Capacitive pin detection device

By designing a capacitor pin testing device with multi-angle shooting and a closed environment, the problems of single angle and external interference in traditional testing are solved, realizing efficient and complete capacitor pin testing and adapting to the needs of capacitors of different specifications.

CN224500418UActive Publication Date: 2026-07-14SHENZHEN MUEN TECHNOLOGY CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
SHENZHEN MUEN TECHNOLOGY CO LTD
Filing Date
2025-07-04
Publication Date
2026-07-14

AI Technical Summary

Technical Problem

In traditional capacitor pin inspection, the single shooting angle leads to incomplete defect identification, low inspection efficiency, and susceptibility to external interference, making it difficult to meet the inspection needs of capacitors of different specifications.

Method used

Design a capacitor pin detection device, including a support component, an imaging component, a enclosure and a light source component. It enables multi-angle imaging through the gap of the turntable, provides a closed environment, and combines multiple cameras and a sliding light source component to ensure detection consistency and adaptability.

Benefits of technology

It improves the efficiency and scope of testing, ensures the consistency of test results and the compactness of the structure, enhances the adaptability to capacitors of different specifications, reduces external interference, and improves the accuracy and automation level of testing.

✦ Generated by Eureka AI based on patent content.

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Abstract

The application relates to a capacitor pin detection device, which is applied to capacitor pin detection through cooperation of a supporting assembly, a shooting assembly, an enclosure and a light source assembly, can help obtain photos of the pins of a capacitor to be detected from multiple angles at one time, is higher in detection efficiency and more complete in detection range, overcomes the defect identification problem existing in the traditional detection mode, provides a relatively closed enclosure environment, guarantees the environmental consistency of capacitor pin detection, makes the positions and angles of each pin shot by the first camera through the first position-avoiding groove the same, guarantees the consistency of the pin detection result, is favorable for enhancing the structural compactness of the capacitor pin detection device, and reduces the space occupied by the capacitor pin detection device; the capacitor to be detected enters and leaves the shooting position through the rotating disc gap, is favorable for realizing pin detection of various specifications of capacitors to be detected in cooperation with rotating discs of various specifications, and improves the adaptability.
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Description

Technical Field

[0001] This application relates to the field of appearance inspection, and in particular to a device for inspecting capacitor pins. Background Technology

[0002] Traditional capacitor pin inspection involves taking pictures of the capacitor pins with a camera. However, the resulting photos do not provide a complete picture of the capacitor pins and can easily lead to problems in identifying defects in certain locations.

[0003] Therefore, for capacitor pin detection in transmission mode, the camera position needs to be adjusted for shooting, which reduces detection efficiency and may still lead to some location defect identification problems. Utility Model Content

[0004] Therefore, it is necessary to provide a capacitor pin detection device.

[0005] One embodiment of this application is a capacitor pin detection device, which includes a support assembly, a camera assembly, a enclosure, and a light source assembly;

[0006] The shooting component and the enclosure are respectively mounted on the support component. There is a turntable gap between the enclosure and the light source component so that the capacitor to be tested can pass through the turntable gap to enter and exit the shooting position in the enclosure.

[0007] The shooting assembly includes a first camera mount and a first camera. Each first camera mount is arranged around the shooting position, and a first camera is mounted on each first camera mount. The first camera is used to shoot the pin of the capacitor to be tested located at the shooting position through the first clearance groove of the enclosure.

[0008] The aforementioned capacitor pin detection device, through the cooperation of a support component, an imaging component, a enclosure, and a light source component, is applied to capacitor pin detection. On one hand, it facilitates the simultaneous acquisition of images of the capacitor pins from multiple angles, enabling the detection of pin defects. This results in higher detection efficiency and a more complete detection range, overcoming the defect identification problems inherent in traditional detection methods. On the other hand, it provides a relatively enclosed enclosure environment, ensuring environmental consistency for capacitor pin detection and minimizing external interference. Furthermore, the first camera captures images of the pins at the shooting position through the first clearance slot, ensuring that the position and angle of each pin are identical, further guaranteeing the consistency of pin detection results and enhancing the structural compactness of the capacitor pin detection device, reducing the space occupied. Moreover, the capacitors under test enter and leave the shooting position through the turntable gap, facilitating the detection of pins for capacitors of various sizes using turntables, thus improving the adaptability of the capacitor pin detection device.

[0009] In some embodiments, the capacitor pin detection device further includes a sliding component and a driving component;

[0010] The light source component is disposed on the sliding component, and the driving component is drivingly connected to the light source component to drive the light source component to slide on the sliding component.

[0011] In some embodiments, the sliding assembly includes a column, a carriage, a carriage base, a fixing base, and a light source bracket;

[0012] The carriage base is mounted on the column, the carriage is mounted on the carriage base, the fixed base is slidably mounted on the carriage, and the light source bracket is mounted on the fixed base;

[0013] The light source assembly is mounted on the light source bracket, and the driving assembly is driven to be connected to the fixed base to drive the light source assembly to slide on the slide.

[0014] As an example, the column is used to be installed on an operating table or other installation location to fix the sliding assembly as a whole; as an example, the column is also connected to the support assembly; for embodiments with a base, as an example, the column is also connected to the base.

[0015] In some embodiments, the drive assembly includes a motor mount and a stepper motor;

[0016] The motor base is mounted on the column or the slide base, and the stepper motor is mounted on the motor base and drivenly connected to the fixed base to drive the fixed base to slide on the slide.

[0017] In some embodiments, the fence has a cylindrical shape, the light source assembly has a partially spherical shape adapted to the cylindrical shape, and the light source assembly has a position in contact with or near the top of the fence while sliding on the sliding assembly.

[0018] In some embodiments, the number of the first camera mounts and the first cameras is 3 to 6, and each of the first camera mounts is centrally symmetrically distributed with respect to the shooting position.

[0019] In some embodiments, the enclosure is further provided with a positioning transmission groove, and the capacitor pin detection device further includes a positioning component disposed on the support assembly. The positioning component is used to determine, through the positioning transmission groove, that the pin of the capacitor to be tested is located at the shooting position; or,

[0020] The inner wall of the enclosure is provided with a reflective surface; or,

[0021] The enclosure is equipped with an auxiliary light source inside, and the inner wall of the enclosure is a light-transmitting layer.

[0022] In some embodiments, the light source assembly is positioned above the enclosure.

[0023] In some embodiments, the light source assembly has a second recess, and the imaging assembly further includes a second camera mount and a second camera;

[0024] The second camera is mounted on the second camera mount and is used to photograph the top of the capacitor to be tested located at the shooting position through the second recess of the light source assembly.

[0025] In some embodiments, the second camera mount is connected to the light source assembly so that the second camera and the light source assembly are linked. Attached Figure Description

[0026] To more clearly illustrate the technical solutions in the embodiments of this application or the conventional technology, the drawings used in the description of the embodiments or the conventional technology will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0027] Figure 1 This is a schematic diagram of an embodiment of the capacitor pin detection device described in this application.

[0028] Figure 2 for Figure 1 Another schematic diagram of the embodiment shown.

[0029] Figure 3 for Figure 2 Another schematic diagram of the embodiment shown.

[0030] Figure 4 for Figure 1 The illustrated embodiment is a schematic diagram of its application in another direction.

[0031] Figure 5 for Figure 4 A partial structural schematic diagram of the embodiment shown.

[0032] Figure 6 for Figure 4 Another schematic diagram of the embodiment shown.

[0033] Figure 7 for Figure 6 The illustrated embodiment is a partial structural diagram in another direction.

[0034] Figure 8 for Figure 7 Another schematic diagram of the embodiment shown.

[0035] Figure 9 for Figure 8 Another schematic diagram of the embodiment shown.

[0036] Figure 10 for Figure 5 The illustrated embodiment is a partial structural diagram in another direction.

[0037] Reference numerals: Capacitor pin detection device 100, support assembly 110, sliding assembly 120, drive assembly 130, imaging assembly 140, enclosure 150, light source assembly 160, turntable gap 170, positioning assembly 180, base 111, support column 112, column 121, carriage 122, carriage seat 123, fixed seat 124, light source bracket 125, motor seat 131, stepper motor 132, first camera seat 141, second camera seat 142, first camera 143, second camera 144, lens 145, imaging position 151, first clearance groove 152, positioning transmission groove 153, second clearance groove 162, capacitor to be tested 200, pin 210. Detailed Implementation

[0038] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.

[0039] It should be noted that when a component is referred to as being "fixed to" or "set on" another component, it can be directly on the other component or there may be an intermediate component. When a component is considered to be "connected to" another component, it can be directly connected to the other component or there may be an intermediate component present. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used in this application's specification are for illustrative purposes only and do not represent the only possible implementation.

[0040] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0041] In this application, unless otherwise expressly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature and the second feature are in indirect contact through an intermediate medium. Furthermore, "above," "over," and "on top" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.

[0042] Unless otherwise defined, all technical and scientific terms used in this application have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in this application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. The term "and or" as used in this application includes any and all combinations of one or more of the associated listed items.

[0043] This application discloses a capacitor pin detection device, which includes some or all of the technical features of the following embodiments; that is, the capacitor pin detection device includes some or all of the following structures. In one embodiment of this application, a capacitor pin detection device includes a support assembly, an imaging assembly, a barrier, and a light source assembly; the imaging assembly and the barrier are respectively disposed on the support assembly, and a turntable gap is provided between the barrier and the light source assembly to allow the capacitor to be tested to pass through the turntable gap into and out of the imaging position in the barrier; the imaging assembly includes a first camera mount and a first camera, each first camera mount is disposed around the imaging position, and a first camera is mounted on each first camera mount, the first camera being used to photograph the pin of the capacitor to be tested located at the imaging position through a first clearance groove of the barrier. The aforementioned capacitor pin detection device, through the cooperation of a support component, an imaging component, a enclosure, and a light source component, is applied to capacitor pin detection. On one hand, it facilitates the simultaneous acquisition of images of the capacitor pins from multiple angles, enabling the detection of pin defects. This results in higher detection efficiency and a more complete detection range, overcoming the defect identification problems inherent in traditional detection methods. On the other hand, it provides a relatively enclosed enclosure environment, ensuring environmental consistency for capacitor pin detection and minimizing external interference. Furthermore, the first camera captures images of the pins at the shooting position through the first clearance slot, ensuring that the position and angle of each pin are identical, further guaranteeing the consistency of pin detection results and enhancing the structural compactness of the capacitor pin detection device, reducing the space occupied. Moreover, the capacitors under test enter and leave the shooting position through the turntable gap, facilitating the detection of pins for capacitors of various sizes using turntables, thus improving the adaptability of the capacitor pin detection device.

[0044] The following is combined with Figures 1 to 10 The capacitor pin detection device will be described in detail below. In some embodiments, a capacitor pin detection device 100 is as follows: Figure 1 As shown, it includes a support assembly 110, a shooting assembly 140, a barrier 150, and a light source assembly 160; combined with Figure 2 and Figure 3The shooting component 140 and the enclosure 150 are respectively disposed on the support component 110. The enclosure 150 and the light source component 160 have a turntable gap 170 so that the capacitor to be tested 200 can pass through the turntable gap 170 to enter and exit the shooting position 151 in the enclosure 150. The shooting component 140 includes a first camera mount 141 and a first camera 143. Each first camera mount 141 is disposed around the shooting position 151, and a first camera 143 is mounted on each first camera mount 141. The first camera 143 is used to photograph the pin 210 of the capacitor to be tested 200 located at the shooting position 151 through the first clearance groove 152 of the enclosure 150. This structural design, through the cooperation of the support component 110, the imaging component 140, the enclosure 150, and the light source component 160, is applied to capacitor pin inspection. On the one hand, it facilitates the simultaneous acquisition of images of the pins 210 of the capacitor 200 under inspection from multiple angles, enabling the detection of defects in pins 210. Therefore, the inspection efficiency is higher and the inspection range is more complete, overcoming the defect identification problems of traditional inspection methods. On the other hand, it provides a relatively enclosed enclosure environment, ensuring environmental consistency for capacitor pin inspection as much as possible and preventing external interference. Furthermore, through the first camera 143... By using the first recessed slot 152 to photograph the pins 210 located at the photographing position 151, the position and angle of each pin 210 being photographed are the same, further ensuring the consistency of the pin detection results and enhancing the structural compactness of the capacitor pin detection device 100, thus reducing the space occupied by the capacitor pin detection device 100. On the other hand, the capacitor 200 to be tested enters and leaves the photographing position 151 through the turntable gap 170, which is conducive to the detection of the pins 210 of various specifications of capacitors 200 to be tested by various turntables, thereby improving the adaptability of the capacitor pin detection device 100.

[0045] In each embodiment, such as Figure 5 and Figure 6As shown, the shooting component 140 and the enclosure 150 are respectively disposed on the support component 110. A turntable gap 170 is provided between the enclosure 150 and the light source component 160 to allow the capacitor to be tested 200 to enter and exit the shooting position 151 within the enclosure 150 through the turntable gap 170. The turntable gap 170 allows the turntable holding the capacitor to be tested 200 to enter or leave the enclosure 150, thereby sending the capacitor to be tested 200 into the shooting position 151, and, after completing the shooting or testing, sending the capacitor to be tested 200 out of the enclosure 150. In some embodiments, the inner wall of the enclosure 150 is provided with a reflective surface; or, the interior of the enclosure 150 is provided with an auxiliary light source, and the inner wall of the enclosure 150 is a light-transmitting layer. This structural design, on the one hand, allows the capacitor 200 to be tested to be quickly and smoothly moved in and out of the shooting position 151 within the enclosure 150 by setting the turntable gap 170 in conjunction with the rotating suction plate, thus reducing the loading and unloading time of the capacitor 200 during the testing process and improving the overall efficiency of the testing. On the other hand, the reflective surface or light-transmitting layer of the inner wall of the enclosure 150 can better reflect or transmit the light emitted by the light source component 160, so that the pins 210 of the capacitor 200 can obtain more uniform and sufficient lighting conditions during shooting, thereby improving the quality of the pin images acquired by the shooting component 140 and thus improving the accuracy of detecting defects in the pins 210. Furthermore, the enclosure 150 provides a relatively closed environment for capacitor pin testing, which can effectively isolate external light, dust and other interference factors, ensuring that the environmental conditions are consistent for each test, further improving the stability and reliability of the test results. On the other hand, the design of the turntable gap 170 allows turntables of different specifications to enter the enclosure 150, which enables the capacitor pin detection device 100 to adapt to various specifications of capacitors 200 to be tested, enhancing the versatility and flexibility of the device.

[0046] As an example, such as Figure 6 and Figure 10As shown, the support assembly 110 includes a base 111 and a support column 112. The imaging assembly 140 and the enclosure 150 are respectively disposed on the base 111, and the base 111 is disposed on the support column 112. The support column 112 is used for external installation to fix the support assembly 110 or to fix the capacitor pin detection device 100 as a whole. This structural design, on the one hand, provides a stable mounting platform for the imaging assembly 140 and the enclosure 150 as the core part of the support assembly 110, and its large contact area can effectively distribute the weight of the equipment, ensuring the stability of the entire detection device during operation and preventing image blurring or detection position displacement caused by vibration or external force. On the other hand, the support column 112 connects the base 111 to the external fixing structure, forming a vertical support system, which not only enhances the stability of the entire device but also withstands greater external impact, extending the service life of the equipment, while ensuring the accuracy and reliability of the detection process. On the other hand, by mounting the base 111 on the support column 112, the height and position of the entire testing device can be easily adjusted to accommodate different specifications of the capacitors 200 to be tested and different testing environments. This allows the device to better adapt to various needs on the production line, improving its versatility and adaptability. Furthermore, the design of the support column 112 ensures that the base 111 and its components maintain a certain distance from the ground or other supporting surfaces, providing sufficient space for the installation and operation of the turntable gap 170 and other related components. This not only facilitates equipment maintenance and repair but also improves the overall compactness of the equipment and reduces its footprint. Moreover, this layered structure design of the support component 110 facilitates subsequent upgrades and expansions of the equipment. For example, additional support components or functional modules can be added to the support column 112 without requiring a large-scale redesign or modification of the entire device, thus reducing the cost and complexity of equipment upgrades.

[0047] In some of these embodiments, such as Figure 6 and Figure 7As shown, the enclosure 150 also has a positioning transmission groove 153, and the capacitor pin detection device 100 further includes a positioning component 180 disposed on the support component 110. The positioning component 180 is used to determine, through the positioning transmission groove 153, whether the pin 210 of the capacitor 200 to be tested is located at the shooting position 151. This structural design allows the positioning component 180 to accurately determine whether the pin 210 of the capacitor 200 to be tested is accurately located at the shooting position 151 through the positioning transmission groove 153, thereby ensuring that the shooting component 140 is in the optimal position for shooting and avoiding detection errors caused by positional deviations. Furthermore, the introduction of the positioning component 180 enables the capacitor pin detection device 100 to automatically identify and calibrate the position of the capacitor 200 to be tested, reducing manual intervention, improving the automation level of the detection process, and increasing detection efficiency. Moreover, by quickly locating the pin 210, the device can enter the detection stage more quickly, reducing the time wasted due to positional adjustments, thereby improving overall detection efficiency. On the other hand, the positioning component 180 ensures that the pin 210 of the capacitor 200 under test is in the same position during each test, thereby ensuring the consistency and repeatability of the test results and improving the reliability of the test device. Furthermore, the design of the positioning transmission groove 153 enables the positioning component 180 to perform positioning operations inside the enclosure 150 without affecting the enclosure 150's sealing of the test environment, further ensuring the stability and consistency of the test environment.

[0048] In each embodiment, such as Figure 3 and Figure 4 As shown, the imaging assembly 140 includes a first camera mount 141 and a first camera 143. Each first camera mount 141 is arranged around the imaging position 151, and each first camera mount 141 is equipped with a first camera 143. The first camera 143 is used to photograph the pin 210 of the capacitor 200 to be tested located at the imaging position 151 through the first recess 152 of the enclosure 150. As an example, in the illustrated embodiment, the imaging assembly 140 also includes a lens 145 connected to the first camera 143. In some embodiments, the number of first camera mounts 141 and first cameras 143 is 3 to 6, and each first camera mount 141 is centrally symmetrically distributed with respect to the imaging position 151. As an example, such as Figure 8 and Figure 9As shown, there are four first camera mounts 141 and four first cameras 143, and the four first camera mounts 141 are centrally symmetrically distributed relative to the shooting position 151. This structural design allows for several advantages. First, the multiple first cameras 143, symmetrically distributed around the shooting position 151, can simultaneously capture images of the pins 210 of the capacitor 200 under test from different angles, ensuring that all sides and details of the pins 210 are clearly captured, thus achieving more comprehensive and accurate detection. Second, the simultaneous operation of multiple first cameras 143 allows for the acquisition of images from multiple angles in a single shooting process, eliminating blind spots and reducing the time required for multiple adjustments to the capacitor position or camera angle in traditional single-camera detection, significantly improving detection efficiency. Furthermore, by capturing images from different angles using multiple cameras, defects in the pins 210, such as bending, breakage, or short circuits, can be more accurately identified, thereby improving the accuracy and reliability of the detection. On the other hand, the compact layout of the first camera mount 141 and the first camera 143 around the shooting position 151 makes the structure of the entire shooting assembly 140 more compact, reduces the size of the device, and facilitates installation and operation in a limited space; in addition, the centrally symmetrically distributed camera design ensures the consistency of the conditions and angles for each shooting, thereby ensuring the stability and repeatability of the detection results and further improving the overall performance of the detection device.

[0049] In some of these embodiments, such as Figure 1 and Figure 3As shown, the capacitor pin detection device 100 further includes a sliding component 120 and a driving component 130; the light source component 160 is disposed on the sliding component 120, and the driving component 130 is drivenly connected to the light source component 160 to drive the light source component 160 to slide on the sliding component 120. This structural design, on the one hand, allows the light source component 160 to slide on the sliding component 120 via the driving component 130, enabling flexible adjustment of the angle and position of the light source according to the specific position and shape of the pin 210 of the capacitor 200 to be detected, ensuring optimal illumination of the pin 210 during imaging, thereby improving image quality. On the other hand, flexible adjustment of the light source position reduces the impact of shadows and reflections on the captured image, allowing the imaging component 140 to capture the details of the pin 210 more clearly, further improving detection accuracy, especially effective for detecting complex shapes or minute defects. On the other hand, the design of the sliding component 120 and the driving component 130 makes the position adjustment of the light source component 160 more flexible, adapting to the detection needs of capacitor pins of different specifications and shapes, thus enhancing the versatility and adaptability of the device. Furthermore, automated light source position adjustment reduces manual intervention, making the detection process smoother and reducing repeated detections caused by improper light source adjustment, thereby improving overall detection efficiency. Moreover, the introduction of the driving component 130 enables automatic sliding and positioning of the light source component 160, further enhancing the automation level of the capacitor pin detection device 100, reducing operational difficulty, and improving the ease of use of the equipment.

[0050] In some of these embodiments, such as Figure 3 and Figure 4As shown, the sliding assembly 120 includes a column 121, a carriage 122, a carriage base 123, a fixed base 124, and a light source bracket 125. The carriage base 123 is disposed on the column 121, the carriage 122 is disposed on the carriage base 123, the fixed base 124 is slidably disposed on the carriage 122, and the light source bracket 125 is disposed on the fixed base 124, so that the light source bracket 125 is slidably disposed on the carriage 122 along with the fixed base 124. The light source assembly 160 is disposed on the light source bracket 125, and the driving assembly 130 is drivenly connected to the fixed base 124 to drive the light source assembly 160 to slide on the carriage 122. As an example, the column 121 is used to install on the operating table or other installation position to fix the sliding assembly 120 as a whole; as an example, the column 121 is also connected to the support assembly 110; for embodiments with a base 111, as an example, the column 121 is also connected to the base 111. This structural design, on the one hand, through the combination of the carriage 122, the fixed seat 124, and the light source bracket 125, allows the light source assembly 160 to achieve precise sliding adjustment on the carriage 122, ensuring that the light source can accurately illuminate all parts of the capacitor pin 210 to be tested, improving the accuracy of the test. On the other hand, the column 121 and the carriage seat 123 provide stable support for the sliding assembly 120, ensuring that the light source assembly 160 remains stable during sliding, avoiding uneven illumination or detection errors caused by vibration or shaking. Furthermore, the column 121 can be installed on the operating table or other positions, allowing the sliding assembly 120 to be flexibly arranged according to the actual testing environment and needs, enhancing the adaptability of the equipment. On the other hand, the connection between the column 121 and the support component 110 or the base 111 further enhances the integrity and stability of the entire capacitor pin detection device 100, ensuring that each component works together during the detection process and improving the reliability of the equipment. Moreover, this modular sliding component design makes the installation, maintenance and position adjustment of the light source component 160 more convenient, reducing the maintenance cost and operation difficulty of the equipment.

[0051] In some of these embodiments, such as Figure 6 and Figure 7As shown, the driving assembly 130 includes a motor mount 131 and a stepper motor 132. The motor mount 131 is mounted on the column 121 or the slide mount 123, and the stepper motor 132 is mounted on the motor mount 131 and is drivenly connected to the fixed base 124 to drive the fixed base 124 to slide on the slide 122. This structural design allows the stepper motor 132 to achieve high-precision displacement control, precisely driving the fixed base 124 to slide on the slide 122, thereby achieving precise adjustment of the position of the light source assembly 160 and ensuring that the light source accurately illuminates the optimal position of the capacitor pin 210 to be tested. Furthermore, the use of the stepper motor 132 enables automated movement of the light source assembly 160, reducing the complexity and errors of manual operation and improving the automation and efficiency of the detection process. On the other hand, the motor mount 131 provides a stable mounting base for the stepper motor 132, ensuring that the motor remains stable during operation, thereby guaranteeing the smooth and reliable movement of the light source assembly 160 and avoiding detection errors caused by motor vibration. Furthermore, the motor mount 131 can be mounted on the column 121 or the carriage mount 123. This flexible mounting method allows the drive assembly 130 to be optimally configured according to the overall layout of the equipment, further improving the adaptability and flexibility of the equipment. Moreover, the modular design of the stepper motor 132 and the motor mount 131 makes their installation, maintenance, and replacement more convenient, reducing equipment maintenance costs and downtime.

[0052] In some of these embodiments, such as Figure 7 and Figure 8 As shown, the enclosure 150 has a cylindrical shape, and the light source assembly 160 has a partially spherical shape that matches the cylindrical shape. Figure 3 and Figure 4When the light source assembly 160 slides on the sliding assembly 120, it has a position that contacts or is close to the top of the enclosure 150. This structural design has several advantages. First, the partially spherical shape of the light source assembly 160 matches the cylindrical shape of the enclosure 150, allowing the light source to more evenly cover the shooting position 151 within the enclosure, reducing blind spots and improving image quality. Second, the light source assembly 160 can slide on the sliding assembly 120 and contact or be close to the top of the enclosure 150, meaning the position of the light source can be flexibly adjusted according to the specific position of the pin 210 of the capacitor 200 to achieve optimal illumination. Third, the shape design of the light source assembly 160 and the enclosure 150 makes the entire detection device more compact, reducing its size and footprint, facilitating installation and operation in limited spaces. On the other hand, this design allows the light source assembly 160 to provide illumination at different positions, which can adapt to the detection needs of capacitor pins of different specifications and shapes, enhancing the versatility and flexibility of the equipment; and when the light source assembly 160 is close to the top of the enclosure 150, it can better cooperate with the enclosed environment inside the enclosure 150, reduce the interference of external light, and maintain the stability and consistency of the detection environment.

[0053] In some embodiments, the light source assembly 160 is positioned above the enclosure 150. In some embodiments, such as... Figure 1 and Figure 4 As shown, the light source assembly 160 has a second recessed groove 162, combined with Figure 3 and Figure 7 The imaging assembly 140 further includes a second camera mount 142 and a second camera 144; the second camera 144 is disposed on the second camera mount 142, and the second camera 144 is used to photograph the top of the capacitor 200 to be tested located at the shooting position 151 through the second recess 162 of the light source assembly 160. As an example, the second camera 144 is used to photograph the safety valve on the top of the capacitor 200 to be tested. As an example, in the illustrated embodiment, the imaging assembly 140 further includes a lens 145 connected to the second camera 144. In some embodiments, the second camera mount 142 is connected to the light source assembly 160 so that the second camera 144 is linked to the light source assembly 160. As an example, such as... Figure 3 and Figure 4As shown, the second camera mount 142 is connected to the fixed base 124, so that the second camera 144 is slidably mounted on the carriage 122 along with the fixed base 124, and the light source bracket 125 is mounted on the fixed base 124, that is, the second camera mount 142 is indirectly connected to the light source assembly 160. This structural design, on the one hand, by placing the light source assembly 160 above the enclosure 150, provides uniform and sufficient illumination to the shooting position 151, while the second camera 144, by shooting through the second recess 162, avoids the influence of direct light on the captured image, thereby improving image quality. On the other hand, the addition of the second camera 144 increases the shooting angle and field of view, enabling the imaging of the pins 210 of the capacitor 200 to be tested from different directions, further improving the comprehensiveness and accuracy of the detection, especially effective for detecting complex shapes or minute defects. Furthermore, the linkage between the second camera mount 142 and the light source assembly 160 or the fixed base 124 allows the second camera 144 to move or adjust its position synchronously with the light source assembly 160, reducing the time required for individual camera position adjustments and improving detection efficiency. Additionally, integrating the second camera 144 with the light source assembly 160 or the sliding assembly 120 further optimizes the spatial layout of the device, making the entire detection apparatus more compact, reducing its footprint, and facilitating installation and operation in limited spaces. Moreover, the design of the second camera 144 sliding along the fixed base 124 on the slide 122 allows the camera position to be flexibly adjusted according to different specifications of the capacitor 200 to be tested or detection requirements, enhancing the adaptability and versatility of the device.

[0054] It should be noted that other embodiments of this application also include a capacitor pin detection device formed by combining the technical features of the above embodiments.

[0055] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0056] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the scope of protection of this application. Therefore, the patent protection scope of this application should be determined by the appended claims.

Claims

1. A capacitive pin detection device (100), characterized in that, The capacitor pin detection device (100) comprises a support assembly (110), a shooting assembly (140), a fence (150) and a light source assembly (160); The shooting assembly (140) and the fence (150) are arranged on the support assembly (110), and the fence (150) and the light source assembly (160) have a turntable gap (170) for the to-be-detected capacitor (200) to pass in and out of a shooting position (151) in the fence (150). The shooting assembly (140) comprises a first camera seat (141) and a first camera (143), each first camera seat (141) is arranged around the shooting position (151), and each first camera seat (141) is provided with a first camera (143), and the first camera (143) is used for shooting the pin (210) of the to-be-detected capacitor (200) located at the shooting position (151) through a first avoiding slot (152) of the fence (150).

2. The capacitive pin detection device (100) according to claim 1, characterized in that The capacitor pin detection device (100) further comprises a sliding assembly (120) and a driving assembly (130); The light source assembly (160) is arranged on the sliding assembly (120), and the driving assembly (130) is drivingly connected with the light source assembly (160) and used for driving the light source assembly (160) to slide on the sliding assembly (120).

3. The capacitive pin detection device (100) according to claim 2, characterized in that The sliding assembly (120) comprises a stand column (121), a sliding carriage (122), a sliding carriage seat (123), a fixed seat (124) and a light source support (125); The sliding carriage seat (123) is arranged on the stand column (121), the sliding carriage (122) is arranged on the sliding carriage seat (123), the fixed seat (124) is slidably arranged on the sliding carriage (122), and the light source support (125) is arranged on the fixed seat (124); The light source assembly (160) is arranged on the light source support (125), and the driving assembly (130) is drivingly connected with the fixed seat (124) and used for driving the light source assembly (160) to slide on the sliding carriage (122).

4. The capacitive pin detection device (100) according to claim 3, characterized in that The driving assembly (130) comprises a motor seat (131) and a stepping motor (132); The motor seat (131) is arranged on the stand column (121) or the sliding carriage seat (123), the stepping motor (132) is arranged on the motor seat (131) and drivingly connected with the fixed seat (124) and used for driving the fixed seat (124) to slide on the sliding carriage (122).

5. The capacitive pin detection apparatus (100) of claim 3, wherein, The fence (150) has a cylindrical shape, the light source assembly (160) has a partial spherical shape matched with the cylindrical shape, and the light source assembly (160) has a position contacting or close to the top of the fence (150) in the state of sliding on the sliding assembly (120).

6. The capacitive pin detection apparatus (100) of claim 1, wherein, The number of the first camera seats (141) and the first cameras (143) is 3-6, and each of the first camera seats (141) is centrally symmetrically distributed relative to the shooting position (151).

7. The capacitive pin detection device (100) of claim 1, wherein, The enclosure (150) is further provided with a positioning transmission groove (153), and the capacitor pin detection device (100) further comprises a positioning assembly (180) arranged on the support assembly (110), and the positioning assembly (180) is used for determining that the pin (210) of the capacitor (200) to be detected is located at the shooting position (151) through the positioning transmission groove (153); or, The inner wall of the enclosure (150) is provided with a light-reflecting surface; or, The inside of the enclosure (150) is provided with an auxiliary light source, and the inner wall of the enclosure (150) is a light-transmitting layer.

8. The capacitive pin detection apparatus (100) according to any one of claims 1 to 7, characterized in that The light source assembly (160) is arranged above the enclosure (150).

9. The capacitive pin detection device (100) according to claim 8, characterized in that The light source assembly (160) is provided with a second avoiding groove (162), and the shooting assembly (140) further comprises a second camera seat (142) and a second camera (144). The second camera (144) is arranged on the second camera seat (142), and the second camera (144) is used for shooting the top of the capacitor (200) to be detected located at the shooting position (151) through the second avoiding groove (162) of the light source assembly (160).

10. The capacitive pin detection apparatus (100) of claim 9, wherein, The second camera seat (142) is connected with the light source assembly (160), so that the second camera (144) and the light source assembly (160) are arranged in linkage.