一种热敏电阻测试用探针清洁装置
By designing an automated probe cleaning device, the problems of increased workload and incomplete cleaning caused by manual cleaning in existing technologies are solved, realizing automated cleaning and drying of probes and ensuring measurement accuracy.
CN224507801UActive Publication Date: 2026-07-17SUZHOU SHUIMI ELECTRONIC TECHNOLOGY CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SUZHOU SHUIMI ELECTRONIC TECHNOLOGY CO LTD
- Filing Date
- 2025-08-12
- Publication Date
- 2026-07-17
AI Technical Summary
Technical Problem
Existing probe cleaning devices for thermistor testing require manual cleaning, which increases the workload and makes it difficult to clean and dry thoroughly. Residual impurities affect the probe's sensing accuracy.
Method used
A probe cleaning device comprising a cleaning component and a pushing component is designed, which achieves automatic cleaning and drying of the probe by using a cleaning soft brush and a blowing fan through an automated clamping, cleaning and drying process.
Benefits of technology
This method enables thorough cleaning and drying of the probe, reduces the workload of personnel, and improves the accuracy of measurement results and the applicability of the device.
✦ Generated by Eureka AI based on patent content.
Smart Images

Figure CN224507801U_ABST
Abstract
本实用新型公开了一种热敏电阻测试用探针清洁装置,包括设备主体,所述设备主体顶面的一侧套接有两组固定套筒,所述设备主体的表面螺纹连接有两组推动组件,其中一组所述固定套筒的内壁转动连接有清理组件,所述固定套筒顶部的内壁固定连接有支撑杆,所述支撑杆的一端固定连接有右夹板,所述推动组件包括螺纹连接于设备主体表面的螺纹推动杆,所述螺纹推动杆的一端转动连接有左夹板。该热敏电阻测试用探针清洁装置,通过清理组件的设置,达到将探头进行充分清理和烘干的效果,避免这些杂质影响探头的感应精度,确保测量结果的准确性,减少人员清理的工作量,提高了热敏电阻测试用探针清洁装置的清洁效果和便捷性。
Need to check novelty before this filing date? Find Prior Art