Double-layer heterogeneous high-low temperature test chamber

Abstract

This application relates to the technical field of high and low temperature test chambers, specifically to a double-layer heterogeneous high and low temperature test chamber, including a test chamber body, an upper test space opened at the top of the test chamber body, and a lower test space opened at the bottom of the test chamber body. The upper test space and the lower test space are respectively provided with a first placement plate and a second placement plate located in the middle of them. The first placement plate and the second placement plate have multiple openings. The upper test space has a first sliding groove on both sides along the height direction of the upper test space. The first placement plate is slidably connected to the upper test space through the first sliding groove. The bottom of the first placement plate is provided with a support device for supporting the first placement plate. The operator only needs to move the first placement plate to the bottom of the upper test space through the support device to easily place materials on the first placement plate, thereby making it more convenient for the operator to place materials.

Description

Technical Field

[0001] This application relates to the technical field of high and low temperature test chambers, and in particular to a double-layer heterogeneous high and low temperature test chamber. Background Technology

[0002] The double-layer heterogeneous high and low temperature test chamber is an environmental testing device specifically designed to simulate extreme temperature environments. It is mainly used to test the performance of various materials and products under extreme temperature conditions. It consists of two stacked chambers, a mechanical cabinet, and a power distribution cabinet. The two chambers can be controlled independently without interference, resulting in high testing efficiency.

[0003] However, if the test material is placed directly in the two chambers, the bottom surface of the material will come into contact with the bottom surface of the chamber, resulting in uneven temperature distribution and causing some deviation in the test results. Existing technology solves this problem by setting a placement plate with multiple openings in the middle of the chamber, which ensures that the material in the middle of the chamber receives a uniform temperature. However, the placement plate also makes it very inconvenient for staff to place the material. When placing the material in the upper chamber, a platform is needed to place it on the placement plate in that chamber, which is very inconvenient. Utility Model Content

[0004] To address the shortcomings of existing technologies, the purpose of this application is to provide a double-layer heterogeneous high and low temperature test chamber to solve the technical problem that the placement of materials by staff is very inconvenient in the existing technology.

[0005] The above-mentioned objective of this application is achieved through the following technical solution: a double-layer heterogeneous high and low temperature test chamber, comprising a test chamber body, an upper test space opened at the upper end of the test chamber body, and a lower test space opened at the lower end of the test chamber body. The upper test space and the lower test space are respectively provided with a first placement plate and a second placement plate located in the middle of them. The first placement plate and the second placement plate are provided with multiple openings. The upper test space is provided with a first sliding groove on both sides along the height direction of the upper test space. The first placement plate is slidably connected to the upper test space through the first sliding groove. The bottom of the first placement plate is provided with a support device for supporting the first placement plate.

[0006] Furthermore, the support device includes two fixed plates fixedly disposed on the bottom surface of the first placement plate and facing each other, and a support rod with one end located between the two fixed plates and rotatably connected to the fixed plates, the other end of the support rod abutting the bottom surface inside the upper test space.

[0007] By adopting the above technical solution, when the staff needs to place the material on the first placement plate in the upper test space, they only need to rotate the support rod in the direction of the upper test space outward so that the support rod no longer abuts against the bottom surface inside the upper test space. At this time, the first placement plate can move down along the first slide groove until the first placement plate moves to the bottom of the upper test space. In this way, the staff can easily place the material on the first placement plate, making it more convenient for the staff to place the material. When the first placement plate needs to be reset, simply slide the first placement plate upward. The support rod will automatically become vertical due to gravity. Then the staff can release the first placement plate to reset it.

[0008] Furthermore, the bottom of the upper test space is provided with a placement opening for placing a support rod, and the end of the support rod away from the fixed plate is located in the placement opening and abuts against the bottom surface of the upper test space.

[0009] While the support device makes it easier for staff to place materials, the test chamber itself may experience slight vibrations during operation. This vibration can cause the support rod to rotate, resulting in the first placement plate falling from the middle of the upper test space to the bottom. The placement opening solves this problem. When the first placement plate is in the middle of the upper test space, the support rod is vertical, with the end furthest from the fixed plate inside the placement opening and abutting against the bottom of the upper test space. If the test chamber experiences slight vibrations, the placement opening can restrict the support rod, preventing it from rotating and thus preventing the first placement plate from falling from the middle of the upper test space to the bottom, thereby improving the stability of the support device.

[0010] Furthermore, the bottom surface of the first placement plate is provided with two support devices, which are located on both sides of the first placement plate respectively.

[0011] By adopting the above technical solution, the support device can support the first placement plate more stably.

[0012] Furthermore, the lower test space has second sliding grooves on both sides inside, which are arranged along the height direction of the lower test space. The second placement plate is slidably connected to the lower test space through the second sliding grooves. The end face of the second placement plate away from the lower test space is provided with a limiting device for positioning the second placement plate in the middle of the lower test space.

[0013] Furthermore, the limiting device includes a U-shaped plate fixedly connected to the test chamber body above the lower test space, an L-shaped plate fixedly disposed on the end face of the second placement plate away from the lower test space, and a horizontal plate fixedly disposed on the upper end of the L-shaped plate. The vertical end of the L-shaped plate passes through the U-shaped plate, and the bottom surface of the horizontal plate abuts against the U-shaped plate.

[0014] While the support device makes it easier for staff to place materials in the upper test space, the staff still needs to squat down to place the materials on the placement plate inside the box when placing them in the lower test space. The support device is not suitable for the lower test space. The limiting device solves this problem. With the limiting device, when staff need to place materials on the second placement plate, they only need to pull the second placement plate upwards along the second slide rail using the L-shaped plate until it reaches the upper end of the lower test space. Then, the staff can place the materials on the second placement plate and release the L-shaped plate. This eliminates the need for staff to squat down, making material placement much more convenient.

[0015] Furthermore, there are two limiting devices, which are located on both sides of the end face of the second placement plate away from the lower test space.

[0016] By adopting the above technical solution, the limiting device can restrict the second placement plate more stably without hindering the staff from placing materials.

[0017] Furthermore, both the first placement plate and the second placement plate are made of polytetrafluoroethylene.

[0018] By adopting the above technical solution, polytetrafluoroethylene is a plastic that is both resistant to high and low temperatures, which can prevent the first placement plate and the second placement plate from being damaged by high and low temperatures.

[0019] In summary, this application includes at least one of the following beneficial technical effects:

[0020] By setting up the support device, when the staff needs to place materials on the first placement plate in the upper test space, they only need to rotate the support rod in the direction of the upper test space to the outside, so that the support rod no longer abuts against the bottom surface inside the upper test space. At this time, the first placement plate can move down along the first slide until the first placement plate moves to the bottom of the upper test space. In this way, the staff can easily place materials on the first placement plate, thus making it more convenient for the staff to place materials. Attached Figure Description

[0021] Figure 1 This is a schematic diagram of the overall structure of the embodiment;

[0022] Figure 2 This is another view of the overall structure of the embodiment;

[0023] Figure 3 yes Figure 1 Enlarged view of section A.

[0024] Reference numerals: 1. Test chamber body; 10. Upper test space; 11. Lower test space; 12. First placement plate; 13. Second placement plate; 14. First slide groove; 15. Placement opening; 16. Second slide groove; 2. Support device; 20. Fixing plate; 21. Support rod; 3. Limiting device; 30. U-shaped plate; 31. L-shaped plate; 32. Horizontal plate. Detailed Implementation

[0025] The present application will be further described in detail below with reference to the accompanying drawings.

[0026] Example, refer to Figure 1 , Figure 2 A double-layer heterogeneous high and low temperature test chamber includes a test chamber body 1, an upper test space 10 located at the top of the test chamber body 1, and a lower test space 11 located at the bottom of the test chamber body 1. The upper test space 10 and the lower test space 11 are respectively provided with a first placement plate 12 and a second placement plate 13 located in their middle. The first placement plate 12 and the second placement plate 13 have multiple openings. The upper test space 10 has first sliding grooves 14 on both sides along its height direction. The first placement plate 12 is slidably connected to the upper test space 10 through the first sliding grooves 14. The bottom of the first placement plate 12 is provided with a support device 2 for supporting the first placement plate 12. The support device 2 includes two fixed plates 20 fixedly disposed on the bottom surface of the first placement plate 12 and facing each other, and one end located between the two fixed plates 20. The support rod 21, which is rotatably connected to the fixed plate 20, has its other end abutting the bottom surface inside the upper test space 10. When the staff needs to place the material on the first placement plate 12 inside the upper test space 10, they only need to rotate the support rod 21 outward from the upper test space 10 so that the support rod 21 no longer abuts the bottom surface inside the upper test space 10. At this time, the first placement plate 12 can move downward along the first slide 14 until the first placement plate 12 moves to the bottom of the upper test space 10. In this way, the staff can easily place the material on the first placement plate 12, making it more convenient for the staff to place the material. When the first placement plate 12 needs to be reset, the staff only needs to slide the first placement plate 12 upward. The support rod 21 will automatically become vertical due to gravity. Then the staff can release the first placement plate 12 to reset it.

[0027] Although the support device 2 makes it easier for staff to place materials, the test chamber body 1 may experience slight vibrations during operation. This vibration can cause the support rod 21 to rotate, causing the first placement plate 12 to fall from the middle of the upper test space 10 to the bottom. To solve this technical problem, this embodiment provides a placement opening 15 at the bottom of the upper test space 10 for placing the support rod 21. The end of the support rod 21 away from the fixed plate 20 is located inside the placement opening 15 and abuts against the bottom surface of the upper test space 10. By setting the placement opening 15, when the first placement plate 12 is located in the middle of the upper test space 10, the support rod 21 is in a vertical state and the end away from the fixed plate 20 is located inside the placement opening 15 and abuts against the bottom surface of the upper test space 10. At this time, if the test chamber body 1 experiences slight vibrations, the placement opening 15 can restrict the support rod 21 and prevent it from rotating, thereby preventing the first placement plate 12 from falling from the middle of the upper test space 10 to the bottom, thus improving the stability of the support device 2.

[0028] In this embodiment, two support devices 2 are provided on the bottom surface of the first placement plate 12, which are located on both sides of the first placement plate 12, so that the support devices 2 support the first placement plate 12 more stably.

[0029] Although the support device 2 makes it easier for staff to place materials in the upper test space 10, when placing materials in the lower test space 11, staff need to squat down to place them on the placement plate inside the box. However, the support device 2 is not suitable for the lower test space 11. To solve this technical problem, refer to... Figure 3 In this embodiment, second sliding grooves 16 are provided on both sides inside the lower test space 11, arranged along the height direction of the lower test space 11. The second placement plate 13 is slidably connected to the lower test space 11 through the second sliding grooves 16. The end face of the second placement plate 13 away from the lower test space 11 is provided with a limiting device 3 for positioning the second placement plate 13 in the middle of the lower test space 11. The limiting device 3 includes a U-shaped plate 30 fixedly connected to the test chamber body 1 above the lower test space 11 and an L-shaped plate 3 fixedly disposed on the end face of the second placement plate 13 away from the lower test space 11. 1. A horizontal plate 32 is fixedly installed on the upper end of the L-shaped plate 31. The vertical end of the L-shaped plate 31 passes through the U-shaped plate 30, and the bottom surface of the horizontal plate 32 abuts against the U-shaped plate 30. With the setting of the limiting device 3, when the staff needs to place the material on the second placement plate 13, they only need to pull the second placement plate 13 along the second slide 16 upward through the L-shaped plate 31 until it moves to the upper end of the lower test space 11. Then the staff can place the material on the second placement plate 13 and release the L-shaped plate 31. In this way, the staff can place the material without squatting down, making it more convenient for the staff to place the material.

[0030] In this embodiment, there are two limiting devices 3, which are located on both sides of the end face of the second placement plate 13 away from the lower test space 11, so that the limiting devices 3 restrict the second placement plate 13 more stably while not hindering the staff from placing materials.

[0031] In this embodiment, both the first placement plate 12 and the second placement plate 13 are made of polytetrafluoroethylene (PTFE), which is a plastic that is resistant to both high and low temperatures, and can prevent the first placement plate 12 and the second placement plate 13 from being damaged by high and low temperatures.

[0032] Specific implementation process: When it is necessary to place materials in the upper test space 10, simply rotate the support rod 21 in the direction of the upper test space 10 outward so that the support rod 21 no longer abuts against the bottom surface inside the upper test space 10. At this time, the first placement plate 12 can move downward along the first slide 14 until the first placement plate 12 moves to the bottom of the upper test space 10. In this way, the staff can easily place the materials on the first placement plate 12, and then push the first placement plate 12 upward so that the support rod 21 rotates to a vertical state due to gravity and inserts into the placement opening 15.

[0033] When materials need to be placed in the lower test space 11, simply pull the second placement plate 13 along the second slide 16 using the L-shaped plate 31 until it reaches the upper end of the lower test space 11. Then, the staff can place the materials on the second placement plate 13 and release the L-shaped plate 31. This way, the staff can place the materials without having to squat down, making it more convenient for them to do so.

[0034] The embodiments described in this specific implementation are preferred embodiments of this application and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.

Claims

1. A double-layered heterogeneous high and low temperature test chamber, characterized in that, The test chamber includes a test chamber body (1), an upper test space (10) located at the top of the test chamber body (1), and a lower test space (11) located at the bottom of the test chamber body (1). The upper test space (10) and the lower test space (11) are respectively provided with a first placement plate (12) and a second placement plate (13) located in the middle of them. The first placement plate (12) and the second placement plate (13) are provided with multiple openings. The upper test space (10) is provided with a first sliding groove (14) on both sides along the height direction of the upper test space (10). The first placement plate (12) is slidably connected to the upper test space (10) through the first sliding groove (14). The bottom of the first placement plate (12) is provided with a support device (2) for supporting the first placement plate (12).

2. The double-layer heterogeneous high and low temperature test chamber according to claim 1, characterized in that, The support device (2) includes two fixed plates (20) fixedly disposed on the bottom surface of the first placement plate (12) and facing each other, and a support rod (21) with one end located between the two fixed plates (20) and rotatably connected to the fixed plate (20). The other end of the support rod (21) abuts against the bottom surface inside the upper test space (10).

3. The double-layer heterogeneous high and low temperature test chamber according to claim 2, characterized in that, The upper test space (10) has a placement opening (15) at the bottom for placing the support rod (21). The end of the support rod (21) away from the fixing plate (20) is located in the placement opening (15) and abuts against the bottom surface of the upper test space (10).

4. The double-layer heterogeneous high and low temperature test chamber according to claim 1, characterized in that, The bottom surface of the first placement plate (12) is provided with two support devices (2), which are located on both sides of the first placement plate (12).

5. The double-layer heterogeneous high and low temperature test chamber according to claim 1, characterized in that, The lower test space (11) has a second slide groove (16) on both sides inside, which is arranged along the height direction of the lower test space (11). The second placement plate (13) is slidably connected to the lower test space (11) through the second slide groove (16). The end face of the second placement plate (13) away from the lower test space (11) is provided with a limiting device (3) for placing the second placement plate (13) in the middle of the lower test space (11).

6. The double-layer heterogeneous high and low temperature test chamber according to claim 5, characterized in that, The limiting device (3) includes a U-shaped plate (30) fixedly connected to the test chamber body (1) above the lower test space (11), an L-shaped plate (31) fixedly set on the end face of the second placement plate (13) away from the lower test space (11), and a horizontal plate (32) fixedly set on the upper end of the L-shaped plate (31). The vertical end of the L-shaped plate (31) passes through the U-shaped plate (30), and the bottom surface of the horizontal plate (32) abuts against the U-shaped plate (30).

7. The double-layer heterogeneous high and low temperature test chamber according to claim 6, characterized in that, The limiting device (3) is provided in two parts, and is located on both sides of the end face of the second placement plate (13) away from the lower test space (11).

8. The double-layer heterogeneous high and low temperature test chamber according to claim 1, characterized in that, Both the first placement plate (12) and the second placement plate (13) are made of polytetrafluoroethylene.

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