Up-press testing device

Abstract

The utility model relates to power device detection technical field discloses an upper pressure testing device, include: base frame, conveying mechanism, upper pressure mechanism and testing mechanism, conveying mechanism installs on the base frame, and the conveying end of conveying mechanism is installed with upper pressure mechanism, and the upper pressure mechanism is used for loading the device to be detected, testing mechanism includes at least two test components, and at least two test components are along the transport direction interval arrangement of conveying mechanism, the bottom of testing mechanism is provided with test mouth, and conveying mechanism can move upper pressure mechanism and the device to be detected to the below of any test component, and upper pressure mechanism can drive the device to be detected vertical movement to approach or away from testing mechanism. Through above -mentioned device, the component of several different functions of conveying mechanism, upper pressure mechanism and testing mechanism is integrated, saves the equipment space, improves the test efficiency, reduces the test cost, improves the effectiveness and safety of test, guarantees the stability in the product test process.

Description

Technical Field

[0001] This utility model relates to the field of power device testing technology, specifically to an up-voltage testing device. Background Technology

[0002] In the semiconductor industry, power devices are essential electronic components. They are devices designed for the safe and efficient handling and management of high current, high voltage, and high power. Their primary function is to convert electrical energy from one form to another, such as converting low voltage and low current to high voltage and high current, and direct current (DC) to alternating current (AC). Therefore, power devices play a crucial role in electrical energy conversion and are fundamental to electrical equipment, playing a vital role in fields such as new energy vehicles, photovoltaics, industry, military, and aerospace. Commonly used power devices include diodes, IGBTs, GTRs, MOSFETs, and SCRs.

[0003] There are many types of tests available for power devices. Taking the IGBT, the most widely used device in the market, as an example, the main test items include: collector-emitter voltage, collector-emitter saturation voltage, and collector cutoff current. When testing VCES, the voltage can reach 10kV, and when testing VCE, the current can reach 1000A. Therefore, the safety and stability requirements for the test location are very high.

[0004] As mentioned above, testing power devices requires switching between different test items. Currently, the main testing method for high-power devices is to place the device at the test station using a robotic arm or manually, then control the test head to press down and contact the device for testing. After the test is completed, the device is removed before moving on to the next test. When testing the next item, the product needs to be moved to the next testing equipment. This method has problems such as complex and cumbersome control, slow speed, high cost, safety issues, and poor protection of the device. Utility Model Content

[0005] In view of this, this utility model provides an up-pressure testing device to solve the problem that existing technologies for testing power devices require switching between different test items. Currently, the main testing method for high-power devices is to place the power device at the testing station using a robotic arm or manually, then control the test head to press down and contact the device for testing. After the test is completed, the device is removed before moving on to the next device. When testing the next item, the product needs to be moved to the next testing equipment. This method has problems such as complex and cumbersome control, slow speed, high cost, safety issues, and poor protection of the device.

[0006] In a first aspect, this utility model provides a pressure testing device, comprising:

[0007] Base frame;

[0008] A conveying mechanism is mounted on the base frame, and an upper pressing mechanism is installed at the conveying end of the conveying mechanism for loading the device to be tested.

[0009] A testing mechanism comprising at least two testing components, wherein the at least two testing components are spaced apart along the transport direction of the conveying mechanism;

[0010] The testing mechanism has a test port at its bottom. The conveying mechanism can move the pressing mechanism and the device under test to the area below any of the testing components. The pressing mechanism can also move the device under test vertically to move closer to or further away from the testing mechanism.

[0011] Beneficial effects: By integrating several components with different functions, such as the conveying mechanism, the pressing mechanism, and the testing mechanism, the above-mentioned device saves equipment space, improves testing efficiency, reduces testing costs, enhances the effectiveness and safety of testing, and ensures the stability of the product testing process.

[0012] In one alternative embodiment, the base frame is provided with a movable groove along the conveying direction of the conveying mechanism;

[0013] The transmission mechanism includes:

[0014] A lead screw transmission unit is installed at the bottom of the base frame;

[0015] A first mounting plate is installed on the transmission end of the lead screw transmission unit;

[0016] The lead screw transmission unit can drive the first mounting plate to reciprocate within the movable groove.

[0017] Beneficial effects: The lead screw transmission unit enables rapid transmission and high-precision positioning at various workstations.

[0018] In one alternative implementation, the pressing mechanism includes:

[0019] An upper pressure cylinder is mounted on the first mounting plate;

[0020] A device quick-cut assembly is connected to the upper pressure cylinder and is used to load the device to be tested;

[0021] The upper pressure cylinder can drive the device quick-cut assembly to move vertically to approach or move away from the test mechanism.

[0022] Beneficial effects: The device under test is pressed from bottom to top to complete the test, which is convenient and quick. The device quick-change component can quickly position the device when switching between different device fixtures. With the pre-adjusted fixture mounting block, no further adjustment is needed when changing device fixtures, thereby improving the speed of product switching and the accuracy of testing.

[0023] In one alternative implementation, the device fast-switching assembly includes:

[0024] A quick-cut mounting plate for components, which is mounted on the moving end of the upper pressure cylinder;

[0025] A fixture mounting block is installed on the side of the device quick-cut mounting plate near the testing mechanism, and a first fixture positioning hole is provided on the fixture mounting block;

[0026] A jig adjustment block is provided, and several jig adjustment blocks are arranged around the quick-cut mounting plate of the device near the test mechanism; the jig mounting block is placed between several jig adjustment blocks, and the jig adjustment block is used to adjust the position of the jig mounting block;

[0027] The device fixture has a second fixture positioning hole, and a positioning pin is inserted into the first fixture positioning hole and the second fixture positioning hole to position and install the device fixture on the fixture mounting block; the device fixture has a mounting groove for installing the device to be tested on the side near the testing mechanism.

[0028] Beneficial effects: The device fixture is customized according to the shape of different devices under test. Its material is an insulating, high-temperature resistant composite material with a concave appearance. Together with the test block, it encloses the device under test during testing, preventing safety issues and product testing stability problems caused by high temperatures, arcing, and current breakdown. It also enables rapid switching and positioning of devices under test of different specifications.

[0029] In one alternative implementation, the testing facility further includes:

[0030] Test support members, wherein at least two test support members are provided, and the at least two test support members are spaced apart on both sides of the movable groove along a first direction perpendicular to the transmission direction of the conveying mechanism;

[0031] The test board base plate has its two sides fixed to the test support members on both sides of the movable groove, thereby forming a movable area between the test board base plate and the base frame;

[0032] The test board base plate has a first test through hole corresponding to the test component.

[0033] In one alternative implementation, the test component includes:

[0034] A test mounting plate is fixed to the test board base plate on the side away from the base frame; a second test through hole is provided on the test mounting plate corresponding to the first test through hole;

[0035] A test probe is fixed to the test mounting plate relative to the second test through hole, and the test end of the test probe is adapted to face the base frame;

[0036] A test circuit board cover is disposed on the side of the test mounting plate away from the base frame, and the opening of the test circuit board cover faces the second test through hole to cover the test probe inside it;

[0037] An aviation connector is fixed to the outer casing of the test circuit board. One end of the aviation connector is connected to the test probe, and the other end of the aviation connector is adapted to be connected to an external test device.

[0038] Beneficial effects: The aviation connector is fixed to the outer casing of the test circuit board. One end of the aviation connector is connected to the test probes, and the pins of the aviation connector are connected to the test probes one by one. The other end of the aviation connector is suitable for connecting to external testing equipment. The aviation connector performs specific tests on the product by connecting to external testing equipment. In this embodiment, the two test circuit board outer casings are equipped with different aviation connectors to connect to different testing machines for other tests.

[0039] In one alternative implementation, the testing component further includes:

[0040] A probe clamping plate is fixed at the step of the test probe;

[0041] A test pressure block is installed at the bottom of the test mounting plate, and a third test through hole is provided on the test pressure block corresponding to the first test through hole.

[0042] Beneficial effects: The probe clamp is fixed at the step of the test probe, pressing down on all test probes on the test probe mounting plate to secure them. The test clamp is installed at the bottom of the test mounting plate, and a third test through hole is opened on the test clamp corresponding to the first test through hole. The test probe is inserted into the third test through hole. The test clamp limits the movement of the device's fast-cut assembly during the pressure test, preventing excessive compression of the test probe and affecting its lifespan. The test clamp is made of insulating high-temperature resistant composite material, and its main purpose is to surround the device under test during the test, providing protection. The test probe mounting plate, probe clamp, and test assembly are all made of insulating high-temperature resistant composite material.

[0043] In one optional embodiment, the pressure testing device further includes a receiving mechanism; the receiving mechanism includes a throwing component and a storage component, the throwing component being used to receive the tested device that has passed the test, and the storage component being used to store the tested device that has passed the test.

[0044] Beneficial effects: The first and second storage slots are used to store qualified test devices. Using the feeding and moving unit, the devices to be tested can be automatically moved from the feeding assembly to the first and second storage slots, achieving automatic sorting and storage of the devices.

[0045] In one alternative implementation, the throwing assembly includes:

[0046] A chute support is provided, which is mounted on the first mounting plate.

[0047] A first and a second discharge trough are disposed at an interval on the discharge trough support, and are used to receive the tested device that has passed the test.

[0048] In one alternative implementation, the storage assembly includes:

[0049] A material storage tank support is installed on the side of the base frame away from the testing mechanism;

[0050] A first storage tank and a second storage tank are arranged at an interval on the storage tank support. The first storage tank and the second storage tank are used to store the tested device that has passed the test. The first storage tank is arranged opposite to the first discharge tank, and the second storage tank is arranged opposite to the second discharge tank.

[0051] The material feeding and moving unit is fixed on the base frame. The material feeding and moving unit can hook the device to be tested in the material throwing assembly to the first storage tank and the second storage tank, and drive the device to be tested on the first storage tank and the second storage tank from the side closer to the testing mechanism to the side farther away from the testing mechanism. Attached Figure Description

[0052] To more clearly illustrate the specific embodiments of this utility model or the technical solutions in the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this utility model. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0053] Figure 1 This is a schematic diagram of the overall structure of a pressure testing device according to an embodiment of the present invention;

[0054] Figure 2 This is a schematic diagram of the conveying mechanism according to an embodiment of the present utility model;

[0055] Figure 3 This is a schematic diagram of the material receiving mechanism according to an embodiment of the present utility model;

[0056] Figure 4 This is a schematic diagram of the testing mechanism according to an embodiment of the present invention;

[0057] Figure 5 This is a schematic diagram of the structure of the device fast-switching assembly according to an embodiment of the present invention;

[0058] Figure 6 This is a schematic diagram showing the cooperation between the pressing mechanism and the testing mechanism in an embodiment of this utility model.

[0059] Explanation of reference numerals in the attached figures:

[0060] 1. Base frame; 11. Main mounting plate; 12. Conveying mechanism support; 13. Conveying mechanism mounting base plate; 14. Moving groove; 15. Origin sensor mounting sheet metal; 16. First sensor; 17. Second sensor; 18. Origin sensing element;

[0061] 2. Conveying mechanism; 21. Lead screw conveying unit; 22. First mounting plate;

[0062] 3. Pressing mechanism; 31. Pressing cylinder; 32. Quick-cut component assembly; 321. Quick-cut component mounting plate; 322. Fixture mounting block; 323. Fixture adjusting block; 324. Component fixture; 325. Fixture through-beam sensor mounting block; 326. Third sensor; 327. Pressing component positioning pin;

[0063] 4. Testing mechanism; 41. Testing support; 42. Testing circuit board base plate; 421. First test through hole; 43. Testing assembly; 431. Testing mounting plate; 4311. Second test through hole; 432. Testing probe; 433. Testing circuit board cover; 434. Aviation connector; 435. Probe pressure plate; 436. Testing pressure block; 4361. Third test through hole; 437. Testing probe mounting plate; 4371. Second probe positioning hole;

[0064] 5. Receiving mechanism; 51. Throwing assembly; 511. Throwing trough support; 512. First throwing trough; 513. Second throwing trough; 52. Storage assembly; 521. Storage trough support; 522. First storage trough; 523. Second storage trough; 53. Feeding moving unit; 531. Slide cylinder; 532. Feeding cylinder; 533. Feeding claw; 54. Throwing through-beam sensor mounting block; 55. Throwing through-beam sensor; 56. Storage through-beam sensor mounting block; 57. Storage through-beam sensor;

[0065] 6. Cable chain sheet metal; 61. Cable chain;

[0066] 7. Device to be tested; 71. First probe positioning hole. Detailed Implementation

[0067] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of this utility model.

[0068] In the semiconductor industry, power devices are essential electronic components. They are devices designed for the safe and efficient handling and management of high current, high voltage, and high power. Their primary function is to convert electrical energy from one form to another, such as converting low voltage and low current to high voltage and high current, and direct current (DC) to alternating current (AC). Therefore, power devices play a crucial role in electrical energy conversion and are fundamental to electrical equipment, playing a vital role in fields such as new energy vehicles, photovoltaics, industry, military, and aerospace. Commonly used power devices include diodes, IGBTs, GTRs, MOSFETs, and SCRs.

[0069] There are many types of tests available for power devices. Taking the IGBT, the most widely used device in the market, as an example, the main test items include: collector-emitter voltage, collector-emitter saturation voltage, and collector cutoff current. When testing VCES, the voltage can reach 10kV, and when testing VCE, the current can reach 1000A. Therefore, the safety and stability requirements for the test location are very high.

[0070] As mentioned above, testing power devices requires switching between different test items. Currently, the main testing method for high-power devices is to place the device at the test station using a robotic arm or manually, then control the test head to press down and contact the device for testing. After the test is completed, the device is removed before moving on to the next test. When testing the next item, the product needs to be moved to the next testing equipment. This method has problems such as complex and cumbersome control, slow speed, high cost, safety issues, and poor protection of the device.

[0071] The following is combined Figures 1 to 6 The following describes embodiments of the present invention.

[0072] According to an embodiment of the present invention, a pressure testing device is provided, comprising: a base frame 1, a conveying mechanism 2, a pressure mechanism 3, and a testing mechanism 4.

[0073] like Figures 1 to 2 As shown, the base frame 1 includes a main mounting plate 11, a conveying mechanism support 12, and a conveying mechanism mounting base plate 13. The main mounting plate 11 has a rectangular clearance opening. Four conveying mechanism supports 12 are provided, each corresponding to one of the four sides of the clearance opening and mounted below the main mounting plate 11. The conveying mechanism supports 12 are placed vertically. The conveying mechanism mounting base plate 13 is mounted at the lower end of the conveying mechanism supports 12, and its four sides are fixed to the four conveying mechanism supports 12. The conveying mechanism mounting base plate 13 and the conveying mechanism supports 12 form a U-shaped structure, which, together with the clearance opening, forms a movable groove 14.

[0074] like Figures 1 to 2 As shown, the conveying mechanism 2 includes a lead screw conveying unit 21 and a first mounting plate 22. The lead screw conveying unit 21 is mounted on the conveying mechanism mounting base plate 13. The conveying section of the lead screw conveying unit 21 is installed in the moving groove 14, and the first mounting plate 22 is mounted on the conveying end of the lead screw conveying unit 21. The lead screw conveying unit 21 can drive the first mounting plate 22 to reciprocate along the conveying direction within the moving groove 14. In addition, a cable chain sheet metal 6 is also mounted on the conveying mechanism mounting base plate 13. The cable chain 61 is mounted on the cable chain sheet metal 6, and components such as wiring are placed inside the cable chain 61 to prevent them from being touched and worn by other components during repeated movement.

[0075] Along the transmission direction, at the edge of the moving groove 14 on the upper surface of the main mounting plate 11, two origin sensor mounting plates 15 are provided. These two plates correspond to the starting and ending points of the transmission mechanism 2, respectively. A first sensor 16 is mounted on the plate away from the test structure, and a second sensor 17 is mounted on the plate closer to the test structure. An origin sensing plate 18 is fixed to the side of the throwing groove support 511 on the main mounting plate 11 near the first and second sensors 16 and 17. By setting the origin sensing plate 18, the first sensor 16, and the second sensor 17, the start and stop points of the lead screw transmission unit 21 are controlled, achieving rapid transmission and high-precision positioning at each workstation.

[0076] like Figure 6 As shown, the pressing mechanism 3 includes a pressing cylinder 31 and a device quick-cut assembly 32. There are two pressing cylinders 31. The two pressing cylinders 31 are fixed together by a pressing cylinder 31 mounting plate. The moving ends of the two pressing cylinders 31 face upward. The two pressing cylinders 31 are fixed together by a pressing cylinder 31 mounting plate on the upper surface of the first mounting plate 22 near the test mechanism 4.

[0077] The device quick-cut assembly 32 includes: a device quick-cut mounting plate 321, a fixture mounting block 322, a fixture adjusting block 323, and a device fixture 324. The device quick-cut mounting plate 321 is mounted on the moving end of two upper pressure cylinders 31, which drive the device quick-cut mounting plate 321 up and down, improving stability. Several fixture adjusting blocks 323 are arranged in a ring at intervals on the upper surface of the device quick-cut mounting plate 321 away from the base frame 1. These fixture adjusting blocks 323 form a mounting area in the middle, used for mounting the fixture mounting blocks 322. Each fixture adjusting block 323 has a horizontally opening adjustment hole. The axis of the adjustment hole passes through the mounting area, allowing screws or other adjusting components to be inserted through the adjustment holes and into the mounting area to adjust the position of the fixture mounting block 322 within the mounting area. After ensuring the relative parallelism between the fixture mounting block 322 and the test mounting plate 431 in the test mechanism 4, the fixture is fixed to ensure that the relative positions of the pins on the device under test 7 and the test probe 432 are aligned, thereby improving test accuracy and the lifespan of the test probe 432. The fixture mounting block 322 is installed in the installation area and has several first fixture positioning holes. A limiting protrusion is also provided in the middle of the fixture mounting block 322. The device fixture 324 has a second fixture positioning hole corresponding to the first fixture positioning hole, and a limiting hole is provided on the device fixture 324 corresponding to the limiting protrusion. The two ends of the upper pressure component positioning pin 327 are respectively inserted into the first fixture positioning hole and the second fixture positioning hole to position and install the device fixture 324 on the fixture mounting block 322. At this time, the limiting protrusion is inserted into the limiting hole. The upper surface of the device fixture 324 away from the base frame 1 has a mounting groove for installing the device under test 7. By utilizing the positioning pin 327 of the upper pressure component, the first fixture positioning hole, and the second fixture positioning hole, rapid positioning is achieved when switching between different component fixtures. In conjunction with the pre-adjusted fixture mounting block 322, no further adjustment is required when changing component fixtures, thereby improving the speed of product switching and testing accuracy.

[0078] In this embodiment, the device fixture 324 is customized according to the shape of different devices 7 to be tested. Its material is an insulating high-temperature resistant composite material, and its appearance is concave. Together with the test pressure block 436, it covers the device 7 to be tested during the test, so as to prevent safety problems and product test stability problems caused by high temperature, electric arc generation and current breakdown during the test.

[0079] like Figure 5 and Figure 6As shown, two fixture through-beam sensor mounting blocks 325 are arranged opposite each other on both sides of the device quick-cut mounting plate 321. A third sensor 326 is mounted on each of the two fixture through-beam sensor mounting blocks 325, and the two third sensors 326 are arranged opposite each other. The third sensor 326 is used to detect whether the device 7 to be tested has been placed on the device fixture 324.

[0080] like Figures 4 to 6 As shown, the testing mechanism 4 includes: a test support 41, a test circuit board base plate 42, and test components 43. Two test support 41s are provided, spaced apart on both sides of the moving groove 14 along a first direction perpendicular to the transmission direction of the conveying mechanism 2. The test support 41s are vertically positioned, forming a stable double-leg support structure. The test circuit board base plate 42 is horizontally overlapped on the two test support 41s, with its sides fixed to the tops of the two test support 41s respectively. Due to the height of the test support 41s, a moving area is left between the test circuit board base plate 42 and the base frame 1. Two test components 43 are provided, spaced apart along the transmission direction of the conveying mechanism 2. The test circuit board base plate 42 has two first test through holes 421 corresponding to the two test components 43. Taking one test component 43 as an example, its specific structure is described. The test component 43 includes: a test mounting plate 431, a test probe 432, a test circuit board cover 433, and an aviation connector 434. The test mounting plate 431 is mounted on the upper surface of the test circuit board base plate 42 away from the base frame 1. From a top view, the horizontal cross-sectional area of ​​the test mounting plate 431 is larger than the horizontal cross-sectional area of ​​the first test through hole 421. The test mounting plate 431 fully covers the corresponding first test through hole 421. The test mounting plate 431 has a second test through hole 4311 corresponding to the first test through hole 421. Several test probes 432 are fixed on the test probe mounting plate 437. The test probes 432 are fixed on the test mounting plate 431 relative to the second test through hole 4311. The test ends of the test probes 432 pass vertically downward through the second test through hole 4311 and the first test through hole 421. The test circuit board cover 433 is fixed on the test mounting plate 431 with its opening facing downward. The test circuit board cover 433 covers the test probes 432 inside, which can protect the test probes 432. An aviation connector 434 is fixed to the test circuit board cover 433. One end of the aviation connector 434 is connected to the test probe 432, and the pins of the aviation connector 434 are connected to the test probe 432 one by one. The other end of the aviation connector 434 is adapted to connect to external testing equipment. The aviation connector 434 performs specific tests on the product by connecting to external testing equipment. In this embodiment, the two test circuit board covers 433 are equipped with different aviation connectors 434 to connect to different testing machines for other tests.

[0081] like Figure 4 and Figure 6 As shown, the test assembly 43 also includes a probe pressure plate 435 and a test pressure block 436. The probe pressure plate 435 is fixed at the step of the test probe 432, pressing down on all the test probes 432 on the test probe mounting plate 437 to fix the test probes 432. The test pressure block 436 is installed at the bottom of the test mounting plate 431, and the test pressure block 436 has a third test through hole 4361 corresponding to the first test through hole 421. The test probe 432 is inserted into the third test through hole 4361. The test pressure block 436 limits the movement of the device quick-cut assembly 32 during the pressure test, preventing excessive compression of the test probe 432 and affecting its lifespan. The test pressure block 436 is made of insulating high-temperature resistant composite material, and its main purpose is to surround the device under test 7 during the test, providing protection. The test probe mounting plate 437, the probe pressure plate 435, and the test assembly 43 are all made of insulating high-temperature resistant composite material.

[0082] like Figure 3 As shown, the pressure testing device also includes a receiving mechanism 5; the receiving mechanism 5 includes a throwing component 51 and a storage component 52. The throwing component 51 is used to receive the tested and qualified devices 7, and the storage component 52 is used to store the tested and qualified devices 7. Specifically, the throwing component 51 includes a throwing trough support 511, a first throwing trough 512 and a second throwing trough 513. There are two throwing trough supports 511, which are installed at intervals along a first direction on the first mounting plate 22. The first storage trough 522 and the second storage trough 523 are arranged at intervals on the two storage trough supports 521, and the first storage trough 522 and the second storage trough 523 are used to store the tested and qualified devices 7.

[0083] The material storage assembly 52 includes: a material storage tank support 521, a first material storage tank 522, a second material storage tank 523, and a material feeding and moving unit 53. The material storage tank support 521 is installed on the side of the base frame 1 away from the testing mechanism 4. There are two material storage tank supports 521, which are spaced apart along a first direction. The first material storage tank 522 and the second material storage tank 523 are spaced apart from each other on the two material storage tank supports 521. The material feeding and moving unit 53 is fixed on the base frame 1. The material feeding and moving unit 53 can hook the device to be tested 7 in the material feeding assembly 51 onto the first material storage tank 522 and the second material storage tank 523, and will move the device to be tested 7 on the first material storage tank 522 and the second material storage tank 523 from the side closer to the testing mechanism 4 to the side away from the testing mechanism 4. The material feeding and moving unit 53 includes a slide cylinder 531, a feeding cylinder 532, and a claw 533. The slide cylinder 531 is installed between two storage slot supports 521. The feeding cylinder 532 is fixed to the side of the slide cylinder 531 closest to the test structure, with the moving end of the feeding cylinder 532 facing upwards. The claw 533 is fixed to the moving end of the feeding cylinder 532. With the above configuration, the material feeding and moving unit 53 can automatically feed the device 7 to be tested from the throwing assembly 51 to the first storage slot 522 and the second storage slot 523, realizing automatic sorting and storage of the device 7 to be tested.

[0084] The receiving mechanism 5 also includes a pair of material throwing through-beam sensor mounting blocks 54, a pair of material throwing through-beam sensors 55, a pair of material storage through-beam sensor mounting blocks 56, and a pair of material storage through-beam sensors 57. The pair of material throwing through-beam sensor mounting blocks 54 are respectively positioned opposite each other on the first material throwing trough 512 and the second material throwing trough 513. The pair of material throwing through-beam sensors 55 are respectively fixed to the material throwing through-beam sensor mounting blocks 54 on both sides, and are positioned opposite each other. Similarly, the pair of material storage through-beam sensor mounting blocks 56 are respectively positioned opposite each other on the first material storage trough 522 and the second material storage trough 523. The pair of material storage through-beam sensors 57 are respectively fixed to the material storage through-beam sensor mounting blocks 56 on both sides.

[0085] In other embodiments, the pressing assembly further includes a pressing assembly positioning pin 327. The two sides of the device under test 7 are provided with first probe positioning holes 71, and the test probe mounting plate 437 is provided with second probe positioning holes 4371 corresponding to the first probe positioning holes 71. The two ends of the pressing assembly positioning pin 327 can be inserted into the first probe positioning holes 71 and the second probe positioning holes 4371 respectively to ensure accurate alignment between the test probe 432 and the pins of the device under test 7 during the test.

[0086] The working process of the pressure testing device provided in this embodiment is as follows:

[0087] First, the lead screw transmission unit 21 pushes the first mounting plate 22 to move, causing the pressing mechanism 3 and the throwing assembly 51 to move towards the receiving assembly. It stops when the origin sensing plate 18 senses proximity to the first sensor 16, and the first throwing trough 512 and the second throwing trough 513 are spaced one millimeter apart from the first storage trough 522 and the second storage trough 523. At this point, the pressing mechanism 3 is located in the area between the receiving mechanism 5 and the testing mechanism 4; this position is the loading position. After receiving the arrival signal, the robotic arm and other mechanisms place the device to be tested 7 from top to bottom onto the device fixture 324. The light emitted by the third sensor 326 is blocked by the device to be tested 7. After detecting that the device to be tested 7 is in place, the lead screw transmission unit 21 pushes the pressing mechanism 3 and the throwing assembly 51 to a test position below a test circuit board cover 433 near the receiving mechanism 5. The lead screw transmission unit 21 stops moving when the positioning pin 327 of the pressing assembly aligns with the second probe positioning holes 4371 on both sides of the test block 436; this position is the first test position. At this time, the pressing cylinder 31 extends upwards. During this process, the device under test 7 is pushed upwards by the pressing cylinder 31. The pins on the device under test 7 contact the test probe 432 and begin to press the test probe 432 upwards. During this process, the device under test 7 and the test probe mounting plate 437 are parallel to each other to shorten the pressure difference between the various test probes 432 during the pressing process. The test probe 432 is compressed and generates a downward thrust, thereby ensuring that all test probes 432 contact the corresponding pins of the device under test 7. In addition, during the test, the test block 436, device fixture, probe pressure plate 435, and test probe mounting plate 437 surround the device under test 7, forming a test cavity for protection. During the pressing process, the pressing component positioning pin 327 in the second probe positioning hole 4371 passes through the first probe positioning holes 71 on both sides of the device under test 7, performing secondary positioning of the device under test 7 to ensure that the reference of the test probe 432 and the pins of the device under test 7 does not deviate during the test. Then, power is applied to perform the first test.

[0088] After the first test is completed, the upper pressure cylinder 31 retracts downwards, and the device quick-cut assembly 32 and the device under test 7 mounted on it move downwards together until the upper pressure cylinder 31 retracts to its lowest point, at which point the movement stops. Then, the lead screw transmission unit 21 pushes the upper pressure mechanism 3, the device quick-cut assembly 32, and the device under test 7 mounted on it to a test position below a test circuit board cover 433, away from the receiving mechanism 5. When the positioning pins 327 of the upper pressure assembly at this test position align with the second probe positioning holes 4371 on the left and right sides of the test pressure block 436, the lead screw transmission unit 21 stops moving. This is the second test position. At this time, the pressing cylinder 31 extends upwards. During this process, the device under test 7 is pushed upwards by the pressing cylinder 31. The pins on the device under test 7 contact the test probe 432 and begin to press the test probe 432 upwards. During this process, the device under test 7 and the test probe mounting plate 437 are parallel to each other to shorten the pressure difference between the various test probes 432 during the pressing process. The test probe 432 is compressed, generating a downward thrust, thereby ensuring that all test probes 432 contact the corresponding pins of the device under test 7. During the pressing process, the pressing component positioning pin 327 in the second probe positioning hole 4371 passes through the first probe positioning holes 71 on both sides of the device under test 7, performing secondary positioning of the device under test 7 to ensure that the reference of the test probe 432 and the pins of the device under test 7 does not deviate during the test. In addition, during the test, the test pressure block 436, the device fixture, the probe pressure plate 435, and the test probe mounting plate 437 surround the device under test 7, forming a test cavity for protection. Then, power is applied to perform the corresponding second test.

[0089] After the second test is completed, the upper pressure cylinder 31 retracts downwards, and the device quick-cut assembly 32 and the device under test 7 mounted on it move downwards together until the upper pressure cylinder 31 retracts to its lowest point, at which point the movement stops. Then, the lead screw transmission unit 21 pushes the upper pressure mechanism 3, the device quick-cut assembly 32, and the device under test 7 mounted on it toward the storage assembly 52. ​​The movement stops when the origin sensing plate 18 senses proximity to the first sensor 16, and the first and second throwing troughs 512 and 513 are spaced one millimeter apart from the first and second storage troughs 522 and 523. At this point, the next action is performed based on the test results. If the test is passed, the robotic arm lifts the device under test 7 from bottom to top and places it from top to bottom onto the surface enclosed by the first and second throwing troughs 512 and 513. The throwing beam sensor 55 detects whether the light is blocked; if the light is blocked by the device under test 7, it is determined that the device under test 7 is in place. The slide cylinder 531 in the material feeding and moving unit 53 extends to the front, pushing the claw 533 mounted on it upward to the top, located between the first material feeding trough 512 and the second material feeding trough 513. Then, the slide cylinder 531 retracts the cylinder. At this time, the claw 533, with the slide cylinder 531 retracted, contacts and pushes the device to be tested 7 away from the placement surface above the first material feeding trough 512 and the second material feeding trough 513 to the placement surface above the first storage trough 522 and the second storage trough 523. Then, when the next device to be tested 7 that has been tested arrives, the previous device to be tested 7 that entered the first storage trough 522 and the second storage trough 523 will be pushed inward by the next device to be tested, gradually advancing forward in a superimposed manner to increase the number. When the material is full, the device to be tested 7 blocks the light of a pair of storage photoelectric sensors 57, that is, the storage photoelectric sensors 57 detect that the material is full and alarm to prompt the staff to clean the device to be tested 7 on the first storage trough 522 and the second storage trough 523.

[0090] The aforementioned device integrates several components with different functions, saving equipment space, improving testing efficiency, reducing testing costs, enhancing the effectiveness and safety of testing, and ensuring the stability of the product testing process.

[0091] Although embodiments of the present invention have been described in conjunction with the accompanying drawings, those skilled in the art can make various modifications and variations without departing from the spirit and scope of the present invention, and such modifications and variations all fall within the scope defined by the appended claims.

Claims

1. A pressure testing device, characterized in that, include: Base frame (1); A conveying mechanism (2) is installed on the base frame (1). The conveying end of the conveying mechanism (2) is equipped with an upper pressure mechanism (3), which is used to load the device to be tested (7). The testing mechanism (4) includes at least two testing components (43), which are spaced apart along the transport direction of the conveying mechanism (2). The test mechanism (4) has a test port at its bottom end. The transmission mechanism (2) can move the pressing mechanism (3) and the device under test (7) to the bottom of any of the test components (43). The pressing mechanism (3) can drive the device under test (7) to move vertically to get closer to or away from the test mechanism (4).

2. The pressure testing device according to claim 1, characterized in that, The base frame (1) has a movable groove (14) along the conveying direction of the conveying mechanism (2). The transmission mechanism (2) includes: A lead screw transmission unit (21) is installed at the bottom of the base frame (1); The first mounting plate (22) is mounted on the transmission end of the lead screw transmission unit (21); The lead screw transmission unit (21) can drive the first mounting plate (22) to reciprocate within the moving groove (14).

3. The pressure testing device according to claim 2, characterized in that, The pressing mechanism (3) includes: An upper pressure cylinder (31) is mounted on the first mounting plate (22); Device quick-cut assembly (32), which is connected to the upper pressure cylinder (31), is used to load the device to be tested (7). The upper pressure cylinder (31) can drive the device quick-cut assembly (32) to move vertically to approach or move away from the test mechanism (4).

4. The pressure testing device according to claim 3, characterized in that, The device fast-switching assembly (32) includes: A quick-cut mounting plate (321) is mounted on the moving end of the upper pressure cylinder (31); A fixture mounting block (322) is installed on the side of the device quick-cut mounting plate (321) near the test mechanism (4). A first fixture positioning hole is provided on the fixture mounting block (322). A jig adjustment block (323) is provided in a plurality of such jig adjustment blocks (323), which are arranged around the device quick-cut mounting plate (321) on the side near the test mechanism (4); a jig mounting block (322) is placed between the plurality of jig adjustment blocks (323), and the jig adjustment blocks (323) are used to adjust the position of the jig mounting block (322); The device fixture (324) has a second fixture positioning hole, and the device fixture (324) is positioned and installed on the fixture mounting block (322) by inserting a positioning pin into the first fixture positioning hole and the second fixture positioning hole; the device fixture (324) has a mounting groove for installing the device to be tested (7) on the side near the test mechanism (4).

5. The pressure testing device according to claim 3, characterized in that, The testing facility (4) also includes: Test support (41), at least two test support (41) are provided, and at least two test support (41) are spaced apart on both sides of the moving groove (14) along a first direction perpendicular to the transmission direction of the conveying mechanism (2); Test board base plate (42), the two sides of the test board base plate (42) are respectively fixed on the test support (41) on both sides of the movable groove (14), so that a movable area is formed between the test board base plate (42) and the base frame (1); The test board base plate (42) has a first test through hole (421) corresponding to the test component (43).

6. The pressure testing device according to claim 5, characterized in that, The test component (43) includes: Test mounting plate (431), the test mounting plate (431) is fixed on the side of the test board base plate (42) away from the base frame (1); a second test through hole (4311) is opened on the test mounting plate (431) corresponding to the first test through hole (421). Test probe (432), the test probe (432) is fixed on the test mounting plate (431) relative to the second test through hole (4311), and the test end of the test probe (432) is adapted to face the base frame (1). Test circuit board cover (433), the test circuit board cover (433) is disposed on the side of the test mounting plate (431) away from the base frame (1), the opening of the test circuit board cover (433) faces the second test through hole (4311) to cover the test probe (432) inside it; An aviation connector (434) is fixed on the outer cover (433) of the test circuit board. One end of the aviation connector (434) is connected to the test probe (432), and the other end of the aviation connector (434) is adapted to be connected to an external test device.

7. The pressure testing device according to claim 6, characterized in that, The test component (43) also includes: A probe clamp (435) is fixed at the step of the test probe (432); Test pressure block (436) is installed at the bottom of the test mounting plate (431). The test pressure block (436) has a third test through hole (4361) corresponding to the first test through hole (421).

8. The pressure testing device according to claim 2, characterized in that, The pressure testing device also includes a receiving mechanism (5); the receiving mechanism (5) includes a throwing component (51) and a storage component (52), the throwing component (51) is used to receive the tested device (7) that has passed the test, and the storage component (52) is used to store the tested device (7) that has passed the test.

9. The pressure testing device according to claim 8, characterized in that, The throwing assembly (51) includes: A chute support (511) is mounted on the first mounting plate (22); The first discharge trough (512) and the second discharge trough (513) are arranged at a distance from each other on the discharge trough support (511). The first discharge trough (512) and the second discharge trough (513) are used to receive the tested device (7) that has passed the test.

10. The pressure testing device according to claim 9, characterized in that, The storage component (52) includes: A storage tank support (521) is installed on the side of the base frame (1) away from the test mechanism (4); A first storage tank (522) and a second storage tank (523) are arranged at intervals on the storage tank support (521). The first storage tank (522) and the second storage tank (523) are used to store the tested device (7) that has passed the test. The first storage tank (522) is arranged opposite to the first discharge tank (512), and the second storage tank (523) is arranged opposite to the second discharge tank (513). Material feeding and moving unit (53) is fixed on the base frame (1). The material feeding and moving unit (53) can hook the device to be tested (7) in the throwing assembly (51) onto the first storage tank (522) and the second storage tank (523), and drive the device to be tested (7) on the first storage tank (522) and the second storage tank (523) to move from the side close to the test mechanism (4) to the side away from the test mechanism (4).

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