pinning structure
By setting multiple first-side probes and second-side probes on the circuit board to form a fan-shaped arrangement, the problem of micro-pitch requirements under the single-row probe architecture is solved, and the cost of materials and labor is reduced.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- STAR TECHNOLOGIES INC
- Filing Date
- 2025-08-07
- Publication Date
- 2026-07-14
Smart Images
Figure CN224500736U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to a probe structure, and more particularly to a probe card structure with a fan-shaped arrangement of signal paths. Background Technology
[0002] In the integrated circuit manufacturing process, electrical testing is a crucial step to ensure the proper functioning of the device. For example, after wafer fabrication, the electrical properties of the test keys on the wafer need to be measured to confirm its reliability. Similarly, after chip fabrication, the electrical properties of the electrical contacts (PADs) on the chip also need to be measured to confirm its reliability, allowing defective chips to be discarded during dicing and saving on subsequent chip packaging costs.
[0003] Traditional cantilever probe cards (CPCs) use parallel-arranged probes to measure the electrical properties of the device under test (DUT) through contact with electrode pads (test keys or electrical contacts). With technological advancements and the need for chip miniaturization, the spacing between the electrode pads and the DUTs is becoming increasingly smaller. Therefore, CPC probes need to be arranged in double layers or staggered arrangements, or MEMS probes can be used directly for electrical measurements. The former increases component and labor costs, while the latter significantly increases probe manufacturing costs. Therefore, how to achieve the required micro-pitch within a single-row probe architecture, thereby reducing component and labor costs, is a pressing issue in this field. Utility Model Content
[0004] The technical problem to be solved by this utility model is to provide a probe structure that meets the micro-pitch requirements in a single-row probe architecture, thereby reducing material and labor costs.
[0005] To address the aforementioned technical problems, this utility model provides a probe testing structure, comprising: a circuit board having a first surface and a second surface opposite to the first surface; a test area disposed in the middle region of the first surface; the test area further having a plurality of first conductive traces and a plurality of second conductive traces; at least one set of first side probes, the at least one set of first side probes being disposed within the test area of the circuit board and extending from the inner side of the test area toward the outer side of the test area; each first side probe having a first end and a second end; the first end being disposed within the test area and configured to be electrically connected to an electrode pad on a test object; the second end being disposed outside the test area and configured to be electrically connected to the first conductive traces on the circuit board; the at least one set of first side probes including a plurality of first probes; and at least one set of second side probes, the at least one set of second side probes being disposed on the circuit board. The first probe is located within the test area and extends from the inside of the test area toward the outside of the test area. The second side probe has a third end and a fourth end. The third end is located inside the test area and configured to be electrically connected to the electrode pad on the test object. The fourth end is located outside the test area and configured to be electrically connected to the second conductive trace on the circuit board. The at least one set of second side probes includes a plurality of second probes. The plurality of first probes have the same shape and length, and the distance between the first ends of any two adjacent first probes is less than the distance between the second ends. The plurality of second probes have the same shape and length, and the distance between the third ends of any two adjacent second probes is less than the distance between the fourth ends. The first ends of the at least one set of first side probes and the third ends of the at least one set of second side probes are arranged face-to-face.
[0006] Optionally, the plurality of first probes and the plurality of second probes have the same shape and length.
[0007] Optionally, the plurality of first probes may have different shapes or lengths than the plurality of second probes.
[0008] Optionally, the at least one set of first side probes further includes a plurality of third probes, the plurality of third probes having the same shape and length, and the distance between the first ends of any two adjacent third probes being less than the distance between their second ends; the at least one set of second side probes further includes a plurality of fourth probes, the plurality of fourth probes having the same shape and length, and the distance between the third ends of any two adjacent fourth probes being less than the distance between their fourth ends; wherein the plurality of third probes and the plurality of fourth probes have the same shape and length; wherein the plurality of first probes and the plurality of third probes have different shapes and lengths, and the plurality of first probes and the plurality of third probes are arranged alternately; wherein the plurality of second probes and the plurality of fourth probes have different shapes and lengths, and the plurality of second probes and the plurality of fourth probes are arranged alternately.
[0009] Optionally, the first ends of the plurality of first probes and the third ends of the plurality of fourth probes are arranged facing each other; wherein the first ends of the plurality of third probes and the third ends of the plurality of second probes are arranged facing each other; wherein the plurality of first probes and the plurality of third probes are arranged on the same horizontal plane, and the plurality of second probes and the plurality of fourth probes are arranged on the same horizontal plane.
[0010] Optionally, the first ends of the plurality of first probes and the third ends of the plurality of second probes are arranged facing each other; wherein the first ends of the plurality of third probes and the third ends of the plurality of fourth probes are arranged facing each other; wherein the plurality of first probes and the plurality of third probes are arranged on the same horizontal plane, and the plurality of second probes and the plurality of fourth probes are arranged on the same horizontal plane.
[0011] Optionally, the first end of the at least one set of first side probes is located on a first straight line, and the third end of the at least one set of second side probes is located on a second straight line, and the first straight line and the second straight line are parallel to each other.
[0012] Optionally, the connection of the second end of the plurality of first probes is in the shape of a protruding arc, and the connection of the fourth end of the plurality of second probes is in the shape of a protruding arc.
[0013] Optionally, the connection of the second end of the plurality of first probes is in the shape of a protruding arc, the connection of the fourth end of the plurality of second probes is in the shape of a protruding arc, the connection of the second end of the plurality of third probes is in the shape of a protruding arc, and the connection of the fourth end of the plurality of fourth probes is in the shape of a protruding arc.
[0014] Optionally, there is a lateral width between the first end of the at least one set of first side probes and the third end of the at least one set of second side probes, the lateral width being the distance between the first end and the third end; each of the first end of the at least one set of first side probes and the third end of the at least one set of second side probes has a longitudinal length, the longitudinal length being the length of the first end of the plurality of first probes in the connection direction, and the longitudinal length is also the length of the third end of the plurality of second probes in the connection direction, the longitudinal length being greater than the lateral width.
[0015] To address the aforementioned technical problems, this utility model also provides a probe testing structure, comprising: a circuit board having a first surface and a second surface opposite to the first surface; a test area disposed in the middle region of the first surface; the test area further comprising a plurality of first conductive traces and a plurality of second conductive traces; each first conductive trace having a first end and a second end; a first spacing between the first ends of any two adjacent first conductive traces; a second spacing between the second ends of any two adjacent first conductive traces; and the second spacing being greater than the first spacing; each second conductive trace having a third end and a fourth end; the first end of any two adjacent second conductive traces being... A third spacing is provided between the three ends, and a fourth spacing is provided between the fourth ends of any two adjacent second conductive traces. The third spacing is equal to the first spacing, and the fourth spacing is equal to the second spacing. The third ends and the first ends are arranged face-to-face with each other. A plurality of first probes are provided in the test area of the circuit board. One end of each first probe is connected to the first conductive trace, and the other end is configured to be electrically connected to the electrode pad on the test object. A plurality of second probes are provided in the test area of the circuit board. One end of each second probe is connected to the second conductive trace, and the other end is configured to be electrically connected to the electrode pad on the test object.
[0016] Optionally, the number of the plurality of first conductive traces is the same as the number of the plurality of second conductive traces, and the first conductive traces and the second conductive traces are arranged facing each other.
[0017] To address the aforementioned technical problems, this utility model also provides a probe testing structure, comprising: a circuit board having a first surface and a second surface opposite to the first surface; a test area disposed in the middle region of the first surface; the test area further having a plurality of first conductive traces and a plurality of second conductive traces; at least one set of first side probes, the at least one set of first side probes being disposed within the test area of the circuit board and extending from the inner side of the test area toward the outer side of the test area; the at least one set of first side probes having a first end and a second end; the first end being disposed within the test area and configured to be electrically connected to an electrode pad on a test object; the second end being disposed outside the test area and configured to be electrically connected to the first conductive traces on the circuit board; the at least one set of first side probes including a plurality of first probes; and extending at least one set of second side probes, the at least one set of second side probes being disposed within the circuit board. The first probe is located within the test area of the board and extends from the inside of the test area toward the outside of the test area. The second side probe has a third end and a fourth end. The third end is located inside the test area and configured to be electrically connected to the electrode pad on the test object. The fourth end is located outside the test area and configured to be electrically connected to the second conductive trace on the circuit board. The at least one set of second side probes includes a plurality of second probes. The plurality of first probes have the same shape and length, and the distance between the first ends of any two adjacent first probes is less than the distance between the second ends. The plurality of second probes have the same shape and length, and the distance between the third ends of any two adjacent second probes is less than the distance between the fourth ends. At least a portion of the first ends of the at least one set of first side probes and the third ends of the at least one set of second side probes are arranged face-to-face with each other.
[0018] The beneficial effects of this utility model are as follows: The probe testing structure provided by this utility model includes a circuit board, at least one set of first-side probes, and at least one set of second-side probes. The circuit board has a first surface and a second surface, and a test area is disposed in the middle region of the first surface. The test area also has multiple first conductive traces and multiple second conductive traces. At least one set of first-side probes is disposed within the test area of the circuit board and extends from the inside of the test area to the outside of the test area. The at least one set of first-side probes has a first end and a second end. The first end is disposed within the test area and is configured to be electrically connected to an electrode pad on the test object. The second end is disposed outside the test area and is configured to be electrically connected to a first conductive trace on the circuit board. The at least one set of first-side probes includes multiple first probes. The at least one set of second-side probes is disposed within the test area of the circuit board and extends from the inside of the test area to the outside of the test area. The at least one set of second-side probes has a third end and a fourth end. The third end is disposed within the test area and is configured to be electrically connected to an electrode pad on the test object. The fourth end is disposed outside the test area and is configured to be electrically connected to a second conductive trace on the circuit board. The at least one set of second-side probes includes multiple second probes. Multiple first probes have the same shape and length, and the distance between the first ends of any two adjacent first probes is less than the distance between their second ends; multiple second probes have the same shape and length, and the distance between the third ends of any two adjacent second probes is less than the distance between their fourth ends; the first ends of at least one set of first side probes and the third ends of at least one set of second side probes are arranged face-to-face. Therefore, the first and second side probes of this invention can form a fan-shaped arrangement, which can meet the micro-pitch requirements in a single-row probe architecture, thereby reducing material and labor costs.
[0019] To further understand the features and technical content of this utility model, please refer to the following detailed description and drawings of this utility model. However, the drawings are provided for reference and illustration only and are not intended to limit this utility model. Attached Figure Description
[0020] Figure 1 This is an exploded perspective view of the probe structure according to the first embodiment of this utility model.
[0021] Figure 2 This is a three-dimensional assembly diagram of the probe structure of the first embodiment of this utility model.
[0022] Figure 3 This is a perspective view of the probe assembly according to the first embodiment of this utility model.
[0023] Figure 4 This is a top view of the probe assembly according to the first embodiment of this utility model.
[0024] Figure 5 This is a perspective view of a single probe according to the first embodiment of this utility model.
[0025] Figure 6 This is an exploded perspective view of the probe structure according to the second embodiment of this utility model.
[0026] Figure 7 This is a three-dimensional assembly diagram of the needle probe structure according to the second embodiment of this utility model.
[0027] Figure 8 This is a perspective view of the probe assembly according to the second embodiment of this utility model.
[0028] Figure 9 This is a top view of the probe assembly according to the second embodiment of this utility model.
[0029] Figure 10 This is a perspective view of a single probe according to the second embodiment of this utility model.
[0030] Figure 11 This is a top view of the probe assembly according to the third embodiment of this utility model.
[0031] Figure 12 This is a top view of the probe assembly according to the fourth embodiment of this utility model.
[0032] Figure 13 This is a top view of the probe assembly according to the fifth embodiment of this utility model.
[0033] Figure 14 This is a top view of the probe assembly according to the sixth embodiment of this utility model.
[0034] Explanation of reference numerals in the attached figures:
[0035] 1. Circuit board; 11. First side; 12. Second side; 13. First conductive trace; 131. First end; 132. Second end; 14. Second conductive trace; 141. Third end; 142. Fourth end; 15. Test area; 2. First probe; 21. First end; 22. Second end; 23. Plate-shaped body; 24. Contact part; 3. Second probe; 31. Third end; 32. Fourth end; 33. Plate-shaped body; 34. Contact part; 4. Third probe; 5. Fourth probe; P1. First spacing; P2. Second spacing; P3. Third spacing; P4. Fourth spacing; W. Lateral width; L. Longitudinal length; L1. First straight line; L2. Second straight line; G1. First side probe; G2. Second side probe; 100. Test object; 101. Electrode pad. Detailed Implementation
[0036] [Example]
[0037] Please see Figure 1 and Figure 2 , Figure 1 This is an exploded perspective view of the needle-measuring structure according to the first embodiment of this utility model. Figure 2 This is a three-dimensional assembly diagram of the probe probe structure according to the first embodiment of the present invention. The present invention provides a probe probe structure, including a circuit board 1, at least one set of first-side probes G1 and at least one set of second-side probes G2.
[0038] The circuit board 1 is a plate, preferably circular, but its shape is not limited; for example, it can also be square or other shapes. The circuit board 1 has a first surface 11 and a second surface 12 opposite to the first surface 11. A test area 15 is located in the middle region of the first surface 11. The test area 15 also has multiple first conductive traces 13 and multiple second conductive traces 14. The first conductive traces 13 and second conductive traces 14 are typically made of copper and covered with an insulating material. The arrangement of the multiple first conductive traces 13 and multiple second conductive traces 14 is not limited.
[0039] The at least one set of first-side probes G1 is disposed within the test area 15 of the circuit board 1 and extends from the inside of the test area 15 toward the outside of the test area 15. Each first-side probe G1 has a first end 21 and a second end 22. The first end 21 is disposed on the inside of the test area 15 and is configured to be electrically connected to the electrode pad 101 on the test object 100. The second end 22 is disposed on the outside of the test area 15 and is configured to be electrically connected to the first conductive trace 13 on the circuit board 1. The at least one set of first-side probes G1 includes a plurality of first probes 2. The structure of the first probes 2 is not limited. In this embodiment, the first probes 2 are plate-shaped probes. In one embodiment, the test object 100 is a wafer, and the electrode pad 101 is a test key on the wafer.
[0040] The at least one set of second side probes G2 is disposed within the test area 15 of the circuit board 1 and extends from the inside of the test area 15 toward the outside of the test area 15. Each second side probe G2 has a third end 31 and a fourth end 32. The third end 31 is disposed on the inside of the test area 15 and is configured to be electrically connected to the electrode pad 101 on the test object 100. The fourth end 32 is disposed on the outside of the test area 15 and is configured to be electrically connected to the second conductive trace 14 on the circuit board 1. The at least one set of second side probes G2 includes a plurality of second probes 3. The structure of the second probes 3 is not limited. In this embodiment, the second probes 3 are plate-shaped probes.
[0041] In this embodiment, the plurality of first probes 2 have the same shape and length (e.g., Figures 3 to 5As shown), the distance between the first ends 21 of any two adjacent first probes 2 is less than the distance between the second ends 22. Specifically, there is a first distance P1 between any two adjacent first ends 21 of the first probes 2, and a second distance P2 between any two adjacent second ends 22 of the first probes 2, where the second distance P2 is greater than the first distance P1. In one embodiment, the distance between the first ends 21 of any two adjacent first probes 2 is equal, and the distance between the second ends 22 of any two adjacent first probes 2 is equal.
[0042] In this embodiment, the plurality of second probes 3 have the same shape and length, and the distance between the third ends 31 of any two adjacent second probes 3 is less than the distance between the fourth ends 32. Specifically, there is a third distance P3 between any two adjacent third ends 31, and a fourth distance P4 between any two adjacent fourth ends 32, where the fourth distance P4 is greater than the third distance P3. In one embodiment, the distance between the third ends 31 of any two adjacent second probes 3 is equal, and the distance between the fourth ends 32 of any two adjacent second probes 3 is equal. Optionally, the first ends 21 of the at least one set of first side probes G1 and the third ends 31 of the at least one set of second side probes G2 are arranged face-to-face.
[0043] In this embodiment, at least one set of first side probes G1 has its first end 21 located on the first straight line L1 (e.g., Figure 4 As shown), at least one set of third ends 31 of the second side probes G2 are located on the second straight line L2, and the first straight line L1 and the second straight line L2 are parallel to each other. Optionally, the connection of the second ends 22 of the plurality of first probes 2 is in the shape of a protruding arc, and the connection of the fourth ends 32 of the plurality of second probes 3 is in the shape of a protruding arc.
[0044] In this embodiment, there is a lateral width W between the first end 21 of the at least one set of first side probes G1 and the third end 31 of the at least one set of second side probes G2 (e.g., ...). Figure 4 As shown in the figure, the lateral width W is the distance between the first end 21 and the third end 31. The first end 21 of the at least one set of first side probes G1 and the third end 31 of the at least one set of second side probes G2 each have a longitudinal length L. The longitudinal length L is the length of the first end 21 of the plurality of first probes 2 in the connection direction, and the longitudinal length L is also the length of the third end 31 of the plurality of second probes 3 in the connection direction. The longitudinal length L is greater than the lateral width W, which can make the probe contact parts (e.g., the first end 21 of the first side probe G1 and the third end 31 of the second side probe G2) more concentrated, so as to reduce the space occupied and reduce the distance between the probe tips.
[0045] like Figure 5As shown, the first probe 2 and the second probe 3 in this embodiment are plate-shaped probes. The first probe 2 and the second probe 3 each have plate-shaped bodies 23 and 33 and contact portions 24 and 34. The first end 21 and the second end 22 are respectively disposed at opposite ends of the plate-shaped body 23, and the third end 31 and the fourth end 32 are respectively disposed at opposite ends of the plate-shaped body 33. The contact portions 24 and 34 are respectively disposed at the first end 21 and the third end 31. The contact portions 24 and 34 are configured to be electrically connected to the electrode pad 101 on the test object 100.
[0046] Please see Figure 6 and Figure 7 , Figure 6 This is an exploded perspective view of the needle-measuring structure according to the second embodiment of this utility model. Figure 7 This is a three-dimensional assembly diagram of the probe structure according to the second embodiment of the present invention. This embodiment is largely the same as the first embodiment described above, except that the first probe 2 and the second probe 3 in this embodiment are cantilever probes, with the first end 21 and the second end 22 respectively located at opposite ends of the first probe 2 (e.g., ...). Figures 8 to 10 As shown), the third end 31 and the fourth end 32 are respectively located at opposite ends of the second probe 3.
[0047] Please see Figure 11 and Figure 12 , Figure 11 This is a top view of the probe assembly according to the third embodiment of this utility model. Figure 12 This is a top view of the probe assembly according to the fourth embodiment of this utility model. Figure 11 In the disclosed embodiments, the plurality of first probes 2 and the plurality of second probes 3 have the same shape and length, but are not limited thereto. Figure 12 In the disclosed embodiments, the plurality of first probes 2 have different shapes or lengths from the plurality of second probes 3.
[0048] Please see Figure 13 , Figure 13This is a top view of the probe assembly according to the fifth embodiment of the present invention. In this embodiment, the at least one set of first side probes G1 further includes a plurality of third probes 4. The plurality of third probes 4 have the same shape and length, and the distance between the first ends 21 of any two adjacent third probes 4 is less than the distance between the second ends 22. In this embodiment, the at least one set of second side probes G2 further includes a plurality of fourth probes 5. The plurality of fourth probes 5 have the same shape and length, and the distance between the third ends 31 of any two adjacent fourth probes 5 is less than the distance between the fourth ends 32. In this embodiment, the plurality of third probes 4 and the plurality of fourth probes 5 have the same shape and length, the plurality of first probes 2 have different shapes and lengths from the plurality of third probes 4, and the plurality of first probes 2 and the plurality of third probes 4 are arranged alternately. The plurality of second probes 3 and the plurality of fourth probes 5 have different shapes and lengths, and the plurality of second probes 3 and the plurality of fourth probes 5 are arranged alternately.
[0049] In this embodiment, the first ends 21 of the plurality of first probes 2 and the third ends 31 of the plurality of fourth probes 5 are arranged facing each other, and the first ends 21 of the plurality of third probes 4 and the third ends 31 of the plurality of second probes 3 are arranged facing each other. Optionally, the plurality of first probes 2 and the plurality of third probes 4 are arranged on the same horizontal plane, and the plurality of second probes 3 and the plurality of fourth probes 5 are arranged on the same horizontal plane. In one embodiment, the distance between the first ends 21 of any two adjacent third probes 4 is equal, and the distance between the second ends 22 of any two adjacent third probes 4 is equal. In one embodiment, the distance between the third ends 31 of any two adjacent fourth probes 5 is equal, and the distance between the fourth ends 32 of any two adjacent fourth probes 5 is equal.
[0050] Please see Figure 14 , Figure 14 This is a top view of the probe assembly according to the sixth embodiment of the present invention. In this embodiment, the first ends 21 of the plurality of first probes 2 and the third ends 31 of the plurality of second probes 3 are arranged facing each other, and the first ends 21 of the plurality of third probes 4 and the third ends 31 of the plurality of fourth probes 5 are arranged facing each other. The plurality of first probes 2 and the plurality of third probes 4 are arranged on the same horizontal plane, and the plurality of second probes 3 and the plurality of fourth probes 5 are arranged on the same horizontal plane.
[0051] In this embodiment, the connection of the second ends 22 of the plurality of first probes 2 is in a protruding arc shape (e.g., Figure 13 and Figure 14 As shown, the connection of the fourth ends 32 of the plurality of second probes 3 is in the shape of a protruding arc, the connection of the second ends 22 of the plurality of third probes 4 is in the shape of a protruding arc, and the connection of the fourth ends 32 of the plurality of fourth probes 5 is in the shape of a protruding arc.
[0052] In another embodiment of the present invention, the first end 21 of at least one set of first side probes G1 and the third end 31 of at least one set of second side probes G2 may not be completely face-to-face with each other. That is, at least a portion of the first end 21 of at least one set of first side probes G1 and the third end 31 of at least one set of second side probes G2 are face-to-face with each other. In other words, each first end 21 of at least one set of first side probes G1 and each third end 31 of the corresponding set of at least one set of second side probes G2 are slightly offset, and only a portion of them are face-to-face with each other.
[0053] This utility model also provides a probe testing structure, including a circuit board 1, multiple first probes 2 and multiple second probes 3 (such as...). Figures 1 to 4 As shown, the circuit board 1 has a first surface 11 and a second surface 12 opposite to the first surface 11. A test area 15 is disposed in the middle area of the first surface 11. The test area 15 also has a plurality of first conductive traces 13 and a plurality of second conductive traces 14. Each first conductive trace 13 has a first end 131 and a second end 132. A first spacing P1 is between any two adjacent first conductive traces 13's first ends 131, and a second spacing P2 is between any two adjacent first conductive traces 13's second ends 132, and the second spacing P2 is greater than the first spacing P1. Each second conductive trace 14 has a third end 141 and a fourth end 142. A third spacing P3 is between any two adjacent second conductive traces 14's third ends 141, and a fourth spacing P4 is between any two adjacent second conductive traces 14's fourth ends 142, the third spacing P3 is equal to the first spacing P1, the fourth spacing P4 is equal to the second spacing P2, and the third end 141 and the first end 131 are arranged face-to-face with each other.
[0054] Each first probe 2 has one end connected to a first conductive trace 13 and the other end configured to be electrically connected to an electrode pad 101 on the test object 100. Each second probe 3 has one end connected to a second conductive trace 14 and the other end configured to be electrically connected to an electrode pad 101 on the test object 100. Optionally, the number of the plurality of first conductive traces 13 and the plurality of second conductive traces 14 are the same, and the first conductive traces 13 and second conductive traces 14 are arranged facing each other.
[0055] [Beneficial Effects of the Examples]
[0056] The beneficial effects of this utility model are as follows: The probe testing structure provided by this utility model includes a circuit board, at least one set of first-side probes, and at least one set of second-side probes. The circuit board has a first surface and a second surface, and a test area is disposed in the middle region of the first surface. The test area also has multiple first conductive traces and multiple second conductive traces. At least one set of first-side probes is disposed within the test area of the circuit board and extends from the inside of the test area to the outside of the test area. The at least one set of first-side probes has a first end and a second end. The first end is disposed within the test area and is configured to be electrically connected to an electrode pad on the test object. The second end is disposed outside the test area and is configured to be electrically connected to a first conductive trace on the circuit board. The at least one set of first-side probes includes multiple first probes. At least one set of second-side probes is disposed within the test area of the circuit board and extends from the inside of the test area to the outside of the test area. The at least one set of second-side probes has a third end and a fourth end. The third end is disposed within the test area and is configured to be electrically connected to an electrode pad on the test object. The fourth end is disposed outside the test area and is configured to be electrically connected to a second conductive trace on the circuit board. The at least one set of second-side probes includes multiple second probes. Multiple first probes have the same shape and length, and the distance between the first ends of any two adjacent first probes is less than the distance between their second ends; multiple second probes have the same shape and length, and the distance between the third ends of any two adjacent second probes is less than the distance between their fourth ends; the first ends of at least one set of first side probes and the third ends of at least one set of second side probes are arranged face-to-face. The first and second side probes of this invention can form a fan-shaped arrangement, which can meet the micro-pitch requirements in a single-row probe architecture, thereby reducing material and labor costs.
[0057] The above description is only a preferred embodiment of the present utility model and is not intended to limit the scope of patent protection of the present utility model. Therefore, all equivalent changes made based on the content of the present utility model specification and drawings are similarly included within the scope of protection of the present utility model and are hereby stated.
Claims
1. A needle-testing structure, characterized in that, include: A circuit board has a first side and a second side opposite to the first side, a test area is disposed in the middle area of the first side, and the test area also has a plurality of first conductive traces and a plurality of second conductive traces. At least one set of first-side probes is disposed within the test area of the circuit board and extends from the inside of the test area toward the outside of the test area. The at least one set of first-side probes has a first end and a second end. The first end is disposed within the test area and configured to be electrically connected to an electrode pad on the test object. The second end is disposed outside the test area and configured to be electrically connected to a first conductive trace on the circuit board. The at least one set of first-side probes includes a plurality of first probes. as well as At least one set of second-side probes is disposed within the test area of the circuit board and extends from the inside of the test area toward the outside of the test area. The at least one set of second-side probes has a third end and a fourth end. The third end is disposed within the test area and configured to be electrically connected to the electrode pad on the test object. The fourth end is disposed outside the test area and configured to be electrically connected to the second conductive trace on the circuit board. The at least one set of second-side probes includes a plurality of second probes. The plurality of first probes have the same shape and length, and the distance between the first ends of any two adjacent first probes is less than the distance between their second ends. The plurality of second probes have the same shape and length, and the distance between the third ends of any two adjacent second probes is less than the distance between the fourth ends. The first end of the at least one set of first side probes and the third end of the at least one set of second side probes are arranged face to face with each other.
2. The needle-testing structure according to claim 1, characterized in that, The plurality of first probes and the plurality of second probes have the same shape and length.
3. The needle-testing structure according to claim 1, characterized in that, The plurality of first probes have different shapes or lengths from the plurality of second probes.
4. The needle-testing structure according to claim 2, characterized in that, The at least one set of first side probes further includes a plurality of third probes, the plurality of third probes having the same shape and length, and the distance between the first ends of any two adjacent third probes being less than the distance between their second ends; The at least one set of second side probes further includes a plurality of fourth probes, the plurality of fourth probes having the same shape and length, and the distance between the third ends of any two adjacent fourth probes being less than the distance between the fourth ends; The plurality of third probes and the plurality of fourth probes have the same shape and length; The plurality of first probes and the plurality of third probes have different shapes and lengths, and the plurality of first probes and the plurality of third probes are arranged in an alternating pattern. The plurality of second probes and the plurality of fourth probes have different shapes and lengths, and are arranged in an alternating pattern.
5. The needle-testing structure according to claim 4, characterized in that, The first ends of the plurality of first probes and the third ends of the plurality of fourth probes are arranged face to face with each other; The first ends of the plurality of third probes and the third ends of the plurality of second probes are arranged face to face with each other; The plurality of first probes and the plurality of third probes are arranged on the same horizontal plane, and the plurality of second probes and the plurality of fourth probes are arranged on the same horizontal plane.
6. The needle-testing structure according to claim 4, characterized in that, The first ends of the plurality of first probes and the third ends of the plurality of second probes are arranged face to face with each other; The first ends of the plurality of third probes and the third ends of the plurality of fourth probes are arranged face to face with each other; The plurality of first probes and the plurality of third probes are arranged on the same horizontal plane, and the plurality of second probes and the plurality of fourth probes are arranged on the same horizontal plane.
7. The probe structure according to claim 1, characterized in that, The first end of the at least one set of first side probes is located on a first straight line, and the third end of the at least one set of second side probes is located on a second straight line, and the first straight line and the second straight line are parallel to each other.
8. The needle-testing structure according to claim 2, characterized in that, The connection of the second end of the plurality of first probes is in the shape of a protruding arc, and the connection of the fourth end of the plurality of second probes is in the shape of a protruding arc.
9. The needle-testing structure according to claim 4, characterized in that, The connection of the second end of the plurality of first probes is in the shape of a protruding arc, the connection of the fourth end of the plurality of second probes is in the shape of a protruding arc, the connection of the second end of the plurality of third probes is in the shape of a protruding arc, and the connection of the fourth end of the plurality of fourth probes is in the shape of a protruding arc.
10. The probe structure according to claim 1, characterized in that, The first end of the at least one set of first side probes and the third end of the at least one set of second side probes have a lateral width, which is the distance between the first end and the third end. The first end of the at least one set of first side probes and the third end of the at least one set of second side probes each have a longitudinal length, which is the length of the first end of the plurality of first probes in the connection direction. The longitudinal length is also the length of the third end of the plurality of second probes in the connection direction. The longitudinal length is greater than the lateral width.
11. A needle-testing structure, characterized in that, include: A circuit board has a first surface and a second surface opposite to the first surface. A test area is disposed in the middle area of the first surface. The test area also has a plurality of first conductive traces and a plurality of second conductive traces. Each first conductive trace has a first end and a second end. There is a first gap between the first ends of any two adjacent first conductive traces and a second gap between the second ends of any two adjacent first conductive traces. The second gap is greater than the first gap. Each of the second conductive traces has a third end and a fourth end. There is a third gap between the third ends of any two adjacent second conductive traces and a fourth gap between the fourth ends of any two adjacent second conductive traces. The third gap is equal to the first gap, the fourth gap is equal to the second gap, and the third end and the first end are arranged face to face with each other. Multiple first probes are disposed in the test area of the circuit board, one end of each first probe is connected to the first conductive trace, and the other end is configured to be electrically connected to the electrode pad on the test object. as well as Multiple second probes are disposed in the test area of the circuit board, with one end of each second probe connected to the second conductive trace and the other end configured to be electrically connected to the electrode pad on the test object.
12. The needle-testing structure according to claim 11, characterized in that, The number of the plurality of first conductive traces is the same as the number of the plurality of second conductive traces, and the first conductive traces and the second conductive traces are arranged facing each other.
13. A needle-testing structure, characterized in that, include: A circuit board has a first side and a second side opposite to the first side, a test area is disposed in the middle area of the first side, and the test area also has a plurality of first conductive traces and a plurality of second conductive traces. At least one set of first-side probes is disposed within the test area of the circuit board and extends from the inside of the test area toward the outside of the test area. The at least one set of first-side probes has a first end and a second end. The first end is disposed within the test area and configured to be electrically connected to an electrode pad on the test object. The second end is disposed outside the test area and configured to be electrically connected to a first conductive trace on the circuit board. The at least one set of first-side probes includes a plurality of first probes. and extension At least one set of second side probes is disposed within the test area of the circuit board and extends from the inside of the test area toward the outside of the test area. The second side probe has a third end and a fourth end. The third end is disposed within the test area and configured to be electrically connected to the electrode pad on the test object. The fourth end is disposed outside the test area and configured to be electrically connected to the second conductive trace on the circuit board. The at least one set of second side probes includes a plurality of second probes. The plurality of first probes have the same shape and length, and the distance between the first ends of any two adjacent first probes is less than the distance between their second ends. The plurality of second probes have the same shape and length, and the distance between the third ends of any two adjacent second probes is less than the distance between the fourth ends. Wherein, at least a portion of the first end of the at least one set of first side probes and at least a portion of the third end of the at least one set of second side probes are arranged face to face with each other.