一种四柱式多维力传感器
By designing a four-column multidimensional force sensor structure and an overlapping flower strain gauge, the problems of complex structure, small range, large crosstalk, and large number of strain gauges in existing six-dimensional force sensors are solved, achieving higher measurement accuracy and reliability and meeting practical application requirements.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- ZHONGHANG ELECTRONIC MEASURING INSTR (XIAN) CO LTD
- Filing Date
- 2025-06-16
- Publication Date
- 2026-07-17
AI Technical Summary
Existing six-dimensional force sensors have complex structures, small measuring ranges, large crosstalk values, and require a large number of strain gauges with inconsistent quality, resulting in low measurement accuracy and efficiency.
A four-column multidimensional force sensor structure is adopted, which utilizes overlapping flower strain gauges and Wheatstone bridge circuits to reduce the number of strain gauges, improve bonding accuracy and measurement accuracy, reduce the workload of welding wires, and enhance the reliability and measurement accuracy of the sensor.
It achieves a wider measurement range and higher measurement accuracy, reduces crosstalk, improves the reliability and working quality of the sensor, and meets practical application requirements.
Smart Images

Figure CN224517999U_ABST
Abstract
Claims
1. A four-column multi-dimensional force sensor characterized by, The sensor body includes a sensor body and an overlapping flower strain gauge. The sensor body includes an upper top plate, a lower bottom plate, and four columns (100) connected between the upper top plate and the lower bottom plate. Four sensing surfaces are provided on the columns (100). The overlapping flower strain gauge includes a triple overlapping flower strain gauge and a double overlapping flower strain gauge. The column (100) is provided with two triple-overlapping strain gauges and two double-overlapping strain gauges. The two triple-overlapping strain gauges are arranged on two opposite sensing surfaces of the column (100), and the two double-overlapping strain gauges are arranged on two opposite sensing surfaces of the column (100). The triple-overlapping strain gauges and the double-overlapping strain gauges are located on adjacent sensing surfaces.
2. The four-column multi-dimensional force sensor according to claim 1, characterized in that, The two columns (100) are set on the horizontal axis of the lower base plate and the two columns (100) are set on the vertical axis of the lower base plate; the triple-overlapping strain gauges are respectively set on the sensing surfaces on the left and right sides of the two columns (100) on the horizontal axis of the lower base plate, and on the sensing surfaces on the front and rear sides of the two columns (100) on the vertical axis of the lower base plate.
3. The four-column multi-dimensional force sensor according to claim 1, characterized by, The four columns (100) are arranged circumferentially around the axis of the lower base plate, and are arranged in a counterclockwise direction as the first column (110), the second column (120), the third column (130) and the fourth column (140), with the first column (110) located on the right side of the lower base plate; The sensing surfaces on the first column (110) are, in order, the first sensing surface (111), the second sensing surface (112), the third sensing surface (113) and the fourth sensing surface (114), with the first sensing surface (111) located on the right side of the first column (110); The sensing surfaces on the second column (120) are, in order, the fifth sensing surface (121), the sixth sensing surface (122), the seventh sensing surface (123) and the eighth sensing surface (124), wherein the fifth sensing surface (121) is located on the front side of the second column (120); The sensing surfaces on the third column (130) are, in order, the ninth sensing surface (131), the tenth sensing surface (132), the eleventh sensing surface (133) and the twelfth sensing surface (134), with the ninth sensing surface (131) located to the left of the third column (130). The sensing surfaces on the fourth column (140) are, in order, the thirteenth sensing surface (141), the fourteenth sensing surface (142), the fifteenth sensing surface (143) and the sixteenth sensing surface (144), with the thirteenth sensing surface (141) located on the rear side of the fourth column (140). The first sensing surface (111), the third sensing surface (113), the fifth sensing surface (121), the seventh sensing surface (123), the ninth sensing surface (131), the eleventh sensing surface (133), the thirteenth sensing surface (141), and the fifteenth sensing surface (143) are all equipped with triple-overlap strain gauges; the second sensing surface (112), the fourth sensing surface (114), the sixth sensing surface (122), the eighth sensing surface (124), the tenth sensing surface (132), the twelfth sensing surface (134), the fourteenth sensing surface (142), and the sixteenth sensing surface (144) are all equipped with double-overlap strain gauges.
4. The four-pillar multi-dimensional force sensor according to claim 3, characterized in that, The triple-overlapping strain gauge includes three A-type strain gauges (200). Each A-type strain gauge (200) includes an A-type substrate, an A-type measuring grid (210), an A-type pad (220), and an A-type end cap. An A-type pad (220) is provided on one side of the upper surface of the A-type substrate, and an A-type measuring grid (210) is provided on the other side of the upper surface of the A-type substrate. The A-type pad (220) is connected to the A-type measuring grid (210), and the A-type end cap covers the upper surface of the A-type measuring grid (210). The three type A strain gauges (200) are stacked one on top of the other, with the first, second, and third type A strain gauges arranged counterclockwise around the axis of the type A measuring grid (210). The angle between the first type A strain gauge and the third type A strain gauge (200) is 90°, and the angle between the first type A strain gauge and the third type A strain gauge (200) and the second type A strain gauge (200) is 135°. The second type A strain gauge (200) is arranged in the vertical direction.
5. The four-pillar multi-dimensional force sensor according to claim 4, characterized in that, The double-overlapping strain gauge includes two B-type strain gauges (300). Each B-type strain gauge (300) includes a B-type substrate, a B-type measuring grid (310), a B-type pad (320), and a B-type end cap. The B-type measuring grid (310) and the B-type pad (320) are both disposed on the upper surface of the B-type substrate. The B-type pad (320) is connected to the opposite sides of the B-type measuring grid (310). The B-type end cap is disposed on the upper surface of the B-type measuring grid (310). The first type B strain gauge (300) is disposed at the bottom of the second type B strain gauge (300), and the angle between the first type B strain gauge (300) and the second type B strain gauge (300) is 90°. Either type B strain gauge (300) is vertically disposed.
6. The four-pillar multi-dimensional force sensor according to claim 4 or 5, characterized in that, The length of the triple-overlapping strain gauge is 4~9mm and the width is 3~8mm; the length and width of the double-overlapping strain gauge are both 4~8mm.
7. The four-pillar multi-dimensional force sensor according to claim 4 or 5, characterized in that, The triple-overlapping strain gauge and the double-overlapping strain gauge are used to construct a four-column multidimensional force sensor force value channel bridge circuit and a four-column multidimensional force sensor torque channel bridge circuit.
8. The four-pillar multi-dimensional force sensor according to claim 7, characterized in that, The four-column multidimensional force sensor force value channel bridge circuit includes an FX Wheatstone bridge, an Fy Wheatstone bridge, and an FZ Wheatstone bridge connected in sequence. The FX Wheatstone bridge is composed of the first A-type strain gauge (200) on the fifth sensing surface (121), the third A-type strain gauge (200) on the fifth sensing surface (121), the third A-type strain gauge (200) on the thirteenth sensing surface (141), and the first A-type strain gauge (200) on the thirteenth sensing surface (141) in sequence; The Fy Wheatstone bridge is composed of the first A-type strain gauge (200) on the first sensing surface (111), the third A-type strain gauge (200) on the first sensing surface (111), the third A-type strain gauge (200) on the ninth sensing surface (131), and the first A-type strain gauge (200) on the ninth sensing surface (131) in sequence; The FZ Wheatstone bridge consists of the first B-type strain gauge (300) on the second sensing surface (112), the first B-type strain gauge (300) on the fourth sensing surface (114), the first B-type strain gauge (300) on the tenth sensing surface (132), the first B-type strain gauge (300) on the twelfth sensing surface (134), the second B-type strain gauge (300) on the sixth sensing surface (122), the second B-type strain gauge (300) on the eighth sensing surface (124), the second B-type strain gauge (300) on the sixteenth sensing surface (144), and the second B-type strain gauge (300) on the fourteenth sensing surface (142). It consists of the first B-type strain gauge (300) on the sixteenth sensing surface (144), the first B-type strain gauge (300) on the fourteenth sensing surface (142), the first B-type strain gauge (300) on the sixth sensing surface (122), the first B-type strain gauge (300) on the eighth sensing surface (124), the second B-type strain gauge (300) on the second sensing surface (112), the second B-type strain gauge (300) on the fourth sensing surface (114), the second B-type strain gauge (300) on the tenth sensing surface (132), and the second B-type strain gauge (300) on the twelfth sensing surface (134).
9. The four-pillar multi-dimensional force sensor according to claim 8, characterized in that, The first B-type strain gauge (300) on the tenth sensing surface (132), the first B-type strain gauge (300) on the twelfth sensing surface (134), the second B-type strain gauge (300) on the sixteenth sensing surface (144), the second B-type strain gauge (300) on the fourteenth sensing surface (142), the first B-type strain gauge (300) on the sixteenth sensing surface (144), the first B-type strain gauge (300) on the fourteenth sensing surface (142), the second B-type strain gauge (300) on the second sensing surface (112), and the second B-type strain gauge (300) on the fourth sensing surface (114) are connected in sequence; A B-type pad (320) of the first B-type strain gauge (300) on the second sensing surface (112) is connected between the second B-type strain gauge (300) on the fourth sensing surface (114) and the first B-type strain gauge (300) on the tenth sensing surface (132). Another B-type pad (320) of the first B-type strain gauge (300) on the second sensing surface (112) is connected to a B-type pad (320) of the first B-type strain gauge (300) on the fourth sensing surface (114). Another B-type pad (320) of the first B-type strain gauge (300) on the fourth sensing surface (114) is connected between the first B-type strain gauge (300) on the twelfth sensing surface (134) and the second B-type strain gauge (300) on the sixteenth sensing surface (144). A B-type pad (320) of the second B-type strain gauge (300) on the sixth sensing surface (122) is connected between the first B-type strain gauge (300) on the twelfth sensing surface (134) and the second B-type strain gauge (300) on the sixteenth sensing surface (144). Another B-type pad (320) of the second B-type strain gauge (300) on the sixth sensing surface (122) is connected to a B-type pad (320) of the second B-type strain gauge (300) on the eighth sensing surface (124). Another B-type pad (320) of the second B-type strain gauge (300) on the eighth sensing surface (124) is connected between the second B-type strain gauge (300) on the fourteenth sensing surface (142) and the first B-type strain gauge (300) on the sixteenth sensing surface (144). A B-type pad (320) of the first B-type strain gauge (300) on the sixth sensing surface (122) is connected between the second B-type strain gauge (300) on the fourteenth sensing surface (142) and the first B-type strain gauge (300) on the sixteenth sensing surface (144). Another B-type pad (320) of the first B-type strain gauge (300) on the sixth sensing surface (122) is connected to a B-type pad (320) of the first B-type strain gauge (300) on the eighth sensing surface (124). Another B-type pad (320) of the first B-type strain gauge (300) on the eighth sensing surface (124) is connected between the first B-type strain gauge (300) on the fourteenth sensing surface (142) and the second B-type strain gauge (300) on the second sensing surface (112). A B-type pad (320) of the second B-type strain gauge (300) on the tenth sensing surface (132) is connected between the first B-type strain gauge (300) on the fourteenth sensing surface (142) and the second B-type strain gauge (300) on the second sensing surface (112). Another B-type pad (320) of the second B-type strain gauge (300) on the tenth sensing surface (132) is connected to a B-type pad (320) of the second B-type strain gauge (300) on the twelfth sensing surface (134). Another B-type pad (320) of the second B-type strain gauge (300) on the twelfth sensing surface (134) is connected between the second B-type strain gauge (300) on the fourth sensing surface (114) and the first B-type strain gauge (300) on the tenth sensing surface (132).
10. The four-column multidimensional force sensor according to claim 9, characterized in that, The four-column multidimensional force sensor torque channel bridge circuit includes an MX Wheatstone bridge, a MY Wheatstone bridge, and an MZ Wheatstone bridge connected in a single phase. The MX Wheatstone bridge is composed of the second A-type strain gauge (200) on the fifth sensing surface (121), the second A-type strain gauge (200) on the thirteenth sensing surface (141), the second A-type strain gauge (200) on the fifteenth sensing surface (143), and the second A-type strain gauge (200) on the seventh sensing surface (123) in sequence; The MY Wheatstone bridge is composed of a second A-type strain gauge (200) on the first sensing surface (111), a second A-type strain gauge (200) on the ninth sensing surface (131), a second A-type strain gauge (200) on the eleventh sensing surface (133), and a second A-type strain gauge (200) on the third sensing surface (113) in sequence; The MZ Wheatstone bridge is composed of the first A-type strain gauge (200) on the eleventh sensing surface (133), the first A-type strain gauge (200) on the third sensing surface (113), the third A-type strain gauge (200) on the seventh sensing surface (123), the third A-type strain gauge (200) on the fifteenth sensing surface (143), the first A-type strain gauge (200) on the seventh sensing surface (123), the first A-type strain gauge (200) on the fifteenth sensing surface (143), the third A-type strain gauge (200) on the eleventh sensing surface (133), and the third A-type strain gauge (200) on the third sensing surface (113) in sequence.