An atomic force microscope simulation demonstration device

Abstract

The present application relates to the technical field of science and education demonstration, and specifically relates to an atomic force microscope simulation demonstration device. The present application comprises a table body and a plurality of indication portions arranged on the table top of the table body. The table top of the table body is used as a drawing board, and the plurality of indication portions can be connected to form at least one demonstration pattern. A plurality of indication magnets that are invisible in the inner cavity of the table body are movably installed on the table body. When the indication magnets are in motion, the indication magnets have a simulation state in which the indication magnets are located directly below the indication portions and a standby state in which the indication magnets are away from the indication portions. In each demonstration period, all of the indication portions of any one of the demonstration patterns formed correspond one-to-one to the indication magnets in the simulation state. A detection handle is arranged on the table body, and a detection magnet is arranged on the lower part of the detection handle. The present application has a simple structure and is convenient to operate. Through interactive operation of a user, the atomic force that is difficult to perceive is converted into a tactile experience that can be perceived, and the learning interest and understanding depth of the user are improved.

Description

Technical Field

[0001] This invention relates to the field of science and education demonstration technology, specifically an atomic force microscope simulation demonstration device. Background Technology

[0002] Atomic force microscopy (AFM) is an important tool for studying the microscopic morphology and structure of material surfaces. Its core working principle is based on the weak interaction forces (such as van der Waals forces, electrostatic forces, etc.) between the sharp tip of the microcantilever probe and the atoms on the sample surface. When the probe scans relative to the sample surface, the interaction forces cause the microcantilever to bend or deflect. By detecting the amount of deflection, a three-dimensional morphological image of the sample surface can be obtained.

[0003] Due to the high cost, complex operation, and stringent environmental requirements of AFM equipment, it is difficult for the public, especially young people, to access and understand its working principles. In recent years, science museums, as important venues for science popularization, have undertaken the social function of showcasing cutting-edge science and technology to the public in an easily understandable way. However, most exhibits on atomic force microscopy (AFM) in science museums currently use video animations, graphic panels, or static models to explain the principles, lacking interactive exhibits for visitors to operate. While these methods can convey basic information, they are abstract and lack interactivity, making it difficult for the public to truly understand the core physical mechanism of force feedback scanning. Visitors often remain at a passive viewing level, unable to gain intuitive, tactile understanding, thus limiting the effectiveness of science popularization. Therefore, this issue urgently needs to be addressed. Summary of the Invention

[0004] To avoid and overcome the technical problems existing in the prior art, the present invention provides an atomic force microscope simulation demonstration device. The device has a simple structure and is easy to operate. Through user interaction, the imperceptible interatomic forces are transformed into a perceptible tactile experience, thereby enhancing the user's learning interest and understanding.

[0005] To achieve the above objectives, the present invention provides the following technical solution: An atomic force microscope simulation demonstration device includes a stage and multiple indicator parts disposed on its stage surface. Using the stage surface as a drawing board, the multiple indicator parts can be connected to form at least one demonstration pattern. Multiple indicator magnets, invisible in the internal cavity of the stage, are movably mounted on the stage. When the indicator magnets are active, they have a simulated state directly below the indicator parts and a standby state away from the indicator parts. In each demonstration cycle, each indicator part of any given demonstration pattern is matched with an indicator magnet in the simulated state. A probe handle is disposed on the stage, and a probe magnet is disposed at the lower part of the probe handle. The lower magnetic pole of the probe magnet is the same as the upper magnetic pole of the indicator magnet. The demonstration pattern corresponding to the current demonstration cycle is obtained by the magnetic repulsion profile sensed when the lower part of the probe handle sweeps across the multiple indicator parts.

[0006] As a further aspect of the present invention: the indicator is arranged in a dot matrix pattern, and the demonstration pattern is a mathematical geometric figure.

[0007] As a further aspect of the present invention: an electric cylinder is provided directly below each of the multiple indicator sections, and an indicator magnet is installed on the extension and retraction end of each electric cylinder. When the electric cylinder is extended and retracted, it drives the indicator magnet to form the simulated state and the standby state, respectively.

[0008] As a further aspect of the present invention: it includes a controller, the output of which is electrically connected to an electric cylinder, and a trigger switch with its output electrically connected to the controller is also installed on the platform. When the trigger switch is triggered, the controller controls the electric cylinder corresponding to the indicator part constituting the demonstration pattern to operate according to one of the demonstration patterns, so as to push the detection magnet corresponding to the indicator part constituting the demonstration pattern to the simulated state.

[0009] As a further aspect of the present invention: the indicator is an indicator light, which has two different indicator colors. The input end of the indicator light is electrically connected to the controller. The platform is provided with multiple selection buttons corresponding to the types of demonstration patterns. The selection buttons are used to send a preset judgment signal of the type of demonstration pattern to the controller. The controller controls all the indicator lights that form the demonstration pattern to turn on different indicator colors according to the judgment signal.

[0010] As a further embodiment of the present invention: a transparent protective plate is installed on the platform directly above the indicator light.

[0011] As a further aspect of the present invention: the platform is provided with a handle fixing seat, and the handle fixing seat is provided with a groove facing upward for inserting a detection handle.

[0012] As a further embodiment of the present invention: a magnet is fixed inside the handle fixing seat, and when the detection handle is inserted into the groove, the fixing magnet and the detection magnet are magnetically attracted to each other.

[0013] As a further aspect of the present invention, the lower insertion end of the probe handle is provided with rounded corners.

[0014] As a further aspect of the present invention, an anti-loss rope is connected between the probe handle and the platform.

[0015] Compared with the prior art, the beneficial effects of the present invention are: 1. By setting multiple indicator points on the stage and movably installing multiple indicator magnets within the stage's internal cavity, the indicator magnets can switch between a simulated state directly below the indicator points and a standby state away from the indicator points, thereby forming a magnetic force distribution corresponding to the demonstration pattern below the stage surface. When the user sweeps the stage surface with a probe handle equipped with a detection magnet, the repulsive force of like poles generates a tactile perception corresponding to the pattern, allowing them to determine the pattern shape based on the repulsive force contour perceived by hand. This application simulates the abstract force feedback scanning principle of atomic force microscopy through magnetic repulsion, enabling users to understand the core logic of morphology reconstruction through hands-on operation and experience of the interaction forces between the atomic force microscope probe and the sample surface atoms, thus enhancing the user's learning interest and depth of understanding. Furthermore, this application features a simple structure, convenient operation, and requires no expensive optical or precision mechanical components, resulting in low cost.

[0016] 2. By setting the indicator to a dot matrix distribution and making the demonstration pattern a mathematical geometric shape, on the one hand, the dot matrix distribution makes the indicator evenly and regularly arranged on the table, the connection between the indicator is flexible, and the dot matrix layout combined with the geometric shape allows for quick switching of different demonstration content without complicated calculations; on the other hand, the shape boundary of the mathematical geometric shape is clear and is also a common demonstration pattern type for users, which makes the boundary of the repulsive force change clearly distinguishable when users perform blind scanning, greatly reducing the difficulty of operation.

[0017] 3. By setting the indicator unit to have two different indicator colors and adding a selection button electrically connected to the controller, a closed-loop teaching system of blind testing, judgment, and verification is achieved. After completing the blind test scan, the user can submit their judgment via the selection button. The controller then provides immediate and clear visual feedback through the color switching of the indicator lights (e.g., green for correct, red for incorrect). On the one hand, this enhances the interactivity and fun of learning; on the other hand, users can directly compare the outline they perceive through touch with the visual pattern. When a judgment is incorrect, they can repeatedly scan and compare, thereby deepening their understanding and effectively improving the demonstration and teaching effect. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the structure of the present invention.

[0019] Figure 2 This is a schematic diagram of the distribution structure of the indicator light and the indicator magnet in this invention.

[0020] Figure 3 This is a top view of the structure of the present invention.

[0021] Figure 4 for Figure 1 A magnified schematic diagram of the structure at point A in the middle.

[0022] In the diagram: 10. Platform body; 11. Transparent protective plate; 12. Handle mounting base; 121. Fixing magnet; 20. Electric cylinder; 21. Indicating magnet; 30. Detector handle; 31. Detector magnet; 32. Anti-loss rope; 40. Indicator light; 50. Trigger switch; 60. Selection button. Detailed Implementation

[0023] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0024] For ease of understanding, the specific structure and operation of the present invention will be further described below with reference to the accompanying drawings: The specific structure of this invention is as follows: Figures 1-4 As shown, this application is mainly used for demonstration exhibitions or classroom teaching to visually demonstrate to visitors or students that different morphological images are formed when an atomic force microscope probe scans a sample surface due to different forces. Its main structure includes a stage 10, an indicating magnet 21, a probe handle 30, and a control unit.

[0025] like Figure 1 As shown, the platform 10 is a rectangular box structure commonly used in exhibition halls, with its upper surface serving as the operating surface. Multiple indicator points are provided on the platform to mark discrete points that can be connected to form at least one demonstration pattern. To reduce the difficulty of detection and identification, in this embodiment, the indicator points are discretely distributed in a dot matrix pattern, such as... Figure 3 The 8×9 array shown demonstrates patterns using common mathematical geometric shapes such as circles, rectangles, and triangles. In practical implementation, a more complex demonstration pattern can be formed using a discrete, randomly distributed form that is difficult to identify.

[0026] like Figure 2As shown, the electric cylinder 20 is fixedly installed in the inner cavity of the platform 10, with its telescopic end extending vertically upward. An indicator magnet 21 is fixedly installed at the top of the telescopic end. The indicator magnet 21 is located inside the inner cavity of the platform 10 and is not visible. An independent electric cylinder 20 is provided directly below the platform position corresponding to each indicator part. The electric cylinder 20 has two extreme positions: when the electric cylinder 20 is fully extended, the indicator magnet 21 is pushed directly below the indicator part and close to the indicator part. This state is defined as the simulation state, indicating that the position participates in the composition of the current demonstration pattern; when the electric cylinder 20 is fully retracted, the indicator magnet 21 moves away from the indicator light 40 and descends to the bottom of the inner cavity of the platform. This state is defined as the standby state, indicating that the position does not participate in the composition of the current demonstration pattern.

[0027] Of course, the electric cylinder 20 is only one of the implementation methods for driving the indicator magnet 21. In actual implementation, other linear motion mechanisms can also be used to drive the lifting motion; even a linkage structure can be used to switch between the simulated state and the standby state when the indicator magnet 21 is active by swinging.

[0028] like Figure 1 and Figure 2 As shown, when the indicator magnet 21 is in simulation mode, its upper magnetic poles are uniformly N (or S). Figure 4 As shown, the detection handle 30 is a one-handed grip structure, with a detection magnet 31 fixedly mounted at its lower end. The lower magnetic pole of the detection magnet 31 is the same as the upper magnetic pole of the indicator magnet 21, i.e., both are N poles. When the user holds the detection handle 30 and sweeps its lower end across the table at a certain height, the detection handle 30 will experience a repulsive force from the analog state indicator magnet 21 due to the repulsion of like poles. When sweeping across a position without the indicator magnet 21 (i.e., in standby mode), the repulsive force is very small or non-existent.

[0029] like Figure 3 As shown, when the user moves the probe handle 30 evenly across the table, their hand will perceive a noticeable change in repulsive force: the repulsive force increases significantly when passing through the outline of the demonstration pattern formed by the indicator magnets 21 in the simulated state, while the repulsive force decreases significantly in areas outside the demonstration pattern. By sensing this change in repulsive force, the user can blindly determine the shape of the demonstration pattern currently presented on the table, thus simulating the process by which the atomic force microscope probe experiences changes in force due to the atomic undulations on the sample surface when scanning the sample surface, ultimately forming a topographic image.

[0030] Based on the above, the platform 10 also contains a controller (such as a PLC controller or a microcontroller), and the output of the controller is electrically connected to the input of each electric cylinder 20. For example... Figure 3As shown, a trigger switch 50 with an output terminal electrically connected to the controller is provided on the front panel of the platform 10. The trigger switch 50 can be a push button switch or a handle switch. When the trigger switch 50 is triggered, the controller selects one of the multiple demonstration patterns as the current demonstration pattern according to a preset rule (e.g., cyclic switching or random selection), and controls the electric cylinder 20 corresponding to the indicator part that makes up the demonstration pattern to operate, so as to push the indicator magnet 21 corresponding to the indicator part that makes up the demonstration pattern to the simulation state.

[0031] like Figure 2 As shown, in order to enhance the demonstration effect during the demonstration process, in this embodiment, the indicator is an indicator light 40 embedded in the table surface, and each indicator light 40 has two display colors (such as red and green), which increases the interactive visual effect compared to the marking methods such as cross lines or raised dots printed or engraved on the table surface.

[0032] Furthermore, such as Figure 3 As shown, the tabletop 10 is also equipped with multiple selection buttons 60, each with an output terminal electrically connected to the controller. Each selection button 60 corresponds to a preset type of demonstration pattern, such as a circle, rectangle, and triangle. In actual implementation, the image or name of the corresponding demonstration pattern can be provided on or next to each selection button 60 so that the user knows which demonstration pattern the selection button 60 corresponds to. The selection button 60 is used to send a corresponding judgment signal to the controller (i.e., what shape the user believes the currently recognized demonstration pattern is). The controller judges whether the judgment result is correct and controls all the indicator lights 40 forming the demonstration pattern to turn on different indicator colors. If the judgment is correct (the pattern selected by the user is consistent with the demonstration pattern of the current demonstration cycle), the controller controls all the indicator lights 40 that make up the pattern to light up green, conveying the feedback that the judgment is correct to the user. At the same time, the other indicator lights 40 can remain off. If the judgment is incorrect (the pattern selected by the user is inconsistent with the demonstration pattern of the current demonstration cycle), the controller controls all the indicator lights 40 that make up the pattern to light up red, conveying the feedback that the judgment is incorrect to the user. At the same time, the other indicator lights 40 can remain off. If the judgment is incorrect, before triggering the trigger switch 50 again, students can use the probe handle 30 to scan the table surface again, comparing the tactile perception with the visual pattern to deepen their understanding of the correspondence between force feedback and shape.

[0033] Based on the above, such as Figure 2 As shown, in order to protect the table surface and indicator light 40 and improve the smoothness of the scanning interface of the probe handle 30, the top surface of the table body 10 is covered with a transparent protective plate 11. The transparent protective plate 11 is made of transparent acrylic material, which does not affect the observation of the indicator light 40, nor does it affect the magnetic penetration.

[0034] In addition, such as Figure 4As shown, a handle fixing seat 12 is also fixed on the platform 10. The handle fixing seat 12 has an upward-facing groove, and preferably a fixing magnet 121 is embedded in the bottom of the groove. When the detection handle 30 is finished using, its lower end is inserted into the groove. The opposite poles of the detection magnet 31 and the fixing magnet 121 face each other, generating an attractive force, thereby reliably attracting and fixing the detection handle 30 in the handle fixing seat 12. At the same time, the tail of the detection handle 30 is connected to the side wall of the platform 10 by a flexible anti-loss rope 32 to prevent the detection handle 30 from being lost or dropped and damaged.

[0035] In addition, the lower insertion end of the probe handle 30 is machined with rounded corners, which facilitates insertion into the groove of the handle fixing seat 12 and reduces resistance and the risk of scratches when sliding on the transparent protective plate 11.

[0036] The demonstration process of this application is as follows: Step 1: By pressing or pushing the trigger switch 50, the controller selects a demonstration pattern from the pattern library according to preset rules, such as selecting a triangle, and drives the corresponding electric cylinder 20 to extend, pushing the corresponding indicator magnet 21 to the simulation state. At this time, all indicator lights 40 remain off, and the user has no idea which pattern is currently active.

[0037] Step Two: The user removes the probe handle 30 from the handle holder 12, places its lower end close to the surface of the transparent protective plate 11, and slowly sweeps it across the surface of the transparent protective plate 11. When sweeping across the triangular edge area of ​​the demonstration pattern, the hand will feel a significant magnetic repulsion; when sweeping across the triangular edge area of ​​a non-demonstration pattern, the repulsion will significantly weaken or disappear. Based on the changes in the strength of the repulsion felt by the hand, the user mentally reconstructs the circular outline.

[0038] Step 3: After completing the scan, the user selects the pattern they believe corresponds to from the multiple selection buttons 60 based on the outline of the pattern perceived through touch. For example, pressing the selection button 60 marked with a triangle. The controller compares the selection button and finds it matches the currently active triangle demonstration pattern, then all indicator lights 40 that make up the triangle pattern light up green, indicating a correct judgment. If the user presses a non-triangle selection button 60, and the controller finds it doesn't match the currently active triangle demonstration pattern, then all indicator lights 40 that make up the triangle demonstration pattern light up red, indicating an incorrect judgment. At this point, the user can again verify the pattern by comparing the tactile perception with the visual pattern using the probe handle 30.

[0039] Step 4: To demonstrate again, trigger switch 50 is triggered again. The controller first controls all electric cylinders 20 to retract and all indicator lights 40 to return to the off state. Then, a new demonstration pattern is selected according to the preset rules of cycle or randomness, and the corresponding electric cylinder 20 is extended again to start a new round of demonstration.

[0040] This application simulates interatomic forces using magnetic force. It utilizes an array of adjustable indicator magnets 21 to form variable magnetic force demonstration patterns. Combined with a handheld probe handle 30, it transforms the imperceptible principle of atomic force scanning imaging into a concrete tactile sensory experience. Through a closed-loop teaching system of blind testing, judgment, and verification, it deeply simulates the scientific process by which researchers reconstruct the morphology of unknown samples based on force feedback data, thereby enhancing the user's learning interest and depth of understanding.

[0041] Of course, those skilled in the art will recognize that the present invention is not limited to the details of the exemplary embodiments described above, but also includes the same or similar structures that can be implemented in other specific forms without departing from the spirit or essential characteristics of the invention. Therefore, the embodiments should be considered illustrative and non-limiting in all respects, and the scope of the invention is defined by the appended claims rather than the foregoing description. Thus, all variations falling within the meaning and scope of equivalents of the claims are intended to be included within the present invention. No reference numerals in the claims should be construed as limiting the scope of the claims.

[0042] Furthermore, it should be understood that although this specification describes embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.

[0043] The technologies, shapes, and structures not described in detail in this invention are all known technologies.

Claims

1. An atomic force microscope simulation demonstration device, characterized in that, The platform (10) includes a table and multiple indicator parts on its surface. The table surface of the platform (10) serves as a drawing board, and the multiple indicator parts can be connected to form at least one demonstration pattern. Multiple indicator magnets (21) located invisibly inside the cavity of the platform (10) are movably installed on the platform (10). When the indicator magnets (21) are active, they have an analog state located directly below the indicator parts and a standby state located away from the indicator parts. In each demonstration cycle, all the indicator parts of any demonstration pattern formed are matched one-to-one with the indicator magnets (21) in the analog state. A probe handle (30) is provided on the platform (10). A probe magnet (31) is provided at the lower part of the probe handle (30), and the lower magnetic pole of the probe magnet (31) is the same as the upper magnetic pole of the indicator magnet (21). The demonstration pattern corresponding to this demonstration cycle is known from the magnetic repulsion profile sensed when the lower part of the probe handle (30) sweeps across the multiple indicator parts.

2. The atomic force microscope simulation demonstration device according to claim 1, characterized in that, The indicator section is arranged in a dot matrix pattern, and the demonstration pattern is a mathematical geometric figure.

3. An atomic force microscope simulation demonstration device according to claim 1 or 2, characterized in that, Each of the multiple indicator sections is provided with an electric cylinder (20) directly below it. The electric cylinder (20) is equipped with an indicator magnet (21) on its extension and retraction ends. When the electric cylinder (20) is extended and retracted, it drives the indicator magnet (21) to form the simulated state and the standby state, respectively.

4. The atomic force microscope simulation demonstration device according to claim 3, characterized in that, The system includes a controller, the output of which is electrically connected to an electric cylinder (20). A trigger switch (50) with its output electrically connected to the controller is also installed on the platform (10). When the trigger switch (50) is triggered, the controller controls the electric cylinder (20) corresponding to the indicator part of the demonstration pattern to operate according to one of the demonstration patterns, so as to push the probe magnet (31) corresponding to the indicator part of the demonstration pattern to the simulated state.

5. The atomic force microscope simulation demonstration device according to claim 4, characterized in that, The indicator is an indicator light (40). The indicator light (40) has two different indicator colors. The input terminal of the indicator light (40) is electrically connected to the controller. The platform (10) is provided with multiple selection buttons (60) corresponding to the demonstration pattern type. The selection button (60) is used to send a preset judgment signal of the demonstration pattern type to the controller. The controller controls all the indicator lights (40) that form the demonstration pattern to turn on different indicator colors according to the judgment signal.

6. The atomic force microscope simulation demonstration device according to claim 5, characterized in that, A transparent protective plate (11) is installed on the platform (10) directly above the indicator light (40).

7. An atomic force microscope simulation demonstration device according to claim 1 or 2, characterized in that, The platform (10) is provided with a handle fixing seat (12), and the handle fixing seat (12) is provided with a groove with the slot facing upward for inserting the probe handle (30).

8. The atomic force microscope simulation demonstration device according to claim 7, characterized in that, A magnet (121) is fixed inside the handle fixing seat (12). When the probe handle (30) is inserted into the groove, the fixing magnet (121) and the probe magnet (31) are magnetically attracted to each other.

9. The atomic force microscope simulation demonstration device according to claim 7, characterized in that, The lower insertion end of the probe handle (30) is provided with rounded corners.

10. An atomic force microscope simulation demonstration device according to claim 1 or 2, characterized in that, An anti-loss rope (32) is connected between the probe handle (30) and the platform (10).

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