High-temperature reverse bias test equipment feeding and discharging device

Abstract

The utility model discloses a kind of high-temperature reverse bias test equipment feeding and discharging devices, belong to high-temperature reverse bias test technical field, this kind of high-temperature reverse bias test equipment feeding and discharging devices includes high-temperature reverse bias test equipment, the high-temperature reverse bias test equipment is provided with test cavity, further including high-temperature reverse deviation aging plate, the high-temperature reverse deviation aging plate is slidably connected in the inner wall of the high-temperature reverse bias test equipment by connecting block, detachable mounting feeding plate is formed on the high-temperature reverse deviation aging plate upper end, the feeding plate is provided with cavity and electronic component pin placement groove. The device can limit electronic component when feeding by electronic component pin limiting mechanism, and the extrusion degree of pin can be adjusted in the limiting process, prevent damaging electronic component pin while limiting, and multiple groups of materials can be fed simultaneously, so that test efficiency is enhanced.

Description

Technical Field

[0001] This utility model relates to the field of high temperature reverse bias testing, and more specifically, to a loading and unloading device for high temperature reverse bias testing equipment. Background Technology

[0002] Electronic components are the fundamental elements of electronic circuits, typically individually packaged with two or more leads or metal contacts. Electronic components must be interconnected to form an electronic circuit with a specific function. Reliability testing of electronic components determines the reliability characteristics of electronic products under various environmental conditions, providing useful data for use, production, and design. It can also expose problems in product design, raw materials, and processes. Through failure analysis, quality control, and other feedback measures, these problems can be gradually resolved, improving product reliability. In lifespan screening, high-temperature reverse-bias life testing machines are used to perform high-temperature reverse-bias tests on electronic components. The electronic components under test in these machines are often tested using high-temperature reverse-bias aging boards. However, existing high-temperature reverse-bias life testing machines cannot effectively protect the lead pins of electronic components during loading and limiting. These lead pins are relatively thin and fragile, and may be damaged by excessive pressure during the limiting process, increasing production costs and causing deviations in test results. How to improve these problems has become a pressing issue for those skilled in the art. Utility Model Content

[0003] To overcome the above shortcomings, this utility model provides a loading and unloading device for a high-temperature reverse bias test equipment. This device aims to improve the performance of electronic components tested in high-temperature reverse bias life testers, where the components are often tested using high-temperature reverse bias aging boards. Existing high-temperature reverse bias life testers for electronic components often fail to effectively protect the component leads during loading and limiting. These leads are delicate and fragile, and may be damaged due to excessive pressure during the limiting process, increasing production costs and causing deviations in test results.

[0004] This utility model is implemented as follows: a loading and unloading device for a high-temperature reverse bias test equipment, including a high-temperature reverse bias test equipment, the high-temperature reverse bias test equipment being provided with a test chamber, and also including a high-temperature reverse bias aging plate, the high-temperature reverse bias aging plate being slidably connected to the inner wall of the high-temperature reverse bias test equipment through a connecting block, a loading plate being detachably installed on the upper end of the high-temperature reverse bias aging plate, the loading plate being provided with a cavity and an electronic component pin placement slot, an electronic component pin limiting mechanism being installed on the inner side of the cavity, the electronic component pin limiting mechanism being used to limit the electronic component pins and prevent damage to the electronic component pins during the limiting process.

[0005] In a preferred embodiment of this invention, the electronic component pin limiting mechanism includes a lead screw rotatably mounted inside the cavity. A sleeve block is threaded onto the lead screw, and a limiting block is mounted on one side of the sleeve block. The sleeve block slides through the cavity, with its tail end positioned within the electronic component pin placement slot. A rod is mounted inside the electronic component pin placement slot, and a slide rod is slidably inserted into the inner wall of the rod. A spring connects the inner end of the rod and one end of the slide rod, and a second limiting block is mounted on one end of the slide rod. The electronic component pin is inserted into the electronic component pin placement slot and then into the electronic component pin insertion hole located at the upper end of the high-temperature anti-deviation aging plate. Rotation of the lead screw causes the sleeve block to move, thereby limiting the electronic component pin in conjunction with the second limiting block. The position of the limiting block and the spring at one end of the slide rod prevent damage to the electronic component pin.

[0006] In a preferred embodiment of this utility model, two sets of electronic component pin placement slots are provided on both sides of the cavity, the threads at both ends of the lead screw are arranged in opposite directions, and two sets of sleeve blocks are provided, with the two sets of sleeve blocks threadedly installed at both ends of the lead screw.

[0007] In a preferred embodiment of this utility model, a rotating rod is rotatably mounted at the inner end of the cavity, a worm gear is mounted at one end of the rotating rod, and a worm wheel is fixedly sleeved on the outside of the lead screw. The worm gear and the worm wheel are meshed together. The rotation of the rotating rod causes the worm gear to drive the worm wheel to rotate, thereby causing the lead screw to rotate. At the same time, the self-locking property of the worm gear prevents the lead screw from rotating in the opposite direction, thereby enhancing the stability of the limiting position.

[0008] In a preferred embodiment of this utility model, the rotating rod rotatably passes through one end of the feeding plate, and a rotating handle is installed at one end of the rotating rod.

[0009] In a preferred embodiment of this utility model, both the limiting block and the second limiting block are elastically arranged, and both the limiting block and the second limiting block have anti-slip textures on one side.

[0010] In a preferred embodiment of this utility model, a guide groove is provided on the inner side of the cavity, and a guide block is provided on one side of the sleeve block and the guide block is slidably connected in the guide groove to enhance the stability of the limiting block and the sleeve block when they move.

[0011] In the preferred embodiment of this utility model, the high-temperature reverse deviation aging plate and the feeding plate are connected and fixed by pins. The high-temperature reverse deviation aging plate and the feeding plate are fixed by pins. The material on the feeding plate is tested by the test chamber of the high-temperature reverse bias test equipment. After the test is completed, the electronic component material on the feeding plate is unloaded.

[0012] The beneficial effects of this utility model are as follows: This utility model provides a high-temperature reverse bias testing equipment loading and unloading device. During use, the electronic component pins are inserted into the electronic component pin placement slot and then into the electronic component pin insertion hole located at the upper end of the high-temperature reverse bias aging plate. Rotating the handle rotates the rotating rod, which in turn causes the worm gear to rotate, resulting in the lead screw rotating. This rotation of the lead screw causes the sleeve block to move, moving the limiting block. The limiting block, in conjunction with the second limiting block, limits the electronic component pins. The position of the limiting block adjusts the pressure applied to the electronic component pins and the elasticity of the spring at one end of the sliding rod, preventing damage to the electronic component pins. After loading, the material on the loading plate is tested against the high-temperature reverse bias aging plate through the test chamber of the high-temperature reverse bias testing equipment. This device, through its electronic component pin limiting mechanism, can limit the electronic components during loading and adjust the pressure applied to the pins during the limiting process. This prevents damage to the electronic component pins while limiting them, and it can load multiple sets of materials simultaneously, thus enhancing testing efficiency. Attached Figure Description

[0013] To more clearly illustrate the technical solutions of the embodiments of this utility model, the drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this utility model and should not be regarded as a limitation of the scope. For those skilled in the art, other related drawings can be obtained from these drawings without creative effort.

[0014] Figure 1 This is a schematic diagram of the loading and unloading device for a high-temperature reverse bias test equipment provided by an embodiment of this utility model;

[0015] Figure 2 A schematic diagram of the internal structure provided for an embodiment of this utility model;

[0016] Figure 3 A schematic diagram of the feeding plate structure provided for an embodiment of this utility model;

[0017] Figure 4 for Figure 3 A magnified view of position A in the middle.

[0018] In the diagram: 100-High temperature reverse bias test equipment; 101-Test chamber; 200-High temperature reverse deviation aging board; 210-Connecting block; 300-Feeding plate; 301-Cavity; 302-Electronic component pin placement slot; 310-Pin; 400-Electronic component pin limiting mechanism; 410-Lead screw; 420-Sleeve block; 430-Limiting block; 440-Worm gear; 450-Rotating rod; 460-Worm; 470-Rotating handle; 480-Sleeve rod; 481-Slide rod; 490-Second limiting block. Detailed Implementation

[0019] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model.

[0020] Please see Figures 1-4 This utility model provides a technical solution: a loading and unloading device for a high-temperature reverse bias test equipment, including a high-temperature reverse bias test equipment 100, a test chamber 101 provided in the high-temperature reverse bias test equipment 100, and a high-temperature reverse deviation aging plate 200. The high-temperature reverse deviation aging plate 200 is slidably connected to the inner wall of the high-temperature reverse bias test equipment 100 through a connecting block 210. A loading plate 300 is detachably installed on the upper end of the high-temperature reverse deviation aging plate 200. The loading plate 300 is provided with a cavity 301 and an electronic component pin placement slot 302. An electronic component pin limiting mechanism 400 is installed inside the cavity 301. The electronic component pin limiting mechanism 400 is used to limit the electronic component pins and prevent damage to the electronic component pins during the limiting process.

[0021] In some specific embodiments, the electronic component pin limiting mechanism 400 includes a lead screw 410, which is rotatably mounted inside the cavity 301. A sleeve block 420 is threaded onto the lead screw 410, and a limiting block 430 is mounted on one side of the sleeve block 420. The sleeve block 420 slides through the cavity 301 and its tail end is positioned within the electronic component pin placement slot 302. A sleeve rod 480 is mounted inside the electronic component pin placement slot 302, and a sliding rod 481 is slidably inserted into the inner wall of the sleeve rod 480. The inner end of the sleeve rod 480 and the sliding rod 481 are connected to each other. One end of the slide rod 481 is connected to a spring, and the other end of the slide rod 481 is equipped with a second limiting block 490. The electronic component pin is inserted into the electronic component pin placement slot 302 and into the electronic component pin insertion hole set at the upper end of the high temperature anti-deviation aging board 200. The screw 410 rotates, causing the sleeve block 420 to drive the limiting block 430 to move, so that the limiting block 430 cooperates with the second limiting block 490 to limit the electronic component pin. Through the position of the limiting block 430 and the spring at one end of the slide rod 481, damage to the electronic component pin is avoided.

[0022] In some specific implementations, two sets of electronic component pin placement slots 302 are provided on both sides of the cavity 301, the threads of the lead screw 410 are arranged in opposite directions at both ends, and two sets of sleeve blocks 420 are provided, with the two sets of sleeve blocks 420 threadedly installed at both ends of the lead screw 410.

[0023] In some specific implementations, a rotating rod 450 is rotatably mounted inside the cavity 301, and a worm gear 460 is mounted on one end of the rotating rod 450. A worm wheel 440 is fixedly sleeved on the outside of the lead screw 410. The worm gear 460 and the worm wheel 440 are meshed together. The rotation of the rotating rod 450 causes the worm gear 460 to drive the worm wheel 440 to rotate, which in turn causes the lead screw 410 to rotate. At the same time, the self-locking property of the worm gear 460 prevents the lead screw 410 from rotating in the opposite direction, thereby enhancing the stability of the limit.

[0024] In some specific implementations, the rotating rod 450 rotates through one end of the feeding plate 300, and a rotating handle 470 is installed at one end of the rotating rod 450.

[0025] In some specific implementations, both the limiting block 430 and the second limiting block 490 are elastically configured, and both the limiting block 430 and the second limiting block 490 have anti-slip textures on one side.

[0026] In some specific implementations, a guide groove is provided on the inner side of the cavity 301, and a guide block is provided on one side of the sleeve block 420 and the guide block is slidably connected in the guide groove, which is used to enhance the stability of the limit block 430 and the sleeve block 420 when they move.

[0027] In some specific implementation schemes, the high-temperature reverse bias aging board 200 and the feeding board 300 are connected and fixed by pins 310. The high-temperature reverse bias aging board 200 and the feeding board 300 are fixed by pins 310. The material on the feeding board 300 is tested by the test chamber 101 of the high-temperature reverse bias test equipment 100. After the test is completed, the electronic component material on the feeding board 300 is unloaded.

[0028] Working principle: During use, the electronic component pins are inserted into the electronic component pin placement slot 302 and then into the electronic component pin insertion holes set on the upper end of the high-temperature reverse bias aging board 200. By rotating the handle 470, the rotating rod 450 is rotated. The rotation of the rotating rod 450 causes the worm gear 460 to drive the worm wheel 440 to rotate, which in turn causes the lead screw 410 to rotate. The rotation of the lead screw 410 causes the sleeve block 420 to drive the limiting block 430 to move. The limiting block 430, in conjunction with the second limiting block 490, limits the electronic component pins. The position of the limiting block 430 is adjusted to control the pressure on the electronic component pins and the elasticity of the spring at one end of the slide rod 481, thus preventing damage to the electronic component pins. After the loading is completed, the material on the loading plate 300 is tested in conjunction with the high-temperature reverse bias aging board 200 through the test chamber 101 of the high-temperature reverse bias test equipment 100.

[0029] The above description is merely a preferred embodiment of this utility model and is not intended to limit the utility model. Various modifications and variations can be made to this utility model by those skilled in the art. Any modifications, equivalent substitutions, or improvements made within the spirit and principles of this utility model should be included within the protection scope of this utility model.

Claims

1. A loading and unloading device for a high-temperature reverse bias test device, comprising a high-temperature reverse bias test device, wherein the high-temperature reverse bias test device is provided with a test chamber, characterized in that, It also includes a high-temperature reverse deviation aging plate, which is slidably connected to the inner wall of the high-temperature reverse bias test equipment via a connecting block. A feeding plate is detachably installed on the upper end of the high-temperature reverse deviation aging plate. The feeding plate is provided with a cavity and an electronic component pin placement slot. An electronic component pin limiting mechanism is installed on the inner side of the cavity. The electronic component pin limiting mechanism is used to limit the electronic component pins and prevent damage to the electronic component pins during the limiting process.

2. The loading and unloading device for a high-temperature reverse bias test equipment according to claim 1, characterized in that, The electronic component pin limiting mechanism includes a lead screw, which is rotatably mounted inside the cavity. A sleeve block is threaded onto the lead screw, and a limiting block is mounted on one side of the sleeve block. The sleeve block slides through the cavity and its tail end is positioned in the electronic component pin placement slot. A sleeve rod is mounted inside the electronic component pin placement slot, and a slide rod is slidably inserted into the inner wall of the sleeve rod. A spring is connected to the inner end of the sleeve rod and one end of the slide rod, and a second limiting block is mounted on one end of the slide rod.

3. The loading and unloading device for a high-temperature reverse bias test equipment according to claim 2, characterized in that, The electronic component pin placement slots are provided in two sets and are located on both sides of the cavity. The threads at both ends of the lead screw are arranged in opposite directions. The sleeve blocks are provided in two sets, and the two sets of sleeve blocks are threadedly installed at both ends of the lead screw.

4. The loading and unloading device for a high-temperature reverse bias test equipment according to claim 2, characterized in that, A rotating rod is rotatably mounted at the inner end of the cavity, a worm gear is mounted at one end of the rotating rod, and a worm wheel is fixedly sleeved on the outside of the lead screw, with the worm gear and the worm wheel meshing together.

5. The loading and unloading device for a high-temperature reverse bias test equipment according to claim 4, characterized in that, The rotating rod rotates through one end of the feeding plate, and a rotating handle is installed at one end of the rotating rod.

6. The loading and unloading device for a high-temperature reverse bias test equipment according to claim 5, characterized in that, Both the limiting block and the second limiting block are elastically arranged, and both the limiting block and the second limiting block have anti-slip textures on one side.

7. The loading and unloading device for a high-temperature reverse bias test equipment according to claim 2, characterized in that, A guide groove is provided on the inner side of the cavity, and a guide block is provided on one side of the sleeve block, with the guide block slidably connected to the guide groove.

8. The loading and unloading device for a high-temperature reverse bias test equipment according to claim 1, characterized in that, The high-temperature anti-deviation aging plate and the feeding plate are connected and fixed by pins.

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