A chip testing apparatus

Abstract

The utility model belongs to chip test field, concretely relates to a chip testing arrangement, base, chip test seat, the top of base is connected with the sliding platform of sliding, the top fixed connection of sliding platform has chip test seat, the top fixed connection of base has the booster seat, be provided with the reversing assembly on the booster seat, the reversing assembly includes the rotary T platform, the top of booster seat is connected with the rotary T platform. This chip testing arrangement has outstanding convenience in the chip placement link. Through the cooperation of rotary T platform, directional block and magnetite, the material guide frame can be accurately moved to a specific position, facilitating the temporary placement and transfer of chips. The design of the guide block between the transfer sliding block and the material guide frame, the magnetite, and the limiting effect of the limiting sliding rod greatly improve the stability and controllability of the chip during the transfer process, making the chip placement work easy and efficient, effectively reducing the cumbersome steps and error probability of manual operation.

Description

Technical Field

[0001] This utility model relates to the field of chip testing technology, specifically to a chip testing device. Background Technology

[0002] In the chip manufacturing industry, chip testing is a crucial step in ensuring chip quality and performance. With the continuous development of chip technology, the requirements for the accuracy and efficiency of chip testing are increasing. After production, chips must undergo rigorous testing before entering the market.

[0003] Currently, existing chip testing devices often lack convenient and precise positioning and fixing mechanisms during chip placement. For example, it is difficult to accurately move the chip onto the test socket, and the chip is prone to shaking and shifting during the transfer process, leading to inaccurate placement. This not only increases the difficulty of manual operation but may also damage the chip or affect the accuracy of test results due to improper placement. Moreover, the entire placement process is cumbersome and time-consuming. In view of this, we propose a chip testing device. Utility Model Content

[0004] The main objective of this invention is to provide a chip testing device that can solve the problems mentioned in the background section.

[0005] To achieve the above objectives, the present invention provides a chip testing device comprising a base and a chip testing socket. A sliding stage is slidably connected to the top of the base, and the chip testing socket is fixedly connected to the top of the sliding stage. A riser is fixedly connected to the top of the base, and a reversing assembly is provided on the riser. The reversing assembly includes:

[0006] A rotating T-stage, wherein the top of the heightening seat is rotatably connected to the rotating T-stage, and an directional block is fixedly connected to the outer wall of the rotating T-stage;

[0007] An inclined block is fixedly connected to the top of the rotating T-stage, and a guide frame is rotatably connected to the outer wall of the rotating T-stage;

[0008] An arc-shaped spring is used, and the inclined block and the guide frame are elastically connected by the arc-shaped spring. A transfer slider is slidably connected to the inner wall of the guide frame.

[0009] A stop block is fixedly connected to the top of the height-increasing seat, and a magnet is fixedly connected to the inner wall of the stop block.

[0010] Preferably, a second stop block is fixedly connected to the top of the height-increasing seat, and a second magnet is fixedly connected to the inner wall of the second stop block.

[0011] Preferably, guide sliders are fixedly connected to both sides of the transfer slider.

[0012] Preferably, a magnet is fixedly connected to the inner wall of the guide frame, and a magnet is fixedly connected to the inner wall of the transfer slider.

[0013] Preferably, an adjusting seat is fixedly connected to the top of the guide frame, and a limiting slide bar is slidably connected to the inner wall of the adjusting seat.

[0014] Preferably, a toggle plate is fixedly connected to the outer wall of the limiting slide bar, and the adjusting seat and the toggle plate are elastically connected by a compression spring.

[0015] Preferably, a slide rail is fixedly connected to the top of the base, a connecting block is fixedly connected to the outer wall of the sliding platform, an electric cylinder seat is fixedly connected to the top of the base, and the inner wall of the sliding platform is slidably connected to the outer wall of the slide rail.

[0016] This invention provides a chip testing device. It has the following advantages:

[0017] (1) This chip testing device offers excellent convenience in chip placement. Through the combination of a rotating platform, orientation blocks, and magnets, the guide rack can be precisely moved to a specific position, facilitating temporary chip placement and transfer. The guide slider and magnet design between the transfer slider and the guide rack, along with the limiting function of the limiting slider, greatly enhance the stability and controllability of the chip during transfer, making chip placement easy and efficient, and effectively reducing the tedious steps and error probability of manual operation.

[0018] (2) The chip testing device has significant advantages in position adjustment. The slide rail on the base works in conjunction with the electric cylinder base to precisely move the sliding stage and chip test holder. Whether it is adjusting the position of the test holder before chip placement for easy operation, or accurately moving the chip into the test area after placement, it can be easily achieved, providing a strong guarantee for the smooth progress of the chip testing process and greatly improving the overall efficiency of the testing work. Attached Figure Description

[0019] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.

[0020] Figure 1 This is a schematic diagram of the overall three-dimensional structure of the present invention. Figure 1 ;

[0021] Figure 2 This is a schematic diagram of the overall three-dimensional structure of the present invention. Figure 2 ;

[0022] Figure 3 This is an exploded cross-sectional view of the height-increasing seat and the transfer slider of this utility model;

[0023] Figure 4 This is an exploded cross-sectional view of the four parts of the present invention: the second stop block and the magnet.

[0024] Figure 5 This is a cross-sectional structural diagram of the guide frame and the actuating plate of this utility model.

[0025] The following are the symbol labels: 1. Base; 2. Sliding stage; 3. Chip test stand; 4. Heightening stand; 5. Reversing assembly; 51. Rotating T-stage; 52. Orientation block; 53. Inclined block; 54. Guide rack; 55. Arc spring; 56. Transfer slider; 57. Stop block one; 58. Magnet one; 59. Stop block two; 510. Magnet two; 6. Guide slider; 7. Magnet three; 8. Magnet four; 9. Adjustment seat; 10. Limiting slide bar; 11. Actuating plate; 12. Slide rail; 13. Connecting block; 14. Electric cylinder base.

[0026] The realization of the purpose, functional features and advantages of this utility model will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0027] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0028] Please see Figures 1-5This utility model proposes a chip testing device, including a base 1 and a chip testing stand 3. A sliding stage 2 is slidably connected to the top of the base 1, and the chip testing stand 3 is fixedly connected to the top of the sliding stage 2. A riser 4 is fixedly connected to the top of the base 1, and a reversing assembly 5 is provided on the riser 4. The reversing assembly 5 includes a rotating T-stage 51, which is rotatably connected to the top of the riser 4. An orientation block 52 is fixedly connected to the outer wall of the rotating T-stage 51. The orientation block 52 is a magnetic component that can be magnetically attracted by a magnet. An inclined block 53 is fixedly connected to the top of the rotating platform 51. A guide frame 54 is rotatably connected to the outer wall of the rotating platform 51. The inclined block 53 and the guide frame 54 are elastically connected by an arc spring 55. A transfer slider 56 is slidably connected to the inner wall of the guide frame 54. The chip to be tested is temporarily placed by the transfer slider 56. A stop block 57 is fixedly connected to the top of the heightening seat 4. A magnet 58 is fixedly connected to the inner wall of the stop block 57. When the rotating platform 51 rotates to the stop block 57, the magnet 58 will be magnetically attracted to the orientation block 52.

[0029] In this utility model, the top of the height-increasing seat 4 is fixedly connected to a stop block 2 59, and the inner wall of the stop block 2 59 is fixedly connected to a magnet 2 510. When the rotating T-stage 51 rotates to the stop block 2 59, the magnet 2 510 will magnetically attract the directional block 52.

[0030] Furthermore, guide sliders 6 are fixedly connected to both sides of the transfer slider 56. A guide groove is provided on the guide frame 54. The guide slider 6 is slidably connected to the inner wall of the guide groove. The guide slider 6 cooperates with the guide groove to ensure that the transfer slider 56 slides smoothly on the guide frame 54, preventing it from deviating or shaking during movement, and ensuring the stability of chip transfer.

[0031] Furthermore, a magnet 7 is fixedly connected to the inner wall of the guide frame 54, and a magnet 8 is fixedly connected to the inner wall of the transfer slider 56. When the transfer slider 56 approaches the magnet 7, the magnet 8 and the magnet 7 attract each other magnetically. Through this magnetic attraction, the transfer slider 56 can be fixed at a specific position on the guide frame 54 to prevent it from sliding randomly and to facilitate subsequent operations.

[0032] Furthermore, an adjusting seat 9 is fixedly connected to the top of the guide frame 54. A limiting slide bar 10 is slidably connected to the inner wall of the adjusting seat 9, and a toggle plate 11 is fixedly connected to the outer wall of the limiting slide bar 10. The adjusting seat 9 and the toggle plate 11 are elastically connected by a compression spring. Under normal conditions, the limiting slide bar 10 is located within the movable area of ​​the transfer slider 56 on the guide frame 54. The movement of the transfer slider 56 is limited by the limiting slide bar 10 to prevent it from sliding directly out of the guide frame 54. The transfer slider 56 is provided with a notch for limiting movement. The slider 10 can slide into the notch. When the limiting slider 10 is in the notch, the transfer slider 56 is still on the guide frame 54. When part of the transfer slider 56 is outside the guide frame 54, and the guide frame 54 is above the chip test socket 3, by pressing the guide frame 54, the guide frame 54 is rotated downward, so that the area of ​​the transfer slider 56 on the outside contacts the chip test socket 3, which facilitates the temporary chip to be moved into the placement slot of the chip test socket 3, thus facilitating the chip placement work.

[0033] Furthermore, a slide rail 12 is fixedly connected to the top of the base 1, a connecting block 13 is fixedly connected to the outer wall of the sliding stage 2, an electric cylinder seat 14 is fixedly connected to the top of the base 1, the inner wall of the sliding stage 2 is slidably connected to the outer wall of the slide rail 12, and the output end of the electric cylinder seat 14 is fixedly connected to the outer wall of the connecting block 13. The electric cylinder seat 14 drives the connecting block 13 to move, thereby driving the sliding stage 2 to move on the slide rail 12, changing the position of the chip test stand 3 to meet the needs of different testing scenarios.

[0034] It should be noted that the above electrical components are all existing technology products. Those skilled in the art should select, install and complete the circuit debugging work according to the needs of use to ensure that all electrical appliances can work normally. The components are all general standard parts or components known to those skilled in the art. Their structure and principle can be known by those skilled in the art through technical manuals or conventional experimental methods. No specific restrictions are made here.

[0035] When in use, when the guide frame 54 is in Figure 1When positioning, magnet 58 will be magnetically attracted to orientation block 52, and part of the transfer slider 56 will be outside the guide frame 54, making it convenient to temporarily place the chip on the transfer slider 56. By moving the transfer slider 56, magnet 8 and magnet 3 will be magnetically attracted to each other, fixing the position of the transfer slider 56. Then we open the cover of the chip test socket 3 and push the rotating T-stage 51 to rotate it, so that orientation block 52 and magnet 2 510 are magnetically attracted. At this time, the guide frame 54 moves to the top of the chip test socket 3. After the rotation is completed, we need to push the transfer slider 56 to separate magnet 8 and magnet 3 7, so that the transfer slider 56 moves to the limit slider 10. Then by pressing the guide frame 54, the guide frame 54 rotates downward, so that the transfer slider 56 is in contact with the chip test socket 3 in the outer area, making it convenient to move the temporarily placed chip into the placement slot of the chip test socket 3, which facilitates the chip placement work.

[0036] After the chip is placed, change the angle of the rotating T-stage 51 so that the guide rack 54 moves away from the chip test holder 3, making it easier to close the cover of the chip test holder 3. The electric cylinder base 14 drives the connecting block 13 to move, which in turn drives the sliding stage 2 to move on the slide rail 12, changing the position of the chip test holder 3 and allowing the chip test holder 3 to enter the testing area.

[0037] The above description is only a preferred embodiment of the present utility model and does not limit the patent scope of the present utility model. All equivalent structural transformations made under the inventive concept of the present utility model using the contents of the present utility model specification and drawings, or direct / indirect applications in other related technical fields, are included within the patent protection scope of the present utility model.

Claims

1. A chip testing device, comprising a base (1) and a chip testing socket (3), characterized in that: A sliding platform (2) is slidably connected to the top of the base (1), a chip test socket (3) is fixedly connected to the top of the sliding platform (2), and a height-adjusting seat (4) is fixedly connected to the top of the base (1). A reversing assembly (5) is provided on the height-adjusting seat (4), and the reversing assembly (5) includes: A rotating T-stage (51) is rotatably connected to the top of the heightening seat (4), and an directional block (52) is fixedly connected to the outer wall of the rotating T-stage (51). Inclined block (53), the top of the rotating T-stage (51) is fixedly connected to the inclined block (53), and the outer wall of the rotating T-stage (51) is rotatably connected to the guide frame (54); The inclined block (53) and the guide frame (54) are elastically connected by the curved spring (55), and the inner wall of the guide frame (54) is slidably connected with the transfer slider (56). A stop block (57) is fixedly connected to the top of the heightening seat (4), and a magnet (58) is fixedly connected to the inner wall of the stop block (57).

2. The chip testing device according to claim 1, characterized in that: The top of the height-increasing seat (4) is fixedly connected to a second stop block (59), and the inner wall of the second stop block (59) is fixedly connected to a second magnet (510).

3. The chip testing device according to claim 1, characterized in that: Guide sliders (6) are fixedly connected to both sides of the transfer slider (56).

4. The chip testing device according to claim 1, characterized in that: The inner wall of the guide frame (54) is fixedly connected to a magnet three (7), and the inner wall of the transfer slider (56) is fixedly connected to a magnet four (8).

5. The chip testing device according to claim 1, characterized in that: An adjusting seat (9) is fixedly connected to the top of the guide frame (54), and a limiting slide bar (10) is slidably connected to the inner wall of the adjusting seat (9).

6. The chip testing apparatus according to claim 5, characterized in that: The outer wall of the limiting slide bar (10) is fixedly connected to a toggle plate (11), and the adjusting seat (9) and the toggle plate (11) are elastically connected by a compression spring.

7. The chip testing device according to claim 1, characterized in that: The top of the base (1) is fixedly connected to a slide rail (12), the outer wall of the sliding table (2) is fixedly connected to a connecting block (13), and the top of the base (1) is fixedly connected to an electric cylinder seat (14).

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