Jig for fast fixing electronic devices to be tested

Abstract

A jig for quickly fixing an electronic device to be tested, comprising a base body with at least one test station; a probe assembly arranged on the base body; and an elastic pressure head assembly arranged on the base body, the elastic pressure head assembly being configured to: when the electronic device to be tested is moved onto the test station by an external force, the elastic pressure head assembly can be avoided under the extrusion of the electronic device to be tested, and reset after losing the extrusion force, so as to tightly fix the electronic device to be tested on the test station, and the probe assembly is electrically connected with a test interface of the electronic device to be tested. When the electronic device to be tested is moved onto the test station by an external force, the elastic pressure head assembly can be automatically avoided under the extrusion of a support of the electronic device to be tested, and after the electronic device to be tested is arranged on the test station, the elastic pressure head assembly loses the extrusion force and resets, so as to tightly fix the support of the electronic device to be tested on the test station from above. After the test is completed, the elastic pressure head assembly is slightly pushed, and the electronic device to be tested can be taken out.

Description

Technical Field

[0001] This utility model relates to the field of fixtures for testing electronic equipment, and in particular to a fixture for quickly fixing electronic equipment to be tested. Background Technology

[0002] As the performance requirements of cameras in smart terminal devices (such as smartphones, AR / VR devices, and automotive vision systems) continue to increase, multi-view cameras are gradually becoming the mainstream configuration. To ensure image consistency and spatial positioning accuracy among the cameras, zero-bias calibration and / or functional testing of each camera is required during the production process. Zero-bias calibration refers to measuring and calibrating parameters such as positional and angular deviations of each camera in a multi-view camera system to achieve the accuracy standards required by the design, thereby ensuring the accuracy of image stitching, 3D reconstruction, and other functions when the cameras work together.

[0003] like Figure 1 As shown, the existing zero-bias calibration test fixture uses a single station, requiring the multi-view camera to be manually placed on the station, and then the fixture to be rotated so that all six sides of the multi-view camera face downwards. This has the following disadvantages:

[0004] 1. A clamping plate is used to fix the multi-camera under test. Each time a multi-camera is tested, the clamping plate must be opened and closed manually, which is cumbersome and affects the testing efficiency.

[0005] 2. The interface positions of each camera may have large tolerances. Direct connection with connectors or rigid probes can easily lead to poor contact or even damage to the interface.

[0006] 3. A single workstation can only test one multi-camera at a time, making it difficult to test multiple multi-cameras in parallel. This does not fully utilize the performance of the external testing host computer, resulting in a waste of testing equipment resources. Utility Model Content

[0007] In view of the problems existing in the background art, the present invention provides a fixture for quickly fixing an electronic device under test, comprising:

[0008] A substrate having at least one test station;

[0009] The probe assembly disposed on the substrate; and

[0010] An elastic pressure head assembly disposed on the substrate, the elastic pressure head assembly being configured such that:

[0011] When the electronic device under test is moved from the outside to the test station, the elastic pressure head assembly can avoid the pressure of the electronic device under test and reset after the pressure is lost, thus pressing and fixing the electronic device under test to the test station. The probe assembly is electrically connected to the test interface of the electronic device under test.

[0012] In some embodiments of this utility model, the fixture for quickly fixing the electronic device under test includes: at least one first elastic element disposed on the base, wherein the first elastic element is compressed when the electronic device under test moves to the test station, and is released when the electronic device under test loses the clamping force applied by the elastic pressure head assembly, thereby ejecting the electronic device under test from the test station.

[0013] In some embodiments of this utility model, the fixture for quickly fixing the electronic device under test includes: a positioning block disposed on the base, the positioning block being able to provide limiting and guiding when the electronic device under test is moved from the outside to the test station.

[0014] In some embodiments of this utility model, the elastic pressure head assembly includes: a mounting base disposed on the base; a pair of rotating plates disposed on both sides of the mounting base, the rotating plates being pivotally connected to the base or the mounting base; a pressure head disposed on one end of the rotating plates; and a second elastic element connecting one end of the rotating plates and the mounting base, so that the pressure head can pivotally avoid being squeezed by the electronic device under test, and pivotally reset after the squeezing force is lost.

[0015] In some embodiments of this invention, the mounting base has a groove formed on it that is capable of accommodating at least a portion of the electronic device under test.

[0016] In some embodiments of this invention, the side of the pressure head used for being squeezed is an inclined surface.

[0017] In some embodiments of this utility model, the probe module includes: a guide rod fixedly connected to the substrate; a third elastic element and a probe seat sequentially sleeved on the guide rod, the third elastic element being located between the probe seat and the substrate; and a probe disposed on the probe seat, wherein when the probe is electrically connected to the test interface, the probe seat moves along the guide rod and compresses the third elastic element.

[0018] In some embodiments of this utility model, the probe holder has a through hole, and the probe holder is sleeved on the guide rod through the through hole, wherein the diameter of the guide rod is smaller than the diameter of the through hole.

[0019] In some embodiments of this utility model, the fixture for quickly fixing the electronic device under test includes: a circuit integrated board disposed on the substrate, the circuit integrated board being provided with at least one bidirectional interface, the probe assembly being electrically connected to the bidirectional interface from one side of the circuit integrated board, and the other side of the bidirectional interface being used for electrical connection to the test port of an external test device.

[0020] In some embodiments of this utility model, the circuit integrated board is provided with guide holes or guide pins for cooperating with guide pins or guide holes provided on the external testing equipment.

[0021] Unlike existing technologies that require manually opening and closing the pressure plate for each multi-camera test, this utility model provides a fixture for quickly securing electronic devices under test. Instead of manually opening and closing the pressure plate after each test, the elastic pressure head assembly automatically avoids the pressure of the device's support when the device is moved from the outside to the test station. Once the device is placed on the test station, the elastic pressure head assembly releases its pressure and resets, pressing the support of the device onto the test station from above. After testing, the device can be easily removed by gently pushing the elastic pressure head assembly. This simple operation improves clamping efficiency. Furthermore, by planning the structural layout to form multiple test stations, multiple electronic devices can be tested simultaneously, and the system supports switching between independent testing and multi-station testing modes, enhancing flexibility and testing efficiency. Attached Figure Description

[0022] Figure 1 This is a schematic diagram of the structure of a manual pressing fixture in the prior art;

[0023] Figure 2 An exploded view of a fixture for quickly fixing an electronic device under test, provided in an embodiment of this utility model;

[0024] Figure 3 for Figure 2 The diagram shows an assembly of a fixture for quickly securing an electronic device under test.

[0025] Figure 4 for Figure 3 The top view of the fixture used for quickly securing the electronic device under test (with the electronic device under test placed on it).

[0026] Figure 5 for Figure 4 A cross-sectional view of the fixture used for quickly securing an electronic device under test, as shown.

[0027] Figure 6 for Figure 5 Enlarged view of part F in the middle;

[0028] Figure 7 for Figure 2 An exploded view of the elastic indenter assembly shown;

[0029] Figure 8 for Figure 7 An assembly diagram of the elastic pressure head assembly shown;

[0030] Figure 9a for Figure 8 The diagram shows the elastic pressure head assembly in the closed state;

[0031] Figure 9b for Figure 8 The diagram shows the elastic pressure head assembly in the open state;

[0032] Figure 10 for Figure 2 An exploded view of the probe assembly shown;

[0033] Figure 11 for Figure 10 An assembly diagram of the probe assembly shown;

[0034] Figure 12 for Figure 11 A cross-sectional view of the probe assembly shown;

[0035] Figure 13 for Figure 2 An exploded view of the circuit board shown.

[0036] Figure 14a for Figure 13 The assembly diagram (front and side) of the circuit board shown.

[0037] Figure 14b for Figure 13 The assembly diagram (back side) of the circuit board shown.

[0038] Figure 15 for Figure 2 The diagram shows a fixture for quickly securing an electronic device under test mounted on an external test device.

[0039] Explanation of reference numerals in the attached figures:

[0040] Fixture 100 for quickly securing electronic devices under test;

[0041] Matrix 10; Test station 10a; First elastic element 11; Positioning block 12;

[0042] Probe assembly 20; guide rod 21; third elastic element 22; probe seat 23; probe 24; through hole 25; upper part 25a; middle part 25b; lower part 25c; coaxial cable 26; needle sleeve 27;

[0043] Elastic pressure head assembly 30; mounting base 31; groove 31a; rotating plate 32; pressure head 33; upper surface 33a; lower surface 33b; outer surface 33c; inner surface 33d; second elastic element 34; rotating shaft seat 35; rotating shaft 36;

[0044] Circuit board 40; bidirectional interface 41; circuit adapter board 42; pin 43; electrical signal module 44; guide hole 45; guide sleeve 45a; guide pin 46;

[0045] Electronic device under test (A); Test interface (B); Camera (C); Bracket (D); Test port of external test equipment (E). Detailed Implementation

[0046] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of this utility model.

[0047] like Figure 2-6 As shown, one embodiment of the present invention provides a fixture 100 for quickly fixing an electronic device under test, including a base 10 having at least one test station 10a; a probe assembly 20 disposed on the base 10; and an elastic pressure head assembly 30 disposed on the base 10. The elastic pressure head assembly 30 is configured such that when the electronic device under test A moves from the outside to the test station 10a, the elastic pressure head assembly 30 can avoid being squeezed by the electronic device under test A, and reset after losing the squeezing force, thus pressing and fixing the electronic device under test A onto the test station 10a. The probe assembly 20 is electrically connected to the test interface B of the electronic device under test A.

[0048] For example, the electronic device A under test can be a multi-view camera. For instance, two cameras C, left and right, are mounted on a central support D as a binocular camera.

[0049] In other embodiments, the electronic device A under test can also be a radar with a transmitting lens and a receiving lens mounted on a bracket.

[0050] The following embodiments use a binocular camera as an example to illustrate the concept of electronic device A under test.

[0051] For example, there are four test stations 10a. Each test station 10a is provided with an elastic pressure head assembly 30 and two probe assemblies 20. The elastic pressure head assembly 30 is used to press and fix the central support D of the binocular camera (electronic device A under test). The probe assemblies 20 can be electrically connected to the test interfaces B of the left and right cameras C of the binocular camera (electronic device A under test).

[0052] In other embodiments, the number of test stations 10a can be increased or decreased, for example, five or three. The number of elastic indenter assemblies 30 and probe assemblies 20 on each test station 10a can also be adjusted according to the actual electronic device A under test. For example, when the electronic device A under test is a tri-lens camera, there are two elastic indenter assemblies 30 and three probe assemblies 20 on each test station 10a.

[0053] Those skilled in the art should understand that the fixture 100 for quickly fixing the electronic device under test provided by this utility model does not require manually opening and closing the pressure plate for each multi-camera test as in the prior art. Instead, it is installed when the binocular camera (electronic device under test A) is moved from the outside to the test station 10a (e.g., ...). Figure 5 As shown in the top-to-bottom direction, the elastic pressure head assembly 30 can automatically avoid the pressure of the bracket D of the binocular camera (electronic device A under test). After the binocular camera (electronic device A under test) is placed on the test station 10a, the elastic pressure head assembly 30 releases the pressure and resets, pressing and fixing the bracket D of the binocular camera (electronic device A under test) onto the test station 10a from above. After the test is completed, the binocular camera (electronic device A under test) can be removed by gently pushing the elastic pressure head assembly 30. The operation is simple and improves clamping efficiency. In addition, by planning the structural layout to form multiple test stations 10a, multiple binocular cameras (electronic devices A under test) can be tested simultaneously, and the switching between independent testing and multi-station testing modes is supported, improving flexibility and testing efficiency.

[0054] Special reference Figure 2 and 5 As shown, the fixture 100 for quickly fixing the electronic device under test also includes at least one first elastic element 11 disposed on the base 10. The first elastic element 11 is compressed when the electronic device under test A moves to the test station 10a, and is released when the electronic device under test A loses the clamping force applied by the elastic pressure head assembly 30, thus popping the electronic device under test A out of the test station 10a.

[0055] For example, the first elastic element 11 is a spring pin. Two spring pins are provided on each test station 10a. The first elastic element 11 can be directly disposed on the base 10 and adjacent to the elastic pressure head assembly 30. The first elastic element 11 can also be disposed on the elastic pressure head assembly 30. For example, the mounting base 31 of the elastic pressure head assembly 30, as described below, can form part of the test station 10a, and the first elastic element 11 can be disposed in the groove 31a of the mounting base 31, that is, the first elastic element 11 is indirectly disposed on the base 10. The first elastic element 11 can also be partially disposed on the base 10 and partially disposed on the elastic pressure head assembly 30 (mounting base 31), that is, the first elastic element 11 is disposed at the junction of the two, that is, the first elastic element 11 can be regarded as indirectly disposed on the base 10.

[0056] In other embodiments, the first elastic element 11 may also be a tower spring or the like. One or more tower springs may be provided on each test station 10a.

[0057] Those skilled in the art should understand that after the test, the operator (such as an operator or a robotic arm) only needs to open (slightly push to both sides) the elastic pressure head assembly 30, and the camera C or bracket D of the binocular camera (electronic device A under test) will spring upward under the action of the spring pin. The operator (such as an operator or a robotic arm) can then directly remove the binocular camera (electronic device A under test) and move the next binocular camera (electronic device A under test) from the outside to the test station 10a, thereby improving the clamping efficiency of continuous testing.

[0058] Special reference Figure 2-4 As shown, the fixture 100 for quickly fixing the electronic device under test further includes a positioning block 12 disposed on the base 10, which can provide limiting and guiding when the electronic device under test A is moved from the outside to the test station 10a.

[0059] For example, the base 10 may be provided with a plurality of positioning blocks 12 to help position the left and right cameras C of the binocular camera (electronic device A under test), with each camera C being surrounded by three positioning blocks 12.

[0060] Those skilled in the art should understand that the positioning block 12 not only provides a limiting and guiding function for the binocular camera (electronic device A under test) to move from the outside to the test station 10a, so that the probe assembly 20 can be correctly connected to the test interface B of the electronic device A under test, but also prevents the probe assembly 20 from being disconnected from the test interface B of the electronic device A under test due to the binocular camera (electronic device A under test) shifting during the test.

[0061] Combination Figure 7-8As shown in 9a and 9b, the elastic pressure head assembly 30 further includes a mounting base 31 disposed on the base 10; a pair of rotating plates 32 disposed on both sides of the mounting base 31, the rotating plates 32 being pivotally connected to the base 10 or the mounting base 31; a pressure head 33 disposed on one end of the rotating plate 32; and a second elastic element 34 connecting one end of the rotating plate 32 and the mounting base 31, so that the pressure head 33 can pivotally avoid being squeezed by the electronic device under test A, and pivotally reset after the squeezing force is lost.

[0062] For example, the pivot seat 35 is fixedly mounted on the base 10 and symmetrically located on both sides of the mounting base 31. Each pivot seat 35 is pivotally connected to a rotating plate 32 by a pivot 36, with the pivot 36 located in the middle of the rotating plate 32, meaning the rotating plate 32 is indirectly pivotally connected to the base 10. The second elastic element 34 is a spring. The two ends of the spring are respectively welded, bonded, or snapped onto the lower end of each rotating plate 32 and the mounting base 31, so that the two are connected to each other by the spring. Two pressure heads 33 are provided at the upper end of each rotating plate 32. That is, the elastic pressure head assembly 30 has a left-right symmetrical structure and has a total of four pressure heads 33.

[0063] In other embodiments, the pivot seat 35 can be directly fixed on the left and right sides of the mounting base 31, or the pivot seats 35 on the left and right sides can be integrally formed with the mounting base 31. Each pivot seat 35 is pivotally connected to a rotating plate 32 by a pivot 36. The pivot 36 is located in the middle of the rotating plate 32, that is, the rotating plate 32 is directly pivotally connected to the mounting base 31. The second elastic element 34 is a spring. The two ends of the spring are fixed to the lower end of each rotating plate 32 and the mounting base 31 by welding, bonding, snap-fitting, etc., so that the two are connected to each other by the spring. The upper end of each rotating plate 32 is provided with two pressure heads 33. That is to say, the elastic pressure head assembly 30 has a left-right symmetrical structure and has a total of four pressure heads 33.

[0064] For example, the number of pressure heads 33 can be increased or decreased, for example, one or three. Furthermore, since different binocular cameras (electronic device A under test) have different shapes, thicknesses, etc., the shape of the pressure head 33 can be designed to conform to the requirements (e.g., based on the cross-sectional shape of the bracket D), meaning the pressure head 33 can be individually replaced as needed. Further, the pressure head 33 can be made of polyurethane material with a Shore hardness of 70, which, through slight compression deformation of the soft material, better ensures pressure is applied to the binocular camera (electronic device A under test) from the opposite side.

[0065] Those skilled in the art should understand that the elastic pressure head assembly 30 is generally similar to a linkage-spring clamping mechanism. When the binocular camera (electronic device A under test) is moved from the outside to the test station 10a (e.g.) Figure 5 As shown in the top-to-bottom direction, the pressure head 33 is automatically pivoted and avoids the pressure of the bracket D of the binocular camera (electronic device A under test) by the rotating plate 32. After the binocular camera (electronic device A under test) is set on the test station 10a, the pressure head 33 loses its pressure and resets under the action of the second elastic element 34. The pressure head 33 then presses and fixes the bracket D of the binocular camera (electronic device A under test) on the test station 10a from above. After the test is completed, the pressure head 33 is gently pushed to both sides, and the binocular camera (electronic device A under test) bounces upward under the action of the first elastic element 11, allowing the binocular camera (electronic device A under test) to be removed directly. The operation is simple and improves the clamping efficiency.

[0066] Special reference Figure 7 and 8 As shown, the mounting base 31 further has a groove 31a formed on it, which is capable of accommodating at least a part of the electronic device A to be tested.

[0067] For example, the cross-sectional shape of the binocular camera (electronic device A under test) bracket D is approximately square, therefore, the cross-sectional shape of the groove 31a is also designed to be approximately square. Since different binocular cameras (electronic device A under test) have different shapes, thicknesses, etc., the shape of the mounting base 31 (which can also be regarded as the groove 31a) can be designed according to the requirements (e.g., based on the cross-sectional shape of the bracket D), that is, the mounting base 31 can be replaced individually according to specific needs.

[0068] Those skilled in the art will understand that the mounting base 31 with the groove 31a is located in the center of the base 10, and multiple positioning blocks 12 are located on the left and right sides of the base 10, which together define the test station 10a. The groove 31a is approximately the same width as the bracket D of the binocular camera (electronic device A under test), and is used to limit and support the bracket D. The positioning blocks 12 on the left and right sides are used to fit against the outer side of the camera C when the binocular camera (electronic device A under test) moves from the outside to the test station 10a, providing limitation and guidance for the camera C. Furthermore, the groove 31a and the positioning blocks 12 can jointly prevent the binocular camera (electronic device A under test) from shifting during the test.

[0069] Combination Figure 9a and 9b As shown, the side of the pressure head 33 that is used for compression is an inclined surface.

[0070] For example, given that the bracket D of the binocular camera (electronic device A under test) has a roughly square cross-sectional shape, the pressure head 33 has a right-angled trapezoidal cross-section, and has a horizontally arranged upper surface 33a and lower surface 33b, a vertically arranged outer surface 33c, and an inclined inner surface 33d.

[0071] Those skilled in the art should understand that the binocular camera (electronic device A under test) can be moved vertically or slightly offset from above to the test station 10a. Preferably, the binocular camera (electronic device A under test) is moved from the outside to the test station 10a in a direction perpendicular to the base 10. The downward pressing force provided by the bracket D of the binocular camera (electronic device A under test) acts on the inclined inner surface 33d of the pressure head 33. Part of the pressing force is decomposed into a force that causes the pressure head 33 to pivot, so that the pressure head 33 is driven by the rotating plate 32 to pivot and automatically avoid rigid contact, preventing damage to the binocular camera (electronic device A under test) or the pressure head 33. When the binocular camera (electronic device A under test) is pressed down to the position below the pressure head 33, the bracket D enters the groove 31a, the pressure head 33 loses the pressing force and resets, and the lower surface 33b of the pressure head 33 presses and fixes the bracket D of the binocular camera (electronic device A under test) in the groove 31a from above.

[0072] Combination Figure 10-12 As shown, the probe module 20 further includes a guide rod 21 fixedly connected to the base 10; a third elastic element 22 and a probe seat 23 sequentially sleeved on the guide rod 21, the third elastic element 22 being located between the probe seat 23 and the base 10; and a probe 24 disposed on the probe seat 23. When the probe 24 is electrically connected to the test interface B, the probe seat 23 moves along the guide rod 21 and compresses the third elastic element 22.

[0073] For example, the guide rod 21 is a pair of screws fixedly connected to the base 10. The height of the guide rod 21 is approximately equal to the height of the probe seat 23, that is, the guide rod 21 is a screw of equal height. The third elastic element 22 is a spring that can be fitted onto the screw. The probe seat 23 has a pair of through holes 25, and the probe seat 23 is fitted onto the screw through the through holes 25, so that the probe seat 23 can move along the length direction of the screw. The probe seat 23 also has a mounting hole, in which the probe 24 is disposed and engaged with the needle sleeve 27, so that the probe 24 is fixedly connected to the probe seat 23, and the probe 24 can move with the probe seat 23.

[0074] Those skilled in the art should understand that the fixture 100 for quickly fixing the electronic device under test provided by this utility model abandons the existing technology of using wire harnesses and connectors for direct connection or using rigid probes, and instead adopts a flexible connection method. According to design requirements, the maximum compression of the third elastic element 22 (spring) can be selected as 1mm. When the binocular camera (electronic device under test A) is moved from the outside to the test station 10a (e.g.) Figure 5As shown in the top-to-bottom direction), when probe 24 touches test interface B, probe seat 23 moves along guide rod 21 and compresses third elastic element 22 (spring). This not only avoids rigid contact between probe 24 and test interface B, but also allows third elastic element 22 (spring) to work with first elastic element 11 (spring pin) to eject binocular camera (electronic device A under test) from test station 10a when the binocular camera (electronic device A under test) loses its clamping force.

[0075] Special reference Figure 12 As shown, the probe holder 23 further has a through hole 25, and the probe holder 23 is sleeved on the guide rod 21 through the through hole 25. The diameter of the guide rod 21 is smaller than the diameter of the through hole 25.

[0076] For example, the through hole 25 is a stepped hole, having an upper portion 25a, a middle portion 25b, and a lower portion 25c. The upper portion 25a and the lower portion 25c have the same diameter, while the middle portion 25b is narrower than the former two. The upper portion 25a serves as a countersunk hole, housing the head of the screw (guide rod 21) so that it does not protrude from the surface of the probe seat 23. The lower portion 25c serves as a receiving cavity, housing a portion of the spring (third elastic element 22) so that the spring (third elastic element 22) can be compressed perpendicularly to the base 10. For example, the middle portion 25b has a diameter of 4.5 mm, and the tail diameter of the screw (guide rod 21) is 4.0 mm. That is, although the middle portion 25b is narrower than the upper portion 25a and the lower portion 25c, it is still slightly larger than the tail diameter of the screw (guide rod 21) by 0.5 mm.

[0077] Those skilled in the art should understand that for a binocular camera (electronic device A under test) with acceptable tolerances, it is necessary to ensure that its test interface B can be smoothly electrically connected to the probe 24. Therefore, the diameter of the guide rod 21 is smaller than the diameter of the through hole 25 to allow for a certain amount of movement (e.g., 0.5 mm). Combined with the fact that the maximum compression of the third elastic element 22 (spring) is selected as 1 mm, the probe 24 (which can also be regarded as probe seat 23) can have a certain amount of movement in three-dimensional space (X, Y, Z directions). That is, the probe 24 (which can also be regarded as probe seat 23) is a "floating" structural design. The "floating" probe 24 (which can also be regarded as probe seat 23) can effectively cope with the error of the test interface B, so that the probe 24 can be properly connected when the dimensional tolerance of the test interface B is within the acceptable range, effectively protecting the test interface B and improving the test stability.

[0078] Combination Figure 13-15As shown, the fixture 100 for quickly fixing the electronic device under test includes a circuit integrated board 40 disposed on the base 10. The circuit integrated board 40 is provided with at least one bidirectional interface 41. The probe assembly 20 is electrically connected to the bidirectional interface 41 from one side of the circuit integrated board 40. The other side of the bidirectional interface 41 is used for electrical connection to the test port of an external test device.

[0079] For example, there are four test stations 10a, each equipped with two probe assemblies 20. The probe assemblies 20 correspond to the test interfaces B of the left and right cameras C of the binocular camera (electronic device A under test). The two probe assemblies 20 (probes 24) can be connected to the bidirectional interface 41 using a coaxial cable 26. That is, there are a total of eight probe assemblies 20 on a fixture 100 for quickly fixing the electronic device under test. The circuit board 40 is disposed on one side of the base 10, and there are also eight bidirectional interfaces 41, allowing each probe assembly 20 to be connected to one bidirectional interface 41.

[0080] For example, the coaxial cable 26 can be different colors, such as red, blue, white, and black; the coaxial cable 26 can also be marked with text, such as No. 1, No. 2, No. 3, and No. 4. Coaxial cables 26 with the same color and / or the same text markings come from two probe assemblies 20 on the same test station 10a (actually one or more foolproof designs), making subsequent maintenance easier.

[0081] For example, the bidirectional interface 41 can be first set on the circuit adapter board 42, and then the circuit adapter board 42 can be fixed on the circuit integration board 40 with the pin 43, that is, the bidirectional interface 41 is indirectly set on the circuit integration board 40.

[0082] For example, depending on the subsequent requirements for reliability, stability and automation, the fixture 100 used to quickly fix the electronic device under test may be equipped with position sensors, pressure sensors, etc. Therefore, the circuit integration board 40 is also provided with an electrical signal module 44, which can be electrically and data connected to various sensors, as a reserved module for future improvement of the fixture's functions.

[0083] Those skilled in the art should understand that by planning the structural layout of the fixture 100 for quickly fixing the electronic device under test, it is possible to simultaneously test four binocular cameras (electronic device under test A) and support switching between independent testing and multi-station testing modes. All probe assemblies 20 (probes 24) are connected to the circuit board 40 via coaxial cables 26, eliminating the need for each probe assembly 20 (probe 24) to be individually connected to external testing equipment, thus improving efficiency.

[0084] Special reference Figure 15As shown, the circuit board 40 is further provided with guide holes 45 or guide pins 46 for engaging with guide pins 46 or guide holes 45 provided on external testing equipment.

[0085] Those skilled in the art should understand that, by way of example, the circuit board 40 has a pair of guide holes 45, and the external test equipment has guide pins 46. When it is necessary to place the fixture 100 for quickly fixing the electronic device under test on the external test equipment, the guide holes 45 (with guide sleeves 45a inside) and the guide pins 46 are first engaged, and then the test port E of the external test equipment is electrically connected to the bidirectional interface 41 to ensure that the circuit board 40 (bidirectional interface 41) is tightly connected to the test port E of the external test equipment, thus ensuring test stability.

[0086] In summary, the fixture 100 for quickly fixing electronic devices under test provided by this utility model adopts a modular design, including an independent base 10, probe assembly 20, elastic pressure head assembly 30, and circuit integrated board 40. This modular design facilitates future upgrades and multi-platform adaptation, offers a high degree of automation, and reduces human error. For example, when the fixture 100 needs to be placed on different external testing devices, only the corresponding base 10 needs to be replaced. When the test ports E of the external testing devices are different, only the corresponding circuit integrated board 40 (bidirectional interface 41) needs to be replaced to ensure smooth electrical connection. When different electronic devices A need to be quickly fixed, only the probe assembly 20 and elastic pressure head assembly 30 need to be replaced. In other words, for different usage scenarios, various shapes and types of base 10, probe assembly 20, elastic pressure head assembly 30, and circuit integrated board 40 can be combined to create multiple fixtures, maximizing module reuse.

[0087] In the description of this specification, the references to terms such as "certain embodiments," "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., refer to specific features, structures, materials, or characteristics described in connection with that embodiment or example, which are included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in a suitable manner in any one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.

[0088] In this utility model, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance; the term "multiple" refers to two or more unless otherwise explicitly defined. The terms "install," "connect," "join," and "fix" should be interpreted broadly. For example, "connect" can be a fixed connection, a detachable connection, or an integral connection; "join" can be a direct connection or an indirect connection through an intermediate medium. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0089] Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of this utility model and are not restrictive. Although this utility model has been described in detail with reference to the embodiments, those skilled in the art should understand that modifications or equivalent substitutions to the technical solution of this utility model do not depart from the spirit and scope of the technical solution of this utility model, and all such modifications or substitutions should be covered within the scope of the claims of this utility model.

Claims

1. A fixture for quickly fixing an electronic device under test, characterized in that, include: A substrate having at least one test station; Probe assembly disposed on the substrate; as well as An elastic pressure head assembly disposed on the substrate, the elastic pressure head assembly being configured such that: When the electronic device under test is moved from the outside to the test station, the elastic pressure head assembly can avoid the pressure of the electronic device under test and reset after the pressure is lost, thus pressing and fixing the electronic device under test to the test station. The probe assembly is electrically connected to the test interface of the electronic device under test.

2. The fixture for quickly fixing an electronic device under test according to claim 1, characterized in that, include: At least one first elastic element is disposed on the substrate, the first elastic element is compressed when the electronic device under test moves to the test station, and is released when the electronic device under test loses the clamping force applied by the elastic pressure head assembly, thereby ejecting the electronic device under test from the test station.

3. The fixture for quickly fixing an electronic device under test according to claim 1, characterized in that, include: The positioning block disposed on the substrate provides limiting and guiding when the electronic device under test is moved from the outside to the test station.

4. The fixture for quickly fixing an electronic device under test according to claim 1, characterized in that, The elastic pressure head assembly includes: Mounting base disposed on the substrate; A pair of rotating plates are arranged on both sides of the mounting base, and the rotating plates are pivotally connected to the base or the mounting base; A pressure head is disposed on one end of the rotating plate; and A second elastic element connects one end of the rotating plate to the mounting base so that the pressure head can pivotally avoid being squeezed by the electronic device under test and pivotally reset after the squeezing force is lost.

5. The fixture for quickly fixing an electronic device under test according to claim 4, characterized in that: The mounting base has a recess formed on it that is capable of accommodating at least a portion of the electronic device under test.

6. The fixture for quickly fixing an electronic device under test according to claim 4, characterized in that: The side of the pressure head that is used for compression is an inclined surface.

7. The fixture for quickly fixing an electronic device under test according to claim 1, characterized in that, The probe module includes: A guide rod fixedly connected to the base; A third elastic element and a probe holder are sequentially sleeved on the guide rod, the third elastic element being located between the probe holder and the base; and When the probe is electrically connected to the test interface, the probe holder moves along the guide rod and compresses the third elastic element.

8. The fixture for quickly fixing an electronic device under test according to claim 7, characterized in that: The probe holder has a through hole, and the probe holder is sleeved on the guide rod through the through hole. The diameter of the guide rod is smaller than the diameter of the through hole.

9. The fixture for quickly fixing an electronic device under test according to claim 1, characterized in that, include: A circuit integrated board is disposed on the substrate, and the circuit integrated board is provided with at least one bidirectional interface. The probe assembly is electrically connected to the bidirectional interface from one side of the circuit integrated board, and the other side of the bidirectional interface is used to electrically connect to the test port of an external test device.

10. The fixture for quickly fixing an electronic device under test according to claim 9, characterized in that: The circuit board is provided with guide holes or guide pins for engaging with guide pins or guide holes provided on the external testing equipment.

Images