Probe module for testing crystal frequencies

Abstract

This invention discloses a probe module for testing crystal oscillator frequencies, comprising a probe circuit board, a metal block, and several probe assemblies. The probe circuit board is disposed on the metal block. Each probe assembly includes a probe sleeve, leads, and two inner probes. Outer probes are inserted into both ends of the probe sleeve. The metal block has the same number of through holes as the probe assembly, and the probe sleeves are correspondingly disposed in these through holes. The two inner probes of each probe assembly are disposed on the probe circuit board. One inner probe of the probe assembly is grounded, and the other inner probe is connected to one end of the outer probe of the probe sleeve via a lead. This invention utilizes a metal block outside the probe sleeve to create a Faraday cage effect, shielding against external electromagnetic interference. It also reduces signal interference by increasing the spacing between probes through the leads on the circuit board. Furthermore, this invention allows for simultaneous testing of multiple crystal oscillators, improving testing efficiency.

Description

Technical Field

[0001] This utility model relates to the field of wafer manufacturing technology, and in particular to a probe module for testing crystal oscillator frequency. Background Technology

[0002] In crystal oscillator frequency testing, when using conventional probe testing, the crystal oscillators are close to each other in the fixture, which also causes the probes to be close together. As a result, the electromagnetic waves and parasitic capacitances between the probes will interfere with the tested frequency, causing the tested frequency to deviate. Utility Model Content

[0003] The technical problem to be solved by this utility model embodiment is to provide a probe module for testing crystal oscillator frequency in order to reduce interference during testing.

[0004] To address the aforementioned technical problems, this utility model provides a probe module for testing crystal oscillator frequencies, comprising a probe circuit board, a metal block, and several probe assemblies. The probe circuit board is mounted on the metal block, and each probe assembly includes a probe sleeve, a lead wire, and two inner probes. External probes are inserted into both ends of the probe sleeve. The metal block has the same number of through holes as the probe assembly, and the probe sleeve is correspondingly positioned within these through holes. The two inner probes of the probe assembly are mounted on the probe circuit board. One inner probe of the probe assembly is grounded, and the other inner probe is connected to one end of the outer probe of the probe sleeve via a lead wire.

[0005] Furthermore, the probe circuit board is provided with an inner probe positioning plate for fixing the inner probe.

[0006] Furthermore, a shielding plate is provided on the inner probe positioning plate.

[0007] Furthermore, the probe module also includes two sets of external probe positioning plates, which are correspondingly disposed on the metal block. The two external probes of the probe assembly are fixed by the two sets of external probe positioning plates respectively.

[0008] Furthermore, the tops of the inner probes of each probe assembly are flush.

[0009] Furthermore, the inner probe is perpendicular to the probe circuit board.

[0010] The beneficial effects of this invention are as follows: This invention sets a metal block outside the probe sleeve to form a Faraday cage effect, shielding external electromagnetic interference; This invention increases the spacing between probes by using the lead wires on the circuit board to reduce signal interference; This invention can test multiple crystal oscillators simultaneously, improving testing efficiency. Attached Figure Description

[0011] Figure 1This is a three-dimensional structural diagram of a probe module for testing crystal oscillator frequency according to an embodiment of the present invention.

[0012] Figure 2 This is an exploded view of a probe module for testing crystal oscillator frequency according to an embodiment of the present invention.

[0013] Figure 3 This is a cross-sectional schematic diagram of the probe assembly portion according to an embodiment of the present invention.

[0014] Figure 4 This is a schematic diagram of the connection between the inner probe and the outer probe in an embodiment of this utility model.

[0015] Figure 5 This is a schematic diagram of the internal probe structure according to an embodiment of the present invention.

[0016] Explanation of icon numbers

[0017] 16. Shielding plate; 17. Inner probe positioning plate; 18. Inner probe; 19. Probe circuit board; 20. Probe sleeve; 21. Outer probe; 22. Through hole; 23. Metal block; 24. Outer probe positioning plate; 25. Lead wire. Detailed Implementation

[0018] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of this application can be combined with each other. The present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0019] In this embodiment of the invention, directional indicators (such as up, down, left, right, front, back, etc.) are only used to explain the relative positional relationship and movement of the components in a specific posture (as shown in the attached figure). If the specific posture changes, the directional indicators will also change accordingly.

[0020] Furthermore, in this utility model, descriptions involving "first," "second," etc., are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first" or "second" may explicitly or implicitly include at least one of those features.

[0021] Please refer to Figures 1-5 The probe module for testing crystal oscillator frequency according to this embodiment includes a probe circuit board, a metal block, an inner probe positioning plate, a shielding plate (which may be a metal shielding plate), an outer probe positioning plate, and several probe assemblies. Each probe assembly includes a probe sleeve, leads, and two inner probes.

[0022] The probe circuit board is mounted on a metal block. External probes are inserted into both ends of the probe sleeve. The metal block has the same number of through holes (preferably round holes) as the probe assembly. The probe sleeve is positioned within each through hole; preferably, the outer wall of the probe sleeve is spaced a predetermined distance from the inner wall of the through hole. Two inner probes of the probe assembly are mounted on the probe circuit board; one inner probe is grounded, and the other inner probe is connected to one end of the external probe of the probe sleeve via a lead wire. The tops of all inner probes are flush.

[0023] An inner probe positioning plate is mounted on the probe circuit board to fix the inner probe, ensuring it is perpendicular to the circuit board. A shielding plate is mounted on the inner probe positioning plate. External probe positioning plates are located at both the top and bottom of the metal block, and the two external probes at the top and bottom ends of the probe assembly are fixed by these two sets of external probe positioning plates.

[0024] The spacing between the inner probes matches the crystal oscillator spacing, and the inner probes protrude a small length from the shielding plate to reduce interference. Preferably, the leads are integrated onto the probe circuit board, extending the small-pitched inner probe contact points outwards, thus increasing the probe spacing. Each pair of inner probes consists of two probes; only one inner probe needs to be led to the outer perimeter, while the other is grounded. The metal block is made of pure iron, which provides excellent signal shielding. The probe sleeve is surrounded by the metal block, creating a Faraday cage effect. This solution improves the testing accuracy by 120% compared to ordinary testing solutions.

[0025] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A probe module for testing the frequency of a crystal oscillator, characterized by, The device includes a probe circuit board, a metal block, and several probe assemblies. The probe circuit board is mounted on the metal block. Each probe assembly includes a probe sleeve, a lead wire, and two inner probes. Both ends of the probe sleeve are fitted with outer probes. The metal block has the same number of through holes as the probe assembly. The probe sleeve is positioned in each of the through holes. The two inner probes of the probe assembly are mounted on the probe circuit board. One inner probe of the probe assembly is grounded, and the other inner probe is connected to the outer probe at one end of the probe sleeve via a lead wire.

2. The probe module for testing the frequency of a crystal oscillator as recited in claim 1, wherein, The probe circuit board is equipped with an inner probe positioning plate for fixing the inner probe.

3. The probe module for testing crystal oscillator frequency as described in claim 2, characterized in that, The inner probe positioning plate is equipped with a shielding plate.

4. The probe module for testing the frequency of a crystal oscillator as recited in claim 1, wherein, The probe module also includes two sets of external probe positioning plates, which are correspondingly set on the metal block. The two external probes of the probe assembly are fixed by the two sets of external probe positioning plates respectively.

5. The probe module for testing the frequency of a crystal oscillator as recited in claim 1, wherein, The tops of the inner probes of each probe assembly are flush.

6. The probe module for testing the frequency of a crystal oscillator as recited in claim 1, wherein, The inner probe is perpendicular to the probe circuit board.

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