An instrument landing analysis device

By designing an instrument landing analysis device, signal decomposition and parameter detection are performed using a downconverter and an FPGA baseband board, solving the problem of low detection efficiency of the instrument landing simulator and realizing rapid measurement and automated detection.

CN224427839UActive Publication Date: 2026-06-30CHINESE PEOPLES LIBERATION ARMY UNIT 92574
View PDF 0 Cites 0 Cited by

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
CHINESE PEOPLES LIBERATION ARMY UNIT 92574
Filing Date
2025-09-05
Publication Date
2026-06-30

AI Technical Summary

Technical Problem

In the existing technology, instrument landing simulators lack rapid and dedicated metrology and testing equipment, resulting in low testing efficiency and a large workload.

Method used

Design an instrument landing analysis device that uses a downconverter and an FPGA baseband board to decompose and detect the instrument landing signal using signal conditioning, IQ modulation, analog-to-digital conversion, IQ demodulation, and multiple filtering circuits. It can automatically separate the carrier signal and the modulation signal and perform parameter calculations.

Benefits of technology

It enables rapid measurement of the instrument landing simulator, improves detection efficiency, reduces workload, and enhances automation.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure CN224427839U_ABST
    Figure CN224427839U_ABST
Patent Text Reader

Abstract

This utility model discloses an instrument landing analysis device, relating to the technical field of instrument landing simulator metering equipment, comprising: a down-converter and an FPGA baseband board; the down-converter includes a signal conditioning circuit, an IQ modulation circuit, and an analog-to-digital converter module; the FPGA baseband board includes an IQ demodulation circuit and multiple filter circuits; wherein, the landing signal of the instrument to be analyzed is connected to the input terminal of the signal conditioning circuit, the output terminal of the signal conditioning circuit is connected to the input terminal of the IQ modulation circuit, the output terminal of the IQ modulation circuit is connected to the input terminal of the analog-to-digital converter module, the output terminal of the analog-to-digital converter module is connected to the input terminal of the IQ demodulation circuit, the output terminal of the IQ demodulation circuit is connected to the input terminals of multiple filter circuits respectively, and the output terminals of the multiple filter circuits are connected to a zero-slot controller. This utility model alleviates the technical problems of low detection efficiency and high workload in the prior art.
Need to check novelty before this filing date? Find Prior Art

Description

Technical Field

[0001] This utility model relates to the technical field of instrument landing simulator metering equipment, specifically to an instrument landing analysis device. Background Technology

[0002] Currently, airports lack rapid and dedicated metrology and testing equipment for ground testing of airborne instrument landing systems (ILS). Traditional instrument landing simulator metrology requires manual testing using multiple independent instruments, which is inefficient and labor-intensive. Utility Model Content

[0003] The purpose of this invention is to provide an instrument landing analysis device to solve at least one of the above-mentioned technical problems.

[0004] In a first aspect, this utility model provides an instrument landing analysis device, comprising: a down-converter and an FPGA baseband board; the down-converter includes a signal conditioning circuit, an IQ modulation circuit, and an analog-to-digital converter module; the FPGA baseband board includes an IQ demodulation circuit and multiple filter circuits; wherein, the instrument landing signal to be analyzed is input to the signal conditioning circuit, the output of the signal conditioning circuit is connected to the input of the IQ modulation circuit, the output of the IQ modulation circuit is connected to the input of the analog-to-digital converter module, the output of the analog-to-digital converter module is connected to the input of the IQ demodulation circuit, and the output of the IQ demodulation circuit is connected to the multiple filter circuits respectively. The input terminals of the circuits are connected, and the output terminals of the multiple filtering circuits are connected to the zero-slot controller. The IQ modulation circuit is used to modulate the output signal of the signal conditioning circuit into an I-channel modulation signal and a Q-channel modulation signal. The analog-to-digital converter module is used to convert the I-channel modulation signal and the Q-channel modulation signal into an I-channel baseband signal and a Q-channel baseband signal. The IQ demodulation circuit is used to demodulate the I-channel baseband signal and the Q-channel baseband signal into an envelope signal. The multiple filtering circuits are used to filter the envelope signal at different frequencies to obtain multiple frequency modulation signals corresponding to different frequencies. The zero-slot controller is used to analyze the multiple frequency modulation signals to obtain the modulation difference.

[0005] Optionally, the signal conditioning circuit includes a frequency selector, an attenuator, a preamplifier, a first adjustable attenuator, a filter selector, an amplifier, and a second adjustable attenuator connected in sequence.

[0006] Optionally, the IQ modulation circuit consists of two modulation multipliers and a local oscillator; the local oscillator is used to output two local oscillator signals with a phase difference of 90°; the two modulation multipliers are used to multiply the output signal of the signal conditioning circuit with the two local oscillator signals with a phase difference of 90° to obtain the I-channel modulation signal and the Q-channel modulation signal.

[0007] Optionally, the analog-to-digital converter module includes: a gain controller, a first low-pass filter, and an analog-to-digital converter; the input terminal of the gain controller is connected to the output terminal of the IQ modulation circuit, the output terminal of the gain controller is connected to the input terminal of the first low-pass filter, the output terminal of the first low-pass filter is connected to the input terminal of the analog-to-digital converter, and the output terminal of the analog-to-digital converter is connected to the input terminal of the IQ demodulation circuit.

[0008] Optionally, the IQ demodulation circuit includes two demodulation multipliers and one adder; the demodulation multipliers are used to multiply the I-channel baseband signal and the Q-channel baseband signal by themselves, respectively, to obtain an I-channel self-multiplied signal and a Q-channel self-multiplied signal; the adder is used to add the I-channel self-multiplied signal and the Q-channel self-multiplied signal to obtain an envelope signal.

[0009] Optionally, the plurality of filtering circuits include a second low-pass filter, a band-pass filter, and a high-pass filter.

[0010] Optionally, the second low-pass filter is used to extract the 90Hz frequency modulation signal; the band-pass filter is used to extract the 150Hz frequency modulation signal; and the high-pass filter is used to extract the 1020Hz frequency modulation signal.

[0011] This invention provides an instrument landing analysis device that decomposes the original standard instrument landing signal into IQ baseband signals through down-conversion. Then, it separates the carrier signal and various modulation signals through multipliers, adders, and different filters. Furthermore, it calculates the amplitude and frequency of each signal and the modulation difference, thereby enabling the detection of various parameters of the carrier signal and modulation signal. This allows for rapid measurement of the instrument landing simulator, with a high degree of automation, alleviating the technical problems of low detection efficiency and high workload in existing technologies. Attached Figure Description

[0012] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this application. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0013] Figure 1 A schematic diagram of the principle of an instrument landing analysis device provided in an embodiment of this utility model;

[0014] Figure 2 This is a schematic diagram of the hardware structure of an instrument landing analysis device provided in an embodiment of the present invention.

[0015] In the diagram: 100, downconverter; 200, FPGA baseband board; 10, signal conditioning circuit; 11, frequency selector; 12, attenuator; 13, preamplifier; 14, first adjustable attenuator; 15, filter selector; 16, amplifier; 17, second adjustable attenuator; 20, IQ modulation circuit; 21, modulation end multiplier; 22, local oscillator; 30, analog-to-digital converter module; 31, gain controller; 32, first low-pass filter; 33, analog-to-digital converter; 40, IQ demodulation circuit; 41, demodulation end multiplier; 42, adder; 50, multiple filter circuits; 51, second low-pass filter; 52, band-pass filter; 53, high-pass filter; 60, zero-slot controller; 70, vector signal transceiver module; 80, PXle backplane; 90, front panel interface. Detailed Implementation

[0016] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0017] Figure 1 This is a schematic diagram of an instrument landing analysis device according to an embodiment of the present invention. Figure 1 As shown, the device includes: a downconverter 100 and an FPGA baseband board 200; the downconverter 100 includes a signal conditioning circuit 10, an IQ modulation circuit 20 and an analog-to-digital converter module 30; the FPGA baseband board 200 includes an IQ demodulation circuit 40 and multiple filter circuits 50.

[0018] Specifically, the landing signal of the instrument to be analyzed is connected to the input terminal of the signal conditioning circuit 10, the output terminal of the signal conditioning circuit 10 is connected to the input terminal of the IQ modulation circuit 20, the output terminal of the IQ modulation circuit 20 is connected to the input terminal of the analog-to-digital converter module 30, the output terminal of the analog-to-digital converter module 30 is connected to the input terminal of the IQ demodulation circuit 40, the output terminal of the IQ demodulation circuit 40 is connected to the input terminals of multiple filter circuits 50, and the output terminals of the multiple filter circuits 50 are connected to the zero slot controller 60.

[0019] IQ modulation circuit 20 is used to modulate the output signal of signal conditioning circuit 10 into I-channel modulation signal and Q-channel modulation signal;

[0020] Analog-to-digital converter module 30 is used to convert I-channel modulated signals and Q-channel modulated signals into I-channel baseband signals and Q-channel baseband signals;

[0021] IQ demodulation circuit 40 is used to demodulate the I-channel baseband signal and the Q-channel baseband signal into an envelope signal;

[0022] Multiple filter circuits 50 are used to filter the envelope signal at different frequencies to obtain multiple frequency modulation signals corresponding to different frequencies;

[0023] The zero-slot controller 60 is used to analyze multiple frequency modulation signals to obtain the modulation difference.

[0024] Figure 2 This is a schematic diagram of the hardware structure of an instrument landing analysis device according to an embodiment of the present invention. Figure 2 As shown, the downconverter 100 and the FPGA baseband board 200 are integrated into the vector signal transceiver module 70. The vector signal transceiver module 70 and the zero slot controller 60 are both located on the PXle backplane 80. The vector signal transceiver module 70 and the zero slot controller 60 are both connected to the front panel interface 90.

[0025] Specifically, such as Figure 2 As shown, the landing signal of the instrument to be analyzed enters the RFIN interface of the vector signal transceiver module 70 through the RF input interface 91 of the front panel interface 90. The vector signal transceiver module 70 transmits the processed analytical parameters to the zero slot controller 60 through the PXle backplane 80. The zero slot controller 60 displays the results on the display screen 92.

[0026] Preferably, such as Figure 2 As shown, the DP interface of the zero slot controller 60 is connected to the display screen 92 of the front panel interface 90.

[0027] Specifically, such as Figure 1 As shown, the signal conditioning circuit 10 includes a frequency selector 11, an attenuator 12, a preamplifier 13, a first adjustable attenuator 14, a filter selector 15, an amplifier 16, and a second adjustable attenuator 17 connected in sequence.

[0028] Specifically, the frequency selector 11 is used to select the frequency of the landing signal of the instrument to be analyzed;

[0029] Attenuator 12 is used to attenuate external input signals to prevent the input signal from being too large and damaging internal components;

[0030] The preamplifier 13 is used to amplify small signals with amplitudes below a preset threshold.

[0031] The first adjustable attenuator 14 is used to appropriately adjust the amplitude of the input signal so that the signal processed by the subsequent circuit is at the required level.

[0032] The filter selector 15 is used to perform preliminary filtering on the input signal according to a preset frequency range to prevent noise signals from entering the subsequent processing path.

[0033] Amplifier 16 is used to amplify the filtered signal;

[0034] The second adjustable attenuator 17 is used to adjust the amplitude of the input signal appropriately so that the amplitude of the signal entering the mixer is at a suitable level.

[0035] Specifically, such as Figure 1 As shown, the IQ modulation circuit 20 consists of two modulation end multipliers 21 and a local oscillator 22;

[0036] Local oscillator 22 is used to output two local oscillator signals with a phase difference of 90°;

[0037] The two modulation end multipliers 21 are used to multiply the output signal of the signal conditioning circuit 10 with two local oscillator signals that are 90° out of phase, respectively, to obtain the I-channel modulation signal and the Q-channel modulation signal.

[0038] Specifically, such as Figure 1 As shown, the analog-to-digital converter module 30 includes: a gain controller 31, a first low-pass filter 32, and an analog-to-digital converter 33; the input terminal of the gain controller 31 is connected to the output terminal of the IQ modulation circuit 20, the output terminal of the gain controller 31 is connected to the input terminal of the first low-pass filter 32, the output terminal of the first low-pass filter 32 is connected to the input terminal of the analog-to-digital converter 33, and the output terminal of the analog-to-digital converter 33 is connected to the input terminal of the IQ demodulation circuit 40.

[0039] Specifically, the IQ demodulation circuit 40 includes two demodulation multipliers 41 and one adder 42. The demodulation multipliers 41 are used to multiply the I-channel baseband signal and the Q-channel baseband signal by themselves, respectively, to obtain the I-channel self-multiplied signal and the Q-channel self-multiplied signal.

[0040] Adder 42 is used to add the I-channel self-multiplied signal and the Q-channel self-multiplied signal to obtain the envelope signal.

[0041] Preferably, such as Figure 1 As shown, the multiple filter circuits 50 include a second low-pass filter 51, a band-pass filter 52, and a high-pass filter 53.

[0042] In some optional embodiments provided in this utility model, the second low-pass filter 51 is used to extract the 90Hz frequency modulation signal;

[0043] Bandpass filter 52 is used to extract the 150Hz frequency modulation signal;

[0044] High-pass filter 53 is used to extract the 1020Hz frequency modulation signal.

[0045] Specifically, in the zero-slot controller 60, the 90Hz modulation and 150Hz modulation are subtracted to obtain the difference in depth modulation (DDM), and the parameters of each analysis are displayed on the interface.

[0046] As described above, this utility model provides an instrument landing analysis device that decomposes the original standard instrument landing signal into IQ baseband signals through down-conversion. Then, it separates the carrier signal and various modulation signals through multipliers, adders, and different filters. Furthermore, it calculates the amplitude and frequency of each signal and the modulation difference, thereby realizing the detection of various parameters of the carrier signal and modulation signal. This enables rapid measurement of the instrument landing simulator, with a high degree of automation, alleviating the technical problems of low detection efficiency and large workload in the existing technology.

[0047] It will be apparent to those skilled in the art that this invention is not limited to the details of the exemplary embodiments described above, and that it can be implemented in other specific forms without departing from the spirit or essential characteristics of this invention. Therefore, the embodiments should be considered illustrative and non-limiting in all respects, and the scope of this invention is defined by the appended claims rather than the foregoing description. Thus, it is intended that all variations falling within the meaning and scope of equivalents of the claims be included within this invention. No reference numerals in the claims should be construed as limiting the scope of the claims.

[0048] Furthermore, it should be understood that although this specification describes embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.

Claims

1. An instrument landing analysis device, characterized in that, include: The system includes a downconverter and an FPGA baseband board; the downconverter comprises a signal conditioning circuit, an IQ modulation circuit, and an analog-to-digital converter module; the FPGA baseband board comprises an IQ demodulation circuit and multiple filtering circuits; wherein... The landing signal of the instrument to be analyzed is connected to the input terminal of the signal conditioning circuit. The output terminal of the signal conditioning circuit is connected to the input terminal of the IQ modulation circuit. The output terminal of the IQ modulation circuit is connected to the input terminal of the analog-to-digital converter module. The output terminal of the analog-to-digital converter module is connected to the input terminal of the IQ demodulation circuit. The output terminal of the IQ demodulation circuit is connected to the input terminals of the plurality of filter circuits respectively. The output terminals of the plurality of filter circuits are connected to the zero-slot controller. The IQ modulation circuit is used to modulate the output signal of the signal conditioning circuit into an I-channel modulation signal and a Q-channel modulation signal; The analog-to-digital converter module is used to convert the I-channel modulation signal and the Q-channel modulation signal into an I-channel baseband signal and a Q-channel baseband signal; The IQ demodulation circuit is used to demodulate the I-channel baseband signal and the Q-channel baseband signal into an envelope signal; The plurality of filtering circuits are used to filter the envelope signal at different frequencies to obtain a plurality of frequency modulation signals corresponding to different frequencies. The zero-slot controller is used to analyze the multiple frequency modulation signals to obtain the modulation difference.

2. The instrument landing analysis device according to claim 1, characterized in that: The signal conditioning circuit includes a frequency selector, an attenuator, a preamplifier, a first adjustable attenuator, a filter selector, an amplifier, and a second adjustable attenuator connected in sequence.

3. The instrument landing analysis device according to claim 1, characterized in that: The IQ modulation circuit consists of two modulation multipliers and a local oscillator. The local oscillator is used to output two local oscillator signals with a phase difference of 90°; The two modulation end multipliers are used to multiply the output signal of the signal conditioning circuit with the two local oscillator signals that are 90° out of phase, respectively, to obtain the I-channel modulation signal and the Q-channel modulation signal.

4. The instrument landing analysis device according to claim 1, characterized in that: The analog-to-digital converter module includes: a gain controller, a first low-pass filter, and an analog-to-digital converter; the input terminal of the gain controller is connected to the output terminal of the IQ modulation circuit, the output terminal of the gain controller is connected to the input terminal of the first low-pass filter, the output terminal of the first low-pass filter is connected to the input terminal of the analog-to-digital converter, and the output terminal of the analog-to-digital converter is connected to the input terminal of the IQ demodulation circuit.

5. The instrument landing analysis device according to claim 1, characterized in that: The IQ demodulation circuit includes two demodulation multipliers and one adder. The demodulation multiplier is used to multiply the I-channel baseband signal and the Q-channel baseband signal by themselves, respectively, to obtain the I-channel self-multiplied signal and the Q-channel self-multiplied signal; The adder is used to add the I-channel self-multiplied signal and the Q-channel self-multiplied signal to obtain the envelope signal.

6. The instrument landing analysis device according to claim 1, characterized in that: The plurality of filtering circuits include a second low-pass filter, a band-pass filter, and a high-pass filter.

7. The instrument landing analysis device according to claim 6, characterized in that: The second low-pass filter is used to extract the 90Hz frequency modulation signal; The bandpass filter is used to extract the 150Hz frequency modulation signal; The high-pass filter is used to extract the 1020Hz frequency modulation signal.