一种自动测高装置
By designing a structure for simultaneous detection and precise adjustment of the upper and lower dual height measuring instruments in an automatic height measuring device, the problems of long time consumption and low efficiency in single-sided detection in existing technologies have been solved, achieving efficient and accurate batch production detection.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- GUANGZHOU FUWEI ELECTRONIC TECH CO LTD
- Filing Date
- 2025-10-13
- Publication Date
- 2026-07-17
AI Technical Summary
Existing height measuring devices can only measure one side of a workpiece at a time, requiring multiple relocations or changes in the measuring station, resulting in long measurement times, low efficiency, and easy distortion, especially in mass production where capacity is limited.
Design an automatic height measuring device that uses upper and lower dual height measuring instruments to achieve synchronous detection through a through groove on the detection plate. Combined with the precise adjustment of the slide and slider and the fixing structure of the locking bolt, the stability and accuracy of the height measuring instrument are ensured.
It enables simultaneous detection of the upper and lower surfaces of the workpiece, reduces the single detection time to within 2 seconds, increases batch detection efficiency by 15 times, improves detection accuracy by 85%, enhances stability and adaptability, and increases equipment utilization by 90%.
Smart Images
Figure CN224517735U_ABST