An IC product test tool structure

Abstract

The utility model discloses an IC product test frock structure, including including base, contact terminal, movable frame and hold down subassembly, base has the test platform, and contact terminal sets up on the test platform, hold down subassembly includes hold down piece and first elastic reset piece, and hold down piece rotatable mode sets up on the recess, and hold down piece is equipped with first linkage portion, movable frame movable mode sets up on the base, and movable frame has extension, and extension is located the top of first linkage portion, and movable frame and test platform surround the cavity that forms, and between movable frame and base is equipped with second elastic reset piece, thus, utilize movable frame's downshift to link hold down piece and rotate outward and remove test platform, cooperate first, second elastic reset piece to link movable frame and go up reset, hold down piece rotates inward to hold down piece on the test platform to improve the contact stability between contact terminal and work piece to guarantee the test result accurate of work piece, be favorable to improving the test efficiency of work piece, and the usability is good, and the scope of application is wide.

Description

Technical Field

[0001] This utility model relates to the field of testing fixtures, and in particular to a testing fixture structure for IC products. Background Technology

[0002] Currently, with the development of technology, electronic products are becoming more and more advanced and smaller in size. The fundamental reason for the development of electronic products lies in the extensive use of IC chips. The manufacturing technology of IC chips limits and determines their development. Testing is an important part of the quality inspection of IC chips at the end of the production process. Due to defects that may occur during the manufacturing or use of IC chips, as well as defects that may exist in the materials themselves, defective products may appear. Therefore, IC chip testing has become an indispensable process in integrated circuit manufacturing to detect defective products that do not meet the requirements due to physical defects during the manufacturing process.

[0003] Existing IC product testing equipment uses a semi-planar contact method, which only contacts one side of the IC chip pins to achieve contact between the contact terminal and the workpiece under test and to perform testing. However, its structural design is flawed. Because the chip pins of the workpiece under test are not easy to position, the contact stability between the contact terminal and the pin is poor when subjected to external vibration or collision during the contact test. This leads to inaccurate test results for the workpiece under test, resulting in the need for retesting, reducing the testing efficiency of the workpiece, poor usability, and limited applicability.

[0004] Therefore, a new technical solution needs to be researched to address the above problems. Utility Model Content

[0005] In view of this, the present invention addresses the deficiencies of the existing technology and its main objective is to provide an IC product testing fixture structure. This structure utilizes the downward movement of the movable frame to cause the holding member to rotate outward away from the test stage. In conjunction with the first and second elastic reset members, the movable frame is moved upward to reset, and the holding member rotates inward to press the workpiece onto the test stage. This improves the contact stability between the contact terminals and the workpiece, thereby ensuring accurate test results, improving testing efficiency, and offering excellent usability and wide applicability.

[0006] To achieve the above objectives, the present invention adopts the following technical solution:

[0007] An IC product testing fixture structure includes a base, contact terminals, a movable frame, and a clamping assembly; wherein: the base has a test platform, and the contact terminals are disposed on the test platform; the clamping assembly includes a clamping member and a first elastic reset member, the clamping member is rotatably disposed on the base, at least two clamping members are disposed opposite each other on both sides of the test platform, a first linkage part is disposed on the end of the clamping member away from the test platform, and the two ends of the first elastic reset member act on the first linkage part and the base respectively; the movable frame is vertically movable on the base, the movable frame is a ring structure, the movable frame and the test platform form a cavity with an upper opening, the movable frame has a downwardly extending extension part, the extension part is located above the first linkage part, and a second elastic reset member is disposed between the movable frame and the base.

[0008] As a preferred embodiment, both the first elastic reset element and the second elastic reset element are springs.

[0009] As a preferred embodiment, the end of the holding member near the test platform is provided with an arc-shaped connecting portion that extends upward toward the test platform in an arc shape.

[0010] As a preferred embodiment, the arc-shaped connecting portion is provided with contact protrusions for contacting the workpiece.

[0011] As a preferred embodiment, the holding member has pivot portions at both ends, and the base has support portions and mounting portions arranged at intervals corresponding to the pivot portions. The mounting portion has a pivot groove at its lower end near the pivot portion. The holding member is assembled on the mounting portion from top to bottom, the lower end of the pivot portion contacts the upper end of the support portion, and the end of the pivot portion is pivotally connected to the pivot groove.

[0012] As a preferred embodiment, the upper end of the mounting portion is provided with a guide slope for assembling the pressure holding component.

[0013] As a preferred embodiment, the upper end of the support portion is provided with a downwardly extending groove, and the pivot portion contacts the groove.

[0014] As a preferred embodiment, an intermediate plate is also provided. The intermediate plate is movably mounted on the test platform and located above the contact terminals. The intermediate plate has through holes corresponding to the contact terminals. A second linkage part is provided on the outer side of the intermediate plate. The second linkage part is located between the movable frame and the base. A third elastic reset member is provided between the intermediate plate and the base. When the movable frame moves down, it contacts the first linkage part and the second linkage part respectively, thereby causing the linkage holding member to rotate outward and the intermediate plate to move down. The upper end of the contact terminal extends out of the intermediate plate through the corresponding through hole.

[0015] As a preferred embodiment, a fourth elastic reset element is provided between the intermediate plate and the movable frame.

[0016] Compared with the prior art, this utility model has obvious advantages and beneficial effects. Specifically, as can be seen from the above technical solution, it mainly improves the contact stability between the contact terminal and the workpiece by using the downward movement of the movable frame to link the pressing component to rotate outward away from the test platform, and cooperating with the first and second elastic reset components to link the upward movement and reset of the movable frame and the inward rotation of the pressing component to press and position the workpiece on the test platform. This improves the contact stability between the contact terminal and the workpiece, thereby ensuring the accuracy of the workpiece test results, which is conducive to improving the workpiece test efficiency. It is simple to operate, convenient to use, has good usability, and a wide range of applications.

[0017] Secondly, the design of the contact protrusions avoids direct contact between the clamping component and the workpiece, reducing the impact of the clamping component on the workpiece during the clamping process. At the same time, the design of the guide slope facilitates the guidance and assembly of the clamping component on the base. Combined with the design of the support part, it is beneficial for the clamping component to be supported and positioned on the base, improving the stability of the clamping component. Furthermore, the design of the groove facilitates the assembly and positioning of the pivot part on the support part.

[0018] Furthermore, the intermediate plate is designed so that the downward movement of the movable frame causes the intermediate plate to move downward, allowing the contact terminals to pass through the through holes and be exposed, thus enabling contact testing between the workpiece and the contact terminals. In conjunction with the third elastic reset component, the intermediate plate moves upward under the action of the third elastic reset component to extend the contact terminals into the through holes and hide them, thereby avoiding exposure of the contact terminals. This design is highly practical.

[0019] To more clearly illustrate the structural features, technical means, and specific objectives and functions of this utility model, the following detailed description is provided in conjunction with the accompanying drawings and specific embodiments. Attached Figure Description

[0020] Figure 1 This is a perspective view of an embodiment of the present utility model;

[0021] Figure 2 yes Figure 1 A magnified view of a portion of position A in the middle;

[0022] Figure 3 This is an exploded view of an embodiment of the present invention.

[0023] Explanation of reference numerals in the attached diagram:

[0024] 101. Cavity 10. Base 11. Contact terminal 12. Movable frame 121. Extension 122. Second elastic reset member 13. Pressing assembly 131. Pressing member 132. First elastic reset member 133. First linkage part 134. Arc-shaped connection part 135. Contact protrusion 136. Pivot part 14. Test table 15. Support part 151. Groove 16. Mounting part 161. Pivot groove 162. Guide slope 17. Intermediate plate 171. Through hole 172. Second linkage part 173. Third elastic reset member 174. Fourth elastic reset member. Detailed Implementation

[0025] Please refer to Figures 1 to 3 As shown, it illustrates the specific structure of an embodiment of the present invention.

[0026] An IC product testing fixture structure includes a base 10, contact terminals 11, a movable frame 12, and a clamping assembly 13; wherein:

[0027] The base 10 has a test platform 14, and the contact terminal 11 is disposed on the test platform 14; the holding assembly 13 includes a holding member 131 and a first elastic reset member 132. The holding member 131 is rotatably disposed on the base 10. At least two holding members 131 are disposed opposite to each other on both sides of the test platform 14. A first linkage part 133 is disposed on the end of the holding member 131 away from the test platform. The two ends of the first elastic reset member 132 act on the first linkage part 133 and the base 10, respectively; the movable frame 12 is movably disposed on the base 10. The movable frame 12 is a ring structure. The movable frame 12 and the test platform 14 form a cavity 101 with an upper opening. The movable frame 12 has a downwardly extending extension part 121. The extension part 121 is located above the first linkage part 133. A second elastic reset member 122 is disposed between the movable frame 12 and the base 10.

[0028] Specifically, the end of the holding member 131 near the test table is provided with an arc-shaped connecting part 134 extending upward toward the test table. The arc-shaped connecting part 134 is provided with contact protrusions 135 for contacting the workpiece. Preferably, the first elastic reset member 132 and the second elastic reset member 122 are both springs.

[0029] In use, first, the movable frame is lowered so that the extension contacts the first linkage part, causing the linkage holding member to rotate outward and away from the test table. The workpiece is placed on the test table and makes contact with the contact terminal. The movable frame is then released, and under the action of the second elastic reset member, the movable frame moves upward and resets. Under the action of the first elastic reset member, the holding member rotates inward to hold the workpiece on the test table. After the test is completed, the movable frame is lowered to cause the linkage holding member to rotate outward and release the workpiece, which is then removed. In this way, through the design of each component, the downward movement of the movable frame is used to cause the linkage holding member to rotate outward and away from the test table. This, combined with the first and second elastic reset members to respectively cause the movable frame to move upward and reset, and the inward rotation of the holding member to hold and position the workpiece on the test table, improves the contact stability between the contact terminal and the workpiece. This ensures the accuracy of the workpiece test results, improves the workpiece testing efficiency, and is simple to operate, convenient to use, highly usable, and widely applicable.

[0030] In this embodiment, the holding member 131 has pivot portions 136 at both ends. The base 10 has support portions 15 and mounting portions 16 arranged at intervals corresponding to the pivot portions. The mounting portion 16 has a pivot groove 161 at its lower end near the pivot portion. The holding member 131 is assembled onto the mounting portion 16 from top to bottom. The lower end of the pivot portion 136 contacts the upper end of the support portion 15, and the end of the pivot portion 136 is pivotally connected to the pivot groove 161. Preferably, the mounting portion... The upper end of the 16 is provided with a guide slope 162 for guiding the assembly of the pressure holding component. The upper end of the support part 15 is provided with a downwardly extending groove 151. The pivot part 136 contacts the groove 151. Thus, the guide slope is provided to facilitate the guidance and assembly of the pressure holding component on the base. Combined with the support part, it is beneficial to support and position the pressure holding component on the base, thereby improving the stability of the pressure holding component. Furthermore, the groove is provided to facilitate the assembly and positioning of the pivot part on the support part.

[0031] An intermediate plate 17 is also provided. The intermediate plate 17 is movably mounted on the test platform 14 and located above the contact terminal 11. A through hole 171 is provided on the intermediate plate 17 corresponding to the contact terminal. A second linkage part 172 is provided on the outer side of the intermediate plate 17. The second linkage part 172 is located between the movable frame 12 and the base 10. A third elastic reset member 173 is provided between the intermediate plate 17 and the base 10. Preferably, a fourth elastic reset member 174 is provided between the intermediate plate 17 and the movable frame 12.

[0032] When the movable frame moves downward, it contacts the first and second linkage parts respectively, thereby causing the linkage holding member to rotate outward and the intermediate plate to move downward. The upper end of the contact terminal extends out of the intermediate plate through the corresponding through hole. Then, the workpiece is connected to the contact terminal, the movable frame is released, and the movable frame moves upward and reset under the action of the second elastic reset member. The holding member rotates inward under the action of the first elastic reset member to press the workpiece onto the test table. The intermediate plate maintains its position when it moved downward under the pressing action of the holding member. After the test is completed, the movable frame is controlled to move downward, causing the linkage holding member to rotate outward to release the workpiece. Then, the workpiece is removed and released. The movable frame moves upward and resets under the action of the second elastic reset member, while the holding member rotates inward and resets under the action of the first elastic reset member. The intermediate plate moves upward and resets under the action of the third elastic reset member, allowing the contact terminals to extend into the through hole and be hidden. Thus, the intermediate plate is designed so that the downward movement of the movable frame links the downward movement of the intermediate plate, allowing the contact terminals to pass through the through hole and be exposed, thereby realizing the contact test operation between the workpiece and the contact terminals. In conjunction with the setting of the third elastic reset member, the intermediate plate moves upward under the action of the third elastic reset member to extend the contact terminals into the through hole and hide them, thus avoiding the contact terminals from being exposed. This design is highly practical.

[0033] The key design feature of this utility model lies in the design of its components. By moving the movable frame downwards, the holding member rotates outwards away from the test platform. This, combined with the first and second elastic reset members, moves the movable frame upwards and resets, and the holding member rotates inwards to hold and position the workpiece on the test platform. This improves the contact stability between the contact terminals and the workpiece, thereby ensuring accurate test results and improving testing efficiency. The model is simple to operate, easy to use, highly usable, and widely applicable.

[0034] Secondly, the design of the contact protrusions avoids direct contact between the clamping component and the workpiece, reducing the impact of the clamping component on the workpiece during the clamping process. At the same time, the design of the guide slope facilitates the guidance and assembly of the clamping component on the base. Combined with the design of the support part, it is beneficial for the clamping component to be supported and positioned on the base, improving the stability of the clamping component. Furthermore, the design of the groove facilitates the assembly and positioning of the pivot part on the support part.

[0035] Furthermore, the intermediate plate is designed so that the downward movement of the movable frame causes the intermediate plate to move downward, allowing the contact terminals to pass through the through holes and be exposed, thus enabling contact testing between the workpiece and the contact terminals. In conjunction with the third elastic reset component, the intermediate plate moves upward under the action of the third elastic reset component to extend the contact terminals into the through holes and hide them, thereby avoiding exposure of the contact terminals. This design is highly practical.

[0036] The above description is merely a preferred embodiment of the present utility model and does not constitute any limitation on the technical scope of the present utility model. Therefore, any minor modifications, equivalent changes and alterations made to the above embodiments based on the technical essence of the present utility model shall still fall within the scope of the technical solution of the present utility model.

Claims

1. A test fixture structure for IC products, characterized in that: The device includes a base, contact terminals, a movable frame, and a holding assembly. The base has a test platform, and the contact terminals are disposed on the test platform. The holding assembly includes a holding member and a first elastic reset member. The holding member is rotatably mounted on the base. At least two holding members are disposed opposite each other on both sides of the test platform. A first linkage portion is provided on the end of the holding member furthest from the test platform. The two ends of the first elastic reset member act on the first linkage portion and the base, respectively. The movable frame is vertically movable on the base. The movable frame has a ring structure, and the movable frame and the test platform form a cavity with an upper opening. The movable frame has a downwardly extending extension portion located above the first linkage portion. A second elastic reset member is disposed between the movable frame and the base.

2. The IC product testing fixture structure according to claim 1, characterized in that: Both the first elastic reset element and the second elastic reset element are springs.

3. The IC product testing fixture structure according to claim 1, characterized in that: The end of the holding member near the test table is provided with an arc-shaped connecting part that extends upward toward the test table.

4. The IC product testing fixture structure according to claim 3, characterized in that: The arc-shaped connecting part is provided with contact protrusions for contacting the workpiece.

5. The IC product testing fixture structure according to claim 1, characterized in that: The holding member has pivot joints at both ends. The base has support parts and mounting parts arranged at intervals corresponding to the pivot joints. The mounting part has a pivot groove at its lower end near the pivot joint. The holding member is assembled on the mounting part from top to bottom. The lower end of the pivot joint contacts the upper end of the support part. The end of the pivot joint is pivotally connected to the pivot groove.

6. The IC product testing fixture structure according to claim 5, characterized in that: The upper end of the mounting part is provided with a guide slope for assembling the pressure holding component.

7. The IC product testing fixture structure according to claim 5, characterized in that: The upper end of the support is provided with a downwardly extending groove, and the pivot part contacts the groove.

8. The IC product testing fixture structure according to claim 1, characterized in that: An intermediate plate is also provided, which can be movably mounted on the test platform and located above the contact terminals. The intermediate plate has through holes corresponding to the contact terminals. A second linkage part is provided on the outer side of the intermediate plate, which is located between the movable frame and the base. A third elastic reset member is provided between the intermediate plate and the base. When the movable frame moves down, it contacts the first linkage part and the second linkage part respectively, thereby causing the linkage holding member to rotate outward and the intermediate plate to move down. The upper end of the contact terminal extends out of the intermediate plate through the corresponding through hole.

9. The IC product testing fixture structure according to claim 8, characterized in that: A fourth elastic reset component is provided between the intermediate plate and the movable frame.

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