一种光谱仪光路结构的检验装置
By designing a spectrometer optical path structure inspection device with a closed-loop optical path, and using variable aperture components and mirror components to isolate error sources in segments, the problem of low inspection efficiency of spectrometer optical path structure is solved, and fast and accurate optical axis calibration is achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- 奥谱天成(湖南)信息科技有限公司
- Filing Date
- 2025-08-13
- Publication Date
- 2026-07-17
AI Technical Summary
The existing technology for testing the optical path structure of spectrometers has low efficiency and cannot meet the needs of rapid batch testing in production lines. It mainly relies on manual adjustment and is prone to causing a chain of optical path deviations.
Design a testing device for the optical path structure of a spectrometer, including a variable aperture assembly, a first reflector assembly, and a second reflector assembly to form a closed-loop optical path. Adjust the state of the variable aperture and the reflector through the mounting base assembly to isolate error sources in segments and achieve precise calibration of the optical axis.
This improves the inspection efficiency of the laser optical path structure of the spectrometer, reduces the assembly error between the variable aperture and the reflector, and enables rapid and accurate optical axis calibration.
Smart Images
Figure CN224518094U_ABST
Abstract
Claims
1. A device for inspecting the optical path structure of a spectrometer, characterized in that, The testing device includes a light source assembly, a variable aperture assembly (1), a first reflector assembly (2), an optical assembly to be tested (3), and a second reflector assembly (4) arranged sequentially along a predetermined optical path; The variable aperture assembly (1) and the first reflector assembly (2) are located in the incident light path of the optical component under test (3), and the second reflector assembly (4) is located in the receiving light path of the optical component under test (3). The variable aperture assembly (1), the first reflector assembly (2), the optical assembly under test (3), and the second reflector assembly (4) can all be moved into or out of the predetermined optical path.
2. The apparatus for inspecting an optical path structure of a spectrometer according to claim 1, characterized by, The testing device also includes a base plate (5); The variable aperture assembly (1), the first reflector assembly (2), the optical assembly to be tested (3), and the second reflector assembly (4) are detachably mounted on the base plate (5).
3. The apparatus for inspecting an optical path structure of a spectrometer according to claim 2, characterized in that, The variable aperture assembly (1) includes: Mounting bracket assembly (6) is detachably mounted on the base plate (5); The first support rod (7) is detachably mounted on the mounting base assembly (6); A variable aperture (8) is provided at the top of the first support rod (7); The first support rod (7) is used to adjust the axial angle and height of the variable aperture (8).
4. The apparatus of claim 3, wherein The first reflector assembly (2) and the second reflector assembly (4) each include: Mounting bracket assembly (6) is detachably mounted on the base plate (5); The second support rod (9) is detachably mounted on the mounting base assembly (6); Mounting bracket (10) is located at the top of the second support rod (9); A reflector (11) is mounted on the mounting bracket (10); The second support rod (9) is used to adjust the axial angle and height of the reflector (11); The mounting bracket (10) is used to adjust the deflection angle of the reflector (11).
5. The apparatus of claim 4, wherein, The mounting base assembly (6) includes a vacuum suction cup (12); The vacuum suction cup (12) is rotatably mounted with a suction cup rotary knob (13), one end of the connecting rod (14) is rotatably connected to the suction cup rotary knob (13), and the other end of the connecting rod (14) is rotatably provided with a clamping seat (15). The first support rod (7) or the second support rod (9) can be detachably mounted on the clamping seat (15). The vacuum suction cup (12) can be adsorbed onto the base plate (5).
6. The apparatus for inspecting an optical path structure of a spectrometer according to claim 5, wherein Locking knobs (16) are provided at both ends of the connecting rod (14); One of the locking knobs (16) is used to lock the connecting rod (14) onto the suction cup knob (13), and the other locking knob (16) is used to lock the clamping seat (15) onto the connecting rod (14).
7. The apparatus of claim 5, wherein: The clamping seat (15) has a through hole (17) at its center, and at least one threaded hole (18) communicating with the through hole (17) is provided on the outer circumferential wall of the clamping seat (15). A bolt is installed in the threaded hole (18). The first support rod (7) or the second support rod (9) passes through the through hole (17), and the first support rod (7) or the second support rod (9) is locked to the clamping seat (15) by the bolt.
8. The apparatus of claim 5, wherein, A level (19) is provided on the top wall of the clamping seat (15).
9. The apparatus of claim 4, wherein, The mounting bracket (10) includes a first bracket (20) and a second bracket (21); The first bracket (20) is located at the top of the second support rod (9), the second bracket (21) is located on one side of the first bracket (20), and the reflector (11) is detachably mounted on the second bracket (21); The first bracket (20) is provided with a first knob (23) at one end and a second knob (24) at the other end. The first knob (23) and the second knob (24) pass through the first bracket (20) and abut against the second bracket (21) respectively. A first spring (25) is provided on one side of the first knob (23), and a second spring (26) is provided on one side of the second knob (24). The first spring (25) and the second spring (26) are respectively connected between the first bracket (20) and the second bracket (21).
10. The apparatus for inspecting an optical path structure of a spectrometer according to claim 9, wherein, The first bracket (20) and the second bracket (21) are connected by screws. A steel ball (22) is provided between the first bracket (20) and the second bracket (21). The cross-section of the first bracket (20) and the second bracket (21) is L-shaped. The screw and the steel ball (22) are located at the right-angle ends of the first bracket (20) and the second bracket (21), respectively.