一种内循环高低温交变湿热试验箱
By constructing a closed-loop circulation system, utilizing a semiconductor heat exchanger and water-cooled coils for multi-stage heat exchange, and combining this with an arc valve plate to regulate the airflow path, the problems of response lag and low heat exchange efficiency in existing high and low temperature alternating humidity test chambers have been solved, achieving efficient and precise temperature and humidity control.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- CHANGZHOU MERRICK INSTR EQUIP MFG CO LTD
- Filing Date
- 2025-07-21
- Publication Date
- 2026-07-17
Smart Images

Figure CN224507136U_ABST
Abstract
Claims
1. An internal circulation high-low temperature alternating damp heat test chamber, characterized in that, include: The test chamber (100), semiconductor heat exchanger (200), dual-outlet fan (300), and pre-cooling water tank (400) are provided. The semiconductor heat exchanger (200) is fixedly installed on the bottom surface of the test chamber (100), and a semiconductor cooling plate assembly (210) is fixedly installed inside the semiconductor heat exchanger (200). A hot air grid (211) and a cold air grid (212) are respectively provided on both sides of the semiconductor cooling plate assembly (210) inside the semiconductor heat exchanger (200). A first air inlet (201) and a second air inlet (202) are respectively provided on both sides of the semiconductor heat exchanger (200). The dual-outlet fan... The air inlet of the (300) is provided with a return air pipe (301) that communicates with the inside of the test chamber (100). The exhaust end of the dual-outlet fan (300) is provided with a first air outlet (312) and a second air outlet (313). The first air outlet (312) is connected to the precooling water tank (400) and is connected to the second air inlet (202). The second air outlet (313) is connected to the first air inlet (201). An arc valve plate (330) is slidably installed on the inner side of the dual-outlet fan (300). An adjustment motor (320) for driving the arc valve plate (330) to slide is fixedly installed on the surface of the fan body (310).
2. The inner loop high low temperature alternate wet and dry test chamber according to claim 1, characterized in that, The precooling water tank (400) is equipped with a water-cooling coil inside, and is connected to the circulating water circuit through the water-cooling coil. The airflow is cooled by heat exchange with the water-cooling coil.
3. The inner loop high-low temperature alternate damp heat test chamber according to claim 1, characterized in that, The semiconductor cooling plate assembly (210) has a number of semiconductor cooling chips arranged in a matrix on its inner side. The cooling surface of each semiconductor cooling chip is attached to the cold air grid (212), and the heating surface of the semiconductor cooling chip is attached to the hot air grid (211).
4. The inner loop high low temperature alternate wet and dry test chamber according to claim 1, characterized in that, The top surface of the semiconductor heat exchange box (200) is provided with several through-hole grooves that communicate with the interior of the test chamber (100), and the surface of the through-hole grooves is provided with flexible rubber flap valves for airflow to be introduced into the interior of the test chamber (100) in one direction through the through-hole grooves.
5. The inner loop high low temperature alternate wet and dry test chamber according to claim 1, characterized in that, A fan motor (311) is fixedly installed on the surface of the fan body (310) to drive the impeller inside the fan body (310) to rotate. The first air outlet (312) and the second air outlet (313) are arranged tangentially relative to the impeller surface.
6. The inner loop high low temperature alternate wet and dry test chamber according to claim 1, characterized in that, The outer periphery of the arc valve plate (330) slides against the inner wall of the dual-outlet fan (300), and the end of the first outlet (312) or the second outlet (313) is shielded by the sliding of the arc valve plate (330) inside the fan body (310).
7. The inner loop high low temperature alternate wet and dry test chamber according to claim 1, characterized in that, The surface of the arc valve plate (330) is provided with a toothed ring (331), and the output end of the regulating motor (320) meshes with the surface of the toothed ring (331) for transmission.