A sorting mechanism for screening photovoltaic silicon wafers
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- JIANGSU CHENGWEI TONGNENG INTELLIGENT TECH CO LTD
- Filing Date
- 2025-07-23
- Publication Date
- 2026-07-14
AI Technical Summary
In existing technologies, silicon wafer inspection processes rely on manual labor or traditional equipment, resulting in complex structures and low production efficiency, making it difficult to effectively detect silicon wafer damage.
The system employs a visual inspection component and a rejection transition component. The visual inspection component determines whether the photovoltaic silicon wafers are qualified, the rejection transition component adsorbs and transports qualified silicon wafers, and the waste component collects unqualified silicon wafers, thus achieving automated sorting.
It improves the efficiency of photovoltaic silicon wafer inspection, ensures high efficiency and accuracy in the transmission process, reduces manual intervention, and enhances production efficiency.
Smart Images

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