Display panel and display device

Abstract

The application provides a display panel and a display device. One end of a crack detection wire of the display panel is used for receiving a first signal, and the other end is used for outputting a second signal. A screen detection unit is used for outputting a third signal in a screen detection stage. A switch piece is used for receiving the second signal and the third signal in the screen detection stage, and is used for turning off or turning on one of the second signal and the third signal, and transmitting the potential of the other to a data signal wire. A module detection unit is connected between the screen detection unit and the switch piece, and is used for outputting a fourth signal in a module detection stage. The switch piece is also used for obtaining the second signal and the fourth signal in the module detection stage, and is used for turning off or turning on one of the second signal and the fourth signal, and transmitting the potential of the other to the data signal wire. The circuit such as the crack detection wire and the switch piece is shared in the screen detection stage and the module detection stage, which is beneficial to reducing the space occupation, and is further beneficial to realizing the narrow frame of the display panel.

Description

Technical Field

[0001] This application belongs to the field of display technology, and in particular relates to a display panel and display device. Background Technology

[0002] Active-matrix organic light-emitting diode (AMOLED) and flat panel display devices based on light-emitting diode (LED) technologies are widely used in various consumer electronics products such as mobile phones, televisions, laptops, and desktop computers due to their advantages such as high image quality, power saving, thin body and wide range of applications, becoming the mainstream of display devices.

[0003] However, the performance of current display products needs to be improved. Summary of the Invention

[0004] The purpose of this application is to provide a display panel and display device that aims to solve the problem of low performance of display products in traditional technologies.

[0005] A first aspect of this application provides a display panel having a screen detection stage and a module detection stage, the display panel comprising:

[0006] A substrate having a display area and a non-display area disposed thereon, the non-display area surrounding the display area, and pixels and data signal lines electrically connected to each other disposed within the display area;

[0007] A crack detection trace is provided in the non-display area, and one end of the crack detection trace is used to receive a first signal, and the other end of the crack detection trace is used to output a second signal.

[0008] The screen detection unit is used to output a third signal during the screen detection stage;

[0009] A switching element is connected to the data signal line in the display area. The switching element is used to receive the second signal and the third signal during the screen detection phase, and to turn off or on one of the second signal and the third signal, and to transmit the potential of the other signal to the data signal line.

[0010] A module detection unit is connected between the screen detection unit and the switch, and is used to output a fourth signal during the module detection stage. The switch is also used to acquire the second signal and the fourth signal during the module detection stage, and to turn off or on one of the second signal and the fourth signal, and to transmit the potential of the other signal to the data signal trace.

[0011] In some embodiments of this application, one of the second signal and the third signal is a gate signal; or, one of the second signal and the fourth signal is a gate signal.

[0012] The gate signal is used to control the switching device to turn off and on; the display panel also has a non-detection phase, in which the gate signal is a high-level signal and the switching device is turned off based on the gate signal; in the screen detection phase and the module detection phase, the gate signal is a low-level signal and the switching device is turned on based on the gate signal.

[0013] In some embodiments of this application, during the screen detection stage, the gate of the switching element is used to receive the third signal, and the source of the switching element is used to receive the second signal.

[0014] In some embodiments of this application, during the module detection stage, the gate of the switching element is used to receive the second signal, and the source of the switching element is used to receive the fourth signal.

[0015] In some embodiments of this application, the number of the switching components is at least two, the number of the data signal lines is at least two, and the switching components and the data signal lines are connected in a one-to-one correspondence.

[0016] In some embodiments of this application, the switching device is a P-channel MOS transistor or a P-type thin-film transistor.

[0017] In some embodiments of this application, at least two crack detection traces are provided, and the two crack detection traces are respectively located on opposite sides of the display area.

[0018] In some embodiments of this application, the two crack detection traces are arranged symmetrically to each other.

[0019] In some embodiments of this application, the crack detection trace includes at least one of a straight trace, an arc trace, and a broken trace.

[0020] A second aspect of this application also provides a display device, including the display panel as described above.

[0021] The beneficial effects of this invention compared to the prior art are as follows: The aforementioned display panel and display device include a screen detection stage and a module detection stage. The display panel includes a substrate, crack detection traces, a screen detection unit, a switching element, and a module detection unit. A display area and a non-display area are disposed on the substrate, with the non-display area surrounding the display area. Pixels and data signal lines are electrically connected to each other within the display area. The crack detection traces are disposed in the non-display area, with one end of the traces used to receive a first signal and the other end used to output a second signal. The screen detection unit outputs a third signal during the screen detection stage. The switching element is connected to the data signal line of the display area. The device is used to receive a second signal and a third signal during the screen detection stage, and to turn off or on one of the second signal and the third signal, and to transfer the potential of the other signal to the data signal trace. The module detection unit is connected between the screen detection unit and the switching device, and is used to output a fourth signal during the module detection stage. The switching device is also used to acquire the second signal and the fourth signal during the module detection stage, and to turn off or on one of the second signal and the fourth signal, and to transfer the potential of the other signal to the data signal trace. In this application, circuits such as crack detection traces and switching devices are shared between the screen detection stage and the module detection stage, which helps to reduce space occupation and thus helps to achieve a narrow bezel for the display panel. Attached Figure Description

[0022] Figure 1 This is a schematic diagram of the structure of a display panel provided in one embodiment of this application;

[0023] Figure 2 A schematic diagram of the frame structure of a display panel provided in an embodiment of this application;

[0024] Figure 3 This is a schematic diagram of the structure of a display panel provided in another embodiment of this application;

[0025] Figure 4 This is a schematic diagram of the structure of a display panel provided in another embodiment of this application.

[0026] Specific element symbol explanations: 10-substrate, 11-non-display area, 100-display area, 110-pixel, 120-data signal trace, 200-switch, 300-crack detection trace, 400-screen detection unit, 500-module detection unit. Detailed Implementation

[0027] To make the technical problems, technical solutions, and beneficial effects to be solved by this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of this application and are not intended to limit the scope of this application. It should be noted that when an element is referred to as being "disposed on" another element, it can be directly on or indirectly on that other element. When an element is referred to as being "connected to" another element, it can be directly connected to or indirectly connected to that other element.

[0028] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this application, "multiple" means two or more, unless otherwise explicitly specified.

[0029] It's important to understand that in the manufacturing and production of display panels, accurately detecting cracks on the periphery of the panel is crucial for ensuring product quality and performance. Currently, the industry widely uses PCD (Panel Crack Detection) traces for this detection. Specifically, this involves testing the resistance between the two ends of the PCD trace, namely PCD_L (panel crack detection - left side) and PCD_R (panel crack detection - right side), and judging whether cracks exist around the display panel based on the change in resistance value. This is because when a crack appears on the periphery of the display panel, the resistance of the PCD trace will change accordingly, thus allowing the crack problem to be identified by detecting the resistance.

[0030] Meanwhile, to accurately determine the impact of different process stages on PCD traces, two inspection methods are generally used in related technologies: screen inspection and module inspection. Screen inspection is mainly an inspection operation performed on the screen itself after the display panel screen manufacturing is completed; module inspection is an inspection of the entire module after the screen and other components are assembled. However, since screen inspection and module inspection are independent inspection processes, each requires a complete inspection solution. This means that two different circuits need to be designed on the display panel screen, one for screen inspection and one for module inspection. From a circuit layout perspective, this design significantly increases the number of traces around the screen. A large number of traces not only occupy the already limited space around the screen but also greatly increase the complexity of the wiring.

[0031] In today's display industry, narrow bezel design has become the mainstream trend. Using two sets of PCD circuits severely conflicts with this concept. Excessive wiring significantly reduces the space available for the display panel bezel, making further narrowing of the bezel extremely difficult, directly impacting the product's market competitiveness. For example, in mobile devices such as smartphones and tablets, narrow bezel design can provide a larger display area within a limited body size, but existing PCD circuit designs limit the realization of this advantage.

[0032] Furthermore, using two sets of PCDs also increases production costs. On the one hand, more circuit components and traces mean more raw materials are needed, directly increasing raw material costs. On the other hand, the difficulty and complexity of the manufacturing process increase accordingly to arrange these complex circuits, requiring more precise manufacturing equipment and higher technical requirements, which undoubtedly increases the cost input in the production process. For example, in the production process, more refined photolithography processes are needed to fabricate these complex circuits, which not only requires higher precision from the photolithography equipment but also increases the scrap rate in the production process, further increasing production costs.

[0033] Based on this, this application makes improvements to the relevant display panel and display device.

[0034] Please see Figure 1 and Figure 2 , Figure 1 A schematic diagram of the display panel in this embodiment is shown. Figure 1 A schematic diagram of the frame structure of the display panel in this embodiment is shown. The display panel in this embodiment has a screen detection stage and a module detection stage. The display panel includes a substrate 10, a crack detection trace 300, a screen detection unit 400, a switch 200, and a module detection unit 500.

[0035] A display area 100 and a non-display area 11 are disposed on the substrate 10. The non-display area 11 surrounds the display area 100. Pixels 110 and data signal lines electrically connected to each other are disposed within the display area 100. A crack detection trace 300 is disposed in the non-display area 11, with one end of the crack detection trace 300 used to receive a first signal and the other end used to output a second signal. A screen detection unit 400 is used to output a third signal during the screen detection stage. A switch 200 is connected to the data signal line of the display area 100 and is used for... During the screen detection phase, the second and third signals are received, and the potential of the other signal is transmitted to the data signal trace 120 based on whether one of the second and third signals is turned off or on. The module detection unit 500 is connected between the screen detection unit 400 and the switch 200, and is used to output a fourth signal during the module detection phase. The switch 200 is also used to acquire the second and fourth signals during the module detection phase, and transmit the potential of the other signal to the data signal trace 120 based on whether one of the second and fourth signals is turned off or on.

[0036] It's important to clarify that the panel inspection stage refers to the process of inspecting the panel itself after its manufacturing is complete, but before it's assembled into a module with other components. This stage aims to identify potential problems that may have arisen during the manufacturing process, particularly cracks around the panel perimeter. The module inspection stage, on the other hand, involves inspecting the entire module after it's assembled with other components. This inspection checks for any issues such as cracks in the display panel caused by various factors during the assembly process and the module's overall operation.

[0037] Understandably, the substrate 10 serves as the basic support structure for the display panel, dividing it into a display area 100 and a non-display area 11. The display area 100 is used to realize the image display function, and the internal pixels 110 and data signal lines are electrically connected to each other. Driven by the display signal, the pixels 110 emit light to present an image; the non-display area 11 provides layout space for other functional components and is the area where the crack detection traces 300 are set.

[0038] The crack detection trace 300 is located in the non-display area 11. One end receives the first signal, and the other end outputs the second signal. When a crack appears on the periphery of the display panel, its resistance changes, thereby altering the characteristics of the second signal. This serves as a key basis for determining whether a crack exists on the periphery of the display panel and is an important component for converting physical crack phenomena into changes in electrical signals.

[0039] The screen detection unit 400 outputs a third signal during the screen detection stage. This signal works in conjunction with the second signal on the switch 200 for circuit control and signal transmission during the screen detection stage, and assists in judging the screen status.

[0040] The switch 200 is connected to the data signal line of the display area 100. During the screen detection phase, it receives the second and third signals, determines its own turn-off or turn-on based on the state of one of these two signals, and transmits the potential of the other to the data signal trace 120. During the module detection phase, it receives the second and fourth signals and operates accordingly based on the signal states. The switch 200 serves the functions of signal conversion and circuit on / off control.

[0041] The module detection unit 500 outputs a fourth signal during the module detection stage, which, together with the second signal, controls the switch 200 to realize the function of detecting cracks in the display panel during the module detection stage.

[0042] Currently, the module detection unit 500 and screen detection unit 400 in display panels use different circuits for PCD detection, which reduces the overall space of the display panel. However, in this application, circuits such as the crack detection trace 300 and the switch 200 are shared between the screen detection stage and the module detection stage. This helps to reduce the space occupied in the non-display area 11 by reducing the number of traces, thereby providing support for achieving a narrow bezel in the display panel. Furthermore, sharing circuits reduces the number of circuit components and traces used, directly reducing raw material procurement costs, while the simplified circuit layout reduces the complexity of the manufacturing process.

[0043] Please refer to the embodiments described in this application. Figure 1 In this embodiment, one of the second and third signals is a gate signal; or, one of the second and fourth signals is a gate signal; the gate signal is used to control the switching device 200 to turn off and on; the display panel also has a non-detection phase, in which the gate signal is a high-level signal and the switching device 200 is turned off based on the gate signal; in the screen detection phase and the module detection phase, the gate signal is a low-level signal and the switching device 200 is turned on based on the gate signal.

[0044] Understandably, during the non-detection phase, the display panel is in normal display operation and no crack detection is performed. At this time, the gate signal is a high-level signal. Taking a common TFT (thin-film transistor) switch 200 as an example, when a high-level signal is applied to the gate, the electric field distribution inside the transistor prevents the formation of a channel between the source and drain, thus cutting off the current path, and the switch 200 is in the off state. This off state ensures that the data signal lines of the display area 100 are not interfered with by crack detection-related signals, guaranteeing that the display panel displays images normally and stably.

[0045] When the screen detection stage begins, the crack detection trace 300 starts working. Assume the first signal is a stable voltage signal, transmitted through the crack detection trace 300. If there are no cracks on the periphery of the display panel, the resistance of the crack detection trace 300 is within the normal range, and the output second signal also remains at a specific level. At this time, the screen detection unit 400 outputs a third signal, and one of the second and third signals is a gate signal (taking the second signal as the gate signal as an example). Since it is in the detection stage, the gate signal is a low-level signal. Under the action of the low-level gate signal, the electric field inside the TFT switching device 200 changes, a conductive channel is formed between the source and drain, and the switching device 200 is turned on. The turned-on switching device 200 transmits the potential of the third signal to the data signal trace 120. By monitoring the potential change of the data signal trace 120, it is possible to determine whether there is a crack in the screen. If there is a crack in the screen, the resistance of the crack detection trace 300 changes, the level of the second signal changes, and the conduction state and the potential transmitted by the switch 200 also change accordingly, which is then identified by the detection system.

[0046] The working principle of the module detection stage is similar to that of the screen detection stage. During module detection, the module detection unit 500 outputs a fourth signal, and one of the second and fourth signals is also a gate signal (taking the second signal as the gate signal as an example). When in module detection mode, the gate signal is also a low-level signal, and the switch 200 is turned on. At this time, the second signal changes due to the resistance change of the crack detection trace 300. The switch 200 transmits the potential of one of the signals to the data signal trace 120 based on the states of the second and fourth signals. By analyzing the potential change of the data signal trace 120, it is possible to determine whether there is a crack in the display panel in the module state. For example, if a component in the display panel module is improperly installed, causing a minor crack due to pressure on the outer edge of the display panel, the resistance of the crack detection trace 300 changes, the second signal changes, and the potential transmitted by the switch 200 also changes accordingly. The detection system then determines the crack problem based on this.

[0047] This application embodiment effectively controls the gate signal at different stages, enabling precise operation of the switching device 200 at different stages. During non-detection stages, it ensures the display panel displays normally without interference; during the screen detection and module detection stages, it accurately detects whether the display panel has cracks. This design not only improves the accuracy and reliability of detection but also reduces space occupation through shared circuitry, providing strong support for realizing a narrow bezel design for the display panel, while simultaneously reducing production costs and improving production efficiency.

[0048] In some embodiments of this application, please refer to Figure 3 , Figure 3 A schematic diagram of the structure of the display panel provided in this embodiment is shown; Figure 3In this embodiment, the Active Area is designated as region AA, the CT circuit is the screen detection unit 400, and the CT pad is the test pad. During the screen detection stage, the gate of the switching element 200 is used to receive the third signal, and the source of the switching element 200 is used to receive the second signal.

[0049] During the screen detection stage, the gate of the switching device 200 is used to receive the third signal, and the source is used to receive the second signal. Assume the first signal is a stable DC voltage signal transmitted through the crack detection trace 300. When there are no cracks around the display panel, the resistance of the crack detection trace 300 remains stable, and the second signal output from the crack detection trace 300 also remains within the normal voltage range.

[0050] The third signal output by the screen detection unit 400 plays a controlling role in the switching device 200 at this time. Since it is in the screen detection stage, the third signal is set to a specific low-level signal (i.e., PCD_SW is the VGL signal). When the gate of the switching device 200 receives this low-level third signal, according to the working principle of the transistor, the electric field inside the switching device 200 changes, causing a conductive channel to form between the source and drain, and the switching device 200 is in the on state.

[0051] At this time, the second signal received by the source of the switching element 200 is transmitted to the drain due to the conduction of the switching element 200, and then to the data signal trace 120. In the display area 100, the detection device can determine that the screen is currently in normal condition by monitoring the potential change of the data signal trace 120. However, when a crack appears on the periphery of the display panel, the crack will cause a change in the resistance of the crack detection trace 300. This change in resistance will change the level of the second signal. Even if the third signal is still a low-level signal used to turn on the switching element 200, the potential transmitted to the data signal trace 120 will change accordingly due to the change in the second signal. Once the detection device detects an abnormal change in the potential of the data signal trace 120, it can determine that there is a crack problem in the screen.

[0052] In some embodiments of this application, please refer to Figure 4 , Figure 4 A schematic diagram of the structure of the display panel provided in this embodiment is shown; during the module detection stage, the gate of the switch 200 is used to receive the second signal, and the source of the switch 200 is used to receive the fourth signal.

[0053] Understandably, when the display panel enters the module detection stage, the gate of the switching element 200 is used to receive the second signal, and the source is used to receive the fourth signal. Before detection begins, it is assumed that the first signal is a stable reference voltage signal, which is input to the crack detection trace 300. When there are no cracks on the periphery of the display panel, the resistance of the crack detection trace 300 is within the normal range, so the output second signal will be maintained at a specific level.

[0054] Simultaneously, the module detection unit 500 starts working and outputs a fourth signal. During the module detection stage, if the second signal is a low-level signal, this low-level second signal is input to the gate of the switching device 200. According to the operating characteristics of the transistor, when the gate receives a low-level signal, the internal physical structure of the switching device 200 changes, allowing a conductive channel to be formed between the source and drain, and the switching device 200 enters the on state.

[0055] At this time, the fourth signal received by the source of the switching device 200 can be smoothly transmitted to the drain through the switching device 200 due to the conduction of the switching device 200, and then transmitted to the data signal trace 120. In the display area 100, the detection device connected to it monitors the potential change of the data signal trace 120 in real time. If the potential is within the normal range, it can be determined that the display panel has not experienced any crack problems in the module state.

[0056] However, if a crack exists on the periphery of the display panel, the crack will change the resistance of the crack detection trace 300. This change in resistance directly causes a change in the level of the second signal. Even if the fourth signal remains stable, because the second signal becomes high, after the gate of the switching device 200 receives the high-level signal, the internal electric field changes, and the conductive channel between the source and drain cannot be formed, so the switching device 200 is in the off state. This prevents the fourth signal from being transmitted to the data signal trace 120, and the detection device detects an abnormal change in the potential of the data signal trace 120, thus determining that the display panel has a crack in the module state.

[0057] Please refer to the embodiments described in this application. Figure 3 and Figure 4 In this embodiment, the number of switch components 200 is at least two, the number of data signal lines is at least two, and the switch components 200 and data signal lines are connected in a one-to-one correspondence.

[0058] It is understood that, in this embodiment of the application, by setting multiple switches 200 and connecting them one-to-one with multiple data signal lines, not only can the presence of cracks in the display panel be accurately detected during the screen inspection stage and the module inspection stage, but the location of the cracks can also be located more precisely, providing more accurate information for subsequent repair and quality improvement.

[0059] Please refer to the embodiments described in this application. Figure 3 and Figure 4 In this embodiment, the switching device 200 is a P-channel MOS transistor or a P-type thin-film transistor.

[0060] Specifically, in this embodiment, multiple P-channel MOSFETs are used as switching devices 200, each connected to a corresponding set of data signal lines. During the screen detection stage, one end of the crack detection trace 300 receives a first signal, which is transmitted through the trace, and the other end outputs a second signal. The screen detection unit 400 then outputs a third signal.

[0061] For a P-channel MOSFET, its turn-on and turn-off characteristics are related to the voltage difference between the gate and source. When a third signal is input to the gate of the P-channel MOSFET as a gate signal, and a second signal is input to the source, during the detection phase (PCD_SW: VGL), the gate voltage is lower than the source voltage, satisfying the turn-on condition of the P-channel MOSFET. At this time, a conductive channel is formed inside the P-channel MOSFET, and the potential of the second signal can be transmitted to the corresponding display area 100 data signal line through the turned-on MOSFET.

[0062] If there are no cracks on the outer perimeter of the display panel, the resistance of the crack detection trace 300 will be stable, the second signal will maintain a normal level, and the potential transmitted to the data signal line will also be normal. In this case, the brightness of the pixel 110 corresponding to the data signal line can be observed to determine if the screen is normal. Conversely, if a crack exists, it will change the resistance of the crack detection trace 300, thus causing a change in the second signal level. This change, transmitted to the data signal line, can be observed to determine if there is a crack in the screen.

[0063] If a P-type thin-film transistor is used as the switching element 200, the principle is similar. During the screen detection stage, when the gate receives the third signal (low level, PCD_SW: VGL) and the source receives the second signal, the P-type thin-film transistor turns on, transferring the potential of the second signal to the data signal line. Similarly, the presence of cracks in the screen is determined by the change in the potential of the data signal line.

[0064] More specifically, during the module testing phase, the operating mode of the P-channel MOSFET or P-type thin-film transistor changes. At this time, the gate of the switching device 200 receives the second signal, and the source receives the fourth signal.

[0065] When in detection mode (PCD_SW: VGL), for the P-channel MOSFET, if the second signal is low, the fourth signal is a normal source input signal, the gate voltage is lower than the source voltage, the P-channel MOSFET is turned on, and the potential of the fourth signal can be smoothly transmitted to the data signal line. If there are no cracks on the periphery of the display panel module, the potential on the data signal line remains normal. At this time, the brightness of pixel 110 corresponding to the data signal line can be observed to determine if the screen is normal. If there are cracks, the level of the second signal will change due to the resistance change caused by the crack. When the second signal becomes high (the conduction condition is not met), the P-channel MOSFET is turned off, and the fourth signal cannot be transmitted to the data signal line. At this time, the brightness of pixel 110 corresponding to the data signal line can be observed to determine if there is a crack problem in the module.

[0066] The P-type thin-film transistor operates on a similar principle during the module testing phase. When the gate receives a low-level second signal (PCD_SW: VGL), the source conducts when it receives a fourth signal, transmitting the fourth signal potential. If the second signal abnormally rises due to a crack, the P-type thin-film transistor turns off, and the potential on the data signal line changes, which is used to determine whether a crack exists.

[0067] Please refer to the embodiments described in this application. Figure 1 In this embodiment, at least two crack detection lines 300 are provided, and the two crack detection lines 300 are respectively located on opposite sides of the display area 100.

[0068] It is understood that in this embodiment, two crack detection lines 300 are used, and the switching device 200 is a P-channel MOS transistor. The two crack detection lines 300 are crack detection line 300A and crack detection line 300B, which are respectively located on the left and right sides of the display area 100.

[0069] During the screen detection stage, the first signal is input to crack detection traces 300A and 300B respectively. When there are no cracks around the display panel, the resistance of both crack detection traces 300 is within the normal range, and the output second signals A and B also maintain normal level values.

[0070] The screen detection unit 400 outputs a third signal, which is input to the gate of each P-channel MOSFET. Second signals A and B are input to the sources of the corresponding P-channel MOSFETs. During the detection phase, because the gate voltage is lower than the source voltage, the P-channel MOSFETs are turned on. At this time, the potentials of second signals A and B are transmitted to the corresponding left and right data signal lines through the turned-on MOSFETs. The detection equipment monitors the potentials of these data signal lines; if the potentials on both sides are normal, it determines that the screen has no cracks.

[0071] If a crack appears on the left side of display area 100, the resistance of the crack detection trace 300A changes, causing a change in the level of the second signal A. Although the third signal still turns on the P-channel MOSFET on the left, the potential transmitted to the left data signal line becomes abnormal. Observing the abnormal potential on the left data signal line while the right side is normal, it can be determined that the crack is located on the left side of display area 100. Similarly, if a crack appears on the right side, the potential on the right data signal line will be abnormal, thus locating the crack on the right side.

[0072] During the module detection stage, crack detection traces 300A and 300B also receive the first signal and output the second signal A and the second signal B. The module detection unit 500 outputs a fourth signal, which is input to the source of the P-channel MOSFET. The second signal A and the second signal B are respectively input to the gate of the corresponding P-channel MOSFET.

[0073] When in detection mode, if the second signal A and the second signal B are low, the conduction condition of the P-channel MOSFET is met, the MOSFET is turned on, and the potential of the fourth signal is transmitted to the corresponding data signal line through the turned-on MOSFET. If there are no cracks around the display panel module, the potential on the data signal line remains normal.

[0074] If a crack appears on the right side of display area 100, the resistance of crack detection trace 300B changes, the second signal B becomes high, the P-channel MOSFET on the right side turns off, and the fourth signal cannot be transmitted to the data signal line on the right side, resulting in an abnormal potential on the data signal line. Observing this abnormal potential on the right data signal line while the left side remains normal allows us to determine that the crack is located on the right side of display area 100. This method allows for more precise location of the crack on either side of display area 100.

[0075] In some embodiments of this application, two crack detection traces 300 are arranged symmetrically to each other.

[0076] In some embodiments of this application, the crack detection trace 300 includes at least one of a straight trace, an arc trace, and a broken trace.

[0077] Understandably, the curved shape of curved traces may give them an advantage in detecting cracks in certain directions or locations. Zigzag traces may be more effective at detecting cracks in areas of complex stress. For example, if a corner of the display panel is prone to stress concentration leading to cracks, setting a zigzag crack detection trace 300 near that corner can more accurately detect the crack's appearance. By using straight traces in relatively flat areas of the display area 100 and curved traces in areas that need to bypass other components, the various trace types work together to comprehensively cover the non-display area 11 of the display panel, improving the accuracy and comprehensiveness of screen detection.

[0078] Furthermore, in order to better implement the display panel in any of the above embodiments, based on the above display panel, this application embodiment also provides a display device, including the display panel as described above.

[0079] In some embodiments, the display device may be a mobile phone, tablet, desktop computer, laptop computer, wearable device, automotive screen, sensor device, etc.

[0080] In the above embodiments, the descriptions of each embodiment have different focuses. Parts not described in detail in a particular embodiment can be found in the relevant descriptions of other embodiments. The basic concepts have been described above. Obviously, for those skilled in the art, the detailed disclosure above is merely illustrative and does not constitute a limitation of this application. Although not explicitly stated herein, those skilled in the art may make various modifications, improvements, and corrections to this application. Such modifications, improvements, and corrections are suggested in this application, and therefore still fall within the spirit and scope of the exemplary embodiments of this application.

[0081] Furthermore, this application uses specific terms to describe embodiments of the application. For example, "an embodiment," "one embodiment," and / or "some embodiments" refer to a particular feature, structure, or characteristic associated with at least one embodiment of the application. Therefore, it should be emphasized and noted that "an embodiment," "one embodiment," or "an alternative embodiment" mentioned twice or more in different locations in this specification do not necessarily refer to the same embodiment. In addition, certain features, structures, or characteristics in one or more embodiments of the application can be appropriately combined.

[0082] The above-described embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application, and should all be included within the protection scope of this application.

Claims

1. A display panel, characterized in that, The display panel includes a screen inspection stage and a module inspection stage. A substrate having a display area and a non-display area disposed thereon, the non-display area surrounding the display area, and pixels and data signal lines electrically connected to each other disposed within the display area; A crack detection trace is provided in the non-display area, and one end of the crack detection trace is used to receive a first signal, and the other end of the crack detection trace is used to output a second signal. The screen detection unit is used to output a third signal during the screen detection stage; A switching element is connected to the data signal line in the display area. The switching element is used to receive the second signal and the third signal during the screen detection phase, and to turn off or on one of the second signal and the third signal, and to transmit the potential of the other signal to the data signal line. A module detection unit is connected between the screen detection unit and the switch, and is used to output a fourth signal during the module detection stage. The switch is also used to acquire the second signal and the fourth signal during the module detection stage, and to turn off or on one of the second signal and the fourth signal, and to transmit the potential of the other signal to the data signal trace.

2. The display panel according to claim 1, characterized in that, One of the second signal and the third signal is a gate signal; or, one of the second signal and the fourth signal is a gate signal. The gate signal is used to control the switching device to turn off and on; the display panel also has a non-detection phase, in which the gate signal is a high-level signal and the switching device is turned off based on the gate signal; in the screen detection phase and the module detection phase, the gate signal is a low-level signal and the switching device is turned on based on the gate signal.

3. The display panel according to claim 2, characterized in that, During the screen detection phase, the gate of the switching device is used to receive the third signal, and the source of the switching device is used to receive the second signal.

4. The display panel according to claim 2, characterized in that, During the module detection phase, the gate of the switching device is used to receive the second signal, and the source of the switching device is used to receive the fourth signal.

5. The display panel according to claim 2, characterized in that, The number of the switching components is at least two, the number of the data signal lines is at least two, and the switching components and the data signal lines are connected in a one-to-one correspondence.

6. The display panel according to any one of claims 2 to 5, characterized in that, The switching device is a P-channel MOS transistor or a P-type thin-film transistor.

7. The display panel according to claim 1, characterized in that, The crack detection traces are configured to be at least two, and the two crack detection traces are respectively located on opposite sides of the display area.

8. The display panel according to claim 7, characterized in that, The two crack detection traces are arranged symmetrically to each other.

9. The display panel according to claim 7 or 8, characterized in that, The crack detection traces include at least one of straight traces, curved traces, and broken traces.

10. A display device, characterized in that, Includes the display panel as described in any one of claims 1 to 9.

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