A bandpass filter test fixture and method

Abstract

The application provides a band-pass filter test tool, which comprises a bottom plate, a base provided above the bottom plate and provided with a product slot, extension parts corresponding to metal pins on a wave bead insulator are formed by extending the two sides of the product slot outward, a through hole extending downward is formed in the bottom wall of the extension part, a movable plate is connected to the lower surface of the base, a test connector is provided on the movable plate, the center probe of the test connector passes through the through hole and protrudes upward, the outer diameter of the center probe is smaller than the diameter of the through hole, when the band-pass filter is placed in the product slot, the projection of the center probe and the metal pin in the front-back direction intersects, and the center probe and the metal pin are in contact by moving the movable plate only, the operation is convenient, the contact stability is good, and the wave bead insulator is not easy to be damaged; and the test method is implemented by using the test tool, the movable plate is moved first, then the band-pass filter is placed, and then the movable plate is moved reversely for testing, the steps are simple, the test efficiency is high, and the consistency is good.

Description

Technical Field

[0001] This invention belongs to the field of bandpass filter testing technology, specifically relating to a bandpass filter testing fixture and testing method. Background Technology

[0002] Bandpass filters allow signals in a specific frequency band to pass through with minimal attenuation, exhibiting significant out-of-band suppression. They are core components in wireless communication, radio frequency equipment, and signal detection instruments. Some bandpass filters achieve frequency selection through cascaded cavities and couplings, requiring high shielding integrity and airtightness. These types of bandpass filters typically incorporate beaded insulators to extract signals. Figure 1 As shown, the structure of the beaded insulator 2 includes a metal pin 3 located in the center, a metal shell located on the outside, and a glass medium located between the metal pin and the metal shell. The three are sintered together at high temperature to form a through-wall element.

[0003] Before leaving the factory, these bandpass filters need to be tested for their performance parameters. The common testing method is to place the test connector against or clamp it to the metal pin end of the bead insulator. However, the contact stability is poor, the test consistency is poor, and the amplitude of the movement must be strictly controlled during the test to avoid damaging the bead insulator. The efficiency of the test operation is low. Summary of the Invention

[0004] The purpose of this invention is to overcome one or more shortcomings in the prior art and provide a bandpass filter testing fixture and testing method.

[0005] To achieve the above objectives, the product in the technical solution adopted by this invention is a bandpass filter testing fixture, comprising: Base plate; The base is set above the base plate, and the upper surface of the base has a product slot for placing a bandpass filter; The product slot extends outward on both sides to form an extension corresponding to the metal pin on the bandpass filter bead insulator. The bottom wall of the extension has a downward-extending through hole. A movable plate that can move back and forth is connected to the lower surface of the base. A test connector is mounted on the movable plate. The center probe of the test connector passes through the through hole and protrudes upward. The outer diameter of the center probe is smaller than the diameter of the through hole. When the bandpass filter is placed in the product slot, the projection of the center probe and the metal pin in the front-back direction intersects.

[0006] Preferably, the movable plate is in the shape of a forward-protruding U, the test connector is inserted through the protrusion at the front end of the movable plate, and the lower surface of the base is provided with a convex groove that matches the movable plate, the rear end of the convex groove extending rearward through the rear side of the base.

[0007] More preferably, the bottom wall of the convex groove is provided with a waist-shaped groove communicating with the through hole, the waist-shaped groove extends in the front-back direction, and the upper end of the test connector is movably embedded in the waist-shaped groove.

[0008] More preferably, the lower surface of the base is provided with a mounting groove extending in the front-to-back direction, the mounting groove being located on both sides of the protrusion and communicating with the convex groove.

[0009] More preferably, the bandpass filter test fixture further includes an elastic element that drives the movable plate to reset, the elastic element being disposed in the through portion of the mounting groove and the convex groove.

[0010] More preferably, the front end of the elastic element is provided with a threaded hole, which is threadedly connected to a bolt inserted into the movable plate, and the rear end of the elastic element is threadedly connected to the mounting groove.

[0011] Preferably, the depth of the convex groove is equal to the wall thickness of the movable plate, and the lower surface of the base is also connected to an anti-detachment plate that blocks both sides of the movable plate, and the anti-detachment plate is provided with adjustment holes.

[0012] Preferably, the depth of the product slot is greater than or equal to half the thickness of the bandpass filter.

[0013] Preferably, the bottom wall of the product slot is provided with a recessed area corresponding to the extension, the recessed area extends in the left-right direction and communicates with the through hole, and when the bandpass filter is placed in the product slot, the bead insulator at the root of the metal pin is located above the recessed area.

[0014] To achieve the above objectives, the method employed in this invention is a bandpass filter testing method, comprising the following steps: S1. Move the movable plate of the above bandpass filter test fixture so that the center probe is close to the wall of the through hole; S2. Place the bandpass filter to be tested into the product slot; S3. Move the movable plate in the opposite direction so that the center probe abuts against the metal pins on both sides of the bandpass filter. When moving the movable plate, control the driving force within the set range. S4. Test by passing a signal through the test connector.

[0015] Due to the application of the above technical solution, the present invention has the following advantages compared with the prior art: The bandpass filter testing fixture provided by this invention includes a base plate and a base disposed above the base plate with a product slot. The product slot extends outwards on both sides to form extensions corresponding to the metal pins on the beaded insulator. A downwardly extending through hole is formed in the bottom wall of the extension. A movable plate that can move back and forth is connected to the lower surface of the base. A test connector is inserted through the movable plate, allowing its center probe to pass through the through hole and protrude upwards. The outer diameter of the center probe is smaller than the diameter of the through hole. When the bandpass filter is placed into the product slot, the projections of the center probe and the metal pins in the front-back direction intersect. Simply moving the movable plate allows the center probe to contact the metal pins, making operation convenient, providing good contact stability, and minimizing damage to the beaded insulator. The testing method provided by this invention, using the above-mentioned testing fixture, involves first moving the movable plate, then placing the bandpass filter in, and then moving the movable plate in the reverse direction for testing. This method is simple, efficient, and consistent. Attached Figure Description

[0016] Figure 1 This is a three-dimensional schematic diagram of a bandpass filter with a beaded insulator lead-out in the prior art.

[0017] Figure 2 This is a three-dimensional schematic diagram of a preferred embodiment of the testing fixture in this invention.

[0018] Figure 3 yes Figure 2 Front view diagram.

[0019] Figure 4 yes Figure 3 Cross-sectional view along the AA direction.

[0020] Figure 5 yes Figure 3 Cross-sectional view along the BB direction.

[0021] Figure 6 yes Figure 3 A top-down view.

[0022] Figure 7 , Figure 8 yes Figure 2 A three-dimensional schematic diagram of the central base.

[0023] The components are: 1. Bandpass filter; 2. Bead insulator; 3. Metal pin; 10. Base plate; 11. Support rod; 20. Base; 21. Product slot; 22. Extension; 23. Through hole; 24. T-shaped blind slot; 25. Waist-shaped slot; 26. Mounting slot; 27. Anti-detachment plate; 28. Adjustment hole; 29. ​​Recessed area; 30. Movable plate; 31. Test connector; 32. Center probe; 33. Protrusion; 34. Bolt; 40. Elastic element. Detailed Implementation

[0024] likeFigures 2 to 8 As shown, the bandpass filter testing fixture provided by the present invention includes: a base plate 10, a base 20 disposed above the base plate 10, and a movable plate 30; wherein, the base plate 10 is connected to an upwardly extending support rod 11, and there are four support rods 11, which are disposed at the four corners of the base 20; the base 20 is connected to the top of all the support rods 11, and the upper surface of the base 20 is provided with a product slot 21 for placing the bandpass filter 1. The two sides of the product slot 21 extend outward to form an extension 22 corresponding to the metal pin 3 on the bead insulator 2 of the bandpass filter 1. The bottom wall of the extension 22 is provided with a downward penetrating through hole 23; the movable plate 30 is movably connected to the lower surface of the base 20, and a test connector 31 is provided on the movable plate 30. The center probe 32 of the test connector 31 passes through the through hole 23 and protrudes upward. The outer diameter of the center probe 32 is smaller than the diameter of the through hole 23. When the bandpass filter 1 is placed in the product slot 21, the projection of the center probe 32 and the metal pin 3 in the front-back direction intersects.

[0025] The advantage of this setup is that the center probe can be brought into contact with the metal pin simply by moving the movable plate, and then a signal can be applied to perform the test. It is easy to operate, has good contact stability, and is not likely to damage the bead insulator.

[0026] To improve stability, in this embodiment, the movable plate 30 is in the shape of a convex U-shape protruding forward. The test connector 31 is installed on the protrusion 33 at the front end of the movable plate 30. The lower surface of the base 20 is provided with a convex groove 24 that matches the movable plate 30. The rear end of the convex groove 24 extends backward through the rear side of the base 20.

[0027] Furthermore, the bottom wall of the convex groove 24 is provided with a waist-shaped groove 25 that communicates with the through hole 23. The waist-shaped groove 25 extends in the front-back direction. The upper end of the test connector 31 is movably embedded in the waist-shaped groove 25. This embedding means that the left and right side walls of the test connector 31 slide against the left and right side walls of the waist-shaped groove 25. The waist-shaped groove 25 can not only cooperate with the movement of the movable plate 30 to stabilize and guide the test connector 31, but also limit the movement of the test connector 31 following the movement of the movable plate 30.

[0028] For ease of operation, the bandpass filter test fixture also includes an elastic element 40 that drives the movable plate 30 to reset. In the initial state, the elastic element 40 drives the movable plate 30 to move backward to its limit position. The elastic element 40 is preferably an elastic element whose elastic force does not change significantly with the displacement (small displacement) of the movable plate 30, such as a spring column. To facilitate the installation of the elastic element 40, the lower surface of the base 20 is provided with a mounting groove 26 extending in the front-rear direction. The mounting groove 26 is located on both sides of the protrusion 33 and communicates with the convex groove 24. The elastic element 40 is located at the communication between the mounting groove 26 and the convex groove 24. The front end is provided with a threaded hole, which is threadedly connected to the bolt 34 inserted on the movable plate 30. The rear end of the elastic element 40 is threadedly connected to the mounting groove 26. During testing, the movable plate 30 is pushed forward first, then the bandpass filter 1 is placed into the product groove 21, and then the movable plate 30 is released. The elastic force of the elastic element 40 can be used to move the movable plate 30 backward, so that the center probe 32 abuts against the metal pin 3 and is subjected to uniform force. The testing operation is fast and there is no need to excessively touch the bead insulator 2, which can avoid damage to the bead insulator 2 and improve the testing efficiency and yield of the bandpass filter.

[0029] In this embodiment, the groove depth of the convex groove 24 is equal to the wall thickness of the movable plate 30. The lower surface of the base 20 is connected to an anti-detachment plate 27 that blocks both sides of the movable plate 30. The anti-detachment plate 27 is provided with an adjustment hole 28 for adjusting the position of the elastic element 40. The adjustment hole 28 is provided corresponding to the through part of the mounting groove 26 and the convex groove 24.

[0030] To facilitate the placement and removal of the bandpass filter and avoid damage, the depth of the product slot 21 is greater than or equal to half the thickness of the bandpass filter 1. The bottom wall of the product slot 21 is provided with a recessed area 29 corresponding to the extension 22. The recessed area 29 extends in the left and right direction and communicates with the through hole 23. When the bandpass filter 1 is placed into the product slot 21, the bead insulator 2 at the root of the metal pin 3 is located above the recessed area 29.

[0031] The bandpass filter testing method provided by this invention includes the following steps: S1. Move the movable plate of the above bandpass filter test fixture so that the center probe is close to the wall of the through hole; S2. Place the bandpass filter to be tested into the product slot; S3. Move the movable plate in the opposite direction so that the center probe abuts against the metal pins on both sides of the bandpass filter. When moving the movable plate, control the driving force within the set range. S4. Test by passing a signal through the test connector.

[0032] The bandpass filter testing method provided by this invention uses the above-mentioned bandpass filter testing fixture for testing. This testing method has simple steps, high testing efficiency, and good consistency of test results.

[0033] The above embodiments are only for illustrating the technical concept and features of the present invention, and are intended to enable those skilled in the art to understand the content of the present invention and implement it accordingly. They should not be used to limit the scope of protection of the present invention. All equivalent changes or modifications made in accordance with the spirit and essence of the present invention should be covered within the scope of protection of the present invention.

Claims

1. A bandpass filter testing fixture, comprising: Base plate; The base is set above the base plate, and the upper surface of the base has a product slot for placing a bandpass filter; Its features are: The product slot extends outward on both sides to form an extension corresponding to the metal pin on the bandpass filter bead insulator. The bottom wall of the extension has a downward-extending through hole. A movable plate that can move back and forth is connected to the lower surface of the base. A test connector is mounted on the movable plate. The center probe of the test connector passes through the through hole and protrudes upward. The outer diameter of the center probe is smaller than the diameter of the through hole. When the bandpass filter is placed in the product slot, the projection of the center probe and the metal pin in the front-back direction intersects.

2. The bandpass filter test fixture according to claim 1, characterized in that: The movable plate is in the shape of a convex U-shape protruding forward. The test connector passes through the protrusion at the front end of the movable plate. The lower surface of the base is provided with a convex groove that matches the movable plate. The rear end of the convex groove extends backward through the rear side of the base.

3. The bandpass filter test fixture according to claim 2, characterized in that: The bottom wall of the convex groove is provided with a waist-shaped groove that communicates with the through hole. The waist-shaped groove extends in the front-back direction, and the upper end of the test connector is movably embedded in the waist-shaped groove.

4. The bandpass filter test fixture according to claim 2, characterized in that: The lower surface of the base is provided with a mounting groove extending in the front-to-back direction. The mounting groove is located on both sides of the protrusion and communicates with the convex groove.

5. The bandpass filter test fixture according to claim 4, characterized in that: The bandpass filter test fixture also includes an elastic element that drives the movable plate to reset, and the elastic element is disposed in the through part of the mounting groove and the convex groove.

6. The bandpass filter test fixture according to claim 5, characterized in that: The front end of the elastic element is provided with a threaded hole, which is threadedly connected to a bolt inserted into the movable plate, and the rear end of the elastic element is threadedly connected to the mounting groove.

7. The bandpass filter test fixture according to claim 1, characterized in that: The depth of the convex groove is equal to the wall thickness of the movable plate. The lower surface of the base is also connected to an anti-detachment plate that blocks both sides of the movable plate. The anti-detachment plate is provided with adjustment holes.

8. The bandpass filter test fixture according to claim 1, characterized in that: The depth of the product slot is greater than or equal to half the thickness of the bandpass filter.

9. The bandpass filter test fixture according to claim 1, characterized in that: The bottom wall of the product slot is provided with a recessed area corresponding to the extension. The recessed area extends in the left-right direction and communicates with the through hole. When the bandpass filter is placed in the product slot, the bead insulator at the root of the metal pin is located above the recessed area.

10. A method for testing a bandpass filter, characterized in that, Includes the following steps: S1. Move the movable plate of the bandpass filter test fixture according to any one of claims 1 to 9 so that the center probe is close to the wall of the through hole; S2. Place the bandpass filter to be tested into the product slot; S3. Move the movable plate in the opposite direction so that the center probe abuts against the metal pins on both sides of the bandpass filter. When moving the movable plate, control the driving force within the set range. S4. Test by passing a signal through the test connector.

Images