A device for measuring the thickness of a capacitive film coating
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- JIANGMEN HAODA ELECTRONIC TECH CO LTD
- Filing Date
- 2025-07-03
- Publication Date
- 2026-07-03
AI Technical Summary
Existing capacitor film coating thickness measuring devices cannot effectively protect the high-frequency measuring probe when not in use, leading to the accumulation of dust and impurities, affecting the measurement results, and the installation and disassembly efficiency is low.
The design includes an installation component, a protective component, and an adjustment component. The installation component facilitates the installation and removal of the high-frequency measurement probe, the protective component protects the probe when not in use, and the adjustment component ensures accurate measurement.
It improves the efficiency of disassembly and assembly of high-frequency measurement probes, prevents the accumulation of dust and impurities, extends service life, and enhances measurement accuracy.
Smart Images

Figure CN224455762U_ABST
Abstract
Citation Information
Patent Citations
Capacitor film coating thickness measuring device
CN222689140U