of the first test guide post 521. One end of the probe plate 54 is connected to the movable plate 53; the other end of the probe plate 54 is provided with an inclined guide block 541; the test probe 542 is provided on the inclined guide block 541; the test probe 542 is movably inserted through the inclined guide block 541; the inclined guide block 541 is provided with a locking bolt 543 for fixing the test probe 542.

[0025] Specifically, in the high-efficiency grain testing and sorting machine described in this embodiment, when the testing platform 52 moves up and down under the action of the first buffer spring 522, it moves linearly along the testing seat 5 via the first test guide post 521 at the bottom. The first buffer spring 522 always extends and retracts along the axial direction of the first test guide post 521. When installing the test probe 542, the test probe 542 is inserted from the rear end of the inclined guide block 541 and pushed forward along the inside of the inclined guide block 541 until the top of the test probe 542 extends to a preset length. Then, the locking bolt 543 on the inclined guide block 541 is tightened, and the test probe 542 is fixed in the inclined guide block 541 by the end face pressure of the bolt. When it is necessary to replace the test probe 542 of different specifications, simply loosen the locking bolt 543 to quickly pull out the old test probe 542 and insert the new test probe 542, and then tighten the bolt again to complete the replacement.

[0026] In this embodiment, a high-efficiency grain testing and sorting machine is provided. The top of the movable plate 53 is provided with a limiting rod 531; the bottom of the limiting rod 531 is provided with a second test guide post 532; the bottom of the second test guide post 532 is provided with a limiting block 534; the second test guide post 532 is movably inserted through the other end of the probe plate 54; a second buffer spring 533 is sleeved on the second test guide post 532; the second buffer spring 533 is located between the bottom of the probe plate 54 and the top of the limiting block 534; the bottom of the limiting rod 531 is provided with a contact ball 535 for abutting against the top of the probe plate 54.

[0027] Specifically, in the high-efficiency grain testing and sorting machine described in this embodiment, when the test probe 542 contacts the bottom surface of the grain and is subjected to a downward force, the other end of the probe plate 54 deforms and swings downward along the second test guide post 532, compressing the second buffer spring 533 located between the bottom of the probe plate 54 and the top of the limiting block 534 to generate an elastic buffer force; the limiting block 534 limits the maximum downward stroke of the probe plate 54 to prevent the probe from excessively retracting and causing insufficient contact pressure; the limiting rod 531 limits the initial upper limit position of the probe plate 54 to ensure that the initial extension height of the probe is consistent; through the above settings, this embodiment ensures that the force of the second buffer spring 533 is always transmitted along the axial direction of the second test guide post 532, avoiding the second buffer spring 533 from deflecting, ensuring uniform and stable contact pressure, and effectively protecting the test probe 542 and the grain from damage; in addition, the limiting rod 531 achieves point contact with the top of the probe plate 54 through the contact ball 535 at the bottom, which can reduce the frictional resistance between the two compared with surface contact, and prevent the probe plate 54 from jamming or getting stuck during relative movement.

[0028] This embodiment describes a high-efficiency grain testing and sorting machine. The test base 5 is equipped with an adjusting base plate 55. The adjusting base plate 55 has a transverse adjusting platform 56 that slides in the transverse direction. The adjusting base plate 55 is rotatably equipped with a transverse adjusting screw 551 extending in the transverse direction. The transverse adjusting platform 56 has a transverse adjusting slide rail 561 extending in the transverse direction. The adjusting base plate 55 has a transverse adjusting slider 552 that is slidably connected to the transverse adjusting slide rail 561. The transverse adjusting screw 551 is fitted with a transverse adjusting nut 553. The transverse adjusting nut 553 is connected to the transverse adjusting platform 56. The transverse adjusting screw 551 is connected to a transverse adjusting knob 554. The transverse adjustment platform 56 is provided with a longitudinal adjustment platform 57 that slides along the longitudinal direction; the transverse adjustment platform 56 is rotatably provided with a longitudinal adjustment screw 562 that extends along the longitudinal direction; the longitudinal adjustment platform 57 is provided with a longitudinal adjustment slide rail 571 that extends along the longitudinal direction; the transverse adjustment platform 56 is provided with a longitudinal adjustment slider 563 that is slidably connected to the longitudinal adjustment slide rail 571; the longitudinal adjustment screw 562 is fitted with a longitudinal adjustment nut 564; the longitudinal adjustment nut 564 is connected to the longitudinal adjustment platform 57; the longitudinal adjustment screw 562 is connected to a longitudinal adjustment knob 565; The longitudinal adjustment platform 57 is provided with a lifting adjustment platform 58 that slides along the height direction; the longitudinal adjustment platform 57 is rotatably provided with a lifting adjustment screw 572 that extends along the height direction; the lifting adjustment platform 58 is provided with a lifting adjustment slide rail 581 that extends along the height direction; the longitudinal adjustment platform 57 is provided with a lifting adjustment slider 573 that is slidably connected to the lifting adjustment slide rail 581; the lifting adjustment screw 572 is fitted with a lifting adjustment nut 574; the lifting adjustment nut 574 is connected to the lifting adjustment platform 58; the lifting adjustment screw 572 is connected to a lifting adjustment knob 575; the lifting adjustment platform 58 is connected to the movable plate 53.

[0029] Specifically, when the lateral position of the test probe 542 needs to be adjusted, rotating the lateral adjustment knob 554 drives the lateral adjustment screw 551 to rotate. The rotational motion is then converted into linear motion of the lateral adjustment table 56 via the lateral adjustment nut 553. The lateral adjustment table 56 slides smoothly relative to the adjustment base plate 55 along the lateral adjustment slide rail 561, thereby causing the subsequent longitudinal adjustment table 57, lifting adjustment table 58, and the test probe 542 to move laterally. When the longitudinal position of the test probe 542 needs to be adjusted, rotating the longitudinal adjustment knob 565 drives the longitudinal adjustment screw 562 to rotate. The longitudinal adjustment nut 564 drives the longitudinal adjustment platform 57 to slide smoothly along the longitudinal adjustment slide rail 571 relative to the transverse adjustment platform 56, thereby causing the lifting adjustment platform 58 and the test probe 542 to move as a whole in the longitudinal direction. When it is necessary to adjust the height of the test probe 542, the lifting adjustment knob 575 is rotated to drive the lifting adjustment screw 572 to rotate. The lifting adjustment nut 574 drives the lifting adjustment platform 58 to slide up and down along the lifting adjustment slide rail 581 relative to the longitudinal adjustment platform 57, thereby causing the movable plate 53, probe plate 54 and test probe 542 to move as a whole in the height direction.

[0030] The high-efficiency grain testing and sorting machine described in this embodiment includes an adsorption mechanism 2 comprising an adsorption seat 21 disposed on the outer periphery of a rotating seat 12, an adsorption rod 22 movably passing through the adsorption seat 21 along the height direction, an adsorption pressing platform 23 disposed on the top of the adsorption rod 22, and a metal suction nozzle 24 disposed on the bottom of the adsorption rod 22; an adsorption buffer spring 25 is provided between the bottom of the adsorption pressing platform 23 and the adsorption seat 21; and a vacuum hole 26 is provided at the bottom of the metal suction nozzle 24. The test stand 5 is provided with a conductive element 59 for contacting the metal nozzle 24.

[0031] Specifically, in the high-efficiency grain testing and sorting machine described in this embodiment, when the adsorption mechanism 2 moves to the material handling station, the vacuum system generates negative pressure through the vacuum hole 26 at the bottom of the metal suction nozzle 24, adsorbing the grain onto the bottom surface of the metal suction nozzle 24; after the pressing mechanism is activated, the pressing rod 62 presses down on the adsorption pressing platform 23, driving the adsorption rod 22 to slide downward along the inside of the adsorption seat 21, while simultaneously compressing the adsorption buffer spring 25 between the adsorption pressing platform 23 and the adsorption seat 21; the adsorption rod 22 drives the metal suction nozzle 24 and the grain to descend synchronously, so that the grain is placed on the testing platform 52; during the descent of the adsorption rod 22, the middle part of the metal suction nozzle 24 reliably contacts the conductive part 59 on the testing seat 5, so that the metal suction nozzle 24 is placed on the bottom surface of the metal suction nozzle 52. The nozzle 24 becomes one of the electrical terminals of the test circuit, forming a complete electrical performance test circuit together with the test probe 542. After the test is completed, the pressing mechanism resets, the adsorption buffer spring 25 releases its elastic force, and pushes the adsorption pressing platform 23 and the adsorption rod 22 upward to reset, separating the metal nozzle 24 from the conductive component 59. In this embodiment, the adsorption buffer spring 25 is used to achieve flexible contact during the pressing process of the adsorption mechanism 2, effectively absorbing the pressing impact and preventing the grains from being damaged by rigid impact. In addition, the metal nozzle 24 serves as both the vacuum adsorption end and the test conductive end, realizing the integrated adsorption and conductivity functions, effectively simplifying the structure of the test circuit, reducing intermediate contact points, and lowering the contact resistance.

[0032] In this embodiment, a high-efficiency grain testing and sorting machine is provided, wherein a vacuum channel 27 communicating with a vacuum hole 26 is provided between the metal suction nozzle 24 and the adsorption rod 22. The conductive element 59 is a metal spring; one end of the metal spring is connected to the test base 5; the other end of the metal spring is provided with a metal contact block 591; The metal nozzle 24 has an annular contact portion 28 in the middle for contacting the metal contact block 591; the bottom of the metal nozzle 24 is fitted with a protective cover 29.

[0033] Specifically, in the high-efficiency grain testing and sorting machine described in this embodiment, the negative pressure generated by the vacuum system is transmitted through the vacuum channel 27 inside the adsorption rod 22 to the vacuum hole 26 at the bottom of the metal nozzle 24 to achieve adsorption of grains; when the adsorption rod 22 drives the metal nozzle 24 to descend, the annular contact portion 28 in the middle of the metal nozzle 24 first contacts the metal contact block 591 at the end of the metal spring sheet. As the adsorption rod 22 continues to descend, the metal spring sheet undergoes elastic deformation, applying a continuous and stable positive pressure to the metal contact block 591, so that the metal contact block 591 and the annular contact portion 28 form a tight surface contact; the protective cover 29 at the bottom of the metal nozzle 24 rises and falls synchronously with the metal nozzle 24, thereby protecting the metal nozzle 24.

[0034] This embodiment describes a high-efficiency grain testing and sorting machine. The machine base 1 is equipped with a column 11. The pressing mechanism includes a pressing seat 6 on the column 11, a pressing plate 61 that is movably and vertically mounted on the pressing seat 6, and a pressing rod 62 on the pressing plate 61. The pressing seat 6 is equipped with a pressing linear module 63 that extends along the height direction. The pressing linear module 63 can be a combination of a motor, screw, slide rail, and slider. The output end of the pressing linear module 63 is connected to the pressing plate 61. The pressing rod 62 is used to drive the adsorption pressing platform 23 to descend.

[0035] Specifically, in the high-efficiency grain testing and sorting machine described in this embodiment, after the adsorption mechanism 2 carries the grains to directly above the testing mechanism, the pressing linear module 63 drives the pressing plate 61 to move vertically downward, and the pressing rod 62 fixed at the bottom of the pressing plate 61 descends synchronously; after the bottom end of the pressing rod 62 contacts the top surface of the adsorption pressing platform 23, it continues to push the adsorption pressing platform 23 and the adsorption rod 22 to descend synchronously until the grains contact the test probe 542; after the test is completed, the pressing linear module 63 drives the pressing plate 61 and the pressing rod 62 to rise and reset, preparing for the next pressing action.

[0036] The high-efficiency grain testing and sorting machine described in this embodiment includes a feeding mechanism comprising a vibratory plate 31 and a linear vibrator 32 mounted on the machine base 1; one end of the linear vibrator 32 is connected to the vibratory plate 31; and the adsorption mechanism 2 is used to pick up the grains from the other end of the linear vibrator 32.

[0037] Specifically, in this embodiment, a batch of scattered test grains are poured into the hopper of the vibratory feeder 31. The vibratory feeder 31 causes the grains to rise along a spiral track in the hopper through high-frequency electromagnetic vibration. During the rise, through a series of track screenings and attitude adjustments, the grains are arranged in an orderly manner with a uniform attitude and enter the feed end of the linear vibrator 32. The linear vibrator 32 conveys the grains at a uniform speed and smoothly to the picking station at its end through linear vibration. Then, the empty adsorption mechanism 2 moves precisely above the picking station and starts vacuum suction of the grains.

[0038] This embodiment describes a high-efficiency grain testing and sorting machine, which includes two feeding mechanisms, two testing mechanisms, two sorting seats 4, and two pressing mechanisms. These mechanisms are all arranged symmetrically around the center of the rotating base 12. This dual-station rotationally symmetrical layout allows the high-efficiency grain testing and sorting machine to simultaneously complete the testing and sorting of two grains within one rotation cycle, thereby effectively improving overall work efficiency.

[0039] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and are not intended to limit the scope of protection of the present invention. Although the present invention has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of the present invention without departing from the essence and scope of the technical solutions of the present invention.

Claims

1. A high-efficiency grain testing and sorting machine, characterized in that: Includes a machine base (1); the machine base (1) is rotatably provided with a rotating seat (12); the rotating seat (12) is provided with multiple adsorption mechanisms (2) along the circumferential direction; The machine base (1) is provided with a feeding mechanism, a testing mechanism and a sorting seat (4) in sequence along the rotation direction of the rotating seat (12); the sorting seat (4) is provided with multiple sorting slots (41) along the rotation direction of the rotating seat (12); The machine (1) is provided with a pressing mechanism on the top of the testing mechanism; the pressing mechanism is used to press down the adsorption mechanism (2) so that the crystals are placed in the testing mechanism.

2. The high-efficiency grain testing and sorting machine according to claim 1, characterized in that: The testing mechanism includes a testing seat (5) disposed on the machine base (1); the testing seat (5) is provided with a testing platform (52); the testing seat (5) is provided with a movable plate (53); the movable plate (53) is provided with a probe plate (54); the probe plate (54) is provided with a test probe (542); the adsorption mechanism (2) is movably disposed on the top of the testing platform (52); the pressing mechanism is used to press down the adsorption mechanism (2) so that the crystal is placed on the testing platform (52); The test platform (52) is provided with a test slot (51) through it; the test probe (542) passes through the test slot (51) from the bottom of the test platform (52); a first buffer spring (522) is provided between the test platform (52) and the test seat (5); a second buffer spring (533) is provided between the probe plate (54) and the movable plate (53).

3. The high-efficiency grain testing and sorting machine according to claim 2, characterized in that: The bottom of the test platform (52) is provided with a first test guide post (521); the first test guide post (521) is slidably mounted on the test seat (5); the first buffer spring (522) is sleeved on the outside of the first test guide post (521); One end of the probe plate (54) is connected to the movable plate (53); the other end of the probe plate (54) is provided with an inclined guide block (541); the test probe (542) is disposed on the inclined guide block (541); the test probe (542) is movably inserted through the inclined guide block (541); the inclined guide block (541) is provided with a locking bolt (543) for fixing the test probe (542).

4. The high-efficiency grain testing and sorting machine according to claim 2, characterized in that: The top of the movable plate (53) is provided with a limiting rod (531); the bottom of the limiting rod (531) is provided with a second test guide post (532); the bottom of the second test guide post (532) is provided with a limiting block (534); the second test guide post (532) is movably inserted through the other end of the probe plate (54); the second buffer spring (533) is sleeved on the outside of the second test guide post (532); the second buffer spring (533) is located between the bottom of the probe plate (54) and the top of the limiting block (534); The bottom of the limiting rod (531) is provided with a contact ball (535) for abutting against the top of the probe plate (54).

5. The high-efficiency grain testing and sorting machine according to claim 2, characterized in that: The test base (5) is provided with an adjustment base plate (55); the adjustment base plate (55) is provided with a transverse adjustment platform (56) that slides in the transverse direction; the adjustment base plate (55) is rotatably provided with a transverse adjustment screw (551) that extends in the transverse direction; the transverse adjustment platform (56) is provided with a transverse adjustment slide rail (561) that extends in the transverse direction; the adjustment base plate (55) is provided with a transverse adjustment slider (552) that is slidably connected to the transverse adjustment slide rail (561); the transverse adjustment screw (551) is fitted with a transverse adjustment nut (553); the transverse adjustment nut (553) is connected to the transverse adjustment platform (56); the transverse adjustment screw (551) is connected to a transverse adjustment knob (554); The transverse adjustment platform (56) is provided with a longitudinal adjustment platform (57) that slides along the longitudinal direction; the transverse adjustment platform (56) is rotatably provided with a longitudinal adjustment screw (562) that extends along the longitudinal direction; the longitudinal adjustment platform (57) is provided with a longitudinal adjustment slide rail (571) that extends along the longitudinal direction; the transverse adjustment platform (56) is provided with a longitudinal adjustment slider (563) that is slidably connected to the longitudinal adjustment slide rail (571); the longitudinal adjustment screw (562) is fitted with a longitudinal adjustment nut (564); the longitudinal adjustment nut (564) is connected to the longitudinal adjustment platform (57); the longitudinal adjustment screw (562) is connected to a longitudinal adjustment knob (565); The longitudinal adjustment platform (57) is provided with a lifting adjustment platform (58) that slides along the height direction; the longitudinal adjustment platform (57) is rotatably provided with a lifting adjustment screw (572) that extends along the height direction; the lifting adjustment platform (58) is provided with a lifting adjustment slide rail (581) that extends along the height direction; the longitudinal adjustment platform (57) is provided with a lifting adjustment slider (573) that is slidably connected to the lifting adjustment slide rail (581); the lifting adjustment screw (572) is fitted with a lifting adjustment nut (574); the lifting adjustment nut (574) is connected to the lifting adjustment platform (58); the lifting adjustment screw (572) is connected to a lifting adjustment knob (575); the lifting adjustment platform (58) is connected to the movable plate (53).

6. The high-efficiency grain testing and sorting machine according to claim 2, characterized in that: The adsorption mechanism (2) includes an adsorption seat (21) disposed on the outer periphery of the rotating seat (12), an adsorption rod (22) movably passing through the adsorption seat (21) along the height direction, an adsorption pressing platform (23) disposed on the top of the adsorption rod (22), and a metal suction nozzle (24) disposed on the bottom of the adsorption rod (22); an adsorption buffer spring (25) is provided between the bottom of the adsorption pressing platform (23) and the adsorption seat (21); a vacuum hole (26) is provided at the bottom of the metal suction nozzle (24); The test stand (5) is provided with a conductive element (59) for contacting the metal nozzle (24).

7. The high-efficiency grain testing and sorting machine according to claim 6, characterized in that: A vacuum channel (27) communicating with the vacuum hole (26) is provided between the metal suction nozzle (24) and the suction rod (22); The conductive element (59) is a metal spring; one end of the metal spring is connected to the test base (5); the other end of the metal spring is provided with a metal contact block (591); The metal nozzle (24) has an annular contact portion (28) in the middle for contacting the metal contact block (591); the bottom of the metal nozzle (24) is covered with a protective cover (29).

8. The high-efficiency grain testing and sorting machine according to claim 6, characterized in that: The machine base (1) is provided with a column (11); the pressing mechanism includes a pressing seat (6) provided on the column (11), a pressing plate (61) that is movably and vertically provided on the pressing seat (6), and a pressing rod (62) provided on the pressing plate (61); the pressing seat (6) is provided with a pressing linear module (63) that extends along the height direction; the output end of the pressing linear module (63) is connected to the pressing plate (61); the pressing rod (62) is used to drive the adsorption pressing platform (23) to descend.

9. The high-efficiency grain testing and sorting machine according to claim 1, characterized in that: The feeding mechanism includes a vibratory plate (31) and a linear vibrator (32) on the machine base (1); one end of the linear vibrator (32) is connected to the vibratory plate (31); the adsorption mechanism (2) is used to absorb the grains at the other end of the linear vibrator (32).

10. A high-efficiency grain testing and sorting machine according to claim 1, characterized in that: The number of the feeding mechanism, testing mechanism, sorting seat (4) and pressing mechanism are all two; the two feeding mechanisms, two testing mechanisms, two sorting seats (4) and two pressing mechanisms are all arranged symmetrically around the center of the rotating seat (12).

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