CT imaging system
CN224383172UActive Publication Date: 2026-06-19SANYING PRECISION INSTR CO LTD
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SANYING PRECISION INSTR CO LTD
- Filing Date
- 2025-06-17
- Publication Date
- 2026-06-19
AI Technical Summary
Technical Problem
Existing CT systems require precision mechanical rotating mechanisms, which increases the difficulty of processing, assembly and control, and produces motion artifacts during the imaging process.
Method used
Employing an electron beam deflection system and a vacuum chamber design, the electron beam is controlled by the deflection system to bombard the transmission target at multiple angles within a vacuum environment. The sample detection structure receives the transmitted X-ray beam, enabling sample imaging and avoiding mechanical movement.
Benefits of technology
It improves CT scanning efficiency, reduces X-ray energy for sample detection, protects samples, eliminates imaging artifacts, simplifies system structure, and reduces costs.
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Smart Images
Figure CN224383172U_ABST
Abstract
The utility model relates to CT imaging technical field discloses a kind of CT imaging systems, comprising: pedestal, electron beam generating structure, deflection system and sample detection mechanism, vacuum chamber is opened in pedestal, and the one end of vacuum chamber is equipped with transmission target;Electron beam generating structure is installed in vacuum chamber, and electron beam generating structure is used to generate electron beam;Deflection system is installed in the one end of vacuum chamber close to transmission target, and deflection system is used to control electron beam deflection direction and angle.The utility model of a kind of CT imaging system, projection is carried out to electron beam deflection, trigger speed is fast, improve the efficiency of CT scanning, reduce the X-ray energy absorbed by sample detection, protect sample.The utility model utilizes electron beam deflection and can be realized in different angles on the imaging of sample, sample detection structure does not need to be moved, the components of entire CT imaging system keep unmoved in the process of imaging, solve the imaging artifact problem caused by traditional static CT mechanical motion scanning mode.
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