An automatic pitch-adjusting probe pin detection clamp

Abstract

The utility model relates to an automatic distance adjusting probe pin detection clamp, base, base is equipped with guide rail, sliding block component, sliding block component sets up on guide rail and can move along guide rail, probe module, probe module installs on sliding block component, and probe module includes a plurality of spring probes for contacting the measured pin, distance adjusting mechanism, distance adjusting mechanism is used for driving sliding block component moves along guide rail to adjust the distance between probe module, scale display structure, scale display structure sets up in any structure in sliding block component and distance adjusting mechanism, is used for visual display the distance between probe module, stop structure, stop structure sets up on sliding block component, is used for locking the position of sliding block component after probe module adjustment reaches target position, signal output structure, signal output structure is used for leading out the signal of spring probe collection to external test equipment.

Description

Technical Field

[0001] This utility model relates to the field of electronic component testing technology, specifically to an automatic adjustable pin detection fixture. Background Technology

[0002] In electronic manufacturing and testing, probe fixtures are typically used as auxiliary devices for physical contact and positioning to test the continuity of pin-type devices such as connectors and pin headers. Existing probe fixtures mostly adjust the spacing between probe modules using mechanisms such as sliders, slide rails, or screws to accommodate different pin arrangements. For example, patent CN211147723U discloses a test fixture with an adjustable structure, which adjusts the clamping width by moving a slider driven by a screw. While it has some adjustment capability, it lacks scale indication and positioning locking functions, and the adjustment process relies on manual experience, resulting in poor repeatability.

[0003] In practical applications, existing probe fixtures generally have the following problems: First, the adjustment structure lacks a visual scale indication, making it impossible to achieve precise control of the probe module position, which affects measurement consistency and adjustment efficiency; Second, there is a lack of reliable stop or locking mechanisms, and the position is prone to displacement after adjustment, affecting the stability of the fixture and measurement accuracy; Third, the probe signal output structure mostly adopts wire bonding, lacking standardized interfaces, which is not conducive to maintenance and integration with automated testing platforms.

[0004] Therefore, there is an urgent need to provide an automatic adjustable probe probe fixture that can quickly adjust, accurately read and reliably lock the probe module spacing, and has a standardized signal output structure to improve the fixture's ease of operation, repeatability, and compatibility with various detection systems. Utility Model Content

[0005] To overcome the shortcomings of existing pin probe fixtures, this invention proposes an automatic adjustable pin probe fixture. This device can achieve rapid adjustment, accurate reading and reliable locking of the probe module spacing, and has a standardized signal output structure to improve the fixture's ease of operation, repeatability, and compatibility with various detection systems.

[0006] Therefore, this utility model provides an automatic spacing adjustment pin detection fixture in one possible embodiment, comprising: a base, the base having a guide rail; a slider assembly, the slider assembly being disposed on the guide rail and movable along the guide rail; a probe module, the probe module being mounted on the slider assembly, the probe module including a plurality of spring probes for contacting the pin to be tested; a spacing adjustment mechanism, the spacing adjustment mechanism being used to drive the slider assembly to move along the guide rail to adjust the spacing between the probe modules; a scale display structure, the scale display structure being disposed on either the slider assembly or the spacing adjustment mechanism, for visually displaying the spacing between the probe modules; a stop structure, the stop structure being disposed on the slider assembly, for locking the position of the slider assembly after the probe module is adjusted to the target position; and a signal output structure, the signal output structure being used to lead the signal collected by the spring probes to an external testing device.

[0007] In one possible implementation, the adjusting mechanism includes a dial wheel and a rack assembly that is driven to the slider, the rotation of which drives the slider assembly to move along the guide rail.

[0008] In one possible implementation, the slider includes a first slider and a second slider, which are symmetrically arranged along the guide rail. The adjustment mechanism is configured to simultaneously drive the first slider and the second slider to move in opposite directions to synchronously adjust the spacing between the corresponding probe modules.

[0009] In one possible implementation, the scale display structure includes: a linear scale ruler disposed on the outer surface of the first slider; and a scale reading window fixedly disposed on the upper surface of the base; wherein the linear scale ruler extends along the guide rail direction, and the scale reading window is disposed corresponding to the scale ruler in the vertical direction, so that when the first slider moves along the guide rail, its scale value at the scale reading window changes, which is used to indicate the spacing between the probe modules.

[0010] In one possible implementation, the stop structure is disposed on the first slider and configured to restrict the movement of the first slider along the guide rail after the probe module is adjusted to the target position.

[0011] In one possible implementation, the signal output structure is located at the tail of the probe module and configured to lead the electrical signal acquired by the spring probe to an external testing device.

[0012] In one possible implementation, the base is an integrally formed rectangular structure, and at least one guide rail is provided on the base along its length to guide the slider assembly to move horizontally. Limiting blocks are provided at both ends of the base to limit the maximum stroke range of the slider assembly.

[0013] In one possible implementation, the probe module is screwed onto the slider assembly.

[0014] In one possible implementation, the tail of the spring probe is plugged into the signal output structure.

[0015] In one possible implementation, the base is provided with mounting holes for fixing the automatic spacing pin detection fixture to the detection platform.

[0016] Additional aspects and advantages of this invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention.

[0017] Based on the above technical solution, the automatic spacing adjustment pin detection fixture provided by this utility model sets a guide rail on the base, uses a slider assembly to move along the guide rail to support and adjust the spacing between the probe modules, and achieves precise control in combination with the spacing adjustment mechanism. The scale display structure provides real-time position visualization, the stop structure is used to stabilize the positioning after adjustment, and the signal output structure leads the signal collected by the spring probe to the external testing equipment. Thus, structurally, it forms an integrated fixture system with position adjustment, display, locking and signal output functions. Its technical principle is to achieve spacing change through the mobility of the slider assembly and the driving cooperation of the spacing adjustment mechanism, and to provide intuitive positioning feedback through the scale structure. This effectively solves the problems of fixed probe spacing, small adaptation range and poor operation repeatability in existing pin detection devices. It has the beneficial effects of strong adaptability, high efficiency of adjustment, reliable positioning and convenient detection signal output. Attached Figure Description

[0018] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this utility model. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0019] Figure 1 A front view of the automatic adjustable-distance pin detection fixture provided in an embodiment of this utility model;

[0020] Figure 2This is a structural schematic diagram of the automatic adjustable-distance pin detection fixture provided in an embodiment of the present invention from another perspective.

[0021] Explanation of reference numerals in the attached figures:

[0022] 1. Base; 2. Guide rail; 3. Slider assembly; 4. Probe module; 5. Adjustment mechanism; 6. Scale display structure; 7. Stop structure; 8. Signal output structure; 9. Dial wheel; 10. Rack; 11. First slider; 12. Second slider; 13. Linear scale; 14. Scale reading window; 15. Mounting hole. Detailed Implementation

[0023] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of this utility model.

[0024] In the description of this utility model, it should be understood that the terms "center," "longitudinal," "transverse," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," and "circumferential," etc., indicating the orientation or positional relationship shown in the accompanying drawings, are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model. Furthermore, features defined with "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this utility model, unless otherwise stated, "a plurality of" means two or more.

[0025] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.

[0026] The embodiments of this utility model are described in detail below. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain this utility model, and should not be construed as limiting this utility model.

[0027] Figure 1 A front view of the automatic adjustable-distance pin detection fixture provided in an embodiment of this utility model; Figure 2 This is a structural schematic diagram of the automatic adjustable-distance pin detection fixture provided in an embodiment of the present invention from another perspective.

[0028] Please see Figure 1-2 In one possible implementation, it includes: a base 1 with a guide rail 2; a slider assembly 3 mounted on and movable along the guide rail 2; a probe module 4 mounted on the slider assembly 3, the probe module 4 including multiple spring probes for contacting the pins to be tested; an adjustment mechanism 5 for driving the slider assembly 3 to move along the guide rail 2 to adjust the spacing between the probe modules 4; a scale display structure 6 mounted on either the slider assembly 3 or the adjustment mechanism 5 for visually displaying the spacing between the probe modules 4; a stop structure 7 mounted on the slider assembly 3 for locking the position of the slider assembly 3 after the probe modules 4 are adjusted to the target position; and a signal output structure 8 for transmitting the signal collected by the spring probes to an external testing device.

[0029] The fixture utilizes the guide rail 2 structure on the base 1 to allow the slider assembly 3 to slide smoothly in the horizontal direction. During use, the operator can drive the slider assembly 3 to adjust the relative distance between the probe modules 4 via the distance adjustment mechanism 5, thereby matching different models and spacing of the probes to be tested. Multiple spring probes are installed inside the probe module 4. When these probes contact the probes under test, a stable electrical connection is formed, and the corresponding signal is transmitted to the external testing system through the signal output structure 8 located at the tail of the probe module 4, achieving accurate testing and data acquisition. During the adjustment of the probe spacing, the scale display structure 6 can intuitively display the current spacing value, providing a clear basis for the adjustment operation and improving controllability and operational efficiency. To prevent probe position changes due to external force or vibration after adjustment, the slider assembly 3 is equipped with a stop structure 7, which can lock the probes after reaching the target position, ensuring stable and reliable measurement results.

[0030] This implementation improves the device's adaptability and ease of operation, making it suitable for testing various sizes of pins. The spacing adjustment is achieved through slider movement, overcoming the problems of poor versatility and high positioning difficulty associated with traditional fixtures. The introduction of the scale display structure 6 significantly improves adjustment accuracy, while the stop structure 7 enhances structural stability and measurement reliability. The rational layout of the signal output structure 8 simplifies system wiring, improves integration efficiency, and is suitable for efficient automated testing needs in production test lines or laboratory environments.

[0031] The specific structure offers flexibility while fulfilling its functional requirements. The guide rail type 2 can be either a ball-bearing linear guide rail 2 or a sliding guide rail 2, depending on accuracy requirements. The slider assembly 3 can adopt a modular design to accommodate replacement and maintenance needs. The adjustment mechanism 5 can also be replaced with an electric push rod structure to meet remote adjustment requirements in automated control scenarios. If used with a digital position sensor, the scale display can achieve electronic readings and system linkage. The stop mechanism can be selected based on the operating frequency, using a knob lock, slider latch, or other forms of quick-positioning structure to balance accuracy and efficiency. The signal output section can also adopt various connection methods according to the system interface standards of the test platform, including pluggable connectors, terminal blocks, or wireless signal transmitters, enhancing system adaptability.

[0032] Please see Figure 1 In one possible implementation, the adjusting mechanism 5 includes a dial wheel 9 and a rack 10 assembly that is connected to the slider in a transmission. The dial wheel 9 is mounted on the side of the base 1, and its shaft is fixedly connected to the base 1 through a bearing assembly. When the dial wheel 9 rotates, it drives a small gear to rotate synchronously. The small gear meshes with the rack 10 located on the side of the slider assembly 3, thereby driving the slider assembly 3 to move along the guide rail 2.

[0033] The dial 9, serving as the adjustment input, has a disc-shaped structure with evenly arranged anti-slip protrusions on its outer edge, facilitating fingertip rotation. It is centrally mounted on a rotating shaft and fixed to the inner wall of the base 1 via an embedded bearing seat, ensuring coaxial stability and low-friction operation during rotation. A small gear is fixed to the inner side of the dial 9 and connected to the rotating shaft using screws to prevent loosening due to prolonged rotation. The rack and pinion assembly 10 features a rectangular cross-section design, arranged laterally along the bottom of the slider assembly 3, and fixed to the slider bracket with fastening screws, maintaining its meshing relationship during slider movement.

[0034] When the dial 9 rotates clockwise, the pinion drives the rack 10 to slide to one side of the guide rail 2, and the slider assembly 3 moves synchronously. Reverse rotation enables the slider to adjust in the opposite direction, thereby changing the relative distance between the two probe modules 4. The transmission ratio of this structure is determined by the diameter of the dial 9 and the gear module, and can be optimized according to the accuracy requirements of the probes to meet precision displacement control.

[0035] In this embodiment, the dial 9 and rack 10 assembly form a mechanical force transmission path, resulting in a compact and easy-to-arrange overall structure that enables efficient pitch control in confined spaces. Compared to conventional manual sliding structures, its operation is more linear and repeatable, making it particularly suitable for testing environments where pin spacing changes frequently.

[0036] Please see Figure 1 In one possible implementation, the slider includes a first slider 11 and a second slider 12, which are symmetrically arranged along the same guide rail 2 on the base 1. The distance adjustment mechanism 5 is located in the middle of the base 1 and is configured to simultaneously drive the first slider 11 and the second slider 12 to move synchronously in opposite directions, thereby adjusting the relative distance between the probe modules 4.

[0037] In this embodiment, a linear guide rail 2 is provided on the central axis of the base 1. The guide rail 2 adopts a rectangular groove structure or a ball bearing guide rail structure to ensure that the slider assembly 3 has smooth and low-friction movement performance in the horizontal direction. The first slider 11 and the second slider 12 are arranged symmetrically around the center of the guide rail 2, respectively installed at both ends of the guide rail 2, and the corresponding probe modules 4 are fixed on them. The adjustment mechanism 5 consists of a central dial wheel 9, a pinion gear, and a pair of symmetrically arranged racks 10. The racks 10 are arranged along the direction of the guide rail 2, and their inner ends are fixedly connected to the bottom of the two sliders, while their outer ends slide freely.

[0038] When the dial 9 is rotated, it drives the central pinion to rotate, simultaneously engaging two racks 10 on both sides in opposite directions. Because the gear has a bidirectional drive structure, one rack 10 is pushed away from the center, while the other is pulled closer to the center, thus driving the first slider 11 and the second slider 12 to move symmetrically. This design allows for simultaneous adjustment of the probe module 4 spacing, and, with the central axis of the guide rail 2 as a reference, ensures that the test center position does not shift, making it suitable for precision scenarios requiring probe alignment detection.

[0039] With this structure, adjustment only requires turning the center dial 9 to simultaneously control the positions of the two probe modules 4, reducing repeated adjustments and effectively improving the symmetry and efficiency of the adjustment. Compared to the single slider structure, this method is more suitable for testing multi-pin or double-sided pin connectors, facilitating automatic adaptation for rapid product specification changes on the production floor.

[0040] Please see Figure 1In one possible implementation, the scale display structure 6 includes: a linear scale 13 disposed on the outer surface of the first slider 11; and a scale reading window 14 fixedly disposed on the upper surface of the base 1. The linear scale 13 extends along the guide rail 2, and the scale reading window 14 is vertically corresponding to the scale 13, so that when the first slider 11 moves along the guide rail 2, its scale value at the scale reading window 14 changes, which is used to indicate the spacing between the probe modules 4.

[0041] In terms of specific structure, a scale strip made of metal or high-contrast plastic is provided on the outer side of the first slider 11. The scale is evenly distributed in millimeter units and marked by laser etching or screen printing to ensure wear resistance and long-term clarity. The scale strip is installed on the side of the first slider 11 near the base 1, so that it remains parallel to the reading window on the base 1 during slider movement. The scale reading window 14 adopts a transparent window structure, with its frame fixed at an appropriate position above the base 1. The window opening faces the scale and is provided with an optical shielding boundary to accurately read the current scale line.

[0042] As the first slider 11 moves along the guide rail 2, it causes the scale on it to slide as well. Since the scale reading window 14 is fixed in position, the user can directly observe the scale value located at the center line through the window, thereby knowing the precise distance between the current slider (i.e., probe module 4) and the reference position. By reading the difference between the scale values ​​on the two sliders, or by setting the window at the midpoint and using a centrally symmetrical scale design, the actual distance between the two probe modules 4 can be quickly calculated.

[0043] This scale display structure 6 features a simple and cost-effective design, providing stable and intuitive displacement readings without the need for electronic sensors. It is suitable for manual adjustment and visual inspection scenarios. Compared to methods relying on gauges or external measuring instruments, the built-in scale structure significantly improves adjustment efficiency and reduces measurement errors and workload, making it suitable for batch testing platforms.

[0044] The scale can also be set on the second slider 12, or simultaneously on both sliders and displayed in a dual-window configuration to enhance readability; the scale reading window 14 can be fitted with a magnifying glass structure to improve reading accuracy; if a digital upgrade is required, a photoelectric encoder or magnetoresistive displacement sensor can be used as a replacement, combined with a digital display panel or PLC interface to provide electronic reading and data acquisition functions.

[0045] Please see Figure 1 In one possible implementation, the stop structure 7 is disposed on the first slider 11 and configured to restrict the movement of the first slider 11 along the guide rail 2 after the probe module 4 is adjusted to the target position.

[0046] Specifically, the stop structure 7 employs a knob locking mechanism, the main body of which is embedded in the upper surface or side of the first slider 11. It includes a locking screw and a fastening knob. The locking screw passes vertically through the slider housing, with its lower end extending to the surface of the guide rail 2. The screw tip can directly press against the guide rail 2 or embed into a pre-set micro-groove on the surface of the guide rail 2, achieving physical limitation. When the operator adjusts the slider to the desired position, turning the knob clockwise will cause the screw to move downwards and contact the surface of the guide rail 2, thereby preventing the slider from shifting position due to vibration or rebound. Rotating the knob in the opposite direction will cause the screw to move upwards, allowing the slider to regain its free movement capability.

[0047] This structure is simple and compact, allowing for manual operation without additional tools, making it suitable for applications requiring frequent adjustments and locking. The stop mechanism can be made of brass or stainless steel to ensure wear resistance and stability during repeated tightening. The knob surface features a non-slip textured finish, enhancing feel and ease of operation. Used in conjunction with the scale display structure 6, it enables rapid positioning and efficient locking, further ensuring that the probe module 4 remains in its position during measurement after adjustment, preventing minor displacements from affecting test accuracy.

[0048] Please see Figure 1 In one possible implementation, the signal output structure 8 is disposed at the tail of the probe module 4 and configured to lead out the electrical signal collected by the spring probe to an external testing device.

[0049] The probe module 4 integrates a signal conversion assembly at its tail, where the tail of each spring probe is connected to a signal line. All signal lines are aggregated and led out to a row of output ports. The signal output structure 8 has an insulating housing with an internal conductive connection board or PCB board for numbering, organizing, and standardizing the leads of each spring probe. A multi-pin socket, such as a DB interface, MIL connector, or custom connector, is located on one side of the housing for quick plug-and-play connection to external test equipment.

[0050] To ensure the stability and anti-interference capability of electrical signal transmission, the output signal line uses a multi-strand twisted or shielded wire structure, and the entire output structure is fixed to the rear end of probe module 4 by screws or clips. The structural design fully considers the relief of cable tensile stress to avoid wire breakage due to frequent plugging and unplugging or vibration. If probe module 4 is a replaceable structure, the output structure can also be designed as a modular plug-in terminal, which achieves reliable electrical contact with the probe tail through a set of metal springs, facilitating quick probe replacement without rewiring.

[0051] This structure allows the weak signals acquired by the spring probe to be stably and clearly transmitted to external data acquisition systems, oscilloscopes, or other electronic test platforms, meeting the requirements of signal integrity and module interchangeability in industrial settings. Compared to direct lead soldering, this structure is easier to maintain and more systematic, making it particularly suitable for complex testing applications involving parallel acquisition of multi-channel signals.

[0052] The signal output structure 8 can also integrate filter capacitors or electromagnetic shielding modules to further improve signal quality; the output port can be configured as a standard industrial bus interface, such as CAN, SPI, or I2C, to meet the communication protocol requirements of different automated testing platforms; structurally, it can also achieve blind insertion and removal through magnetic connectors, improving work efficiency and reducing the risk of misoperation.

[0053] Please see Figure 1 In one possible implementation, the base 1 is an integrally formed rectangular structure, and at least one guide rail 2 is provided on the base 1 along its length direction to guide the slider assembly 3 to move in the horizontal direction. Limiting blocks are provided at both ends of the base 1 to limit the maximum stroke range of the slider assembly 3.

[0054] The base 1 is made of die-cast aluminum alloy or CNC machined, and has a rectangular shape. A central guide rail 2 runs along its length, and the guide rail 2 is a U-groove structure or a linear slide rail, extending through both ends of the base 1. The guide rail 2 has high cross-sectional precision and good flatness, effectively ensuring the linearity and low-friction operation of the slider during movement. Mounting positions are reserved on both sides of the guide rail 2 to fix the guide mechanism of the slider and ensure stable slider engagement.

[0055] Limiting blocks are installed at both ends of the base 1 along its length. These limiting blocks are detachable, typically metal blocks or high-strength nylon parts, and are fixed to both ends of the base 1 with screws. Adjustable stroke screws are provided to adapt the maximum range of movement of the slider according to the size of different probe modules 4. This design prevents the slider from derailing beyond the working area and allows for fine-tuning of the stroke during assembly based on specific usage scenarios.

[0056] The base 1 features an adjustable distance mechanism 5 mounting slot and a scale reading window 14 fixing holes in its center, facilitating integration with other structures and maintaining overall symmetry. Multiple mounting surfaces and threaded holes can also be machined on its bottom to securely fix the fixture to the test platform or robotic arm end, improving stability and repeatability during use. The integrated, one-piece molding structure enhances mechanical strength and resistance to deformation, making it suitable for long-term, high-frequency operation environments.

[0057] The base 1 can be made of hard resin or composite material to reduce weight; the guide rail 2 can be designed as a double-rail parallel type to improve the stability when the two sliders move in parallel; the limit block can be replaced with a built-in spring buffer structure to prevent sudden impact damage to the structure.

[0058] Please see Figure 1 In one possible implementation, the probe module 4 is screwed onto the slider assembly 3.

[0059] Specifically, the slider assembly 3 is provided with a mounting hole 15, which is a threaded hole structure that penetrates the upper surface of the slider body in a direction perpendicular to the guide rail 2. The probe module 4 is equipped with a stud or a mounting seat with external threads at its bottom, which can be directly screwed into the mounting hole 15 on the slider. During installation, the operator aligns the probe module 4 with the reserved hole in the slider assembly 3 and gradually tightens it by rotating the threaded structure, ultimately achieving a stable connection. This screw connection method not only enables quick assembly and disassembly but also ensures that the probe module 4 does not shift or loosen during operation.

[0060] The probe module 4 may have a positioning boss at its bottom, which cooperates with the positioning groove on the slider assembly 3, thereby achieving preliminary orientation and limiting before thread tightening, effectively improving installation accuracy. The threaded connection usually uses metal threads, which are highly wear-resistant and can meet the needs of multiple replacements. If quick replacement is required in the production line, quick-change nuts or knobs can be added to the threaded connection to make tool-free operation possible.

[0061] This structural design facilitates the standardization and modular management of probe module 4. Users can quickly replace probe module 4 with different specifications based on the specifications, quantity, or arrangement of the probes to be tested, without altering the slider body or base 1 structure, significantly improving the flexibility and adaptability of the testing platform. Compared to welding or gluing methods, the screw-in structure offers stronger maintainability, repeatability, and process stability.

[0062] It is worth noting that the screw connection structure can be an internal hex screw or a high-lock nut with a locking washer to adapt to different vibration environments; the slider surface can also be machined with countersunk holes or guide holes to accommodate the nut, improving the overall compactness and appearance consistency; the probe module 4 can also be designed as a multi-point screw connection structure for installing large or high-channel-density modules, further enhancing the installation stability.

[0063] In one possible implementation, the tail of the spring probe is plugged into the signal output structure 8.

[0064] In this structure, each spring probe has a standard pin or plug terminal at its tail, which is uniformly inserted into the connection socket located at the tail of probe module 4. This socket is an integrated terminal block or multi-hole connector structure with an internal elastic contact structure or spring structure, ensuring reliable contact with the probe tail and providing a certain degree of elastic buffering capacity to guarantee contact stability and connection reliability of the electrical signal during insertion and removal. One end of the connection socket connects to the signal output port via a multi-core cable or flexible circuit board, completing a seamless extension of the signal path.

[0065] The main advantage of this pluggable connection method lies in its extremely high maintainability. When a probe is damaged or fails, the operator only needs to unplug the corresponding probe and insert a new one, without disassembling the entire probe module 4 or resoldering the circuit, significantly improving maintenance efficiency and reducing downtime risks. Furthermore, the probes and sockets are of standard size, allowing the use of industry-standard Pogo Pin series components, facilitating spare parts management and specification replacement.

[0066] The socket section is typically made of wear-resistant copper alloy or elastic gold-plated material, offering excellent conductivity and oxidation resistance. The insertion area may also feature a limiting groove or positioning keyway structure to ensure unique insertion and removal directions, minimize installation errors, and prevent mis-insertion or reverse insertion. The overall structure is secured to the tail housing of probe module 4 using clips, screws, or adhesive sealing, ensuring stability and reliability during long-term use.

[0067] It is worth noting that the plug-in connection can be extended to pin header and nut header structures, magnetic contact modules, or flexible slot interfaces to adapt to the needs of different test frequencies and assembly methods. If improved electrical isolation or transmission performance is required, filtering components or electrical protection devices can be introduced between the plug-in interfaces to achieve signal conditioning and anti-interference design.

[0068] Please see Figure 2 In one possible implementation, the base 1 is provided with mounting holes 15 for fixing the automatic distance adjustment pin detection fixture to the detection platform.

[0069] In terms of specific structure, the base 1 has several evenly distributed through holes or threaded holes at its bottom or edge. These mounting holes 15 are symmetrically arranged along the length or width of the base 1, and the hole diameter is designed according to the general fastener standard to accommodate common bolt or screw specifications such as M4 and M6. The mounting holes 15 can be countersunk to ensure that the fasteners do not protrude above the surface of the base 1 after assembly, thereby avoiding interference with the structure of other equipment or the movement trajectory of the slider.

[0070] In use, the operator can directly position the fixture at the preset mounting position on the testing platform and securely fix the base 1 with bolts to ensure that the device does not shift or vibrate during use, thereby improving the stability and repeatability of the measurement process. The position of the mounting hole 15 can also be customized according to the user's platform size to facilitate compatibility with different types of test workbenches, fixture conversion seats, or automated equipment mounting surfaces.

[0071] To improve the versatility and portability of the fixture, some mounting holes 15 can be through holes, supporting temporary fixation via quick clamping components such as positioning pins, magnetic bases 1, or vacuum adsorption pads, significantly improving work efficiency in applications where frequent product or module replacements are required.

[0072] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "illustrative embodiment," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0073] Although embodiments of the present invention have been shown and described, those skilled in the art will understand that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the claims and their equivalents.

[0074] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "illustrative embodiment," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0075] Although embodiments of the present invention have been shown and described, those skilled in the art will understand that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the claims and their equivalents.

Claims

1. An automatic adjustable-distance pin detection fixture, characterized in that, include: The base is equipped with guide rails; A slider assembly, which is disposed on the guide rail and is movable along the guide rail; A probe module is mounted on the slider assembly, and the probe module includes a plurality of spring probes for contacting the pin to be tested; An adjustment mechanism is provided to drive the slider assembly to move along the guide rail in order to adjust the spacing between the probe modules. A scale display structure is provided on either the slider assembly or the distance adjustment mechanism, and is used to visually display the distance between the probe modules; A stop structure is provided on the slider assembly for locking the position of the slider assembly after the probe module is adjusted to the target position; A signal output structure is provided for transmitting the signal collected by the spring probe to an external testing device.

2. The automatic adjustable-distance pin detection fixture according to claim 1, characterized in that, The adjusting mechanism includes a dial wheel and a rack assembly that is driven by the slider. The rotation of the dial wheel is used to drive the slider assembly to move along the guide rail.

3. The automatic adjustable-distance pin detection fixture according to claim 2, characterized in that, The slider includes a first slider and a second slider, which are symmetrically arranged along the guide rail. The adjustment mechanism is configured to simultaneously drive the first slider and the second slider to move in opposite directions to synchronously adjust the spacing between the corresponding probe modules.

4. The automatic spacing adjustment pin detection fixture according to claim 3, characterized in that, The scale display structure includes: A linear scale is provided on the outer surface of the first slider; A scale reading window is fixedly mounted on the upper surface of the base; The linear scale extends along the guide rail, and the scale reading window is vertically aligned with the scale, so that when the first slider moves along the guide rail, its scale value at the scale reading window changes, indicating the spacing between the probe modules.

5. The automatic spacing adjustment pin detection fixture according to claim 4, characterized in that, The stop structure is disposed on the first slider and is configured to restrict the movement of the first slider along the guide rail after the probe module is adjusted to the target position.

6. The automatic spacing adjustment pin detection fixture according to claim 5, characterized in that, The signal output structure is located at the tail of the probe module and is configured to lead the electrical signal collected by the spring probe to an external testing device.

7. The automatic spacing adjustment pin detection fixture according to claim 6, characterized in that, The base is a one-piece rectangular structure, and at least one guide rail is provided on the base along its length to guide the slider assembly to move horizontally. Limiting blocks are provided at both ends of the base to limit the maximum stroke range of the slider assembly.

8. The automatic spacing adjustment pin detection fixture according to claim 7, characterized in that, The probe module is screwed onto the slider assembly.

9. The automatic spacing adjustment pin detection fixture according to claim 8, characterized in that, The tail of the spring probe is connected to the signal output structure via a plug-in connection.

10. The automatic spacing adjustment pin detection fixture according to claim 7, characterized in that, The base is provided with mounting holes for fixing the automatic distance adjustment pin detection fixture to the detection platform.

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