A diffraction stress analyzer
By introducing a heat dissipation system and multiple detectors into the diffraction stress analyzer, the problems of rising X-ray source temperature and large equipment size were solved, thereby improving the stability and portability of the equipment.
CN224456033UActive Publication Date: 2026-07-03SHENZHEN XPECTVISION TECH CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SHENZHEN XPECTVISION TECH CO LTD
- Filing Date
- 2025-07-21
- Publication Date
- 2026-07-03
Smart Images
Figure CN224456033U_ABST
Abstract
The utility model discloses a kind of diffraction stress analyzers, including shell, X-ray source, detection device and heat dissipation system, shell is provided with containing cavity and detection opening, and detection opening is communicated with containing cavity;X-ray source is housed in containing cavity, X-ray source is used to emit X-ray to detection opening, X-ray is emitted to outside shell via detection opening and is diffracted, forms diffraction X-ray;Detection device is housed in containing cavity, and is exposed setting by detection opening, and detection device is used to detect diffraction X-ray;Heat dissipation system is housed in containing cavity, and heat dissipation system is used to heat dissipation to X-ray source.Such, the temperature of X-ray source can be reduced, ensure that X-ray source stably works.
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