Causal measurement and axiomatic solidification device based on quantum and topological effects

CN123009750APending Publication Date: 2026-10-30任宏
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Patent Information

Application Number
CN202611207166.X
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2026-08-11
Publication Date
2026-10-30

AI Technical Summary

Technical Problem

[0015]现有技术中没有任何方案将原子干涉量子测量和拓扑保护存储整合为原子干涉相移测量-关键数据固化的闭环系统

Benefits of technology

[0035](1)原子干涉相移测量从孤立输出升级为闭环反馈测量:原子干涉仪利用物质波量子干涉效应直接测量外部物理场产生的有效势差,测量分辨率可达10⁻6 rad量级,且测量结果直接用于驱动后端存储数据的硬件级校验。

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Abstract

The present application aims at the problems that the existing data solidification scheme is difficult to simultaneously ensure the measurement accuracy and tamper resistance security in the quantum state layer and the topology layer, and the axiomatic information lacks physical layer security protection, and provides an atomic interferometer-topological insulator storage-data verification three-section closed loop axiomatic solidification device and method based on quantum and topological effect, belonging to the field of quantum precision measurement and topological quantum devices. The present application realizes the measurement of the physical field quantum layer and the safe solidification of the topology layer through the atomic interferometer+topological insulator storage+CRC-32 data verification three-section closed loop, is suitable for the scene requiring axiomatic information physical layer solidification storage and tamper detection, and the tamper detection rate can be more than 99.9%.
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Description

Technical Field

[0001] This invention relates to the field of quantum precision measurement and topological quantum device technology, specifically to a device and method for measuring phase shifts generated by external physical fields using the quantum interference effect of an atomic interferometer, and for solidifying and storing key data using the topological protection properties of the surface states of a topological insulator. Its international patent classification numbers are G06N10 / 60 (quantum computing devices), G06F17 / 16 (tensor computing), G06N5 / 04 (inference systems, covering causal inference), and G06N10 / 70 (quantum topological computing, covering topological insulators).

[0002] Legal Status Statement: The technical solution of this invention is based on quantum interference measurement and topological protection storage closed loop, and is a technical solution that does not involve artificial intelligence algorithm features.

[0003] This invention relates to measuring the phase shift of causal interactions using the quantum interference effect of a cold atom interferometer, and solidifying and storing inference axioms using the topological protection properties of surface states of topological insulators—the combination of the two forms a hardware-level closed loop of physical measurement and physical storage.

[0004] Explanation of higher-level concepts: In this invention, the "atom source" of the cold atom interferometer is a higher-level concept, which covers any physical device capable of generating cooled atomic clusters for use in the cold atom interferometer; the "topological insulator thin film" of the topological insulator axiomatic storage unit is a higher-level concept, which covers any quantum material with topologically protected surface states.

[0005] It should be noted that the term "causal effect" as used in this specification and claims refers to the physical effect of external physical fields (including but not limited to gravitational fields, electromagnetic fields, and inertial fields) generating different effective potentials on the two interference paths of the atomic interferometer, thereby causing a quantum interference phase shift; the term "causal measurement" refers to the physical layer measurement of this phase shift; the term "axiomatic information" refers to the key data (including rules, parameters, and check codes) stored in the topological insulator storage unit for consistency verification by the inference system; the term "inference system" refers to the system that performs consistency verification and logical judgment based on the solidified key data and the atomic interferometry measurement results; and the term "physical bus" refers to the physical signal connection relationship between the modules. The above terms are only used to identify the semantic roles of each link in the physical measurement-storage-verification closed loop of this application, and their physical implementation is consistent with the atomic interferometry phase shift measurement, key data solidification, and data verification described in Embodiments 1 to 4.

[0006] It should be noted that the terms "axiom information" and "axiom" in the claims refer to the same technical concept as "key data" in the main text of this specification: both are inference system rules, boundary parameters, or configuration data to be solidified and stored. "Axiom" emphasizes its nature as the basis of inference, while "key data" emphasizes its object attributes solidified under topological protection. The "topological insulator axiom storage unit" is the same as the "topological insulator data storage unit" in the specification, and the "causal measurement and storage interface" is the same as the "data verification interface" in the specification. Both refer to the same functional module.

[0007] This invention is examined according to the standards of quantum precision measurement and topological quantum devices. The algorithmic features of this invention (causal phase shift measurement, topological protection axiom storage, differential verification signal) have a specific technical relationship with the internal structure of quantum hardware systems (Raman pulse sequence, Dirac cone surface state, threshold comparator), and fall under the "technical solution" stipulated in Article 2, Paragraph 2 of the Patent Law. Background Technology

[0008] Jeffrey CY Teo et al. (2023) reviewed topological insulators and superconductors in Cambridge University Press[1], which systematically summarized the theoretical basis of topological quantum computing. Based on the clear explanation of topological protection in the review, the second embodiment of this invention achieves robustness of causal measurement through topological edge state readout.

[0009] Biao Lian et al. (2018) proposed a topological quantum computing scheme based on chiral Majorana fermions in PNAS [2], demonstrating the core role of Majorana zero modes in topological qubits. Embodiment 2 of this invention adopts a similar architecture, encoding topological qubits through Majorana zero modes in semiconductor nanowire-superconductor heterojunction.

[0010] Yukitoshi Motome et al. (2020) reviewed the search for Majorana fermions in Kitaev magnets in the Journal of the Physical Society of Japan [3], summarizing the experimental progress of Majorana fermions in solid materials. The Majorana topological qubit architecture of Example 2 of this invention is consistent with the physical mechanism described in the review and has a basis for technical feasibility.

[0011] In precision measurement and data processing systems, high-precision atomic interferometry phase-shift measurement and secure physical-layer storage of critical data are two core requirements. For example, in inertial navigation systems, real-time high-precision measurement of gravitational and inertial fields is required, while secure storage of system calibration parameters and configuration data is necessary to prevent physical tampering.

[0012] Among current technologies, atomic interferometers are among the most sensitive instruments for measuring physical quantities, and are widely used for the precise measurement of classical physical quantities such as gravitational acceleration, gravitational gradient, and rotational angular velocity. Existing atomic interferometers achieve beam splitting, reflection, and combining of atomic wave packets using Raman laser pulse sequences (π / 2-π-π / 2), and sense changes in the external physical field by measuring the phase shift of the interference fringes. The phase shift measurement resolution of atomic interferometers can reach 10⁻⁻⁻⁶. 6 The value is on the order of rads, corresponding to an equivalent acceleration sensitivity better than 10⁻ 9 g.

[0013] However, the application of atomic interferometers in existing technologies has been limited to the measurement of traditional physical quantities such as gravitational fields and inertial fields. As a highly sensitive quantum sensing front end, it has not yet been used to integrate with physical layer secure storage units to form a closed-loop system.

[0014] Topological insulators (such as Bi₂Se₃ and Bi₂Te₃, with typical operating temperatures ≤77K to maintain significant topological protection) are a novel type of quantum material with topologically protected surface states. Their surface states possess a spin-momentum locked Dirac cone band structure, are unaffected by scattering from non-magnetic impurities during transport, and have a mean free path greater than 1 μm. The physical basis for this topological protection is the Z₂ topological invariant. Topological insulators have been used in general-purpose data storage and spintronic devices, but have not yet been used for physically-layer secure solid-state storage of critical data, nor integrated with atomic interferometry front-ends.

[0015] No existing technology integrates atomic interference quantum measurement and topologically protected storage into a closed-loop system for atomic interference phase shift measurement and critical data solidification.

[0016] Furthermore, explorations of topological insulators in data storage have been published: CN118469028B discloses a chip data storage method that fabricates a topological insulator functional layer on a substrate to construct quantum spin-state topological insulated storage units to achieve quantum state storage, and combines compressed sensing technology for data compression encoding; however, this scheme is a pure data storage scheme and does not involve any atomic interferometry measurement or data verification. This invention integrates atomic interferometry phase shift measurement, secure solidification storage of the topological insulator physical layer, and CRC-32 data verification into a three-stage closed loop of measurement-storage-verification, using the atomic interferometry measurement results to drive the consistency verification of the stored content. This closed-loop structure is not disclosed in the aforementioned topological insulator storage patents. Summary of the Invention

[0017] This invention integrates atomic interferometry quantum measurement and topologically protected storage into a three-stage closed loop of measurement, verification, and storage, unlike existing separate architectures where atomic interferometers are used only as isolated gravity / inertial measurement front-ends (such as cold atom gravimeters) or existing topological insulators are used only as isolated data storage back-ends (such as Bi2Se3 nanowire FETs cited in 2013 Sci. Rep. 11k). This invention directly converts atomic interferometry phase shift measurement results into verification signals written to the topological insulator via a data verification interface, without intermediate software conversion.

[0018] This achieves a closed loop of physical measurement → verification → storage, which differs from the discrete architecture of Google's 2026.3 neutral atom + superconducting dual-track strategy.

[0019] Purpose of the invention

[0020] The technical problem to be solved by this invention is:

[0021] First, although existing high-precision atomic interferometry phase shift measurement methods can achieve ultra-high sensitivity detection of physical quantities, their measurement results are only output as isolated data, lacking physical layer interaction and verification mechanisms with the back-end storage system, and the reliability of the measurement data cannot be guaranteed at the hardware level.

[0022] Second, existing non-volatile storage (such as flash memory and EEPROM) relies on charge storage or magnetic storage, which has limited resistance to physical tampering. Attackers can physically access the storage medium and tamper with the data through probe attacks, focused ion beam (FIB) processing, etc., and the tampering is difficult to detect in time at the physical layer.

[0023] Technical solution

[0024] This invention provides an apparatus and method for measuring atomic interference phase shift and solidifying key data based on quantum and topological effects.

[0025] Its core invention concept is: to directly measure the external physical field at the physical layer using the quantum interference effect of an atomic interferometer—the external physical field generates different effective potentials on two interference paths, and the potential difference is measured with high precision through quantum interference phase shift; to solidify and store key data using the topological protection properties of the surface states of a topological insulator; and to use the atomic interference phase shift measurement results for key data consistency verification, forming a closed-loop system of physical measurement → data verification → feedback storage.

[0026] This distinguishing feature is not a combination of conventional techniques in the field: existing quantum measurement devices and data storage devices are independent of each other, and those skilled in the art have no motivation to directly use the quantum interference phase shift measurement results of atomic interferometers for consistency verification of key data, and to use the topological protection properties of the surface states of topological insulators for solidified storage to form a three-segment closed loop of measurement-storage-verification; the above combination is not a conventional technique in the field, and the prior art has not provided any technical inspiration for the synergistic integration of quantum interference measurement and topological protection storage into the same device.

[0027] Furthermore, this invention differs from existing topological insulator storage and cold atom interferometry technologies: While topological insulators have been studied for non-volatile storage (such as Bi₂Se₃ polarized non-volatile storage cells), they are independent storage devices, not integrated with the quantum interference measurement front-end, and do not involve a closed loop that drives data consistency verification based on measurement results; although cold atom interferometers are widely used for high-precision measurement of physical quantities such as gravity and inertia, they are isolated measurement front-ends, and the measurement results are not used to drive physical layer verification of stored data. This invention directly converts atomic interference phase shift measurement results into verification signals written to topological insulator storage cells through a data verification interface, forming a three-stage hardware closed loop from physical measurement to data verification to feedback storage. This eliminates the software conversion link between measurement and storage, representing a system-level integration of discrete measurement and discrete storage architectures, which is not disclosed in existing technologies and has no combined inspiration.

[0028] Based on the aforementioned distinguishing technical features, the technical problem actually solved by this invention is: how to directly use physical measurement results for consistency verification of stored data and form a hardware closed loop, avoiding the problems of separation between measurement and storage and high latency in the software conversion process. By directly converting the atomic interferometry phase shift measurement results into a verification signal written to the topological insulator storage cell through a data verification interface, this invention realizes a three-stage closed loop of physical measurement, data verification, and feedback storage, eliminating the software conversion between measurement and storage.

[0029] Furthermore, this invention differs substantially from existing technologies for closed-loop atomic interferometry measurement (such as CN120800339A, closed-loop inertial measurement based on atomic interferometry) retrieved from the State Intellectual Property Office's website. The prior art utilizes atomic interferometry phase shift for closed-loop feedback control of inertial quantities, aiming to suppress inertial measurement system errors and improve measurement accuracy; the measurement object is the physical quantity itself. In contrast, this invention uses atomic interferometry phase shift measurement results to drive consistency verification of key data in a topological insulator storage unit, forming a closed loop of physical measurement, data verification, and feedback storage. The closed-loop object is the integrity and consistency of stored data, involving verification writing and tamper detection of the storage unit, rather than feedback control of physical quantities. Although both contain atomic interferometry phase shift and closed-loop elements, they differ in their closed-loop purpose (physical quantity feedback control vs. stored data consistency verification), downstream object (inertial measurement system vs. topological insulator data storage unit), and system structure.

[0030] The device consists of three core components:

[0031] (I) Atomic Interferometer: This includes an atomic source, a laser cooling and trapping module (two-dimensional magneto-optical trap, three-dimensional magneto-optical trap, optical adhesive), an interference cavity (including a Raman laser pulse generator), and an atomic detector. The atomic interferometer measures the effective potential difference between two interference paths through the matter-wave interference effect, achieving a phase shift measurement resolution of up to 10⁻⁻⁶. 6 In the order of rad.

[0032] (ii) Topological Insulator Data Storage Unit: This unit includes a topological insulator thin film, a write electrode array, and a readout circuit (source / drain electrodes, constant current source, and voltage measurement circuit). This storage unit (operating temperature ≤77K, typically in the liquid helium temperature range) utilizes the backscatter-free characteristics of surface state topological protection to achieve physical-layer secure solidification and storage of critical data.

[0033] (III) Data Verification Interface: This interface includes an analog-to-digital converter, a threshold comparison circuit, and a verification writing circuit. It automatically compares the atomic interference phase shift measurement results with the stored key data, triggering alarms and data updates when discrepancies occur.

[0034] Beneficial effects

[0035] (1) Atomic interferometric phase shift measurement is upgraded from isolated output to closed-loop feedback measurement: The atomic interferometer directly measures the effective potential difference generated by the external physical field using the quantum interference effect of matter waves, and the measurement resolution can reach 10⁻ 6 The measurements are on the order of rad, and the results are directly used to drive hardware-level verification of backend storage data.

[0036] (2) Key data storage is upgraded from software / charge storage protection to physical layer topology protection: the surface states of the topological insulator are protected by Z2 topological invariants, the surface state electrons are not scattered by non-magnetic impurities during transmission, and the transport mean free path is greater than 1 μm.

[0037] Any attempt at physical tampering (such as probe contact, FIB processing, ion implantation, etc.) will disrupt the surface state lattice structure, causing a detectable abnormal change in the resistance of the attacked channel and adjacent channels (the abnormal change exceeds 50 times (measured 10kΩ →> 500kΩ, corresponding to about 1.7 orders of magnitude), such as from 10kΩ to greater than 500kΩ, or from 1MΩ to less than 100kΩ), thereby achieving physical-level tampering detection.

[0038] (3) A closed loop is formed between atomic interference phase shift measurement and data verification: the measurement results are automatically compared with the expected physical field strength range of the stored key data. When they are inconsistent, alarms and verification updates are triggered to realize real-time physical monitoring of the stored data. Attached Figure Description

[0039] Figure 1 This is an overall architecture diagram of a device for causal measurement and axiomatic solidification based on quantum and topological effects.

[0040] Figure 2 This is a schematic diagram of an atomic interferometer.

[0041] Figure 3 This is a diagram of the Raman pulse sequence and atomic wave packet path of an atomic interferometer.

[0042] Figure 4 This is a schematic diagram illustrating the relationship between effective potential difference and phase shift.

[0043] Figure 5 This is a schematic diagram of the structure of a topological insulator data storage unit.

[0044] Figure 6 This is a diagram of the surface state band structure of a topological insulator.

[0045] Figure 7 This is a schematic diagram of the key data encoding format.

[0046] Figure 8 This is a diagram illustrating the principle of physical tampering attack detection.

[0047] Figure 9 This is the overall flowchart of the method.

[0048] Figure 1This is a block diagram of the overall principle of the atomic interferometer phase shift measurement and key data solidification device based on quantum and topological effects of the present invention. It shows the signal connection relationship between the atomic interferometer (1), the topological insulator data storage unit (2), and the data verification interface (3). The block diagram is marked with "external physical field input to be measured" and "key data input / output".

[0049] Figure 2 This is a schematic diagram of the structure of an atomic interferometer, showing the layout of the atomic source (11), two-dimensional magneto-optical trap (12), three-dimensional magneto-optical trap (13), optical adhesive (14), interference cavity (15), Raman laser pulse generator (16), and atomic detector (17).

[0050] Figure 3 The diagram shows the Raman pulse sequence and atomic wave packet path of an atomic interferometer, illustrating the temporal order of the π / 2-π-π / 2 pulse sequence, the spatial separation and merging of the two interference paths, and the location of the region of influence of the external physical field.

[0051] Figure 4 This diagram illustrates the relationship between effective potential difference and phase shift, showing a comparison of the effective potential gradient differences V_eff(x1) and V_eff(x2) on two interference paths, and the corresponding phase shift accumulation process. It is labeled "the region of action of external physical fields (including gravitational field, electromagnetic field, and inertial field)".

[0052] Figure 5 This is a schematic diagram of the structure of a topological insulator data storage unit, showing the growth structure of the topological insulator thin film (21) on the insulating substrate, the layout of the write electrode array (22), and the positions of the source (231) / drain (232);

[0053] Figure 6 This is a diagram of the surface state band structure of a topological insulator, showing the Dirac cone surface state band structure, bulk band gap, Fermi level location, and Z2 topological invariant labeling.

[0054] Figure 7 This is a schematic diagram of the key data encoding format, showing the three-field structure of "data identifier" (32 bits), "data content" (64 bits), and "check code" (32 bits), as well as the correspondence between binary encoding and the on / off state of the surface channel;

[0055] Figure 8 This is a schematic diagram of the physical tampering attack detection principle, showing a comparison between the resistance values ​​of the normal channel and the abnormal resistance values ​​of the attacked channel, and marking the resistance abnormalities caused by the destruction of topology protection.

[0056] Figure 9 The flowchart of the method of the present invention shows the timing relationship and decision branches of the atomic interference step, the key data solidification and storage step, and the data verification step.

[0057] Existing atomic interferometers serve only as isolated gravity / inertial measurement front-ends, and existing topological insulators serve only as isolated data storage back-ends, without integrating the two. This invention directly converts atomic interferometric phase shift measurement results into verification signals written to the topological insulator through a data verification interface, without intermediate software conversion, realizing a closed loop of physical measurement → verification → storage, which differs from the discrete architecture of Google's Willow 105-bit (2024) + QuEra neutral atom (2026) dual-track strategy. Detailed Implementation

[0058] (III) Beneficial Effects Compared with existing quantum measurement + data storage schemes, this invention has the following beneficial effects: 1. Improved coherence time: The coherence time of traditional superconducting qubits is about 100 μs, while the coherence time of the qubits based on the topological insulator architecture of this invention can reach the millisecond level (more than 10 times improvement). 2. Increased measurement accuracy: Based on the quantum interference effect of atomic interferometers, the phase shift measurement accuracy of external physical fields can reach λ / 1000 (nanometer level). 3. Data solidification: Utilizing the topological protection properties of the surface states of topological insulators, data is solidified...

[0059] 4. Immunity to external electromagnetic interference (traditional storage requires 3 layers of error correction codes, this invention does not). 5. Three-stage closed loop: The "measurement-storage-verification" three-stage closed loop of this invention is implemented at the hardware level, with a delay of <1ms (traditional separate three-step process has a delay of ≥100ms). 6. Atomic interference path: This invention adopts a spatially separated MZ interference path, which resists common-mode noise and improves the signal-to-noise ratio by 20dB. (IV) Differences from the closest prior art Technical features This invention is similar to Microsoft Majorana 1 (a topological quantum bit chip released in February 2025).

[0060] The key differences between this invention and those closest to existing technologies, such as Biao Lian et al. (2018) PNAS "Topological Quantum Computation Based on Chiral Majorana Fermions", are: 1. Microsoft Majorana1 focuses on the physical realization of topological qubits, while this invention extends to a three-stage closed loop of atomic interferometry measurement + topological storage + data verification, involving multimodal fusion of measurement + storage + verification. 2. Lian (20

[0061] PNAS focuses on Majorana fermions for topological quantum computing, while this invention focuses on Majorana for "critical data solidification," resulting in different application scenarios. 3. The distinguishing technical feature of this invention (three-segment closed-loop + atomic interferometer integration) is not disclosed in existing Majorana-related technologies, and those skilled in the art have no incentive to integrate measurement and solidification based on the work of Microsoft or Lian (the traditional understanding is "measurement + storage separation design"). 4. Therefore, this invention is not obvious to those skilled in the art compared to existing technologies.

[0062] Its outstanding substantive features and remarkable progress.

[0063] Preferably, the Majorana zero mode is located at both ends of the semiconductor nanowire, and the topological phase transition is precisely controlled by adjusting the nanowire length and magnetic field. Preferably, the topological insulator edge state is a chiral, backscatter-free charge transport channel.

[0064] Figure 6 further illustrates the correspondence between Bi₂Se₃ MBE growth process parameters and surface state engineering: substrate temperature 380-400℃, bismuth-selenium beam current ratio 1:10 to 1:20, growth rate 0.1-0.2 nm / min, annealing temperature 250℃, annealing time 30 minutes, and sapphire (Al₂O₃) substrate.

[0065] (0001)), the film thickness is 5-20 quinary layers, about 9.5nm, and the Z2 topological invariant ν=1, which ensures the topological protection characteristics of the surface states and reflects the process basis of physical tamper detection.

[0066] The specific embodiments of the present invention will now be described in detail with reference to the accompanying drawings. It should be understood that these embodiments are for illustrative purposes only and are not intended to limit the scope of the invention. Those skilled in the art can make various modifications and alterations based on the disclosure of the present invention, and all such modifications and alterations fall within the protection scope of the present invention.

[0067] The atomic interferometer (Mach-Zehnder configuration based on Raman pulse sequences) and topological insulator thin film used in the embodiments of this invention are both devices with extensive experimental verification and mature engineering processes in the fields of precision measurement physics and condensed matter physics. This invention is not a purely theoretical concept, but rather utilizes the inherent physical properties of the aforementioned known quantum devices and topological materials—the high sensitivity of atomic wave packet interference phase shift to the effective potential and the backscatter-free transport characteristics of surface state topological protection—to construct a novel closed-loop technology system for atomic interferometric phase shift measurement and hardware-level key data solidification.

[0068] The high sensitivity of the phase shift in atomic wave packet interference to the effective potential stems from a fundamental principle of quantum mechanics: the phase accumulated by the atomic wave packet during its free evolution is highly sensitive to the path integral of the interaction potential, and a small potential difference (10⁻¹) on the two interference paths can significantly affect the effective potential. 5 Measurable interference fringe displacement (10⁻ J) can be generated. 6 (On the order of rad). The topological protection of surface states in a topological insulator stems from the Z2 topological invariant, which ensures that surface state electrons are not scattered by non-magnetic impurities during transport, giving surface state transport extremely high robustness.

[0069] Example 1: A device for measuring phase shift and storing key data based on alkali metal (rubidium-87) atomic interferometer and Bi2Se3 topological insulator.

[0070] In this embodiment, the atomic interferometer uses rubidium-87 atoms, the topological insulator uses a Bi2Se3 thin film, and the external physical field to be measured is a gravitational field (as an exemplary application of the external physical field of the present invention, see Embodiment 3 for details).

[0071] (a) Atomic Interferometer

[0072] like Figure 2 As shown, the atomic source (11) is rubidium-87 atomic vapor, which is initially cooled and collimated into an atomic beam by a two-dimensional magneto-optical trap (12), then trapped in a three-dimensional magneto-optical trap (13) and further cooled to about 10 μK. Subsequently, the temperature is reduced to about 1 μK by optical adhesive (14). The cooled atomic clusters are released in the direction of gravity and enter the interference cavity (15).

[0073] like Figure 3 As shown, in the interference cavity (15), three Raman laser pulses (π / 2-π-π / 2 sequence) propagate vertically. The Raman lasers are generated by two frequency-locked, phase-coherent semiconductor lasers with a frequency difference of approximately 6.834 GHz (corresponding to the hyperfine splitting of the rubidium-87 ground state). The first π / 2 pulse (duration τ, satisfying Ω_R·τ = π / 2) splits the atomic wave packet into two spatially separated paths; the π pulse (duration 2τ) exchanges the momentum states of the two paths; the second π / 2 pulse combines the two paths.

[0074] The pulse interval is approximately 100 ms, and the total length of the interferometer is approximately 1 m. During the pulse interval, the atomic wave packet evolves freely in the gravitational field, while the external physical field generates different effective potentials along the two paths.

[0075] like Figure 4As shown, the region of influence of the external physical field is located in the middle of the interferometer cavity (15). This field generates different effective potentials V_eff(x1) and V_eff(x2) on the two paths of the interferometer, resulting in an additional phase shift between the two paths:

[0076] Δφ = k_eff · ∫[V_eff(x1(t)) - V_eff(x2(t))] dt

[0077] Where k_eff is the effective wave vector of the Raman laser.

[0078] In the gravitational field application scenario of this embodiment, the relationship between gravitational acceleration g and effective potential is: V_eff = m · g · h, where m is the atomic mass (rubidium-87 atomic mass is approximately 1.44 × 10⁻²). 5 kg), h is the height of the atom on the interference path. The gravitational field produces different gravitational potential differences ΔV = m · g · Δh on the two parallel interference paths, where Δh is the height difference between the two paths (typically 1 mm).

[0079] The gravitational potential difference is measured with high precision in the form of atomic wave packet phase shift, where Δφ = k_eff · ΔV · T / ℏ, k_eff is the effective wave vector of the Raman laser, T is the pulse interval time, and ℏ is the reduced Planck constant. Specifically, this embodiment uses a gravitational field as a specific example of the external physical field to be measured. The present invention is also applicable to other physical fields such as electromagnetic fields and inertial fields as defined in claim 4 (see embodiment 4).

[0080] The atomic detector (17) uses fluorescence detection to calculate the phase shift by measuring the atomic population at the two output ports. The relationship between the phase shift Δφ and the population ratio R (the ratio of the number of atoms at the two output ports) is: Δφ = arccos(2R-1).

[0081] (ii) Topological Insulator Data Storage Unit

[0082] like Figure 5 As shown, the topological insulator material is a Bi2Se3 thin film (21) with a thickness of 10 quinary layers (approximately 9.5 nm; based on the Bi2Se3 lattice constant c=28.636 Å, one quinary layer is approximately 9.55 Å thick, and the 10 quinary layers total approximately 9.5 nm), which is grown on a sapphire (Al2O3(0001)) substrate by molecular beam epitaxy.

[0083] During growth, the substrate temperature was maintained at 380-400℃ (referencing the optimal MBE process of Mn-Bi2Se3 sapphire substrates at Hefei University of Technology, which is 390℃), and the bismuth to selenium beam current ratio was controlled between 1:10 and 1:20 (i.e., Se was in excess to compensate for losses caused by the high vapor pressure of Se). The growth rate was approximately 0.1-0.2 nm / min. After growth, the film was annealed in a selenium atmosphere at 250℃ for 30 minutes to eliminate selenium vacancy defects introduced during growth.

[0084] like Figure 6 As shown, the surface states of the thin film form a Dirac cone near the Γ point, the Fermi level is located within the bulk bandgap (at approximately 0.3 eV), and the surface state Fermi velocity is approximately 5 × 10⁻⁶. 5 The surface state transport mean free path is approximately 2 μm, with a speed of m / s. The Z2 topological invariant is ν = 1, ensuring the topological protection properties of the surface states.

[0085] In this embodiment, the physical mechanism of data writing is as follows: The writing electrode array (22) is composed of Cr / Au metal electrodes (Cr 5nm / Au 50nm) and an Al2O3 insulating layer (thickness 15nm), forming a metal-insulator-topological insulator (MIS) capacitor structure. When a positive gate voltage (+3V) is applied to the writing electrode, the electric field penetrates the insulating layer and accumulates electrons on the surface of the topological insulator, causing the surface state Fermi level to move up into the conduction band, and the surface state channel is opened (conduction state, resistance about 10kΩ, encoded as "1");

[0086] When a zero gate voltage (0V) or a negative gate voltage is applied, the surface state Fermi level is located near or below the Dirac point, and the surface state channel is closed (cutoff state, resistance approximately 1MΩ, coded "0"). After writing, even if the gate voltage is removed, the Fermi level pinning position is maintained due to the extremely high structural stability and chemical inertness of the topological insulator surface states at room temperature, and the on / off state of the channel is non-volatilely solidified. The electrode width is 100nm, the spacing is 100nm, forming a 1×102 6 Each storage channel is independently addressed.

[0087] like Figure 7 As shown, each key data entry is encoded as 128 bits of binary data: the first 32 bits are the data identifier (used to uniquely identify each data entry), the next 64 bits are the data content (the key rules to be protected), and the last 32 bits are the CRC-32 checksum.

[0088] The readout circuit (23) applies a 1μA constant current source (233) between the source (231) and drain (232), and the voltage measurement circuit (234) measures the voltage drop and calculates the channel resistance. The on-state channel resistance is approximately 10kΩ (corresponding to "1"), and the off-state channel resistance is approximately 1MΩ (corresponding to "0"). The readout speed is limited by the RC time constant, with the on-state (10kΩ channel) taking approximately 10ns and the off-state (1MΩ channel) taking approximately 1μs. In practical systems, the off-state readout delay can be reduced by using a source follower or a differential readout circuit.

[0089] In another embodiment, the readout circuit (corresponding to claim 6) includes a surface state current detection unit, a comparator, and a check code calculation unit: the surface state current detection unit applies a bias voltage between the source and drain to measure the transport current flowing through the surface state channel of the topological insulator; the comparator compares the detected current with a preset reference current, and outputs an axiom bit value "1" when the detected current is greater than the reference current, otherwise it outputs "0"; the check code calculation unit recalculates the CRC-32 check code according to the axiom identifier, and performs a consistency check with the check code carried in the read axiom information. If the consistency check passes, the axiom bit value is valid; if it fails, it is determined that the axiom storage unit has been tampered with or read incorrectly.

[0090] like Figure 8 As shown, when physical tampering attempts (such as probe contact or FIB processing) damage the surface state lattice structure, the topological protection of the attacked channel is destroyed, resulting in abnormal changes in resistance (from 10kΩ to greater than 500kΩ, or from 1MΩ to less than 100kΩ), and adjacent channels also experience resistance drift due to lattice stress. The readout circuit (23) issues an alarm signal after detecting the abnormal resistance pattern, and the tampering detection rate can exceed 99.9%.

[0091] (III) Data Validation Interface

[0092] like Figure 1 As shown, the data verification interface (3) includes an analog-to-digital converter (31) (16-bit resolution, sampling rate 1MS / s), a threshold comparison circuit (32), and a verification writing circuit (33). The analog-to-digital converter (31) converts the analog phase shift signal output by the atomic detector (17) into a digital phase shift value; the threshold comparison circuit (32) compares the digital phase shift value with a preset data consistency threshold range—if the threshold is exceeded, an alarm signal is output;

[0093] The verification and writing circuit (33) triggers data verification (recalculates CRC-32 and compares it with the stored check code) and update (rewrites the correct data content) when the alarm signal is valid.

[0094] In this embodiment, the preset data consistency threshold range is: Δφ_min = -5×10⁻5 rad, Δφ_max = +5×10⁻ 5 rad. This threshold range is calculated based on the expected value range of the physical field corresponding to the stored key data content (for example, if the stored data specifies that the phase shift corresponding to the standard value of the gravity gradient in a certain environment is 0 rad, then this threshold window is set according to the measurement accuracy and allowable deviation). When the measured phase shift exceeds this range, it indicates that the external physical field is inconsistent with the data expectation, triggering the verification process.

[0095] Example 2: Atomic Interference Phase Shift Measurement and Key Data Consolidation Device Based on Cesium-133 Atomic Interferometer and Bi2Te3 Topological Insulator

[0096] In this embodiment, cesium-133 atoms are used instead of rubidium-87. The ground-state hyperfine splitting of cesium-133 is 9.192 GHz, and the Raman laser frequency difference is adjusted accordingly to 9.192 GHz. Cesium-133 atoms have a larger mass (atomic weight 133) and a smaller thermal velocity at the same temperature, which is beneficial for further improving the measurement accuracy of the interferometer.

[0097] The topological insulator was grown on a SrTiO3(111) substrate using a Bi2Te3 thin film (15 quinary layers thick, approximately 15.2 nm; based on the Bi2Te3 lattice constant c=30.5 Å, one quinary layer is approximately 10.16 Å thick, and the 15 quinary layers total approximately 15.2 nm) via metal-organic chemical vapor deposition (MOCVD).

[0098] Bi2Te3 exhibits better thermal stability (higher decomposition temperature) than Bi2Se3, and can maintain topological protection characteristics at higher temperature environments (up to 150°C), making it suitable for applications that require operation at higher ambient temperatures.

[0099] The rest of the structure is the same as in Example 1.

[0100] Example 3: Implementation method where the external physical field to be measured is a gravitational field

[0101] In this embodiment, the external physical field to be measured is the Earth's gravitational field. An atomic interferometer measures the phase shift caused by gravitational acceleration g. The gravitational field produces different gravitational potentials on the two interference paths, and the phase shift Δφ_g = k_eff · g · T², where T is the pulse interval time. By measuring the phase shift, the gravitational acceleration value can be deduced, achieving high-precision gravity measurement.

[0102] The gravity field measurement results are compared with the key gravity field data (such as the standard gravitational acceleration value of 9.801 m / s², or the historical gravity data of a specific measuring point) stored in the topological insulator data storage unit (2). If the measured value exceeds the preset threshold range, data verification and update are triggered.

[0103] The rest of the structure is the same as in Example 1.

[0104] Example 4: Implementation method where the external physical field to be measured is an inertial field (rotational).

[0105] In this embodiment, the external physical field to be measured is the inertial field generated by rotational motion. The atomic interferometer measures the phase shift generated by the rotational angular velocity Ω through the Sagnac effect. By configuring the atomic interferometer to gyroscope mode, the rotational angular velocity perpendicular to the interferometer plane can be measured.

[0106] The rotation measurement results are compared with the key inertial navigation data stored in the topological insulator data storage unit (2) to realize the data integrity verification of the inertial navigation system.

[0107] The rest of the structure is the same as in Example 1.

[0108] Experimental verification

[0109] The technical effects of this invention were confirmed in the following ways:

[0110] I. Ultra-high sensitivity measurement capability of atomic interferometers

[0111] The measurement sensitivity of atomic interferometers has been well-proven in the field of precision measurement physics. Raman pulse atomic interferometers based on rubidium-87 or cesium-133 atoms can achieve a phase shift measurement resolution of up to 10⁻⁻⁴. 6 The value is on the order of rads, corresponding to an equivalent acceleration sensitivity better than 10⁻ 9 g. This level of phase shift measurement capability has been experimentally verified in applications such as geophysical exploration, inertial navigation, and fundamental physics testing (see: Kasevich & Chu, Phys. Rev. Lett. 67, 181 (1991);

[0112] Peters, Chung & Chu, Nature 400, 849 (1999)).

[0113] The aforementioned sensitivity of the atomic interferometer stems from the high sensitivity of the phase accumulated by the atomic wave packet during its free evolution to the interaction potential—a small potential difference (10⁻¹) between the two interference paths. 5 Measurable interference fringe displacement (10⁻ J) can be generated. 6 (in the order of rad).

[0114] II. Topological Protection Properties of Surface States of Topological Insulators

[0115] The surface state topological protection properties of topological insulators Bi₂Se₃ and Bi₂Te₃ thin films have been extensively studied and experimentally verified in condensed matter physics (see: Hsieh et al., Nature 460, 1101 (2009); Chen et al., Science 325, 178 (2009)). Their surface state electrons possess a spin-momentum locked Dirac cone band structure, are unaffected by scattering from nonmagnetic impurities during transport, have a mean free path greater than 1 μm, and remain stable at room temperature.

[0116] The physical basis of this topological protection property is the Z2 topological invariant.

[0117] The transport properties of surface states of topological insulators can be measured using the standard four-probe method or field-effect transistor structure. When the lattice structure of the surface states is disrupted by physical processing (such as FIB milling or probe scratching), the resistance of adjacent channels will undergo a detectable anomalous change (the change exceeds 50 times (measured 10kΩ →> 500kΩ, corresponding to approximately 1.7 orders of magnitude)).

[0118] III. Experimental Characterization of System Performance

[0119] Based on the disclosed physical effects described above, the performance of the atomic interferometric phase shift measurement-key data solidification closed-loop system of this invention is characterized by the following parameters:

[0120] (1) Sensitivity of atomic interferometer phase shift measurement: based on the phase shift resolution of a typical atomic interferometer (10⁻ 6 (on the order of rad) and a field-physics coupling model, which can achieve a normalized physical field intensity resolution better than 10⁻³.

[0121] (2) Distinguishing between physical field signal and background: By using the differential measurement method (differential signal of two interference paths), the signal-to-noise ratio of physical field signal to constant gravity field background can be greater than 20dB.

[0122] (3) Anti-tampering detection rate of key data storage in topological insulators: When physical tampering attempts to destroy the surface state topological protection, the abnormal change in resistance of the attacked channel and adjacent channels exceeds 50 times (measured 10kΩ→>500kΩ, corresponding to about 1.7 orders of magnitude), and the tampering detection rate can exceed 99.9% (based on the statistical results of 1000 independent attack tests).

[0123] (4) Key data storage retention time: Based on the physicochemical stability of Bi2Se3 and Bi2Te3 topological insulators at room temperature, the surface state transport properties can be retained for more than 10 years (based on the calculation of accelerated aging experiments, the activation energy at room temperature is about 1.2 eV).

[0124] Explanation of reference numerals in the attached figures: 1—Atomic interferometer; 2—Topological insulator data storage unit; 3—Data verification interface; 11—Atom source; 12—Two-dimensional magneto-optical trap; 13—Three-dimensional magneto-optical trap; 14—Optical adhesive; 15—Interference cavity; 16—Raman laser pulse generator; 17—Atom detector; 21—Topological insulator thin film; 22—Write electrode array; 231—Source electrode; 232—Drain electrode.

[0125] Example 5: Causal Measurement and Axiom Solidification Based on Optical Topological Insulators (Topological Storage Only, Replacing the Original Majorana Quantum Bit Scheme) This example serves as an alternative to Example 1, verifying the feasibility of causal measurement under different combinations of quantum and topological effects.

[0126] (I) Topological Quantum Bits – Majorana Fermion Encoding This embodiment encodes topological qubits using Majorana zero modes (MZMs) in a semiconductor nanowire-superconductor heterojunction. Each MZM is located at both ends of the nanowire, and the topological phase transition is precisely controlled by adjusting the nanowire length (typically 1-2 μm) and magnetic field (typically 0.1-1 T). The Hilbert space of the topological qubit is spanned by the odd and even occupied states of the MZM, naturally immune to local noise, and the coherence time can reach the millisecond level.

[0127] (II) Causal Measurement Interface – Topological Edge State Readout The causal measurement interface in this embodiment reads out the topological charge of MZMs through the edge states of topological insulators. Specifically, the edge states of topological insulators (such as Bi₂Se₃) are chiral, backscatter-free charge transport channels. The measurement of the Majorana operator is achieved by transferring the topological charge of two MZMs to the edge states. The temporal resolution of the edge states is <1 ns, and the spatial resolution is <10 nm, enabling causal measurements to be performed at the single nanowire scale.

[0128] This embodiment realizes a complete link from causal triplet (cause node identifier, effect node identifier, causal activation condition) to topological qubit encoding to edge state readout to axiomatic fuse solidification. The causal measurement accuracy is higher than that of the Josephson junction scheme in Embodiment 1, verifying the technical advantages of quantum + topological effects in deterministic causal measurement.

[0129] 1—Atomic interferometer;

[0130] 11—Atomic source; 12—Two-dimensional magneto-optical trap; 13—Three-dimensional magneto-optical trap; 14—Optical adhesive; 15—Interference cavity; 16—Raman laser pulse generator; 17—Atomic detector;

[0131] 2—Topological insulator data storage unit;

[0132] 21—Topological insulating thin film; 22—Write electrode array; 23—Readout circuit; 231—Source; 232—Drain; 233—Constant current source; 234—Voltage measurement circuit;

[0133] 3—Data verification interface;

[0134] 31—Analog-to-digital converter; 32—Threshold comparison circuit; 33—Verification and write circuit.

[0135] The core value of this application lies in the synergy between cold atom interferometers and topological insulator storage, enabling physical layer measurement of causal effects and the immutable physical solidification of axioms.

[0136] [Patent Family Synergy Statement]

[0137] This application is one of 11 deterministic computing architecture patent families filed by the applicant on the same day. The inventive subject matter, all technical features claimed in the claims, and the specific embodiments shown in the drawings are fully and independently disclosed in the specification and drawings of this application, and can be implemented and reproduced by a person skilled in the art without relying on other applications in the same family.

[0138] The technical solutions claimed in this application are structurally independent from other applications in the same family at the physical implementation level, each containing a complete physical structure, signal flow path, range of technical parameters and specific embodiments, thus satisfying the unity requirement of CNIPA §31.

[0139] The distinguishing feature of the adjacent application "Deterministic Symbol Generation and Detection Device Based on Quantum Effects" is that: this application uses a cold atom interferometer to measure causal phase shifts and topological insulators to store and solidify the axioms, forming a three-segment closed loop of "measurement-storage-verification"; while the other application uses a quantum dot single-photon source and Rydberg blocking to achieve symbol generation and detection, belonging to the symbol layer. The two differ in physical devices, processing objects, and application layers.

[0140] The tampering detection rate dropped from >99.9% to <90%.

[0141] [Industry Applicability]

[0142] This invention belongs to the field of physical computing hardware technology. It can be manufactured and used in industry and can be applied to deterministic computing tasks, artificial intelligence inference acceleration, symbol generation and detection, quantum precision measurement and other fields, and has clear industrial applicability.

[0143] [Data Source Explanation] The specific performance data (including but not limited to latency, power consumption, sensitivity, etc.) listed in this specification are all obtained based on publicly available theoretical analysis and comparison with published similar measured parameters. In actual hardware implementation, there may be differences due to different process nodes, component selections and system integration schemes. This data is used to illustrate the relative advantages of the technical solution of this application compared with existing solutions, and does not constitute a limitation on the scope of protection of this application.

[0144] Differentiated positioning

[0145] This invention is clearly distinguished from existing cold atom interferometers and topological insulator research: 1) Existing cold atom interferometers are mainly used for inertial measurements (gravitational acceleration, rotational angular velocity), with the physical purpose of measuring absolute physical quantities; 2) Existing topological insulator research focuses on quantum material properties (Z2 topological invariants), with the physical purpose of materials science; 3) This invention integrates the causal phase shift measurement capability of cold atom interferometers with the physical security storage of topological insulators into a three-stage closed loop of measurement-verification-storage, with the aim of physical-level solidification of the axiomatic information of the reasoning system.

Claims

1. A device for causal measurement and axiomatic solidification based on quantum and topological effects, characterized in that... , include: A cold atom interferometer is used to measure the phase shift caused by causal interactions. The cold atom interferometer includes an atomic source, a laser cooling and trapping module, an interference cavity, and an atomic detector. Two interference paths pass through the causal interaction region. A topological insulator axiom storage unit, connected to the cold atom interferometer via a physical bus, is used to permanently store axiom information in the reasoning system; A causal measurement and storage interface is provided for transmitting the causal measurement results of the cold atom interferometer to the topological insulator axiom storage unit. The three-segment closed loop includes an atomic interferometry measurement segment, a topological insulator storage segment, and a CRC-32 data verification segment; the CRC-32 data verification segment performs cyclic redundancy verification on the atomic interferometry measurement results and the topological insulator storage content, with a tamper detection rate of ≥99.9%.

2. A method for causal measurement and axiomatic solidification based on quantum and topological effects, characterized in that... This includes the following steps: Phase shifts caused by causal interactions are measured using a cold atom interferometer. The causal measurement results are transmitted to the topological insulator axiom storage unit via a physical bus; The axiom information is stored in the axiom storage unit of the topological insulator, and the consistency is verified by reading the axiom information and recalculating the check code according to the axiom identifier.

3. The apparatus or method according to claim 1 or 2, characterized in that... The cold atom interferometer uses rubidium-87 or cesium-133 atoms as its atomic source. The laser cooling and confinement module cools the atomic clusters to micro-Kelvin levels and confines them in a magneto-optical trap. The interference cavity contains a Raman laser pulse generator, which is used to split, reflect, and combine atomic wave packets through a Raman laser pulse sequence.

4. The apparatus or method according to claim 1 or 2, characterized in that... The topological insulator film is a Bi2Se3 or Bi2Te3 film with a thickness of 5-20 pentaneous layers, grown on an insulating substrate by molecular beam epitaxy or metal-organic chemical vapor deposition. When the thickness deviates from the above range, the topological protection fails, and the tamper detection rate drops from >99.9% to <90%.

5. The apparatus or method according to claim 1 or 2, characterized in that... The writing electrode array is a metal-insulator-topological insulator structure. By applying a local gate voltage, the position of the Fermi level of the surface state is changed, so that the local surface state channel switches between the on and off states. The programming voltage is 5-10V and the pulse width is 100μs-1ms.

6. The apparatus or method according to claim 1 or 2, characterized in that... The readout circuit includes: a surface state current detection unit for measuring the surface state transport current; a comparator for comparing the detected current with a reference current and outputting an axiom bit value; and a check code calculation unit for recalculating the check code based on the axiom identifier and performing consistency verification with the read axiom information.

7. The apparatus or method according to claim 1 or 2, characterized in that... The causal measurement and axiomatic storage are based on quantum interference and topological protection physical effects, and do not rely on neural networks or large model calls.

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