Novel LDO chip batch test device

Abstract

The utility model discloses a novel LDO (Low Dropout Regulator) chip batch test device, which comprises a clamping seat, a hook claw, a pull plate, a pull rod and a rotating handle, according to the novel LDO chip batch test device, one side of each chip test seat is slidably connected with a clamping seat, pull plates are arranged on the outer sides of the chip test seats in the same row, hook claws are symmetrically and fixedly connected to the two sides, corresponding to the clamping seats, of the pull plates, the hook claws are inserted into the clamping seats and slidably connected with the clamping seats, claw grooves are formed in the positions, corresponding to the hook claws, of the clamping seats, and the claw grooves are connected with the clamping seats. The head portion of the hook claw can slide in the claw groove, the clamping seat is clamped and fixed to the side edge of the chip testing seat through cooperation of the elastic clamping piece and the clamping groove, an LDO chip is clamped and fixed, the outer wall of the frame body is extruded through the inclined face through rotation of the rotating handle, and therefore the pull rod is pulled, the pull rod pulls the pull plate through the push piece, and the LDO chip is clamped and fixed. The pulling plate is matched with the claw groove through the hook claw to pull the clamping seat, so that the clamping seat is separated from the chip testing seat, clamping and fixing of the LDO chip are loosened, and the LDO chip is convenient to take down.

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