一种内循环高低温交变湿热试验箱

By constructing a closed-loop circulation system, utilizing a semiconductor heat exchanger and water-cooled coils for multi-stage heat exchange, and combining this with an arc valve plate to regulate the airflow path, the problems of response lag and low heat exchange efficiency in existing high and low temperature alternating humidity test chambers have been solved, achieving efficient and precise temperature and humidity control.

CN224507136UActive Publication Date: 2026-07-17CHANGZHOU MERRICK INSTR EQUIP MFG CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
CHANGZHOU MERRICK INSTR EQUIP MFG CO LTD
Filing Date
2025-07-21
Publication Date
2026-07-17

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Abstract

本实用新型公开了一种内循环高低温交变湿热试验箱,包括试验箱体、半导体换热箱、双出气风机和预冷水箱,所述双出气风机的进气端通过回气管与试验箱体内部连通,排气端设置第一出气口和第二出气口,第一出气口经预冷水箱连通至半导体换热箱的第二进气管口,第二出气口连通至第一进气管口。所述半导体换热箱内设有半导体制冷板组,其两侧分别设有热气栅和冷气栅,顶部设有通向试验箱体内部的通孔槽,通孔槽表面设有柔性胶瓣阀片。风机内部设置可滑动的弧阀板,通过调节电机与齿环啮合传动实现冷热气流通路的切换。该结构实现了气流闭环循环、冷热风比例可调、热交换效率高、控温响应速度快的目标,适用于各类高精度高低温湿热环境模拟试验。
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Claims

1. An internal circulation high-low temperature alternating damp heat test chamber, characterized in that, include: The test chamber (100), semiconductor heat exchanger (200), dual-outlet fan (300), and pre-cooling water tank (400) are provided. The semiconductor heat exchanger (200) is fixedly installed on the bottom surface of the test chamber (100), and a semiconductor cooling plate assembly (210) is fixedly installed inside the semiconductor heat exchanger (200). A hot air grid (211) and a cold air grid (212) are respectively provided on both sides of the semiconductor cooling plate assembly (210) inside the semiconductor heat exchanger (200). A first air inlet (201) and a second air inlet (202) are respectively provided on both sides of the semiconductor heat exchanger (200). The dual-outlet fan... The air inlet of the (300) is provided with a return air pipe (301) that communicates with the inside of the test chamber (100). The exhaust end of the dual-outlet fan (300) is provided with a first air outlet (312) and a second air outlet (313). The first air outlet (312) is connected to the precooling water tank (400) and is connected to the second air inlet (202). The second air outlet (313) is connected to the first air inlet (201). An arc valve plate (330) is slidably installed on the inner side of the dual-outlet fan (300). An adjustment motor (320) for driving the arc valve plate (330) to slide is fixedly installed on the surface of the fan body (310).

2. The inner loop high low temperature alternate wet and dry test chamber according to claim 1, characterized in that, The precooling water tank (400) is equipped with a water-cooling coil inside, and is connected to the circulating water circuit through the water-cooling coil. The airflow is cooled by heat exchange with the water-cooling coil.

3. The inner loop high-low temperature alternate damp heat test chamber according to claim 1, characterized in that, The semiconductor cooling plate assembly (210) has a number of semiconductor cooling chips arranged in a matrix on its inner side. The cooling surface of each semiconductor cooling chip is attached to the cold air grid (212), and the heating surface of the semiconductor cooling chip is attached to the hot air grid (211).

4. The inner loop high low temperature alternate wet and dry test chamber according to claim 1, characterized in that, The top surface of the semiconductor heat exchange box (200) is provided with several through-hole grooves that communicate with the interior of the test chamber (100), and the surface of the through-hole grooves is provided with flexible rubber flap valves for airflow to be introduced into the interior of the test chamber (100) in one direction through the through-hole grooves.

5. The inner loop high low temperature alternate wet and dry test chamber according to claim 1, characterized in that, A fan motor (311) is fixedly installed on the surface of the fan body (310) to drive the impeller inside the fan body (310) to rotate. The first air outlet (312) and the second air outlet (313) are arranged tangentially relative to the impeller surface.

6. The inner loop high low temperature alternate wet and dry test chamber according to claim 1, characterized in that, The outer periphery of the arc valve plate (330) slides against the inner wall of the dual-outlet fan (300), and the end of the first outlet (312) or the second outlet (313) is shielded by the sliding of the arc valve plate (330) inside the fan body (310).

7. The inner loop high low temperature alternate wet and dry test chamber according to claim 1, characterized in that, The surface of the arc valve plate (330) is provided with a toothed ring (331), and the output end of the regulating motor (320) meshes with the surface of the toothed ring (331) for transmission.