Device for assisting micrometer caliper in measuring glass thickness
CN223727020UActive Publication Date: 2025-12-26CHINA NATIONAL BUILDING MATERIALS (BENGBU) OPTOELECTRONIC MATERIALS CO LTD
0 Cites 0 Cited by
Patent Information
- Application Number
- CN202520108746.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-17
- Publication Date
- 2025-12-26
- Estimated Expiration
- 2035-01-17
Smart Images

Figure CN223727020U_ABST
Abstract
The utility model provides a device for assisting a micrometer caliper in measuring the thickness of glass, which comprises a quality inspection operating platform (1) and is characterized in that a sinking support (2) is connected onto the quality inspection operating platform (1), a bidirectional moving component (3) moving on a horizontal plane is arranged on the sinking support (2), a longitudinal moving support (4) is arranged on the bidirectional moving component (3), and the longitudinal moving support (4) is connected with the sinking support (2). The longitudinal moving support (4) is provided with a thickness measuring platform (5), the thickness measuring platform (5) is provided with a through hole (6), the through hole (6) is internally provided with a mounting groove (7), the mounting groove (7) is provided with a micrometer caliper (8), and the upper surface of a measuring anvil of the micrometer caliper (8) is coplanar with the upper surface of the thickness measuring platform (5). The device is simple in structure and convenient to assemble, measurement result deviation caused by manual operation can be eliminated in the measurement process, and therefore the quality inspection requirement in the thin glass production process is met.
Need to check novelty before this filing date? Find Prior Art