Rectifier bridge single diode independent test tool

Abstract

This invention discloses an independent test fixture for a single diode of a rectifier bridge, relating to the field of power electronic device testing technology. It includes a housing; a cover, one side of which is hinged to the top of the housing, and the other side locked to the housing by screws, forming a box structure; a rectifier bridge adapter socket assembly disposed on the cover for inserting the rectifier bridge under test; a first switch and a second switch, both single-pole double-throw switches, disposed side-by-side on the cover; a first test port and a second test port disposed on the cover for connecting external testing equipment; the common terminal of the first switch is connected to the first test port, and the two sets of stationary contacts of the first switch are respectively used to connect to the two DC pins of the rectifier bridge. This invention features a simple structure, convenient operation, high testing accuracy, strong adaptability, and combines professional high-precision testing with general-purpose simple testing capabilities.

Description

Technical Field

[0001] This invention relates to the field of power electronic device testing technology, specifically to an independent testing fixture for a single diode of a rectifier bridge. Background Technology

[0002] A rectifier bridge consists of four independent diodes integrated in a bridge package. It is widely used in switching power supplies, industrial rectifiers, and power electronic terminals, and its reliability directly determines the overall operational stability of the equipment. In product screening, R&D reliability verification, and after-sales maintenance and testing, each of the four diodes inside the rectifier bridge must be independently tested for parameters such as forward voltage drop, reverse leakage current, and reverse withstand voltage. This allows for precise identification of issues such as single-diode degradation, leakage, latent failures, and excessive parameter dispersion, enabling accurate quality assessment of the rectifier bridge.

[0003] The pin pairings of the four diodes in the rectifier bridge are intertwined, and the test circuits are not interchangeable. The industry's conventional testing modes are divided into three categories: manual point-to-point testing, automated relay matrix testing, and manual testing of multiple discrete switches. Manual testing relies on operators memorizing the pin pairing logic and frequently switching probes, which is prone to missed tests, false tests, and parameter judgment deviations. Automated testing equipment is complex in structure, expensive, and has poor portability, making it unsuitable for lightweight scenarios such as laboratory sample testing and field repair. Manual multi-switch discrete fixtures are the mainstream improvement solution in the industry, but they have inherent defects such as component redundancy, susceptibility to misoperation, and poor adaptability. The industry has long lacked a portable fixture with a minimalist structure, zero false tests, and the ability to balance professional high-precision testing with general simple testing.

[0004] The existing technology mainly uses a four-switch independent selection rectifier bridge test fixture and a manual probe switching test method. Its specific technical defects are as follows: Traditional manual testing methods are cumbersome and have a low error tolerance. Existing technologies rely entirely on manual memorization of pin pairing relationships, requiring repeated probe swapping for four tests. This easily leads to problems such as incorrect pin pairing, disordered test order, missed tests, and misjudgments, resulting in poor test consistency and making them unsuitable for batch comparison testing and parameter consistency screening.

[0005] Traditional four-switch discrete selection structures have high component redundancy, high cost, and large size. Existing improved manual tooling generally adopts a four-switch independent selection structure with "one tube and one switch", which requires four independent switching devices. This results in a large number of devices, complex wiring, cumbersome assembly, high failure rate, and a large overall tooling size with poor portability.

[0006] Existing switch selection fixtures suffer from operational redundancy, complex logic, and susceptibility to misoperation. The four-switch structure carries the risk of multiple switches being accidentally activated simultaneously, easily creating invalid paths. In some scenarios, test circuit disorder can occur, requiring additional complex interlocking circuits or strict manual operation procedures, resulting in low system reliability.

[0007] Automated relay matrix equipment is expensive and has poor applicability. Existing automatic testing equipment relies on microcontrollers, multi-channel relay arrays, and control circuits to achieve automatic selection. It has a complex structure, high cost, and large size, and is only suitable for mass production testing on production lines. It is not suitable for laboratory research and development, small sample screening, or portable testing scenarios in maintenance sites.

[0008] Traditional rectifier bridge test bases suffer from poor compatibility and insufficient contact stability. Existing fixtures are mostly fixed single-pitch socket bases, which can only be used with single-package rectifier bridges; a few adjustable bases use a sliding clamping structure, which is prone to problems such as slippage, contact resistance drift, and arcing after long-term use. The test data repeatability is poor, and the disassembly and assembly are cumbersome and the durability is low. Summary of the Invention

[0009] In view of the above-mentioned shortcomings and deficiencies of the prior art, the present invention provides a single diode independent test fixture for a rectifier bridge to solve the problems mentioned in the background art.

[0010] To achieve the above objectives, the present invention provides the following technical solution: a rectifier bridge single diode independent test fixture, comprising: outer shell; The cover is hinged to the top of the outer shell on one side and locked to the outer shell on the other side by screws, forming a box structure with the outer shell; A rectifier bridge adapter socket assembly is disposed on the cover and is used to insert the rectifier bridge under test. The first switch and the second switch are both single-pole double-throw switches, which are arranged side by side on the cover. The first test port and the second test port are provided on the cover and are used to connect to external test equipment; The common terminal of the first switch is connected to the first test port, and the two sets of stationary contacts of the first switch are respectively used to connect to the two DC pins of the rectifier bridge; The common terminal of the second switch is connected to the second test port, and the two sets of stationary contacts of the second switch are respectively used to connect to the two AC pins of the rectifier bridge; The first switch and the second switch form a 2×2 matrix selection topology, and the four diodes inside the rectifier bridge are selected by the four gear combinations of the two switches.

[0011] Furthermore, both the first and second switches are ON-ON single-pole double-throw switches with no neutral position. At any given time, the common terminal of the switch is only connected to one of the two sets of stationary contacts, without any intermediate floating or open circuit states.

[0012] Furthermore, the first set of stationary contacts of the first switch is connected to pin 4 of the rectifier bridge, and pin 4 is the negative DC output terminal DC-. The second set of stationary contacts of the first switch is connected to pin 1 of the rectifier bridge, and pin 1 is the positive DC output terminal DC+. The first set of stationary contacts of the second switch is connected to pin 2 of the rectifier bridge, and pin 2 is the first AC input terminal AC1. The second set of stationary contacts of the second switch is connected to pin 3 of the rectifier bridge, and pin 3 is the second AC input terminal AC2.

[0013] Furthermore, the rectifier bridge adapter socket assembly includes a fixed base and a replaceable sub-socket. The fixed base is fixedly disposed inside the housing, and the sub-socket is detachably installed above the fixed base.

[0014] Furthermore, the first test port and the second test port are non-polar universal test ports.

[0015] Furthermore, the first test port and the second test port are standard banana plugs or BNC plugs.

[0016] Furthermore, the first switch and the second switch are miniature toggle switches or push-button switches with a rated current greater than or equal to 1A and a contact resistance less than or equal to 50mΩ.

[0017] Furthermore, the contact spring between the fixed base and the sub-socket is made of beryllium copper.

[0018] Furthermore, the outer shell and the cover are made of insulating material, and the upper surface of the cover is an operation panel. The operation panel has a nameplate or silkscreen text corresponding to each switch position.

[0019] This invention provides an independent test fixture for a single diode in a rectifier bridge, which has the following advantages: 1. This invention utilizes a dual-switch matrix selection logic, allowing operators to accurately select four diodes simply by toggling two switches. This eliminates the need to memorize pin pairings or frequently switch test leads, thus avoiding human error such as accidental touches, missed tests, and incorrect judgments. The testing accuracy is close to 100%, and the testing efficiency is more than three times higher than manual test lead testing, making it particularly suitable for batch comparison testing and parameter consistency screening scenarios.

[0020] 2. Compared with the traditional four-switch discrete selection structure of "one tube and one switch", the present invention reduces the number of switches by 50%, greatly simplifies the internal wiring and wiring terminals, reduces the assembly process by more than 60%, reduces the overall tooling volume by more than half, greatly improves portability, reduces the failure rate of components, and significantly reduces the cost of mass production, highlighting the advantages of lightweight and low cost.

[0021] 3. This invention features a unique dual-switch row-column matrix selection logic, ensuring that only one of the two switches is conducting at any given time, eliminating floating and open-circuit states and naturally forming an electrical logic self-locking mechanism. All switch combinations are in a valid test state, with no invalid positions or short-circuit risks. No additional interlocking circuits or mechanical limit structures are required, completely solving the circuit disorder problem caused by simultaneous accidental activation in traditional multi-switch fixtures, resulting in high system reliability.

[0022] 4. This invention eliminates the need for complex electronic control structures such as microcontrollers, relay arrays, and control circuits, while maintaining the core advantages of miniaturization, low cost, and high precision. It is perfectly suited for various scenarios, including laboratory R&D verification, small-batch sample screening, and on-site equipment maintenance. The test port adopts a non-polarity design, making it compatible with professional semiconductor parameter testing equipment with automatic polarity recognition (which can automatically complete full parameter testing of forward voltage drop, reverse leakage current, and reverse withstand voltage), as well as general-purpose testing equipment such as ordinary multimeters and conventional DC sources. This overcomes the industry shortcomings of bulky and expensive automated equipment and poor precision of traditional manual tooling.

[0023] 5. This invention adopts a split assembly structure with a fixed base and replaceable sub-sockets, abandoning the traditional sliding adjustable structure. With no moving friction parts, the contact resistance remains constant over a long period, completely solving problems such as loose sliding structures, resistance drift, and arcing. The repeatability and consistency of test data are significantly improved. By replacing the standardized sub-sockets, it can be adapted to rectifier bridges of various package specifications, offering strong versatility, convenient assembly and disassembly, and high durability. Attached Figure Description

[0024] Figure 1 This is a schematic diagram of an independent test fixture for a single diode of a rectifier bridge according to the present invention. Figure 2 This is a schematic diagram showing the opening of the cover of a single diode independent test fixture for a rectifier bridge according to the present invention; Figure 3 This is a schematic diagram of the switching principle of a single diode independent test fixture for a rectifier bridge according to the present invention.

[0025] In the diagram: 1. Outer shell; 2. Cover; 3. Rectifier bridge adapter socket assembly; 31. Fixed base; 32. Sub-socket; 4. S1 switch; 5. S2 switch; 6. First test port; 7. Second test port; 8. Screw. Detailed Implementation

[0026] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0027] The present invention will now be described in detail through specific embodiments, as follows: Overall structure and assembly relationship of tooling like Figures 1 to 3 As shown, the present invention provides a rectifier bridge single diode independent test fixture, including a housing 1, a cover 2, a rectifier bridge adapter socket assembly 3, an S1 switch 4, an S2 switch 5, a first test port 6, and a second test port 7.

[0028] The cover 2 is hinged to the outer shell 1 and secured with screws 8, forming a rectangular box structure with an internal cavity. Both the cover 2 and the outer shell 1 are made of insulating material. The upper surface of the cover 2 serves as an operation panel, which includes socket mounting holes, switch mounting holes, and port mounting holes. The interior of the outer shell 1 contains mounting brackets for securing various components and cable trays for wiring.

[0029] The rectifier bridge adapter socket assembly 3 is fixedly installed at the socket mounting hole on the operation panel of the cover 2, with its pin holes facing upwards and exposed on the surface of the operation panel for easy insertion and removal of the rectifier bridge under test. The adapter socket assembly 3 includes a fixed base 31 and a replaceable sub-socket 32. The fixed base 31 is fixedly disposed inside the housing 1, and its bottom is provided with a wiring terminal for connection to the switching circuit, maintaining a permanent and stable electrical connection with the switching circuit. The replaceable sub-socket 32 ​​is detachably installed above the fixed base 31. Various models are available to accommodate different rectifier bridge package specifications and different pin pitches. The lower contacts of each model of sub-socket 32 ​​are connected one-to-one with the contact springs on the upper part of the fixed base 31. The upper part of the sub-socket 32 ​​is provided with a socket matching the pins of the rectifier bridge under test.

[0030] Switches S1 (4) and S2 (5) are installed side-by-side at the switch mounting holes on the operation panel of cover 2. Both switches S1 (4) and S2 (5) are ON-ON single-pole double-throw switches with no neutral position. An ON-ON single-pole double-throw switch with no neutral position means that at any given time, its common terminal is only connected to one of the two sets of stationary contacts, with no intermediate floating or open circuit states. When toggled, it directly switches between the two positions. This characteristic ensures that only one test circuit is connected at any given time, eliminating the risk of multiple channels conducting simultaneously without the need for additional interlocking circuitry.

[0031] The first test port 6 and the second test port 7 are installed at the port mounting holes on the operation panel of the cover 2. They are non-polar universal test ports, using standard banana sockets or BNC sockets, for connecting external multimeters, semiconductor parameter testers or DC power supplies.

[0032] Circuit connection relationship like Figure 3As shown, the common terminal of switch S1 4 is connected to the first test port 6. The first set of stationary contacts of switch S1 4 is connected to pin 4 of rectifier bridge adapter socket assembly 3 (corresponding to the negative DC output of rectifier bridge DC-). The second set of stationary contacts of switch S1 4 is connected to pin 1 of rectifier bridge adapter socket assembly 3 (corresponding to the positive DC output of rectifier bridge DC+). That is, switch S1 4 is used to select one of the two DC pins (pin 4 and pin 1) of the rectifier bridge.

[0033] The common terminal of switch S2 5 is connected to the second test port 7. The first set of stationary contacts of switch S2 5 is connected to pin 2 of rectifier bridge adapter socket assembly 3 (corresponding to the first AC input terminal AC1 of the rectifier bridge), and the second set of stationary contacts of switch S2 5 is connected to pin 3 of rectifier bridge adapter socket assembly 3 (corresponding to the second AC input terminal AC2 of the rectifier bridge). That is, switch S2 5 is used to select one of the two AC pins (pin 2 and pin 3) of the rectifier bridge.

[0034] The above connection relationship allows switch S14 to act as the column selector and switch S25 to act as the row selector, together forming a 2×2 row-column matrix gating topology. The two switches can be turned independently without affecting each other. The four possible combinations of the two switches in a total of 2×2 correspond to the test circuits of the four diodes, with one-to-one mapping, no redundant combinations, and no conflicting combinations.

[0035] It should be noted that the "left-hand" and "right-hand" functions of switches S1 and S2 are relative concepts, defined by the operating direction of the switches. In this embodiment, left-hand S1 indicates that the common terminal of S1 is connected to the stationary contact of connection pin 4, and right-hand S1 indicates that the common terminal of S1 is connected to the stationary contact of connection pin 1; left-hand S2 indicates that the common terminal of S2 is connected to the stationary contact of connection pin 2, and right-hand S2 indicates that the common terminal of S2 is connected to the stationary contact of connection pin 3. In specific implementations, the definitions of "left" and "right" can be adjusted according to the actual installation direction of the switches, but the corresponding circuit connection logic remains unchanged.

[0036] Detailed test operation steps The rectifier bridge under test is a standard four-pin package used in the industry. Its pin definitions are as follows: Pin 1 is the DC output positive terminal (DC+), Pin 2 is the first AC input terminal (AC1), Pin 3 is the second AC input terminal (AC2), and Pin 4 is the DC output negative terminal (DC-). The test pin pairs corresponding to the four diodes inside the rectifier bridge are as follows: between pin 2 and pin 4 (corresponding to the first diode), between pin 3 and pin 4 (corresponding to the second diode), between pin 2 and pin 1 (corresponding to the third diode), and between pin 3 and pin 1 (corresponding to the fourth diode).

[0037] The operator inserts the rectifier bridge under test into the socket of the adapter assembly 3 in the correct direction, connects the test leads of the external test equipment to the first test port 6 and the second test port 7, and then performs diode selection test by toggling the S1 switch 4 and the S2 switch 5. The specific operation is as follows: Testing the first diode (pins 2-4): Flip switch S1 4 to the left, connecting test port 6 to pin 4; flip switch S2 5 to the left, connecting test port 7 to pin 2. At this point, the current path of the external testing equipment is: test port 6 → pin 4 → first diode → pin 2 → test port 7, forming a closed test loop. The operator reads the electrical parameters displayed on the external testing equipment to complete the test of the first diode.

[0038] To test the second diode (pins 3-4): Keep switch S1 4 turned to the left, connecting the first test port 6 to pin 4; turn switch S2 5 to the right, connecting the second test port 7 to pin 3. At this time, the current path of the external test equipment is: first test port 6 → pin 4 → second diode → pin 3 → second test port 7, forming a closed test loop. The operator reads the electrical parameters displayed on the external test equipment to complete the test of the second diode.

[0039] Testing the third diode (pin 2 to pin 1): Turn switch S1 4 to the right, connecting test port 6 and pin 1; turn switch S2 5 to the left, connecting test port 7 and pin 2. At this time, the current path of the external testing equipment is: test port 6 → pin 1 → third diode → pin 2 → test port 7, forming a closed test loop. The operator reads the electrical parameters displayed on the external testing equipment to complete the test of the third diode.

[0040] Testing the fourth diode (pins 3-1): Turn switch S1 4 to the right, connecting test port 6 to pin 1; turn switch S2 5 to the right, connecting test port 7 to pin 3. At this point, the current path of the external testing equipment is: test port 6 → pin 1 → fourth diode → pin 3 → test port 7, forming a closed test loop. The operator reads the electrical parameters displayed on the external testing equipment to complete the test of the fourth diode.

[0041] The four tests described above are not in any particular order, and operators can choose the test sequence arbitrarily according to actual needs. Between two adjacent tests, simply toggling either switch S1 (4) or S2 (5) will switch to the next test circuit, making operation extremely simple.

[0042] Used in conjunction with a professional semiconductor parameter tester The test port of this invention adopts a non-polarity design, which is particularly suitable for professional semiconductor parameter testers with automatic polarity recognition and the ability to adjust high and low potential outputs independently.

[0043] When using this type of professional testing equipment, connect the two test leads to the first test port 6 and the second test port 7, respectively. After power-on, the equipment automatically detects the potential at both ends of the current circuit, identifies the circuit polarity, and automatically adjusts the output high and low potentials according to the preset test items to perform forward voltage drop tests or reverse leakage current and reverse withstand voltage tests. The operator does not need to manually determine the positive and negative terminals or change the test leads during the entire testing process. After completing the test of one diode, toggle any switch to switch to the next diode; the equipment automatically identifies the polarity of the new circuit and completes the corresponding test.

[0044] Taking the test of the fourth diode (pins 3-1) as an example: When S1 and S2 are switched to the right, the first test port 6 is connected to pin 1 (DC+) through S1, and the second test port 7 is connected to pin 3 (AC2) through S2. For the fourth diode located between pins 3 and 1, its actual polarity is pin 3 as the anode and pin 1 as the cathode. Therefore, when the test current flows into the second test port 7 and out of the first test port 6, the fourth diode is in a forward conducting state; otherwise, it is in a reverse cutoff state. Professional equipment automatically identifies this polarity relationship, and forward and reverse tests can be completed sequentially without manual wiring changes.

[0045] Used in conjunction with a regular multimeter When using general-purpose test equipment without automatic polarity identification function, such as ordinary multimeters or conventional DC power supplies, operators can determine the polarity direction of the diodes in the current test circuit by checking the conduction position of switch S1 4, and then connect the corresponding test leads to complete accurate testing.

[0046] The specific judgment method is as follows: When the S1 switch 4 is turned to the left to select pin 4 (DC-), the first test port 6 is connected to the DC negative terminal of the rectifier bridge. For the currently selected diode, the first test port 6 is the anode side and the second test port 7 is the cathode side. When the S1 switch 4 is turned to the right to select pin 1 (DC+), the first test port 6 is connected to the DC positive terminal of the rectifier bridge. For the currently selected diode, the first test port 6 is the cathode side and the second test port 7 is the anode side.

[0047] According to the above rules, the operator can connect the red and black probes of the multimeter to the first test port 6 and the second test port 7 in the corresponding directions to correctly read the forward voltage drop or reverse parameters. There is no need to memorize complicated pin pairing relationships; simply observe the switch position.

[0048] Adaptation operation of replaceable socket components When the package specifications of the rectifier bridge under test do not match those of the currently installed sub-socket 32, the operator shall perform the following replacement steps: First, remove the rectifier bridge under test from the current sub-socket 32; then, grasp both sides of the current sub-socket 32 ​​and pull it vertically upward from the fixed base 31; next, select another sub-socket 32 ​​model that matches the package specifications of the rectifier bridge under test, align its lower contacts with the contact springs on the upper part of the fixed base 31, and press it vertically downward until it is locked in place; finally, insert the rectifier bridge under test into the newly replaced sub-socket 32 ​​socket to begin testing.

[0049] Existing female and male sockets can be used, and the entire replacement process requires no tools, making it simple and quick. Because of the rigid contact between the fixed base 31 and the replaceable female socket 32, there are no sliding friction parts, eliminating problems such as loosening, contact resistance drift, and arcing that can occur with traditional sliding adjustable structures over long-term use. This ensures long-term contact stability and repeatability of test data.

[0050] Preferred component selection and structural parameters In a preferred embodiment of the present invention, S1 switch 4 and S2 switch 5 are selected as miniature toggle switches or toggle switches with a rated current of not less than 1A and a contact resistance of not more than 50mΩ, to ensure that the voltage drop of the switch contacts is negligible under high current test conditions and does not affect the test accuracy.

[0051] In a preferred embodiment of the present invention, the first test port 6 and the second test port 7 are gold-plated banana sockets, which have low contact resistance and strong oxidation resistance, ensuring contact stability during long-term use.

[0052] In a preferred embodiment of the present invention, the contact spring between the fixed base 31 and the replaceable sub-socket 32 ​​is made of beryllium copper, which has excellent elasticity and conductivity, ensuring reliable electrical contact after multiple insertions and removals.

[0053] As a preferred embodiment of the present invention, the outer shell 1 and the cover 2 are injection molded from ABS or polycarbonate engineering plastic, which has excellent insulation performance and mechanical strength. The operation panel is provided with a nameplate or silkscreen text corresponding to each switch position, indicating the pin number and gear correspondence, so as to facilitate the operator's identification and use.

[0054] Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention. Any modifications, alterations, substitutions, and variations made by those skilled in the art to the above embodiments are within the scope of the present invention.

Claims

1. A single-diode independent test fixture for a rectifier bridge, characterized in that, include: Outer shell (1); The cover (2) is hinged to the top of the outer shell (1) on one side and locked to the outer shell (1) on the other side by screws (8). The cover (2) and the outer shell (1) form a box structure. A rectifier bridge adapter socket assembly (3) is disposed on the cover (2) for inserting the rectifier bridge under test; The first switch (4) and the second switch (5) are both single-pole double-throw switches, and are arranged side by side on the cover (2); The first test port (6) and the second test port (7) are provided on the cover (2) for connecting external test equipment; The common terminal of the first switch (4) is connected to the first test port (6), and the two sets of stationary contacts of the first switch (4) are respectively used to connect the two DC pins of the rectifier bridge; The common terminal of the second switch (5) is connected to the second test port (7), and the two sets of stationary contacts of the second switch (5) are respectively used to connect the two AC pins of the rectifier bridge; The first switch (4) and the second switch (5) form a 2×2 row and column matrix selection topology, and the four diodes inside the rectifier bridge are selected by the four gear combinations of the two switches respectively.

2. The rectifier bridge single diode independent test fixture according to claim 1, characterized in that, Both the first switch (4) and the second switch (5) are ON-ON single-pole double-throw switches with no open position. At any given time, the common terminal of the switch is only connected to one of the two sets of stationary contacts, without any intermediate floating or open circuit state.

3. The rectifier bridge single diode independent test fixture according to claim 1, characterized in that, The first set of stationary contacts of the first switch (4) is connected to pin 4 of the rectifier bridge, and pin 4 is the negative DC output terminal DC-. The second set of stationary contacts of the first switch (4) is connected to pin 1 of the rectifier bridge, and pin 1 is the positive DC output terminal DC+. The first set of stationary contacts of the second switch (5) is connected to pin 2 of the rectifier bridge, and pin 2 is the first AC input terminal AC1. The second set of stationary contacts of the second switch (5) is connected to pin 3 of the rectifier bridge, and pin 3 is the second AC input terminal AC2.

4. The rectifier bridge single diode independent test fixture according to claim 1, characterized in that, The rectifier bridge adapter socket assembly (3) includes a fixed base base (31) and a replaceable sub-socket (32). The fixed base base (31) is fixedly disposed inside the outer casing (1), and the sub-socket (32) is detachably installed above the fixed base base (31).

5. The rectifier bridge single diode independent test fixture according to claim 1, characterized in that, The first test port (6) and the second test port (7) are non-polar universal test ports.

6. The rectifier bridge single diode independent test fixture according to claim 5, characterized in that, The first test port (6) and the second test port (7) are standard banana sockets or BNC sockets.

7. The rectifier bridge single diode independent test fixture according to claim 1, characterized in that, The first switch (4) and the second switch (5) are miniature toggle switches or toggle switches with a rated current greater than or equal to 1A and a contact resistance less than or equal to 50mΩ.

8. The rectifier bridge single diode independent test fixture according to claim 4, characterized in that, The contact spring between the fixed base (31) and the sub-socket (32) is made of beryllium copper.

9. The rectifier bridge single diode independent test fixture according to claim 1, characterized in that, The outer shell (1) and the cover (2) are made of insulating material. The upper surface of the cover (2) is an operation panel. The operation panel is provided with a nameplate or silkscreen text corresponding to each switch position.

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