Testing device for simulating automobile wheel speed signal
By designing a test device including a signal input port, a first amplifier, a bias amplifier and a second amplifier, modulation processing of the input PWM signal, the problem of targetedness and singularity of the existing test device is solved, and the correctness of the The wheel speed signal simulation of different types of vehicles and tires improves the versatility and efficiency of the test device.
CN222461038UActive Publication Date: 2025-02-11SUZHOU RUIZHIXIN SEMICON TECH CO LTD
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Patent Information
- Application Number
- CN202320694196.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2023-03-31
- Publication Date
- 2025-02-11
- Estimated Expiration
- 2033-03-31
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Figure CN222461038U_ABST
Abstract
The utility model relates to a testing device for simulating an automobile wheel speed signal, which comprises a signal input port, a first amplifier, a bias amplifier, a second amplifier and a signal output port, the first resistor and the first capacitor are connected with the signal input port and are connected in parallel and grounded; the base electrode of the first triode is connected with the first resistor and the capacitor; the emitter electrode of the first triode is grounded; the bias amplifier comprises a third resistor and a second capacitor which are connected with the collector of the first triode and are connected in parallel, a second triode of which the base is connected with the third resistor and the second capacitor and the collector is connected with the power supply, fourth and fifth resistors which are connected with the emitter of the second triode, are connected in parallel and are grounded, and a sixth resistor which is connected with the fourth and fifth resistors and is connected with the power supply. According to the utility model, PWM signals can be modulated, different high-fitting-degree wheel speed signals can be simulated, the versatility is improved, the test cost is reduced, and the test efficiency and the production benefit are ensured.
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