A device for measuring the thickness of a capacitive film coating

CN224455762UActive Publication Date: 2026-07-03JIANGMEN HAODA ELECTRONIC TECH CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
JIANGMEN HAODA ELECTRONIC TECH CO LTD
Filing Date
2025-07-03
Publication Date
2026-07-03

AI Technical Summary

Technical Problem

Existing capacitor film coating thickness measuring devices cannot effectively protect the high-frequency measuring probe when not in use, leading to the accumulation of dust and impurities, affecting the measurement results, and the installation and disassembly efficiency is low.

Method used

The design includes an installation component, a protective component, and an adjustment component. The installation component facilitates the installation and removal of the high-frequency measurement probe, the protective component protects the probe when not in use, and the adjustment component ensures accurate measurement.

Benefits of technology

It improves the efficiency of disassembly and assembly of high-frequency measurement probes, prevents the accumulation of dust and impurities, extends service life, and enhances measurement accuracy.

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Abstract

This utility model discloses a capacitor thin film coating thickness measuring device, relating to the field of thin film coating measurement technology. It includes a mounting frame, with an adjusting plate fixedly mounted at the bottom of the mounting frame. Movable frames are provided on both sides of the adjusting plate, and a mounting frame is fixedly connected to the surface of the movable frames. A mounting plate is located inside the mounting frame, and a high-frequency measuring probe is fixedly connected to the surface of the mounting plate. Mounting components are also provided on both sides of the mounting frame. This utility model, through its mounting components, facilitates the disassembly and assembly of the high-frequency measuring probe. The protective components effectively protect the high-frequency measuring probe, and the adjusting components allow for effective adjustment and movement of the high-frequency measuring probe, thereby significantly improving the accuracy of the measurement results.
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Citation Information

Patent Citations

  • Capacitor film coating thickness measuring device

    CN222689140U