Automatic testing device for integrated circuit

Abstract

The utility model relates to the technical field of integrated circuit automatic test equipment, in particular to an integrated circuit automatic test device. Comprising a testing device body, an adjusting device is arranged on one side of the testing device body, the adjusting device comprises two adjusting blocks, the two adjusting blocks are fixedly connected with the two ends of the side face of the testing device body respectively, and rotating rods rotationally penetrate through the inner walls of the adjusting blocks; the two ends of the arc face of the rotating rod are fixedly connected with the same moving plate, and an adjusting rod penetrates through one inner wall of the moving plate in a threaded mode. According to the integrated circuit automatic testing device provided by the utility model, after the connecting line is connected with the connecting port of the testing device, the surface of the line body of the connecting line can be clamped through the adjusting device, so that the contact stability of the connecting line and the connecting port of the testing device can be improved through clamping, and the loosening of the connecting line and the connecting port during contact is avoided; and the accuracy of the test result of the test device on the integrated circuit is influenced.

Description

Technical Field

[0001] This utility model relates to the field of automatic testing equipment for integrated circuits, and in particular to an automatic testing device for integrated circuits. Background Technology

[0002] Integrated circuit automatic test equipment is a device used to automatically test the functions, performance, reliability and other parameters of integrated circuits. It performs batch testing in an automated manner and is widely used in the design verification, production testing and quality control of integrated circuits.

[0003] Utility model CN219162005U discloses an automatic testing device for integrated circuit boards. The key technical points are: it includes an automatic testing device for integrated circuit boards, a camera fixedly connected to the bottom of the testing cabinet, a support frame fixedly connected to the surface of the support platform via an adjusting motor, and several placement racks for placing integrated circuit boards on the surface of the support frame. This utility model, by setting up a camera, support frame, adjusting motor, and placement racks, allows the integrated circuit board to be tested to be placed on the placement rack. Under the action of a compression cylinder, the circuit board can be compressed and fixed by a compression rod. Thus, under the action of the adjusting motor, it can be rotated to the bottom of the camera for filming, enabling rapid observation and achieving continuous testing. This solves the problem that current methods for inspecting the appearance of circuit boards mostly rely on manual visual inspection with the assistance of inspection equipment, which is not conducive to batch testing.

[0004] Regarding the aforementioned issues, the following technical defects exist: An automatic test device for integrated circuits is a device used to test the functionality, performance, and reliability of integrated circuits. It performs rapid and accurate testing of integrated circuits through automation. Typically, when using the test device, the integrated circuit is inserted into the test port, and a connecting cable is plugged into the connection port. The test device then tests the integrated circuit, and the connecting cable transmits the integrated circuit's output signal back to the test system for measurement. However, with the connecting cable constantly connected to the test device's connection port, external factors can cause the connection to loosen. This loosening of the connecting cable and the connection port affects the overall stability of the test device and the accuracy of its testing of integrated circuits.

[0005] Therefore, it is necessary to provide a new type of automatic testing device for integrated circuits to solve the above-mentioned technical problems. Utility Model Content

[0006] The purpose of this invention is to solve the problem in the prior art where the connection between the connecting wire and the connection port of the test device is loosened under external factors after a long period of time. This loosening of the connecting wire and the connection port affects the stability of the entire test device and the accuracy of the test device in testing integrated circuits.

[0007] To solve the above-mentioned technical problems, this utility model provides an automatic testing device for integrated circuits, comprising: a testing device body, an adjustment device provided on one side of the testing device body, the adjustment device including two adjustment blocks, the two adjustment blocks being fixedly connected to both ends of the side of the testing device body respectively, a rotating rod rotatably passing through the inner wall of the adjustment block, a common moving plate being fixedly connected to both ends of the arc surface of the rotating rod, an adjustment rod threaded through one inner wall of the moving plate, a contact block being fixedly connected to one end of the arc surface of the adjustment rod, a clamping block being rotatably connected to the other end of the arc surface of the adjustment rod, and guide rods being fixedly connected to both ends of the clamping block near the side of the adjustment block, both guide rods slidingly passing through the other inner wall of the moving plate.

[0008] The aforementioned components achieve the following effect: The automatic test device for integrated circuits is a testing equipment used to test the functionality, performance, and reliability of integrated circuits. Through automation, it performs rapid and accurate testing of integrated circuits. Typically, when using the test device, the integrated circuit is inserted into the test port of the test device, and a connecting wire is plugged into the connection port of the test device. The integrated circuit can then be tested by the test device. The connecting wire transmits the output signal of the integrated circuit back to the test system for measurement. However, with the connecting wire connected to the connection port of the test device for a long time, the connection may loosen under external factors. This loosening of the connecting wire and the connection port affects the stability of the entire test device and the accuracy of the test of integrated circuits. In this case, an adjustment device can be used to clamp the surface of the connecting wire, thereby improving the stability of the contact between the connecting wire and the test device.

[0009] Preferably, four contact pads are fixedly connected to the side of the clamping block away from the adjusting rod, and the cross-section of the contact pads is arc-shaped.

[0010] The effect achieved by the above components is that when the clamping block comes into contact with the connecting wire, the contact pad installed on the clamping block can increase the friction when the clamping block comes into contact with the connecting wire, thereby improving the stability when the clamping block comes into contact with the connecting wire.

[0011] Preferably, both ends of the arc surface of the rotating rod are fitted with coil springs, and the two ends of the coil springs are fixedly connected to the adjusting block and the moving plate, respectively.

[0012] The effect achieved by the above components is that when the limiting effect on the connecting line is released, the coil spring installed on the rotating rod will quickly drive the moving plate to move, thereby facilitating the quick contact between the clamping block and the connecting line.

[0013] Preferably, the arc surface of the contact block is provided with a plurality of anti-slip grooves, and the plurality of anti-slip grooves are evenly distributed on the arc surface of the contact block.

[0014] The effect achieved by the above components is that when the adjusting rod is rotated by the contact block, the anti-slip groove on the contact block can increase the friction of the contact block surface, making it easier for the user to rotate the adjusting rod by the contact block.

[0015] Preferably, the guide rod is a titanium alloy rod.

[0016] The effect achieved by the above components is that the guide rod made of titanium alloy has a relatively hard surface, and it is less likely to deform even after long-term use, resulting in a better service life.

[0017] Preferably, an auxiliary device is provided on the side of the testing device body. The auxiliary device includes four connecting rods, which are arranged in pairs. The two pairs of connecting rods are fixedly connected to the two sides of the testing device body. A limit block is fixedly connected to the end of the arc surface of the connecting rod away from the testing device body. A connecting block is rotatably connected to the arc surface of the connecting rod. The four connecting blocks are arranged in pairs. The same connecting rope is fixedly connected to the side of each pair of connecting blocks that is close to each other. The same adjusting belt is fixedly connected to the side of each pair of connecting ropes that is close to each other.

[0018] The effect achieved by the above-mentioned components is that when moving the main body of the testing device, the auxiliary device can be used to move the main body of the testing device, thereby increasing the speed of moving the main body of the testing device and improving the efficiency and stability of moving the main body of the testing device.

[0019] Preferably, an anti-slip sleeve is fixedly connected to the surface of the adjustment belt, and the anti-slip sleeve has anti-slip texture on its side.

[0020] The effect achieved by the above components is that when the test device body is pulled by the adjustment belt, the anti-slip sleeve installed on the adjustment belt can increase the friction of the adjustment belt surface, thereby improving the stability of the adjustment belt.

[0021] Compared with related technologies, the automatic testing device for integrated circuits provided by this utility model has the following advantages:

[0022] This utility model provides an automatic testing device for integrated circuits. By setting an adjustment device, after the connecting wire is connected to the connection port of the testing device, the surface of the connecting wire can be clamped by the adjustment device. This clamping improves the stability of the contact between the connecting wire and the connection port of the testing device, and avoids loosening when the two are in contact, which would affect the accuracy of the testing results of the integrated circuit.

[0023] By setting up an auxiliary device, the position of the test device body can be moved when the test device is moved. The auxiliary device can improve the stability of the test device when the user moves the test device and prevent the test device from slipping out of the hand when moving the test device. Attached Figure Description

[0024] Figure 1 A schematic diagram of the structure of an automatic testing device for integrated circuits provided by this utility model;

[0025] Figure 2 for Figure 1 The diagram shows the structure of the regulating device.

[0026] Figure 3 for Figure 1 A partially enlarged schematic diagram of the adjustment device shown;

[0027] Figure 4 for Figure 1 The diagram shows the structure of the auxiliary device.

[0028] The following are the labels in the diagram: 1. Test device body; 2. Adjustment device; 201. Adjustment block; 202. Rotating rod; 203. Moving plate; 204. Adjustment rod; 205. Clamping block; 206. Contact block; 207. Guide rod; 208. Contact pad; 209. Anti-slip groove; 210. Coil spring; 3. Auxiliary device; 31. Connecting rod; 32. Limiting block; 33. Connecting block; 34. Connecting rope; 35. Adjustment belt; 36. Anti-slip sleeve. Detailed Implementation

[0029] To make the objectives, technical solutions, and advantages of this utility model clearer, the present utility model will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present utility model and are not intended to limit the present utility model.

[0030] The specific implementation of this utility model will be described in detail below with reference to specific embodiments.

[0031] Please see Figures 1 to 4The present invention provides an automatic testing device for integrated circuits, comprising: a testing device body 1, an adjustment device 2 on one side of the testing device body 1, and an auxiliary device 3 on the side of the testing device body 1.

[0032] In the embodiments of this utility model, please refer to Figure 2 and Figure 3The adjustment device 2 includes two adjustment blocks 201, which are fixedly connected to the two ends of the side of the test device body 1. A rotating rod 202 rotatably passes through the inner wall of the adjustment block 201. The same moving plate 203 is fixedly connected to both ends of the arc surface of the rotating rod 202. An adjustment rod 204 is threaded through one inner wall of the moving plate 203. A contact block 206 is fixedly connected to one end of the arc surface of the adjustment rod 204, and a clamping block 205 is rotatably connected to the other end of the arc surface of the adjustment rod 204. Guide rods 207 are fixedly connected to both ends of the clamping block 205 near the adjustment block 201. Both guide rods 207 slide through the other inner wall of the moving plate 203. The automatic test device body 1 for integrated circuits is a device for testing integrated circuits. This testing equipment performs functional, performance, and reliability tests on integrated circuits (ICs) using automated methods. Typically, when using the test device body 1, the IC is inserted into the test port of the test device body 1, and a connecting cable is plugged into the connection port of the test device body 1. The IC can then be tested through the test device body 1, and the connecting cable transmits the IC's output signal back to the test system for measurement. However, with the connecting cable remaining connected to the connection port of the test device body 1 for an extended period, external factors can cause the connection to loosen. This loosening of the connecting cable and the connection port affects the overall stability of the test device body 1 and its ability to perform accurate tests on the ICs. To improve the accuracy of the test, the surface of the connecting wire can be clamped by the adjustment device 2. This adjustment device 2 improves the stability of the contact between the connecting wire and the test device body 1. Four contact pads 208 are fixedly connected to the side of the clamping block 205 away from the adjustment rod 204. The cross-section of the contact pads 208 is arc-shaped. When the clamping block 205 contacts the connecting wire, the contact pads 208 on the clamping block 205 increase the friction between the clamping block 205 and the connecting wire, thus improving the stability of the contact between the clamping block 205 and the connecting wire. Coil springs 210 are fitted at both ends of the arc surface of the rotating rod 202. The two ends of the coil springs 210 are fixedly connected to the adjustment block 201 and the moving plate 203, respectively. When the connection is released... When the wiring is in a limited position, the coil spring 210 installed on the rotating rod 202 will quickly drive the moving plate 203 to move, thereby facilitating the quick contact between the clamping block 205 and the connecting wire. The arc surface of the contact block 206 is provided with several anti-slip grooves 209, which are evenly distributed on the arc surface of the contact block 206. When the adjusting rod 204 is rotated by the contact block 206, the anti-slip grooves 209 on the contact block 206 can increase the friction of the surface of the contact block 206, making it easier for the user to rotate the adjusting rod 204 by the contact block 206. The guide rod 207 is a titanium alloy rod. The surface of the guide rod 207 made of titanium alloy is relatively hard, and its surface is less likely to deform after long-term use, resulting in a better service life.

[0033] In the embodiments of this utility model, please refer to Figure 4 The auxiliary device 3 includes four connecting rods 31, which are arranged in pairs. The two pairs of connecting rods 31 are fixedly connected to both sides of the test device body 1. A limit block 32 is fixedly connected to the end of the connecting rod 31 away from the test device body 1. A connecting block 33 is rotatably connected to the arc surface of the connecting rod 31. The four connecting blocks 33 are arranged in pairs. The same connecting rope 34 is fixedly connected to the side of each pair of connecting blocks 33 that is close to each other. The same adjusting belt 35 is fixedly connected to the side of each pair of connecting ropes 34 that is close to each other. When testing the device… When the main body 1 is moved, the auxiliary device 3 can be used to move the main body 1 of the test device. The auxiliary device 3 can increase the speed of moving the main body 1 of the test device, and improve the efficiency and stability of moving the main body 1 of the test device. The surface of the adjusting belt 35 is fixedly connected with the anti-slip sleeve 36. The side of the anti-slip sleeve 36 is provided with anti-slip texture. When the main body 1 of the test device is pulled by the adjusting belt 35, the anti-slip sleeve 36 installed on the adjusting belt 35 can increase the friction of the surface of the adjusting belt 35, thereby improving the stability of using the adjusting belt 35.

[0034] The working principle of the automatic integrated circuit testing device provided by this utility model is as follows: Rotating the rotating rod 202 on the adjusting block 201 causes the moving plate 203 to rotate, moving the moving plate 203 towards the connecting wire. At this time, the adjusting rod 204 can be rotated on the moving plate 203 through the contact block 206. The movement of the adjusting rod 204 causes the clamping block 205 to move, and the clamping block 205 slides along the direction of the guide rod 207. Thus, the adjusting rod 204 can drive the clamping block 205 to move towards the connecting wire, thereby clamping the connecting wire.

[0035] When moving the test device body 1, the connecting rope 34 can be pulled by adjusting the belt 35. The connecting rope 34 will rotate on the connecting rod 31, so the test device body 1 can be lifted by adjusting the belt 35 in conjunction with the connecting rod 31, thus facilitating the movement of the test device body 1.

[0036] The circuits and controls involved in this utility model are all existing technologies, and will not be described in detail here.

[0037] The above description is merely an embodiment of this utility model and does not limit the patent scope of this utility model. Any equivalent structural or procedural transformations made based on the description and drawings of this utility model, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of this utility model.

Claims

1. An automatic testing device for integrated circuits, characterized in that, include: The test device body (1) has an adjustment device (2) on one side. The adjustment device (2) includes two adjustment blocks (201). The two adjustment blocks (201) are fixedly connected to the two ends of the side of the test device body (1). A rotating rod (202) is rotatably passed through the inner wall of the adjustment block (201). The same moving plate (203) is fixedly connected to both ends of the arc surface of the rotating rod (202). An adjustment rod (204) is threaded through one of the inner walls of the moving plate (203). A contact block (206) is fixedly connected to one end of the arc surface of the adjustment rod (204). A clamping block (205) is rotatably connected to the other end of the arc surface of the adjustment rod (204). Guide rods (207) are fixedly connected to both ends of the clamping block (205) near the side of the adjustment block (201). Both guide rods (207) slide through the other inner wall of the moving plate (203).

2. The integrated circuit automatic testing device according to claim 1, characterized in that, Four contact pads (208) are fixedly connected to the side of the clamping block (205) away from the adjusting rod (204), and the cross-section of the contact pads (208) is arc-shaped.

3. The automatic testing device for integrated circuits according to claim 1, characterized in that, Both ends of the arc surface of the rotating rod (202) are fitted with coil springs (210), and the two ends of the coil springs (210) are fixedly connected to the adjusting block (201) and the moving plate (203) respectively.

4. The automatic testing device for integrated circuits according to claim 1, characterized in that, The contact block (206) has a plurality of anti-slip grooves (209) on its arc surface, and the plurality of anti-slip grooves (209) are evenly distributed on the arc surface of the contact block (206).

5. The automatic testing device for integrated circuits according to claim 1, characterized in that, The guide rod (207) is a titanium alloy rod.

6. The automatic testing device for integrated circuits according to claim 1, characterized in that, The test device body (1) is provided with an auxiliary device (3) on its side. The auxiliary device (3) includes four connecting rods (31). The four connecting rods (31) are in pairs. The two sets of connecting rods (31) are fixedly connected to the two sides of the test device body (1). The end of the arc surface of the connecting rod (31) away from the test device body (1) is fixedly connected to a limiting block (32). The arc surface of the connecting rod (31) is rotatably connected to a connecting block (33). The four connecting blocks (33) are in pairs. The same connecting rope (34) is fixedly connected to the side of each set of connecting blocks (33) that is close to each other. The same adjusting belt (35) is fixedly connected to the side of the two connecting ropes (34) that are close to each other.

7. The automatic testing device for integrated circuits according to claim 6, characterized in that, The surface of the adjusting belt (35) is fixedly connected to an anti-slip sleeve (36), and the side of the anti-slip sleeve (36) is provided with anti-slip texture.

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