Magnet falling-off inspection device and magnet falling-off inspection system
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SHENZHEN HONOR SMART MASCH CO LTD
- Filing Date
- 2025-04-18
- Publication Date
- 2026-06-26
Smart Images
Figure CN224416680U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of electronic equipment inspection technology, and in particular to a magnet detachment inspection device and a magnet detachment inspection system. Background Technology
[0002] In today's electronic device industry, numerous innovative designs have emerged to enhance product functionality and user experience. Take foldable phones as an example: the use of magnets on the frame utilizes the interaction between magnets to achieve a stable connection between the two components when closed, greatly facilitating user portability and use, and becoming a key element in the design of foldable phones.
[0003] However, existing technologies face numerous challenges in achieving this functionality. Among these, the issue of magnetic components or individual magnets detaching from the phone's frame is particularly prominent. Magnetic components consist of a base and a magnet mounted within it. The base is installed on the phone's frame. Because the magnetic components and frame are typically bonded with a thin adhesive layer, and the base and magnet are also bonded with a thin adhesive layer, and given the frequent opening and closing of the phone during daily use and the potential for external impacts, the currently used magnetic components and individual magnets are highly susceptible to detachment. Once detached, this directly and severely impacts the phone's opening and closing function, potentially causing screen damage due to abnormal forces during opening and closing, and also resulting in unusual noises. For concealed magnetic components or individual magnets, once loosening occurs, the process is often irreversible due to the specific installation location, requiring the user to send the phone for repair. This not only increases usage costs but also reduces product reliability and user satisfaction.
[0004] To address the aforementioned issues, the stability of magnetic components or individual magnets is currently widely inspected manually during the product manufacturing process. The conventional testing method involves using a matching component—a part that matches the device being tested and also contains a magnetic component or individual magnet (e.g., in the case of foldable phones, if the device being tested is one component, the matching component is the other). This component is directly attracted to the magnet and simulates the opening and closing process of a phone to determine if the magnetic component or individual magnet has become loose. However, this manual inspection method has significant drawbacks. Firstly, the frequent attraction and opening / closing operations easily cause scratches on the product's exterior and damage to internal parts, reducing product quality. Secondly, manual operation is highly susceptible to subjective factors, leading to missed detections and making it impossible to ensure accurate testing of the stability of the magnetic components or individual magnets for every product. Furthermore, manual operation makes it difficult to precisely control the attraction force and angle, hindering accurate and comprehensive testing of the attraction performance of the magnetic components or individual magnets, and failing to meet increasingly stringent product quality requirements. Summary of the Invention
[0005] This application provides a magnet detachment inspection device and a magnet detachment inspection system, which solves the technical problems of inaccuracy and inefficiency in the inspection of magnets on electronic devices in the prior art.
[0006] The technical solution is as follows:
[0007] The first aspect of this application provides a magnet detachment testing device, applied to an electronic device to be tested. The electronic device to be tested includes a main body and a magnet part mounted on the main body. The magnet detachment testing device includes a body, a first testing part, and a second testing part. Both the first testing part and the second testing part are mounted on the body. The second testing part includes a movable part, which is disposed opposite to the first testing part and is movably mounted on the body along a first direction, wherein the first direction is the direction in which the movable part approaches and moves away from the first testing part. The magnet detachment testing device also includes a magnetic part. One of the first testing part and the movable part is used to mount the electronic device to be tested, and the magnetic part is mounted on the other of the first testing part and the movable part. The movable part has a test position in the first direction. When the movable part moves to the test position, the magnetic part can provide a test magnetic force to the magnet that moves away from the direction of the main body.
[0008] This application utilizes a first testing unit and a second testing unit with a movable part that moves along a first direction. One unit houses the electronic device to be tested, while the other houses a magnetic part. The movable part can reach a predetermined testing position, and the magnetic part simulates the external force that might cause the magnet to separate from the main body during actual use. It applies a test magnetic force to the magnet in a direction away from the main body. Compared to traditional manual inspection using a matching part for adsorption, this significantly improves the accuracy of testing whether the magnet easily detaches from the main body. It completely avoids the problem of "three damages" (exterior scratches, internal component damage, etc.) caused by frequent direct operation during traditional manual inspection, effectively ensuring product quality and reducing the defect rate. The entire process is completed through the mechanical movement of the device, unlike the tedious manual operation of opening and closing the matching parts one by one. It enables batch and rapid magnet detachment testing of electronic devices, free from subjective human interference. A standardized inspection process can be performed on each electronic device to be tested, effectively eliminating the common omissions in manual inspection.
[0009] In some implementations, the position of the magnetic force section corresponds to the position of the magnet section. This ensures that the test magnetic force generated by the magnetic force section during the inspection process can act precisely on the magnet section, making the simulated external force detaching from the main body more targeted and effective. This improves the accuracy of detecting whether the magnet is prone to detachment, avoids misjudgments due to deviations in the magnetic force action, and strongly guarantees the reliability of product quality inspection.
[0010] In some implementations, the magnetic component is mounted on the moving component, and the first testing unit includes a support assembly for supporting the electronic device to be inspected. The support assembly is fixed to the first testing unit, ensuring the electronic device is stably positioned within it. This prevents collisions and friction caused by movement during inspection, eliminating the risk of scratches, internal component displacement, or damage. This effectively maintains the integrity and quality of the product and significantly reduces the defect rate caused by inspection operations.
[0011] In some implementations, the second test unit further includes a drive assembly mounted on the main body, with a moving part mounted on the output end of the drive assembly. The drive assembly drives the moving part to move along a first direction. The drive assembly can precisely and stably drive the moving part to move along the first direction, ensuring the smoothness and controllability of the movement process. This allows the magnetic part to accurately reach its position according to a preset path and speed when approaching or moving away from the magnet part of the electronic device under test, thereby providing a stable and accurate test magnetic force to the magnet part.
[0012] In some implementations, the magnet detachment testing device further includes a limiting part, which is positioned between the first testing part and the moving part. When the moving part is in the testing position, the limiting part stops the moving part from moving towards the first testing part, thus keeping the moving part in the testing position. The limiting part ensures the moving part remains stable in the testing position, allowing the magnetic part to stably apply a test magnetic force away from the main body at the testing distance, accurately replicating the actual force applied. This significantly improves the accuracy of testing whether the magnet is prone to detaching from the main body and avoids testing errors caused by changes in the testing distance or unstable magnetic force due to displacement of the moving part.
[0013] In some implementations, the limiting part includes a limiting protrusion. The first end of the limiting protrusion is mounted on the second test part, and the second end of the limiting protrusion protrudes from the moving part and abuts against the electronic device or carrier component to be tested. Upon reaching the test position, the protruding part abuts against the electronic device or carrier component to be tested, thus limiting the movement and effectively preventing the moving part from continuing to move towards the first test part, ensuring that the moving part is accurately maintained in the test position.
[0014] In some implementations, the second testing unit further includes a force measuring unit. The movable part is movably mounted on the output end of the driving component along the first direction, and the output end of the driving component is connected to the movable part via the force measuring unit. In terms of inspection accuracy, the force measuring unit can accurately measure in real time the force generated by the driving component during the driving of the movable part, that is, the magnitude of the test magnetic force applied by the magnetic force unit to the magnet part of the electronic device under test. This allows inspectors to accurately determine the stability of the connection between the magnet part and the main body based on precise force data, avoiding misjudgments due to unclear magnetic force magnitude, and greatly improving the accuracy and reliability of the inspection results.
[0015] In some implementations, the output end of the drive component includes a first guide structure, and the moving part is provided with a second guide structure. Both the first and second guide structures extend along a first direction, and cooperate to guide the movement of the moving part relative to the output end of the drive component. The two work together to form a stable guide path, ensuring that the moving part moves strictly in a straight line along the first direction relative to the output end of the drive component, avoiding inaccurate measurements due to deviation.
[0016] In some implementations, the support component includes a support platform for supporting the electronic equipment to be inspected. A fixing element is provided on the support platform for fixedly connecting the fixing element to the electronic equipment. This fixed connection further strengthens the equipment's stability, preventing vibration or other external forces from causing the equipment to shake or shift during inspection, thus eliminating potential scratches on the product's exterior or damage to internal parts.
[0017] In some implementations, the fixing element includes multiple clamping blocks spaced circumferentially along the support platform, forming a clamping space. At least two of the clamping blocks abut against the electronic device to be inspected, thus clamping and fixing the device. The arrangement of multiple clamping blocks is compatible with electronic devices of various shapes and sizes. By adjusting the number and position of the clamping blocks involved in the abutment, it can flexibly adapt to devices of different sizes and shapes to be inspected. Whether it is a regular rectangular device or an irregularly shaped electronic product, reliable fixing can be achieved, significantly broadening the applicability of the inspection device.
[0018] In some implementations, the clamping block is made of an elastic material. This flexible material effectively cushions external forces when the clamping block contacts the electronic device under inspection and applies clamping force, preventing damage such as hard scratches and indentations to the device surface. It is particularly suitable for electronic devices whose casing materials are prone to marking, greatly maintaining the product's appearance integrity and quality. The elastic material can adaptively deform according to the device's shape, closely conforming to the device's contours and providing a uniform and stable clamping force.
[0019] In some implementations, a guide ramp is provided on the inner wall of the end of the clamping block furthest from the support platform. The guide ramp gradually slopes inward toward the clamping space along the direction closest to the support platform. The guide ramp plays a guiding role, and by gradually slopes inward toward the clamping space, the equipment can be more smoothly introduced into the clamping position, reducing operational difficulties caused by inaccurate positioning or placement angle deviations. It can also cause the clamping block to gradually deform and clamp the electronic equipment to be inspected.
[0020] In some implementations, the support assembly also includes a positioning element, which is disposed on the support platform and its position corresponds to the positioning structure of the electronic device to be tested. The positioning element precisely matches the device positioning structure (the perforated or columnar structure on the electronic device frame), guiding the operator to quickly and accurately place the device in the predetermined position on the support platform, greatly shortening the device installation time, and ensuring precise alignment of the magnetic part and the magnet part.
[0021] In some implementations, the limiting protrusions in this application embodiment are multiple, and all of the multiple limiting protrusions abut against the electronic device to be tested or the supporting component. Alternatively, some of the multiple limiting protrusions abut against the electronic device to be tested, while others abut against the supporting component. The multiple limiting protrusions abut from different positions, which can more precisely restrict the further movement of the moving part when it reaches the test position, ensuring that the moving part is stably maintained in the test position. This allows the magnetic part and the magnet part to maintain a precise test distance, ensuring that the test magnetic force is accurately applied to the magnet part, greatly improving the accuracy of testing the connection stability between the magnet and the main body.
[0022] In some implementations, the magnet detachment testing device further includes a third guide structure and a fourth guide structure. The third guide structure is disposed on the first testing unit, and the fourth guide structure is disposed on the moving unit. Both the third and fourth guide structures extend along a first direction and cooperate to guide the movement of the moving unit. The cooperation of the third and fourth guide structures provides precise and stable guidance for the movement of the moving unit, enabling it to move strictly in a straight line along the first direction under the drive of the drive component, accurately reaching the testing position.
[0023] In some implementations, the magnet detachment testing device also includes a balancing unit positioned between the output end of the drive assembly and the main body end of the drive assembly. The balancing unit allows the output end of the drive assembly to swing appropriately. When the moving part reaches the test position, multiple guide protrusions will experience a reaction force from the electronic device under test and / or the supporting assembly. Since the shape of the electronic device under test may have slight deviations, or its placement on the support platform may have minor errors, without the balancing unit, some guide protrusions may not be able to effectively abut.
[0024] In some implementations, there are multiple magnet parts and magnetic force parts, with the positions of the multiple magnetic force parts corresponding to the positions of multiple magnet parts. Multiple magnetic force parts can simultaneously inspect magnet parts at different locations on the electronic device. Compared to inspecting them one by one, this greatly shortens the inspection time, significantly reduces the inspection time for a single batch of electronic devices to be inspected, and effectively improves the overall inspection efficiency.
[0025] In some implementations, the machine body includes a base and a frame. The frame is mounted on the base, and a first testing unit is mounted on the base. A transverse guide is provided on the frame, and a second testing unit is mounted on the transverse guide to allow the second testing unit to move along a second direction, which is perpendicular to the first direction. By moving the second testing unit in the second direction, the magnet to be tested can be more accurately aligned, making the relative position between the magnetic part and the magnet part more precise.
[0026] The second aspect of this application provides a magnet detachment inspection system. The magnet detachment inspection system includes a magnet detachment inspection device, a control device, and a display device. The control device is electrically connected to the magnet detachment inspection device, and the display device is electrically connected to the control device. The magnet detachment inspection device is the aforementioned magnet detachment inspection device.
[0027] Since the magnet detachment inspection system includes the magnet detachment inspection device, it possesses at least all the beneficial effects of the magnet detachment inspection device, which will not be elaborated further here. Attached Figure Description
[0028] Figure 1 This is a schematic diagram of the structure of the electronic device to be tested;
[0029] Figure 2 yes Figure 1 Enlarged view of region A in the middle;
[0030] Figure 3 This is a simplified structural diagram of the magnet detachment inspection device provided in the embodiments of this application;
[0031] Figure 4 This is a schematic diagram of the magnet detachment inspection device provided in the embodiments of this application;
[0032] Figure 5 yes Figure 4 A magnified view of a portion of region B in the middle;
[0033] Figure 6 This is a schematic diagram of the structure of the second test section provided in an embodiment of this application;
[0034] Figure 7 This is a schematic diagram of the left side of the magnet detachment inspection device provided in the embodiments of this application;
[0035] Figure 8 yes Figure 7 A magnified view of a portion of region C in the middle;
[0036] Figure 9 This is a schematic diagram of the magnet detachment inspection device provided in the embodiments of this application from another angle;
[0037] Figure 10 yes Figure 9 A magnified view of a portion of region D in the middle;
[0038] Figure 11 This is a schematic diagram of the structure of the support platform provided in the embodiments of this application;
[0039] Figure 12 This is a schematic diagram of the structure of the clamping block provided in the embodiment of this application;
[0040] The meanings of the various symbols in the attached icons are as follows:
[0041] 100. Electronic equipment to be inspected; 1. Main body; 2. Magnet part;
[0042] 10. Body; 11. Base; 12. Frame; 13. Lateral guide section;
[0043] 20. First test section; 21. Bearing assembly; 22. Bearing platform; 23. Fixing component; 231. Clamping block; 2311. Guide ramp; 2312. Positioning component;
[0044] 30. Second testing section; 31. Moving section; 32. Drive assembly; 33. Force measuring section; 34. First guide structure; 35. Second guide structure;
[0045] 40. Magnetic Department;
[0046] 50. Limiting part; 51. Limiting protrusion;
[0047] 60. Third guiding structure; Detailed Implementation
[0048] To make the objectives, technical solutions, and advantages of this application clearer, the embodiments of this application will be further described in detail below with reference to the accompanying drawings. The embodiments described with reference to the accompanying drawings are exemplary and intended to explain this application, and should not be construed as limiting this application.
[0049] In the description of this application, it should be understood that the terms "length", "width", "thickness", "top", "bottom", "inner", "outer", "upper", "lower", "left", "right", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application.
[0050] To facilitate a clear description of the technical solutions of this application, the terms "first" and "second" are used to distinguish identical or similar items with essentially the same function and effect. Those skilled in the art will understand that the terms "first" and "second" do not limit the quantity or execution order, and that the terms "first" and "second" do not necessarily imply that they are different.
[0051] In this application, unless otherwise expressly specified and limited, the terms "connected" and "linked" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.
[0052] In this application, "and / or" is merely a way of describing the relationship between related objects, indicating that three relationships can exist; for example, A and / or B can represent three cases: A existing alone, A and B existing simultaneously, and B existing alone. Additionally, the character " / " in this document generally indicates that the preceding and following related objects have an "or" relationship.
[0053] It should be noted that, in this application, the words "in one embodiment," "exemplarily," and "for example" are used to indicate examples, illustrations, or descriptions. Any embodiment or design described in this application as "in one embodiment," "exemplarily," or "for example" should not be construed as being more preferred or advantageous than other embodiments or designs. Specifically, the use of words such as "in one embodiment," "exemplarily," and "for example" is intended to present the relevant concepts in a specific manner.
[0054] As described in the background section, the stability of magnetic components or individual magnets is currently widely inspected manually during product manufacturing. The conventional testing method involves using a matching component—a part that matches the device being inspected and also contains a magnetic component or individual magnet (e.g., in the case of foldable phones, if the device being inspected is one component, the matching component is the other)—to directly adsorb and simulate the opening and closing process of a phone, thereby determining whether the magnetic component or individual magnet has become loose. However, this manual inspection method has significant drawbacks. On the one hand, the frequent adsorption and opening / closing operations easily cause scratches on the product's exterior and damage to internal parts, reducing product quality. On the other hand, manual operation is greatly affected by subjective factors, easily leading to missed inspections and making it impossible to ensure that the stability of the magnetic component or individual magnet of every product is accurately tested. Furthermore, manual operation makes it difficult to precisely control the adsorption force and angle, failing to accurately and comprehensively test the adsorption performance of the magnetic component or individual magnet, and thus failing to meet increasingly stringent product quality requirements.
[0055] See Figures 1 to 4As shown, the magnet detachment inspection device in this embodiment is applied to an electronic device 100 to be inspected. The electronic device 100 includes a main body 1 and a magnet part 2 mounted on the main body 1. The electronic device 100 is an electronic device whose magnet installation stability needs to be inspected during the production process. In the background art, a foldable screen mobile phone is used as an example, which includes a main body 1 and a magnet part 2 mounted on the main body 1. The main body refers to one of the two flip-up main bodies of the foldable screen, or it can be two connected together. In the inspection device of this embodiment, the electronic device 100 to be inspected becomes the object of inspection. The device performs simulated force testing on its magnet part 2 to ensure that the product quality meets the requirements. The magnet detachment inspection device includes a body 10, a first testing part 20, and a second testing part 30. Both the first testing part 20 and the second testing part 30 are mounted on the body 10. The second testing part 30 includes a moving part 31, which is disposed opposite to the first testing part 20 and is movably mounted on the body 10 along a first direction, wherein the first direction is the direction in which the moving part 31 moves towards and away from the first testing part 20. The magnet detachment testing device in this embodiment further includes a magnetic section 40. One of the first testing section 20 and the moving section 31 is used to mount the electronic device 100 to be tested, and the magnetic section 40 is mounted on the other of the first testing section 20 and the moving section 31. The moving section 31 has a test position in a first direction. When the moving section 31 moves to the test position, the magnetic section 40 can provide a test magnetic force to the magnet in a direction away from the main body 1. In this magnet detachment testing device, the first direction is defined as the direction in which the moving section 31 approaches and moves away from the first testing section 20. This direction is set to define the movement trajectory of the moving section 31, so that during the testing process, the moving section 31 can approach or move away from the first testing section 20 (or vice versa) along a specific path, thereby enabling the magnetic section 40 mounted on the moving section 31 or the first testing section 20 to accurately apply a test magnetic force to the magnet section 2 of the electronic device 100 to complete the magnet detachment testing operation. After the attraction test, check whether the magnet part 2 is loose or warped relative to the main body 1. If any abnormalities are found, it is sent for repair. If no abnormalities are found, the test is completed.
[0056] It should be noted that the first testing unit 20 and the second testing unit 30 work together. During the inspection process, the first testing unit 20 is responsible for installing the electronic device 100 to be inspected (or the moving unit 31 may install the electronic device 100 to be inspected, and the first testing unit 20 may install the magnetic part 40, depending on the design of the device and the actual inspection requirements), providing a fixed test position for the electronic device 100 so that when the moving unit 31 moves the magnetic part 40 closer, the magnetic part 2 of the electronic device can be accurately inspected.
[0057] When the moving part 31 reaches the test position, the magnetic part 40 mounted on the moving part 31 (or mounted on the first test part 20) interacts with the magnet part 2 of the electronic device 100 under test, completing the magnetic force application operation required for the magnet detachment test. By precisely controlling the position of the moving part 31 in the first direction, the magnetic part 40 can apply a test magnetic force away from the main body 1 to the magnet part 2 of the electronic device 100 under test at the test position. By simulating the external force that the magnet part 2 may experience in actual use, which could cause it to separate from the main body 1, the stability of the magnet part 2 mounted on the main body 1 is tested, and it is determined whether the magnet is prone to detachment.
[0058] In this embodiment, the magnetic part 40 can be a magnet. The magnetic field of the magnet is stable and can continuously output a relatively constant magnetic force. Combined with the moving part 31, it is brought to the test position to accurately simulate the magnetic force on the magnet part 2 when the electronic device is in normal use, reliably detect the magnet falling off, and the structure is simple.
[0059] In this embodiment, the magnetic part 40 can be an electromagnet, and the magnetic field strength can be easily adjusted by changing the magnitude of the current. It can accurately control the test magnetic force for different types and specifications of electronic devices 100 and their magnetic parts 2, thereby improving the accuracy and adaptability of the inspection. It can also achieve rapid opening and closing and precise control of the application time of the magnetic force with the help of the control circuit, which facilitates automated, standardized and efficient batch inspection on the production line.
[0060] The magnet detachment inspection device in this embodiment comprises a first testing unit 20 and a second testing unit 30 with a movable part 31 that moves along a first direction. One part houses the electronic device 100 to be inspected, and the other part houses the magnetic part 40. The movable part 31 can precisely reach the testing position, and the magnetic part 40 can accurately simulate the external force that the magnet part 2 might encounter during actual use, causing it to separate from the main body 1. It applies a test magnetic force to the magnet part 2 in a direction away from the main body 1. Compared to traditional manual inspection using the adsorption of the connecting parts, this significantly improves the accuracy of inspecting whether the magnet easily detaches from the main body 1. It completely avoids the problem of product "three damages" (exterior scratches, internal component damage, etc.) caused by frequent direct operation during traditional manual inspection, effectively ensuring product quality and reducing the defect rate. The entire process is completed through the mechanical movement of the device, unlike the tedious manual operation of opening and closing the connecting parts one by one. It can perform magnet detachment inspections on electronic devices in batches and quickly, without being affected by subjective human factors. A standardized inspection process can be performed on each electronic device 100 to be inspected, effectively eliminating the common omissions in manual inspection.
[0061] In this embodiment, the position of the magnetic part 40 corresponds to the position of the magnet part 2. This ensures that the test magnetic force generated by the magnetic part 40 during the inspection process can accurately act on the magnet part 2, making the simulated external force detaching from the main body 1 more targeted and effective. This improves the accuracy of detecting whether the magnet is prone to detachment, avoids misjudgment due to deviation in the magnetic force action, and effectively guarantees the reliability of product quality inspection. During operation, after the electronic device 100 to be inspected is installed in the first test part 20 (or the moving part 31), the device is activated. The moving part 31 moves along the first direction. At the instant it reaches the test position, since the magnetic part 40 corresponds to the position of the magnet part 2, the magnetic part 40 immediately applies a test magnetic force in a specific direction to the magnet part 2, simulating the external force that the magnet part 2 may experience in actual use, causing it to separate from the main body 1. This verifies the connection stability between the magnet part 2 and the main body 1. The entire process is coherent and efficient, accurately simulating the force scenario.
[0062] See Figure 3 and Figure 6 As shown, in this embodiment, the magnetic part 40 is mounted on the moving part 31. The first testing part 20 includes a supporting component 21, which supports the electronic device 100 to be inspected. The moving part 31 drives the magnetic part 40 to move, and the magnetic force application position can be adjusted according to the different models of the electronic device 100 to be inspected and the position of the magnet part 2. Compared with applying magnetic force at a fixed position, this can significantly improve the accuracy of detecting whether the magnet is easy to fall off. The supporting component 21 is fixed in the first testing part 20, and the electronic device 100 to be inspected is stable after being placed there, avoiding bumps and friction caused by its own movement during the inspection process. This eliminates the possibility of scratches on the appearance, displacement or damage of internal parts, etc., effectively maintaining the integrity and quality of the product and significantly reducing the defect rate caused by the inspection operation.
[0063] The second testing unit 30 in this embodiment further includes a driving component 32, which is mounted on the body 10. A moving part 31 is mounted on the output end of the driving component 32. The driving component 32 drives the moving part 31 to move along a first direction. The driving component 32 can accurately and stably drive the moving part 31 to move along the first direction, ensuring the smoothness and controllability of the movement process. This allows the magnetic part 40 to accurately reach its position according to a preset path and speed when approaching or moving away from the magnet part 2 of the electronic device 100 under test. This provides a stable and accurate test magnetic force to the magnet part 2, greatly improving the accuracy of simulating the force on the magnet part 2 during actual use of the electronic device. It effectively avoids inspection errors caused by deviations in the movement of the moving part 31, significantly improving the inspection accuracy for detecting whether the magnet is easily detached from the body 1. Simultaneously, the automated movement achieved by the driving component 32 replaces manual operation of the moving part 31, greatly improving inspection efficiency. The driving component 32 can be a motor assembly, a cylinder assembly, or the like.
[0064] See Figures 7 to 10 As shown, the magnet detachment testing device in this embodiment further includes a limiting part 50, which is disposed between the first testing part 20 and the moving part 31. When the moving part 31 is in the testing position, the limiting part 50 stops the moving part 31 from moving towards the first testing part 20, so that the moving part 31 is held in the testing position. When the moving part 31 moves towards the first testing part 20 and reaches the testing position, the limiting part 50 acts as a stop, preventing the moving part 31 from moving further and ensuring that it is held stably in that position. The testing position is designed to form a specific testing distance between the magnetic part 40 and the magnet part 2. This distance is a key parameter simulating the force scenario of the magnet part 2 in actual use of the electronic device. In a specific embodiment, the testing distance is 0.3mm to 0.5mm, preferably 0.4mm. The testing distance can be set according to the distance between another magnet on other components that work with the magnet part 2 of the electronic device 100 to be tested.
[0065] The limiting part 50 ensures that the moving part 31 is stable in the test position, allowing the magnetic part 40 to stably apply a test magnetic force away from the main body 1 to the magnet part 2 at the test distance. This accurately reproduces the actual force, greatly improving the accuracy of testing whether the magnet is easily detached from the main body 1, and avoiding test errors caused by changes in the test distance or unstable magnetic force due to the displacement of the moving part 31. In a specific embodiment, when the moving part 31 is in the test position, the attraction force of the magnetic part 40 is 10N to 20N, preferably 15N.
[0066] The limiting part 50 in this embodiment includes a limiting protrusion 51. The first end of the limiting protrusion 51 is mounted on the second test part 30, and the second end of the limiting protrusion 51 protrudes from the moving part 31 and abuts against the electronic device 100 to be tested or the support component 21. During the testing process, when the moving part 31 moves towards the test position, the limiting protrusion 51 moves synchronously with the output end of the drive component 32 and reaches the test position. The protruding part abuts against the electronic device 100 to be tested or the support component 21, playing a limiting role and effectively preventing the moving part 31 from continuing to move towards the first test part 20, ensuring that the moving part 31 is accurately maintained at the test position.
[0067] See Figure 4 and Figure 5As shown, the second test unit 30 in this embodiment further includes a force measuring unit 33. The moving part 31 is movably mounted on the output end of the drive component 32 along the first direction, and the output end of the drive component 32 and the moving part 31 are connected through the force measuring unit 33. In terms of inspection accuracy, the force measuring unit 33 can accurately measure the force generated by the drive component 32 driving the moving part 31 in real time, that is, the magnitude of the test magnetic force applied by the magnetic force unit 40 to the magnet part 2 of the electronic device 100 under test. This allows the inspector to accurately judge the stability of the connection between the magnet part 2 and the main body 1 based on precise force data, avoiding misjudgments due to unclear magnetic force magnitude, and greatly improving the accuracy and reliability of the inspection results. The force feedback provided by the force measuring unit 33 allows the operator to understand the changes in force during the inspection process in a timely manner, and flexibly adjust the drive component 32 according to the actual situation, making the test magnetic force more consistent with the actual use scenario of the electronic device, and achieving more accurate simulation testing.
[0068] The force measuring unit 33 can employ a resistance strain gauge sensor, a tension / compression sensor, etc. A resistance strain gauge sensor operates based on the resistance strain effect. When the sensor is subjected to an external force and deforms, the internal resistance strain gauge deforms, causing a change in resistance value. By measuring the change in resistance value, the magnitude of the external force can be indirectly measured. In the magnet drop test device, the resistance strain gauge sensor is installed between the output end of the drive assembly 32 and the moving part 31. When the drive assembly 32 drives the moving part 31 to move, the sensor is subjected to a force applied by the magnetic part 40 and deforms, causing a change in the resistance value of the resistance strain gauge. The measuring circuit converts the change in resistance value into a voltage or current signal. By processing and analyzing the signal, the magnitude of the force applied by the magnetic part 40 can be obtained. A tension / compression sensor is a sensor capable of simultaneously measuring tension and compression. It typically consists of an elastic body, a strain gauge, and a measuring circuit. In the magnet drop test device, the tension / compression sensor is installed between the output end of the drive assembly 32 and the moving part 31. When the drive assembly 32 drives the moving part 31 to move, the force applied by the magnetic part 40 acts on the tension / compression sensor, causing the elastic body to deform and the resistance value of the strain gauge to change. The measuring circuit converts the change in resistance value into a voltage or current signal, and by processing and analyzing the signal, the magnitude of the force applied by the magnetic part 40 can be obtained.
[0069] See Figure 4 and Figure 5As shown, in this embodiment, the output end of the drive component 32 includes a first guide structure 34, and the moving part 31 is provided with a second guide structure 35. Both the first guide structure 34 and the second guide structure 35 extend along a first direction. The first guide structure 34 and the second guide structure 35 cooperate to guide the movement of the moving part 31 relative to the output end of the drive component 32. In this embodiment, the first and second guide structures 35, which extend along the first direction and cooperate with each other, are provided at the output end of the drive component 32 and the moving part 31. The two cooperate to form a stable guide path, ensuring that the moving part 31 moves strictly in a straight line along the first direction relative to the output end of the drive component 32. This avoids inaccurate measurement by the force measuring part 33 due to deviation, making the measurement by the force measuring part 33 more accurate.
[0070] In this embodiment, the first guide structure 34 is a cylindrical structure, and the second guide structure 35 is a guide hole. Both extend along the first direction and cooperate with each other. The cylindrical first guide structure 34 and the guide hole second guide structure 35 cooperate to provide high-precision guidance for the movement of the moving part 31 relative to the output end of the drive assembly 32. The cylindrical structure slides smoothly within the guide hole, ensuring that the moving part 31 moves strictly in a straight line along the first direction, avoiding deviation or shaking during the movement.
[0071] The support component 21 in this embodiment includes a support platform 22, which supports the electronic device 100 to be inspected. A fixing member 23 is provided on the support platform 22 for fixed connection with the electronic device 100. The support platform 22 provides a stable placement surface for the electronic device 100, ensuring stability throughout the inspection process and preventing positional shifts due to unstable placement, which could affect the relative position of the magnetic part 40 and the magnet part 2. This ensures accurate application of the test magnetic force to the magnet part 2 and improves the accuracy of the connection between the magnet and the main body 1. The fixing member 23, fixedly connected to the electronic device 100, further strengthens the device's fixation, preventing shaking or displacement caused by vibrations or other external forces during inspection, thus eliminating potential scratches on the product's exterior or damage to internal parts. Furthermore, the stable fixing method ensures that the placement of the electronic device 100 is highly consistent during each inspection, greatly improving the repeatability and standardization of the inspection process. Among them, the fastener 23 can be a clamp type, such as a clamping block 231, or a snap-on type, such as an elastic snap-on or a rotating snap-on.
[0072] See Figures 10 to 12As shown, the fixing member 23 in this embodiment includes a plurality of clamping blocks 231. The plurality of clamping blocks 231 are arranged at intervals along the circumference of the support platform 22, and the plurality of clamping blocks 231 surround a clamping space. At least two of the plurality of clamping blocks 231 abut against the electronic device 100 to be tested, so as to clamp and fix the electronic device 100 to be tested. Here, "circumferential" refers to the direction around the periphery of an object or space, and can be applied to various shapes, including but not limited to circles, rectangles, polygons, etc. For example, on a square support platform 22, the direction along its four sides can also be said to be circumferential; for a polygonal object, the direction around each of its sides is also circumferential. It emphasizes the directional characteristics around the periphery of the object, and is not limited to a specific circular shape. Even in an embodiment with two clamping blocks 231, there are only two points, and the clamping space can be between the two points.
[0073] In this embodiment, multiple clamping blocks 231 work together, with at least two clamping blocks 231 abutting against the device. They apply force from different directions, evenly distributing the fixing force and preventing tilting or displacement of the device due to single-point force. This ensures the device is stably fixed on the support platform 22, guaranteeing that even during inspection, the device remains stationary despite vibrations caused by the movement of the moving part 31. This ensures the magnetic part 40 accurately acts on the magnet part 2, greatly improving the accuracy of the connection between the magnet and the main body 1. The multiple clamping blocks 231 are compatible with electronic devices of various shapes and sizes. By adjusting the number and position of the clamping blocks 231 involved in the abutment, different sizes and shapes of devices to be inspected can be flexibly adapted. Whether it is a regular rectangular device or an irregularly shaped electronic product, reliable fixing can be achieved, significantly broadening the applicability of the inspection device.
[0074] The clamping block 231 in this embodiment is made of an elastic material. The elastic material is flexible and resilient; when the clamping block 231 contacts the electronic device 100 to be inspected and applies clamping force, it effectively buffers external forces, preventing damage such as hard scratches and indentations to the device surface. This is especially suitable for electronic devices whose casing materials are prone to leaving marks, greatly maintaining the integrity and quality of the product's appearance. The elastic material can adaptively deform according to the device's shape, closely conforming to the device's contours and providing a uniform and stable clamping force. This allows the magnetic part 40 to accurately apply test magnetic force to the magnet part 2, improving the accuracy of the connection stability between the inspection magnet and the main body 1. Furthermore, the elastic clamping block 231 can adapt to subtle differences in the shape and size of devices, broadening the compatibility of the inspection device with various electronic devices and enhancing the device's practicality.
[0075] In this embodiment, the elastic material can be rubber, silicone, thermoplastic elastomer, etc. Rubber has good elasticity, wear resistance, and insulation, and has a relatively good coefficient of friction, making the electronic device 100 to be tested less likely to loosen.
[0076] See Figure 11 and Figure 12 As shown, in this embodiment, the inner wall of the clamping block 231 at the end furthest from the support platform 22 is provided with a guide slope 2311. The guide slope 2311 gradually slopes inward toward the clamping space along the direction close to the support platform 22. When the operator places the electronic device in the clamping space of the support platform 22, the guide slope 2311 can play a guiding role. Following its gradual slope inward toward the clamping space, the device can be more smoothly introduced into the clamping position, reducing operational difficulties caused by inaccurate positioning or placement angle deviation. It can also cause the clamping block 231 to gradually deform and clamp the electronic device 100 to be inspected.
[0077] In addition, the guide ramp 2311 can also assist in adjusting the position of the moving part 31. As the moving part 31 approaches the clamping block 231, the ramp applies a lateral force for automatic correction. Similarly, the guide ramp 2311 can also assist in adjusting the position of the equipment to be inspected, making it more accurately positioned in the center of the clamping space, ensuring that the multiple clamping blocks 231 apply force evenly to fix the equipment, avoiding the equipment from shifting or shaking due to uneven force, and improving the stability of the fixation.
[0078] See Figure 11 As shown, the support component 21 in this embodiment further includes a positioning element 2312, which is disposed on the support platform 22. The position of the positioning element 2312 corresponds to the position of the positioning structure of the electronic device 100 to be inspected. The positioning element 2312 is precisely adapted to the device positioning structure (the hole-like structure or column-like structure on the electronic device frame), guiding the operator to quickly and accurately place the device in the predetermined position on the support platform 22, greatly shortening the device installation time, and at the same time ensuring precise alignment of the magnetic part 40 and the magnet part.
[0079] In this embodiment, the positioning element 2312 is a positioning pin set on the support platform 22, corresponding to a hole on the electronic device 100 to be inspected (as a positioning hole). When the device is placed on the support platform 22, the positioning pin is inserted into the positioning hole to achieve precise positioning of the device.
[0080] In another embodiment, the positioning element 2312 in this application is a positioning protrusion disposed on the support platform 22, corresponding to a groove (positioning groove) on the electronic device 100 to be inspected. The positioning protrusion is embedded into the positioning groove to achieve positioning of the device. The height and size of the positioning protrusion should be adapted to the positioning groove to ensure a tight fit. In terms of materials, plastic or metal with high hardness can be selected to ensure the reliability of positioning.
[0081] In this embodiment, there are multiple limiting protrusions 51. Each limiting protrusion 51 abuts against the electronic device 100 to be tested or the supporting component 21. Alternatively, some of the multiple limiting protrusions 51 abut against the electronic device 100 to be tested, while others abut against the supporting component 21. The multiple limiting protrusions 51 abut from different positions, which can more precisely restrict the further movement of the moving part 31 when it reaches the test position, ensuring that the moving part 31 is stably maintained in the test position. This allows the magnetic part 40 and the magnet part 2 to maintain a precise test distance, ensuring that the test magnetic force is accurately applied to the magnet part 2, greatly improving the accuracy of testing the connection stability between the magnet and the main body 1. The multiple limiting protrusions 51 share the abutment force, avoiding excessive force at a single point, and ensuring that the electronic device 100 to be tested and the supporting component 21 are subjected to uniform force. This not only prevents damage to the equipment due to excessive local force, protecting the product's appearance and internal structure, but also ensures the stability of the supporting component 21 and extends its service life. In embodiments where a portion of the multiple limiting protrusions 51 abuts against the electronic device 100 to be inspected, and another portion abuts against the supporting component 21, this arrangement of partially abutting the limiting protrusions 51 against the electronic device 100 to be inspected and partially abutting against the supporting component 21 can better accommodate electronic devices 100 to be inspected with different shapes, sizes, and weights. For some devices with special shapes or uneven weight distribution, it can provide more stable support and limiting, enhancing the versatility and applicability of the inspection device.
[0082] In one embodiment of this application, in embodiments where all or part of the limiting protrusions 51 of the magnet detachment testing device abut against the electronic device 100 to be tested, no fixing member 23 is provided. The multiple limiting protrusions 51 can play a certain positioning and limiting role. When all the limiting protrusions 51 abut against the device, they can constrain the device from multiple directions, preventing the device from undergoing large displacement due to force during the process of the moving part 31 reaching the test position and applying the test magnetic force. Even if only part of the limiting protrusions 51 abut against the device, it can still fix the key parts of the device to a certain extent, keeping the device relatively stable during testing. This simplifies the structure of the supporting component 21, reduces manufacturing and maintenance costs, and also shortens the operation time for placing and removing the electronic device 100 to be tested.
[0083] In another embodiment of this application, where all or part of the limiting protrusions 51 of the magnet detachment testing device abut against the electronic device 100 to be tested, the fixing member 23 provides better stability. The fixing member 23 can cooperate with the limiting protrusions 51 to further enhance the fixing effect on the device. For example, when the limiting protrusions 51 are mainly responsible for limiting the displacement of the device in a certain direction, the fixing member 23 can fasten the device from other directions, ensuring reliable fixation of the device in three-dimensional space. In this way, during the testing process, even if the test magnetic force is large or the device is subjected to slight external vibrations, the device position can be ensured to be accurate, avoiding changes in the relative position of the magnetic part 40 and the magnet part 2 due to device shaking, thereby improving the accuracy and reliability of the test results.
[0084] In one embodiment, see Figure 4 and Figure 6 As shown, the first guide structure 34 is one or more of the multiple limiting protrusions 51, and the second guide structure 35 is a guide hole, which saves manufacturing costs and overall weight.
[0085] See Figure 4 and Figure 5 As shown, the magnet detachment testing device in this embodiment further includes a third guide structure 60 and a fourth guide structure. The third guide structure 60 is disposed on the first test part 20, and the fourth guide structure is disposed on the moving part 31. Both the third guide structure 60 and the fourth guide structure extend along the first direction. The third guide structure 60 and the fourth guide structure cooperate to guide the movement of the moving part 31. The cooperation of the third guide structure 60 and the fourth guide structure provides precise and stable guidance for the movement of the moving part 31, enabling the moving part 31 to move in a straight line strictly along the first direction under the drive of the drive component 32, and accurately reach the test position. The magnetic part 40 can accurately correspond to the magnet part 2 of the electronic device 100 to be tested, ensuring that the test magnetic force can be accurately applied to the magnet part 2, thereby greatly improving the accuracy of simulating the force situation of the magnet part 2 in actual use of the electronic device. This not only reduces the risk of wear and damage to internal components caused by unstable movement and extends the service life of the equipment, but also ensures the stability of the electronic equipment 100 under inspection during the inspection process, avoiding collisions or damage caused by the unstable movement of the moving part 31, thus effectively guaranteeing product quality.
[0086] In one embodiment, the third guide structure 60 is a guide rail, and the fourth guide structure is a slider. In another embodiment, the third guide structure 60 is a guide post, and the fourth guide structure is a guide hole.
[0087] The magnet detachment testing device in this embodiment further includes a balancing section, which is disposed between the output end of the drive assembly 32 and the main body 1 end of the drive assembly 32. The balancing section allows the output end of the drive assembly 32 to swing appropriately. When the moving part 31 reaches the test position, multiple guide protrusions will be subjected to the reaction force of the electronic device 100 under test and / or the support assembly 21. Since the shape of the electronic device 100 under test may have slight deviations, or its placement position on the support platform 22 may have slight errors, without the balancing section, some guide protrusions may not be able to effectively abut against the electronic device 100 under test. The presence of the balancing section allows the output end of the drive assembly 32 to adjust its angle relative to the main body 1 end, so that guide protrusions that might otherwise not abut against the main body 1 can abut against the electronic device 100 under test or the support assembly 21 together with other guide protrusions. Multiple guide protrusions can uniformly apply limiting force, ensuring that the moving part 31 is accurately and stably positioned in the test position. This, in turn, maintains a precise test distance and relative position between the magnetic part 40 and the magnet part 2, allowing the test magnetic force to be accurately applied to the magnet part 2, greatly improving the accuracy of testing whether the magnet is easily detached from the main body 1. The main body 1 is the "heart" of the drive assembly 32, responsible for converting and processing the input energy or signal, outputting it in a suitable form to the output end to drive the external load. However, it is not directly connected to the external load; the main body 1 can also be called the output end of the output end. The output end is the part of the drive assembly 32 that outputs energy or motion to the external load. It is directly connected to the external load, transmitting the converted energy or motion from within the drive assembly 32 to the load, causing the load to produce corresponding actions or changes.
[0088] In addition, the balancing section effectively buffers the reaction force received by the guide protrusion. The impact force generated when the guide protrusion abuts is dispersed and absorbed by the balancing section, preventing excessive impact force from being directly transmitted to the drive assembly 32 and other components, reducing wear and damage to components, lowering the equipment failure rate, and extending the service life of the entire inspection device.
[0089] In one embodiment of this application, the balancing part includes a hinge made of an elastic material (such as spring steel) that connects the output end of the drive assembly 32 and the main body 1. The elastic hinge consists of two connecting plates and an elastic body in the middle. The connecting plates are fixed to the output end of the drive assembly 32 and the main body 1, respectively. The elastic body can be a bent sheet or a spring structure. When a reaction force is applied to the moving part 31, the elastic body of the elastic hinge deforms, causing a certain angle change in the output end of the drive assembly 32 relative to the main body 1. The elastic deformation of the elastic body can absorb and buffer the reaction force, and automatically adjust the angle according to the magnitude and direction of the reaction force to ensure effective abutment of the guide protrusion.
[0090] In another embodiment of this application, the balancing part consists of a cross shaft and universal joint forks. The universal joint forks are connected to the output end of the drive assembly 32 and the end of the main body 1, respectively. The cross shaft is installed between the two universal joint forks and is rotatably connected by bearings. When the moving part 31 is subjected to a reaction force, the output end of the drive assembly 32 can rotate within a certain range around the axis of the cross shaft via the universal joints, thereby achieving multi-angle swinging.
[0091] The number of magnetic parts 40 is consistent with the number of magnet parts 2 in the electronic device 100 to be inspected. In this embodiment, there are multiple magnet parts 2 and magnetic parts 40, and the positions of the multiple magnetic parts 40 correspond to the positions of the multiple magnet parts 2. Multiple magnetic parts 40 can simultaneously inspect magnet parts 2 at different positions on the electronic device. Compared to inspecting them one by one, this greatly shortens the inspection time, significantly reduces the inspection time for a single batch of electronic devices to be inspected, and effectively improves the overall inspection efficiency. Since the magnet layout inside electronic devices is often complex and distributed in different areas, multiple magnetic parts 40 precisely correspond to magnet parts 2 at different positions, covering the magnets in all parts of the device. This ensures that the stability of all magnet connections in the device can be inspected, preventing quality defects from entering the market due to missed magnets, and comprehensively guaranteeing product quality.
[0092] See Figure 3 As shown, the body 10 in this embodiment includes a base 11 and a frame 12. The frame 12 is disposed on the base 11, and the first testing part 20 is mounted on the base 11. A transverse guide part 13 is provided on the frame 12, and the second testing part 30 is mounted on the transverse guide part 13 so that the second testing part 30 can move along a second direction, wherein the second direction is perpendicular to the first direction. In practical applications, the distribution of the magnet parts 2 of electronic devices may be complex, and the positions and orientations of different magnets are different. By moving the second testing part 30 in the second direction, the magnet parts 2 to be tested can be more accurately aligned, making the relative position between the magnetic part 40 and the magnet parts 2 more precise.
[0093] In this embodiment, a display unit is provided on the base 11 to display various parameters, providing operators with an intuitive operating interface. During inspection operations, operators can view key parameters at any time, such as the magnitude of the test magnetic force, the position of the moving part 31, and the inspection time. This helps operators understand the operating status of the inspection device in a timely manner, allowing for adjustments and optimizations based on actual conditions, ensuring the accuracy and stability of the inspection process. Simultaneously, the display unit facilitates the recording and analysis of inspection data, providing strong support for subsequent quality control and improvement.
[0094] According to another aspect of this application, a magnet detachment inspection system is provided. The system includes a magnet detachment inspection device, a control device, and a display device. The control device is electrically connected to the magnet detachment inspection device, and the display device is electrically connected to the control device. The magnet detachment inspection device is the aforementioned magnet detachment inspection device. The control device, electrically connected to the magnet detachment inspection device, enables automated control of the inspection process. The control device can precisely adjust various parameters of the inspection device according to a preset program, such as the running speed of the drive component 32, the displacement distance of the moving part 31, and the magnitude of the magnetic force applied by the magnetic part 40. This eliminates the uncertainty and error caused by manual operation, ensuring that each inspection is conducted under the same conditions, guaranteeing the accuracy and consistency of the inspection results. It is particularly suitable for large-scale production where strict requirements for product quality stability are present.
[0095] The control device can also acquire the working status and inspection data of the magnet detachment inspection device in real time, such as the magnetic force on the magnet part 2, the inspection time, and the position of the moving part 31. The display device is electrically connected to the control device, which can present this data to the operator in an intuitive way. The operator can understand the progress and results of the inspection process at any time, promptly detect abnormalities, and take corresponding measures. For example, if the magnetic force suddenly drops during the inspection, the display device will immediately show this abnormality, and the operator can stop the inspection in time and troubleshoot the fault, preventing unqualified products from flowing to the next stage.
[0096] In addition, the control device can record and store data during the inspection process, and the display device can show this historical data. By analyzing large amounts of inspection data, companies can gain a deeper understanding of product quality, identify potential quality problems, and pinpoint weaknesses in the production process. For example, by analyzing inspection data from different batches of products, it may be discovered that the magnet detachment rate was high within a certain period. This allows for targeted adjustments and improvements to production equipment, raw materials, or processes, thereby enhancing product quality and production efficiency. The control device can be an industrial computer or control board, while the display device can be an LCD screen.
[0097] The above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application, and should all be included within the protection scope of this application.
Claims
1. A magnet detachment testing device, applied to an electronic device to be tested, the electronic device to be tested comprising a main body and a magnet portion mounted on the main body, characterized in that, The magnet detachment testing device includes a body, a first testing unit, and a second testing unit. Both the first and second testing units are mounted on the body. The second testing unit includes a movable part, which is disposed opposite to the first testing unit and movably mounted on the body along a first direction, wherein the first direction is the direction in which the movable part approaches and moves away from the first testing unit. The magnet detachment testing device further includes: A magnetic section is provided, wherein one of the first test section and the movable section is used to mount the electronic device under test, and the magnetic section is mounted on the other of the first test section and the movable section; wherein the movable section has a test position in the first direction, the movable section moves to the test position, and the magnetic section is capable of providing a test magnetic force to the magnet away from the direction of the main body.
2. The magnet detachment testing device as described in claim 1, characterized in that, The position of the magnetic part corresponds to the position of the magnet part.
3. The magnet detachment inspection device as described in claim 1, characterized in that, The magnetic part is mounted on the moving part, and the first test part includes a support component for supporting the electronic device to be tested.
4. The magnet detachment inspection device as described in claim 2, characterized in that, The second test unit further includes a drive component, which is mounted on the body. The moving part is mounted on the output end of the drive component, and the drive component is used to drive the moving part to move along the first direction.
5. The magnet detachment inspection device as described in claim 3, characterized in that, The magnet detachment testing device further includes a limiting part, which is disposed between the first testing part and the moving part. When the moving part is in the testing position, the limiting part stops the moving part from moving toward the first testing part, so that the moving part is kept in the testing position.
6. The magnet detachment inspection device as described in claim 5, characterized in that, The limiting part includes a limiting protrusion. The first end of the limiting protrusion is installed on the second test part, and the second end of the limiting protrusion protrudes from the moving part and abuts against the electronic device to be tested or the carrier component.
7. The magnet detachment inspection device as described in claim 4, characterized in that, The second test unit further includes a force measuring unit. The moving part is movably mounted on the output end of the drive assembly along the first direction. The output end of the drive assembly and the moving part are connected through the force measuring unit.
8. The magnet detachment inspection device as described in claim 7, characterized in that, The output end of the drive component includes a first guide structure, and the moving part is provided with a second guide structure. Both the first guide structure and the second guide structure extend along the first direction. The first guide structure and the second guide structure cooperate to guide the movement of the moving part relative to the output end of the drive component.
9. The magnet detachment inspection device as described in claim 3, characterized in that, The support assembly includes a support platform for supporting the electronic device to be inspected. A fixing member is provided on the support platform for fixed connection with the electronic device to be inspected.
10. The magnet detachment inspection device as described in claim 9, characterized in that, The fixing component includes a plurality of clamping blocks, which are spaced apart circumferentially along the support platform and form a clamping space. At least two of the clamping blocks abut against the electronic device to be inspected to clamp and fix the electronic device to be inspected.
11. The magnet detachment inspection device as described in claim 10, characterized in that, The clamping block is made of an elastic material.
12. The magnet detachment testing device as described in claim 10, characterized in that, The inner wall of the clamping block at the end away from the support platform is provided with a guide slope, which gradually slopes toward the interior of the clamping space along the direction close to the support platform.
13. The magnet detachment inspection device as described in claim 9, characterized in that, The supporting component further includes a positioning element, which is disposed on the supporting platform and the position of the positioning element corresponds to the positioning structure position of the electronic device to be tested.
14. The magnet detachment inspection device as described in claim 6, characterized in that, There are multiple limiting protrusions, and each of the multiple limiting protrusions abuts against the electronic device to be inspected or the carrier component, or, a portion of the multiple limiting protrusions abuts against the electronic device to be inspected, and another portion abuts against the carrier component.
15. The magnet detachment testing device as described in claim 1, characterized in that, The magnet detachment inspection device further includes a third guide structure and a fourth guide structure. The third guide structure is disposed on the first test part, and the fourth guide structure is disposed on the moving part. Both the third guide structure and the fourth guide structure extend along the first direction. The third guide structure and the fourth guide structure cooperate to guide the movement of the moving part.
16. The magnet detachment testing device as described in claim 4, characterized in that, The magnet detachment inspection device also includes a balancing unit, which is disposed between the output end of the drive component and the main body end of the drive component.
17. The magnet detachment testing device as described in any one of claims 2 to 16, characterized in that, There are multiple magnet parts and magnetic force parts, and the positions of the multiple magnetic force parts correspond to the positions of the multiple magnet parts.
18. The magnet detachment testing device according to any one of claims 1 to 16, characterized in that, The machine body includes a base and a frame. The frame is disposed on the base. The first test part is mounted on the base. The frame is provided with a transverse guide part. The second test part is mounted on the transverse guide part so that the second test part can move along a second direction, wherein the second direction is perpendicular to the first direction.
19. A magnet detachment inspection system, characterized in that, The magnet detachment inspection system includes a magnet detachment inspection device, a control device, and a display device. The control device is electrically connected to the magnet detachment inspection device, and the display device is electrically connected to the control device. The magnet detachment inspection device is the magnet detachment inspection device according to any one of claims 1 to 18.